Search results for "defectivity"

Found 12 publication records. Showing 12 according to the selection in the facets

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
120	Sandra Levasseur, Frederic Duvivier	Application of a yield model merging critical areas and defectivity to industrial products.	DFT	1997	DBLP DOI BibTeX RDF	industrial products, survey sampling based estimation tool, fabrication process, SGS-Thomson Crolles plant, multiple products, process versions, 0.5 micron, robustness, defectivity, EYES, critical areas, yield model, integrated circuit yield
84	Kamal Rajkanan	Yield Analysis Methodology for Low Defectivity Wafer Fabs.	MTDT	2000	DBLP DOI BibTeX RDF
59	Sandrine Barberan, Frederic Duvivier	Management of Critical Areas and Defectivity Data for Yield Trend Modeling.	DFT	1998	DBLP DOI BibTeX RDF	critical areas, defect analysis, yield modeling
34	Mario Santo Alessandrino, Beatrice Carbone, Francesco Cordiano, Bruna Mazza, Alfio Russo, W. Coco, Massimo Boscaglia, A. Di Salvo, A. Lombardo, D. Scarcella, Elisa Vitanza, Patrick Fiorenza	Failure analysis addressing method of optically undetected defectivity on 4H-SiC PowerMOSFET epitaxial layer.	IRPS	2022	DBLP DOI BibTeX RDF
34	Wei-Che Wang, Yair Yona, Suhas N. Diggavi, Puneet Gupta 0001	LEDPUF: Stability-guaranteed physical unclonable functions through locally enhanced defectivity.	HOST	2016	DBLP DOI BibTeX RDF
34	Paolo Buttà, Nicola Guglielmi, Manuela Manetta, Silvia Noschese	Differential Equations for Real-Structured Defectivity Measures.	SIAM J. Matrix Anal. Appl.	2015	DBLP DOI BibTeX RDF
34	Dan X. Houston, Douglas Buettner, Myron Hecht	Defectivity profiling with dynamic COQUALMO: An explication and product quality retrospective.	J. Softw. Evol. Process.	2012	DBLP DOI BibTeX RDF
34	Hirotachi Abo	On non-defectivity of certain Segre-Veronese varieties.	J. Symb. Comput.	2010	DBLP DOI BibTeX RDF
34	Despina C. Moschou, M. A. Exarchos, Dimitrios N. Kouvatsos, George J. Papaioannou, Aggeliki Arapoyanni, Apostolos T. Voutsas	Reliability and defectivity comparison of n- and p-channel SLS ELA polysilicon TFTs fabricated with a novel crystallization technique.	Microelectron. Reliab.	2008	DBLP DOI BibTeX RDF
25	Dan X. Houston, Douglas Buettner, Myron Hecht	Dynamic COQUALMO: Defect Profiling over Development Cycles.	ICSP	2009	DBLP DOI BibTeX RDF	Defect profile, defect introduction and removal, COQUALMO
25	Maryam Ashouei, Adit D. Singh, Abhijit Chatterjee	Reconfiguring CMOS as Pseudo N/PMOS for Defect Tolerance in Nano-Scale CMOS.	VLSI Design	2008	DBLP DOI BibTeX RDF
25	Robert Madge	New Test Paradigms for Yield and Manufacturability.	ITC	2004	DBLP DOI BibTeX RDF