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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 30 occurrences of 28 keywords
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Results
Found 104 publication records. Showing 104 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
67 | Xiaochun Yu, R. D. (Shawn) Blanton |
Multiple defect diagnosis using no assumptions on failing pattern characteristics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 45th Design Automation Conference, DAC 2008, Anaheim, CA, USA, June 8-13, 2008, pp. 361-366, 2008, ACM, 978-1-60558-115-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
defect diagnosis, fault isolation, IC testing |
66 | Shi-Yu Huang |
On Improving the Accuracy Of Multiple Defect Diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA, pp. 34-41, 2001, IEEE Computer Society, 0-7695-1122-8. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
63 | Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou, Magdy S. Abadir |
Delay Defect Diagnosis Based Upon Statistical Timing Models - The First Step. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 2003 Design, Automation and Test in Europe Conference and Exposition (DATE 2003), 3-7 March 2003, Munich, Germany, pp. 10328-10335, 2003, IEEE Computer Society, 0-7695-1870-2. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
61 | Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou, T. M. Mak |
Enhancing diagnosis resolution for delay defects based upon statistical timing and statistical fault models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 40th Design Automation Conference, DAC 2003, Anaheim, CA, USA, June 2-6, 2003, pp. 668-673, 2003, ACM, 1-58113-688-9. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
delay ATPG, delay fault diagnosis, statistical timing models |
50 | Wei Zou, Wu-Tung Cheng, Sudhakar M. Reddy |
Bridge Defect Diagnosis with Physical Information. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India, pp. 248-253, 2005, IEEE Computer Society, 0-7695-2481-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
45 | Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou |
Diagnosis of Delay Defects Using Statistical Timing Models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA, pp. 339-344, 2003, IEEE Computer Society, 0-7695-1924-5. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
41 | Shi-Yu Huang |
Towards the logic defect diagnosis for partial-scan designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASP-DAC ![In: Proceedings of ASP-DAC 2001, Asia and South Pacific Design Automation Conference 2001, January 30-February 2, 2001, Yokohama, Japan, pp. 313-318, 2001, ACM, 0-7803-6634-4. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
34 | Chih-Wea Wang, Kuo-Liang Cheng, Jih-Nung Lee, Yung-Fa Chou, Chih-Tsun Huang, Cheng-Wen Wu, Frank Huang, Hong-Tzer Yang |
Fault Pattern Oriented Defect Diagnosis for Memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, pp. 29-38, 2003, IEEE Computer Society, 0-7803-8106-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
failure analysis (FA), fault pattern, memory diagnostics, memory testing, bitmap, semiconductor memory |
32 | Manoj Sachdev |
SeparateIDDQ testing of signal and bias paths in CMOS ICs for defect diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 8(2), pp. 203-214, 1996. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
junction leakage current, diagnostics, deep sub-micron, I DDQ testing, subthreshold leakage current |
31 | Pilsung Choe, Chulwoo Kim, Mark R. Lehto, Jan P. Allebach |
Experimental Comparison of Adaptive vs. Static Thumbnail Displays. ![Search on Bibsonomy](Pics/bibsonomy.png) |
HCI (2) ![In: Human-Computer Interaction. Interaction Platforms and Techniques, 12th International Conference, HCI International 2007, Beijing, China, July 22-27, 2007, Proceedings, Part II, pp. 41-48, 2007, Springer, 978-3-540-73106-1. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
static display, thumbnail display, print defect diagnosis, information retrieval, search, diagnosis, keyword search, troubleshooting, Adaptive display |
30 | Wei Zou, Wu-Tung Cheng, Sudhakar M. Reddy, Huaxing Tang |
Speeding Up Effect-Cause Defect Diagnosis Using a Small Dictionary. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA, pp. 225-230, 2007, IEEE Computer Society, 0-7695-2812-0. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
29 | Yu Huang 0005 |
Dynamic learning based scan chain diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 2007 Design, Automation and Test in Europe Conference and Exposition, DATE 2007, Nice, France, April 16-20, 2007, pp. 510-515, 2007, EDA Consortium, San Jose, CA, USA, 978-3-9810801-2-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
26 | Jennifer Dworak |
An Investigation of Excitation Balance and Additional Mandatory Conditions for the Diagnosis of Fortuitously Detected Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MTV ![In: Sixth International Workshop on Microprocessor Test and Verification (MTV 2005), Common Challenges and Solutions, 3-4 November 2005, Austin, Texas, USA, pp. 48-54, 2005, IEEE Computer Society, 0-7695-2627-6. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
26 | Jean-Michel Portal, L. Forli, Hassen Aziza, Didier Née |
An Automated Methodology to Diagnose Geometric Defect in the EEPROM Cell. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002, pp. 31-36, 2002, IEEE Computer Society, 0-7803-7543-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
24 | Shuo Wang, Jianwei Dai, Lei Wang 0003 |
Defect-tolerant digital filtering with unreliable molecular electronics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SiPS ![In: Proceedings of the IEEE Workshop on Signal Processing Systems, SiPS 2008, October 8-10, 2008, Washington, D.C. Metro Area, USA, pp. 194-199, 2008, IEEE, 978-1-4244-2924-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
24 | Haihua Yan, Adit D. Singh |
A Delay Test to Differentiate Resistive Interconnect Faults from Weak Transistor Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 18th International Conference on VLSI Design (VLSI Design 2005), with the 4th International Conference on Embedded Systems Design, 3-7 January 2005, Kolkata, India, pp. 47-52, 2005, IEEE Computer Society, 0-7695-2264-5. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
24 | Zoran Stanojevic, Hari Balachandran, D. M. H. Walker, Fred Lakbani, Jayashree Saxena, Kenneth M. Butler |
Computer-aided fault to defect mapping (CAFDM) for defect diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000, pp. 729-738, 2000, IEEE Computer Society, 0-7803-6546-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
20 | Srikanth Venkataraman, Irith Pomeranz, Shraddha Bodhe, M. Enamul Amyeen |
Test reordering for improved scan chain diagnosis using an enhanced defect diagnosis procedure. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017, pp. 1-9, 2017, IEEE, 978-1-5386-3413-4. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
20 | Vishal J. Mehta, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski |
Timing-Aware Multiple-Delay-Fault Diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 9th International Symposium on Quality of Electronic Design (ISQED 2008), 17-19 March 2008, San Jose, CA, USA, pp. 246-253, 2008, IEEE Computer Society, 978-0-7695-3117-5. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
defect-diagnosis, diagnosis, ATPG, DFT, delay-testing |
20 | Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi |
Diagnosis of Full Open Defects in Interconnecting Lines. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA, pp. 158-166, 2007, IEEE Computer Society, 0-7695-2812-0. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Defect Diagnosis, Full Open Defect, Interconnecting Line, CMOS |
20 | James F. Plusquellic, Donald M. Chiarulli, Steven P. Levitan |
Characterization of CMOS Defects using Transient Signal Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '98), 2-4 November 1998, Austin, TX, USA, Proceedings, pp. 93-101, 1998, IEEE Computer Society, 0-8186-8832-7. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
transient signal analysis, CMOS defect characterization, defect diagnosis, failure analysis |
20 | Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, T. M. Mak |
Diagnosis-Based Post-Silicon Timing Validation Using Statistical Tools and Methodologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, pp. 339-348, 2003, IEEE Computer Society, 0-7803-8106-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
17 | Jerry M. Soden, Charles F. Hawkins, Ravi K. Gulati, Weiwei Mao |
IDDQ testing: A review. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 3(4), pp. 291-303, 1992. The full citation details ...](Pics/full.jpeg) |
1992 |
DBLP DOI BibTeX RDF |
IC quality, fault models, defects, Current testing, CMOS IC, I DDQ |
15 | Jean Michel Penalva, Laurent Coudouneau, Lydie Leyval, Jacky Montmain |
A Supervision Support System for Industrial Processes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Expert ![In: IEEE Expert 8(5), pp. 57-65, 1993. The full citation details ...](Pics/full.jpeg) |
1993 |
DBLP DOI BibTeX RDF |
|
15 | Yanxin Wang, Jing Yan 0003, Zhou Yang 0006, Zhenkang Qi, Jianhua Wang, Yingsan Geng |
A novel hybrid meta-learning for few-shot gas-insulated switchgear insulation defect diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Expert Syst. Appl. ![In: Expert Syst. Appl. 233, pp. 120956, December 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
15 | Yangze Liang, Guangyao Chen, Sihao Li, Zhao Xu |
Intelligent Defect Diagnosis of Appearance Quality for Prefabricated Concrete Components Based on Target Detection and Multimodal Fusion Decision. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Comput. Civ. Eng. ![In: J. Comput. Civ. Eng. 37(6), November 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
15 | Ruoxin Wang, Chi Fai Cheung |
Knowledge graph embedding learning system for defect diagnosis in additive manufacturing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Comput. Ind. ![In: Comput. Ind. 149, pp. 103912, August 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
15 | Mu Nie, Wen Jiang, Wankou Yang, Senling Wang, Xiaoqing Wen, Tianming Ni |
Enhancing Defect Diagnosis and Localization in Wafer Map Testing Through Weakly Supervised Learning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ATS ![In: 32nd IEEE Asian Test Symposium, ATS 2023, Beijing, China, October 14-17, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-0310-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
15 | Yi Zhang |
GIS equipment defect diagnosis based on X-ray detection technology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
iSPEC ![In: IEEE Sustainable Power and Energy Conference, iSPEC 2023, Chongqing, China, November 28-30, 2023, pp. 1-7, 2023, IEEE, 979-8-3503-2269-9. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
15 | Szczepan Urban, Piotr Zimnowlodzki, Manish Sharma, Shraddha Bodhe, John Schulze, Abdullah Yassine, Adam Styblinski |
Global Control Signal Defect Diagnosis in Volume Production Environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 65-70, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
15 | Weihong Zhai, Xiupeng Shi, Zeng Zeng |
Adaptive Modelling for Anomaly Detection and Defect Diagnosis in Semiconductor Smart Manufacturing: A Domain-specific AutoML. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CIS-RAM ![In: IEEE International Conference on Cybernetics and Intelligent Systems, CIS 2023 and IEEE Conference on Robotics, Automation and Mechatronics, RAM 2023, Penang, Malaysia, June 9-12, 2023, pp. 198-203, 2023, IEEE, 979-8-3503-0308-7. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
15 | Qing Han, Yu Xia, Xiupeng Shi, Zeng Zeng |
AutoML with Focal Loss for Defect Diagnosis and Prognosis in Smart Manufacturing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CIS-RAM ![In: IEEE International Conference on Cybernetics and Intelligent Systems, CIS 2023 and IEEE Conference on Robotics, Automation and Mechatronics, RAM 2023, Penang, Malaysia, June 9-12, 2023, pp. 180-185, 2023, IEEE, 979-8-3503-0308-7. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
15 | Wuqin Tang, Qiang Yang, Xiaochen Hu, Wenjun Yan |
Convolution neural network based polycrystalline silicon photovoltaic cell linear defect diagnosis using electroluminescence images. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Expert Syst. Appl. ![In: Expert Syst. Appl. 202, pp. 117087, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
15 | Yanxin Wang, Jing Yan 0003, Zhou Yang 0006, Zhenkang Qi, Jianhua Wang, Yingsan Geng |
Gas-Insulated Switchgear Insulation Defect Diagnosis via a Novel Domain Adaptive Graph Convolutional Network. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Instrum. Meas. ![In: IEEE Trans. Instrum. Meas. 71, pp. 1-10, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
15 | Sonal Gahlot, S. R. N. Reddy, Dinesh Kumar |
Early congenital heart defect diagnosis in neonates using novel WBAN based three-tier network architecture. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. King Saud Univ. Comput. Inf. Sci. ![In: J. King Saud Univ. Comput. Inf. Sci. 34(6 Part B), pp. 3661-3672, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
15 | Syed Muhammad Tayyab, Steven Chatterton, Paolo Pennacchi |
Intelligent Defect Diagnosis of Rolling Element Bearings under Variable Operating Conditions Using Convolutional Neural Network and Order Maps. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sensors ![In: Sensors 22(5), pp. 2026, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
15 | Sheetal Barekar, Madan Mali |
On-chip weak resistive defect diagnosis with performance enhancement in 45 nm technology static random access memory. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. J. ![In: Microelectron. J. 115, pp. 105178, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
15 | Xutong Tan, Chun Yin, Xuegang Huang, Sara Dadras |
Design of Defect Diagnosis Algorithm with Multi-objective Feature Extraction Optimization to Assess the M/OD Impact Damages. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACC ![In: 2021 American Control Conference, ACC 2021, New Orleans, LA, USA, May 25-28, 2021, pp. 1712-1717, 2021, IEEE, 978-1-6654-4197-1. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
15 | Katherine Shu-Min Li, Leon Li-Yang Chen, Peter Yi-Yu Liao, Sying-Jyan Wang, Andrew Yi-Ann Huang, Ken Chau-Cheung Cheng |
Integrated Scratch Marker for Wafer Defect Diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2021, Shanghai, China, August 18-20, 2021, pp. 1-4, 2021, IEEE, 978-1-6654-1334-3. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
15 | Taotao Zhou, Jiangjun Ruan, Yufei Liu, Shiyi Peng, Boyong Wang |
Defect Diagnosis of Disconnector Based on Wireless Communication and Support Vector Machine. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 8, pp. 30198-30209, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
15 | Jihye Kim, Hayoung Lee, Seokjun Jang, Sungho Kang 0001 |
Fine-Grained Defect Diagnosis for CMOL FPGA Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 8, pp. 163140-163151, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
15 | Lei Bai 0007, Rengkui Liu, Qing Li |
Data-Driven Bias Correction and Defect Diagnosis Model for In-Service Vehicle Acceleration Measurements. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sensors ![In: Sensors 20(3), pp. 872, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
15 | Ken Chau-Cheung Cheng, Katherine Shu-Min Li, Andrew Yi-Ann Huang, Ji-Wei Li, Leon Li-Yang Chen, Nova Cheng-Yen Tsai, Sying-Jyan Wang, Chen-Shiun Lee, Leon Chou, Peter Yi-Yu Liao, Hsing-Chung Liang, Jwu E. Chen |
Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 2020 Design, Automation & Test in Europe Conference & Exhibition, DATE 2020, Grenoble, France, March 9-13, 2020, pp. 1710-1711, 2020, IEEE, 978-3-9819263-4-7. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
15 | Safa Mhamdi, Patrick Girard 0001, Arnaud Virazel, Alberto Bosio, Aymen Ladhar |
Learning-Based Cell-Aware Defect Diagnosis of Customer Returns. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: IEEE European Test Symposium, ETS 2020, Tallinn, Estonia, May 25-29, 2020, pp. 1-2, 2020, IEEE, 978-1-7281-4312-5. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
15 | Jihye Kim, Hayoung Lee, Seokjun Jang, Hogyeong Kim, Sungho Kang 0001 |
Memory-like Defect Diagnosis for CMOL FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISOCC ![In: International SoC Design Conference, ISOCC 2020, Yeosu, South Korea, October 21-24, 2020, pp. 139-140, 2020, IEEE, 978-1-7281-8331-2. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
15 | Soumya Mittal, R. D. Shawn Blanton |
A Deterministic-Statistical Multiple-Defect Diagnosis Methodology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 38th IEEE VLSI Test Symposium, VTS 2020, San Diego, CA, USA, April 5-8, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-5359-9. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
15 | Xia Fang, Wang Jie, Tao Feng |
An Industrial Micro-Defect Diagnosis System via Intelligent Segmentation Region. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sensors ![In: Sensors 19(11), pp. 2636, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
15 | Soumya Mittal, R. D. Shawn Blanton |
LearnX: A Hybrid Deterministic-Statistical Defect Diagnosis Methodology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 24th IEEE European Test Symposium, ETS 2019, Baden-Baden, Germany, May 27-31, 2019, pp. 1-6, 2019, IEEE, 978-1-7281-1173-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
15 | Thomas Zehelein, Philip Werk, Markus Lienkamp |
An Evaluation of Autoencoder and Sparse Filter as Automated Feature Extraction Process for Automotive Damper Defect Diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EVER ![In: Fourteenth International Conference on Ecological Vehicles and Renewable Energies, EVER 2019, Monte-Carlo, Monaco, May 8-10, 2019, pp. 1-8, 2019, IEEE, 978-1-7281-3703-2. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
15 | Irith Pomeranz |
Selecting Functional Test Sequences for Defect Diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 26(10), pp. 2160-2164, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
15 | Ji-wang Zhang, Lai-bin Zhang, Li-xiang Duan |
A Blade Defect Diagnosis Method by Fusing Blade Tip Timing and Tip Clearance Information. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sensors ![In: Sensors 18(7), pp. 2166, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
15 | Naixing Wang, Irith Pomeranz, Brady Benware, M. Enamul Amyeen, Srikanth Venkataraman |
Improving the Resolution of Multiple Defect Diagnosis by Removing and Selecting Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018, pp. 1-6, 2018, IEEE Computer Society, 978-1-5386-8398-9. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
15 | Irith Pomeranz |
Identifying Biases of a Defect Diagnosis Procedure. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(7), pp. 1215-1225, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
15 | Ben Niewenhuis, Soumya Mittal, R. D. (Shawn) Blanton |
Multiple-defect diagnosis for Logic Characterization Vehicles. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 22nd IEEE European Test Symposium, ETS 2017, Limassol, Cyprus, May 22-26, 2017, pp. 1-6, 2017, IEEE, 978-1-5090-5457-2. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
15 | Guanghui Li 0001, Xiang Weng, Xiaocheng Du, Xiping Wang, Hailin Feng |
Stress wave velocity patterns in the longitudinal-radial plane of trees for defect diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Comput. Electron. Agric. ![In: Comput. Electron. Agric. 124, pp. 23-28, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
15 | Irith Pomeranz |
A Test Selection Procedure for Improving the Accuracy of Defect Diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 24(8), pp. 2759-2767, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
15 | Jaeyong Chung, Woochul Kang |
Defect Diagnosis via Segment Delay Learning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 24(1), pp. 388-392, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
15 | Irith Pomeranz |
Improving the accuracy of defect diagnosis by adding and removing tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IET Comput. Digit. Tech. ![In: IET Comput. Digit. Tech. 10(2), pp. 47-53, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
15 | Irith Pomeranz |
Improving the Accuracy of Defect Diagnosis with Multiple Sets of Candidate Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 65(7), pp. 2332-2338, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
15 | Ning Yu, Xiaohui Shen, Zhe L. Lin, Radomír Mech, Connelly Barnes |
Automatic Image Defect Diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1612.01635, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP BibTeX RDF |
|
15 | Baris Arslan |
Small delay defect diagnosis through failure observation ordering. ![Search on Bibsonomy](Pics/bibsonomy.png) |
AQTR ![In: IEEE International Conference on Automation, Quality and Testing, Robotics, AQTR 2016, Cluj-Napoca, Romania, May 19-21, 2016, pp. 1-6, 2016, IEEE, 978-1-4673-8692-0. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
15 | Eun Jung Jang, Jaeyong Chung, Jacob A. Abraham |
Delay Defect Diagnosis Methodology Using Path Delay Measurements. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEICE Trans. Electron. ![In: IEICE Trans. Electron. 98-C(10), pp. 991-994, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
15 | Michal Tadeusiewicz, Andrzej Kuczynski, Stanislaw Halgas |
Spot Defect Diagnosis in Analog Nonlinear Circuits with Possible Multiple Operating Points. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 31(5-6), pp. 491-502, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
15 | Gontran Sion, Yves Blaquière, Yvon Savaria |
Defect diagnosis algorithms for a field programmable interconnect network embedded in a Very Large Area Integrated Circuit. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015, pp. 83-88, 2015, IEEE, 978-1-4673-7905-2. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
15 | Mohamad Chakaroun, Mohand Djeziri, Mustapha Ouladsine, Jacques Pinaton |
Defect diagnosis using in line product control data in semiconductor industry. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSC ![In: 4th International Conference on Systems and Control, ICSC 2015, Sousse, Tunisia, April 28-30, 2015, pp. 212-217, 2015, IEEE, 978-1-4799-8318-6. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
15 | Irith Pomeranz |
Improving the accuracy of defect diagnosis by considering reduced diagnostic information. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015, pp. 1-6, 2015, IEEE Computer Society, 978-1-4799-7597-6. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
15 | Po-Juei Chen, Chieh-Chih Che, J. C.-M. Li, Shuo-Fen Kuo, Pei-Ying Hsueh, Chun-Yi Kuo, Jih-Nung Lee |
Physical-aware systematic multiple defect diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IET Comput. Digit. Tech. ![In: IET Comput. Digit. Tech. 8(5), pp. 199-209, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
15 | Irith Pomeranz |
Functional Broadside Tests for Multistep Defect Diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(9), pp. 1429-1433, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
15 | Irith Pomeranz |
Improving the Accuracy of Defect Diagnosis by Considering Fewer Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(12), pp. 2010-2014, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
15 | Chun-Chuan Chi, Bing-Yang Lin, Cheng-Wen Wu, Min-Jer Wang, Hung-Chih Lin, Ching-Nen Peng |
On Improving Interconnect Defect Diagnosis Resolution and Yield for Interposer-Based 3-D ICs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test ![In: IEEE Des. Test 31(4), pp. 16-26, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
15 | Faiza Iftikhar, Ayesha Shams, Arfa Dilawari |
RCD: a toolkit for rheumatic valvular and congenital heart defect diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Neural Comput. Appl. ![In: Neural Comput. Appl. 23(6), pp. 1729-1735, 2013. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
15 | Chiao-Wen Liu, Chen-Fu Chien 0001 |
An intelligent system for wafer bin map defect diagnosis: An empirical study for semiconductor manufacturing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Eng. Appl. Artif. Intell. ![In: Eng. Appl. Artif. Intell. 26(5-6), pp. 1479-1486, 2013. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
15 | Chidambaram Alagappan, Vishwani D. Agrawal |
Defect Diagnosis of Digital Circuits Using Surrogate Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VDAT ![In: VLSI Design and Test, 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers, pp. 376-386, 2013, Springer, 978-3-642-42023-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
15 | Dimitris Liparas, Lefteris Angelis, Robert Feldt |
Applying the Mahalanobis-Taguchi strategy for software defect diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Autom. Softw. Eng. ![In: Autom. Softw. Eng. 19(2), pp. 141-165, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
15 | Hisham A. H. Al-Khazali, Mohamad R. Askari |
Defect Diagnosis in Rotors Systems by Vibrations Data Collectors Using Trending Software ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1208.3122, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP BibTeX RDF |
|
15 | Amirali Ghofrani, Ritesh Parikh, Saeed Shamshiri, Andrew DeOrio, Kwang-Ting Cheng, Valeria Bertacco |
Comprehensive online defect diagnosis in on-chip networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 30th IEEE VLSI Test Symposium, VTS 2012, Maui, Hawaii, USA, 23-26 April 2012, pp. 44-49, 2012, IEEE Computer Society, 978-1-4673-1074-1. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
15 | Pilsung Choe, Mark R. Lehto, Jan P. Allebach |
Query translation-based cross-language print defect diagnosis based on the fuzzy Bayesian model. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Intell. Manuf. ![In: J. Intell. Manuf. 22(1), pp. 43-55, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
15 | Chao-Wen Tzeng, Shi-Yu Huang |
Split-Masking: An Output Masking Scheme for Effective Compound Defect Diagnosis in Scan Architecture With Test Compression. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(5), pp. 834-839, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
15 | Aymen Ladhar, Mohamed Masmoudi |
An Effective and Accurate Methodology for the Cell Internal Defect Diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 26(6), pp. 621-639, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
15 | Dongok Kim, Irith Pomeranz, M. Enamul Amyeen, Srikanth Venkataraman |
Defect diagnosis based on DFM guidelines. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA, pp. 206-211, 2010, IEEE Computer Society, 978-1-4244-6648-1. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
15 | Ruqiang Yan 0001, Robert X. Gao |
Energy-Based Feature Extraction for Defect Diagnosis in Rotary Machines. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Instrum. Meas. ![In: IEEE Trans. Instrum. Meas. 58(9), pp. 3130-3139, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
15 | Gang Chen 0011, Janusz Rajski, Sudhakar M. Reddy, Irith Pomeranz |
N-distinguishing Tests for Enhanced Defect Diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan, pp. 183-186, 2009, IEEE Computer Society, 978-0-7695-3864-8. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
15 | Rama Gudavalli, W. Robert Daasch, Phil Nigh, Douglas Heaberlin |
Application of non-parametric statistics of the parametric response for defect diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009, pp. 1-10, 2009, IEEE Computer Society, 978-1-4244-4868-5. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
15 | S. Saqib Khursheed, Paul M. Rosinger, Bashir M. Al-Hashimi, Sudhakar M. Reddy, Peter Harrod |
Bridge Defect Diagnosis for Multiple-Voltage Design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 13th European Test Symposium, ETS 2008, Verbania, Italy, May 25-29, 2008, pp. 99-104, 2008, IEEE Computer Society, 978-0-7695-3150-2. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Logic based Diagnosis, Multiple-Vdd designs, Resistive Bridging Faults |
15 | Wu-Tung Cheng, Brady Benware, Ruifeng Guo, Kun-Han Tsai, Takeo Kobayashi, Kazuyuki Maruo, Michinobu Nakao, Yoshiaki Fukui, Hideyuki Otake |
Enhancing Transition Fault Model for Delay Defect Diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ATS ![In: 17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008, pp. 179-184, 2008, IEEE Computer Society, 978-0-7695-3396-4. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
15 | Xiaochun Yu, Ronald D. Blanton |
An Effective and Flexible Multiple Defect Diagnosis Methodology Using Error Propagation Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008, pp. 1-9, 2008, IEEE Computer Society, 978-1-4244-2403-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
15 | Tao Xu 0002, Krishnendu Chakrabarty |
Parallel Scan-Like Test and Multiple-Defect Diagnosis for Digital Microfluidic Biochips. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Biomed. Circuits Syst. ![In: IEEE Trans. Biomed. Circuits Syst. 1(2), pp. 148-158, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
15 | Shuo Li 0001, Ian G. Ross, Sukhdeep Gill, Terry M. Peters, Prakash Mahesh, Richard Rankin |
Computer-aided septal defect diagnosis and detection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Medical Imaging: Computer-Aided Diagnosis ![In: Medical Imaging 2007: Computer-Aided Diagnosis, San Diego, CA, United States, 17-22 February 2007, pp. 65141A, 2007, SPIE, 9780819466327. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
15 | Chen Liu, Wei Zou, Sudhakar M. Reddy, Wu-Tung Cheng, Manish Sharma, Huaxing Tang |
Interconnect open defect diagnosis with minimal physical information. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007, pp. 1-10, 2007, IEEE Computer Society, 1-4244-1128-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
15 | Osei Poku, Ronald D. Blanton |
Delay defect diagnosis using segment network faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007, pp. 1-10, 2007, IEEE Computer Society, 1-4244-1128-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
15 | Yasuo Sato, Kazushi Sugiura, Reisuke Shimoda, Yutaka Yoshizawa, Kenji Norimatsu, Masaru Sanada |
Defect Diagnosis - Reasoning Methodology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ATS ![In: 15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006, pp. 209-214, 2006, IEEE, 0-7695-2628-4. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
15 | Wei Zou, Wu-Tung Cheng, Sudhakar M. Reddy |
Interconnect Open Defect Diagnosis with Physical Information. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ATS ![In: 15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006, pp. 203-209, 2006, IEEE, 0-7695-2628-4. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
15 | Mu-Hsien Hsu, Yu-Tsao Hsing, Jen-Chieh Yeh, Cheng-Wen Wu |
Fault-Pattern Oriented Defect Diagnosis for Flash Memory. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MTDT ![In: 14th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2006), 2-4 August 2006, Taipei, Taiwan, pp. 3-8, 2006, IEEE Computer Society, 0-7695-2572-5. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
15 | Vishal J. Mehta, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski |
Timing Defect Diagnosis in Presence of Crosstalk for Nanometer Technology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006, pp. 1-10, 2006, IEEE Computer Society, 1-4244-0292-1. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
15 | Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy, M. Enamul Amyeen |
Defect Diagnosis Based on Pattern-Dependent Stuck-At Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 17th International Conference on VLSI Design (VLSI Design 2004), with the 3rd International Conference on Embedded Systems Design, 5-9 January 2004, Mumbai, India, pp. 475-480, 2004, IEEE Computer Society, 0-7695-2072-3. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
15 | Chintan Patel, Ernesto Staroswiecki, Smita Pawar, Dhruva Acharyya, Jim Plusquellic |
Defect Diagnosis Using a Current Ratio Based Quiescent Signal Analysis Model for Commercial Power Grids. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 19(6), pp. 611-623, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
I DDT, quiescent signal analysis, test, power grids, I DDQ |
15 | Sheng-Jen Hsieh |
Knowledge integration strategies in defect diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
|
1995 |
RDF |
|
11 | Abdelkader Adla |
Agent-Based Group Decision Making. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSEA ![In: Proceedings of the Third International Conference on Software Engineering Advances, ICSEA 2008, October 26-31, 2008, Sliema, Malta, pp. 146-151, 2008, IEEE Computer Society, 978-0-7695-3372-8. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
11 | Giuseppe Acciani, A. Camposarcone, Silvano Vergura |
Innovative Methodology for IR Acquisition. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCSA (2) ![In: Computational Science and Its Applications - ICCSA 2008, International Conference, Perugia, Italy, June 30 - July 3, 2008, Proceedings, Part II, pp. 617-626, 2008, Springer, 978-3-540-69840-1. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
11 | V. M. D. Jagannath, Bhaskaran Raman |
WiBeaM: Wireless Bearing Monitoring System. ![Search on Bibsonomy](Pics/bibsonomy.png) |
COMSWARE ![In: Proceedings of the Second International Conference on COMmunication System softWAre and MiddlewaRE (COMSWARE 2007), January 7-12, 2007, Bangalore, India, 2007, IEEE, 1-4244-0614-5. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
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