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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 220 occurrences of 191 keywords
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Results
Found 5411 publication records. Showing 5411 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
1 | P. D'Hondt, Aymen Ladhar, Patrick Girard 0001, Arnaud Virazel |
A Comprehensive Learning-Based Flow for Cell-Aware Model Generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 484-488, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Ankush Srivastava, Jais Abraham |
Low Capture Power At-Speed Test with Local Hot Spot Analysis to Reduce Over-Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 446-455, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Tobias Kilian, Markus Hanel, Daniel Tille, Martin Huch, Ulf Schlichtmann |
A Path Selection Flow for Functional Path Ring Oscillators using Physical Design Data. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 258-267, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Josie E. Rodriguez Condia, Juan-David Guerrero-Balaguera, Fernando Fernandes dos Santos, Matteo Sonza Reorda, Paolo Rech |
A Multi-level Approach to Evaluate the Impact of GPU Permanent Faults on CNN's Reliability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 278-287, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Zhengyuan Shi, Min Li 0019, Sadaf Khan, Liuzheng Wang, Naixing Wang, Yu Huang, Qiang Xu 0001 |
DeepTPI: Test Point Insertion with Deep Reinforcement Learning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 194-203, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Yan-Fu Chen, Duo-Yao Kang, Kuen-Jong Lee |
Scan-Based Test Chip Design with XOR-based C-testable Functional Blocks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 82-91, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Thomas Nirmaier, Manuel Harrant, Marc Huppmann, Wendy You, Georg Pelz |
Virtual Prototyping: Closing the digital gap between product requirements and post-Si verification. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 559-562, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Min Jian Yang, Yueling Zeng, Li-C. Wang |
Language Driven Analytics for Failure Pattern Feedforward and Feedback. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 288-297, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Arani Sinha, Yonsang Cho, Jon Easter, Meizel V. Leiva Rojas |
Multi-die Parallel Test Fabric for Scalability and Pattern Reusability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 249-257, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Soumya Mittal, Szczepan Urban, Kun Young Chung, Jakub Janicki, Wu-Tung Cheng, Martin Parley, Manish Sharma, Shaun Nicholson |
Industry Evaluation of Reversible Scan Chain Diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 420-426, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Esteban Garita-Rodríguez, Renato Rimolo-Donadio, Rafael Zamora-Salazar |
Challenges for High Volume Testing of Embedded IO Interfaces in Disaggregated Microprocessor Products. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 456-464, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Dun-An Yang, Jing-Jia Liou, Harry H. Chen |
Transient Fault Pruning for Effective Candidate Reduction in Functional Debugging. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 73-81, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Mahta Mayahinia, Mehdi B. Tahoori, Gurgen Harutyunyan, Grigor Tshagharyan, Karen Amirkhanyan |
An Efficient Test Strategy for Detection of Electromigration Impact in Advanced FinFET Memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 650-655, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Xiaopeng Zhang 0009, Shoubo Hu, Zhitang Chen, Shengyu Zhu 0001, Evangeline F. Y. Young, Pengyun Li, Cheng Chen, Yu Huang, Jianye Hao |
RCANet: Root Cause Analysis via Latent Variable Interaction Modeling for Yield Improvement. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 100-107, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Wei Zou, Benoit Nadeau-Dostie |
Configurable BISR Chain For Fast Repair Data Loading. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 56-62, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Chen-Lin Tsai, Shi-Yu Huang |
Just-Enough Stress Test for Infant-Mortality Screening Using Speed Binning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 137-144, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Amit Pandey, Brendan Tully, Karthikeyan Natarajan |
High Speed IO Access for Test forms the foundation for Silicon Lifecycle Management. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 656-660, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Mahta Mayahinia, Mehdi B. Tahoori, Manu Perumkunnil, Kristof Croes, Francky Catthoor |
Analyzing the Electromigration Challenges of Computation in Resistive Memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 534-538, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Firooz Massoudi |
In search of Vmin for dynamic power managmenet and reliable operation in mission mode. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 661-664, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Makoto Eiki, Tomoki Nakamura, Masuo Kajiyama, Michiko Inoue, Michihiro Shintani |
Accurate Failure Rate Prediction Based on Gaussian Process Using WAT Data. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 573-577, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Muhtadi Choudhury, Minyan Gao, Shahin Tajik, Domenic Forte |
TAMED: Transitional Approaches for LFI Resilient State Machine Encoding. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 46-55, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Soyed Tuhin Ahmed, Mehdi B. Tahoori |
Compact Functional Test Generation for Memristive Deep Learning Implementations using Approximate Gradient Ranking. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 239-248, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Supriyo Srimani, Hafizur Rahaman 0001 |
Testing of Analog Circuits using Statistical and Machine Learning Techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 619-626, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Ayush Arunachalam, Athulya Kizhakkayil, Shamik Kundu, Arnab Raha, Suvadeep Banerjee, Robert Jin, Fei Su, Kanad Basu |
Unsupervised Learning-based Early Anomaly Detection in AMS Circuits of Automotive SoCs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 229-238, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Lorella Bordogna, Fabio Brembilla, Alberto Pagani, Marco Spinetta |
New R&R Methodology in Semiconductor Manufacturing Electrical Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 410-419, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Prabuddha Chakraborty, Swarup Bhunia |
AI-Driven Assurance of Hardware IP against Reverse Engineering Attacks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 627-636, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Bharath Nandakumar, Madhur Maheshwari, Sameer Chillarige, Robert Redburn, Jeff Zimmerman, Nicholai L'Esperance, Edward Dziarcak |
Scaling physically aware logic diagnosis to complex high volume 7nm server processors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 340-347, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Suriyaprakash Natarajan, Abhijit Sathaye, Chaitali Oak, Nipun Chaplot, Suvadeep Banerjee |
DEFCON: Defect Acceleration through Content Optimization. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 298-304, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Janusz Rajski, Maciej Trawka, Jerzy Tyszer, Bartosz Wlodarczak |
Hardware Root of Trust for SSN-basedDFT Ecosystems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 479-483, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Chen He, Paul Grosch, Onder Anilturk, Joyce Witowski, Carl Ford, Rahul Kalyan, John C. Robinson, David W. Price, Jay Rathert, Barry Saville, Dave Lee |
Defect-Directed Stress Testing Based on Inline Inspection Results. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 427-435, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Hans Martin von Staudt, Luai Tarek Elnawawy, Sarah Wang, Larry Ping, Jung Woo Choi |
Probeless DfT Scheme for Testing 20k I/Os of an Automotive Micro-LED Headlamp Driver IC. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 365-371, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Takumi Uezono, Yi He 0010, Yanjing Li |
Achieving Automotive Safety Requirements through Functional In-Field Self-Test for Deep Learning Accelerators. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 465-473, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Feng Yun, Yunkun Lin, Lou Yunfei, Lei Gao, Vaibhav Gera, Boxuan Li, Vennela Chowdary Nekkanti, Aditya Rajendra Pharande, Kunal Sheth, Meghana Thommondru, Guizhong Ye, Sandeep Gupta 0001 |
Fault-coverage Maximizing March Tests for Memory Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 529-533, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Cheng-Sian Kuo, Bing-Han Hsieh, James Chien-Mo Li, Chris Nigh, Gaurav Bhargava, Mason Chern |
Diagnosing Double Faulty Chains through Failing Bit Separation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 175-184, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Yiwen Liao, Raphaël Latty, Paul R. Genssler, Hussam Amrouch, Bin Yang 0009 |
Wafer Map Defect Classification Based on the Fusion of Pattern and Pixel Information. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 1-9, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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1 | Francesco Angione, Paolo Bernardi, Andrea Calabrese, Lorenzo Cardone, A. Niccoletti, Davide Piumatti, Stefano Quer, Davide Appello, Vincenzo Tancorre, Roberto Ugioli |
An innovative Strategy to Quickly Grade Functional Test Programs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 355-364, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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1 | Abhairaj Singh, Moritz Fieback, Rajendra Bishnoi, Filip Bradaric, Anteneh Gebregiorgis, Rajiv V. Joshi, Said Hamdioui |
Accelerating RRAM Testing with a Low-cost Computation-in-Memory based DFT. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 400-409, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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1 | Mukta Debnath, Animesh Basak Chowdhury, Debasri Saha, Susmita Sur-Kolay |
GreyConE: Greybox Fuzzing + Concolic Execution Guided Test Generation for High Level Designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 494-498, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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1 | Mayukh Bhattacharya, Beatrice Solignac, Michael Dürr |
Application of Sampling in Industrial Analog Defect Simulation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 436-445, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Weng Joe Soh, Chen He |
Enhanced Data Pattern to Detect Defects in Flash Memory Address Decoder. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 544-548, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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1 | Junhua Huang, Hui-Ling Zhen, Naixing Wang, Hui Mao, Mingxuan Yuan, Yu Huang |
Neural Fault Analysis for SAT-based ATPG. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 36-45, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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1 | Yiwen Liao, Zahra Paria Najafi-Haghi, Hans-Joachim Wunderlich, Bin Yang 0009 |
Efficient and Robust Resistive Open Defect Detection Based on Unsupervised Deep Learning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 185-193, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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1 | Kazuya Loki, Yasuyuki Kai, Kohei Miyase, Seiji Kajihara |
A Practical Online Error Detection Method for Functional Safety Using Three-Site Implications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 63-72, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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1 | Shyue-Kung Lu, Shi-Chun Tseng, Kohei Miyase |
Fine-Grained Built-In Self-Repair Techniques for NAND Flash Memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 391-399, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Nirmal R. Saxena, Atieh Lotfi |
Error Model (EM) - A New Way of Doing Fault Simulation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 324-333, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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1 | Ken Chau-Cheung Cheng, Katherine Shu-Min Li, Sying-Jyan Wang, Andrew Yi-Ann Huang, Chen-Shiun Lee, Leon Li-Yang Chen, Peter Yi-Yu Liao, Nova Cheng-Yen Tsai |
Wafer Defect Pattern Classification with Explainable-Decision Tree Technique. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 549-553, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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1 | Rasheed Kibria, M. Sazadur Rahman, Farimah Farahmandi, Mark M. Tehranipoor |
RTL-FSMx: Fast and Accurate Finite State Machine Extraction at the RTL for Security Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 165-174, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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1 | Gabriele Filipponi, Giusy Iaria, Matteo Sonza Reorda, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre |
In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 646-649, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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1 | Jun-Yang Lei, Abhijit Chatterjee |
ML-Assisted Bug Emulation Experiments for Post-Silicon Multi-Debug of AMS Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 268-277, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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1 | Jonti Talukdar, Arjun Chaudhuri, Mayukh Bhattacharya, Krishnendu Chakrabarty |
Automatic Structural Test Generation for Analog Circuits using Neural Twins. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 145-154, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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1 | Sam M.-H. Hsiao, Lowry P.-T. Wang, Aaron C.-W. Liang, Charles H.-P. Wen |
Existence of Single-Event Double-Node Upsets (SEDU) in Radiation-Hardened Latches for Sub-65nm CMOS Technologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 128-136, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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1 | Costas Argyrides, Vilas Sridharan, Hayk Danoyan, Gurgen Harutyunyan, Yervant Zorian |
A Novel Protection Technique for Embedded Memories with Optimized PPA. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 642-645, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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1 | Michele Portolan, Antonios Pavlidis, Giorgio Di Natale, Eric Faehn, Haralampos-G. Stratigopoulos |
Circuit-to-Circuit Attacks in SoCs via Trojan-Infected IEEE 1687 Test Infrastructure. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 539-543, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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1 | Kwondo Ma, Anurup Saha, Chandramouli N. Amarnath, Abhijit Chatterjee |
Efficient Low Cost Alternative Testing of Analog Crossbar Arrays for Deep Neural Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 499-503, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | David P. Lerner, Benson Inkley, Shubhada H. Sahasrabudhe, Ethan Hansen, Luis D. Rojas Munoz, Arjan van de Ven |
Optimization of Tests for Managing Silicon Defects in Data Centers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 578-582, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Farrokh Ghani Zadegan, Zilin Zhang, Kim Petersén, Erik Larsson |
Reusing IEEE 1687-Compatible Instruments and Sub-Networks over a System Bus. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 219-228, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Hongfei Wang, Wei Liu 0004, Hai Jin 0001, Yu Chen, Wenjie Cai |
Modeling Challenge Covariances and Design Dependency for Efficient Attacks on Strong PUFs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 1-10, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Upoma Das, Md Rafid Muttaki, Mark M. Tehranipoor, Farimah Farahmandi |
ADWIL: A Zero-Overhead Analog Device Watermarking Using Inherent IP Features. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 155-164, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Ya-Chi Cheng, Pai-Yu Tan, Cheng-Wen Wu, Ming-Der Shieh, Chien-Hui Chuang, Gordon Liao |
Improving Test Quality of Memory Chips by a Decision Tree-Based Screening Method. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 601-608, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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1 | Khader S. Abdel-Hafez, Michael Dsouza, Likith Kumar Manchukonda, Elddie Tsai, Karthikeyan Natarajan, Ting-Pu Tai, Wenhao Hsueh, Smith Lai |
Comprehensive Power-Aware ATPG Methodology for Complex Low-Power Designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 334-339, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Subhadip Kundu, Gaurav Bhargava, Lesly Endrinal, Lavakumar Ranganathan |
Using Custom Fault Models to Improve Understanding of Silicon Failures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 348-354, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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1 | |
IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022 ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![IEEE, 978-1-6654-6270-9 The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Shamik Kundu, Akul Malhotra, Arnab Raha, Sumeet Kumar Gupta, Kanad Basu |
RIBoNN: Designing Robust In-Memory Binary Neural Network Accelerators. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 504-508, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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1 | Brian Foutz, Sarthak Singhal, Prateek Kumar Rai, Krishna Chakravadhanula, Vivek Chickermane, Bharath Nandakumar, Sameer Chillarige, Christos Papameletis, Satish Ravichandran |
PPA Optimization of Test Points in Automotive Designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 204-212, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty |
Fault Diagnosis for Resistive Random-Access Memory and Monolithic Inter-tier Vias in Monolithic 3D Integration. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 118-127, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Wei Li, Chris Nigh, Danielle Duvalsaint, Subhasish Mitra, Ronald D. Blanton |
PEPR: Pseudo-Exhaustive Physically-Aware Region Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 314-323, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Saurabh Hukerikar, Nirmal R. Saxena |
Runtime Fault Diagnostics for GPU Tensor Cores. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 524-528, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Shyue-Kung Lu, Yu-Sheng Wu, Jin-Hua Hong, Kohei Miyase |
Fault Resilience Techniques for Flash Memory of DNN Accelerators. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 591-600, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Kuan-Wei Hou, Hsueh-Hung Cheng, Chi Tung, Cheng-Wen Wu, Juin-Ming Lu |
Fault Modeling and Testing of Memristor-Based Spiking Neural Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 92-99, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Ze-Wei Pan, Jin-Fu Li 0001 |
DFT-Enhanced Test Scheme for Spin-Transfer-Torque (STT) MRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 489-493, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Seongkwan Lee, Cheolmin Park, Minho Kang, Jun Yeon Won, HyungSun Ryu, Jaemoo Choi, Byunghyun Yim |
4.5 Gsps MIPI D-PHY Receiver Circuit for Automatic Test Equipment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 563-567, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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1 | Kushagra Bhatheja, Shravan K. Chaganti, Degang Chen 0001, Xiankun Robert Jin, Chris C. Dao, Juxiang Ren, Abhishek Kumar, Daniel Correa, Mark Lehmann, Thomas Rodriguez, Eric Kingham, Joel R. Knight, Allan Dobbin, Scott W. Herrin, Doug Garrity |
Low Cost High Accuracy Stimulus Generator for On-chip Spectral Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 514-518, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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1 | Michael Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Songlin Zuo |
IEEE P1687.1: Extending the Network Boundaries for Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 382-390, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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1 | Bijay Raj Paudel, Spyros Tragoudas |
The Impact of On-chip Training to Adversarial Attacks in Memristive Crossbar Arrays. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 519-523, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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1 | Wei-Chen Lin, Chun Chen, Chao-Ho Hsieh, James Chien-Mo Li, Eric Jia-Wei Fang, Sung S.-Y. Hsueh |
ML-Assisted VminBinning with Multiple Guard Bands for Low Power Consumption. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 213-218, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Franco Stellari, Peilin Song |
Reliability Study of 14 nm Scan Chains and Its Application to Hardware Security. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 28-35, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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1 | Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi 0001, Degang Chen 0001 |
Optimal Order Polynomial Transformation for Calibrating Systematic Errors in Multisite Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 509-513, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Christian Majenz, Chanelle Matadah Manfouo, Maris Ozols |
Quantum-Access Security of the Winternitz One-Time Signature Scheme. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2nd Conference on Information-Theoretic Cryptography, ITC 2021, July 23-26, 2021, Virtual Conference., pp. 21:1-21:22, 2021, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-197-9. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Gili Schul-Ganz, Gil Segev 0001 |
Generic-Group Identity-Based Encryption: A Tight Impossibility Result. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2nd Conference on Information-Theoretic Cryptography, ITC 2021, July 23-26, 2021, Virtual Conference., pp. 26:1-26:23, 2021, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-197-9. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Alexander R. Block, Simina Brânzei, Hemanta K. Maji, Himanshi K. Mehta, Tamalika Mukherjee, Hai H. Nguyen |
P4-free Partition and Cover Numbers & Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2nd Conference on Information-Theoretic Cryptography, ITC 2021, July 23-26, 2021, Virtual Conference., pp. 16:1-16:25, 2021, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-197-9. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Yevgeniy Dodis, Kevin Yeo |
Doubly-Affine Extractors, and Their Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2nd Conference on Information-Theoretic Cryptography, ITC 2021, July 23-26, 2021, Virtual Conference., pp. 13:1-13:23, 2021, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-197-9. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Gal Arnon, Guy N. Rothblum |
On Prover-Efficient Public-Coin Emulation of Interactive Proofs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2nd Conference on Information-Theoretic Cryptography, ITC 2021, July 23-26, 2021, Virtual Conference., pp. 3:1-3:15, 2021, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-197-9. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Kenji Yasunaga |
Replacing Probability Distributions in Security Games via Hellinger Distance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2nd Conference on Information-Theoretic Cryptography, ITC 2021, July 23-26, 2021, Virtual Conference., pp. 17:1-17:15, 2021, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-197-9. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Bhavana Kanukurthi, Sai Lakshmi Bhavana Obbattu, Sruthi Sekar, Jenit Tomy |
Locally Reconstructable Non-Malleable Secret Sharing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2nd Conference on Information-Theoretic Cryptography, ITC 2021, July 23-26, 2021, Virtual Conference., pp. 11:1-11:19, 2021, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-197-9. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
1 | |
Front Matter, Table of Contents, Preface, Conference Organization. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2nd Conference on Information-Theoretic Cryptography, ITC 2021, July 23-26, 2021, Virtual Conference., pp. 0:1-0:12, 2021, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-197-9. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Samuel Dittmer, Yuval Ishai, Rafail Ostrovsky |
Line-Point Zero Knowledge and Its Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2nd Conference on Information-Theoretic Cryptography, ITC 2021, July 23-26, 2021, Virtual Conference., pp. 5:1-5:24, 2021, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-197-9. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Yevgeniy Dodis, Siyao Guo, Noah Stephens-Davidowitz, Zhiye Xie |
Online Linear Extractors for Independent Sources. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2nd Conference on Information-Theoretic Cryptography, ITC 2021, July 23-26, 2021, Virtual Conference., pp. 14:1-14:14, 2021, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-197-9. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Shumo Chu, Danyang Zhuo, Elaine Shi, T.-H. Hubert Chan |
Differentially Oblivious Database Joins: Overcoming the Worst-Case Curse of Fully Oblivious Algorithms. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2nd Conference on Information-Theoretic Cryptography, ITC 2021, July 23-26, 2021, Virtual Conference., pp. 19:1-19:24, 2021, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-197-9. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Carmit Hazay, Muthuramakrishnan Venkitasubramaniam, Mor Weiss |
ZK-PCPs from Leakage-Resilient Secret Sharing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2nd Conference on Information-Theoretic Cryptography, ITC 2021, July 23-26, 2021, Virtual Conference., pp. 6:1-6:21, 2021, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-197-9. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Yue Gao, Or Sheffet |
Differentially Private Approximations of a Convex Hull in Low Dimensions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2nd Conference on Information-Theoretic Cryptography, ITC 2021, July 23-26, 2021, Virtual Conference., pp. 18:1-18:16, 2021, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-197-9. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Brett Hemenway Falk, Rafail Ostrovsky |
Secure Merge with O(n log log n) Secure Operations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2nd Conference on Information-Theoretic Cryptography, ITC 2021, July 23-26, 2021, Virtual Conference., pp. 7:1-7:29, 2021, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-197-9. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
1 | T.-H. Hubert Chan, Elaine Shi, Wei-Kai Lin, Kartik Nayak |
Perfectly Oblivious (Parallel) RAM Revisited, and Improved Constructions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2nd Conference on Information-Theoretic Cryptography, ITC 2021, July 23-26, 2021, Virtual Conference., pp. 8:1-8:23, 2021, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-197-9. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Ivan Bjerre Damgård, Boyang Li 0012, Nikolaj Ignatieff Schwartzbach |
More Communication Lower Bounds for Information-Theoretic MPC. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2nd Conference on Information-Theoretic Cryptography, ITC 2021, July 23-26, 2021, Virtual Conference., pp. 2:1-2:18, 2021, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-197-9. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Marshall Ball, Alper Çakan, Tal Malkin |
Linear Threshold Secret-Sharing with Binary Reconstruction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2nd Conference on Information-Theoretic Cryptography, ITC 2021, July 23-26, 2021, Virtual Conference., pp. 12:1-12:22, 2021, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-197-9. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Luke Demarest, Benjamin Fuller 0001, Alexander Russell |
Code Offset in the Exponent. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2nd Conference on Information-Theoretic Cryptography, ITC 2021, July 23-26, 2021, Virtual Conference., pp. 15:1-15:23, 2021, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-197-9. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Gwangbae Choi, F. Betül Durak, Serge Vaudenay |
Post-Compromise Security in Self-Encryption. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2nd Conference on Information-Theoretic Cryptography, ITC 2021, July 23-26, 2021, Virtual Conference., pp. 25:1-25:23, 2021, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-197-9. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Stefano Tessaro (eds.) |
2nd Conference on Information-Theoretic Cryptography, ITC 2021, July 23-26, 2021, Virtual Conference. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-197-9 The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP BibTeX RDF |
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1 | Guru-Vamsi Policharla, Manoj Prabhakaran 0001, Rajeev Raghunath, Parjanya Vyas |
Group Structure in Correlations and Its Applications in Cryptography. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2nd Conference on Information-Theoretic Cryptography, ITC 2021, July 23-26, 2021, Virtual Conference., pp. 1:1-1:23, 2021, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-197-9. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Akinori Kawachi, Harumichi Nishimura |
Communication Complexity of Private Simultaneous Quantum Messages Protocols. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2nd Conference on Information-Theoretic Cryptography, ITC 2021, July 23-26, 2021, Virtual Conference., pp. 20:1-20:19, 2021, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-197-9. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
1 | Jeremiah Blocki, Seunghoon Lee, Samson Zhou |
On the Security of Proofs of Sequential Work in a Post-Quantum World. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2nd Conference on Information-Theoretic Cryptography, ITC 2021, July 23-26, 2021, Virtual Conference., pp. 22:1-22:27, 2021, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-197-9. The full citation details ...](Pics/full.jpeg) |
2021 |
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