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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 271 occurrences of 126 keywords
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Results
Found 717 publication records. Showing 717 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
14 | Katherine Shu-Min Li, Chung-Len Lee 0001, Yao-Wen Chang, Chauchin Su, Jwu E. Chen |
Multilevel full-chip routing with testability and yield enhancement. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SLIP ![In: The Seventh International Workshop on System-Level Interconnect Prediction (SLIP 2005), San Francisco, CA, USA, April 2-3, 2005, Proceedings, pp. 29-36, 2005, ACM, 1-59593-033-7. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
multilevel routing, yield, testability |
14 | Mohammad Azam, Krishna R. Pattipati, Ann Patterson-Hine |
Optimal sensor allocation for fault detection and isolation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SMC (2) ![In: Proceedings of the IEEE International Conference on Systems, Man & Cybernetics: The Hague, Netherlands, 10-13 October 2004, pp. 1309-1314, 2004, IEEE, 0-7803-8566-7. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
14 | Olivier Caty, Ismet Bayraktaroglu, Amitava Majumdar 0002, Richard Lee, John Bell, Lisa Curhan |
Instruction Based BIST for Board/System Level Test of External Memories and Internconnects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, pp. 961-970, 2003, IEEE Computer Society, 0-7803-8106-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
14 | Jin-Fu Li 0001, Cheng-Wen Wu |
Efficient FFT network testing and diagnosis schemes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 10(3), pp. 267-278, 2002. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
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14 | Béchir el Ayeb |
Fault Identification in System-Level Diagnosis: a Logic-Based Framework and an O(n2sqrt(tau/log n) Algorithm. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Algorithmica ![In: Algorithmica 33(2), pp. 129-149, 2002. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
Fault identification algorithms, Logic-based deduction, Complexity, Graph, Diagnosis, Formalization, System-level diagnosis |
14 | Stavros Tripakis |
Fault Diagnosis for Timed Automata. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FTRTFT ![In: Formal Techniques in Real-Time and Fault-Tolerant Systems, 7th International Symposium, FTRTFT 2002, Co-sponsored by IFIP WG 2.2, Oldenburg, Germany, September 9-12, 2002, Proceedings, pp. 205-224, 2002, Springer, 3-540-44165-4. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
Fault diagnosis, Timed Automata, Partial observability |
14 | Mohammad A. Al-Hashimi, Huay-min H. Pu, Nohpill Park, Fabrizio Lombardi |
Dependability under Malicious Agreement in N-modular Redundancy-on-Demand Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
NCA ![In: IEEE International Symposium on Network Computing and Applications (NCA 2001), October 8-10, 2001, Cambridge, MA, USA, pp. 80-93, 2001, IEEE Computer Society, 0-7695-1432-4. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
14 | Fabrizio Lombardi, Nohpill Park, Mohammad A. Al-Hashimi, Huay-min H. Pu |
Modeling the Dependability of N-Modular Redundancy on Demand under Malicious Agreement. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PRDC ![In: 8th Pacific Rim International Symposium on Dependable Computing (PRDC 2001), 17-19 December 2001, Seoul, Korea, pp. 68-75, 2001, IEEE Computer Society, 0-7695-1414-6. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
14 | Béchir el Ayeb |
Fault Identification Algorithmic: A New Formal Approach. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FTCS ![In: Digest of Papers: FTCS-29, The Twenty-Ninth Annual International Symposium on Fault-Tolerant Computing, Madison, Wisconsin, USA, June 15-18, 1999, pp. 138-145, 1999, IEEE Computer Society, 0-7695-0213-X. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
Fault Identification Algorithm, New Formal Approach, Complexity, Graph, System-Level Diagnosis |
14 | Krishnaiyan Thulasiraman, Anindya Das, Kaiyuan Huang, Vinod K. Agarwal |
Correct diagnosis of almost all faulty units in a multiprocessor system. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS (6) ![In: Proceedings of the 1999 International Symposium on Circuits and Systems, ISCAS 1999, Orlando, Florida, USA, May 30 - June 2, 1999, pp. 161-164, 1999, IEEE, 0-7803-5471-0. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
14 | Paolo Santi, Piero Maestrini |
Self-Validating Diagnosis of Hypercube Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PRDC ![In: 1999 Pacific Rim International Symposium on Dependable Computing (PRDC 1999), 16-17 December 1999, Hong Kong, pp. 218-226, 1999, IEEE Computer Society, 0-7695-0371-3. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
self-validating diagnosis, wafer-scale testing, hypercube, System-level diagnosis, multicomputer systems |
14 | Dilip K. Bhavsar, Ugonna Echeruo, David R. Akeson, William J. Bowhill |
A highly testable and diagnosable fabrication process test chip. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998, pp. 853-861, 1998, IEEE Computer Society, 0-7803-5093-6. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
14 | Dirk Stroobandt, Jan Van Campenhout |
Hierarchical Test Generation with Built-In Fault Diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 5th Asian Test Symposium (ATS '96), November 20-22, 1996, Hsinchu, Taiwan, pp. 22-28, 1996, IEEE Computer Society, 0-8186-7478-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
Hierarchical Test Pattern Generation, Fault Diagnosis, Test Compaction |
14 | Anindya Das, Krishnaiyan Thulasiraman |
Diagnosis of t/s-Diagnosable Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
WG ![In: Graph-Theoretic Concepts in Computer Science, 16rd International Workshop, WG '90, Berlin, Germany, June 20-22, 1990, Proceedings, pp. 193-205, 1990, Springer, 3-540-53832-1. The full citation details ...](Pics/full.jpeg) |
1990 |
DBLP DOI BibTeX RDF |
|
14 | Chin-Long Wey, Jyhyeung Ding, Tsin-Yuan Chang |
Design of Repairable and Fully Diagnosable Folded PLAs for Yield Enhancement. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 27th ACM/IEEE Design Automation Conference. Orlando, Florida, USA, June 24-28, 1990., pp. 327-332, 1990, IEEE Computer Society Press, 0-89791-363-9. The full citation details ...](Pics/full.jpeg) |
1990 |
DBLP DOI BibTeX RDF |
|
14 | Luca Simoncini, Arthur D. Friedman |
Incomplete Fault Coverage In Modular Miltiprocessor Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Annual Conference (1) ![In: Proceedings 1978 ACM Annual Conference, Washington, DC, USA, December 4-6, 1978, Volume I, pp. 210-216, 1978, ACM, 978-0-89791-000-2. The full citation details ...](Pics/full.jpeg) |
1978 |
DBLP DOI BibTeX RDF |
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14 | Ajoy K. Bose, Stephen A. Szygenda |
Design of a diagnosable and fault-tolerant input/output controller. ![Search on Bibsonomy](Pics/bibsonomy.png) |
AFIPS National Computer Conference ![In: American Federation of Information Processing Societies: 1977 National Computer Conference, June 13-16, 1977, Dallas, Texas, USA, pp. 795-800, 1977, AFIPS Press, 978-1-4503-7914-4. The full citation details ...](Pics/full.jpeg) |
1977 |
DBLP DOI BibTeX RDF |
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