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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 292 occurrences of 178 keywords
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Results
Found 654 publication records. Showing 643 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
98 | Shanrui Zhang, Minsu Choi, Nohpill Park, Fabrizio Lombardi |
Probabilistic Balancing of Fault Coverage and Test Cost in Combined Built-In Self-Test/Automated Test Equipment Testing Environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings, pp. 48-56, 2004, IEEE Computer Society, 0-7695-2241-6. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
93 | Xiaojun Ma, Fabrizio Lombardi |
Multi-Site and Multi-Probe Substrate Testing on an ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA, pp. 495-506, 2006, IEEE Computer Society, 0-7695-2706-X. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
substrate testing, multi-probe, ATE, MCM, manufacturing test, multi-site |
82 | Xiaojun Ma, Fabrizio Lombardi |
Substrate Testing on a Multi-Site/Multi-Probe ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 24(1-3), pp. 193-201, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Substrate testing, Multi-probe, ATE, MCM, Manufacturing test, Multi-site |
82 | Rajesh Tiwari, Abhijeet Shrivastava, Mahit Warhadpande, Srivaths Ravi 0001, Rubin A. Parekhji |
A Regression Based Technique for ATE-Aware Test Data Volume Estimation of System-on-Chips. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA, pp. 53-58, 2008, IEEE Computer Society, 978-0-7695-3123-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Tester, ATPG, Estimation, ATE, Test Time, Test Data Volume |
81 | Changan Zhao, Fangguo Zhang, Jiwu Huang |
A note on the Ate pairing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Inf. Sec. ![In: Int. J. Inf. Sec. 7(6), pp. 379-382, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Elliptic curves, Tate pairing, Pairing-based cryptosystems, Ate pairing |
80 | Seiichi Matsuda, Naoki Kanayama, Florian Hess, Eiji Okamoto |
Optimised Versions of the Ate and Twisted Ate Pairings. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IMACC ![In: Cryptography and Coding, 11th IMA International Conference, Cirencester, UK, December 18-20, 2007, Proceedings, pp. 302-312, 2007, Springer, 978-3-540-77271-2. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
73 | A. T. Sivaram, Daniel Fan, Jon Pryce |
XML And Java For Open ATE Programming Environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, pp. 793-801, 2003, IEEE Computer Society, 0-7803-8106-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
73 | Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi |
Test Time Reduction in a Manufacturing Environment by Combining BIST and ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver, BC, Canada, Proceedings, pp. 186-194, 2002, IEEE Computer Society, 0-7695-1831-1. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
73 | Vikram Iyengar, Sandeep Kumar Goel, Erik Jan Marinissen, Krishnendu Chakrabarty |
Test Resource Optimization for Multi-Site Testing of SOCs Under ATE Memory Depth Constraints. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002, pp. 1159-1168, 2002, IEEE Computer Society, 0-7803-7543-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
71 | Joe Kelly, Dean Nicholson, Edwin Lowery, Victor Grothen |
Light-Enhanced FET Switch Improves ATE RF Power Settling. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 25(1), pp. 38-43, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
FET, RF switch, power settling, HVM, high-volume manufacturing, ATE, test time, settling time |
65 | Eunjeong Lee, Hyang-Sook Lee, Cheol-Min Park |
Efficient and Generalized Pairing Computation on Abelian Varieties. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Inf. Theory ![In: IEEE Trans. Inf. Theory 55(4), pp. 1793-1803, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
62 | David C. Keezer, Dany Minier, Patrice Ducharme |
Method for reducing jitter in multi-gigahertz ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 2007 Design, Automation and Test in Europe Conference and Exposition, DATE 2007, Nice, France, April 16-20, 2007, pp. 701-706, 2007, EDA Consortium, San Jose, CA, USA, 978-3-9810801-2-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
62 | Luca Schiano, Yong-Bin Kim, Fabrizio Lombardi |
Scan Test of IP Cores in an ATE Environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DELTA ![In: 2nd IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2004), 28-30 January 2004, Perth, Australia, pp. 281-286, 2004, IEEE Computer Society, 0-7695-2081-2. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
62 | Hamidreza Hashempour, Fabrizio Lombardi |
ATE-Amenable Test Data Compression with No Cyclic Scan. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings, pp. 151-158, 2003, IEEE Computer Society, 0-7695-2042-1. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
62 | Masashi Shimanouchi |
New Paradigm for Signal Paths in ATE Pin Electronics are Needed for Serialcom Device Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002, pp. 903-912, 2002, IEEE Computer Society, 0-7803-7543-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
60 | Hamidreza Hashempour, Fabrizio Lombardi |
Two dimensional reordering of functional test data for compression by ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 15th ACM Great Lakes Symposium on VLSI 2005, Chicago, Illinois, USA, April 17-19, 2005, pp. 188-192, 2005, ACM, 1-59593-057-4. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
2D reordering, column reordering, functional test data, scan test data, ATE, test data compression |
59 | Yasuyuki Nogami, Masataka Akane, Yumi Sakemi, Hidehiro Katou, Yoshitaka Morikawa |
Integer Variable chi-Based Ate Pairing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Pairing ![In: Pairing-Based Cryptography - Pairing 2008, Second International Conference, Egham, UK, September 1-3, 2008. Proceedings, pp. 178-191, 2008, Springer, 978-3-540-85503-3. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Miller’s algorithm, Ate pairing |
59 | Jochen Rivoir |
Low-Cost Analog Signal Generation Using a Pulse-Density Modulated Digital ATE Channel. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan, pp. 290-295, 2004, IEEE Computer Society, 0-7695-2235-1. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
low-cost ATE, multi-site test, mixed-signal test, concurrent test, low-cost test, test resource partitioning |
52 | Claire Whelan, Michael Scott |
Side Channel Analysis of Practical Pairing Implementations: Which Path Is More Secure? ![Search on Bibsonomy](Pics/bibsonomy.png) |
VIETCRYPT ![In: Progressin Cryptology - VIETCRYPT 2006, First International Conference on Cryptology in Vietnam, Hanoi, Vietnam, September 25-28, 2006, Revised Selected Papers, pp. 99-114, 2006, Springer, 3-540-68799-8. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Correlation Power Analysis (CPA), ?T Pairing, Side Channel Analysis (SCA), Tate Pairing, Pairing Based Cryptography, Ate Pairing |
52 | Ashraf Saad, Deborah Boisvert |
National science foundation advanced technological education projects and centers of excellence for information technology education: an overview. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SIGITE Conference ![In: Proceedings of the 6th Conference on Information Technology Education, SIGITE 2005, Newark, NJ, USA, October 20-22, 2005, pp. 233-238, 2005, ACM, 1-59593-252-6. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
NSF ATE projects and centers of excellence, advanced technological education, information technology education |
52 | Anuja Sehgal, Vikram Iyengar, Mark D. Krasniewski, Krishnendu Chakrabarty |
Test cost reduction for SOCs using virtual TAMs and lagrange multipliers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 40th Design Automation Conference, DAC 2003, Anaheim, CA, USA, June 2-6, 2003, pp. 738-743, 2003, ACM, 1-58113-688-9. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
bandwidth matching, automatic test equipment (ATE), test access mechanism (TAM), scan chains, system-on-chip (SOC) |
51 | Peter Muhmenthaler |
New on-Chip DFT and ATE Features for Efficient Embedded Memory Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MTDT ![In: 14th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2006), 2-4 August 2006, Taipei, Taiwan, 2006, IEEE Computer Society, 0-7695-2572-5. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
51 | Erik Larsson, Stina Edbom |
Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI-SoC ![In: VLSI-SoC: From Systems To Silicon, Proceedings of IFIP TC 10, WG 10.5, Thirteenth International Conference on Very Large Scale Integration of System on Chip (VLSI-SoC 2005), October 17-19, 2005, Perth, Australia, pp. 221-244, 2005, Springer, 978-0-387-73660-0. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
51 | David C. Keezer, Dany Minier, F. Binette |
Modular Extension of ATE to 5 Gbps. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 748-757, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
51 | R. Raghuraman |
Simulation Requirements for Vectors in ATE Formats. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 1100-1107, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
51 | Manu Rehani, David Abercrombie, Robert Madge, Jim Teisher, Jason Saw |
ATE Data Collection - A comprehensive requirements proposal to maximize ROI of test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 181-189, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
51 | Gordon D. Robinson |
Open Architecture ATE: Dream or Reality? ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 1408, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
51 | Jochen Rivoir |
Lowering Cost of Test: Parallel Test or Low-Cost ATE? ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, pp. 360-365, 2003, IEEE Computer Society, 0-7695-1951-2. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
51 | Harald P. E. Vranken, Friedrich Hapke, Soenke Rogge, Domenico Chindamo, Erik H. Volkerink |
ATPG Padding And ATE Vector Repeat Per Port For Reducing Test Data Volume. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, pp. 1069-1078, 2003, IEEE Computer Society, 0-7803-8106-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
51 | Farzin Karimi, Waleed Meleis, Zainalabedin Navabi, Fabrizio Lombardi |
Data Compression for System-on-Chip Testing Using ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver, BC, Canada, Proceedings, pp. 166-176, 2002, IEEE Computer Society, 0-7695-1831-1. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
51 | Ajay Khoche, Erik H. Volkerink, Jochen Rivoir, Subhasish Mitra |
Test Vector Compression Using EDA-ATE Synergies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April - 2 May 2002, Monterey, CA, USA, pp. 97-102, 2002, IEEE Computer Society, 0-7695-1570-3. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
51 | John Gatej, Lee Song, Carol Pyron, Rajesh Raina, Tom Munns |
valuating ATE Features in Terms of Test Escape Rates and Other Cost of Test Culprits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002, pp. 1040-1049, 2002, IEEE Computer Society, 0-7803-7543-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
51 | Wayne Moorhead, Serge N. Demidenko |
Making ATE Accessible for Academic Institutions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DELTA ![In: 1st IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2002), 29-31 January 2002, Christchurch, New Zealand, pp. 219-222, 2002, IEEE Computer Society, 0-7695-1453-7. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
Electronic ducation, hardware/software requirements, curriculum, test technology |
51 | Dan Proskauer |
High quality, easy to use, on time ATE software Can it be done? ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998, pp. 597-605, 1998, IEEE Computer Society, 0-7803-5093-6. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
50 | Jie Sun, Mike Li |
A Generic Test Path and DUT Model for DataCom ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, pp. 528-536, 2003, IEEE Computer Society, 0-7803-8106-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
Eye-diagram, Jitter, ATE, ISI |
50 | Rainer Dorsch, Ramón Huerta Rivera, Hans-Joachim Wunderlich, Martin Fischer |
Adapting an SoC to ATE Concurrent Test Capabilities. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002, pp. 1169-1175, 2002, IEEE Computer Society, 0-7803-7543-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
ATE, SoC Test, Concurrent Test, Test Resource Partitioning |
49 | Robert Granger, Florian Hess, Roger Oyono, Nicolas Thériault, Frederik Vercauteren |
Ate Pairing on Hyperelliptic Curves. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EUROCRYPT ![In: Advances in Cryptology - EUROCRYPT 2007, 26th Annual International Conference on the Theory and Applications of Cryptographic Techniques, Barcelona, Spain, May 20-24, 2007, Proceedings, pp. 430-447, 2007, Springer, 978-3-540-72539-8. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
finite fields, Tate pairing, hyperelliptic curves, Ate pairing |
49 | Sudhir K. Jhajharia, Hua Swee Wang |
Training diploma students on ATE-related module. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 4th Asian Test Symposium (ATS '95), November 23-24, 1995. Bangalore, India, pp. 184-, 1995, IEEE Computer Society, 0-8186-7129-7. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
electronic equipment testing, tertiary institution, ATE-related module, diploma students, final year students, Microelectronics option, Electronics and Communication Engineering Department, Singapore Polytechnic, Singapore Polytechnic Education Model, automated test equipment, Advanced Diploma, practical training, laboratory session, training, integrated circuit testing, assessment, teaching, teaching, automatic testing, automatic test equipment, test patterns, printed circuit boards, educational courses, printed circuit testing, industry-standard, electronic engineering education |
43 | Srimat T. Chakradhar |
Open architecture test system: not why but when! ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASP-DAC ![In: Proceedings of the 2004 Conference on Asia South Pacific Design Automation: Electronic Design and Solution Fair 2004, Yokohama, Japan, January 27-30, 2004, pp. 337-340, 2004, IEEE Computer Society, 0-7803-8175-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
43 | Daniel Fan, Steve Roehling, Rusty Carruth |
Case Study - Using STIL as Test Pattern Language. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, pp. 811-817, 2003, IEEE Computer Society, 0-7803-8106-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
43 | Mohsen Nahvi, André Ivanov, Resve A. Saleh |
Dedicated Autonomous Scan-Based Testing (DAST) for Embedded Cores. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002, pp. 1176-1184, 2002, IEEE Computer Society, 0-7803-7543-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
42 | Salem Abdennadher, Saghir A. Shaikh |
Practices in Mixed-Signal and RF IC Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 24(4), pp. 332-339, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
I/O testing, SiP testing, wireless transceiver testing, DFT, built-in tests, ATE |
42 | Darren Aaberge, Ken Mockler, Dieu Van Dinh, Raoul Belleau, Tim Donovan, Reid Hewlitt |
Meeting the Test Challenges of the 1 Gbps Parallel RapidIO Interface with New Automatic Test Equipment Capabilities. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA, pp. 75-84, 2005, IEEE Computer Society, 0-7695-2314-5. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
RapidIO, Source-Synchronous, LVDS, Differential, ATE, Non-determinism |
41 | Anshuman Chandra, Krishnendu Chakrabarty |
Analysis of Test Application Time for Test Data Compression Methods Based on Compression Codes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 20(2), pp. 199-212, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
decompression architecture, precomputed test sets, system-on-a-chip testing, test set encoding, variable-to-variable-length codes, automatic test equipment (ATE), testing time, embedded core testing |
40 | Bernd Laquai, Martin Hua, Guido Schulze, Michael Braun |
A Flexible and Scaleable Methodology for Testing High Speed Source Synchronous Interfaces on ATE with Multiple Fixed Phase Capture and Compare. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 11th European Test Symposium, ETS 2006, Southhampton, UK, May 21-24, 2006, pp. 97-102, 2006, IEEE Computer Society, 0-7695-2566-0. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
40 | Fengming Zhang, Warren Necoechea, Peter Reiter, Yong-Bin Kim, Fabrizio Lombardi |
Load Board Designs Using Compound Dot Technique and Phase Detector for Hierarchical ATE Calibrations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA, pp. 486-494, 2006, IEEE Computer Society, 0-7695-2706-X. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
40 | Julien Dalmasso, Marie-Lise Flottes, Bruno Rouzeyre |
Fitting ATE Channels with Scan Chains: a Comparison between a Test Data Compression Technique and Serial Loading of Scan Chains. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DELTA ![In: Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2006), 17-19 January 2006, Kuala Lumpur, Malaysia, pp. 295-300, 2006, IEEE Computer Society, 0-7695-2500-8. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
40 | Ilia Polian, Bernd Becker 0001 |
Scalable Delay Fault BIST for Use with Low-Cost ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 20(2), pp. 181-197, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
thermal constraints, BIST, SAT, delay testing, IP cores, symbolic methods |
40 | Michael R. Nelms, Kevin W. Gorman, Darren Anand |
Generating At-Speed Array Fail Maps with Low-Speed ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004, Napa Valley, CA, USA, pp. 87-96, 2004, IEEE Computer Society, 0-7695-2134-7. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
Delay & Performance Test, Diagnosis & Debug, Design for Testability, BIST, Memory Test |
40 | Baolin Deng, Wolfram Glauert |
Formal Description of Test Specification and ATE Architecture for Mixed-Signal Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 1081-1090, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
40 | Koji Nakamae, Homare Sakamoto, Hiromu Fujioka |
How ATE Planning Affects LSI Manufacturing Cost. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 13(4), pp. 66-73, 1996. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
VLSI manufacturing system, test cost, LSI tester, evaluation |
38 | Zijing Zhong, Zhongbao Xing, Yanbin Shi |
Research on the Airborne Communication and Navigation Apparatus ATE System Based on the Virtual Instrument. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PACIIA (2) ![In: PACIIA 2008, Volume 2, 2008 IEEE Pacific-Asia Workshop on Computational Intelligence and Industrial Application, 19-20 December 2008, Wuhan, China, pp. 757-760, 2008, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
ATE system, airborne communication and navigation, diagnoses platform |
38 | Steve Brown, Germán Gutiérrez, Reed Nelson, Chris VanKrevelen |
A gate-array based 500 MHz triple channel ATE controller with 40 pS timing verniers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 13th IEEE VLSI Test Symposium (VTS'95), April 30 - May 3, 1995, Princeton, New Jersey, USA, pp. 467-471, 1995, IEEE Computer Society, 0-8186-7000-2. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
emitter-coupled logic, triple channel ATE controller, timing verniers, precision edge timing, drive waveforms, returning signals, system clock frequency, ECL, 500 MHz, 40 ps, timing, clocks, automatic test equipment, logic arrays, programmable controllers, gate array, high speed testing |
37 | Rishabh Gupta, Venktesh V, Mukesh K. Mohania, Vikram Goyal |
'John ate 5 apples' != 'John ate some apples': Self-Supervised Paraphrase Quality Detection for Algebraic Word Problems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2206.08263, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
37 | Rishabh Gupta, Venktesh V, Mukesh K. Mohania, Vikram Goyal |
'John Ate 5 Apples' != 'John Ate Some Apples': Self-supervised Paraphrase Quality Detection for Algebraic Word Problems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ECML/PKDD (6) ![In: Machine Learning and Knowledge Discovery in Databases - European Conference, ECML PKDD 2022, Grenoble, France, September 19-23, 2022, Proceedings, Part VI, pp. 353-369, 2022, Springer, 978-3-031-26421-4. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
37 | Seiichi Matsuda, Naoki Kanayama, Florian Hess, Eiji Okamoto |
Optimised Versions of the Ate and Twisted Ate Pairings. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci. ![In: IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 92-A(7), pp. 1660-1667, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
37 | Seiichi Matsuda, Naoki Kanayama, Florian Hess, Eiji Okamoto |
Optimised versions of the Ate and Twisted Ate Pairings. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IACR Cryptol. ePrint Arch. ![In: IACR Cryptol. ePrint Arch. 2007, pp. 13, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP BibTeX RDF |
|
36 | Phillip James, Markus Roggenbach |
Designing Domain Specific Languages for Verification: First Steps. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ATE ![In: Proceedings of the First Workshop on Automated Theory Engineering, Wrocław, Poland, July 31, 2011, pp. 40-45, 2011, CEUR-WS.org. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP BibTeX RDF |
|
36 | Peter Höfner, Annabelle McIver, Georg Struth (eds.) |
Proceedings of the First Workshop on Automated Theory Engineering, Wrocław, Poland, July 31, 2011 ![Search on Bibsonomy](Pics/bibsonomy.png) |
ATE ![CEUR-WS.org The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP BibTeX RDF |
|
36 | Walter Guttmann, Georg Struth, Tjark Weber |
A Repository for Tarski-Kleene Algebras. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ATE ![In: Proceedings of the First Workshop on Automated Theory Engineering, Wrocław, Poland, July 31, 2011, pp. 30-39, 2011, CEUR-WS.org. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP BibTeX RDF |
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36 | Michael Beeson, Jay Halcomb, Wolfgang Mayer |
Inconsistencies in the Process Specification Language (PSL). ![Search on Bibsonomy](Pics/bibsonomy.png) |
ATE ![In: Proceedings of the First Workshop on Automated Theory Engineering, Wrocław, Poland, July 31, 2011, pp. 9-19, 2011, CEUR-WS.org. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP BibTeX RDF |
|
36 | Josef Urban |
An Overview of Methods for Large-Theory Automated Theorem Proving. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ATE ![In: Proceedings of the First Workshop on Automated Theory Engineering, Wrocław, Poland, July 31, 2011, pp. 3-8, 2011, CEUR-WS.org. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP BibTeX RDF |
|
36 | Vilius Naudziunas, Timothy G. Griffin |
A Domain-Specific Language for the Specification of Path Algebras. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ATE ![In: Proceedings of the First Workshop on Automated Theory Engineering, Wrocław, Poland, July 31, 2011, pp. 46-57, 2011, CEUR-WS.org. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP BibTeX RDF |
|
36 | Han-Hing Dang, Bernhard Möller |
Simplifying Pointer Kleene Algebra. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ATE ![In: Proceedings of the First Workshop on Automated Theory Engineering, Wrocław, Poland, July 31, 2011, pp. 20-29, 2011, CEUR-WS.org. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP BibTeX RDF |
|
36 | Timothy G. Griffin |
Do Formal Methodists have Bell-Shaped Heads? ![Search on Bibsonomy](Pics/bibsonomy.png) |
ATE ![In: Proceedings of the First Workshop on Automated Theory Engineering, Wrocław, Poland, July 31, 2011, pp. 1-2, 2011, CEUR-WS.org. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP BibTeX RDF |
|
33 | Ji He |
Improving feature representation of natural language gene functional annotations using automatic term expansion. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CIBCB ![In: Proceedings of the 2008 IEEE Symposium on Computational Intelligence in Bioinformatics and Computational Biology, CIBCB 2008, Sun Valley Resort, Sun Valley, Idaho, USA, September 15-17, 2008, pp. 173-179, 2008, IEEE, 978-1-4244-1778-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
33 | Anders Larsson, Erik Larsson, Petru Eles, Zebo Peng |
Optimized integration of test compression and sharing for SOC testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 2007 Design, Automation and Test in Europe Conference and Exposition, DATE 2007, Nice, France, April 16-20, 2007, pp. 207-212, 2007, EDA Consortium, San Jose, CA, USA, 978-3-9810801-2-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
33 | Ivo Koren, Frank Demmerle, Roland May, Martin Kaibel, Sebastian Sattler |
FPGA Architecture for RF Transceiver System and Mixed-Signal Low Cost Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 12th European Test Symposium, ETS 2007, Freiburg, Germany, May 20, 2007, pp. 43-48, 2007, IEEE Computer Society, 978-0-7695-2827-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
33 | Xiaoyu Ruan, Rajendra S. Katti |
An Efficient Data-Independent Technique for Compressing Test Vectors in Systems-on-a-Chip. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISVLSI ![In: 2006 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2006), 2-3 March 2006, Karlsruhe, Germany, pp. 153-158, 2006, IEEE Computer Society, 0-7695-2533-4. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
33 | Sandeep Kumar Goel, Erik Jan Marinissen |
On-Chip Test Infrastructure Design for Optimal Multi-Site Testing of System Chips. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 2005 Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany, pp. 44-49, 2005, IEEE Computer Society, 0-7695-2288-2. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
33 | Anuja Sehgal, Vikram Iyengar, Krishnendu Chakrabarty |
SOC test planning using virtual test access architectures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 12(12), pp. 1263-1276, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
33 | Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Paolo Bernardi, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda |
A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 20(1), pp. 79-87, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
IEEE P1500, diagnosis, Hough transform, embedded memories |
33 | A. T. Sivaram, Masashi Shimanouchi, Howard Maassen, Robert Jackson |
Tester Architecture For The Source Synchronous Bus. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 738-747, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
33 | John S. Davis, David C. Keezer, Odile Liboiron-Ladouceur, Keren Bergman |
Application and Demonstration of a Digital Test Core: Optoelectronic Test Bed and Wafer-level Prober. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, pp. 166-174, 2003, IEEE Computer Society, 0-7803-8106-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
33 | Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi, Farzin Karimi |
Hybrid Multisite Testing at Manufacturing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, pp. 927-936, 2003, IEEE Computer Society, 0-7803-8106-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
33 | Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda |
A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MTDT ![In: 10th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2002), 10-12 July 2002, Isle of Bendor, France, pp. 12-16, 2002, IEEE Computer Society, 0-7695-1617-3. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
33 | Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda |
A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 8th IEEE International On-Line Testing Workshop (IOLTW 2002), 8-10 July 2002, Isle of Bendor, France, pp. 206-210, 2002, IEEE Computer Society, 0-7695-1641-6. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
33 | Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola Nicolici |
Useless Memory Allocation in System-on-a-Chip Test: Problems and Solutions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April - 2 May 2002, Monterey, CA, USA, pp. 423-432, 2002, IEEE Computer Society, 0-7695-1570-3. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
33 | John S. Davis, David C. Keezer |
Multi-Purpose Digital Test Core Utilizing Programmable Logic. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002, pp. 438-445, 2002, IEEE Computer Society, 0-7803-7543-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
33 | Rohit Kapur, R. Chandramouli, Thomas W. Williams |
Strategies for Low-Cost Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 18(6), pp. 47-54, 2001. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
32 | John Burns Kilbride, Ate Poortinga, Biplov Bhandari, Nyein Soe Thwal, Nguyen Hanh Quyen, Jeff Silverman, Karis Tenneson, David M. Bell, Matthew J. Gregory, Robert Kennedy, David Saah |
A Near Real-Time Mapping of Tropical Forest Disturbance Using SAR and Semantic Segmentation in Google Earth Engine. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Remote. Sens. ![In: Remote. Sens. 15(21), pp. 5223, November 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
32 | Bianchi Dy, Nazim Ibrahim, Ate Poorthuis, Sam Joyce |
Improving Visualization Design for Effective Multi-Objective Decision Making. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Vis. Comput. Graph. ![In: IEEE Trans. Vis. Comput. Graph. 28(10), pp. 3405-3416, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
32 | Khuyagbaatar Batsuren, Omer Goldman, Salam Khalifa, Nizar Habash, Witold Kieras, Gábor Bella, Brian Leonard, Garrett Nicolai, Kyle Gorman, Yustinus Ghanggo Ate, Maria Ryskina, Sabrina J. Mielke, Elena Budianskaya, Charbel El-Khaissi, Tiago Pimentel, Michael Gasser, William Lane, Mohit Raj, Matt Coler, Jaime Rafael Montoya Samame, Delio Siticonatzi Camaiteri, Esaú Zumaeta Rojas, Didier López Francis, Arturo Oncevay, Juan López Bautista, Gema Celeste Silva Villegas, Lucas Torroba Hennigen, Adam Ek, David Guriel, Peter Dirix, Jean-Philippe Bernardy, Andrey Scherbakov, Aziyana Bayyr-ool, Antonios Anastasopoulos, Roberto Zariquiey, Karina Sheifer, Sofya Ganieva, Hilaria Cruz, Ritván Karahóga, Stella Markantonatou, George Pavlidis, Matvey Plugaryov, Elena Klyachko, Ali Salehi, Candy Angulo, Jatayu Baxi, Andrew Krizhanovsky, Natalia Krizhanovskaya, Elizabeth Salesky, Clara Vania, Sardana Ivanova, Jennifer White, Rowan Hall Maudslay, Josef Valvoda, Ran Zmigrod, Paula Czarnowska, Irene Nikkarinen, Aelita Salchak, Brijesh Bhatt, Christopher Straughn, Zoey Liu, Jonathan North Washington, Yuval Pinter, Duygu Ataman, Marcin Wolinski, Totok Suhardijanto, Anna Yablonskaya, Niklas Stoehr, Hossep Dolatian, Zahroh Nuriah, Shyam Ratan, Francis M. Tyers, Edoardo M. Ponti, Grant Aiton, Aryaman Arora, Richard J. Hatcher, Ritesh Kumar, Jeremiah Young, Daria Rodionova, Anastasia Yemelina, Taras Andrushko, Igor Marchenko, Polina Mashkovtseva, Alexandra Serova, Emily Prud'hommeaux, Maria Nepomniashchaya, Fausto Giunchiglia, Eleanor Chodroff, Mans Hulden, Miikka Silfverberg, Arya D. McCarthy, David Yarowsky, Ryan Cotterell, Reut Tsarfaty, Ekaterina Vylomova |
UniMorph 4.0: Universal Morphology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2205.03608, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
32 | Shane Marielle Ate Marges, Perla Salazar Dela Cruz |
Lesson Playlist: Its Effects on the Academic Achievement and Attitude in Mathematics among Grade 7 Students. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IC4E ![In: IC4E 2022: 13th International Conference on E-Education, E-Business, E-Management, and E-Learning, Tokyo, Japan, January 14 - 17, 2022, pp. 224-231, 2022, ACM, 978-1-4503-8718-7. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
32 | Ate Penders, Ana Lucia Varbanescu, Gregor Pavlin, Henk J. Sips |
Design-Space Exploration for Decision-Support Software. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASE ![In: 37th IEEE/ACM International Conference on Automated Software Engineering, ASE 2022, Rochester, MI, USA, October 10-14, 2022, pp. 134:1-134:6, 2022, ACM, 978-1-4503-9475-8. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
32 | Khuyagbaatar Batsuren, Omer Goldman, Salam Khalifa, Nizar Habash, Witold Kieras, Gábor Bella, Brian Leonard, Garrett Nicolai, Kyle Gorman, Yustinus Ghanggo Ate, Maria Ryskina, Sabrina J. Mielke, Elena Budianskaya, Charbel El-Khaissi, Tiago Pimentel, Michael Gasser, William Abbott Lane, Mohit Raj, Matt Coler, Jaime Rafael Montoya Samame, Delio Siticonatzi Camaiteri, Esaú Zumaeta Rojas, Didier López Francis, Arturo Oncevay, Juan López Bautista, Gema Celeste Silva Villegas, Lucas Torroba Hennigen, Adam Ek, David Guriel, Peter Dirix, Jean-Philippe Bernardy, Andrey Scherbakov, Aziyana Bayyr-ool, Antonios Anastasopoulos, Roberto Zariquiey, Karina Sheifer, Sofya Ganieva, Hilaria Cruz, Ritván Karahóga, Stella Markantonatou, George Pavlidis, Matvey Plugaryov, Elena Klyachko, Ali Salehi, Candy Angulo, Jatayu Baxi, Andrew Krizhanovsky, Natalia Krizhanovskaya, Elizabeth Salesky, Clara Vania, Sardana Ivanova, Jennifer White, Rowan Hall Maudslay, Josef Valvoda, Ran Zmigrod, Paula Czarnowska, Irene Nikkarinen, Aelita Salchak, Brijesh Bhatt, Christopher Straughn, Zoey Liu, Jonathan North Washington, Yuval Pinter, Duygu Ataman, Marcin Wolinski, Totok Suhardijanto, Anna Yablonskaya, Niklas Stoehr, Hossep Dolatian, Zahroh Nuriah, Shyam Ratan, Francis M. Tyers, Edoardo M. Ponti, Grant Aiton, Aryaman Arora, Richard J. Hatcher, Ritesh Kumar, Jeremiah Young, Daria Rodionova, Anastasia Yemelina, Taras Andrushko, Igor Marchenko, Polina Mashkovtseva, Alexandra Serova, Emily Prud'hommeaux, Maria Nepomniashchaya, Fausto Giunchiglia, Eleanor Chodroff, Mans Hulden, Miikka Silfverberg, Arya D. McCarthy, David Yarowsky, Ryan Cotterell, Reut Tsarfaty, Ekaterina Vylomova |
UniMorph 4.0: Universal Morphology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
LREC ![In: Proceedings of the Thirteenth Language Resources and Evaluation Conference, LREC 2022, Marseille, France, 20-25 June 2022, pp. 840-855, 2022, European Language Resources Association. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP BibTeX RDF |
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32 | Jash R. Parekh, Ate Poortinga, Biplov Bhandari, Timothy J. Mayer, David Saah, Farrukh Chishtie |
Automatic Detection of Impervious Surfaces from Remotely Sensed Data Using Deep Learning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Remote. Sens. ![In: Remote. Sens. 13(16), pp. 3166, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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32 | Raja Ram Aryal, Crystal Wespestad, Robert Kennedy, John Dilger, Karen Dyson, Eric Bullock, Nishanta Khanal, Marija Kono, Ate Poortinga, David Saah, Karis Tenneson |
Lessons Learned While Implementing a Time-Series Approach to Forest Canopy Disturbance Detection in Nepal. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Remote. Sens. ![In: Remote. Sens. 13(14), pp. 2666, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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32 | Qingqing Chen 0002, Ate Poorthuis |
Identifying home locations in human mobility data: an open-source R package for comparison and reproducibility. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Geogr. Inf. Sci. ![In: Int. J. Geogr. Inf. Sci. 35(7), pp. 1425-1448, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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32 | Caitrin Armstrong, Ate Poorthuis, Matthew Zook, Derek Ruths, Thomas Soehl |
Challenges when identifying migration from geo-located Twitter data. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EPJ Data Sci. ![In: EPJ Data Sci. 10(1), pp. 1, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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32 | Qingqing Chen 0002, I-Ting Chuang, Ate Poorthuis |
Entangled footprints: Understanding urban neighbourhoods by measuring distance, diversity, and direction of flows in Singapore. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Comput. Environ. Urban Syst. ![In: Comput. Environ. Urban Syst. 90, pp. 101708, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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32 | Hazem Elgabry, Shimaa Attia, Ahmed Abdel-Rahman, Ahmed Abdel-Ate, Sandra Girgis |
A Contextual Word Embedding for Arabic Sarcasm Detection with Random Forests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
WANLP ![In: Proceedings of the Sixth Arabic Natural Language Processing Workshop, WANLP 2021, Kyiv, Ukraine (Virtual), April 9, 2021, pp. 340-344, 2021, Association for Computational Linguistics, 978-1-954085-09-1. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP BibTeX RDF |
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32 | Ate Poortinga, Aekkapol Aekakkararungroj, Kritsana Kityuttachai, Quyen Nguyen, Biplov Bhandari, Nyein Soe Thwal, Hannah Priestley, Jiwon Kim, Karis Tenneson, Farrukh Chishtie, Peeranan Towashiraporn, David Saah |
Predictive Analytics for Identifying Land Cover Change Hotspots in the Mekong Region. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Remote. Sens. ![In: Remote. Sens. 12(9), pp. 1472, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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32 | Miguel Laverde-Barajas, G. A. Corzo Perez, Ate Poortinga, Farrukh Chishtie, Chinaporn Meechaiya, Susantha Jayasinghe, Peeranan Towashiraporn, Amanda M. Markert, David Saah, Lam Hung Son, Khem Sothea, Surajate Boonya-aroonnet, Winai Chaowiwat, Remko Uijlenhoet, Dimitri P. Solomatine |
ST-CORAbico: A Spatiotemporal Object-Based Bias Correction Method for Storm Prediction Detected by Satellite. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Remote. Sens. ![In: Remote. Sens. 12(21), pp. 3538, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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32 | Kel N. Markert, Amanda M. Markert, Timothy J. Mayer, Claire Nauman, Arjen Haag, Ate Poortinga, Biplov Bhandari, Nyein Soe Thwal, Thannarot Kunlamai, Farrukh Chishtie, Martijn Kwant, Kittiphong Phongsapan, Nicholas Clinton, Peeranan Towashiraporn, David Saah |
Comparing Sentinel-1 Surface Water Mapping Algorithms and Radiometric Terrain Correction Processing in Southeast Asia Utilizing Google Earth Engine. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Remote. Sens. ![In: Remote. Sens. 12(15), pp. 2469, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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32 | Nishanta Khanal, Mir Matin, Kabir Uddin, Ate Poortinga, Farrukh Chishtie, Karis Tenneson, David Saah |
A Comparison of Three Temporal Smoothing Algorithms to Improve Land Cover Classification: A Case Study from NEPAL. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Remote. Sens. ![In: Remote. Sens. 12(18), pp. 2888, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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32 | Xiaojing Wu, Ate Poorthuis, Raúl Zurita-Milla, Menno-Jan Kraak |
An interactive web-based geovisual analytics platform for co-clustering spatio-temporal data. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Comput. Geosci. ![In: Comput. Geosci. 137, pp. 104420, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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32 | David Saah, Karis Tenneson, Ate Poortinga, Quyen Nguyen, Farrukh Chishtie, Khun San Aung, Kel N. Markert, Nicholas Clinton, Eric R. Anderson 0002, Peter Cutter, Joshua Goldstein, Ian W. Housman, Biplov Bhandari, Peter V. Potapov, Mir Matin, Kabir Uddin, Hai N. Pham, Nishanta Khanal, David J. Ganz |
Primitives as building blocks for constructing land cover maps. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Appl. Earth Obs. Geoinformation ![In: Int. J. Appl. Earth Obs. Geoinformation 85, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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32 | Aekkapol Aekakkararungroj, Farrukh Chishtie, Ate Poortinga, Hamid Mehmood, Eric R. Anderson 0002, Thailynn Munroe, Peter Cutter, Nuntarut Loketkawee, Githika Tondapu, Peeranan Towashiraporn, David Saah |
A publicly available GIS-based web platform for reservoir inundation mapping in the lower Mekong region. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Environ. Model. Softw. ![In: Environ. Model. Softw. 123, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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32 | Grace Guo, Bianchi Dy, Nazim Ibrahim, Sam Conrad Joyce, Ate Poorthuis |
Examining Design-Centric Test Participants in Graphical Perception Experiments. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EuroVis (Short Papers) ![In: 22nd Eurographics Conference on Visualization, EuroVis 2020 - Short Papers, Norrköping, Sweden, May 25-29, 2020 [online only], pp. 43-47, 2020, Eurographics Association, 978-3-03868-106-9. The full citation details ...](Pics/full.jpeg) |
2020 |
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