Search results for "Diagnosability"

Found 717 publication records. Showing 717 according to the selection in the facets

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
14	Katherine Shu-Min Li, Chung-Len Lee 0001, Yao-Wen Chang, Chauchin Su, Jwu E. Chen	Multilevel full-chip routing with testability and yield enhancement.	SLIP	2005	DBLP DOI BibTeX RDF	multilevel routing, yield, testability
14	Mohammad Azam, Krishna R. Pattipati, Ann Patterson-Hine	Optimal sensor allocation for fault detection and isolation.	SMC (2)	2004	DBLP DOI BibTeX RDF
14	Olivier Caty, Ismet Bayraktaroglu, Amitava Majumdar 0002, Richard Lee, John Bell, Lisa Curhan	Instruction Based BIST for Board/System Level Test of External Memories and Internconnects.	ITC	2003	DBLP DOI BibTeX RDF
14	Jin-Fu Li 0001, Cheng-Wen Wu	Efficient FFT network testing and diagnosis schemes.	IEEE Trans. Very Large Scale Integr. Syst.	2002	DBLP DOI BibTeX RDF
14	Béchir el Ayeb	Fault Identification in System-Level Diagnosis: a Logic-Based Framework and an O(n2sqrt(tau/log n) Algorithm.	Algorithmica	2002	DBLP DOI BibTeX RDF	Fault identification algorithms, Logic-based deduction, Complexity, Graph, Diagnosis, Formalization, System-level diagnosis
14	Stavros Tripakis	Fault Diagnosis for Timed Automata.	FTRTFT	2002	DBLP DOI BibTeX RDF	Fault diagnosis, Timed Automata, Partial observability
14	Mohammad A. Al-Hashimi, Huay-min H. Pu, Nohpill Park, Fabrizio Lombardi	Dependability under Malicious Agreement in N-modular Redundancy-on-Demand Systems.	NCA	2001	DBLP DOI BibTeX RDF
14	Fabrizio Lombardi, Nohpill Park, Mohammad A. Al-Hashimi, Huay-min H. Pu	Modeling the Dependability of N-Modular Redundancy on Demand under Malicious Agreement.	PRDC	2001	DBLP DOI BibTeX RDF
14	Béchir el Ayeb	Fault Identification Algorithmic: A New Formal Approach.	FTCS	1999	DBLP DOI BibTeX RDF	Fault Identification Algorithm, New Formal Approach, Complexity, Graph, System-Level Diagnosis
14	Krishnaiyan Thulasiraman, Anindya Das, Kaiyuan Huang, Vinod K. Agarwal	Correct diagnosis of almost all faulty units in a multiprocessor system.	ISCAS (6)	1999	DBLP DOI BibTeX RDF
14	Paolo Santi, Piero Maestrini	Self-Validating Diagnosis of Hypercube Systems.	PRDC	1999	DBLP DOI BibTeX RDF	self-validating diagnosis, wafer-scale testing, hypercube, System-level diagnosis, multicomputer systems
14	Dilip K. Bhavsar, Ugonna Echeruo, David R. Akeson, William J. Bowhill	A highly testable and diagnosable fabrication process test chip.	ITC	1998	DBLP DOI BibTeX RDF
14	Dirk Stroobandt, Jan Van Campenhout	Hierarchical Test Generation with Built-In Fault Diagnosis.	Asian Test Symposium	1996	DBLP DOI BibTeX RDF	Hierarchical Test Pattern Generation, Fault Diagnosis, Test Compaction
14	Anindya Das, Krishnaiyan Thulasiraman	Diagnosis of t/s-Diagnosable Systems.	WG	1990	DBLP DOI BibTeX RDF
14	Chin-Long Wey, Jyhyeung Ding, Tsin-Yuan Chang	Design of Repairable and Fully Diagnosable Folded PLAs for Yield Enhancement.	DAC	1990	DBLP DOI BibTeX RDF
14	Luca Simoncini, Arthur D. Friedman	Incomplete Fault Coverage In Modular Miltiprocessor Systems.	ACM Annual Conference (1)	1978	DBLP DOI BibTeX RDF
14	Ajoy K. Bose, Stephen A. Szygenda	Design of a diagnosable and fault-tolerant input/output controller.	AFIPS National Computer Conference	1977	DBLP DOI BibTeX RDF

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