|
|
|
|
Venues (Conferences, Journals, ...)
|
|
|
GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 199 occurrences of 154 keywords
|
|
|
|
|
Results
Found 896 publication records. Showing 896 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Elena I. Vatajelu, Alberto Bosio, Luigi Dilillo, Patrick Girard 0001, Aida Todri, Arnaud Virazel, Nabil Badereddine |
Analyzing resistive-open defects in SRAM core-cell under the effect of process variability.  |
ETS  |
2013 |
DBLP DOI BibTeX RDF |
|
| 1 | Afsaneh Nassery, Sule Ozev, Mustapha Slamani |
Analytical modeling for EVM in OFDM transmitters including the effects of IIP3, I/Q imbalance, noise, AM/AM and AM/PM distortion. |
ETS |
2013 |
DBLP DOI BibTeX RDF |
|
| 1 | Saman Kiamehr, Farshad Firouzi, Mehdi Baradaran Tahoori |
A layout-aware x-filling approach for dynamic power supply noise reduction in at-speed scan testing. |
ETS |
2013 |
DBLP DOI BibTeX RDF |
|
| 1 | Manuel J. Barragan Asian, Gildas Léger |
Efficient selection of signatures for analog/RF alternate test. |
ETS |
2013 |
DBLP DOI BibTeX RDF |
|
| 1 | Shyam Kumar Devarakond, Debashis Banerjee, Aritra Banerjee, Shreyas Sen, Abhijit Chatterjee |
Efficient system-level testing and adaptive tuning of MIMO-OFDM wireless transmitters. |
ETS |
2013 |
DBLP DOI BibTeX RDF |
|
| 1 | Wei-Hen Lo, Ang-Chih Hsieh, Chien-Ming Lan, Min-Hsien Lin, TingTing Hwang |
Utilizing circuit structure for scan chain diagnosis. |
ETS |
2013 |
DBLP DOI BibTeX RDF |
|
| 1 | Carolina Metzler, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard 0001, Arnaud Virazel, Pascal Vivet, Marc Belleville |
Computing detection probability of delay defects in signal line tsvs. |
ETS |
2013 |
DBLP DOI BibTeX RDF |
|
| 1 | Seetal Potluri, Satya Trinadh, Roopashree Baskaran, Nitin Chandrachoodan, V. Kamakoti 0001 |
PinPoint: An algorithm for enhancing diagnostic resolution using capture cycle power information. |
ETS |
2013 |
DBLP DOI BibTeX RDF |
|
| 1 | Ozgur Sinanoglu, Naghmeh Karimi, Jeyavijayan Rajendran, Ramesh Karri, Yier Jin, Ke Huang 0001, Yiorgos Makris |
Reconciling the IC test and security dichotomy. |
ETS |
2013 |
DBLP DOI BibTeX RDF |
|
| 1 | Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta 0001, Rohit Kapur |
Aggresive scan chain masking for improved diagnosis of multiple scan chain failures. |
ETS |
2013 |
DBLP DOI BibTeX RDF |
|
| 1 | |
18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013 |
ETS |
2013 |
DBLP BibTeX RDF |
|
| 1 | Said Hamdioui, Davide Appello, Arnaud Grasset, Xinli Gu, Bram Kruseman, Riccardo Mariani, Hermann Obermeir, Srikanth Venkataraman |
Panel session what is the electronics industry doing to win the battle against the expected scary failure rates in future technology nodes? |
ETS |
2013 |
DBLP DOI BibTeX RDF |
|
| 1 | Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras |
BIST architecture to detect defects in tsvs during pre-bond testing. |
ETS |
2013 |
DBLP DOI BibTeX RDF |
|
| 1 | Hans A. R. Manhaeve, Esko Mikkola |
Semiconductor failure modes and mitigation for critical systems embedded tutorial. |
ETS |
2013 |
DBLP DOI BibTeX RDF |
|
| 1 | Ke Huang 0001, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris |
On combining alternate test with spatial correlation modeling in analog/RF ICs. |
ETS |
2013 |
DBLP DOI BibTeX RDF |
|
| 1 | Yuxi Liu, Rong Ye, Feng Yuan, Qiang Xu 0001 |
Optimization for timing-speculated circuits by redundancy addition and removal. |
ETS |
2013 |
DBLP DOI BibTeX RDF |
|
| 1 | Sergej Deutsch, Krishnendu Chakrabarty |
Robust optimization of test-architecture designs for core-based SoCs. |
ETS |
2013 |
DBLP DOI BibTeX RDF |
|
| 1 | Martin Omaña 0001, Daniele Rossi 0001, Filippo Fuzzi, Cecilia Metra, Chandra Tirumurti, R. Galivache |
Novel approach to reduce power droop during scan-based logic BIST. |
ETS |
2013 |
DBLP DOI BibTeX RDF |
|
| 1 | Paolo Rech, Caroline Aguiar, Christopher Frost 0002, Luigi Carro |
Experimental evaluation of thread distribution effects on multiple output errors in GPUs. |
ETS |
2013 |
DBLP DOI BibTeX RDF |
|
| 1 | Rafal Baranowski, Michael A. Kochte, Hans-Joachim Wunderlich |
Scan pattern retargeting and merging with reduced access time. |
ETS |
2013 |
DBLP DOI BibTeX RDF |
|
| 1 | Unni Chandran, Dan Zhao, Rathish Jayabharathi |
Hybrid 3D pre-bonding test framework design. |
ETS |
2013 |
DBLP DOI BibTeX RDF |
|
| 1 | Sarvesh Prabhu, Michael S. Hsiao, Loganathan Lingappan, Vijay Gangaram |
Test generation for circuits with embedded memories using SMT. |
ETS |
2013 |
DBLP DOI BibTeX RDF |
|
| 1 | Irith Pomeranz |
Generation of compact multi-cycle diagnostic test sets. |
ETS |
2013 |
DBLP DOI BibTeX RDF |
|
| 1 | H.-J. Lin, Xuan-Lun Huang, Jiun-Lang Huang |
A mutual characterization based SAR ADC self-testing technique. |
ETS |
2013 |
DBLP DOI BibTeX RDF |
|
| 1 | Yuma Higuchi, Kenichi Shinkai, Masanori Hashimoto, Rahul M. Rao, Sani R. Nassif |
Extracting device-parameter variations using a single sensitivity-configurable ring oscillator. |
ETS |
2013 |
DBLP DOI BibTeX RDF |
|
| 1 | Shaji Krishnan, Hans G. Kerkhoff |
A robust metric for screening outliers from analogue product manufacturing tests responses. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Artur Jutman, Sergei Devadze, Igor Aleksejev, Thomas Wenzel |
Embedded synthetic instruments for Board-Level testing. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Armin Krieg, Johannes Grinschgl, Christian Steger, Reinhold Weiss, Andreas Genser, Holger Bock, Josef Haid |
Characterization and handling of low-cost micro-architectural signatures in MPSoCs. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Jaan Raik |
FP7 collaborative research project DIAMOND: Diagnosis, error modeling and correction for reliable systems design. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Vasilis F. Pavlidis, Hu Xu 0002, Giovanni De Micheli |
Enhanced wafer matching heuristics for 3-D ICs. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Matthias Sauer 0002, Alexander Czutro, Bernd Becker 0001, Ilia Polian |
On the quality of test vectors for post-silicon characterization. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Fabian Oboril, Mehdi Baradaran Tahoori |
Reducing wearout in embedded processors using proactive fine-grain dynamic runtime adaptation. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Jae Wook Lee, Ji Hwan (Paul) Chun, Jacob A. Abraham |
Indirect method for random jitter measurement on SoCs using critical path characterization. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Marco Ottavi |
Introducing MEDIAN: A new COST Action on manufacturable and dependable multicore architectures at nanoscale. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard 0001, Aida Todri, Guillaume Prenat, Jérémy Alvarez-Herault, Ken Mackay |
Coupling-based resistive-open defects in TAS-MRAM architectures. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Chandra K. H. Suresh, Ozgur Sinanoglu, Sule Ozev |
Adaptive testing of chips with varying distributions of unknown response bits. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Abishek Ramdas, Ozgur Sinanoglu |
Toggle-masking scheme for x-filtering. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Xinli Gu, Jeff Rearick, Bill Eklow, Martin Keim, Jun Qian, Artur Jutman, Krishnendu Chakrabarty, Erik Larsson |
Re-using chip level DFT at board level. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard 0001, Aida Todri, Arnaud Virazel, Nabil Badereddine |
Defect analysis in power mode control logic of low-power SRAMs. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Alexander Czutro, Matthias Sauer 0002, Ilia Polian, Bernd Becker 0001 |
Multi-conditional SAT-ATPG for power-droop testing. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Arvind Jain, Rubin A. Parekhji |
Time-division multiplexing for testing SoCs with DVS and multiple voltage islands. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Irith Pomeranz |
On the detection of path delay faults by functional broadside tests. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Yukiya Miura, Yasuo Sato, Yousuke Miyake, Seiji Kajihara |
On-chip temperature and voltage measurement for field testing. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Said Hamdioui, Rob Aitken |
VLSI Test technology: Why is the field not sexy enough? |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Ender Yilmaz, Sule Ozev, Ozgur Sinanoglu, Peter C. Maxwell |
Adaptive testing: Conquering process variations. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Asma Laraba, Haralampos-G. D. Stratigopoulos, Salvador Mir, Hervé Naudet, Christophe Forel |
Enhanced reduced code linearity test technique for multi-bit/stage pipeline ADCs. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Zhaobo Zhang, Xinli Gu, Yaohui Xie, Zhiyuan Wang, Zhanglei Wang, Krishnendu Chakrabarty |
Diagnostic system based on support-vector machines for board-level functional diagnosis. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Nadereh Hatami, Rafal Baranowski, Paolo Prinetto, Hans-Joachim Wunderlich |
Efficient system-level aging prediction. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Stefanos Valadimas, Yiorgos Tsiatouhas, Angela Arapoyanni |
Cost and power efficient timing error tolerance in flip-flop based microprocessor cores. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Mahesh Prabhu, Jacob A. Abraham |
Functional test generation for hard to detect stuck-at faults using RTL model checking. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Chih-Sheng Hou, Jin-Fu Li 0001 |
Disturbance fault testing on various NAND flash memories. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Mohamed Azimane |
Reducing test cost for mixed signal circuits "From TOETS to ELESIS". |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Valentin Gherman, Samuel Evain, Yannick Bonhomme |
Memory reliability improvements based on maximized error-correcting codes. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Jean DaRolt, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre |
On-chip test comparison for protecting confidential data in secure ICs. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Cândido Duarte, Henrique Cavadas, Pedro Coke, Luis Malheiro, Vítor Grade Tavares, Pedro Guedes de Oliveira |
BIST design for analog cell matching. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Syed Zafar Shazli, Mehdi Baradaran Tahoori |
Online detection and recovery of transient errors in front-end structures of microprocessors. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Aritra Banerjee, Shyam Kumar Devarakond, Shreyas Sen, Debashis Banerjee, Abhijit Chatterjee |
Testing of digitally assisted adaptive analog/RF systems using tuning knob - Performance space estimation. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Gabriel L. Nazar, Luigi Carro |
Fast error detection through efficient use of hardwired resources in FPGAs. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Riccardo Mariani |
The impact of functional safety standards in the design and test of reliable and available integrated circuits. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Mihalis Psarakis, Andreas Apostolakis |
Fault tolerant FPGA processor based on runtime reconfigurable modules. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Abhishek Jain 0003, Andrea Veggetti 0001, Dennis Crippa, Pierluigi Rolandi |
On-chip delay measurement circuit. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Piet Engelke, Hermann Obermeir |
Funding project DIANA - Integrated diagnostics for the analysis of electronic failures in vehicles. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Urmas Repinski, Hanno Hantson, Maksim Jenihhin, Jaan Raik, Raimund Ubar, Giuseppe Di Guglielmo, Graziano Pravadelli, Franco Fummi |
Combining dynamic slicing and mutation operators for ESL correction. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Manuel J. Barragan Asian, Gildas Léger, José L. Huertas |
OBT for settling error test of sampled-data systems using signal-dependent clocking. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | |
17th IEEE European Test Symposium, ETS 2012, Annecy, France, May 28 - June 1 2012 |
ETS |
2012 |
DBLP BibTeX RDF |
|
| 1 | Ender Yilmaz, Sule Ozev |
Adaptive multi-site testing for analog/mixed-signal circuits incorporating neighborhood information. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Friedrich Hapke, Jürgen Schlöffel |
Introduction to the defect-oriented cell-aware test methodology for significant reduction of DPPM rates. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Stefan Hillebrecht, Michael A. Kochte, Hans-Joachim Wunderlich, Bernd Becker 0001 |
Exact stuck-at fault classification in presence of unknowns. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Fábio P. Itturriet, Ronaldo Rodrigues Ferreira, Luigi Carro |
Fault-Tolerant Algebraic Architecture for radiation induced soft-errors. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Jörg Henkel, Oliver Bringmann 0001, Andreas Herkersdorf, Wolfgang Rosenstiel, Norbert Wehn |
Dependable embedded systems: The German research foundation DFG priority program SPP 1500. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Mehdi Dehbashi, Görschwin Fey, Kaushik Roy 0001, Anand Raghunathan |
Functional analysis of circuits under timing variations. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Xiaoqing Wen |
Power-aware testing: The next stage. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Cristiana Bolchini, Antonio Miele, Chiara Sandionigi |
Increasing autonomous fault-tolerant FPGA-based systems' lifetime. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Jakub Janicki, Jerzy Tyszer, Grzegorz Mrugalski, Janusz Rajski |
Bandwidth-aware test compression logic for SoC designs. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Zhengliang Lv, Linda Milor, Shiyuan Yang |
Impact of NBTI on analog components. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | George Theodorou, Serafeim Chatzopoulos, Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos |
A Software-Based Self-Test methodology for on-line testing of data TLBs. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Samah Mohamed Saeed, Ozgur Sinanoglu |
DfT support for launch and capture power reduction in launch-off-capture testing. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Carolina Metzler, Aida Todri, Alberto Bosio, Luigi Dilillo, Patrick Girard 0001, Arnaud Virazel |
Through-Silicon-Via resistive-open defect analysis. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Q. Wang, Andreas Wallin, Viacheslav Izosimov, Urban Ingelsson, Zebo Peng |
Test tool qualification through fault injection. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Paolo Bernardi, Lyl M. Ciganda, Mauricio de Carvalho, Michelangelo Grosso, Jorge Luis Lagos-Benites, Ernesto Sánchez 0001, Matteo Sonza Reorda, Oscar Ballan |
On-line software-based self-test of the Address Calculation Unit in RISC processors. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Alejandro Cook, Sybille Hellebrand, Hans-Joachim Wunderlich |
Built-in self-diagnosis exploiting strong diagnostic windows in mixed-mode test. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Mohamed Tagelsir Mohammadat, Noohul Basheer Zain Ali, Fawnizu Azmadi Hussin |
Multi-voltage aware resistive open fault modeling. |
ETS |
2012 |
DBLP DOI BibTeX RDF |
|
| 1 | Ozgur Sinanoglu |
Toggle-Based Masking Scheme for Clustered Unknown Response Bits. |
ETS |
2011 |
DBLP DOI BibTeX RDF |
response unknowns, unknown masking, scan based test, response compaction |
| 1 | Tomokazu Yoneda, Makoto Nakao, Michiko Inoue, Yasuo Sato, Hideo Fujiwara |
Temperature-Variation-Aware Test Pattern Optimization. |
ETS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Michail Maniatakos, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris |
AVF Analysis Acceleration via Hierarchical Fault Pruning. |
ETS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Anelise Kologeski, Caroline Concatto, Luigi Carro, Fernanda Lima Kastensmidt |
Improving Reliability in NoCs by Application-Specific Mapping Combined with Adaptive Fault-Tolerant Method in the Links. |
ETS |
2011 |
DBLP DOI BibTeX RDF |
Data Splitting, Fault Tolerance, Mapping, Adaptive Routing, Links, NoCs |
| 1 | Alejandro Cook, Melanie Elm, Hans-Joachim Wunderlich, Ulrich Abelein |
Structural In-Field Diagnosis for Random Logic Circuits. |
ETS |
2011 |
DBLP DOI BibTeX RDF |
In-field diagnosis, Built-In Self-Diagnosis |
| 1 | Alessandro Cilardo, Carmelo Lofiego, Antonino Mazzeo, Nicola Mazzocca |
Revisiting Application-Dependent Test for FPGA Devices. |
ETS |
2011 |
DBLP DOI BibTeX RDF |
Application-Dependent test, FPGA test |
| 1 | Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer |
Reduced ATE Interface for High Test Data Compression. |
ETS |
2011 |
DBLP DOI BibTeX RDF |
channel bandwidth management, embedded deterministic test, test interface, tri-modal compression, test data compression, scan-based designs |
| 1 | Chun-Chuan Chi, Erik Jan Marinissen, Sandeep Kumar Goel, Cheng-Wen Wu |
DfT Architecture for 3D-SICs with Multiple Towers. |
ETS |
2011 |
DBLP DOI BibTeX RDF |
three-dimensional stacking, 3D-SIC, multi-tower, DfT, wrapper, design-for-test, TSV, through-silicon via |
| 1 | |
16th European Test Symposium, ETS 2011, Trondheim, Norway, May 23-27, 2011 |
ETS |
2011 |
DBLP BibTeX RDF |
|
| 1 | Harm C. M. Bossers, Johann L. Hurink, Gerard J. M. Smit |
Online Univariate Outlier Detection in Final Test: A Robust Rolling Horizon Approach. |
ETS |
2011 |
DBLP DOI BibTeX RDF |
online outlier detection, final test, robust |
| 1 | Ilia Polian, Bernd Becker 0001, Sybille Hellebrand, Hans-Joachim Wunderlich, Peter C. Maxwell |
Towards Variation-Aware Test Methods. |
ETS |
2011 |
DBLP DOI BibTeX RDF |
Delay test, Adaptive test, Parameter variations |
| 1 | Feng Yuan, Xiao Liu 0011, Qiang Xu 0001 |
On High-Quality Test Pattern Selection and Manipulation. |
ETS |
2011 |
DBLP DOI BibTeX RDF |
Pseudo-functional testing, test overkill, test escape, test pattern selection |
| 1 | Marie Engelene J. Obien, Satoshi Ohtake, Hideo Fujiwara |
F-Scan Test Generation Model for Delay Fault Testing at RTL Using Standard Full Scan ATPG. |
ETS |
2011 |
DBLP DOI BibTeX RDF |
automatic test pattern generation, scan-based test, high-level testing |
| 1 | Mottaqiallah Taouil, Said Hamdioui |
Layer Redundancy Based Yield Improvement for 3D Wafer-to-Wafer Stacked Memories. |
ETS |
2011 |
DBLP DOI BibTeX RDF |
3D stacked-IC, memory redundancy, 3D memory, yield enhancement |
| 1 | Dongsoo Lee, Kaushik Roy 0001 |
Viterbi-Based Efficient Test Data Compression. |
ETS |
2011 |
DBLP DOI BibTeX RDF |
On-Chip Decompressor, Scalability, Logic Test, Test Data Compression, Low-Power Test |
| 1 | Shaji Krishnan, Hans G. Kerkhoff |
A Robust Metric for Screening Outliers from Analogue Product Manufacturing Tests Responses. |
ETS |
2011 |
DBLP DOI BibTeX RDF |
Analogue, Reliability, Test, Outliers, Mahalanobis distance |
| 1 | Aritra Banerjee, Subho Chatterjee, Azad Naeemi, Abhijit Chatterjee |
Power Aware Post-manufacture Tuning of Analog Nanocircuits. |
ETS |
2011 |
DBLP DOI BibTeX RDF |
|
| 1 | Fang Bao, Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, LeRoy Winemberg, Mohammad Tehranipoor |
Critical Fault-Based Pattern Generation for Screening SDDs. |
ETS |
2011 |
DBLP DOI BibTeX RDF |
|
Displaying result #501 - #600 of 896 (100 per page; Change: ) Pages: [ <<][ 1][ 2][ 3][ 4][ 5][ 6][ 7][ 8][ 9][ >>] |
|
![[Valid RSS]](Pics/valid-rss.png "Validate my RSS feed")
data released under the ODC-BY 1.0 license