Search results for "scan"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
20	David Chaum, Aleksander Essex, Richard Carback, Jeremy Clark, Stefan Popoveniuc, Alan T. Sherman, Poorvi L. Vora	Scantegrity: End-to-End Voter-Verifiable Optical-Scan Voting.	IEEE Secur. Priv.	2008	DBLP DOI BibTeX RDF
20	Jianhua Ma 0001, Lingjian Chen, Jing Huang 0018, Wufan Chen	An improved super-short-scan reconstruction for fan-beam computed tomography.	ICIP	2008	DBLP DOI BibTeX RDF
20	Debargha Mukherjee, Ramin Samadani	Distributed image coding for imformation recovery from the print-scan channel.	ICIP	2008	DBLP DOI BibTeX RDF
20	Jason A. Stipes, John G. P. Cole, J. Humphreys	4D scan registration with the SR-3000 LIDAR.	ICRA	2008	DBLP DOI BibTeX RDF
20	Jia Li 0022, Qiang Xu 0001, Yu Hu 0001, Xiaowei Li 0001	iFill: An Impact-Oriented X-Filling Method for Shift- and Capture-Power Reduction in At-Speed Scan-Based Testing.	DATE	2008	DBLP DOI BibTeX RDF
20	Hiroaki Kikuchi, Naoya Fukuno, Masato Terada, Norihisa Doi	Principal Components of Port-Address Matrices in Port-Scan Analysis.	OTM Conferences (2)	2008	DBLP DOI BibTeX RDF
20	Przemyslaw Mazurek	Spatio-Temporal Track-Before-Detect Algorithm for Interlaced and Progressive Scan Imaging Sensors.	ICCVG	2008	DBLP DOI BibTeX RDF	Track-Before-Detect, Interlaced Sensors, Image Processing, Imaging Sensors
20	Tinne De Laet, Ruben Smits, Joris De Schutter, Herman Bruyninckx	Adaptive Full Scan Model for Range Finders in Dynamic Environments.	ISER	2008	DBLP DOI BibTeX RDF
20	Kaijian Shi	Area and power-delay efficient state retention pulse-triggered flip-flops with scan and reset capabilities.	ICCD	2008	DBLP DOI BibTeX RDF
20	Hector Jasso, Chaitan Baru, Tony Fountain, William S. Hodgkiss, Don Reich, Kurt Warner	Using 9-1-1 call data and the space-time permutation scan statistic for emergency event detection.	DG.O	2008	DBLP BibTeX RDF	telephone 911, emergency response, public safety
20	Sying-Jyan Wang, Shih-Cheng Chen, Katherine Shu-Min Li	Design and analysis of skewed-distribution scan chain partition for improved test data compression.	ISCAS	2008	DBLP DOI BibTeX RDF
20	Jing-Chu Chan, Nelson Yen-Chung Chang, Tian-Sheuan Chang	ISID : In-order scan and indexed diffusion segmentation algorithm for stereo vision.	ISCAS	2008	DBLP DOI BibTeX RDF
20	Hongping Xu, Xiaoxia Wan	Watermarking Algorithm for Print-Scan Based on HVS and Multiscale Error Diffusion.	CSSE (6)	2008	DBLP DOI BibTeX RDF
20	Julio Miró-Borrás, Pablo A. Bernabeu	Text Entry System Based on a Minimal Scan Matrix for Severely Physically Handicapped People.	ICCHP	2008	DBLP DOI BibTeX RDF	handicapped people, ambiguous keyboards, Text entry, scanning, AAC
20	Shianling Wu, Laung-Terng Wang, Zhigang Jiang, Jiayong Song, Boryau Sheu, Xiaoqing Wen, Michael S. Hsiao, James Chien-Mo Li, Jiun-Lang Huang, Ravi Apte	On Optimizing Fault Coverage, Pattern Count, and ATPG Run Time Using a Hybrid Single-Capture Scheme for Testing Scan Designs.	DFT	2008	DBLP DOI BibTeX RDF
20	Ingrid S. Reiser, Beverly A. Lau, Robert M. Nishikawa	Effect of Scan Angle and Reconstruction Algorithm on Model Observer Performance in Tomosynthesis.	Digital Mammography / IWDM	2008	DBLP DOI BibTeX RDF
20	Quan Qiu, Jianda Han	A New Fast Histogram Matching Algorithm for Laser Scan Data.	RAM	2008	DBLP DOI BibTeX RDF
20	Shih-Ping Lin 0001, Chung-Len Lee 0001, Jwu-E Chen, Ji-Jan Chen, Kun-Lun Luo, Wen Ching Wu	A Multilayer Data Copy Test Data Compression Scheme for Reducing Shifting-in Power for Multiple Scan Design.	IEEE Trans. Very Large Scale Integr. Syst.	2007	DBLP DOI BibTeX RDF
20	Diego Rodríguez-Losada, Javier Minguez	Improved Data Association for ICP-based Scan Matching in Noisy and Dynamic Environments.	ICRA	2007	DBLP DOI BibTeX RDF
20	Antoni Burguera, Yolanda González Cid, Gabriel Oliver	Probabilistic Sonar Scan Matching for Robust Localization.	ICRA	2007	DBLP DOI BibTeX RDF
20	Peter Sanders 0001, Jochen Speck, Jesper Larsson Träff	Full Bandwidth Broadcast, Reduction and Scan with Only Two Trees.	PVM/MPI	2007	DBLP DOI BibTeX RDF
20	Yu Huang 0005	Dynamic learning based scan chain diagnosis.	DATE	2007	DBLP DOI BibTeX RDF
20	Federico Baronti, Roberto Roncella, Roberto Saletti, Paolo D'Abramo, L. Di Piro, H. Fabian, M. Giardi	The importance of At-Speed Scan Testing: an industrial experience.	DSD	2007	DBLP DOI BibTeX RDF
20	Stephan Matzka, Yvan R. Petillot, Andrew M. Wallace	Determining Efficient Scan-Patterns for 3-D Object Recognition Using Spin Images.	ISVC (2)	2007	DBLP DOI BibTeX RDF
20	Xiangyin Ma, Hongbin Zha	Hybrid Scene Reconstruction by Integrating Scan Data and Stereo Image Pairs.	3DIM	2007	DBLP DOI BibTeX RDF
20	Tae-Kyung Ryu, Tae-Il Jeong, Kwon-Yeol Ryu, Kwang-Seok Moon, Jong-Nam Kim	A Fast Partial Distortion Elimination Algorithm Using Adaptive Matching Scan and Refining Threshold.	ICIC (3)	2007	DBLP DOI BibTeX RDF	Partial Distortion Elimination, Motion Estimation, Block Matching
20	Kristijan Lenac, Enzo Mumolo, Massimiliano Nolich	Fast Genetic Scan Matching Using Corresponding Point Measurements in Mobile Robotics.	EvoWorkshops	2007	DBLP DOI BibTeX RDF
20	Anu Pramila, Anja Keskinarkaus, Tapio Seppänen	Multiple Domain Watermarking for Print-Scan and JPEG Resilient Data Hiding.	IWDW	2007	DBLP DOI BibTeX RDF	JPEG, JPEG2000, inversion, Digital image watermarking, multiple watermarking
20	Roystein Oliveira, Aditya Jagirdar, Tapan J. Chakraborty	A TMR Scheme for SEU Mitigation in Scan Flip-Flops.	ISQED	2007	DBLP DOI BibTeX RDF
20	V. R. Devanathan, C. P. Ravikumar, V. Kamakoti 0001	Glitch-Aware Pattern Generation and Optimization Framework for Power-Safe Scan Test.	VTS	2007	DBLP DOI BibTeX RDF	Low Power ATPG, Glitch Power, IR Drop, Peak Power, Power-profiling
20	Aggelos Kiayias, Laurent Michel, Alexander Russell, Narasimha K. Shashidhar, Andrew See, Alexander A. Shvartsman, Seda Davtyan	Tampering with Special Purpose Trusted Computing Devices: A Case Study in Optical Scan E-Voting.	ACSAC	2007	DBLP DOI BibTeX RDF
20	Michael E. Imhof, Christian G. Zoellin, Hans-Joachim Wunderlich, Nicolas Mäding, Jens Leenstra	Scan Test Planning for Power Reduction.	DAC	2007	DBLP DOI BibTeX RDF
20	Seongmoon Wang, Sandeep K. Gupta 0001	LT-RTPG: a new test-per-scan BIST TPG for low switching activity.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2006	DBLP DOI BibTeX RDF
20	Scott Reed 0001, Ioseba Tena Ruiz, Chris Capus, Yvan R. Petillot	The Fusion of Large Scale Classified Side-Scan Sonar Image Mosaics.	IEEE Trans. Image Process.	2006	DBLP DOI BibTeX RDF
20	Ming Li, Wen-Ben Jone, Qing-An Zeng	An Efficient Wrapper Scan Chain Configuration Method for Network-on-Chip Testing.	ISVLSI	2006	DBLP DOI BibTeX RDF
20	Nabil Badereddine, Patrick Girard 0001, Serge Pravossoudovitch, Christian Landrault, Arnaud Virazel, Hans-Joachim Wunderlich	Structural-Based Power-Aware Assignment of Don't Cares for Peak Power Reduction during Scan Testing.	VLSI-SoC	2006	DBLP DOI BibTeX RDF
20	Gang Zeng, Hideo Ito	Concurrent core test for SOC using shared test set and scan chain disable.	DATE	2006	DBLP DOI BibTeX RDF
20	Anja Keskinarkaus, Anu Pramila, Tapio Seppänen, Jaakko J. Sauvola	Wavelet Domain Print-Scan and JPEG Resilient Data Hiding Method.	IWDW	2006	DBLP DOI BibTeX RDF	JND profile estimation, periodic reference water-mark, spread spectrum technique, multilevel technique, Watermarking, affine transformation
20	Yeny Yim, Helen Hong	Smoothing Segmented Lung Boundary in Chest CT Images Using Scan Line Search.	CIARP	2006	DBLP DOI BibTeX RDF
20	Kousuke Yamaoka, Takashi Morimoto, Hidekazu Adachi, Kazutoshi Awane, Tetsushi Koide, Hans Jürgen Mattausch	Multi-object tracking VLSI architecture using image-scan based region growing and feature matching.	ISCAS	2006	DBLP DOI BibTeX RDF
20	Christian Galke, René Kothe, Sabine Schultke, K. Winkler, Jeanette Honko, Heinrich Theodor Vierhaus	Embedded Scan Test with Diagnostic Features for Self-Testing SoCs.	IOLTS	2006	DBLP DOI BibTeX RDF
20	Junichi Tokuda, Shigehiro Morikawa, Hasnine A. Haque, Tetsuji Tsukamoto, Kiyoshi Matsumiya, Hongen Liao, Ken Masamune, Takeyoshi Dohi	New 4-D Imaging for Real-Time Intraoperative MRI: Adaptive 4-D Scan.	MICCAI (1)	2006	DBLP DOI BibTeX RDF
20	Zhuo Zhang 0008, Sudhakar M. Reddy, Irith Pomeranz, Xijiang Lin, Janusz Rajski	Scan Tests with Multiple Fault Activation Cycles for Delay Faults.	VTS	2006	DBLP DOI BibTeX RDF
20	Helene Hembrooke, Matthew K. Feusner, Geri Gay	Averaging scan patterns and what they can tell us.	ETRA	2006	DBLP DOI BibTeX RDF
20	Josef Strnadel, Zdenek Kotásek	Educational Tool for the Demonstration of DfT Principles Based on Scan Methodologies.	DSD	2005	DBLP DOI BibTeX RDF
20	Ho Fai Ko, Qiang Xu 0001, Nicola Nicolici	Register-transfer level functional scan for hierarchical designs.	ASP-DAC	2005	DBLP DOI BibTeX RDF
20	Yung-Chieh Lin, Feng Lu 0002, Kai Yang, Kwang-Ting Cheng	Constraint extraction for pseudo-functional scan-based delay testing.	ASP-DAC	2005	DBLP DOI BibTeX RDF
20	V. R. Devanathan	Novel Bi-partitioned Scan Architecture to Improve Transition Fault Coverage.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF
20	Tapan J. Chakraborty	Efficient Test Architecture based on Boundary Scan for Comprehensive System Test.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF
20	Yinhe Han 0001, Xiaowei Li 0001, Shivakumar Swaminathan, Yu Hu 0001, Anshuman Chandra	Scan Data Volume Reduction Using Periodically Alterable MUXs Decompressor.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF
20	Junichi Hirase, Yoshiyuki Goi, Yoshiyuki Tanaka	IDDQ Testing Method using a Scan Pattern for Production Testing.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF
20	Ondrej Novák, Jirí Zahrádka, Zdenek Plíva	COMPAS - Compressed Test Pattern Sequencer for Scan Based Circuits.	EDCC	2005	DBLP DOI BibTeX RDF
20	Chris Muelder, Kwan-Liu Ma, Tony Bartoletti	Interactive Visualization for Network and Port Scan Detection.	RAID	2005	DBLP DOI BibTeX RDF	network scans, user interfaces, information visualization, intrusion detection, Network security, port scans
20	Jie Wu 0001, Shuhui Yang	SMART: a scan-based movement-assisted sensor deployment method in wireless sensor networks.	INFOCOM	2005	DBLP DOI BibTeX RDF
20	Dragomir Anguelov, Benjamin Taskar, Vassil Chatalbashev, Daphne Koller, Dinkar Gupta, Geremy Heitz, Andrew Y. Ng	Discriminative Learning of Markov Random Fields for Segmentation of 3D Scan Data.	CVPR (2)	2005	DBLP DOI BibTeX RDF
20	Gang Zeng, Hideo Ito	Concurrent Core Test for Test Cost Reduction Using Merged Test Set and Scan Tree.	ICCD	2005	DBLP DOI BibTeX RDF
20	Jiann-Chyi Rau, Chih-Lung Chien, Jia-Shing Ma	Reconfigurable multiple scan-chains for reducing test application time of SOCs.	ISCAS (6)	2005	DBLP DOI BibTeX RDF
20	Rong-Jian Chen, Wen-Kai Lu, Jui-Lin Lai	Image encryption using progressive cellular automata substitution and SCAN.	ISCAS (2)	2005	DBLP DOI BibTeX RDF
20	Filip Schutyser, Gwen Swennen, Paul Suetens	Robust Visualization of the Dental Occlusion by a Double Scan Procedure.	MICCAI	2005	DBLP DOI BibTeX RDF
20	Kirti Joshi, Eric W. MacDonald	Reduction of Instantaneous Power by Ripple Scan Clocking.	VTS	2005	DBLP DOI BibTeX RDF
20	Michael Gössel, Krishnendu Chakrabarty, Vitalij Ocheretnij, Andreas Leininger	A Signature Analysis Technique for the Identification of Failing Vectors with Application to Scan-BIST.	J. Electron. Test.	2004	DBLP DOI BibTeX RDF	algebraic analysis, intervals of test vectors, fault diagnosis, linearity, MISR
20	Masahiro Tomono	A Scan Matching Method Using Euclidean Invariant Signature for Global Localization and Map Building.	ICRA	2004	DBLP DOI BibTeX RDF
20	Ho Fai Ko, Nicola Nicolici	Functional Scan Chain Design at RTL for Skewed-Load Delay Fault Testing.	Asian Test Symposium	2004	DBLP DOI BibTeX RDF	High-level DFT, Delay-fault testing
20	Konstantinos V. Kostas, Alexandros I. Ginnis, Panagiotis D. Kaklis	A Scan-Line Algorithm for Clustering Line Segments.	SMI	2004	DBLP DOI BibTeX RDF
20	Ho Fai Ko, Nicola Nicolici	Functional Illinois Scan Design at RTL.	ICCD	2004	DBLP DOI BibTeX RDF
20	David Hély, Marie-Lise Flottes, Frédéric Bancel, Bruno Rouzeyre, Nicolas Bérard, Michel Renovell	Scan Design and Secure Chip.	IOLTS	2004	DBLP DOI BibTeX RDF
20	Dong Hyun Baik, Kewal K. Saluja, Seiji Kajihara	Random Access Scan: A solution to test power, test data volume and test time.	VLSI Design	2004	DBLP DOI BibTeX RDF
20	Christopher Kachris, Nikolaos G. Bourbakis, Apostolos Dollas	A Reconfigurable Logic-Based Processor for the SCAN Image and Video Encryption Algorithm.	Int. J. Parallel Program.	2003	DBLP DOI BibTeX RDF	cryptography, block cipher, reconfigurable logic, image encryption
20	Nikolaos G. Bourbakis, Apostolos Dollas	SCAN-Based Compression-Encryption-Hiding for Video on Demand.	IEEE Multim.	2003	DBLP DOI BibTeX RDF	Image Video Compression, Multimedia on demand, FPGA, encryption, information hiding
20	Chunsheng Liu, Krishnendu Chakrabarty	Failing vector identification based on overlapping intervals of test vectors in a scan-BIST environment.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2003	DBLP DOI BibTeX RDF
20	Irith Pomeranz, Sudhakar M. Reddy	Theorems for identifying undetectable faults in partial-scan circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2003	DBLP DOI BibTeX RDF
20	Yun Shao 0002, Sudhakar M. Reddy, Irith Pomeranz, Seiji Kajihara	On Selecting Testable Paths in Scan Designs.	J. Electron. Test.	2003	DBLP DOI BibTeX RDF	testable path, delay testing, delay fault, path delay fault, path selection
20	Xijiang Lin, Ron Press, Janusz Rajski, Paul Reuter, Thomas Rinderknecht, Bruce Swanson, Nagesh Tamarapalli	High-Frequency, At-Speed Scan Testing.	IEEE Des. Test Comput.	2003	DBLP DOI BibTeX RDF
20	Valentin Goranko, Ullrich Hustadt, Renate A. Schmidt, Dimiter Vakarelov	SCAN Is Complete for All Sahlqvist Formulae.	RelMiCS	2003	DBLP DOI BibTeX RDF
20	Dong Xiang, Shan Gu, Hideo Fujiwara	Non-Scan Design for Testability for Mixed RTL Circuits with Both Data Paths and Controller via Conflict Analysis.	Asian Test Symposium	2003	DBLP DOI BibTeX RDF
20	Alessandro Bevilacqua, Alessandro Lanza, Giorgio Baccarani, Riccardo Rovatti	A Single-Scan Algorithm for Connected Components Labelling in a Traffic Monitoring Application.	SCIA	2003	DBLP DOI BibTeX RDF
20	Irith Pomeranz, Sudhakar M. Reddy	Static Test Compaction for Multiple Full-Scan Circuits.	ICCD	2003	DBLP DOI BibTeX RDF
20	Kedarnath J. Balakrishnan, Nur A. Touba	Scan-Based BIST Diagnosis Using an Embedded Processor.	DFT	2003	DBLP DOI BibTeX RDF
20	Mohsen Nahvi, André Ivanov	An Embedded Autonomous Scan-Based Results Analyzer (EARA) for SoC Cores.	VTS	2003	DBLP DOI BibTeX RDF
20	Peter Wohl, John A. Waicukauski, Sanjay Patel, Minesh B. Amin	X-Tolerant Compression And Application of Scan-ATPG Patterns In A BIST Architecture.	ITC	2003	DBLP DOI BibTeX RDF
20	Bhargab B. Bhattacharya, Sharad C. Seth, Sheng Zhang 0008	Low-Energy BIST Design for Scan-based Logic Circuits.	VLSI Design	2003	DBLP DOI BibTeX RDF
20	Ismet Bayraktaroglu, Alex Orailoglu	Cost-Effective Deterministic Partitioning for Rapid Diagnosis in Scan-Based BIST.	IEEE Des. Test Comput.	2002	DBLP DOI BibTeX RDF
20	Erik Johansson, Konstantinos Sagonas	Linear Scan Register Allocation in a High-Performance Erlang Compiler.	PADL	2002	DBLP DOI BibTeX RDF
20	Hao Huang, Xindong Wu 0001, Richard Relue	Association Analysis with One Scan of Databases.	ICDM	2002	DBLP DOI BibTeX RDF
20	Ismet Bayraktaroglu, Alex Orailoglu	Gate Level Fault Diagnosis in Scan-Based BIST.	DATE	2002	DBLP DOI BibTeX RDF
20	Chunsheng Liu, Krishnendu Chakrabarty, Michael Gössel	An Interval-Based Diagnosis Scheme for Identifying Failing Vectors in a Scan-BIST Environment.	DATE	2002	DBLP DOI BibTeX RDF
20	Hanspeter Mössenböck, Michael Pfeiffer 0004	Linear Scan Register Allocation in the Context of SSA Form and Register Constraints.	CC	2002	DBLP DOI BibTeX RDF
20	N. Jhanwar, Subhasis Chaudhuri, Guna Seetharaman, Bertrand Y. Zavidovique	Content Based Image Retrieval Using Optimum Peano Scan.	ICPR (4)	2002	DBLP DOI BibTeX RDF
20	Farzin Karimi, Fabrizio Lombardi	A Scan-Bist Environment for Testing Embedded Memories.	MTDT	2002	DBLP DOI BibTeX RDF
20	Irith Pomeranz, Sudhakar M. Reddy	On undetectable faults in partial scan circuits.	ICCAD	2002	DBLP DOI BibTeX RDF
20	Farzin Karimi, Fabrizio Lombardi	A Scan-Bist Environment for Testing Embedded Memories.	IOLTW	2002	DBLP DOI BibTeX RDF
20	Seiji Kajihara, Koji Ishida, Kohei Miyase	Test Vector Modification for Power Reduction during Scan Testing.	VTS	2002	DBLP DOI BibTeX RDF
20	Amit R. Pandey, Janak H. Patel	Reconfiguration Technique for Reducing Test Time and Test Data Volume in Illinois Scan Architecture Based Designs .	VTS	2002	DBLP DOI BibTeX RDF
20	Michael Gössel, Egor S. Sogomonyan, Adit D. Singh	Scan-Path with Directly Duplicated and Inverted Duplicated Registers.	VTS	2002	DBLP DOI BibTeX RDF
20	Nadir Z. Basturkmen, Sudhakar M. Reddy, Irith Pomeranz	Pseudo Random Patterns Using Markov Sources for Scan BIST.	ITC	2002	DBLP DOI BibTeX RDF
20	Bill Eklow, Carl Barnhart, Kenneth P. Parker	IEEE P1149.6: A Boundary-Scan Standard for Advanced Digital Networks.	ITC	2002	DBLP DOI BibTeX RDF
20	Sreejit Chakravarty, Ankur Jain, Nandakumar Radhakrishnan, Eric W. Savage, Sujit T. Zachariah	Experimental Evaluation of Scan Tests for Bridges.	ITC	2002	DBLP DOI BibTeX RDF
20	Bart Vermeulen, Tom Waayers, Sandeep Kumar Goel	Core-Based Scan Architecture for Silicon Debug.	ITC	2002	DBLP DOI BibTeX RDF
20	David Berthelot, Samit Chaudhuri, Hamid Savoj	An Efficient Linear Time Algorithm for Scan Chain Optimization and Repartitioning.	ITC	2002	DBLP DOI BibTeX RDF
20	Tapan J. Chakraborty, Chen-Huan Chiang	A Novel Fault Injection Method for System Verification Based on FPGA Boundary Scan Architectur.	ITC	2002	DBLP DOI BibTeX RDF