|
|
Venues (Conferences, Journals, ...)
|
|
GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 30 occurrences of 28 keywords
|
|
|
Results
Found 104 publication records. Showing 104 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
67 | Xiaochun Yu, R. D. (Shawn) Blanton |
Multiple defect diagnosis using no assumptions on failing pattern characteristics. |
DAC |
2008 |
DBLP DOI BibTeX RDF |
defect diagnosis, fault isolation, IC testing |
66 | Shi-Yu Huang |
On Improving the Accuracy Of Multiple Defect Diagnosis. |
VTS |
2001 |
DBLP DOI BibTeX RDF |
|
63 | Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou, Magdy S. Abadir |
Delay Defect Diagnosis Based Upon Statistical Timing Models - The First Step. |
DATE |
2003 |
DBLP DOI BibTeX RDF |
|
61 | Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou, T. M. Mak |
Enhancing diagnosis resolution for delay defects based upon statistical timing and statistical fault models. |
DAC |
2003 |
DBLP DOI BibTeX RDF |
delay ATPG, delay fault diagnosis, statistical timing models |
50 | Wei Zou, Wu-Tung Cheng, Sudhakar M. Reddy |
Bridge Defect Diagnosis with Physical Information. |
Asian Test Symposium |
2005 |
DBLP DOI BibTeX RDF |
|
45 | Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou |
Diagnosis of Delay Defects Using Statistical Timing Models. |
VTS |
2003 |
DBLP DOI BibTeX RDF |
|
41 | Shi-Yu Huang |
Towards the logic defect diagnosis for partial-scan designs. |
ASP-DAC |
2001 |
DBLP DOI BibTeX RDF |
|
34 | Chih-Wea Wang, Kuo-Liang Cheng, Jih-Nung Lee, Yung-Fa Chou, Chih-Tsun Huang, Cheng-Wen Wu, Frank Huang, Hong-Tzer Yang |
Fault Pattern Oriented Defect Diagnosis for Memories. |
ITC |
2003 |
DBLP DOI BibTeX RDF |
failure analysis (FA), fault pattern, memory diagnostics, memory testing, bitmap, semiconductor memory |
32 | Manoj Sachdev |
SeparateIDDQ testing of signal and bias paths in CMOS ICs for defect diagnosis. |
J. Electron. Test. |
1996 |
DBLP DOI BibTeX RDF |
junction leakage current, diagnostics, deep sub-micron, I DDQ testing, subthreshold leakage current |
31 | Pilsung Choe, Chulwoo Kim, Mark R. Lehto, Jan P. Allebach |
Experimental Comparison of Adaptive vs. Static Thumbnail Displays. |
HCI (2) |
2007 |
DBLP DOI BibTeX RDF |
static display, thumbnail display, print defect diagnosis, information retrieval, search, diagnosis, keyword search, troubleshooting, Adaptive display |
30 | Wei Zou, Wu-Tung Cheng, Sudhakar M. Reddy, Huaxing Tang |
Speeding Up Effect-Cause Defect Diagnosis Using a Small Dictionary. |
VTS |
2007 |
DBLP DOI BibTeX RDF |
|
29 | Yu Huang 0005 |
Dynamic learning based scan chain diagnosis. |
DATE |
2007 |
DBLP DOI BibTeX RDF |
|
26 | Jennifer Dworak |
An Investigation of Excitation Balance and Additional Mandatory Conditions for the Diagnosis of Fortuitously Detected Defects. |
MTV |
2005 |
DBLP DOI BibTeX RDF |
|
26 | Jean-Michel Portal, L. Forli, Hassen Aziza, Didier Née |
An Automated Methodology to Diagnose Geometric Defect in the EEPROM Cell. |
ITC |
2002 |
DBLP DOI BibTeX RDF |
|
24 | Shuo Wang, Jianwei Dai, Lei Wang 0003 |
Defect-tolerant digital filtering with unreliable molecular electronics. |
SiPS |
2008 |
DBLP DOI BibTeX RDF |
|
24 | Haihua Yan, Adit D. Singh |
A Delay Test to Differentiate Resistive Interconnect Faults from Weak Transistor Defects. |
VLSI Design |
2005 |
DBLP DOI BibTeX RDF |
|
24 | Zoran Stanojevic, Hari Balachandran, D. M. H. Walker, Fred Lakbani, Jayashree Saxena, Kenneth M. Butler |
Computer-aided fault to defect mapping (CAFDM) for defect diagnosis. |
ITC |
2000 |
DBLP DOI BibTeX RDF |
|
20 | Srikanth Venkataraman, Irith Pomeranz, Shraddha Bodhe, M. Enamul Amyeen |
Test reordering for improved scan chain diagnosis using an enhanced defect diagnosis procedure. |
ITC |
2017 |
DBLP DOI BibTeX RDF |
|
20 | Vishal J. Mehta, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski |
Timing-Aware Multiple-Delay-Fault Diagnosis. |
ISQED |
2008 |
DBLP DOI BibTeX RDF |
defect-diagnosis, diagnosis, ATPG, DFT, delay-testing |
20 | Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi |
Diagnosis of Full Open Defects in Interconnecting Lines. |
VTS |
2007 |
DBLP DOI BibTeX RDF |
Defect Diagnosis, Full Open Defect, Interconnecting Line, CMOS |
20 | James F. Plusquellic, Donald M. Chiarulli, Steven P. Levitan |
Characterization of CMOS Defects using Transient Signal Analysis. |
DFT |
1998 |
DBLP DOI BibTeX RDF |
transient signal analysis, CMOS defect characterization, defect diagnosis, failure analysis |
20 | Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, T. M. Mak |
Diagnosis-Based Post-Silicon Timing Validation Using Statistical Tools and Methodologies. |
ITC |
2003 |
DBLP DOI BibTeX RDF |
|
17 | Jerry M. Soden, Charles F. Hawkins, Ravi K. Gulati, Weiwei Mao |
IDDQ testing: A review. |
J. Electron. Test. |
1992 |
DBLP DOI BibTeX RDF |
IC quality, fault models, defects, Current testing, CMOS IC, I DDQ |
15 | Jean Michel Penalva, Laurent Coudouneau, Lydie Leyval, Jacky Montmain |
A Supervision Support System for Industrial Processes. |
IEEE Expert |
1993 |
DBLP DOI BibTeX RDF |
|
15 | Yanxin Wang, Jing Yan 0003, Zhou Yang 0006, Zhenkang Qi, Jianhua Wang, Yingsan Geng |
A novel hybrid meta-learning for few-shot gas-insulated switchgear insulation defect diagnosis. |
Expert Syst. Appl. |
2023 |
DBLP DOI BibTeX RDF |
|
15 | Yangze Liang, Guangyao Chen, Sihao Li, Zhao Xu |
Intelligent Defect Diagnosis of Appearance Quality for Prefabricated Concrete Components Based on Target Detection and Multimodal Fusion Decision. |
J. Comput. Civ. Eng. |
2023 |
DBLP DOI BibTeX RDF |
|
15 | Ruoxin Wang, Chi Fai Cheung |
Knowledge graph embedding learning system for defect diagnosis in additive manufacturing. |
Comput. Ind. |
2023 |
DBLP DOI BibTeX RDF |
|
15 | Mu Nie, Wen Jiang, Wankou Yang, Senling Wang, Xiaoqing Wen, Tianming Ni |
Enhancing Defect Diagnosis and Localization in Wafer Map Testing Through Weakly Supervised Learning. |
ATS |
2023 |
DBLP DOI BibTeX RDF |
|
15 | Yi Zhang |
GIS equipment defect diagnosis based on X-ray detection technology. |
iSPEC |
2023 |
DBLP DOI BibTeX RDF |
|
15 | Szczepan Urban, Piotr Zimnowlodzki, Manish Sharma, Shraddha Bodhe, John Schulze, Abdullah Yassine, Adam Styblinski |
Global Control Signal Defect Diagnosis in Volume Production Environment. |
ITC |
2023 |
DBLP DOI BibTeX RDF |
|
15 | Weihong Zhai, Xiupeng Shi, Zeng Zeng |
Adaptive Modelling for Anomaly Detection and Defect Diagnosis in Semiconductor Smart Manufacturing: A Domain-specific AutoML. |
CIS-RAM |
2023 |
DBLP DOI BibTeX RDF |
|
15 | Qing Han, Yu Xia, Xiupeng Shi, Zeng Zeng |
AutoML with Focal Loss for Defect Diagnosis and Prognosis in Smart Manufacturing. |
CIS-RAM |
2023 |
DBLP DOI BibTeX RDF |
|
15 | Wuqin Tang, Qiang Yang, Xiaochen Hu, Wenjun Yan |
Convolution neural network based polycrystalline silicon photovoltaic cell linear defect diagnosis using electroluminescence images. |
Expert Syst. Appl. |
2022 |
DBLP DOI BibTeX RDF |
|
15 | Yanxin Wang, Jing Yan 0003, Zhou Yang 0006, Zhenkang Qi, Jianhua Wang, Yingsan Geng |
Gas-Insulated Switchgear Insulation Defect Diagnosis via a Novel Domain Adaptive Graph Convolutional Network. |
IEEE Trans. Instrum. Meas. |
2022 |
DBLP DOI BibTeX RDF |
|
15 | Sonal Gahlot, S. R. N. Reddy, Dinesh Kumar |
Early congenital heart defect diagnosis in neonates using novel WBAN based three-tier network architecture. |
J. King Saud Univ. Comput. Inf. Sci. |
2022 |
DBLP DOI BibTeX RDF |
|
15 | Syed Muhammad Tayyab, Steven Chatterton, Paolo Pennacchi |
Intelligent Defect Diagnosis of Rolling Element Bearings under Variable Operating Conditions Using Convolutional Neural Network and Order Maps. |
Sensors |
2022 |
DBLP DOI BibTeX RDF |
|
15 | Sheetal Barekar, Madan Mali |
On-chip weak resistive defect diagnosis with performance enhancement in 45 nm technology static random access memory. |
Microelectron. J. |
2021 |
DBLP DOI BibTeX RDF |
|
15 | Xutong Tan, Chun Yin, Xuegang Huang, Sara Dadras |
Design of Defect Diagnosis Algorithm with Multi-objective Feature Extraction Optimization to Assess the M/OD Impact Damages. |
ACC |
2021 |
DBLP DOI BibTeX RDF |
|
15 | Katherine Shu-Min Li, Leon Li-Yang Chen, Peter Yi-Yu Liao, Sying-Jyan Wang, Andrew Yi-Ann Huang, Ken Chau-Cheung Cheng |
Integrated Scratch Marker for Wafer Defect Diagnosis. |
ITC-Asia |
2021 |
DBLP DOI BibTeX RDF |
|
15 | Taotao Zhou, Jiangjun Ruan, Yufei Liu, Shiyi Peng, Boyong Wang |
Defect Diagnosis of Disconnector Based on Wireless Communication and Support Vector Machine. |
IEEE Access |
2020 |
DBLP DOI BibTeX RDF |
|
15 | Jihye Kim, Hayoung Lee, Seokjun Jang, Sungho Kang 0001 |
Fine-Grained Defect Diagnosis for CMOL FPGA Circuits. |
IEEE Access |
2020 |
DBLP DOI BibTeX RDF |
|
15 | Lei Bai 0007, Rengkui Liu, Qing Li |
Data-Driven Bias Correction and Defect Diagnosis Model for In-Service Vehicle Acceleration Measurements. |
Sensors |
2020 |
DBLP DOI BibTeX RDF |
|
15 | Ken Chau-Cheung Cheng, Katherine Shu-Min Li, Andrew Yi-Ann Huang, Ji-Wei Li, Leon Li-Yang Chen, Nova Cheng-Yen Tsai, Sying-Jyan Wang, Chen-Shiun Lee, Leon Chou, Peter Yi-Yu Liao, Hsing-Chung Liang, Jwu E. Chen |
Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis. |
DATE |
2020 |
DBLP DOI BibTeX RDF |
|
15 | Safa Mhamdi, Patrick Girard 0001, Arnaud Virazel, Alberto Bosio, Aymen Ladhar |
Learning-Based Cell-Aware Defect Diagnosis of Customer Returns. |
ETS |
2020 |
DBLP DOI BibTeX RDF |
|
15 | Jihye Kim, Hayoung Lee, Seokjun Jang, Hogyeong Kim, Sungho Kang 0001 |
Memory-like Defect Diagnosis for CMOL FPGAs. |
ISOCC |
2020 |
DBLP DOI BibTeX RDF |
|
15 | Soumya Mittal, R. D. Shawn Blanton |
A Deterministic-Statistical Multiple-Defect Diagnosis Methodology. |
VTS |
2020 |
DBLP DOI BibTeX RDF |
|
15 | Xia Fang, Wang Jie, Tao Feng |
An Industrial Micro-Defect Diagnosis System via Intelligent Segmentation Region. |
Sensors |
2019 |
DBLP DOI BibTeX RDF |
|
15 | Soumya Mittal, R. D. Shawn Blanton |
LearnX: A Hybrid Deterministic-Statistical Defect Diagnosis Methodology. |
ETS |
2019 |
DBLP DOI BibTeX RDF |
|
15 | Thomas Zehelein, Philip Werk, Markus Lienkamp |
An Evaluation of Autoencoder and Sparse Filter as Automated Feature Extraction Process for Automotive Damper Defect Diagnosis. |
EVER |
2019 |
DBLP DOI BibTeX RDF |
|
15 | Irith Pomeranz |
Selecting Functional Test Sequences for Defect Diagnosis. |
IEEE Trans. Very Large Scale Integr. Syst. |
2018 |
DBLP DOI BibTeX RDF |
|
15 | Ji-wang Zhang, Lai-bin Zhang, Li-xiang Duan |
A Blade Defect Diagnosis Method by Fusing Blade Tip Timing and Tip Clearance Information. |
Sensors |
2018 |
DBLP DOI BibTeX RDF |
|
15 | Naixing Wang, Irith Pomeranz, Brady Benware, M. Enamul Amyeen, Srikanth Venkataraman |
Improving the Resolution of Multiple Defect Diagnosis by Removing and Selecting Tests. |
DFT |
2018 |
DBLP DOI BibTeX RDF |
|
15 | Irith Pomeranz |
Identifying Biases of a Defect Diagnosis Procedure. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2017 |
DBLP DOI BibTeX RDF |
|
15 | Ben Niewenhuis, Soumya Mittal, R. D. (Shawn) Blanton |
Multiple-defect diagnosis for Logic Characterization Vehicles. |
ETS |
2017 |
DBLP DOI BibTeX RDF |
|
15 | Guanghui Li 0001, Xiang Weng, Xiaocheng Du, Xiping Wang, Hailin Feng |
Stress wave velocity patterns in the longitudinal-radial plane of trees for defect diagnosis. |
Comput. Electron. Agric. |
2016 |
DBLP DOI BibTeX RDF |
|
15 | Irith Pomeranz |
A Test Selection Procedure for Improving the Accuracy of Defect Diagnosis. |
IEEE Trans. Very Large Scale Integr. Syst. |
2016 |
DBLP DOI BibTeX RDF |
|
15 | Jaeyong Chung, Woochul Kang |
Defect Diagnosis via Segment Delay Learning. |
IEEE Trans. Very Large Scale Integr. Syst. |
2016 |
DBLP DOI BibTeX RDF |
|
15 | Irith Pomeranz |
Improving the accuracy of defect diagnosis by adding and removing tests. |
IET Comput. Digit. Tech. |
2016 |
DBLP DOI BibTeX RDF |
|
15 | Irith Pomeranz |
Improving the Accuracy of Defect Diagnosis with Multiple Sets of Candidate Faults. |
IEEE Trans. Computers |
2016 |
DBLP DOI BibTeX RDF |
|
15 | Ning Yu, Xiaohui Shen, Zhe L. Lin, Radomír Mech, Connelly Barnes |
Automatic Image Defect Diagnosis. |
CoRR |
2016 |
DBLP BibTeX RDF |
|
15 | Baris Arslan |
Small delay defect diagnosis through failure observation ordering. |
AQTR |
2016 |
DBLP DOI BibTeX RDF |
|
15 | Eun Jung Jang, Jaeyong Chung, Jacob A. Abraham |
Delay Defect Diagnosis Methodology Using Path Delay Measurements. |
IEICE Trans. Electron. |
2015 |
DBLP DOI BibTeX RDF |
|
15 | Michal Tadeusiewicz, Andrzej Kuczynski, Stanislaw Halgas |
Spot Defect Diagnosis in Analog Nonlinear Circuits with Possible Multiple Operating Points. |
J. Electron. Test. |
2015 |
DBLP DOI BibTeX RDF |
|
15 | Gontran Sion, Yves Blaquière, Yvon Savaria |
Defect diagnosis algorithms for a field programmable interconnect network embedded in a Very Large Area Integrated Circuit. |
IOLTS |
2015 |
DBLP DOI BibTeX RDF |
|
15 | Mohamad Chakaroun, Mohand Djeziri, Mustapha Ouladsine, Jacques Pinaton |
Defect diagnosis using in line product control data in semiconductor industry. |
ICSC |
2015 |
DBLP DOI BibTeX RDF |
|
15 | Irith Pomeranz |
Improving the accuracy of defect diagnosis by considering reduced diagnostic information. |
VTS |
2015 |
DBLP DOI BibTeX RDF |
|
15 | Po-Juei Chen, Chieh-Chih Che, J. C.-M. Li, Shuo-Fen Kuo, Pei-Ying Hsueh, Chun-Yi Kuo, Jih-Nung Lee |
Physical-aware systematic multiple defect diagnosis. |
IET Comput. Digit. Tech. |
2014 |
DBLP DOI BibTeX RDF |
|
15 | Irith Pomeranz |
Functional Broadside Tests for Multistep Defect Diagnosis. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2014 |
DBLP DOI BibTeX RDF |
|
15 | Irith Pomeranz |
Improving the Accuracy of Defect Diagnosis by Considering Fewer Tests. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2014 |
DBLP DOI BibTeX RDF |
|
15 | Chun-Chuan Chi, Bing-Yang Lin, Cheng-Wen Wu, Min-Jer Wang, Hung-Chih Lin, Ching-Nen Peng |
On Improving Interconnect Defect Diagnosis Resolution and Yield for Interposer-Based 3-D ICs. |
IEEE Des. Test |
2014 |
DBLP DOI BibTeX RDF |
|
15 | Faiza Iftikhar, Ayesha Shams, Arfa Dilawari |
RCD: a toolkit for rheumatic valvular and congenital heart defect diagnosis. |
Neural Comput. Appl. |
2013 |
DBLP DOI BibTeX RDF |
|
15 | Chiao-Wen Liu, Chen-Fu Chien 0001 |
An intelligent system for wafer bin map defect diagnosis: An empirical study for semiconductor manufacturing. |
Eng. Appl. Artif. Intell. |
2013 |
DBLP DOI BibTeX RDF |
|
15 | Chidambaram Alagappan, Vishwani D. Agrawal |
Defect Diagnosis of Digital Circuits Using Surrogate Faults. |
VDAT |
2013 |
DBLP DOI BibTeX RDF |
|
15 | Dimitris Liparas, Lefteris Angelis, Robert Feldt |
Applying the Mahalanobis-Taguchi strategy for software defect diagnosis. |
Autom. Softw. Eng. |
2012 |
DBLP DOI BibTeX RDF |
|
15 | Hisham A. H. Al-Khazali, Mohamad R. Askari |
Defect Diagnosis in Rotors Systems by Vibrations Data Collectors Using Trending Software |
CoRR |
2012 |
DBLP BibTeX RDF |
|
15 | Amirali Ghofrani, Ritesh Parikh, Saeed Shamshiri, Andrew DeOrio, Kwang-Ting Cheng, Valeria Bertacco |
Comprehensive online defect diagnosis in on-chip networks. |
VTS |
2012 |
DBLP DOI BibTeX RDF |
|
15 | Pilsung Choe, Mark R. Lehto, Jan P. Allebach |
Query translation-based cross-language print defect diagnosis based on the fuzzy Bayesian model. |
J. Intell. Manuf. |
2011 |
DBLP DOI BibTeX RDF |
|
15 | Chao-Wen Tzeng, Shi-Yu Huang |
Split-Masking: An Output Masking Scheme for Effective Compound Defect Diagnosis in Scan Architecture With Test Compression. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2010 |
DBLP DOI BibTeX RDF |
|
15 | Aymen Ladhar, Mohamed Masmoudi |
An Effective and Accurate Methodology for the Cell Internal Defect Diagnosis. |
J. Electron. Test. |
2010 |
DBLP DOI BibTeX RDF |
|
15 | Dongok Kim, Irith Pomeranz, M. Enamul Amyeen, Srikanth Venkataraman |
Defect diagnosis based on DFM guidelines. |
VTS |
2010 |
DBLP DOI BibTeX RDF |
|
15 | Ruqiang Yan 0001, Robert X. Gao |
Energy-Based Feature Extraction for Defect Diagnosis in Rotary Machines. |
IEEE Trans. Instrum. Meas. |
2009 |
DBLP DOI BibTeX RDF |
|
15 | Gang Chen 0011, Janusz Rajski, Sudhakar M. Reddy, Irith Pomeranz |
N-distinguishing Tests for Enhanced Defect Diagnosis. |
Asian Test Symposium |
2009 |
DBLP DOI BibTeX RDF |
|
15 | Rama Gudavalli, W. Robert Daasch, Phil Nigh, Douglas Heaberlin |
Application of non-parametric statistics of the parametric response for defect diagnosis. |
ITC |
2009 |
DBLP DOI BibTeX RDF |
|
15 | S. Saqib Khursheed, Paul M. Rosinger, Bashir M. Al-Hashimi, Sudhakar M. Reddy, Peter Harrod |
Bridge Defect Diagnosis for Multiple-Voltage Design. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
Logic based Diagnosis, Multiple-Vdd designs, Resistive Bridging Faults |
15 | Wu-Tung Cheng, Brady Benware, Ruifeng Guo, Kun-Han Tsai, Takeo Kobayashi, Kazuyuki Maruo, Michinobu Nakao, Yoshiaki Fukui, Hideyuki Otake |
Enhancing Transition Fault Model for Delay Defect Diagnosis. |
ATS |
2008 |
DBLP DOI BibTeX RDF |
|
15 | Xiaochun Yu, Ronald D. Blanton |
An Effective and Flexible Multiple Defect Diagnosis Methodology Using Error Propagation Analysis. |
ITC |
2008 |
DBLP DOI BibTeX RDF |
|
15 | Tao Xu 0002, Krishnendu Chakrabarty |
Parallel Scan-Like Test and Multiple-Defect Diagnosis for Digital Microfluidic Biochips. |
IEEE Trans. Biomed. Circuits Syst. |
2007 |
DBLP DOI BibTeX RDF |
|
15 | Shuo Li 0001, Ian G. Ross, Sukhdeep Gill, Terry M. Peters, Prakash Mahesh, Richard Rankin |
Computer-aided septal defect diagnosis and detection. |
Medical Imaging: Computer-Aided Diagnosis |
2007 |
DBLP DOI BibTeX RDF |
|
15 | Chen Liu, Wei Zou, Sudhakar M. Reddy, Wu-Tung Cheng, Manish Sharma, Huaxing Tang |
Interconnect open defect diagnosis with minimal physical information. |
ITC |
2007 |
DBLP DOI BibTeX RDF |
|
15 | Osei Poku, Ronald D. Blanton |
Delay defect diagnosis using segment network faults. |
ITC |
2007 |
DBLP DOI BibTeX RDF |
|
15 | Yasuo Sato, Kazushi Sugiura, Reisuke Shimoda, Yutaka Yoshizawa, Kenji Norimatsu, Masaru Sanada |
Defect Diagnosis - Reasoning Methodology. |
ATS |
2006 |
DBLP DOI BibTeX RDF |
|
15 | Wei Zou, Wu-Tung Cheng, Sudhakar M. Reddy |
Interconnect Open Defect Diagnosis with Physical Information. |
ATS |
2006 |
DBLP DOI BibTeX RDF |
|
15 | Mu-Hsien Hsu, Yu-Tsao Hsing, Jen-Chieh Yeh, Cheng-Wen Wu |
Fault-Pattern Oriented Defect Diagnosis for Flash Memory. |
MTDT |
2006 |
DBLP DOI BibTeX RDF |
|
15 | Vishal J. Mehta, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski |
Timing Defect Diagnosis in Presence of Crosstalk for Nanometer Technology. |
ITC |
2006 |
DBLP DOI BibTeX RDF |
|
15 | Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy, M. Enamul Amyeen |
Defect Diagnosis Based on Pattern-Dependent Stuck-At Faults. |
VLSI Design |
2004 |
DBLP DOI BibTeX RDF |
|
15 | Chintan Patel, Ernesto Staroswiecki, Smita Pawar, Dhruva Acharyya, Jim Plusquellic |
Defect Diagnosis Using a Current Ratio Based Quiescent Signal Analysis Model for Commercial Power Grids. |
J. Electron. Test. |
2003 |
DBLP DOI BibTeX RDF |
I DDT, quiescent signal analysis, test, power grids, I DDQ |
15 | Sheng-Jen Hsieh |
Knowledge integration strategies in defect diagnosis. |
|
1995 |
RDF |
|
11 | Abdelkader Adla |
Agent-Based Group Decision Making. |
ICSEA |
2008 |
DBLP DOI BibTeX RDF |
|
11 | Giuseppe Acciani, A. Camposarcone, Silvano Vergura |
Innovative Methodology for IR Acquisition. |
ICCSA (2) |
2008 |
DBLP DOI BibTeX RDF |
|
11 | V. M. D. Jagannath, Bhaskaran Raman |
WiBeaM: Wireless Bearing Monitoring System. |
COMSWARE |
2007 |
DBLP DOI BibTeX RDF |
|
Displaying result #1 - #100 of 104 (100 per page; Change: ) Pages: [ 1][ 2][ >>] |
|