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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 86 occurrences of 67 keywords
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Results
Found 138 publication records. Showing 138 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
1 | Pierluigi Civera, Luca Macchiarulo, Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante |
Exploiting FPGA for Accelerating Fault Injection Experiments. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 7th IEEE International On-Line Testing Workshop (IOLTW 2001), 9-11 July 2001, Taormina, Italy, pp. 9-13, 2001, IEEE Computer Society, 0-7695-1290-9. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
1 | Marcello Artioli, Fiorenzo Filippetti |
Fault Diagnosis for Linear Analog Circuits with Symbolic Analysis and Reduced Observable Point Set. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 7th IEEE International On-Line Testing Workshop (IOLTW 2001), 9-11 July 2001, Taormina, Italy, pp. 215-218, 2001, IEEE Computer Society, 0-7695-1290-9. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
1 | Manuel G. Gericota, Gustavo R. Alves, Miguel L. Silva, José M. Ferreira 0001 |
DRAFT: An On-Line Fault Detection Method for Dynamic and Partially Reconfigurable FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 7th IEEE International On-Line Testing Workshop (IOLTW 2001), 9-11 July 2001, Taormina, Italy, pp. 34-36, 2001, IEEE Computer Society, 0-7695-1290-9. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
1 | T. Vallino, Abbas Dandache, J. P. Delahaye, Fabrice Monteiro, Bernard Lepley |
A Stamping Technique to Increase the Error Correction Capacity of the (127, k, d) RS Code. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 169-170, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
safety in digital system, coding theory, software implementation |
1 | M. E. Nillesen, A. Del Pizzo, M. Pasquariello, R. Rizzo |
A Very Flexible DSP-Based Controller for On-Line Test and Control of Industrial Processes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 179-184, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
avionics and industrial applications, Controller, DSP, automotive, railway |
1 | Ondrej Novák, Jiri Nosek |
On Using Deterministic Test Sets in BIST. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 127-132, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
1 | Y. Tsiatouhas, Th. Haniotakis, Dimitris Nikolos |
A Compact Built-In Current Sensor for IDDQ Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 95-99, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
Bridging and Stuck-on fault testability, Design for testability, DFT, IDDQ testing, Built in current sensors, BICS, Current monitoring |
1 | Paolo Migliavacca |
Faster Time-to-Market, Lower Cost of Development and Test for Standard Analog IC. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 155-, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
Bipolar array, standard analog IC, time-to-market, Voltage Reference |
1 | Bartomeu Alorda, Ivan de Paúl, Jaume Segura 0001, T. Miller |
On-Line Current Testing for a Microprocessor Based Application with an Off-Chip Sensor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 87-91, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
1 | Raoul Velazco, Sana Rezgui |
Transient Bitflip Injection in Microprocessor Embedded Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 80-, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
1 | Lukás Sekanina, Vladimír Drábek |
Relation between Fault Tolerance and Reconfiguration in Cellular Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 25-30, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
fault tolerance, reconfiguration, evolution, cell, cellular automaton |
1 | Miron Abramovici, Charles E. Stroud, Brandon Skaggs, John Marty Emmert |
Improving On-Line BIST-Based Diagnosis for Roving STARs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 31-39, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
on-line testing and diagnosis, FPGA test and diagnosis |
1 | Anzhela Yu. Matrosova, Sergey Ostanin |
Self-Checking FSM Design with Observing only FSM Outputs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 153-154, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
Self-checking design, unidirectional fault, PLA description, multilevel synthesis, FSM |
1 | B. Parrotta, Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante |
New Techniques for Accelerating Fault Injection in VHDL Descriptions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 61-66, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
VHDL, Fault Injection |
1 | Debaleena Das, Nur A. Touba, Markus Seuring, Michael Gössel |
Low Cost Concurrent Error Detection Based on Modulo Weight-Based Codes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 171-, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
error detecting codes, Concurrent error detection, self-checking checkers |
1 | Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante, Ph. Cheynet, Bogdan Nicolescu, Raoul Velazco |
Evaluating the Effectiveness of a Software Fault-Tolerance Technique on RISC- and CISC-Based Architectures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 17-, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
Fault Injection, Software Fault-Tolerance |
1 | Naotake Kamiura, Masashi Tomita, Teijiro Isokawa, Nobuyuki Matsui |
On Realization of Fault-Tolerant Fuzzy Controllers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 185-190, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
concurrent compensation, fault tolerance, fuzzy control, stuck-at faults, concurrent test |
1 | Keith Whisnant, Zbigniew Kalbarczyk, Ravishankar K. Iyer |
Micro-Checkpointing: Checkpointing for Multithreaded Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 3-8, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
multithreaded applications, object-oriented programming, checkpointing |
1 | Michael Nicolaidis, N. Zaidan, Th. Calin, D. Bied-Charreton |
ISIS: A Fail-Safe Interface Realized in Smart Power Technology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 191-, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
1 | K. D. R. Jagath-Kumara |
Theoretical Performance Bounds of a Probability of Bit Error Estimator Used in Digital Links Employing Binary Block Codes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 165-168, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
Bit Error Probability, Automatic Link Establishment, Channel Quality Estimates, Digital Communications |
1 | |
6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![IEEE Computer Society, 0-7695-0646-1 The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP BibTeX RDF |
|
1 | Daniel Gil, Joaquin Gracia, Juan Carlos Baraza, Pedro J. Gil |
A Study of the Effects of Transient Fault Injection into the VHDL Model of a Fault-Tolerant Microcomputer System. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 73-79, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
1 | Ahmad Abdelhay, Emmanuel Simeu |
Analytical Redundancy Based Approach for Concurrent Fault Detection in Linear Digital Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 112-, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
Linear digital, parity equation, redundancy, state space, concurrent testing |
1 | Patrick Girard 0001, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel |
Comparison between Random and Pseudo-Random Generation for BIST of Delay, Stuck-at and Bridging Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 121-126, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
BIST, Random Testing, Delay Testing, Bridging Faults |
1 | Vincent Pouget, Pascal Fouillat, Dean Lewis, Hervé Lapuyade, L. Sarger, F. M. Roche, S. Duzellier, R. Ecoffet |
An Overview of the Applications of a Pulsed Laser System for SEU Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 52-, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
1 | Yvan Maidon, Yann Deval, Jean-Baptiste Bégueret |
An Improved CMOS BICS for On-Line Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 100-, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
On Line Testing, IDDQ testing, Built-In Current Sensor |
1 | Mohammad A. Naal, Emmanuel Simeu |
High-Level Synthesis Methodology for On-Line Testability Optimization. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 201-206, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
On-line testability, Function factorization, idle-time operation, High-level synthesis |
1 | Jose Miguel Vieira dos Santos |
Concurrent Scan Monitoring and Multi-Pattern Search. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 107-111, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
Dependable VLSI, DFT, Concurrent test, BST |
1 | José Antonio Sainz, R. Muñoz, J. A. Maiz, L. A. Aguado, Miquel Roca 0001 |
A Crosstalk Sensor Implementation for Measuring Interferences in Digital CMOS VLSI Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 45-51, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
VLSI, Sensor, CMOS, Crosstalk, Digital |
1 | Fabian Vargas 0001, Alexandre M. Amory, Raoul Velazco |
Estimating Circuit Fault-Tolerance by Means of Transient-Fault Injection in VHDL. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 67-72, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
1 | Andrzej Krasniewski |
Self-Testing of FPGA Delay Faults in the System Environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 40-, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
FPGA, BIST, random testing, delay faults |
1 | Alfredo Benso, Silvia Chiusano, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni |
A Family of Self-Repair SRAM Cores. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 214-218, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
Memory Self-Repair, Memory BIST, BISR |
1 | Xiaodong Zhang 0010, Kaushik Roy 0001 |
Power Reduction in Test-Per-Scan BIST. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 133-, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
Test-per-scan, Low Power BIST, Testing, Low Power, BIST, Weighted Random Pattern |
1 | Michael Gössel, Alexej Dmitriev, Vladimir V. Saposhnikov, Valerij V. Saposhnikov |
A New Method for Concurrent Checking by Use of a 1-out-of-4 Code. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 147-152, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
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1 | Martin Margala, Srdjan Dragic, Ahmed El-Abasiry, Samuel Ekpe, Viera Stopjaková |
I-V Fast IDDQ Current Sensor for On-Line Mixed-Signal/Analog Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 92-93, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
VLSI, Testing, Sensors, Iddq, Ultra-Low-Voltage, Current |
1 | Andrej A. Morosov, Valerij V. Saposhnikov, Vladimir V. Saposhnikov, Michael Gössel |
New Self-Checking Circuits by Use of Berger-Codes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 141-146, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
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1 | Janusz Sosnowski |
Improving Fault Coverage in System Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 207-213, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
In system testing, test controllability and observability, fault coverage analysis, on-line monitoring |
1 | Alfredo Benso, Silvia Chiusano, Paolo Prinetto |
A COTS Wrapping Toolkit for Fault Tolerant Applications under Windows NT. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain, pp. 9-16, 2000, IEEE Computer Society, 0-7695-0646-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
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