Search results for "yield"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
12	Diana Marculescu, Siddharth Garg	Process-Driven Variability Analysis of Single and Multiple Voltage-Frequency Island Latency-Constrained Systems.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2008	DBLP DOI BibTeX RDF
12	Saibal Mukhopadhyay, Hamid Mahmoodi, Kaushik Roy 0001	Reduction of Parametric Failures in Sub-100-nm SRAM Array Using Body Bias.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2008	DBLP DOI BibTeX RDF
12	Shuhei Miyashita, Max Kessler, Marco Lungarella	How morphology affects self-assembly in a stochastic modular robot.	ICRA	2008	DBLP DOI BibTeX RDF
12	Phiroze N. Parakh, Shankar Krishnamoorthy	A robust approach to lithography friendly design implementation.	ISPD	2008	DBLP DOI BibTeX RDF
12	Feng Wang 0004, Yuan Xie 0001	Embedded Multi-Processor System-on-chip (MPSoC) design considering process variations.	IPDPS	2008	DBLP DOI BibTeX RDF
12	Rehman Ashraf, Malgorzata Chrzanowska-Jeske, Siva G. Narendra	Carbon nanotube circuit design choices in the presence of metallic tubes.	ISCAS	2008	DBLP DOI BibTeX RDF
12	Yibo Chen, Jin Ouyang, Yuan Xie 0001	ILP-based scheme for timing variation-aware scheduling and resource binding.	SoCC	2008	DBLP DOI BibTeX RDF
12	Lun-Chun Wei, Hung-Ming Chen, Li-Da Huang, Sarah Songjie Xu	Efficient and optimal post-layout double-cut via insertion by network relaxation and min-cost maximum flow.	ACM Great Lakes Symposium on VLSI	2008	DBLP DOI BibTeX RDF	redundant via insertion, network flow, relaxation
12	Fadi J. Kurdahi, Nikil D. Dutt, Ahmed M. Eltawil, Sani R. Nassif	Cross-Layer Approaches to Designing Reliable Systems Using Unreliable Chips.	VLSI Design	2008	DBLP DOI BibTeX RDF
12	Yan Lin 0001, Lei He 0001	Stochastic physical synthesis for FPGAs with pre-routing interconnect uncertainty and process variation.	FPGA	2007	DBLP DOI BibTeX RDF	FPGA, uncertainty, process variation, stochastic, physical synthesis
12	Yan Lin 0001, Lei He 0001	Interactive presentation: Statistical dual-Vdd assignment for FPGA interconnect power reduction.	DATE	2007	DBLP DOI BibTeX RDF
12	Vishal Khandelwal, Ankur Srivastava 0001	Variability-driven formulation for simultaneous gate sizing and post-silicon tunability allocation.	ISPD	2007	DBLP DOI BibTeX RDF	post-silicon tunability, variability, stochastic optimization, timing optimization, gate sizing
12	Vishal Khandelwal, Ankur Srivastava 0001	Monte-Carlo driven stochastic optimization framework for handling fabrication variability.	ICCAD	2007	DBLP DOI BibTeX RDF
12	Debabrata Mohapatra, Georgios Karakonstantis, Kaushik Roy 0001	Low-power process-variation tolerant arithmetic units using input-based elastic clocking.	ISLPED	2007	DBLP DOI BibTeX RDF	elastic clocking, process tolerant, low power
12	Esa Hyytiä, Jorma T. Virtamo	On optimality of single-path routes in massively dense wireless multi-hop networks.	MSWiM	2007	DBLP DOI BibTeX RDF	single-path, load balancing, multi-path, wireless multi-hop network
12	Michael Nicolaidis	GRAAL: A Fault-Tolerant Architecture for Enabling Nanometric Technologies.	IOLTS	2007	DBLP DOI BibTeX RDF
12	Swaroop Ghosh, Patrick Ndai, Swarup Bhunia, Kaushik Roy 0001	Tolerance to Small Delay Defects by Adaptive Clock Stretching.	IOLTS	2007	DBLP DOI BibTeX RDF
12	Xinjie Wei, Yici Cai, Xianlong Hong	Physical aware clock skew rescheduling.	ACM Great Lakes Symposium on VLSI	2007	DBLP DOI BibTeX RDF	skew rescheduling, process variations, clock skew
12	Venkataraman Mahalingam, N. Ranganathan	Variation Aware Timing Based Placement Using Fuzzy Programming.	ISQED	2007	DBLP DOI BibTeX RDF
12	Sudarshan Bahukudumbi, Krishnendu Chakrabarty	Test-Length Selection and TAM Optimization for Wafer-Level, Reduced Pin-Count Testing of Core-Based Digital SoCs.	VLSI Design	2007	DBLP DOI BibTeX RDF
12	Ashish Dobhal, Vishal Khandelwal, Azadeh Davoodi, Ankur Srivastava 0001	Variability Driven Joint Leakage-Delay Optimization Through Gate Sizing with Provabale Convergence.	VLSI Design	2007	DBLP DOI BibTeX RDF
12	Oded Goldreich 0001, Madhu Sudan 0001	Locally testable codes and PCPs of almost-linear length.	J. ACM	2006	DBLP DOI BibTeX RDF	error-correcting codes, derandomization, probabilistically checkable proofs, Proof verification
12	Mehdi Baradaran Tahoori	Application-independent defect tolerance of reconfigurable nanoarchitectures.	ACM J. Emerg. Technol. Comput. Syst.	2006	DBLP DOI BibTeX RDF	reconfigurable architectures, nanotechnology, Defect tolerance
12	Frédéric Blanqui, Jean-Pierre Jouannaud, Albert Rubio	Higher-Order Termination: From Kruskal to Computability.	LPAR	2006	DBLP DOI BibTeX RDF
12	Hai Li 0001, Yiran Chen 0001, Kaushik Roy 0001, Cheng-Kok Koh	SAVS: a self-adaptive variable supply-voltage technique for process- tolerant and power-efficient multi-issue superscalar processor design.	ASP-DAC	2006	DBLP DOI BibTeX RDF
12	Hailong Yao, Subarna Sinha, Charles C. Chiang, Xianlong Hong, Yici Cai	Efficient process-hotspot detection using range pattern matching.	ICCAD	2006	DBLP DOI BibTeX RDF
12	Diana Marculescu, Siddharth Garg	System-level process-driven variability analysis for single and multiple voltage-frequency island systems.	ICCAD	2006	DBLP DOI BibTeX RDF	voltage-frequency islands, variability
12	Vaibhav Nawale, Thomas W. Chen	Optimal useful clock skew scheduling in the presence of variations using robust ILP formulations.	ICCAD	2006	DBLP DOI BibTeX RDF
12	Yantao Zheng, Lingyu Duan, Qi Tian 0002, Jesse S. Jin	TV Commercial Classification by using Multi-Modal Textual Information.	ICME	2006	DBLP DOI BibTeX RDF
12	Xingguo Xiong, Yu-Liang Wu, Wen-Ben Jone	Reliability Analysis of Self-Repairable MEMS Accelerometer.	DFT	2006	DBLP DOI BibTeX RDF
12	Jay Jahangiri, David Abercrombie	Meeting Nanometer DPM Requirements Through DFT.	ISQED	2005	DBLP DOI BibTeX RDF
12	Vishak Venkatraman, Wayne P. Burleson	Impact of Process Variations on Multi-Level Signaling for On-Chip Interconnects.	VLSI Design	2005	DBLP DOI BibTeX RDF
12	Ethan Schuchman, T. N. Vijaykumar	Rescue: A Microarchitecture for Testability and Defect Tolerance.	ISCA	2005	DBLP DOI BibTeX RDF
12	Sang-Woon Kim, B. John Oommen	Enhancing prototype reduction schemes with recursion: a method applicable for "large" data sets.	IEEE Trans. Syst. Man Cybern. Part B	2004	DBLP DOI BibTeX RDF
12	Li Zhao	Is sparse and distributed the coding goal of simple cells?	Biol. Cybern.	2004	DBLP DOI BibTeX RDF
12	Alessandra Nardi, Alberto L. Sangiovanni-Vincentelli	Synthesis for Manufacturability: A Sanity Check.	DATE	2004	DBLP DOI BibTeX RDF
12	Shuji Tsukiyama	Toward stochastic design for digital circuits: statistical static timing analysis.	ASP-DAC	2004	DBLP DOI BibTeX RDF
12	Andrew B. Kahng, Ion I. Mandoiu, Qinke Wang, Xu Xu 0001, Alexander Zelikovsky	Multi-project reticle floorplanning and wafer dicing.	ISPD	2004	DBLP DOI BibTeX RDF	multi-project wafers, reticle design, wafer dicing
12	Said Hamdioui, Georgi Gaydadjiev, Ad J. van de Goor	The State-of-Art and Future Trends in Testing Embedded Memories.	MTDT	2004	DBLP DOI BibTeX RDF
12	Carolina Selva, Cosimo Torelli, Danilo Rimondi, Rita Zappa, Stefano Corbani, Giovanni Mastrodomenico, Lara Albani	A Programmable Built-in Self-Diagnosis for Embedded SRAM.	MTDT	2004	DBLP DOI BibTeX RDF
12	Tao Feng, Byoungjae Jin, J. Wang, Nohpill Park, Yong-Bin Kim, Fabrizio Lombardi	Fault tolerant clockless wave pipeline design.	Conf. Computing Frontiers	2004	DBLP DOI BibTeX RDF	clockless wave pipeline, inter-wave fault, intra-wave fault, fault tolerance, reliability
12	Yukio Okuda	Panel Synopsis - Diagnosis Meets Physical Failure Analysis: How Long Can We Succeed?	ITC	2004	DBLP DOI BibTeX RDF
12	Shyue-Kung Lu	A Novel Built-In Self-Repair Approach for Embedded RAMs.	J. Electron. Test.	2003	DBLP DOI BibTeX RDF	divided word line, fault tolerance, redundancy, low power design, embedded memory
12	Puneet Gupta 0001, Andrew B. Kahng	Manufacturing-Aware Physical Design.	ICCAD	2003	DBLP DOI BibTeX RDF
12	Fadi A. Aloul, Igor L. Markov, Karem A. Sakallah	Shatter: efficient symmetry-breaking for boolean satisfiability.	DAC	2003	DBLP DOI BibTeX RDF	clause learning, logic simplification, routing, symmetries, SAT, CNF, backtrack search, graph automorphism
12	Oded Goldreich 0001, Madhu Sudan 0001	Locally Testable Codes and PCPs of Almost-Linear Length.	FOCS	2002	DBLP DOI BibTeX RDF
12	Pedram Khademsameni, Marek Syrzycki	Manufacturability Analysis of Analog CMOS ICs through Examination of Multiple Layout Solutions.	DFT	2002	DBLP DOI BibTeX RDF
12	Sang-Woon Kim, B. John Oommen	Recursive Prototype Reduction Schemes Applicable for Large Data Sets.	SSPR/SPR	2002	DBLP DOI BibTeX RDF
12	Marco Bernardo 0001, Mario Bravetti	Reward Based Congruences: Can We Aggregate More?	PAPM-PROBMIV	2001	DBLP DOI BibTeX RDF
12	Minsu Choi, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi	Connectivity-Based Multichip Module Repair.	PRDC	2001	DBLP DOI BibTeX RDF
12	Stefan D. Wilke	Neural Coding of Dynamic Stimuli.	ICANN	2001	DBLP DOI BibTeX RDF
12	John Kibarian	Ramping New IC Products in the Deep Submicron Age.	ISQED	2000	DBLP DOI BibTeX RDF
12	Tzvetan Ostromsky, Ivan Dimov 0001, Ilia Tzvetanov, Zahari Zlatev	Estimation of the Wheat Losses Caused by the Tropospheric Ozone in Bulgaria and Denmark.	NAA	2000	DBLP DOI BibTeX RDF
12	N. S. Nagaraj, Andrzej J. Strojwas, Sani R. Nassif, Ray Hokinson, Tak Young, Wonjae L. Kang, David Overhauser, Sung-Mo Kang	When bad things happen to good chips (panel session).	DAC	2000	DBLP DOI BibTeX RDF
12	Tuna B. Tarim, H. Hakan Kuntman, Mohammed Ismail 0001	Robust Design of Basic Low Voltage CMOS Transconductors.	J. VLSI Signal Process.	1999	DBLP DOI BibTeX RDF
12	Glenn H. Chapman, Yves Audet	Creating 35 mm Camera Active Pixel Sensors.	DFT	1999	DBLP DOI BibTeX RDF
12	T. M. Mak, Debika Bhattacharya, Cheryl Prunty, Bob Roeder, Nermine Ramadan, F. Joel Ferguson, Jianlin Yu	Cache RAM inductive fault analysis with fab defect modeling.	ITC	1998	DBLP DOI BibTeX RDF
12	Ron Bourassa, Tim Coffman, Joe Brewer	Ultra large scale static rams.	J. VLSI Signal Process.	1991	DBLP DOI BibTeX RDF
12	Shambhu J. Upadhyaya, John A. Thodiyil	BIST PLAs, Pass or Fail - A Case Study.	DAC	1990	DBLP DOI BibTeX RDF
12	Mustafa A. Kamal	Intelligent systems for statistical process control in steel (abstract only).	ACM Conference on Computer Science	1987	DBLP DOI BibTeX RDF
12	Alan J. Demers	Generalized Left Corner Parsing.	POPL	1977	DBLP DOI BibTeX RDF
11	Qingkai Ji, Feng Liu 0020, Jun Zhuang 0001	Procurement Contract Design Under Asymmetric Information of Random Yield.	Asia Pac. J. Oper. Res.	2024	DBLP DOI BibTeX RDF
11	Jing Nie, Jiachen Jiang, Yang Li 0111, Jingbin Li, Yujie Qiao, Sezai Ercisli	UAVEC-FLchain: Distributed multi-regional jujube orchard joint yield estimation for secure agricultural-IoT applications.	Internet Things	2024	DBLP DOI BibTeX RDF
11	K. P. N. S. Dayarathne, U. Thayasiwam	Utility of Smoothing Techniques in Yield Curve Modeling for the Asian Pacific Frontier Capital Market.	SN Comput. Sci.	2024	DBLP DOI BibTeX RDF
11	Rakesh Mohan Datt, Vinay Kukreja	Neural Network Model for Predicting Apple Yield Based on Arrival of Phenological Stage in Conjunction with Leaf disease, Soil and Weather Parameters.	SN Comput. Sci.	2024	DBLP DOI BibTeX RDF
11	Guilong Xiao, Xueyou Zhang, Quandi Niu, Xingang Li, Xuecao Li, Liheng Zhong, Jianxi Huang	Winter wheat yield estimation at the field scale using sentinel-2 data and deep learning.	Comput. Electron. Agric.	2024	DBLP DOI BibTeX RDF
11	Hongchun Qu, Chaofang Zheng, Hao Ji, Kallol Barai, Yong-Jiang Zhang	A fast and efficient approach to estimate wild blueberry yield using machine learning with drone photography: Flight altitude, sampling method and model effects.	Comput. Electron. Agric.	2024	DBLP DOI BibTeX RDF
11	Shuaipeng Fei, Shunfu Xiao, Jinyu Zhu, Yonggui Xiao, Yuntao Ma	Dual sampling linear regression ensemble to predict wheat yield across growing seasons with hyperspectral sensing.	Comput. Electron. Agric.	2024	DBLP DOI BibTeX RDF
11	Kamran Forghani, Mats Carlsson, Pierre Flener, Magnus Fredriksson, Justin Pearson, Di Yuan	Maximizing value yield in wood industry through flexible sawing and product grading based on wane and log shape.	Comput. Electron. Agric.	2024	DBLP DOI BibTeX RDF
11	Hamid Kamangir, Brent S. Sams, Nick Dokoozlian, Luis Sanchez 0001, J. Mason Earles	Large-scale spatio-temporal yield estimation via deep learning using satellite and management data fusion in vineyards.	Comput. Electron. Agric.	2024	DBLP DOI BibTeX RDF
11	Yangfeng Zou, Giri Raj Kattel, Lijuan Miao	Enhancing Maize Yield Simulations in Regional China Using Machine Learning and Multi-Data Resources.	Remote. Sens.	2024	DBLP DOI BibTeX RDF
11	Patrick Killeen, Iluju Kiringa, Tet Hin Yeap, Paula Branco	Corn Grain Yield Prediction Using UAV-Based High Spatiotemporal Resolution Imagery, Machine Learning, and Spatial Cross-Validation.	Remote. Sens.	2024	DBLP DOI BibTeX RDF
11	Ilina Kamenova, Milen Chanev, Petar Dimitrov, Lachezar Filchev, Bogdan Bonchev, Liang Zhu, Qinghan Dong	Crop Type Mapping and Winter Wheat Yield Prediction Utilizing Sentinel-2: A Case Study from Upper Thracian Lowland, Bulgaria.	Remote. Sens.	2024	DBLP DOI BibTeX RDF
11	Jiang Chen, Tong Yu, Jerome H. Cherney, Zhou Zhang 0001	Optimal Integration of Optical and SAR Data for Improving Alfalfa Yield and Quality Traits Prediction: New Insights into Satellite-Based Forage Crop Monitoring.	Remote. Sens.	2024	DBLP DOI BibTeX RDF
11	Feng Yu, Ming Wang, Jun Xiao 0005, Qian Zhang, Jinmeng Zhang, Xin Liu, Yang Ping, Ru-peng Luan	Advancements in Utilizing Image-Analysis Technology for Crop-Yield Estimation.	Remote. Sens.	2024	DBLP DOI BibTeX RDF
11	Rana Ahmad Faraz Ishaq, Guanhua Zhou, Chen Tian 0012, Yumin Tan, Guifei Jing, Hongzhi Jiang, Obaid Ur Rehman	A Systematic Review of Radiative Transfer Models for Crop Yield Prediction and Crop Traits Retrieval.	Remote. Sens.	2024	DBLP DOI BibTeX RDF
11	Nildson Rodrigues de França e Silva, Michel Eustáquio Dantas Chaves, Ana Cláudia dos Santos Luciano, Ieda Del'Arco Sanches, Cláudia Maria de Almeida, Marcos Adami	Sugarcane Yield Estimation Using Satellite Remote Sensing Data in Empirical or Mechanistic Modeling: A Systematic Review.	Remote. Sens.	2024	DBLP DOI BibTeX RDF
11	Yanxi Zhao, Jiaoyang He, Xia Yao, Tao Cheng 0003, Yan Zhu 0005, Weixing Cao, Yongchao Tian	Wheat Yield Robust Prediction in the Huang-Huai-Hai Plain by Coupling Multi-Source Data with Ensemble Model under Different Irrigation and Extreme Weather Events.	Remote. Sens.	2024	DBLP DOI BibTeX RDF
11	Muhammad Ashfaq, Imran Khan 0004, Abdulrahman Alzahrani, Muhammad Usman Tariq, Humera Khan, Anwar Ghani	Accurate Wheat Yield Prediction Using Machine Learning and Climate-NDVI Data Fusion.	IEEE Access	2024	DBLP DOI BibTeX RDF
11	Ioannis K. Bazionis, Markos A. Kousounadis-Knousen, Vasileios E. Katsigiannis, Francky Catthoor, Pavlos S. Georgilakis	An Advanced Hybrid Boot-LSTM-ICSO-PP Approach for Day-Ahead Probabilistic PV Power Yield Forecasting and Intra-Hour Power Fluctuation Estimation.	IEEE Access	2024	DBLP DOI BibTeX RDF
11	Ali Mohammad Hayajneh, Feras Alasali, Abdelaziz Salama, William Holderbaum	Intelligent Solar Forecasts: Modern Machine Learning Models and TinyML Role for Improved Solar Energy Yield Predictions.	IEEE Access	2024	DBLP DOI BibTeX RDF
11	Priti Prakash Jorvekar, Sharmila Kishor Wagh, Jayashree Rajesh Prasad	Crop yield predictive modeling using optimized deep convolutional neural network: An automated crop management system.	Multim. Tools Appl.	2024	DBLP DOI BibTeX RDF
11	Venkata Rama Rao Kolipaka, Anupama Namburu	An automatic crop yield prediction framework designed with two-stage classifiers: a meta-heuristic approach.	Multim. Tools Appl.	2024	DBLP DOI BibTeX RDF
11	P. S. S. Gopi, M. Karthikeyan	Red fox optimization with ensemble recurrent neural network for crop recommendation and yield prediction model.	Multim. Tools Appl.	2024	DBLP DOI BibTeX RDF
11	B. Sunitha Devi, N. Sandhya, K. Shahu Chatrapati	Hybrid deep WaveNet-LSTM architecture for crop yield prediction.	Multim. Tools Appl.	2024	DBLP DOI BibTeX RDF
11	M. Vamsi Krishna 0001, K. Swaroopa, G. SwarnaLatha, V. Yasaswani	Crop yield prediction in India based on mayfly optimization empowered attention-bi-directional long short-term memory (LSTM).	Multim. Tools Appl.	2024	DBLP DOI BibTeX RDF
11	Nan Zhang, Kaiquan Cai, Yingjun Deng, Jun Zhang	Joint optimization of condition-based maintenance and condition-based production of a single equipment considering random yield and maintenance delay.	Reliab. Eng. Syst. Saf.	2024	DBLP DOI BibTeX RDF
11	You-Shyang Chen, Ying-Hsun Hung, Mike Yau-Jung Lee, Chien-Jung Lai, Jieh-Ren Chang, Chih-Yao Chien	Identification of the Yield Rate by a Hybrid Fuzzy Control PID-Based Four-Stage Model: A Case Study of Optical Filter Industry.	Axioms	2024	DBLP DOI BibTeX RDF
11	Yen-Jen Chang, Ming-Hsin Lai, Chien-Ho Wang, Yu-Shun Huang, Jason Lin	Target-Aware Yield Prediction (TAYP) Model Used to Improve Agriculture Crop Productivity.	IEEE Trans. Geosci. Remote. Sens.	2024	DBLP DOI BibTeX RDF
11	Hua Guo, Shengxiang Deng, Jingbiao Yang	Intelligent control strategy for industrial furnaces based on yield classification prediction using a gray relative correlation-convolutional neural network-multilayer perceptron (GCM) machine learning model.	PeerJ Comput. Sci.	2024	DBLP DOI BibTeX RDF
11	Nabil El Farme	Optimal skip-lot sampling plan based on the yield index for auto-correlated data.	Commun. Stat. Simul. Comput.	2024	DBLP DOI BibTeX RDF
11	Mark O. Neisser, Ndubuisi G. Orji, Harry J. Levinson, Umberto Celano, James R. Moyne, Supika Mashiro, Dan Wilcox, Slava Libman	How Lithography and Metrology Are Enabling Yield in the Next Generation of Semiconductor Patterning.	Computer	2024	DBLP DOI BibTeX RDF
11		Retraction notice to "An Improved Multilayer Perceptron Approach for Detecting Sugarcane Yield Production in IoT based Smart Agriculture" [Microprocessors and Microsystems 82 (2021) 103822].	Microprocess. Microsystems	2024	DBLP DOI BibTeX RDF
11	Yogesh Bansal, David Lillis, M. Tahar Kechadi	Correction to: A neural meta-model for predicting winter wheat crop yield.	Mach. Learn.	2024	DBLP DOI BibTeX RDF
11	Muhammad Hanif Tunio, Jian Ping Li, Xiaoyang Zeng, Faijan Akhtar, Syed Attique Shah, Awais Ahmed, Yu Yang, Md Belal Bin Heyat	Meta-knowledge guided Bayesian optimization framework for robust crop yield estimation.	J. King Saud Univ. Comput. Inf. Sci.	2024	DBLP DOI BibTeX RDF
11	Biniam Sisheber, Michael T. Marshall, Daniel Mengistu, Andrew Nelson 0003	Assimilation of Earth Observation Data for Crop Yield Estimation in Smallholder Agricultural Systems.	IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.	2024	DBLP DOI BibTeX RDF
11	Nanlin Guo, Fulin Peng, Jiahe Shi, Fan Yang 0001, Jun Tao 0001, Xuan Zeng 0001	Yield Optimization for Analog Circuits over Multiple Corners via Bayesian Neural Networks: Enhancing Circuit Reliability under Environmental Variation.	ACM Trans. Design Autom. Electr. Syst.	2024	DBLP DOI BibTeX RDF
11	Francisco Alejandro Mena, Deepak Pathak, Hiba Najjar, Cristhian Sanchez, Patrick Helber, Benjamin Bischke, Peter Habelitz, Miro Miranda, Jayanth Siddamsetty, Marlon Nuske, Marcela Charfuelan, Diego Arenas, Michaela Vollmer, Andreas Dengel 0001	Adaptive Fusion of Multi-view Remote Sensing data for Optimal Sub-field Crop Yield Prediction.	CoRR	2024	DBLP DOI BibTeX RDF
11	Alvin Inderka, Florian Huber, Volker Steinhage	On Convolutional Vision Transformers for Yield Prediction.	CoRR	2024	DBLP DOI BibTeX RDF
11	Forkan Uddin Ahmed, Annesha Das, Md. Zubair	A Machine Learning Approach for Crop Yield and Disease Prediction Integrating Soil Nutrition and Weather Factors.	CoRR	2024	DBLP DOI BibTeX RDF