Search results for "single-event"

Hits ?▲	Authors	Title	Venue	Year	Link
9	Gary Swift	Invited talk I: The foundations of robustness in reconfigurability in a radiation environment: Understanding single-event effects test results on SRAM-based FPGAs.	AHS	2017	DBLP DOI BibTeX RDF
9	Luis Alberto Contreras Benites, Fernanda Lima Kastensmidt	Fault injection methodology for single event effects on clock-gated ASICs.	LATS	2017	DBLP DOI BibTeX RDF
9	Paulo Ricardo Cechelero Villa, Roger C. Goerl, Fabian Vargas 0001, Leticia B. Poehls, Nilberto H. Medina, Nemitala Added, Vitor A. P. de Aguiar, Eduardo L. A. Macchione, Fernando Aguirre, Marcilei Aparecida Guazzelli da Silveira, Eduardo Augusto Bezerra	Analysis of single-event upsets in a Microsemi ProAsic3E FPGA.	LATS	2017	DBLP DOI BibTeX RDF
9	Luca Sterpone, Sarah Azimi, Boyang Du, David Merodio Codinachs, Raoul Grimoldi	Effective Mitigation of Radiation-induced Single Event Transient on Flash-based FPGAs.	ACM Great Lakes Symposium on VLSI	2017	DBLP DOI BibTeX RDF
9	Amr M. S. Tosson, Shimeng Yu, Mohab H. Anis, Lan Wei	1T2R: A novel memory cell design to resolve single-event upset in RRAM arrays.	ASICON	2017	DBLP DOI BibTeX RDF
9	Jia-wei Tan, Yang Guo 0003, Jianjun Chen, Hengzhou Yuan, Xi Chen	A state recovery design against single-event transient in high-speed phase interpolation clock and data recovery circuit.	ASICON	2017	DBLP DOI BibTeX RDF
9	Zhongshan Zheng, Zhentao Li, Gengsheng Chen, Jiajun Luo, Zhengsheng Han	Roles of the gate length and width of the transistors in increasing the single event upset resistance of SRAM cells.	ASICON	2017	DBLP DOI BibTeX RDF
9	Yankang Du, Shuming Chen	A Novel Layout-Based Single Event Transient Injection Approach to Evaluate the Soft Error Rate of Large Combinational Circuits in Complimentary Metal-Oxide-Semiconductor Bulk Technology.	IEEE Trans. Reliab.	2016	DBLP DOI BibTeX RDF
9	Go Matsukawa, Yuta Kimi, Shuhei Yoshida, Shintaro Izumi, Hiroshi Kawaguchi 0001, Masahiko Yoshimoto	Error Propagation Analysis for Single Event Upset considering Masking Effects on Re-Convergent Path.	IEICE Trans. Fundam. Electron. Commun. Comput. Sci.	2016	DBLP DOI BibTeX RDF
9	Wei Wei 0034, Kazuteru Namba, Yong-Bin Kim, Fabrizio Lombardi	A Novel Scheme for Tolerating Single Event/Multiple Bit Upsets (SEU/MBU) in Non-Volatile Memories.	IEEE Trans. Computers	2016	DBLP DOI BibTeX RDF
9	Liang He, Hua Chen, Peng Sun, Xiaofei Jia, Chongguang Dai, Jing Liu 0006, Long Shao, Zhaoqing Liu	Single event upset rate modeling for ultra-deep submicron complementary metal-oxide-semiconductor devices.	Sci. China Inf. Sci.	2016	DBLP DOI BibTeX RDF
9	Haibin Wang, Mulong Li, Xixi Dai, Shuting Shi, Li Chen 0001, Gang Guo	Layout-based Single Event Mitigation Techniques for Dynamic Logic Circuits.	J. Electron. Test.	2016	DBLP DOI BibTeX RDF
9	Yuanqing Li, Haibin Wang, Lixiang Li 0001, Li Chen 0001, Rui Liu 0011, Mo Chen	A Built-in Single Event Upsets Detector for Sequential Cells.	J. Electron. Test.	2016	DBLP DOI BibTeX RDF
9	Yuanqing Li, Lixiang Li 0001, Yuan Ma, Li Chen 0001, Rui Liu 0011, Haibin Wang, Qiong Wu, Michael Newton, Mo Chen	A 10-Transistor 65 nm SRAM Cell Tolerant to Single-Event Upsets.	J. Electron. Test.	2016	DBLP DOI BibTeX RDF
9	Yabin Sun, Jun Fu, Yudong Wang, Wei Zhou, Zhihong Liu, Xiaojin Li, Yanling Shi	Experimental study of bias dependence of pulsed laser-induced single-event transient in SiGe HBT.	Microelectron. Reliab.	2016	DBLP DOI BibTeX RDF
9	Roberta Pilia, Guillaume Bascoul, Kevin Sanchez, Giovanna Mura, Fulvio Infante	Single Event Transient acquisition and mapping for space device Characterization.	Microelectron. Reliab.	2016	DBLP DOI BibTeX RDF
9	Y. Q. de Aguiar, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis	Permanent and single event transient faults reliability evaluation EDA tool.	Microelectron. Reliab.	2016	DBLP DOI BibTeX RDF
9	Chung Tah Chua, Hock Guan Ong, Kevin Sanchez, Philippe Perdu, Chee Lip Gan	Effects of voltage stress on the single event upset (SEU) response of 65 nm flip flop.	Microelectron. Reliab.	2016	DBLP DOI BibTeX RDF
9	Jingqiu Wang, Fujiang Lin, Donglin Wang, Wenna Song, Li Liu, Qiwei Song, Liang Chen	Collection of charge in NMOS from single event effect.	IEICE Electron. Express	2016	DBLP DOI BibTeX RDF
9	Yunlong Zheng, Ruofan Dai, Zhuojun Chen, Shulong Sun, Zheng Wang, Zehua Sang, Min Lin 0005, Shichang Zou	Comparison of single-event transients of T-gate core and IO device in 130 nm partially depleted silicon-on-insulator technology.	IEICE Electron. Express	2016	DBLP DOI BibTeX RDF
9	Robért Glein, Florian Rittner, Albert Heuberger	Adaptive single-event effect mitigation for dependable processing systems.	ReConFig	2016	DBLP DOI BibTeX RDF
9	Illani Mohd Nawi, Basel Halak, Mark Zwolinski	The influence of hysteresis voltage on single event transients in a 65nm CMOS high speed comparator.	ETS	2016	DBLP DOI BibTeX RDF
9	Varadan Savulimedu Veeravalli, Andreas Steininger	Study of a delayed single-event effect in the Muller C-element.	ETS	2016	DBLP DOI BibTeX RDF
9	Ghaith Bany Hamad, Ghaith Kazma, Otmane Aït Mohamed, Yvon Savaria	Efficient and accurate analysis of single event transients propagation using SMT-based techniques.	ICCAD	2016	DBLP DOI BibTeX RDF
9	Ghaith Bany Hamad, Ghaith Kazma, Otmane Aït Mohamed, Yvon Savaria	Comprehensive non-functional analysis of combinational circuits vulnerability to single event transients.	FDL	2016	DBLP DOI BibTeX RDF
9	Ghaith Bany Hamad, Otmane Aït Mohamed, Yvon Savaria	Towards formal abstraction, modeling, and analysis of Single Event Transients at RTL.	ISCAS	2016	DBLP DOI BibTeX RDF
9	Rongmei Chen, Enxia Zhang, Bharat L. Bhuva	Single-event performance of differential flip-flop designs and hardening implication.	IOLTS	2016	DBLP DOI BibTeX RDF
9	Werner Nedel, Fernanda Lima Kastensmidt, José Rodrigo Azambuja	Evaluating the effects of single event upsets in soft-core GPGPUs.	LATS	2016	DBLP DOI BibTeX RDF
9	Jong Kang Park, Jun Sung Go, Jong Tae Kim	A pre-characterization method for multiple single-event transient analysis in cell-based designs.	ISOCC	2016	DBLP DOI BibTeX RDF
9	Jeffrey Prinzie, Michiel Steyaert, Paul Leroux, Jorgen Christiansen, Paulo Moreira	A single-event upset robust, 2.2 GHz to 3.2 GHz, 345 fs jitter PLL with triple-modular redundant phase detector in 65 nm CMOS.	A-SSCC	2016	DBLP DOI BibTeX RDF
9	Ji Li 0006, Jeffrey Draper	Accelerating soft-error-rate (SER) estimation in the presence of single event transients.	DAC	2016	DBLP DOI BibTeX RDF
9	Ramin Rajaei, Mahmoud Tabandeh, Mahdi Fazeli	Single Event Multiple Upset (SEMU) Tolerant Latch Designs in Presence of Process and Temperature Variations.	J. Circuits Syst. Comput.	2015	DBLP DOI BibTeX RDF
9	Ruiqiang Song, Shuming Chen, Yibai He, Yankang Du	Flip-flops soft error rate evaluation approach considering internal single-event transient.	Sci. China Inf. Sci.	2015	DBLP DOI BibTeX RDF
9	Baojun Liu, Li Cai, Yan Li, Qiang Kang	Reliability for nanomagnetic logic (NML) readout circuit under single event effect.	Microelectron. J.	2015	DBLP DOI BibTeX RDF
9	Selahattin Sayil, Li Yuan 0004	Modeling single event crosstalk speedup in nanometer technologies.	Microelectron. J.	2015	DBLP DOI BibTeX RDF
9	Bradley T. Kiddie, William H. Robinson, Daniel B. Limbrick	Single-Event Multiple-Transient Characterization and Mitigation via Alternative Standard Cell Placement Methods.	ACM Trans. Design Autom. Electr. Syst.	2015	DBLP DOI BibTeX RDF
9	Jinxin Zhang, Chaohui He, Hongxia Guo, Du Tang, Cen Xiong, Pei Li, Xin Wang	3-D simulation study of single event effects of SiGe heterojunction bipolar transistor in extreme environment.	Microelectron. Reliab.	2015	DBLP DOI BibTeX RDF
9	Daniela Munteanu, Jean-Luc Autran	3D simulation of single-event-transient effects in symmetrical dual-material double-gate MOSFETs.	Microelectron. Reliab.	2015	DBLP DOI BibTeX RDF
9	Carmine Abbate, Giovanni Busatto, Francesco Iannuzzo, S. Mattiazzo, Annunziata Sanseverino, L. Silvestrin, D. Tedesco, Francesco Velardi	Experimental study of Single Event Effects induced by heavy ion irradiation in enhancement mode GaN power HEMT.	Microelectron. Reliab.	2015	DBLP DOI BibTeX RDF
9	Luca Sterpone, Boyang Du, Sarah Azimi	Radiation-induced single event transients modeling and testing on nanometric flash-based technologies.	Microelectron. Reliab.	2015	DBLP DOI BibTeX RDF
9	Tomoyuki Shoji, Shuichi Nishida, Kimimori Hamada, Hiroshi Tadano	Analysis of neutron-induced single-event burnout in SiC power MOSFETs.	Microelectron. Reliab.	2015	DBLP DOI BibTeX RDF
9	Chunmei Hu, Shuming Chen, Pengcheng Huang, Yao Liu, Jianjun Chen	Evaluating the single event sensitivity of dynamic comparator in 5 Gbps SerDes.	IEICE Electron. Express	2015	DBLP DOI BibTeX RDF
9	Zhikui Duan, Yi Ding, Chong Lu, Zhenyu Zhao, Jianguo Hu, Hong-Zhou Tan	A single-event transient hardened LDO regulator with built-in filter.	IEICE Electron. Express	2015	DBLP DOI BibTeX RDF
9	Jingyan Xu, Shuming Chen, Pengcheng Huang, Peipei Hao, Ruiqiang Song, Chunmei Hu	Single event transient propagation in dynamic complementary metal oxide semiconductor cascade circuits.	IEICE Electron. Express	2015	DBLP DOI BibTeX RDF
9	Lei Chen 0010, Yuanfu Zhao, Zhiping Wen 0001, Jing Zhou, Xuewu Li, Yanlong Zhang, Huabo Sun	300 Thousand Gates Single Event Effect Hardened SRAM-based FPGA for Space Application (Abstract Only).	FPGA	2015	DBLP DOI BibTeX RDF
9	Taiki Uemura, Masanori Hashimoto	Investigation of single event upset and total ionizing dose in FeRAM for medical electronic tag.	IRPS	2015	DBLP DOI BibTeX RDF
9	Taiki Uemura, Takashi Kato, Hideya Matsuyama, Masanori Hashimoto	Impact of package on neutron induced single event upset in 20 nm SRAM.	IRPS	2015	DBLP DOI BibTeX RDF
9	Norbert Seifert, Shah M. Jahinuzzaman, Jyothi Velamala, Nikunj Patel	Susceptibility of planar and 3D tri-gate technologies to muon-induced single event upsets.	IRPS	2015	DBLP DOI BibTeX RDF
9	Nanditha P. Rao, Madhav P. Desai	A Detailed Characterization of Errors in Logic Circuits due to Single-Event Transients.	DSD	2015	DBLP DOI BibTeX RDF
9	Jiannan Zhai, Yangyang He, Fred S. Switzer, Jason O. Hallstrom	A Software Approach to Protecting Embedded System Memory from Single Event Upsets.	EWSN	2015	DBLP DOI BibTeX RDF
9	Walter E. Calienes Bartra, Andrei Vladimirescu, Ricardo Reis 0001	Bulk and FDSOI Sub-micron CMOS transistors resilience to single-event transients.	ICECS	2015	DBLP DOI BibTeX RDF
9	Luca Sterpone, Boyang Du	SET-PAR: Place and Route Tools for the Mitigation of Single Event Transients on Flash-Based FPGAs.	ARC	2015	DBLP DOI BibTeX RDF
9	Aymeric Privat, Lawrence T. Clark	Simple and accurate single event charge collection macro modeling for circuit simulation.	ISCAS	2015	DBLP DOI BibTeX RDF
9	Patrick Nsengiyumva, Qiaoyan Yu	Investigation of single-event upsets in dynamic logic based flip-flops.	ISCAS	2015	DBLP DOI BibTeX RDF
9	Ghaith Bany Hamad, Otmane Aït Mohamed, Yvon Savaria	Efficient multilevel formal analysis and estimation of design vulnerability to Single Event Transients.	IOLTS	2015	DBLP DOI BibTeX RDF
9	René Rydhof Hansen, Kim Guldstrand Larsen, Mads Chr. Olesen, Erik Ramsgaard Wognsen	Formal Methods for Modelling and Analysis of Single-Event Upsets.	IRI	2015	DBLP DOI BibTeX RDF
9	Carlos Viale, Pablo A. Petrashin, Luis E. Toledo, Walter J. Lancioni, Carlos Daniel Vázquez	Single event effects in an analog SOI transconductor: a case study.	LATS	2015	DBLP DOI BibTeX RDF
9	Zhong-Shan Zheng, Zhen-Tao Li, Ning Qiao, Kai Zhao, Fang Yu, Jia-Jun Luo	Comparison of decoupling resistors and capacitors for increasing the single event upset resistance of SRAM cells.	ASICON	2015	DBLP DOI BibTeX RDF
9	Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Tommy Q. Yang, Israel Koren, Zahava Koren	Single Event Upsets and Hot Pixels in digital imagers.	DFTS	2015	DBLP DOI BibTeX RDF
9	Tianqi Wang, Liyi Xiao, Mingxue Huo, Chunhua Qi, Shanshan Liu 0001	Novel technique for P-hit single-event transient mitigation using enhance dummy transistor.	ISQED	2015	DBLP DOI BibTeX RDF
9	Marek Turowski, Klas Lilja	Single-event effects in advanced CMOS technologies - Analysis and mitigation.	MIXDES	2015	DBLP DOI BibTeX RDF
9	Xiaoxuan She, Ningxi Li	Single event transient tolerant frequency divider.	IET Comput. Digit. Tech.	2014	DBLP DOI BibTeX RDF
9	Ramin Rajaei, Mahmoud Tabandeh, Mahdi Fazeli	Soft error rate estimation for Combinational Logic in Presence of Single Event Multiple Transients.	J. Circuits Syst. Comput.	2014	DBLP DOI BibTeX RDF
9	Haibin Wang, Mulong Li, Li Chen 0001, Rui Liu 0011, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Rita Fung, Jinshun Bi	Single Event Resilient Dynamic Logic Designs.	J. Electron. Test.	2014	DBLP DOI BibTeX RDF
9	Yi Ren, Anlin He, Shuting Shi, Gang Guo, Li Chen 0001, Shi-Jie Wen, Richard Wong, N. W. van Vonno, Bharat L. Bhuva	Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser.	J. Electron. Test.	2014	DBLP DOI BibTeX RDF
9	Yi Ren, Li Chen 0001	The Effect of Temperature-Induced Quiescent Operating Point Shift on Single-Event Transient Sensitivity in Analog/Mixed-Signal Circuits.	J. Electron. Test.	2014	DBLP DOI BibTeX RDF
9	Jean-Luc Autran, Maximilien Glorieux, Daniela Munteanu, Sylvain Clerc, Gilles Gasiot, Philippe Roche	Particle Monte Carlo modeling of single-event transient current and charge collection in integrated circuits.	Microelectron. Reliab.	2014	DBLP DOI BibTeX RDF
9	Jean-Max Dutertre, Rodrigo Possamai Bastos, Olivier Potin, Marie-Lise Flottes, Bruno Rouzeyre, Giorgio Di Natale, Alexandre Sarafianos	Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS.	Microelectron. Reliab.	2014	DBLP DOI BibTeX RDF
9	Chao Zhang, Jianjun Chen, Yaqing Chi, Hui Yang	Research on single-event transient mechanism in a novel SOI CMOS technology.	IEICE Electron. Express	2014	DBLP DOI BibTeX RDF
9	David S. Lee, Jeffrey Draper	A framework to quantify FPGA design hardness against radiation-induced single event effects.	MWSCAS	2014	DBLP DOI BibTeX RDF
9	Ghaith Bany Hamad, Syed Rafay Hasan, Otmane Aït Mohamed, Yvon Savaria	Modeling, analyzing, and abstracting single event transient propagation at gate level.	MWSCAS	2014	DBLP DOI BibTeX RDF
9	Bradley T. Kiddie, William H. Robinson	Alternative Standard Cell Placement Strategies for Single-Event Multiple-Transient Mitigation.	ISVLSI	2014	DBLP DOI BibTeX RDF
9	Luca Sterpone, Boyang Du	Analysis and mitigation of single event effects on flash-based FPGAS.	ETS	2014	DBLP DOI BibTeX RDF
9	Nafiseh Khoram, Chadia Zayane, Taous-Meriem Laleg-Kirati, Rabia Djellouli	On the characterization of single-event related brain activity from functional Magnetic Resonance Imaging (fMRI) measurements.	EMBC	2014	DBLP DOI BibTeX RDF
9	Alisson J. C. Lanot, Tiago R. Balen	Reliability Analysis of a 130nm Charge Redistribution SAR ADC under Single Event Effects.	SBCCI	2014	DBLP DOI BibTeX RDF
9	Ghaith Bany Hamad, Otmane Aït Mohamed, Yvon Savaria	Probabilistic model checking of single event transient propagation at RTL level.	ICECS	2014	DBLP DOI BibTeX RDF
9	Ghaith Bany Hamad, Syed Rafay Hasan, Otmane Aït Mohamed, Yvon Savaria	Abstracting Single Event Transient characteristics variations due to input patterns and fan-out.	ISCAS	2014	DBLP DOI BibTeX RDF
9	Christelle Hobeika, Simon Pichette, M. A. Leonard, Claude Thibeault, Jean-François Boland, Yves Audet	Multi-abstraction level signature generation and comparison based on radiation single event upset.	IOLTS	2014	DBLP DOI BibTeX RDF
9	Werner Nedel, Fernanda Lima Kastensmidt, José Rodrigo Azambuja	Implementation and experimental evaluation of a CUDA core under single event effects.	LATW	2014	DBLP DOI BibTeX RDF
9	Alisson J. C. Lanot, Tiago R. Balen	Analysis of the effects of single event transients on an SAR-ADC based on charge redistribution.	LATW	2014	DBLP DOI BibTeX RDF
9	Stefano Di Carlo, Paolo Prinetto, Daniele Rolfo, Pascal Trotta	A fault injection methodology and infrastructure for fast single event upsets emulation on Xilinx SRAM-based FPGAs.	DFT	2014	DBLP DOI BibTeX RDF
9	Cristian Constantinescu, Srini Krishnamoorthy, Tuyen Nguyen	Estimating the effect of single-event upsets on microprocessors.	DFT	2014	DBLP DOI BibTeX RDF
9	Wei Wei 0034, Fabrizio Lombardi, Kazuteru Namba	Designs and analysis of non-volatile memory cells for single event upset (SEU) tolerance.	DFT	2014	DBLP DOI BibTeX RDF
9	Hoda Pahlevanzadeh, Qiaoyan Yu	Systematic analyses for latching probability of single-event transients.	ISQED	2014	DBLP DOI BibTeX RDF
9	Luca Cassano	Analysis and test of the effects of single event upsets affecting the configuration memory of SRAM-based FPGAs.	ITC	2014	DBLP DOI BibTeX RDF
9	Raul Dario Chipana Quispe	Single event transient effects in clock distribution networks.		2014	RDF
9	William Geoffrey Bennett	Single Event Upset Mechanisms in Emerging Memory Technologies.		2014	RDF
9	George Petkov, Nikolay Mladenov, Stiliyan Kalitzin	Integral single-event scene reconstruction from general over-complete sets of measurements with application to explosions localization and charge estimation.	Integr. Comput. Aided Eng.	2013	DBLP DOI BibTeX RDF
9	Varadan Savulimedu Veeravalli, Thomas Polzer, Ulrich Schmid 0001, Andreas Steininger, Michael Hofbauer, Kurt Schweiger, Horst Dietrich, Kerstin Schneider-Hornstein, Horst Zimmermann, Kay-Obbe Voss, Bruno Merk, Michael Hajek	An infrastructure for accurate characterization of single-event transients in digital circuits.	Microprocess. Microsystems	2013	DBLP DOI BibTeX RDF
9	Farouk Smith	A new methodology for single event transient suppression in flash FPGAs.	Microprocess. Microsystems	2013	DBLP DOI BibTeX RDF
9	Enrico Costenaro, Dan Alexandrescu, Kader Belhaddad, Michael Nicolaidis	A Practical Approach to Single Event Transient Analysis for Highly Complex Design.	J. Electron. Test.	2013	DBLP DOI BibTeX RDF
9	Zhichao Zhang, Yi Ren, Li Chen 0001, Nelson J. Gaspard, Arthur F. Witulski, W. Timothy Holman, Bharat L. Bhuva, Shi-Jie Wen, Ramaswami Sammynaiken	A Bulk Built-In Voltage Sensor to Detect Physical Location of Single-Event Transients.	J. Electron. Test.	2013	DBLP DOI BibTeX RDF
9	Nihaar N. Mahatme, Indranil Chatterjee, Akash Patki, Daniel B. Limbrick, Bharat L. Bhuva, Ronald D. Schrimpf, William H. Robinson	An efficient technique to select logic nodes for single event transient pulse-width reduction.	Microelectron. Reliab.	2013	DBLP DOI BibTeX RDF
9	Luca Sterpone	SEL-UP: A CAD tool for the sensitivity analysis of radiation-induced Single Event Latch-Up.	Microelectron. Reliab.	2013	DBLP DOI BibTeX RDF
9	I. El Moukhtari, Vincent Pouget, C. Larue, Frédéric Darracq, Dean Lewis, Philippe Perdu	Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell.	Microelectron. Reliab.	2013	DBLP DOI BibTeX RDF
9	Nogaye Mbaye, Vincent Pouget, Frédéric Darracq, Dean Lewis	Characterization and modeling of laser-induced single-event burn-out in SiC power diodes.	Microelectron. Reliab.	2013	DBLP DOI BibTeX RDF
9	Selahattin Sayil, Sumanth R. Yeddula, Juyu Wang	Single-Event Coupling Soft Errors in Nanoscale CMOS Circuits.	IEEE Des. Test	2013	DBLP DOI BibTeX RDF
9	Hariprasath Venkatram, Jon Guerber, Manideep Gande, Un-Ku Moon	Detection and Correction Methods for Single Event Effects in Analog to Digital Converters.	IEEE Trans. Circuits Syst. I Regul. Pap.	2013	DBLP DOI BibTeX RDF
9	Alireza Rohani, Hans G. Kerkhoff, Enrico Costenaro, Dan Alexandrescu	Pulse-length determination techniques in the rectangular single event transient fault model.	ICSAMOS	2013	DBLP DOI BibTeX RDF
9	Antonio Calomarde, Esteve Amat, Francesc Moll, Antonio Rubio 0001	A single event transient hardening circuit design technique based on strengthening.	MWSCAS	2013	DBLP DOI BibTeX RDF