Search results for "NBTI"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
18	Balaji Vaidyanathan, Anthony S. Oates, Yuan Xie 0001	Intrinsic NBTI-variability aware statistical pipeline performance assessment and tuning.	ICCAD	2009	DBLP DOI BibTeX RDF
18	Hao-I Yang, Ching-Te Chuang, Wei Hwang	Impacts of NBTI and PBTI on Power-gated SRAM with High-k Metal-gate Devices.	ISCAS	2009	DBLP DOI BibTeX RDF
18	C. Guardiani, A. Shibkov, Angelo Brambilla, Giancarlo Storti Gajani, Davide Appello, Fausto Piazza, Paolo Bernardi	An I-IP based approach for the monitoring of NBTI effects in SoCs.	IOLTS	2009	DBLP DOI BibTeX RDF
18	Dominik Lorenz, Georg Georgakos, Ulf Schlichtmann	Aging analysis of circuit timing considering NBTI and HCI.	IOLTS	2009	DBLP DOI BibTeX RDF
18	Maurício Banaszeski da Silva, Vinicius V. A. Camargo, Lucas Brusamarello, Gilson I. Wirth, Roberto da Silva	NBTI-aware technique for transistor sizing of high-performance CMOS gates.	LATW	2009	DBLP DOI BibTeX RDF
18	Thomas Aichinger, Michael Nelhiebel, Tibor Grasser	On the temperature dependence of NBTI recovery.	Microelectron. Reliab.	2008	DBLP DOI BibTeX RDF
18	Stefano Aresu, Reinhard Pufall, Michael Goroll, Wolfgang Gustin	NBTI on smart power technologies: A detailed analysis of two concurrent effects using a re-examined on-the-fly technique.	Microelectron. Reliab.	2008	DBLP DOI BibTeX RDF
18	Anastasios A. Katsetos	Negative bias temperature instability (NBTI) recovery with bake.	Microelectron. Reliab.	2008	DBLP DOI BibTeX RDF
18	Arnost Neugroschel, Gennadi Bersuker, Rino Choi	Applications of DCIV method to NBTI characterization.	Microelectron. Reliab.	2007	DBLP DOI BibTeX RDF
18	Sung Jun Jang, Dae Hyun Ka, Chong-Gun Yu, Kwan-Su Kim, Won-Ju Cho, Jong Tae Park 0003	Comparative study of NBTI as a function of Si film orientation and thickness in SOI pMOSFETs.	Microelectron. Reliab.	2007	DBLP DOI BibTeX RDF
18	A. Shickova, Ben Kaczer, Anabela Veloso, Marc Aoulaiche, M. Houssa, Herman E. Maes, Guido Groeseneken, J. A. Kittl	NBTI reliability of Ni FUSI/HfSiON gates: Effect of silicide phase.	Microelectron. Reliab.	2007	DBLP DOI BibTeX RDF
18	C. Y. Lu, Horng-Chih Lin, Y. J. Lee	Dynamic NBTI characteristics of PMOSFETs with PE-SiN capping.	Microelectron. Reliab.	2007	DBLP DOI BibTeX RDF
18	Helmut Puchner	NBTI product level reliability for a low-power SRAM technology.	Microelectron. Reliab.	2007	DBLP DOI BibTeX RDF
18	Stefano Aresu, Werner Kanert, Reinhard Pufall, Michael Goroll	Exceptional operative gate voltage induces negative bias temperature instability (NBTI) on n-type trench DMOS transistors.	Microelectron. Reliab.	2007	DBLP DOI BibTeX RDF
18	Muhammad Ashraful Alam, Haldun Kufluoglu, Dhanoop Varghese, S. Mahapatra	A comprehensive model for PMOS NBTI degradation: Recent progress.	Microelectron. Reliab.	2007	DBLP DOI BibTeX RDF
18	C. R. Parthasarathy, Alain Bravaix, Chloe Guérin, M. Denais, Vincent Huard	Design-In Reliability for 90-65nm CMOS Nodes Submitted to Hot-Carriers and NBTI Degradation.	PATMOS	2007	DBLP DOI BibTeX RDF
18	Kunhyuk Kang, Muhammad Ashraful Alam, Kaushik Roy 0001	Characterization of NBTI induced temporal performance degradation in nano-scale SRAM array using IDDQ.	ITC	2007	DBLP DOI BibTeX RDF
18	Vincent Huard, M. Denais, C. R. Parthasarathy	NBTI degradation: From physical mechanisms to modelling.	Microelectron. Reliab.	2006	DBLP DOI BibTeX RDF
18	Marty Agostinelli, Shing Lau, Sangwoo Pae, Phil Marzolf, Harish Muthali, Steve Jacobs	PMOS NBTI-induced circuit mismatch in advanced technologies.	Microelectron. Reliab.	2006	DBLP DOI BibTeX RDF
18	Sarvesh Bhardwaj, Wenping Wang, Rakesh Vattikonda, Yu Cao 0001, Sarma B. K. Vrudhula	Predictive Modeling of the NBTI Effect for Reliable Design.	CICC	2006	DBLP DOI BibTeX RDF
18	Kunhyuk Kang, Haldun Kufluoglu, Muhammad Ashraful Alam, Kaushik Roy 0001	Efficient Transistor-Level Sizing Technique under Temporal Performance Degradation due to NBTI.	ICCD	2006	DBLP DOI BibTeX RDF
18	Shyue Seng Tan, Tupei Chen, Lap Chan	Dynamic NBTI lifetime model for inverter-like waveform.	Microelectron. Reliab.	2005	DBLP DOI BibTeX RDF
18	Prasad Chaparala, Douglas Brisbin	Impact of NBTI and HCI on PMOSFET threshold voltage drift.	Microelectron. Reliab.	2005	DBLP DOI BibTeX RDF
18	Hideki Aono, Eiichi Murakami, Kousuke Okuyama, A. Nishida, Masataka Minami, Y. Ooji, Katsuhiko Kubota	Modeling of NBTI saturation effect and its impact on electric field dependence of the lifetime.	Microelectron. Reliab.	2005	DBLP DOI BibTeX RDF
18	Vincent Huard, M. Denais, F. Perrier, Nathalie Revil, C. R. Parthasarathy, Alain Bravaix, E. Vincent	A thorough investigation of MOSFETs NBTI degradation.	Microelectron. Reliab.	2005	DBLP DOI BibTeX RDF
18	Muhammad Ashraful Alam, S. Mahapatra	A comprehensive model of PMOS NBTI degradation.	Microelectron. Reliab.	2005	DBLP DOI BibTeX RDF
18	Shimpei Tsujikawa, Jiro Yugami	Positive charge generation due to species of hydrogen during NBTI phenomenon in pMOSFETs with ultra-thin SiON gate dielectrics.	Microelectron. Reliab.	2005	DBLP DOI BibTeX RDF
18	Yao-Jen Lee, Tien-Sheng Chao, Tiao-Yuan Huang	High voltage applications and NBTI effects of DT-pMOSFETS with reverse Schottky substrate contacts.	Microelectron. Reliab.	2005	DBLP DOI BibTeX RDF
18	Lifeng Wu	NBTI/HCI Modeling and Full-Chip Analysis in Design Environment.	ISQED	2003	DBLP DOI BibTeX RDF
18	Mahesh S. Krishnan, Viktor Kol'dyaev, Eiji Morifoji, Koji Miyamoto, Tomasz Brozek, Xiaolei Li	Series resistance degradation due to NBTI in PMOSFET.	Microelectron. Reliab.	2002	DBLP DOI BibTeX RDF
15	Avinash Karanth Kodi, Ashwini Sarathy, Ahmed Louri, Janet Meiling Wang	Adaptive inter-router links for low-power, area-efficient and reliable Network-on-Chip (NoC) architectures.	ASP-DAC	2009	DBLP DOI BibTeX RDF
15	Sanjay V. Kumar, Chris H. Kim, Sachin S. Sapatnekar	Adaptive techniques for overcoming performance degradation due to aging in digital circuits.	ASP-DAC	2009	DBLP DOI BibTeX RDF
15	Bin Zhang 0011	Online circuit reliability monitoring.	ACM Great Lakes Symposium on VLSI	2009	DBLP DOI BibTeX RDF	reliability, circuit, macromodel, online monitoring
15	Chenyue Ma, Bo Li, Lining Zhang, Jin He 0003, Xing Zhang 0002, Xinnan Lin, Mansun Chan	A unified FinFET reliability model including high K gate stack dynamic threshold voltage, hot carrier injection, and negative bias temperature instability.	ISQED	2009	DBLP DOI BibTeX RDF
15	Eric Karl, David T. Blaauw, Dennis Sylvester, Trevor N. Mudge	Multi-Mechanism Reliability Modeling and Management in Dynamic Systems.	IEEE Trans. Very Large Scale Integr. Syst.	2008	DBLP DOI BibTeX RDF
15	Suresh Srinivasan, Krishnan Ramakrishnan, Prasanth Mangalagiri, Yuan Xie 0001, Vijaykrishnan Narayanan, Mary Jane Irwin, Karthik Sarpatwari	Toward Increasing FPGA Lifetime.	IEEE Trans. Dependable Secur. Comput.	2008	DBLP DOI BibTeX RDF	Reliability, Reconfigurable hardware, availability and serviceability
15	Prasanth Mangalagiri, Sungmin Bae, Krishnan Ramakrishnan, Yuan Xie 0001, Vijaykrishnan Narayanan	Thermal-aware reliability analysis for platform FPGAs.	ICCAD	2008	DBLP DOI BibTeX RDF
15	Nimay Shah, Rupak Samanta, Ming Zhang, Jiang Hu, Duncan Walker	Built-In Proactive Tuning System for Circuit Aging Resilience.	DFT	2008	DBLP DOI BibTeX RDF
15	Baker Mohammad, Martin Saint-Laurent, Paul Bassett, Jacob A. Abraham	Cache Design for Low Power and High Yield.	ISQED	2008	DBLP DOI BibTeX RDF	reduce voltage swing, sram yield, SRAM 6T cell, cache design, parametric failure
15	Philippe Magarshack	Design challenges in 45nm and below: DFM, low-power and design for reliability.	ACM Great Lakes Symposium on VLSI	2007	DBLP DOI BibTeX RDF	design for reliability, low-power design, design for manufacturability
15	Kunhyuk Kang, Keejong Kim, Kaushik Roy 0001	Variation Resilient Low-Power Circuit Design Methodology using On-Chip Phase Locked Loop.	DAC	2007	DBLP DOI BibTeX RDF
15	Dennis Sylvester, David T. Blaauw, Eric Karl	ElastIC: An Adaptive Self-Healing Architecture for Unpredictable Silicon.	IEEE Des. Test Comput.	2006	DBLP DOI BibTeX RDF	unpredictable silicon, runtime self-diagnosis, adaptivity, architecture, process variations, self-healing, ElastIC, technology scaling
15	Robert C. Aitken	Reliability Issues for Embedded SRAM at 90nm and Below.	IOLTS	2006	DBLP DOI BibTeX RDF
15	Ananth Somayaji Goda, Gautam Kapila	Design For Degradation : CAD Tools for Managing Transistor Degradation Mechanisms.	ISQED	2005	DBLP DOI BibTeX RDF