Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
1 | Wenjing Rao, Alex Orailoglu, Ramesh Karri |
Fault Identification in Reconfigurable Carry Lookahead Adders Targeting Nanoelectronic Fabrics. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Robin Saxby |
Innovation and Wealth Creation from Technology. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Yu-Jen Huang, Jin-Fu Li 0001 |
Testing Active Neighborhood Pattern-Sensitive Faults of Ternary Content Addressable Memories. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Mohammad Hosseinabady, Pejman Lotfi-Kamran, Giorgio Di Natale, Stefano Di Carlo, Alfredo Benso, Paolo Prinetto |
Single-Event Upset Analysis and Protection in High Speed Circuits. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Mikaël Cimino, Hervé Lapuyade, M. De Matos, Thierry Taris, Yann Deval, Jean-Baptiste Bégueret |
A Robust 130nm-CMOS Built-In Current Sensor Dedicated to RF Applications. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
Analog and mixed-signal integrated circuits, Robustness, Design for testability, CMOS technology, Built-In current sensor |
1 | Xuan-Tu Tran, Jean Durupt, François Bertrand, Vincent Beroulle, Chantal Robach |
A DFT Architecture for Asynchronous Networks-on-Chip. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Noohul Basheer Zain Ali, Mark Zwolinski, Bashir M. Al-Hashimi, Peter Harrod |
Dynamic Voltage Scaling Aware Delay Fault Testing. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Bill Eklow, Ben Bennetts |
New Techniques for Accessing Embedded Instrumentation: IEEE P1687 (IJTAG). |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Shalabh Goyal, Abhijit Chatterjee, Mike Atia |
Reducing Sampling Clock Jitter to Improve SNR Measurement of A/D Converters in Production Test. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz |
A Unified Method to Detect Transistor Stuck-Open Faults and Transition Delay Faults. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Gildas Léger, Adoración Rueda |
Experimental Validation of a Fully Digital BISTfor Cascaded Sigma Delta Modulators. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian |
Minimal March Tests for Dynamic Faults in Random Access Memories. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Frank Poehl, Jan Rzeha, Matthias Beck, Michael Gössel, Ralf Arnold, Peter Ossimitz |
On-Chip Evaluation, Compensation, and Storage of Scan Diagnosis Data - A Test Time Efficient Scan Diagnosis Architecture. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Byoungho Kim, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham |
Optimized Signature-Based Statistical Alternate Test for Mixed-Signal Performance Parameters. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Slimane Boutobza, Michael Nicolaidis, Kheiredine M. Lamara, Andrea Costa |
A Transparent based Programmable Memory BIST. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Vincent Fresnaud, Lilian Bossuet, Dominique Dallet, Serge Bernard, Jean-Marie Janik, B. Agnus, Philippe Cauvet, Ph. Gandy |
A Low Cost Alternative Method for Harmonics Estimation in a BIST Context. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto |
A 22n March Test for Realistic Static Linked Faults in SRAMs. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Erik Schüler, Daniel Scain Farenzena, Luigi Carro |
Evaluating Sigma-Delta Modulated Signals to Develop Fault-Tolerant Circuits. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Giuseppe Di Guglielmo, Franco Fummi, Cristina Marconcini, Graziano Pravadelli |
FATE: a Functional ATPG to Traverse Unstabilized EFSMs. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Delong Shang, Alexandre Yakovlev, Frank P. Burns, Fei Xia, Alexandre V. Bystrov |
Low-Cost Online Testing of Asynchronous Handshakes. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Steve B. Furber |
Living with Failure: Lessons from Nature? |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Qiang Xu 0001, Baosheng Wang, F. Y. Young |
Retention-Aware Test Scheduling for BISTed Embedded SRAMs. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Gefu Xu, Adit D. Singh |
Low Cost Launch-on-Shift Delay Test with Slow Scan Enable. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Ramashis Das, Igor L. Markov, John P. Hayes |
On-Chip Test Generation Using Linear Subspaces. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Artur Pogiel, Janusz Rajski, Jerzy Tyszer |
Convolutional Compactors with Variable Polynomials. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee |
Improving SNR for DSM Linear Systems Using Probabilistic Error Correction and State Restoration: A Comparative Study. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Michal Kopec, Tomasz Garbolino, Krzysztof Gucwa, Andrzej Hlawiczka |
Test-per-Clock Detection, Localization and Identification of Interconnect Faults. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Irith Pomeranz, Sudhakar M. Reddy |
Fault Collapsing for Transition Faults Using Extended Transition Faults. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | |
11th European Test Symposium, ETS 2006, Southhampton, UK, May 21-24, 2006 |
ETS |
2006 |
DBLP BibTeX RDF |
|
1 | Bernd Laquai, Martin Hua, Guido Schulze, Michael Braun |
A Flexible and Scaleable Methodology for Testing High Speed Source Synchronous Interfaces on ATE with Multiple Fixed Phase Capture and Compare. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell |
"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Tino Heijmen, André Nieuwland |
Soft-Error Rate Testing of Deep-Submicron Integrated Circuits. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Donghoon Han, Shalabh Goyal, Soumendu Bhattacharya, Abhijit Chatterjee |
Low Cost Parametric Failure Diagnosis of RF Transceivers. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Dan Zhao 0001, Shambhu J. Upadhyaya, Martin Margala |
A new SoC test architecture with RF/wireless connectivity. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | |
10th European Test Symposium, ETS 2005, Tallinn, Estonia, May 22-25, 2005 |
ETS |
2005 |
DBLP BibTeX RDF |
|
1 | Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer, Chen Wang 0014 |
Convolutional compaction-driven diagnosis of scan failures. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Xinyue Fan, Will R. Moore, Camelia Hora, Guido Gronthoud |
Stuck-open fault diagnosis with stuck-at model. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Fei Xin, Maciej J. Ciesielski, Ian G. Harris |
Design validation of behavioral VHDL descriptions for arbitrary fault models. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Franco Fummi, Graziano Pravadelli, Franco Toto |
Coverage of formal properties based on a high-level fault model and functional ATPG. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Smita Krishnaswamy, Igor L. Markov, John P. Hayes |
Logic circuit testing for transient faults. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Luigi Dilillo, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian Hage-Hassan |
Resistive-open defect influence in SRAM pre-charge circuits: analysis and characterization. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Urban Ingelsson, Sandeep Kumar Goel, Erik Larsson, Erik Jan Marinissen |
Test scheduling for modular SOCs in an abort-on-fail environment. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Mohammad Gh. Mohammad, Laila Terkawi |
Fault collapsing for flash memory disturb faults. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Jaan Raik, Raimund Ubar, Joachim Sudbrock, Wieslaw Kuzmicz, Witold A. Pleskacz |
DOT: new deterministic defect-oriented ATPG tool. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto |
Automatic March tests generation for static and dynamic faults in SRAMs. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Hans-Joachim Wunderlich |
From embedded test to embedded diagnosis. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | David Hély, Frédéric Bancel, Marie-Lise Flottes, Bruno Rouzeyre |
Test control for secure scan designs. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Matthew Collins, Bashir M. Al-Hashimi, J. Neil Ross |
A programmable time measurement architecture for embedded memory characterization. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Philipp Öhler, Sybille Hellebrand |
Low power embedded DRAMs with high quality error correcting capabilities. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Ganesh Srinivasan, Sasikumar Cherubal, Pramodchandran N. Variyam, Melese Teklu, C. P. Wang, David Guidry, Abhijit Chatterjee |
Accurate measurement of multi-tone power ratio (MTPR) of ADSL devices using low cost testers. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda |
Exploiting an infrastructure IP to reduce memory diagnosis costs in SoCs. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Matteo Sonza Reorda, Luca Sterpone, Massimo Violante |
Multiple errors produced by single upsets in FPGA configuration memory: a possible solution. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Carl Jeffrey, Zhou Xu, Andrew Richardson 0001 |
Bias Superposition - An On-Line Test Strategy for a MEMS Based Conductivity Sensor. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Peter Maxwell |
Test for low cost CMOS image sensors. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Hans G. Kerkhoff |
Testing of MEMS-based microsystems. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Irith Pomeranz, Sudhakar M. Reddy |
Using dummy bridging faults to define a reduced set of target faults. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Gang Chen 0011, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski, Piet Engelke, Bernd Becker 0001 |
A unified fault model and test generation procedure for interconnect opens and bridges. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Raimund Ubar, Tatjana Shchenova, Gert Jervan, Zebo Peng |
Energy minimization for hybrid BIST in a system-on-chip test environment. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Zhanglei Wang, Krishnendu Chakrabarty |
Built-in self-test of molecular electronics-based nanofabrics. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Amir Zjajo, José Pineda de Gyvez |
Evaluation of signature-based testing of RF/analog circuits. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Chuck Hawkins, Jaume Segura 0001 |
The anatomy of nanometer timing failures. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Víctor H. Champac, Antonio Zenteno, José L. Garcia |
Testing of resistive opens in CMOS latches and flip-flops. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara |
Acceleration of transition test generation for acyclic sequential circuits utilizing constrained combinational stuck-at test generation. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Arijit Raychowdhury, Swaroop Ghosh, Swarup Bhunia, Debjyoti Ghosh, Kaushik Roy 0001 |
A novel delay fault testing methodology using on-chip low-overhead delay measurement hardware at strategic probe points. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Adam B. Kinsman, Nicola Nicolici |
Time-multiplexed test data decompression architecture for core-based SOCs with improved utilization of tester channels. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Frédérick Mailly, Florence Azaïs, Norbert Dumas, Laurent Latorre, Pascal Nouet |
Towards on-line testing of MEMS using electro-thermal excitation. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Achraf Dhayni, Salvador Mir, Libor Rufer |
Evaluation of impulse response-based BIST techniques for MEMS in the presence of weak nonlinearities. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Bharath Seshadri, Irith Pomeranz, Sudhakar M. Reddy, Sandip Kundu |
Path-oriented transition fault test generation considering operating conditions. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras |
Defective behaviours of resistive opens in interconnect lines. |
ETS |
2005 |
DBLP DOI BibTeX RDF |
|
1 | Ad J. van de Goor, Said Hamdioui, Zaid Al-Ars |
Tests for address decoder delay faults in RAMs due to inter-gate opens. |
ETS |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Artur Jutman |
At-speed on-chip diagnosis of board-level interconnect faults. |
ETS |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel |
A new self-checking multiplier by use of a code-disjoint sum-bit duplicated adder. |
ETS |
2004 |
DBLP DOI BibTeX RDF |
|
1 | |
9th European Test Symposium, ETS 2004, Ajaccio, France, May 23-26, 2004 |
ETS |
2004 |
DBLP BibTeX RDF |
|
1 | Yannick Bonhomme, Tomokazu Yoneda, Hideo Fujiwara, Patrick Girard 0001 |
An efficient scan tree design for test time reduction. |
ETS |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Norbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet |
Electrically-induced thermal stimuli for MEMS testing. |
ETS |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Victor Avendaño, Víctor H. Champac, Joan Figueras |
Signal integrity verification using high speed monitors. |
ETS |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Paul Theo Gonciari, Bashir M. Al-Hashimi |
A compression-driven test access mechanism design approach. |
ETS |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Seiji Kajihara, Kewal K. Saluja, Sudhakar M. Reddy |
Enhanced 3-valued logic/fault simulation for full scan circuits using implicit logic values. |
ETS |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Bruce R. Parnas, Ankan K. Pramanick, Mark Elston, Toshiaki Adachi |
Software development for an open architecture test system. |
ETS |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Uros Kac, Franc Novak |
All-pass SC biquad reconfiguration scheme for oscillation based analog BIST. |
ETS |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Ludovic A. Krundel, Sandeep Kumar Goel, Erik Jan Marinissen, Marie-Lise Flottes, Bruno Rouzeyre |
User-constrained test architecture design for modular SOC testing. |
ETS |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla |
A new BIST scheme for 5GHz low noise amplifiers. |
ETS |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Fei Su, Sule Ozev, Krishnendu Chakrabarty |
Test planning and test resource optimization for droplet-based microfluidic systems. |
ETS |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Tian Xia, Peilin Song, Keith A. Jenkins, Jien-Chung Lo |
Delay chain based programmable jitter generator. |
ETS |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara |
A design methodology to realize delay testable controllers using state transition information. |
ETS |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin |
Towards a BIST technique for noise figure evaluation. |
ETS |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Ramyanshu Datta, Antony Sebastine, Jacob A. Abraham |
Delay fault testing and silicon debug using scan chains. |
ETS |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Xiangdong Xuan, Abhijit Chatterjee, Adit D. Singh |
Application of local design-for-reliability techniques for reducing wear-out degradation of CMOS combinational logic circuits. |
ETS |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Patrick Girard 0001, Olivier Héron, Serge Pravossoudovitch, Michel Renovell |
Manufacturing-oriented testing of delay faults in the logic architecture of symmetrical FPGAs. |
ETS |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Octavian Petre, H. G. Kerkho |
Accurate tap-delay measurements using a di .erential oscillation technique. |
ETS |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Franco Fummi, Cristina Marconcini, Graziano Pravadelli |
Functional fault coverage: the chamber of secrets or an accurate estimation of gate-level coverage? |
ETS |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Ozgur Sinanoglu, Alex Orailoglu |
Pipelined test of SOC cores through test data transformations. |
ETS |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Kedarnath J. Balakrishnan, Nur A. Touba |
Relating entropy theory to test data compression. |
ETS |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Luigi Dilillo, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan |
Dynamic read destructive fault in embedded-SRAMs: analysis and march test solution. |
ETS |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Piet Engelke, Ilia Polian, Michel Renovell, Bernd Becker 0001 |
Automatic test pattern generation for resistive bridging faults. |
ETS |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Achraf Dhayni, Salvador Mir, Libor Rufer |
Mems built-in-self-test using MLS. |
ETS |
2004 |
DBLP DOI BibTeX RDF |
|