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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 452 occurrences of 271 keywords
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Results
Found 1308 publication records. Showing 1308 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
17 | Gita Ghiasi, Catherine Beaudry, Vincent Larivière, Carl St-Pierre, Andrea Schiffauerova, Matthew Harsh |
Who profits from the Canadian nanotechnology reward system? Implications for gender-responsible innovation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 126(9), pp. 7937-7991, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Lamjed Touil, Ismail Gassoumi, Abdellatif Mtibaa |
Design and Implementation of Nanotechnology QCA Geometric Greedy Router. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electr. Comput. Eng. ![In: J. Electr. Comput. Eng. 2021, pp. 3935091:1-3935091:12, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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17 | Milosz Kadzinski, Krzysztof Martyn, Marco Cinelli, Roman Slowinski, Salvatore Corrente, Salvatore Greco |
Preference disaggregation method for value-based multi-decision sorting problems with a real-world application in nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Knowl. Based Syst. ![In: Knowl. Based Syst. 218, pp. 106879, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Deb Newberry |
Nanotechnology: Lessons from Nature - Discoveries, Research, and Applications ![Search on Bibsonomy](Pics/bibsonomy.png) |
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2021 |
DOI RDF |
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17 | Richard Wilson |
3D printing, nanotechnology and organ printing: An ethical and anticipatory ethical analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISTAS ![In: IEEE International Symposium on Technology and Society, ISTAS 2021, Waterloo, ON, Canada, October 28-31, 2021, pp. 1, 2021, IEEE, 978-1-6654-3580-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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17 | Shubham Rai, Nishant Gupta, Abhiroop Bhattacharjee, Ansh Rupani, Michael Raitza, Jens Trommer, Thomas Mikolajick, Akash Kumar 0001 |
END-TRUE: Emerging Nanotechnology-Based Double-Throughput True Random Number Generator. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI-SoC (Selected Papers) ![In: VLSI-SoC: Technology Advancement on SoC Design - 29th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2021, Singapore, October 4-8, 2021, Revised and Extended Selected Papers, pp. 175-203, 2021, Springer, 978-3-031-16817-8. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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17 | Luigi Dilillo, Luca Cassano, Athanasios Papadimitriou (eds.) |
36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021 ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![IEEE, 978-1-6654-1609-2 The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Vasudeva Bevara, Pradyut Kumar Sanki |
An Ultra-Low Power Reversible MUX and DEMUX using QCA nanotechnology with energy dissipation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
iSES ![In: IEEE International Symposium on Smart Electronic Systems, iSES 2021, Jaipur, India, December 18-22, 2021, pp. 323-326, 2021, IEEE, 978-1-7281-8753-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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17 | Davide Bellizia, Nadia El Mrabet, Apostolos P. Fournaris, Simon Pontié, Francesco Regazzoni 0001, François-Xavier Standaert, Élise Tasso, Emanuele Valea |
Post-Quantum Cryptography: Challenges and Opportunities for Robust and Secure HW Design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-6, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Elaheh Malekzadeh, Nezam Rohbani, Zhonghai Lu, Masoumeh Ebrahimi |
The Impact of Faults on DNNs: A Case Study. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-6, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Romain Mercier, Cédric Killian, Angeliki Kritikakou, Youri Helen, Daniel Chillet |
A Region-Based Bit-Shuffling Approach Trading Hardware Cost and Fault Mitigation Efficiency. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-4, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Vijay K. Jain, Glenn H. Chapman |
Fault Tolerance for Islandable-Microgrid Sensors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-4, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Hardi Selg, Maksim Jenihhin, Peeter Ellervee |
JÄNES: A NAS Framework for ML-based EDA Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-6, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Stavros Simoglou, Christos P. Sotiriou, Nikolaos Blias |
Static Timing Analysis Induced Simulation Errors for Asynchronous Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-4, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Marcel Merten, Sebastian Huhn 0001, Rolf Drechsler |
A Codeword-based Compactor for On-Chip Generated Debug Data Using Two-Stage Artificial Neural Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-6, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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17 | Md Toufiq Hasan Anik, Jean-Luc Danger, Omar Diankha, Mohammad Ebrahimabadi, Christoph Frisch, Sylvain Guilley, Naghmeh Karimi, Michael Pehl, Sofiane Takarabt |
Testing and Reliability Enhancement of Security Primitives. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-8, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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17 | Ioanna Souvatzoglou, Athanasios Papadimitriou, Aitzan Sari, Vasileios Vlagkoulis, Mihalis Psarakis |
Analyzing the Single Event Upset Vulnerability of Binarized Neural Networks on SRAM FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-6, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Nabanita Ghoshal, Sree Rama K. C. Saraswatula, Santosh Yachareni, Shidong Zhou, Anil Kumar Kandala, Narendra Kumar Pulipati |
Mitigation of the impact of across chip systematic process variation using a novel system level design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-4, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Alessandro Palumbo, Luca Cassano, Pedro Reviriego, Giuseppe Bianchi 0001, Marco Ottavi |
A Lightweight Security Checking Module to Protect Microprocessors against Hardware Trojan Horses. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-6, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Anuraag Narang, Balaji Venn, S. Saqib Khursheed, Peter Harrod |
An Exploration of Microprocessor Self-Test Optimisation Based On Safe Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-6, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Irith Pomeranz |
Zoom-In Feature for Storage-Based Logic Built-In Self-Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-6, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Marko S. Andjelkovic, Oliver Schrape, Anselm Breitenreiter, Junchao Chen 0001, Milos Krstic |
A Tunable Single Event Transient Filter Based on Digitally Controlled Capacitive Delay Cells. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-6, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Glenn H. Chapman, Simone Neufeld, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren |
Dependence of SEUs in Digital Cameras on Pixel size and Elevation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-4, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Panayiotis Corneliou, Panagiota Nikolaou, Maria K. Michael, Theocharis Theocharides |
Fine-Grained Vulnerability Analysis of Resource Constrained Neural Inference Accelerators. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-6, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Mohamed Amine Khelif, Jordane Lorandel, Olivier Romain |
Non-invasive I2C Hardware Trojan Attack Vector. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-6, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Dake Chen, Chunxiao Lin, Peter A. Beerel |
GF-Flush: A GF(2) Algebraic Attack on Dynamically Secured Scan Chains. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-6, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Cristiana Bolchini, Luca Cassano, Andrea Mazzeo, Antonio Miele |
Usability-based Cross-Layer Reliability Evaluation of Image Processing Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-6, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Wei Chang, Yu-Guang Chen, Po-Yeh Huang, Jin-Fu Li 0001 |
An Aging-Aware CMOS SRAM Structure Design for Boolean Logic In-Memory Computing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-4, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
17 | Zhen Gao 0005, Jiajun Xiao, Pedro Reviriego |
Reliability Evaluation of Digital Channelizers Implemented on SRAM - FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-4, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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17 | Endri Kaja, Nicolas Gerlin, Mounika Vaddeboina, Luis Rivas, Sebastian Siegfried Prebeck, Zhao Han, Keerthikumara Devarajegowda, Wolfgang Ecker |
Towards Fault Simulation at Mixed Register-Transfer/Gate-Level Models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-6, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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17 | Vishal Gupta 0002, Giulio Panunzi, Saurabh Khandelwal, Eugenio Martinelli, Abusaleh M. Jabir, Marco Ottavi |
Reliability Assessment of Memristor based Gas Sensor Array. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-6, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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17 | Zhen Gao 0005, Ruize Wang, Haoyu Du, Pedro Reviriego |
Analysis and Evaluation of the Effects of Single Event Upsets (SEU s) on Memories in Polar Decoders. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-6, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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17 | Marcello Barbirotta, Abdallah Cheikh, Antonio Mastrandrea, Francesco Menichelli, Francesco Vigli, Mauro Olivieri |
A Fault Tolerant soft-core obtained from an Interleaved-Multi- Threading RISC- V microprocessor design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-4, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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17 | Sandeep Kumar, Atin Mukherjee 0001 |
A Self-Healing, High Performance and Low-Cost Radiation Hardened Latch Design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-6, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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17 | Aneesh Balakrishnan, Guilherme Cardoso Medeiros, Cemil Cem Gürsoy, Said Hamdioui, Maksim Jenihhin, Dan Alexandrescu |
Modeling Soft-Error Reliability Under Variability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-6, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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17 | Puneet Ramesh Savanur, Spyros Tragoudas |
A Fault Model to Detect Design Errors in Combinational Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-4, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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17 | Zahra Kazemi, Amin Norollah, Afef Kchaou, Mahdi Fazeli, David Hély, Vincent Beroulle |
An In-Depth Vulnerability Analysis of RISC-V Micro-Architecture Against Fault Injection Attack. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-6, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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17 | Stéphane Burel, Adrian Evans, Lorena Anghel |
Zero-Overhead Protection for CNN Weights. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-6, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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17 | Pelopidas Tsoumanis, Georgios Ioannis Paliaroutis, Nestoras E. Evmorfopoulos, George I. Stamoulis |
On the Impact of Electrical Masking and Timing Analysis on Soft Error Rate Estimation in Deep Submicron Technologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-6, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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17 | L. Degli Abbati, Rudolf Ullmann, G. Paganini, M. Coppetta, L. Zaia, Vincent Huard, O. Montfort, Riccardo Cantoro, Giorgio Insinga, F. Venini, P. Calao, Paolo Bernardi |
Industrial best practice: cases of study by automotive chip- makers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-6, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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17 | Hideyuki Ichihara, Takayuki Fukuda, Tomoo Inoue |
A Design of Reliable Linear FSMs with Equivalent States in Stochastic Computing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-6, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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17 | Christos Georgakidis, Iordanis Lilitsis, Georgios Stanimeropoulos, Christos P. Sotiriou |
RADPlace: A Timing-aware RAdiation-Hardening Detailed Placement Scheme Satisfying TMR Spacing Constraints. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-6, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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17 | Corrado De Sio, Sarah Azimi, Andrea Portaluri, Luca Sterpone |
SEU Evaluation of Hardened-by-Replication Software in RISC- V Soft Processor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-6, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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17 | Sébastien Thomet, Serge De Paoli, Jean-Marc Daveau, Valérie Bertin, Fady Abouzeid, Philippe Roche, Fakhreddine Ghaffari, Olivier Romain |
FIRECAP: Fail-Reason Capturing hardware module for a RISC-V based System on a Chip. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021, pp. 1-6, 2021, IEEE, 978-1-6654-1609-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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17 | Pijush Kanti Dutta Pramanik, Arun Solanki, Abhinaba Debnath, Anand Nayyar, Shaker H. Ali El-Sappagh, Kyung-Sup Kwak |
Advancing Modern Healthcare With Nanotechnology, Nanobiosensors, and Internet of Nano Things: Taxonomies, Applications, Architecture, and Challenges. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 8, pp. 65230-65266, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Damilola E. Babatunde, Iheanacho H. Denwigwe, Olubayo M. Babatunde, Saheed Lekan Gbadamosi, Ifeoluwa P. Babalola, Oluranti Agboola |
Environmental and Societal Impact of Nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 8, pp. 4640-4667, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Aimé Lay-Ekuakille |
Needing measurements and instrumentation within the nanotechnology world: IEEE IMS TC-34 experience. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Instrum. Meas. Mag. ![In: IEEE Instrum. Meas. Mag. 23(8), pp. 24-26, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Maliheh Norouzi, Saeed Rasouli Heikalabad, Fereshteh Salimzadeh |
A reversible ALU using HNG and Ferdkin gates in QCA nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Circuit Theory Appl. ![In: Int. J. Circuit Theory Appl. 48(8), pp. 1291-1303, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Mesbah Uddin, Md. Badruddoja Majumder, Md Sakib Hasan, Garrett S. Rose |
A Secure Back-up and Restore for Resource-Constrained IoT based on Nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2007.04570, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP BibTeX RDF |
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17 | Randy Bryant, Mark D. Hill, Tom Kazior, Daniel Lee, Jie Liu, Klara Nahrstedt, Vijay Narayanan, Jan M. Rabaey, Hava T. Siegelmann, Naresh R. Shanbhag, Naveen Verma, H.-S. Philip Wong |
Nanotechnology-inspired Information Processing Systems of the Future. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2005.02434, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP BibTeX RDF |
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17 | Amjad Aljaloud, Sally A. Peyman, Almut Beige |
A Quantum Heat Exchanger for Nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Entropy ![In: Entropy 22(4), pp. 379, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Harsh Kumar, Kamil Kuca, Shashi Kant Bhatia, Kritika Saini, Ankur Kaushal, Rachna Verma, Tek Chand Bhalla, Dinesh Kumar |
Applications of Nanotechnology in Sensor-Based Detection of Foodborne Pathogens. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sensors ![In: Sensors 20(7), pp. 1966, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Runjhun Saran, Yong Wang 0039, Isaac T. S. Li |
Mechanical Flexibility of DNA: A Quintessential Tool for DNA Nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sensors ![In: Sensors 20(24), pp. 7019, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Deb Newberry |
Nanotechnology Past and Present ![Search on Bibsonomy](Pics/bibsonomy.png) |
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2020 |
DOI RDF |
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17 | Wujie Zhang |
Nanotechnology for Bioengineers ![Search on Bibsonomy](Pics/bibsonomy.png) |
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2020 |
DOI RDF |
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17 | Luigi Dilillo, Mihalis Psarakis, Taniya Siddiqua (eds.) |
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020 ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![IEEE, 978-1-7281-9457-8 The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP BibTeX RDF |
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17 | Antonios Stellas, George Giannakopoulos, Vassilios Constantoudis |
Hybridizing AI and Domain Knowledge in Nanotechnology: the Example of Surface Roughness Effects on Wetting Behavior. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SETN Workshops ![In: Workshops of the 11th EETN Conference on Artificial Intelligence 2020 co-located with the 11th EETN Conference on Artificial Intelligence (SETN 2020), Athens, Greece, September 2-4, 2020., pp. 48-54, 2020, CEUR-WS.org. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP BibTeX RDF |
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17 | Zhen Gao 0005, Xiaohui Wei, Han Zhang, Wenshuo Li, Guangjun Ge, Yu Wang 0002, Pedro Reviriego |
Reliability Evaluation of Pruned Neural Networks against Errors on Parameters. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Irith Pomeranz |
Improving a Test Set to Cover Test Holes by Detecting Gate-Exhaustive Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-4, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Annachiara Ruospo, Angelo Balaara, Alberto Bosio, Ernesto Sánchez 0001 |
A Pipelined Multi-Level Fault Injector for Deep Neural Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Dario Mamone, Alberto Bosio, Alessandro Savino, Said Hamdioui, Maurizio Rebaudengo |
On the Analysis of Real-time Operating System Reliability in Embedded Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Sergi Alcaide, Leonidas Kosmidis, Carles Hernández 0001, Jaume Abella 0001 |
Software-only based Diverse Redundancy for ASIL-D Automotive Applications on Embedded HPC Platforms. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-4, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Junchao Chen 0001, Thomas Lange, Marko S. Andjelkovic, Aleksandar Simevski, Milos Krstic |
Hardware Accelerator Design with Supervised Machine Learning for Solar Particle Event Prediction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
17 | Avijit Chakraborty, D. M. H. Walker |
Observability Driven Path Generation for Delay Test Coverage Improvement in Scan Limited Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-4, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
17 | Rubens Luiz Rech Junior, Paolo Rech |
Impact of Layers Selective Approximation on CNNs Reliability and Performance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-4, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Marcello Barbirotta, Antonio Mastrandrea, Francesco Menichelli, Francesco Vigli, Luigi Blasi, Abdallah Cheikh, Stefano Sordillo, Fabio Di Gennaro, Mauro Olivieri |
Fault resilience analysis of a RISC-V microprocessor design through a dedicated UVM environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
17 | Siva Satyendra Sahoo, Bharadwaj Veeravalli, Akash Kumar 0001 |
Markov Chain-based Modeling and Analysis of Checkpointing with Rollback Recovery for Efficient DSE in Soft Real-time Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Christos Georgakidis, Christos P. Sotiriou |
Radiation Hardening Legalisation Satisfying TMR Spacing Constraints with Respect to HPWL. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
17 | Aein Rezaei Shahmirzadi, Amir Moradi 0001 |
Clock Glitch versus SIFA. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Danilo Cappellone, Stefano Di Mascio, Gianluca Furano, Alessandra Menicucci, Marco Ottavi |
On-Board Satellite Telemetry Forecasting with RNN on RISC-V Based Multicore Processor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Xiaohan Yang, Saurabh Khandelwal, Aiqi Jiang, Abusaleh M. Jabir |
A Modelling Attack Resistant Low Overhead Memristive Physical Unclonable Function. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-4, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
17 | Gianluca Furano, Antonis Tavoularis, Marco Rovatti |
AI in space: applications examples and challenges. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Basma Hajri, Mohammad M. Mansour, Ali Chehab, Hassen Aziza |
A Lightweight Reconfigurable RRAM-based PUF for Highly Secure Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-4, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Riccardo Cantoro, Nikolaos Ioannis Deligiannis, Matteo Sonza Reorda, Marcello Traiola, Emanuele Valea |
Evaluating Data Encryption Effects on the Resilience of an Artificial Neural Network. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-4, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Hussein Bazzi, Jérémy Postel-Pellerin, Hassen Aziza, Mathieu Moreau, Adnan Harb |
Resistive RAM SET and RESET Switching Voltage Evaluation as an Entropy Source for Random Number Generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-4, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Zhen Gao 0005, Han Zhang, Xiaohui Wei, Tong Yan, Kangkang Guo, Wenshuo Li, Yu Wang 0002, Pedro Reviriego |
Reliable Classification with Ensemble Convolutional Neural Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-4, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Maryam Rajabalipanah, Seyedeh Maryam Ghasemi, Nooshin Nosrati, Katayoon Basharkhah, Saba Yousefzadeh, Zainalabedin Navabi |
Reducing DFT hardware overhead by use of a test microprogram in a microprogrammed hardware accelerator. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-4, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Dimitris Theodoropoulos, Nektarios Kranitis, Antonis Tsigkanos, Antonis M. Paschalis |
Efficient LDPC Encoder Designs for Magnetic Recording Media. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Corrado De Sio, Sarah Azimi, Luca Sterpone |
An Emulation Platform for Evaluating the Reliability of Deep Neural Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-4, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Athanasios Papadimitriou, Konstantinos Nomikos, Mihalis Psarakis, Ehsan Aerabi, David Hély |
You can detect but you cannot hide: Fault Assisted Side Channel Analysis on Protected Software-based Block Ciphers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Cristiana Bolchini, Luca Cassano, Antonio Miele, Matteo Biasielli |
Lightweight Fault Detection and Management for Image Restoration. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Alexander Sprenger, Somayeh Sadeghi Kohan, Jan Dennis Reimer, Sybille Hellebrand |
Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
17 | Payam Habiby, Sebastian Huhn 0001, Rolf Drechsler |
Power-aware Test Scheduling for IEEE 1687 Networks with Multiple Power Domains. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Nagabhushan Reddy, Sankaran Menon, Prashant D. Joshi |
Validation Challenges in Recent Trends of Power Management in Microprocessors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Vishal Gupta 0002, Danilo Pellegrini, Saurabh Khandelwal, Abusaleh M. Jabir, Shahar Kvatinsky, Eugenio Martinelli, Corrado Di Natale, Marco Ottavi |
Sensing with Memristive Complementary Resistive Switch: Modelling and Simulations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Ryuki Asami, Toshinori Hosokawa, Masayoshi Yoshimura, Masayuki Arai |
A Multiple Target Test Generation Method for Gate-Exhaustive Faults to Reduce the Number of Test Patterns Using Partial MaxSAT. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Giorgio Di Natale, Francesco Regazzoni 0001, Vincent Albanese, Frank Lhermet, Yann Loisel, Abderrahmane Sensaoui, Samuel Pagliarini |
Latest Trends in Hardware Security and Privacy. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-4, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Yiannakis Sazeides, Arkady Bramnik, Ron Gabor, Chrysostomos Nicopoulos, Ramon Canal, Dimitris Konstantinou, Giorgos Dimitrakopoulos |
2D Error Correction for F/F based Arrays using In-Situ Real-Time Error Detection (RTD). ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-4, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Ruoyi Zhao, Israel Koren, Zahava Koren |
Using digital imagers to characterize the dependence of energy and area distributions of SEUs on elevation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-4, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | T. Vayssade, Florence Azaïs, Laurent Latorre, François Lefevre |
EVM measurement of RF ZigBee transceivers using standard digital ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Lucas Matana Luza, Daniel Söderström, Georgios Tsiligiannis, Helmut Puchner, Carlo Cazzaniga, Ernesto Sánchez 0001, Alberto Bosio, Luigi Dilillo |
Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Soultana Ellinidou, Gaurav Sharma 0006, Olivier Markowitch, Guy Gogniat, Jean-Michel Dricot |
A novel Network-on-Chip security algorithm for tolerating Byzantine faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, Frascati, Italy, October 19-21, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-9457-8. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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17 | Alan L. Porter, Jon Garner, Nils C. Newman, Stephen F. Carley, Jan L. Youtie, Seokbeom Kwon, Yin Li |
National nanotechnology research prominence. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Technol. Anal. Strateg. Manag. ![In: Technol. Anal. Strateg. Manag. 31(1), pp. 25-39, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
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17 | Antonio Miele, Martin A. Trefzer, S. Saqib Khursheed (eds.) |
Guest Editorial: Defect and Fault Tolerance in VLSI and Nanotechnology Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IET Comput. Digit. Tech. ![In: IET Comput. Digit. Tech. 13(3), pp. 127-128, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
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17 | Reza Binaei, Mohammad Gholami |
Design of novel D flip-flops with set and reset abilities in quantum-dot cellular automata nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Comput. Electr. Eng. ![In: Comput. Electr. Eng. 74, pp. 259-272, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
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17 | Teresa Muñoz-Écija, Benjamín Vargas-Quesada, Zaida Chinchilla-Rodríguez |
Coping with methods for delineating emerging fields: Nanoscience and nanotechnology as a case study. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Informetrics ![In: J. Informetrics 13(4), 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
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17 | Teresa Muñoz-Écija, Benjamín Vargas-Quesada, Zaida Chinchilla-Rodríguez |
Coping with the delineation of emerging fields: Nanoscience and Nanotechnology as a case study. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1907.11888, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP BibTeX RDF |
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17 | Azath Mubarakali, Jayabrabu Ramakrishnan, Dinesh Mavaluru, Amria Elsir, Omer Elsier, Karzan Wakil |
A new efficient design for random access memory based on quantum dot cellular automata nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Nano Commun. Networks ![In: Nano Commun. Networks 21, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
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17 | Avi Karsenty, Yaakov Mandelbaum |
Computer Algebra Challenges in Nanotechnology: Accurate Modeling of Nanoscale Electro-optic Devices Using Finite Elements Method. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Math. Comput. Sci. ![In: Math. Comput. Sci. 13(1-2), pp. 117-130, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
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17 | Thara Prabhakaran, Hiran H. Lathabai, Susan George |
Competing, complementary and co-existing paradigms in techno-scientific literature: A case study of Nanotechnology for engineering. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 118(3), pp. 941-977, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
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