Search results for "SCOAP"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
200	C. P. Ravikumar, Hemant Joshi	HISCOAP: a hierarchical testability analysis tool.	VLSI Design	1995	DBLP DOI BibTeX RDF	HISCOAP, hierarchical testability analysis tool, SCOAP measure, gate-level netlist, SCOAP expression diagrams, VLSI, logic testing, controllability, controllability, sequential circuits, sequential circuits, combinational circuits, combinational circuits, observability, observability, circuit analysis computing, integrated logic circuits, VLSI circuits, functional modules, stuck at fault model
53	Waleed K. Al-Assadi, Sindhu Kakarla	Design for Test of Asynchronous NULL Convention Logic (NCL) Circuits.	J. Electron. Test.	2009	DBLP DOI BibTeX RDF	NULL convention logic (NCL), SCOAP, ATPG, Asynchronous circuits, Design for test (DFT)
53	C. P. Ravikumar, Gurjeet S. Saund, Nidhi Agrawal	A STAFAN-like functional testability measure for register-level circuits.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	functional testability measure, register-level circuits, testability analysis programs, SCOAP, gate-level digital circuits, testability-driven synthesis, busses, F-STAFAN, Sun/SPARC workstation, performance evaluation, fault diagnosis, logic testing, high-level synthesis, statistical analysis, design for testability, fault simulation, fault coverage, circuit analysis computing, adders, multipliers, multiplexers, digital circuit, shift registers, logic gates, reliability theory, stuck-at fault model
35	Richa Sharma, G. K. Sharma 0001, Manisha Pattanaik, V. S. S. Prashant	Structural and SCOAP Features Based Approach for Hardware Trojan Detection Using SHAP and Light Gradient Boosting Model.	J. Electron. Test.	2023	DBLP DOI BibTeX RDF
35	Chi-Wei Chen, Pei-Yu Lo, Wei-Ting Hsu, Chih-Wei Chen, Chin-Wei Tien, Sy-Yen Kuo	A Hardware Trojan Insertion Framework against Gate-Level Netlist Structural Feature-based and SCOAP-based Detection.	MWSCAS	2022	DBLP DOI BibTeX RDF
35	Pei-Yu Lo, Chi-Wei Chen, Wei-Ting Hsu, Chih-Wei Chen, Chin-Wei Tien, Sy-Yen Kuo	Semi-supervised Trojan Nets Classification Using Anomaly Detection Based on SCOAP Features.	ISCAS	2022	DBLP DOI BibTeX RDF
35	Seyyede Maryam Ghasemy, Maryam Rajabalipanah, Saeideh Sarmadi, Zainalabedin Navabi	SCOAP-based Directed Random Test Generation for Combinational Circuits.	EWDTS	2019	DBLP DOI BibTeX RDF
35	Chee Hoo Kok, Chia Yee Ooi, Mehrdad Moghbel, Nordinah Ismail, Hau Sim Choo, Michiko Inoue	Classification of Trojan Nets Based on SCOAP Values using Supervised Learning.	ISCAS	2019	DBLP DOI BibTeX RDF
35	Nam Ky Giang, Minkeun Ha, Daeyoung Kim 0001	SCoAP: An integration of CoAP protocol with web-based application.	GLOBECOM	2013	DBLP DOI BibTeX RDF
35	C. P. Ravikumar, Hemant Joshi	SCOAP-based Testability Analysis from Hierarchical Netlists.	VLSI Design	1998	DBLP DOI BibTeX RDF
35	Lawrence H. Goldstein, Evelyn L. Thigpen	SCOAP: Sandia controllability/observability analysis program.	DAC	1980	DBLP DOI BibTeX RDF
23	Shih-Chieh Chang, Wen-Ben Jone, Shi-Sen Chang	TAIR: testability analysis by implication reasoning.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2000	DBLP DOI BibTeX RDF
23	M. H. Konijnenburg, Hans van der Linden, Ad J. van de Goor	Fault (In)Dependent Cost Estimates and Conflict-Directed Backtracking to Guide Sequential Circuit Test Generation.	Asian Test Symposium	1999	DBLP DOI BibTeX RDF	sequential circuit TPG, back-jumping, conflict-directed backtrack, three-state (tri-state) circuit TPG, ATPG, cost estimates
23	Kim T. Le, Kewal K. Saluja	A Heuristic Measure to Maximize Detected Faults per Test.	J. Electron. Test.	1998	DBLP DOI BibTeX RDF	combinational circuit testing, dynamic test compaction, fault selection, test generation, testability measures, backtrace
23	Marie-Lise Flottes, R. Pires, Bruno Rouzeyre	Analyzing testability from behavioral to RT level.	ED&TC	1997	DBLP DOI BibTeX RDF
23	Eric Schell, M. Ray Mercer	CADTOOLS: a CAD algorithm development system.	DAC	1985	DBLP DOI BibTeX RDF	software engineering, CAD