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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 10 occurrences of 8 keywords
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Results
Found 12 publication records. Showing 12 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
120 | Sandra Levasseur, Frederic Duvivier |
Application of a yield model merging critical areas and defectivity to industrial products. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 1997 Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT '97), 20-22 October 1997, Paris, France, pp. 11-19, 1997, IEEE Computer Society, 0-8186-8168-3. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
industrial products, survey sampling based estimation tool, fabrication process, SGS-Thomson Crolles plant, multiple products, process versions, 0.5 micron, robustness, defectivity, EYES, critical areas, yield model, integrated circuit yield |
84 | Kamal Rajkanan |
Yield Analysis Methodology for Low Defectivity Wafer Fabs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MTDT ![In: 8th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2000), 7-8 August 2000, San Jose, CA, USA, pp. 65-72, 2000, IEEE Computer Society, 0-7695-0689-5. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
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59 | Sandrine Barberan, Frederic Duvivier |
Management of Critical Areas and Defectivity Data for Yield Trend Modeling. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '98), 2-4 November 1998, Austin, TX, USA, Proceedings, pp. 17-, 1998, IEEE Computer Society, 0-8186-8832-7. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
critical areas, defect analysis, yield modeling |
34 | Mario Santo Alessandrino, Beatrice Carbone, Francesco Cordiano, Bruna Mazza, Alfio Russo, W. Coco, Massimo Boscaglia, A. Di Salvo, A. Lombardo, D. Scarcella, Elisa Vitanza, Patrick Fiorenza |
Failure analysis addressing method of optically undetected defectivity on 4H-SiC PowerMOSFET epitaxial layer. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022, pp. 61-1, 2022, IEEE, 978-1-6654-7950-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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34 | Wei-Che Wang, Yair Yona, Suhas N. Diggavi, Puneet Gupta 0001 |
LEDPUF: Stability-guaranteed physical unclonable functions through locally enhanced defectivity. ![Search on Bibsonomy](Pics/bibsonomy.png) |
HOST ![In: 2016 IEEE International Symposium on Hardware Oriented Security and Trust, HOST 2016, McLean, VA, USA, May 3-5, 2016, pp. 25-30, 2016, IEEE Computer Society, 978-1-4673-8826-9. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
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34 | Paolo Buttà, Nicola Guglielmi, Manuela Manetta, Silvia Noschese |
Differential Equations for Real-Structured Defectivity Measures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SIAM J. Matrix Anal. Appl. ![In: SIAM J. Matrix Anal. Appl. 36(2), pp. 523-548, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
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34 | Dan X. Houston, Douglas Buettner, Myron Hecht |
Defectivity profiling with dynamic COQUALMO: An explication and product quality retrospective. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Softw. Evol. Process. ![In: J. Softw. Evol. Process. 24(7), pp. 803-814, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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34 | Hirotachi Abo |
On non-defectivity of certain Segre-Veronese varieties. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Symb. Comput. ![In: J. Symb. Comput. 45(12), pp. 1254-1269, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
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34 | Despina C. Moschou, M. A. Exarchos, Dimitrios N. Kouvatsos, George J. Papaioannou, Aggeliki Arapoyanni, Apostolos T. Voutsas |
Reliability and defectivity comparison of n- and p-channel SLS ELA polysilicon TFTs fabricated with a novel crystallization technique. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 48(8-9), pp. 1544-1548, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
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25 | Dan X. Houston, Douglas Buettner, Myron Hecht |
Dynamic COQUALMO: Defect Profiling over Development Cycles. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSP ![In: Trustworthy Software Development Processes, International Conference on Software Process, ICSP 2009 Vancouver, Canada, May 16-17, 2009 Proceedings, pp. 161-172, 2009, Springer, 978-3-642-01679-0. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
Defect profile, defect introduction and removal, COQUALMO |
25 | Maryam Ashouei, Adit D. Singh, Abhijit Chatterjee |
Reconfiguring CMOS as Pseudo N/PMOS for Defect Tolerance in Nano-Scale CMOS. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 21st International Conference on VLSI Design (VLSI Design 2008), 4-8 January 2008, Hyderabad, India, pp. 27-32, 2008, IEEE Computer Society, 0-7695-3083-4. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
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25 | Robert Madge |
New Test Paradigms for Yield and Manufacturability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 13, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
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