Search results for "IOLTW"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
1	Pierluigi Civera, Luca Macchiarulo, Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante	Exploiting FPGA for Accelerating Fault Injection Experiments.	IOLTW	2001	DBLP DOI BibTeX RDF
1	Marcello Artioli, Fiorenzo Filippetti	Fault Diagnosis for Linear Analog Circuits with Symbolic Analysis and Reduced Observable Point Set.	IOLTW	2001	DBLP DOI BibTeX RDF
1	Manuel G. Gericota, Gustavo R. Alves, Miguel L. Silva, José M. Ferreira 0001	DRAFT: An On-Line Fault Detection Method for Dynamic and Partially Reconfigurable FPGAs.	IOLTW	2001	DBLP DOI BibTeX RDF
1	T. Vallino, Abbas Dandache, J. P. Delahaye, Fabrice Monteiro, Bernard Lepley	A Stamping Technique to Increase the Error Correction Capacity of the (127, k, d) RS Code.	IOLTW	2000	DBLP DOI BibTeX RDF	safety in digital system, coding theory, software implementation
1	M. E. Nillesen, A. Del Pizzo, M. Pasquariello, R. Rizzo	A Very Flexible DSP-Based Controller for On-Line Test and Control of Industrial Processes.	IOLTW	2000	DBLP DOI BibTeX RDF	avionics and industrial applications, Controller, DSP, automotive, railway
1	Ondrej Novák, Jiri Nosek	On Using Deterministic Test Sets in BIST.	IOLTW	2000	DBLP DOI BibTeX RDF
1	Y. Tsiatouhas, Th. Haniotakis, Dimitris Nikolos	A Compact Built-In Current Sensor for IDDQ Testing.	IOLTW	2000	DBLP DOI BibTeX RDF	Bridging and Stuck-on fault testability, Design for testability, DFT, IDDQ testing, Built in current sensors, BICS, Current monitoring
1	Paolo Migliavacca	Faster Time-to-Market, Lower Cost of Development and Test for Standard Analog IC.	IOLTW	2000	DBLP DOI BibTeX RDF	Bipolar array, standard analog IC, time-to-market, Voltage Reference
1	Bartomeu Alorda, Ivan de Paúl, Jaume Segura 0001, T. Miller	On-Line Current Testing for a Microprocessor Based Application with an Off-Chip Sensor.	IOLTW	2000	DBLP DOI BibTeX RDF
1	Raoul Velazco, Sana Rezgui	Transient Bitflip Injection in Microprocessor Embedded Applications.	IOLTW	2000	DBLP DOI BibTeX RDF
1	Lukás Sekanina, Vladimír Drábek	Relation between Fault Tolerance and Reconfiguration in Cellular Systems.	IOLTW	2000	DBLP DOI BibTeX RDF	fault tolerance, reconfiguration, evolution, cell, cellular automaton
1	Miron Abramovici, Charles E. Stroud, Brandon Skaggs, John Marty Emmert	Improving On-Line BIST-Based Diagnosis for Roving STARs.	IOLTW	2000	DBLP DOI BibTeX RDF	on-line testing and diagnosis, FPGA test and diagnosis
1	Anzhela Yu. Matrosova, Sergey Ostanin	Self-Checking FSM Design with Observing only FSM Outputs.	IOLTW	2000	DBLP DOI BibTeX RDF	Self-checking design, unidirectional fault, PLA description, multilevel synthesis, FSM
1	B. Parrotta, Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante	New Techniques for Accelerating Fault Injection in VHDL Descriptions.	IOLTW	2000	DBLP DOI BibTeX RDF	VHDL, Fault Injection
1	Debaleena Das, Nur A. Touba, Markus Seuring, Michael Gössel	Low Cost Concurrent Error Detection Based on Modulo Weight-Based Codes.	IOLTW	2000	DBLP DOI BibTeX RDF	error detecting codes, Concurrent error detection, self-checking checkers
1	Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante, Ph. Cheynet, Bogdan Nicolescu, Raoul Velazco	Evaluating the Effectiveness of a Software Fault-Tolerance Technique on RISC- and CISC-Based Architectures.	IOLTW	2000	DBLP DOI BibTeX RDF	Fault Injection, Software Fault-Tolerance
1	Naotake Kamiura, Masashi Tomita, Teijiro Isokawa, Nobuyuki Matsui	On Realization of Fault-Tolerant Fuzzy Controllers.	IOLTW	2000	DBLP DOI BibTeX RDF	concurrent compensation, fault tolerance, fuzzy control, stuck-at faults, concurrent test
1	Keith Whisnant, Zbigniew Kalbarczyk, Ravishankar K. Iyer	Micro-Checkpointing: Checkpointing for Multithreaded Applications.	IOLTW	2000	DBLP DOI BibTeX RDF	multithreaded applications, object-oriented programming, checkpointing
1	Michael Nicolaidis, N. Zaidan, Th. Calin, D. Bied-Charreton	ISIS: A Fail-Safe Interface Realized in Smart Power Technology.	IOLTW	2000	DBLP DOI BibTeX RDF
1	K. D. R. Jagath-Kumara	Theoretical Performance Bounds of a Probability of Bit Error Estimator Used in Digital Links Employing Binary Block Codes.	IOLTW	2000	DBLP DOI BibTeX RDF	Bit Error Probability, Automatic Link Establishment, Channel Quality Estimates, Digital Communications
1		6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain	IOLTW	2000	DBLP BibTeX RDF
1	Daniel Gil, Joaquin Gracia, Juan Carlos Baraza, Pedro J. Gil	A Study of the Effects of Transient Fault Injection into the VHDL Model of a Fault-Tolerant Microcomputer System.	IOLTW	2000	DBLP DOI BibTeX RDF
1	Ahmad Abdelhay, Emmanuel Simeu	Analytical Redundancy Based Approach for Concurrent Fault Detection in Linear Digital Systems.	IOLTW	2000	DBLP DOI BibTeX RDF	Linear digital, parity equation, redundancy, state space, concurrent testing
1	Patrick Girard 0001, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel	Comparison between Random and Pseudo-Random Generation for BIST of Delay, Stuck-at and Bridging Faults.	IOLTW	2000	DBLP DOI BibTeX RDF	BIST, Random Testing, Delay Testing, Bridging Faults
1	Vincent Pouget, Pascal Fouillat, Dean Lewis, Hervé Lapuyade, L. Sarger, F. M. Roche, S. Duzellier, R. Ecoffet	An Overview of the Applications of a Pulsed Laser System for SEU Testing.	IOLTW	2000	DBLP DOI BibTeX RDF
1	Yvan Maidon, Yann Deval, Jean-Baptiste Bégueret	An Improved CMOS BICS for On-Line Testing.	IOLTW	2000	DBLP DOI BibTeX RDF	On Line Testing, IDDQ testing, Built-In Current Sensor
1	Mohammad A. Naal, Emmanuel Simeu	High-Level Synthesis Methodology for On-Line Testability Optimization.	IOLTW	2000	DBLP DOI BibTeX RDF	On-line testability, Function factorization, idle-time operation, High-level synthesis
1	Jose Miguel Vieira dos Santos	Concurrent Scan Monitoring and Multi-Pattern Search.	IOLTW	2000	DBLP DOI BibTeX RDF	Dependable VLSI, DFT, Concurrent test, BST
1	José Antonio Sainz, R. Muñoz, J. A. Maiz, L. A. Aguado, Miquel Roca 0001	A Crosstalk Sensor Implementation for Measuring Interferences in Digital CMOS VLSI Circuits.	IOLTW	2000	DBLP DOI BibTeX RDF	VLSI, Sensor, CMOS, Crosstalk, Digital
1	Fabian Vargas 0001, Alexandre M. Amory, Raoul Velazco	Estimating Circuit Fault-Tolerance by Means of Transient-Fault Injection in VHDL.	IOLTW	2000	DBLP DOI BibTeX RDF
1	Andrzej Krasniewski	Self-Testing of FPGA Delay Faults in the System Environment.	IOLTW	2000	DBLP DOI BibTeX RDF	FPGA, BIST, random testing, delay faults
1	Alfredo Benso, Silvia Chiusano, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni	A Family of Self-Repair SRAM Cores.	IOLTW	2000	DBLP DOI BibTeX RDF	Memory Self-Repair, Memory BIST, BISR
1	Xiaodong Zhang 0010, Kaushik Roy 0001	Power Reduction in Test-Per-Scan BIST.	IOLTW	2000	DBLP DOI BibTeX RDF	Test-per-scan, Low Power BIST, Testing, Low Power, BIST, Weighted Random Pattern
1	Michael Gössel, Alexej Dmitriev, Vladimir V. Saposhnikov, Valerij V. Saposhnikov	A New Method for Concurrent Checking by Use of a 1-out-of-4 Code.	IOLTW	2000	DBLP DOI BibTeX RDF
1	Martin Margala, Srdjan Dragic, Ahmed El-Abasiry, Samuel Ekpe, Viera Stopjaková	I-V Fast IDDQ Current Sensor for On-Line Mixed-Signal/Analog Test.	IOLTW	2000	DBLP DOI BibTeX RDF	VLSI, Testing, Sensors, Iddq, Ultra-Low-Voltage, Current
1	Andrej A. Morosov, Valerij V. Saposhnikov, Vladimir V. Saposhnikov, Michael Gössel	New Self-Checking Circuits by Use of Berger-Codes.	IOLTW	2000	DBLP DOI BibTeX RDF
1	Janusz Sosnowski	Improving Fault Coverage in System Tests.	IOLTW	2000	DBLP DOI BibTeX RDF	In system testing, test controllability and observability, fault coverage analysis, on-line monitoring
1	Alfredo Benso, Silvia Chiusano, Paolo Prinetto	A COTS Wrapping Toolkit for Fault Tolerant Applications under Windows NT.	IOLTW	2000	DBLP DOI BibTeX RDF

Publications at "IOLTW"( http://dblp.L3S.de/Venues/IOLTW )