Search results for "defect-diagnosis"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
67	Xiaochun Yu, R. D. (Shawn) Blanton	Multiple defect diagnosis using no assumptions on failing pattern characteristics.	DAC	2008	DBLP DOI BibTeX RDF	defect diagnosis, fault isolation, IC testing
66	Shi-Yu Huang	On Improving the Accuracy Of Multiple Defect Diagnosis.	VTS	2001	DBLP DOI BibTeX RDF
63	Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou, Magdy S. Abadir	Delay Defect Diagnosis Based Upon Statistical Timing Models - The First Step.	DATE	2003	DBLP DOI BibTeX RDF
61	Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou, T. M. Mak	Enhancing diagnosis resolution for delay defects based upon statistical timing and statistical fault models.	DAC	2003	DBLP DOI BibTeX RDF	delay ATPG, delay fault diagnosis, statistical timing models
50	Wei Zou, Wu-Tung Cheng, Sudhakar M. Reddy	Bridge Defect Diagnosis with Physical Information.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF
45	Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou	Diagnosis of Delay Defects Using Statistical Timing Models.	VTS	2003	DBLP DOI BibTeX RDF
41	Shi-Yu Huang	Towards the logic defect diagnosis for partial-scan designs.	ASP-DAC	2001	DBLP DOI BibTeX RDF
34	Chih-Wea Wang, Kuo-Liang Cheng, Jih-Nung Lee, Yung-Fa Chou, Chih-Tsun Huang, Cheng-Wen Wu, Frank Huang, Hong-Tzer Yang	Fault Pattern Oriented Defect Diagnosis for Memories.	ITC	2003	DBLP DOI BibTeX RDF	failure analysis (FA), fault pattern, memory diagnostics, memory testing, bitmap, semiconductor memory
32	Manoj Sachdev	SeparateIDDQ testing of signal and bias paths in CMOS ICs for defect diagnosis.	J. Electron. Test.	1996	DBLP DOI BibTeX RDF	junction leakage current, diagnostics, deep sub-micron, I DDQ testing, subthreshold leakage current
31	Pilsung Choe, Chulwoo Kim, Mark R. Lehto, Jan P. Allebach	Experimental Comparison of Adaptive vs. Static Thumbnail Displays.	HCI (2)	2007	DBLP DOI BibTeX RDF	static display, thumbnail display, print defect diagnosis, information retrieval, search, diagnosis, keyword search, troubleshooting, Adaptive display
30	Wei Zou, Wu-Tung Cheng, Sudhakar M. Reddy, Huaxing Tang	Speeding Up Effect-Cause Defect Diagnosis Using a Small Dictionary.	VTS	2007	DBLP DOI BibTeX RDF
29	Yu Huang 0005	Dynamic learning based scan chain diagnosis.	DATE	2007	DBLP DOI BibTeX RDF
26	Jennifer Dworak	An Investigation of Excitation Balance and Additional Mandatory Conditions for the Diagnosis of Fortuitously Detected Defects.	MTV	2005	DBLP DOI BibTeX RDF
26	Jean-Michel Portal, L. Forli, Hassen Aziza, Didier Née	An Automated Methodology to Diagnose Geometric Defect in the EEPROM Cell.	ITC	2002	DBLP DOI BibTeX RDF
24	Shuo Wang, Jianwei Dai, Lei Wang 0003	Defect-tolerant digital filtering with unreliable molecular electronics.	SiPS	2008	DBLP DOI BibTeX RDF
24	Haihua Yan, Adit D. Singh	A Delay Test to Differentiate Resistive Interconnect Faults from Weak Transistor Defects.	VLSI Design	2005	DBLP DOI BibTeX RDF
24	Zoran Stanojevic, Hari Balachandran, D. M. H. Walker, Fred Lakbani, Jayashree Saxena, Kenneth M. Butler	Computer-aided fault to defect mapping (CAFDM) for defect diagnosis.	ITC	2000	DBLP DOI BibTeX RDF
20	Srikanth Venkataraman, Irith Pomeranz, Shraddha Bodhe, M. Enamul Amyeen	Test reordering for improved scan chain diagnosis using an enhanced defect diagnosis procedure.	ITC	2017	DBLP DOI BibTeX RDF
20	Vishal J. Mehta, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski	Timing-Aware Multiple-Delay-Fault Diagnosis.	ISQED	2008	DBLP DOI BibTeX RDF	defect-diagnosis, diagnosis, ATPG, DFT, delay-testing
20	Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi	Diagnosis of Full Open Defects in Interconnecting Lines.	VTS	2007	DBLP DOI BibTeX RDF	Defect Diagnosis, Full Open Defect, Interconnecting Line, CMOS
20	James F. Plusquellic, Donald M. Chiarulli, Steven P. Levitan	Characterization of CMOS Defects using Transient Signal Analysis.	DFT	1998	DBLP DOI BibTeX RDF	transient signal analysis, CMOS defect characterization, defect diagnosis, failure analysis
20	Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, T. M. Mak	Diagnosis-Based Post-Silicon Timing Validation Using Statistical Tools and Methodologies.	ITC	2003	DBLP DOI BibTeX RDF
17	Jerry M. Soden, Charles F. Hawkins, Ravi K. Gulati, Weiwei Mao	IDDQ testing: A review.	J. Electron. Test.	1992	DBLP DOI BibTeX RDF	IC quality, fault models, defects, Current testing, CMOS IC, I DDQ
15	Jean Michel Penalva, Laurent Coudouneau, Lydie Leyval, Jacky Montmain	A Supervision Support System for Industrial Processes.	IEEE Expert	1993	DBLP DOI BibTeX RDF
15	Yanxin Wang, Jing Yan 0003, Zhou Yang 0006, Zhenkang Qi, Jianhua Wang, Yingsan Geng	A novel hybrid meta-learning for few-shot gas-insulated switchgear insulation defect diagnosis.	Expert Syst. Appl.	2023	DBLP DOI BibTeX RDF
15	Yangze Liang, Guangyao Chen, Sihao Li, Zhao Xu	Intelligent Defect Diagnosis of Appearance Quality for Prefabricated Concrete Components Based on Target Detection and Multimodal Fusion Decision.	J. Comput. Civ. Eng.	2023	DBLP DOI BibTeX RDF
15	Ruoxin Wang, Chi Fai Cheung	Knowledge graph embedding learning system for defect diagnosis in additive manufacturing.	Comput. Ind.	2023	DBLP DOI BibTeX RDF
15	Mu Nie, Wen Jiang, Wankou Yang, Senling Wang, Xiaoqing Wen, Tianming Ni	Enhancing Defect Diagnosis and Localization in Wafer Map Testing Through Weakly Supervised Learning.	ATS	2023	DBLP DOI BibTeX RDF
15	Yi Zhang	GIS equipment defect diagnosis based on X-ray detection technology.	iSPEC	2023	DBLP DOI BibTeX RDF
15	Szczepan Urban, Piotr Zimnowlodzki, Manish Sharma, Shraddha Bodhe, John Schulze, Abdullah Yassine, Adam Styblinski	Global Control Signal Defect Diagnosis in Volume Production Environment.	ITC	2023	DBLP DOI BibTeX RDF
15	Weihong Zhai, Xiupeng Shi, Zeng Zeng	Adaptive Modelling for Anomaly Detection and Defect Diagnosis in Semiconductor Smart Manufacturing: A Domain-specific AutoML.	CIS-RAM	2023	DBLP DOI BibTeX RDF
15	Qing Han, Yu Xia, Xiupeng Shi, Zeng Zeng	AutoML with Focal Loss for Defect Diagnosis and Prognosis in Smart Manufacturing.	CIS-RAM	2023	DBLP DOI BibTeX RDF
15	Wuqin Tang, Qiang Yang, Xiaochen Hu, Wenjun Yan	Convolution neural network based polycrystalline silicon photovoltaic cell linear defect diagnosis using electroluminescence images.	Expert Syst. Appl.	2022	DBLP DOI BibTeX RDF
15	Yanxin Wang, Jing Yan 0003, Zhou Yang 0006, Zhenkang Qi, Jianhua Wang, Yingsan Geng	Gas-Insulated Switchgear Insulation Defect Diagnosis via a Novel Domain Adaptive Graph Convolutional Network.	IEEE Trans. Instrum. Meas.	2022	DBLP DOI BibTeX RDF
15	Sonal Gahlot, S. R. N. Reddy, Dinesh Kumar	Early congenital heart defect diagnosis in neonates using novel WBAN based three-tier network architecture.	J. King Saud Univ. Comput. Inf. Sci.	2022	DBLP DOI BibTeX RDF
15	Syed Muhammad Tayyab, Steven Chatterton, Paolo Pennacchi	Intelligent Defect Diagnosis of Rolling Element Bearings under Variable Operating Conditions Using Convolutional Neural Network and Order Maps.	Sensors	2022	DBLP DOI BibTeX RDF
15	Sheetal Barekar, Madan Mali	On-chip weak resistive defect diagnosis with performance enhancement in 45 nm technology static random access memory.	Microelectron. J.	2021	DBLP DOI BibTeX RDF
15	Xutong Tan, Chun Yin, Xuegang Huang, Sara Dadras	Design of Defect Diagnosis Algorithm with Multi-objective Feature Extraction Optimization to Assess the M/OD Impact Damages.	ACC	2021	DBLP DOI BibTeX RDF
15	Katherine Shu-Min Li, Leon Li-Yang Chen, Peter Yi-Yu Liao, Sying-Jyan Wang, Andrew Yi-Ann Huang, Ken Chau-Cheung Cheng	Integrated Scratch Marker for Wafer Defect Diagnosis.	ITC-Asia	2021	DBLP DOI BibTeX RDF
15	Taotao Zhou, Jiangjun Ruan, Yufei Liu, Shiyi Peng, Boyong Wang	Defect Diagnosis of Disconnector Based on Wireless Communication and Support Vector Machine.	IEEE Access	2020	DBLP DOI BibTeX RDF
15	Jihye Kim, Hayoung Lee, Seokjun Jang, Sungho Kang 0001	Fine-Grained Defect Diagnosis for CMOL FPGA Circuits.	IEEE Access	2020	DBLP DOI BibTeX RDF
15	Lei Bai 0007, Rengkui Liu, Qing Li	Data-Driven Bias Correction and Defect Diagnosis Model for In-Service Vehicle Acceleration Measurements.	Sensors	2020	DBLP DOI BibTeX RDF
15	Ken Chau-Cheung Cheng, Katherine Shu-Min Li, Andrew Yi-Ann Huang, Ji-Wei Li, Leon Li-Yang Chen, Nova Cheng-Yen Tsai, Sying-Jyan Wang, Chen-Shiun Lee, Leon Chou, Peter Yi-Yu Liao, Hsing-Chung Liang, Jwu E. Chen	Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis.	DATE	2020	DBLP DOI BibTeX RDF
15	Safa Mhamdi, Patrick Girard 0001, Arnaud Virazel, Alberto Bosio, Aymen Ladhar	Learning-Based Cell-Aware Defect Diagnosis of Customer Returns.	ETS	2020	DBLP DOI BibTeX RDF
15	Jihye Kim, Hayoung Lee, Seokjun Jang, Hogyeong Kim, Sungho Kang 0001	Memory-like Defect Diagnosis for CMOL FPGAs.	ISOCC	2020	DBLP DOI BibTeX RDF
15	Soumya Mittal, R. D. Shawn Blanton	A Deterministic-Statistical Multiple-Defect Diagnosis Methodology.	VTS	2020	DBLP DOI BibTeX RDF
15	Xia Fang, Wang Jie, Tao Feng	An Industrial Micro-Defect Diagnosis System via Intelligent Segmentation Region.	Sensors	2019	DBLP DOI BibTeX RDF
15	Soumya Mittal, R. D. Shawn Blanton	LearnX: A Hybrid Deterministic-Statistical Defect Diagnosis Methodology.	ETS	2019	DBLP DOI BibTeX RDF
15	Thomas Zehelein, Philip Werk, Markus Lienkamp	An Evaluation of Autoencoder and Sparse Filter as Automated Feature Extraction Process for Automotive Damper Defect Diagnosis.	EVER	2019	DBLP DOI BibTeX RDF
15	Irith Pomeranz	Selecting Functional Test Sequences for Defect Diagnosis.	IEEE Trans. Very Large Scale Integr. Syst.	2018	DBLP DOI BibTeX RDF
15	Ji-wang Zhang, Lai-bin Zhang, Li-xiang Duan	A Blade Defect Diagnosis Method by Fusing Blade Tip Timing and Tip Clearance Information.	Sensors	2018	DBLP DOI BibTeX RDF
15	Naixing Wang, Irith Pomeranz, Brady Benware, M. Enamul Amyeen, Srikanth Venkataraman	Improving the Resolution of Multiple Defect Diagnosis by Removing and Selecting Tests.	DFT	2018	DBLP DOI BibTeX RDF
15	Irith Pomeranz	Identifying Biases of a Defect Diagnosis Procedure.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2017	DBLP DOI BibTeX RDF
15	Ben Niewenhuis, Soumya Mittal, R. D. (Shawn) Blanton	Multiple-defect diagnosis for Logic Characterization Vehicles.	ETS	2017	DBLP DOI BibTeX RDF
15	Guanghui Li 0001, Xiang Weng, Xiaocheng Du, Xiping Wang, Hailin Feng	Stress wave velocity patterns in the longitudinal-radial plane of trees for defect diagnosis.	Comput. Electron. Agric.	2016	DBLP DOI BibTeX RDF
15	Irith Pomeranz	A Test Selection Procedure for Improving the Accuracy of Defect Diagnosis.	IEEE Trans. Very Large Scale Integr. Syst.	2016	DBLP DOI BibTeX RDF
15	Jaeyong Chung, Woochul Kang	Defect Diagnosis via Segment Delay Learning.	IEEE Trans. Very Large Scale Integr. Syst.	2016	DBLP DOI BibTeX RDF
15	Irith Pomeranz	Improving the accuracy of defect diagnosis by adding and removing tests.	IET Comput. Digit. Tech.	2016	DBLP DOI BibTeX RDF
15	Irith Pomeranz	Improving the Accuracy of Defect Diagnosis with Multiple Sets of Candidate Faults.	IEEE Trans. Computers	2016	DBLP DOI BibTeX RDF
15	Ning Yu, Xiaohui Shen, Zhe L. Lin, Radomír Mech, Connelly Barnes	Automatic Image Defect Diagnosis.	CoRR	2016	DBLP BibTeX RDF
15	Baris Arslan	Small delay defect diagnosis through failure observation ordering.	AQTR	2016	DBLP DOI BibTeX RDF
15	Eun Jung Jang, Jaeyong Chung, Jacob A. Abraham	Delay Defect Diagnosis Methodology Using Path Delay Measurements.	IEICE Trans. Electron.	2015	DBLP DOI BibTeX RDF
15	Michal Tadeusiewicz, Andrzej Kuczynski, Stanislaw Halgas	Spot Defect Diagnosis in Analog Nonlinear Circuits with Possible Multiple Operating Points.	J. Electron. Test.	2015	DBLP DOI BibTeX RDF
15	Gontran Sion, Yves Blaquière, Yvon Savaria	Defect diagnosis algorithms for a field programmable interconnect network embedded in a Very Large Area Integrated Circuit.	IOLTS	2015	DBLP DOI BibTeX RDF
15	Mohamad Chakaroun, Mohand Djeziri, Mustapha Ouladsine, Jacques Pinaton	Defect diagnosis using in line product control data in semiconductor industry.	ICSC	2015	DBLP DOI BibTeX RDF
15	Irith Pomeranz	Improving the accuracy of defect diagnosis by considering reduced diagnostic information.	VTS	2015	DBLP DOI BibTeX RDF
15	Po-Juei Chen, Chieh-Chih Che, J. C.-M. Li, Shuo-Fen Kuo, Pei-Ying Hsueh, Chun-Yi Kuo, Jih-Nung Lee	Physical-aware systematic multiple defect diagnosis.	IET Comput. Digit. Tech.	2014	DBLP DOI BibTeX RDF
15	Irith Pomeranz	Functional Broadside Tests for Multistep Defect Diagnosis.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2014	DBLP DOI BibTeX RDF
15	Irith Pomeranz	Improving the Accuracy of Defect Diagnosis by Considering Fewer Tests.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2014	DBLP DOI BibTeX RDF
15	Chun-Chuan Chi, Bing-Yang Lin, Cheng-Wen Wu, Min-Jer Wang, Hung-Chih Lin, Ching-Nen Peng	On Improving Interconnect Defect Diagnosis Resolution and Yield for Interposer-Based 3-D ICs.	IEEE Des. Test	2014	DBLP DOI BibTeX RDF
15	Faiza Iftikhar, Ayesha Shams, Arfa Dilawari	RCD: a toolkit for rheumatic valvular and congenital heart defect diagnosis.	Neural Comput. Appl.	2013	DBLP DOI BibTeX RDF
15	Chiao-Wen Liu, Chen-Fu Chien 0001	An intelligent system for wafer bin map defect diagnosis: An empirical study for semiconductor manufacturing.	Eng. Appl. Artif. Intell.	2013	DBLP DOI BibTeX RDF
15	Chidambaram Alagappan, Vishwani D. Agrawal	Defect Diagnosis of Digital Circuits Using Surrogate Faults.	VDAT	2013	DBLP DOI BibTeX RDF
15	Dimitris Liparas, Lefteris Angelis, Robert Feldt	Applying the Mahalanobis-Taguchi strategy for software defect diagnosis.	Autom. Softw. Eng.	2012	DBLP DOI BibTeX RDF
15	Hisham A. H. Al-Khazali, Mohamad R. Askari	Defect Diagnosis in Rotors Systems by Vibrations Data Collectors Using Trending Software	CoRR	2012	DBLP BibTeX RDF
15	Amirali Ghofrani, Ritesh Parikh, Saeed Shamshiri, Andrew DeOrio, Kwang-Ting Cheng, Valeria Bertacco	Comprehensive online defect diagnosis in on-chip networks.	VTS	2012	DBLP DOI BibTeX RDF
15	Pilsung Choe, Mark R. Lehto, Jan P. Allebach	Query translation-based cross-language print defect diagnosis based on the fuzzy Bayesian model.	J. Intell. Manuf.	2011	DBLP DOI BibTeX RDF
15	Chao-Wen Tzeng, Shi-Yu Huang	Split-Masking: An Output Masking Scheme for Effective Compound Defect Diagnosis in Scan Architecture With Test Compression.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2010	DBLP DOI BibTeX RDF
15	Aymen Ladhar, Mohamed Masmoudi	An Effective and Accurate Methodology for the Cell Internal Defect Diagnosis.	J. Electron. Test.	2010	DBLP DOI BibTeX RDF
15	Dongok Kim, Irith Pomeranz, M. Enamul Amyeen, Srikanth Venkataraman	Defect diagnosis based on DFM guidelines.	VTS	2010	DBLP DOI BibTeX RDF
15	Ruqiang Yan 0001, Robert X. Gao	Energy-Based Feature Extraction for Defect Diagnosis in Rotary Machines.	IEEE Trans. Instrum. Meas.	2009	DBLP DOI BibTeX RDF
15	Gang Chen 0011, Janusz Rajski, Sudhakar M. Reddy, Irith Pomeranz	N-distinguishing Tests for Enhanced Defect Diagnosis.	Asian Test Symposium	2009	DBLP DOI BibTeX RDF
15	Rama Gudavalli, W. Robert Daasch, Phil Nigh, Douglas Heaberlin	Application of non-parametric statistics of the parametric response for defect diagnosis.	ITC	2009	DBLP DOI BibTeX RDF
15	S. Saqib Khursheed, Paul M. Rosinger, Bashir M. Al-Hashimi, Sudhakar M. Reddy, Peter Harrod	Bridge Defect Diagnosis for Multiple-Voltage Design.	ETS	2008	DBLP DOI BibTeX RDF	Logic based Diagnosis, Multiple-Vdd designs, Resistive Bridging Faults
15	Wu-Tung Cheng, Brady Benware, Ruifeng Guo, Kun-Han Tsai, Takeo Kobayashi, Kazuyuki Maruo, Michinobu Nakao, Yoshiaki Fukui, Hideyuki Otake	Enhancing Transition Fault Model for Delay Defect Diagnosis.	ATS	2008	DBLP DOI BibTeX RDF
15	Xiaochun Yu, Ronald D. Blanton	An Effective and Flexible Multiple Defect Diagnosis Methodology Using Error Propagation Analysis.	ITC	2008	DBLP DOI BibTeX RDF
15	Tao Xu 0002, Krishnendu Chakrabarty	Parallel Scan-Like Test and Multiple-Defect Diagnosis for Digital Microfluidic Biochips.	IEEE Trans. Biomed. Circuits Syst.	2007	DBLP DOI BibTeX RDF
15	Shuo Li 0001, Ian G. Ross, Sukhdeep Gill, Terry M. Peters, Prakash Mahesh, Richard Rankin	Computer-aided septal defect diagnosis and detection.	Medical Imaging: Computer-Aided Diagnosis	2007	DBLP DOI BibTeX RDF
15	Chen Liu, Wei Zou, Sudhakar M. Reddy, Wu-Tung Cheng, Manish Sharma, Huaxing Tang	Interconnect open defect diagnosis with minimal physical information.	ITC	2007	DBLP DOI BibTeX RDF
15	Osei Poku, Ronald D. Blanton	Delay defect diagnosis using segment network faults.	ITC	2007	DBLP DOI BibTeX RDF
15	Yasuo Sato, Kazushi Sugiura, Reisuke Shimoda, Yutaka Yoshizawa, Kenji Norimatsu, Masaru Sanada	Defect Diagnosis - Reasoning Methodology.	ATS	2006	DBLP DOI BibTeX RDF
15	Wei Zou, Wu-Tung Cheng, Sudhakar M. Reddy	Interconnect Open Defect Diagnosis with Physical Information.	ATS	2006	DBLP DOI BibTeX RDF
15	Mu-Hsien Hsu, Yu-Tsao Hsing, Jen-Chieh Yeh, Cheng-Wen Wu	Fault-Pattern Oriented Defect Diagnosis for Flash Memory.	MTDT	2006	DBLP DOI BibTeX RDF
15	Vishal J. Mehta, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski	Timing Defect Diagnosis in Presence of Crosstalk for Nanometer Technology.	ITC	2006	DBLP DOI BibTeX RDF
15	Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy, M. Enamul Amyeen	Defect Diagnosis Based on Pattern-Dependent Stuck-At Faults.	VLSI Design	2004	DBLP DOI BibTeX RDF
15	Chintan Patel, Ernesto Staroswiecki, Smita Pawar, Dhruva Acharyya, Jim Plusquellic	Defect Diagnosis Using a Current Ratio Based Quiescent Signal Analysis Model for Commercial Power Grids.	J. Electron. Test.	2003	DBLP DOI BibTeX RDF	I DDT, quiescent signal analysis, test, power grids, I DDQ
15	Sheng-Jen Hsieh	Knowledge integration strategies in defect diagnosis.		1995	RDF
11	Abdelkader Adla	Agent-Based Group Decision Making.	ICSEA	2008	DBLP DOI BibTeX RDF
11	Giuseppe Acciani, A. Camposarcone, Silvano Vergura	Innovative Methodology for IR Acquisition.	ICCSA (2)	2008	DBLP DOI BibTeX RDF
11	V. M. D. Jagannath, Bhaskaran Raman	WiBeaM: Wireless Bearing Monitoring System.	COMSWARE	2007	DBLP DOI BibTeX RDF