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Results
Found 186 publication records. Showing 186 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Yousuke Miyake, Seiji Kajihara, Poki Chen |
On-Chip Test Clock Validation Using A Time-to-Digital Converter in FPGAs.  |
ITC-Asia  |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | |
IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019 |
ITC-Asia |
2019 |
DBLP BibTeX RDF |
|
| 1 | Stephan Eggersglüß |
Towards Complete Fault Coverage by Test Point Insertion using Optimization-SAT Techniques. |
ITC-Asia |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Man-Hsuan Kuo, Chun-Ming Hu, Kuen-Jong Lee |
Time-Related Hardware Trojan Attacks on Processor Cores. |
ITC-Asia |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Foisal Ahmed, Michihiro Shintani, Michiko Inoue |
Low Cost Recycled FPGA Detection Using Virtual Probe Technique. |
ITC-Asia |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Haiying Ma, Rui Guo, Quan Jing, Jing Han, Yu Huang 0005, Rahul Singhal, Wu Yang, Xin Wen, Fanjin Meng |
A Case Study of Testing Strategy for AI SoC. |
ITC-Asia |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Wei Chu, Shi-Yu Huang |
Online Testing of Clock Delay Faults in a Clock Network. |
ITC-Asia |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Sebastian Huhn 0001, Daniel Tille, Rolf Drechsler |
A Hybrid Embedded Multichannel Test Compression Architecture for Low-Pin Count Test Environments in Safety-Critical Systems. |
ITC-Asia |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Sebastian Pointner, Robert Wille |
Did We Test Enough? Functional Coverage for Post-Silicon Validation. |
ITC-Asia |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Raviteja P. Reddy, Amit Acharyya, S. Saqib Khursheed |
A Framework for TSV Based 3D-IC to Analyze Aging and TSV Thermo-Mechanical Stress on Soft Errors. |
ITC-Asia |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Shuya Kikuchi, Hiroyuki Yotsuyanagi, Masaki Hashizume |
On Delay Measurement Under Delay Variations in Boundary Scan Circuit with Embedded TDC. |
ITC-Asia |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Kun-Han Tsai |
Race and Glitch Handling: A Test Perspective. |
ITC-Asia |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Ahmed M. Y. Ibrahim, Hans G. Kerkhoff |
An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips. |
ITC-Asia |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Junying Huang, Jing Ye 0001, Xiaochun Ye, Da Wang, Dongrui Fan, Huawei Li 0001, Xiaowei Li 0001, Zhimin Zhang 0004 |
Instruction Vulnerability Test and Code Optimization Against DVFS Attack. |
ITC-Asia |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Wei-Chen Huang, Guan-Hao Hou, Jiun-Lang Huang, Terry Kuo |
An FPGA-Based Data Receiver for Digital IC Testing. |
ITC-Asia |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Yipei Yang, Jing Ye 0001, Xiaowei Li 0001, Yinhe Han 0001, Huawei Li 0001, Yu Hu 0001 |
Implementation of Parametric Hardware Trojan in FPGA. |
ITC-Asia |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Yuto Sasaki, Kosuke Machida, Riho Aoki, Shogo Katayama, Takayuki Nakatani, Jianlong Wang, Keno Sato, Takashi Ishida 0003, Toshiyuki Okamoto, Tamotsu Ichikawa, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi 0001 |
Accurate and Fast Testing Technique of Operational Amplifier DC Offset Voltage in µV-Order by DC-AC Conversion. |
ITC-Asia |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Zhan Gao, Min-Chun Hu 0002, Joe Swenton, Santosh Malagi, Jos Huisken, Kees Goossens, Erik Jan Marinissen |
Optimization of Cell-Aware ATPG Results by Manipulating Library Cells' Defect Detection Matrices. |
ITC-Asia |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Tsuyoshi Iwagaki, Sho Yuasa, Hideyuki Ichihara, Tomoo Inoue |
An Empirical Approach to RTL Scan Path Design Focusing on Structural Interpretation in Logic Synthesis. |
ITC-Asia |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Tong-Yu Hsieh, Kuang-Chun Lin, Hsin-Hsien Lin |
A Delay-Aware Implementation Scheme for Cost-Effective Implication-Based Concurrent Error Detection. |
ITC-Asia |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Zhiyuan Song, Aibin Yan, Jie Cui 0004, Zhili Chen, Xuejun Li, Xiaoqing Wen, Chaoping Lai, Zhengfeng Huang, Huaguo Liang |
A Novel Triple-Node-Upset-Tolerant CMOS Latch Design using Single-Node-Upset-Resilient Cells. |
ITC-Asia |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Yousuke Miyake, Yasuo Sato, Seiji Kajihara |
A Selection Method of Ring Oscillators for An On-Chip Digital Temperature And Voltage Sensor. |
ITC-Asia |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Yukiko Shibasaki, Koji Asami, Anna Kuwana, Kosuke Machida, Yuanyang Du, Akemi Hatta, Kazuyoshi Kubo, Haruo Kobayashi 0001 |
Crest Factor Controlled Multi-Tone Signals for Analog/Mixed-Signal IC Testing. |
ITC-Asia |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Yang Yu 0015, Zhiming Yang 0001, Kangkang Xu |
A Post-Bond TSVs Test Solution for Leakage Fault. |
ITC-Asia |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Zhikuang Cai, Ying Wang, Shihuan Liu, Kai Lv, Zixuan Wang |
A Novel BIST Algorithm for Low-Voltage SRAM. |
ITC-Asia |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Li Li, Dawen Xu 0002, Kouzi Xing, Cheng Liu 0008, Ying Wang 0001, Huawei Li 0001, Xiaowei Li 0001 |
Squeezing the Last MHz for CNN Acceleration on FPGAs. |
ITC-Asia |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Danielle Duvalsaint, Zeye Liu 0001, Ananya Ravikumar, Ronald D. Blanton |
Characterization of Locked Sequential Circuits via ATPG. |
ITC-Asia |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Ahmed Wahba, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa |
Wafer Plot Classification Using Neural Networks and Tensor Methods. |
ITC-Asia |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Pin-Ru Jhao, Denny C.-Y. Wu, Charles H.-P. Wen |
Skew-Aware Functional Timing Analysis Against Setup Violation for Post-Layout Validation. |
ITC-Asia |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Tara Ghasempouri, Siavoosh Payandeh Azad, Behrad Niazmand, Jaan Raik |
An Automatic Approach to Evaluate Assertions' Quality Based on Data-Mining Metrics. |
ITC-Asia |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Tomonori Yanagida, Shohei Shibuya, Kosuke Machida, Koji Asami, Haruo Kobayashi 0001 |
Low-Distortion One-Tone and Two-Tone Signal Generation Using AWG Over Full Nyquist Region. |
ITC-Asia |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Yuming Zhuang, Degang Chen 0001 |
Cost-Effective High Purity Signal Generator Using Pre-distortion. |
ITC-Asia |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Desong Pang, Dawen Xu 0002, Ying Wang 0001, Huaguo Liang |
MTTF-Aware Reliability Task Scheduling for PIM-Based Heterogeneous Computing System. |
ITC-Asia |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Yuming Zhuang, Degang Chen 0001 |
Accurate Spectral Testing with Impure Test Stimulus for Multi-tone Test. |
ITC-Asia |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Jia-Yun Hu, Kuan-Wei Hou, Chih-Yen Lo, Yung-Fa Chou, Cheng-Wen Wu |
RRAM-Based Neuromorphic Hardware Reliability Improvement by Self-Healing and Error Correction. |
ITC-Asia |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Takeru Nishimi, Yasuo Sato, Seiji Kajihara, Yoshiyuki Nakamura |
Good Die Prediction Modelling from Limited Test Items. |
ITC-Asia |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Chih-Hao Wang, Chi-Hsuan Ho, Tong-Yu Hsieh |
Error Indication Signal Collapsing for Implication-Based Concurrent Error Detection. |
ITC-Asia |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Teresa L. McLaurin |
Periodic Online LBIST Considerations for a Multicore Processor. |
ITC-Asia |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Guoliang Li 0004, Henry Zhao, Qinfu Yang, Jun Qian, Yu Huang 0005 |
Industrial Case Studies of SoC Test Scheduling Optimization by Selecting Appropriate EDT Architectures. |
ITC-Asia |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Aibin Yan, Zhile Chen, Zhengfeng Huang, Xiangsheng Fang, Maoxiang Yi, Jing Guo |
Radiation Hardening by Design of a Novel Double-Node-Upset-Tolerant Latch Combined with Layout Technique. |
ITC-Asia |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Jing Ye 0001, Yipei Yang, Yue Gong, Yu Hu 0001, Xiaowei Li 0001 |
Grey Zone in Pre-Silicon Hardware Trojan Detection. |
ITC-Asia |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Ruifeng Guo, Brian Archer, Kevin Chau, Xiaolei Cai |
Efficient Cell-Aware Defect Characterization for Multi-bit Cells. |
ITC-Asia |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Behrad Niazmand, Siavoosh Payandeh Azad, Tara Ghasempouri, Jaan Raik, Gert Jervan |
A Hierarchical Approach for Devising Area Efficient Concurrent Online Checkers. |
ITC-Asia |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Xi Chen, Omid Aramoon, Gang Qu 0001, Aijiao Cui |
Balancing Testability and Security by Configurable Partial Scan Design. |
ITC-Asia |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Yi-Cheng Kung, Kuen-Jong Lee, Sudhakar M. Reddy |
Generating Compact Test Patterns for Stuck-at Faults and Transition Faults in One ATPG Run. |
ITC-Asia |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Riccardo Cantoro, Aleksa Damljanovic, Matteo Sonza Reorda, Giovanni Squillero |
A Semi-Formal Technique to Generate Effective Test Sequences for Reconfigurable Scan Networks. |
ITC-Asia |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Tong-Yu Hsieh, Chao-Ru Chen |
A No-Reference Error-Tolerability Test Methodology for Image Processing Applications. |
ITC-Asia |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | |
IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018 |
ITC-Asia |
2018 |
DBLP BibTeX RDF |
|
| 1 | Ying Zhang 0040, Lu Yu, Huawei Li 0001, Jianhui Jiang |
Small Trojan Testing Using Bounded Model Checking. |
ITC-Asia |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Chun-Yu Lin, Juinn-Dar Huang, Hailong Yao, Tsung-Yi Ho |
A Comprehensive Security System for Digital Microfluidic Biochips. |
ITC-Asia |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Keng-Wei Chang, Chun-Yang Huang, Szu-Pang Mu, Jian-Min Huang, Shi-Hao Chen, Mango C.-T. Chao |
DVFS Binning Using Machine-Learning Techniques. |
ITC-Asia |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Ying Wang 0001, Wen Li, Huawei Li 0001, Xiaowei Li 0001 |
Leveraging DRAM Refresh to Protect the Memory Timing Channel of Cloud Chip Multi-processors. |
ITC-Asia |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Harm van Schaaijk, Martien Spierings, Erik Jan Marinissen |
Automatic Generation of In-Circuit Tests for Board Assembly Defects. |
ITC-Asia |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Kun-Han Tsai |
X-Sources Analysis for Improving the Test Quality. |
ITC-Asia |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Venkat Yellapragada, Suresh Raman, Banadappa Shivaray, Luc Romain, Benoit Nadeau-Dostie, Martin Keim, Jean-Francois Cote, Albert Au, Giri Podichetty, Ashok Anbalan |
Implementing Design-for-Test Within a Tile-Based Design Methodology - Challenges and Solutions. |
ITC-Asia |
2018 |
DBLP DOI BibTeX RDF |
|
| 1 | Yousuke Miyake, Yasuo Sato, Seiji Kajihara |
On the effects of real time and contiguous measurement with a digital temperature and voltage sensor. |
ITC-Asia |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Masayuki Kawabata, Koji Asami, Shohei Shibuya, Tomonori Yanagida, Haruo Kobayashi 0001 |
Low-distortion signal generation for analog/mixed-signal circuit testing with digital ATE. |
ITC-Asia |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Mehmet Ince, Ender Yilmaz, Jae Woong Jeong, LeRoy Winemberg, Sule Ozev |
Evaluation of loop transfer function based dynamic testing of LDOs. |
ITC-Asia |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Hans G. Kerkhoff, Ghazanfar Ali, Hassan Ebrahimi, Ahmed Ibrahim 0001 |
An automotive MP-SoC featuring an advanced embedded instrument infrastructure for high dependability. |
ITC-Asia |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Matthew Beckler, R. D. Shawn Blanton |
GPU-accelerated fault dictionary generation for the TRAX fault model. |
ITC-Asia |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Charles Chia-Hao Hsu, Charles H.-P. Wen |
Speeding up power verification by merging equivalent power domains in RTL design with UPF. |
ITC-Asia |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Hideyuki Ichihara, Motoi Fukuda, Tsuyoshi Iwagaki, Tomoo Inoue |
State assignment for fault tolerant stochastic computing with linear finite state machines. |
ITC-Asia |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Young-Woo Lee, Inhyuk Choi, Kang-Hoon Oh, James Jinsoo Ko, Sungho Kang |
Test item priority estimation for high parallel test efficiency under ATE debug time constraints. |
ITC-Asia |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Tim Cheng |
Keynote I: Hardware security - Verification, test, and defense mechanisms. |
ITC-Asia |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Hao Chen 0053, Hung-Chih Lin, Min-Jer Wang |
Fan-out wafer level chip scale package testing. |
ITC-Asia |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Yi-Ju Ke, Yi-Chieh Ghen, Jng-Jer Huang |
An integrated design environment of fault tolerant processors with flexible HW/SW solutions for versatile performance/cost/coverage tradeoffs. |
ITC-Asia |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Jais Abraham, Uttam Garg, Glenn Colón-Bonet, Ramesh Sharma, Chennian Di, Benoit Nadeau-Dostie, Etienne Racine, Martin Keim |
Adapting an industrial memory BIST solution for testing CAMs. |
ITC-Asia |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Yen-Long Lee, Soon-Jyh Chang |
A quick jitter tolerance estimation technique for bang-bang CDRs. |
ITC-Asia |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Abhishek Bhattacharya, Ramesh Tekumalla |
Test strategy for storage SOCs. |
ITC-Asia |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Shyue-Kung Lu, Hung-Kai Huang |
Adaptive block-based refresh techniques for mitigation of data retention faults and reduction of refresh power. |
ITC-Asia |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | |
International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017 |
ITC-Asia |
2017 |
DBLP BibTeX RDF |
|
| 1 | Andreina Zambrano, Hans G. Kerkhoff |
A dependable AMR sensor system for automotive applications. |
ITC-Asia |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Yervant Zorian |
Tutorial I: Topic: Automotive test strategies. |
ITC-Asia |
2017 |
DBLP DOI BibTeX RDF |
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| 1 | Erik Jan Marinissen, Ferenc Fodor, Bart De Wachter, Jorg Kiesewetter, Eric Hill, Ken Smith |
A fully automatic test system for characterizing large-array fine-pitch micro-bump probe cards. |
ITC-Asia |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Tsung-Fu Hsieh, Jin-Fu Li 0001, Kuan-Te Wu, Jenn-Shiang Lai, Chih-Yen Lo, Ding-Ming Kwai, Yung-Fa Chou |
Software-hardware-cooperated built-in self-test scheme for channel-based DRAMs. |
ITC-Asia |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Davide Appello, M. Laurino, Marco Pranzo |
A mathematical model to assess the influence of parallelism in a semiconductor back-end test floor. |
ITC-Asia |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Cheng-Wen Wu, Bing-Yang Lin, Hsin-Wei Hung, Shu-Mei Tseng, Chi Chen |
Symbiotic system models for efficient IGT system design and test. |
ITC-Asia |
2017 |
DBLP DOI BibTeX RDF |
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| 1 | Rajit Karmakar, Santanu Chattopadhyay, Rohit Kapur |
Enhancing security of logic encryption using embedded key generation unit. |
ITC-Asia |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Daniel Tille, Benedikt Gottinger, Ulrike Pfannkuchen |
A lightweight X-masking scheme for IoT designs. |
ITC-Asia |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Michael A. Kochte, Rafal Baranowski, Hans-Joachim Wunderlich |
Trustworthy reconfigurable access to on-chip infrastructure. |
ITC-Asia |
2017 |
DBLP DOI BibTeX RDF |
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| 1 | Chih-Hao Wang, Tong-Yu Hsieh |
A hybrid concurrent error detection scheme for simultaneous improvement on probability of detection and diagnosability. |
ITC-Asia |
2017 |
DBLP DOI BibTeX RDF |
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| 1 | Tang-Jung Chiu, Yu-Lun Tseng, Yen-Cheng Lin, Yi-Chen Wang, Hung-Chih Lin, Min-Jer Wang |
Testing-for-manufacturing (TFM) for ultra-thin IPD on InFO. |
ITC-Asia |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Shuo-Lian Hong, Kuen-Jong Lee |
A run-pause-resume silicon debug technique for multiple clock domain systems. |
ITC-Asia |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Cheng-Hung Wu, Kuen-Jong Lee, Sudhakar M. Reddy |
Test generation for open and delay faults in CMOS circuits. |
ITC-Asia |
2017 |
DBLP DOI BibTeX RDF |
|
| 1 | Po-Yao Chuang, Cheng-Wen Wu, Harry H. Chen |
Cell-aware test generation time reduction by using switch-level ATPG. |
ITC-Asia |
2017 |
DBLP DOI BibTeX RDF |
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| 1 | Po-Hao Chen, Chi-Lin Lee, Jing-Yu Chen, Po-Wei Chen, James Chien-Mo Li |
Physical-aware diagnosis of multiple interconnect defects. |
ITC-Asia |
2017 |
DBLP DOI BibTeX RDF |
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