|
|
Venues (Conferences, Journals, ...)
|
|
GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
No Growbag Graphs found.
|
|
|
Results
Found 186 publication records. Showing 186 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
1 | Yousuke Miyake, Seiji Kajihara, Poki Chen |
On-Chip Test Clock Validation Using A Time-to-Digital Converter in FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019, pp. 157-162, 2019, IEEE, 978-1-7281-4718-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | |
IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019 ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![IEEE, 978-1-7281-4718-5 The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP BibTeX RDF |
|
1 | Stephan Eggersglüß |
Towards Complete Fault Coverage by Test Point Insertion using Optimization-SAT Techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019, pp. 67-72, 2019, IEEE, 978-1-7281-4718-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Man-Hsuan Kuo, Chun-Ming Hu, Kuen-Jong Lee |
Time-Related Hardware Trojan Attacks on Processor Cores. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019, pp. 43-48, 2019, IEEE, 978-1-7281-4718-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Foisal Ahmed, Michihiro Shintani, Michiko Inoue |
Low Cost Recycled FPGA Detection Using Virtual Probe Technique. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019, pp. 103-108, 2019, IEEE, 978-1-7281-4718-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Haiying Ma, Rui Guo, Quan Jing, Jing Han, Yu Huang 0005, Rahul Singhal, Wu Yang, Xin Wen, Fanjin Meng |
A Case Study of Testing Strategy for AI SoC. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019, pp. 61-66, 2019, IEEE, 978-1-7281-4718-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Wei Chu, Shi-Yu Huang |
Online Testing of Clock Delay Faults in a Clock Network. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019, pp. 163-168, 2019, IEEE, 978-1-7281-4718-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Sebastian Huhn 0001, Daniel Tille, Rolf Drechsler |
A Hybrid Embedded Multichannel Test Compression Architecture for Low-Pin Count Test Environments in Safety-Critical Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019, pp. 115-120, 2019, IEEE, 978-1-7281-4718-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Sebastian Pointner, Robert Wille |
Did We Test Enough? Functional Coverage for Post-Silicon Validation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019, pp. 31-36, 2019, IEEE, 978-1-7281-4718-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Raviteja P. Reddy, Amit Acharyya, S. Saqib Khursheed |
A Framework for TSV Based 3D-IC to Analyze Aging and TSV Thermo-Mechanical Stress on Soft Errors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019, pp. 121-126, 2019, IEEE, 978-1-7281-4718-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Shuya Kikuchi, Hiroyuki Yotsuyanagi, Masaki Hashizume |
On Delay Measurement Under Delay Variations in Boundary Scan Circuit with Embedded TDC. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019, pp. 169-174, 2019, IEEE, 978-1-7281-4718-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Kun-Han Tsai |
Race and Glitch Handling: A Test Perspective. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019, pp. 85-90, 2019, IEEE, 978-1-7281-4718-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Ahmed M. Y. Ibrahim, Hans G. Kerkhoff |
An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019, pp. 109-114, 2019, IEEE, 978-1-7281-4718-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Junying Huang, Jing Ye 0001, Xiaochun Ye, Da Wang, Dongrui Fan, Huawei Li 0001, Xiaowei Li 0001, Zhimin Zhang 0004 |
Instruction Vulnerability Test and Code Optimization Against DVFS Attack. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019, pp. 49-54, 2019, IEEE, 978-1-7281-4718-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Wei-Chen Huang, Guan-Hao Hou, Jiun-Lang Huang, Terry Kuo |
An FPGA-Based Data Receiver for Digital IC Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019, pp. 25-30, 2019, IEEE, 978-1-7281-4718-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Yipei Yang, Jing Ye 0001, Xiaowei Li 0001, Yinhe Han 0001, Huawei Li 0001, Yu Hu 0001 |
Implementation of Parametric Hardware Trojan in FPGA. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019, pp. 37-42, 2019, IEEE, 978-1-7281-4718-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Yuto Sasaki, Kosuke Machida, Riho Aoki, Shogo Katayama, Takayuki Nakatani, Jianlong Wang, Keno Sato, Takashi Ishida 0003, Toshiyuki Okamoto, Tamotsu Ichikawa, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi 0001 |
Accurate and Fast Testing Technique of Operational Amplifier DC Offset Voltage in µV-Order by DC-AC Conversion. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019, pp. 1-6, 2019, IEEE, 978-1-7281-4718-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Zhan Gao, Min-Chun Hu 0002, Joe Swenton, Santosh Malagi, Jos Huisken, Kees Goossens, Erik Jan Marinissen |
Optimization of Cell-Aware ATPG Results by Manipulating Library Cells' Defect Detection Matrices. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019, pp. 91-96, 2019, IEEE, 978-1-7281-4718-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Tsuyoshi Iwagaki, Sho Yuasa, Hideyuki Ichihara, Tomoo Inoue |
An Empirical Approach to RTL Scan Path Design Focusing on Structural Interpretation in Logic Synthesis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019, pp. 55-60, 2019, IEEE, 978-1-7281-4718-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Tong-Yu Hsieh, Kuang-Chun Lin, Hsin-Hsien Lin |
A Delay-Aware Implementation Scheme for Cost-Effective Implication-Based Concurrent Error Detection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019, pp. 145-150, 2019, IEEE, 978-1-7281-4718-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Zhiyuan Song, Aibin Yan, Jie Cui 0004, Zhili Chen, Xuejun Li, Xiaoqing Wen, Chaoping Lai, Zhengfeng Huang, Huaguo Liang |
A Novel Triple-Node-Upset-Tolerant CMOS Latch Design using Single-Node-Upset-Resilient Cells. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019, pp. 139-144, 2019, IEEE, 978-1-7281-4718-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Yousuke Miyake, Yasuo Sato, Seiji Kajihara |
A Selection Method of Ring Oscillators for An On-Chip Digital Temperature And Voltage Sensor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019, pp. 13-18, 2019, IEEE, 978-1-7281-4718-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Yukiko Shibasaki, Koji Asami, Anna Kuwana, Kosuke Machida, Yuanyang Du, Akemi Hatta, Kazuyoshi Kubo, Haruo Kobayashi 0001 |
Crest Factor Controlled Multi-Tone Signals for Analog/Mixed-Signal IC Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019, pp. 7-12, 2019, IEEE, 978-1-7281-4718-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Yang Yu 0015, Zhiming Yang 0001, Kangkang Xu |
A Post-Bond TSVs Test Solution for Leakage Fault. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019, pp. 127-132, 2019, IEEE, 978-1-7281-4718-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Zhikuang Cai, Ying Wang, Shihuan Liu, Kai Lv, Zixuan Wang |
A Novel BIST Algorithm for Low-Voltage SRAM. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019, pp. 133-138, 2019, IEEE, 978-1-7281-4718-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Li Li, Dawen Xu 0002, Kouzi Xing, Cheng Liu 0008, Ying Wang 0001, Huawei Li 0001, Xiaowei Li 0001 |
Squeezing the Last MHz for CNN Acceleration on FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019, pp. 151-156, 2019, IEEE, 978-1-7281-4718-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Danielle Duvalsaint, Zeye Liu 0001, Ananya Ravikumar, Ronald D. Blanton |
Characterization of Locked Sequential Circuits via ATPG. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019, pp. 97-102, 2019, IEEE, 978-1-7281-4718-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Ahmed Wahba, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa |
Wafer Plot Classification Using Neural Networks and Tensor Methods. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019, pp. 79-84, 2019, IEEE, 978-1-7281-4718-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
1 | Pin-Ru Jhao, Denny C.-Y. Wu, Charles H.-P. Wen |
Skew-Aware Functional Timing Analysis Against Setup Violation for Post-Layout Validation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018, pp. 67-72, 2018, IEEE, 978-1-5386-5180-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Tara Ghasempouri, Siavoosh Payandeh Azad, Behrad Niazmand, Jaan Raik |
An Automatic Approach to Evaluate Assertions' Quality Based on Data-Mining Metrics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018, pp. 61-66, 2018, IEEE, 978-1-5386-5180-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Tomonori Yanagida, Shohei Shibuya, Kosuke Machida, Koji Asami, Haruo Kobayashi 0001 |
Low-Distortion One-Tone and Two-Tone Signal Generation Using AWG Over Full Nyquist Region. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018, pp. 91-96, 2018, IEEE, 978-1-5386-5180-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Yuming Zhuang, Degang Chen 0001 |
Cost-Effective High Purity Signal Generator Using Pre-distortion. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018, pp. 103-108, 2018, IEEE, 978-1-5386-5180-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Desong Pang, Dawen Xu 0002, Ying Wang 0001, Huaguo Liang |
MTTF-Aware Reliability Task Scheduling for PIM-Based Heterogeneous Computing System. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018, pp. 25-30, 2018, IEEE, 978-1-5386-5180-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Yuming Zhuang, Degang Chen 0001 |
Accurate Spectral Testing with Impure Test Stimulus for Multi-tone Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018, pp. 97-102, 2018, IEEE, 978-1-5386-5180-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Jia-Yun Hu, Kuan-Wei Hou, Chih-Yen Lo, Yung-Fa Chou, Cheng-Wen Wu |
RRAM-Based Neuromorphic Hardware Reliability Improvement by Self-Healing and Error Correction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018, pp. 19-24, 2018, IEEE, 978-1-5386-5180-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Takeru Nishimi, Yasuo Sato, Seiji Kajihara, Yoshiyuki Nakamura |
Good Die Prediction Modelling from Limited Test Items. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018, pp. 115-120, 2018, IEEE, 978-1-5386-5180-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Chih-Hao Wang, Chi-Hsuan Ho, Tong-Yu Hsieh |
Error Indication Signal Collapsing for Implication-Based Concurrent Error Detection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018, pp. 127-132, 2018, IEEE, 978-1-5386-5180-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Teresa L. McLaurin |
Periodic Online LBIST Considerations for a Multicore Processor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018, pp. 37-42, 2018, IEEE, 978-1-5386-5180-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Guoliang Li 0004, Henry Zhao, Qinfu Yang, Jun Qian, Yu Huang 0005 |
Industrial Case Studies of SoC Test Scheduling Optimization by Selecting Appropriate EDT Architectures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018, pp. 109-114, 2018, IEEE, 978-1-5386-5180-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Aibin Yan, Zhile Chen, Zhengfeng Huang, Xiangsheng Fang, Maoxiang Yi, Jing Guo |
Radiation Hardening by Design of a Novel Double-Node-Upset-Tolerant Latch Combined with Layout Technique. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018, pp. 49-54, 2018, IEEE, 978-1-5386-5180-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Jing Ye 0001, Yipei Yang, Yue Gong, Yu Hu 0001, Xiaowei Li 0001 |
Grey Zone in Pre-Silicon Hardware Trojan Detection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018, pp. 79-84, 2018, IEEE, 978-1-5386-5180-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Ruifeng Guo, Brian Archer, Kevin Chau, Xiaolei Cai |
Efficient Cell-Aware Defect Characterization for Multi-bit Cells. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018, pp. 7-12, 2018, IEEE, 978-1-5386-5180-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Behrad Niazmand, Siavoosh Payandeh Azad, Tara Ghasempouri, Jaan Raik, Gert Jervan |
A Hierarchical Approach for Devising Area Efficient Concurrent Online Checkers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018, pp. 139-144, 2018, IEEE, 978-1-5386-5180-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Xi Chen, Omid Aramoon, Gang Qu 0001, Aijiao Cui |
Balancing Testability and Security by Configurable Partial Scan Design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018, pp. 145-150, 2018, IEEE, 978-1-5386-5180-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Yi-Cheng Kung, Kuen-Jong Lee, Sudhakar M. Reddy |
Generating Compact Test Patterns for Stuck-at Faults and Transition Faults in One ATPG Run. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018, pp. 1-6, 2018, IEEE, 978-1-5386-5180-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Riccardo Cantoro, Aleksa Damljanovic, Matteo Sonza Reorda, Giovanni Squillero |
A Semi-Formal Technique to Generate Effective Test Sequences for Reconfigurable Scan Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018, pp. 55-60, 2018, IEEE, 978-1-5386-5180-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Tong-Yu Hsieh, Chao-Ru Chen |
A No-Reference Error-Tolerability Test Methodology for Image Processing Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018, pp. 133-138, 2018, IEEE, 978-1-5386-5180-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
1 | |
IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018 ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![IEEE, 978-1-5386-5180-3 The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP BibTeX RDF |
|
1 | Ying Zhang 0040, Lu Yu, Huawei Li 0001, Jianhui Jiang |
Small Trojan Testing Using Bounded Model Checking. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018, pp. 85-90, 2018, IEEE, 978-1-5386-5180-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Chun-Yu Lin, Juinn-Dar Huang, Hailong Yao, Tsung-Yi Ho |
A Comprehensive Security System for Digital Microfluidic Biochips. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018, pp. 151-156, 2018, IEEE, 978-1-5386-5180-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Keng-Wei Chang, Chun-Yang Huang, Szu-Pang Mu, Jian-Min Huang, Shi-Hao Chen, Mango C.-T. Chao |
DVFS Binning Using Machine-Learning Techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018, pp. 31-36, 2018, IEEE, 978-1-5386-5180-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Ying Wang 0001, Wen Li, Huawei Li 0001, Xiaowei Li 0001 |
Leveraging DRAM Refresh to Protect the Memory Timing Channel of Cloud Chip Multi-processors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018, pp. 73-78, 2018, IEEE, 978-1-5386-5180-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Harm van Schaaijk, Martien Spierings, Erik Jan Marinissen |
Automatic Generation of In-Circuit Tests for Board Assembly Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018, pp. 13-18, 2018, IEEE, 978-1-5386-5180-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Kun-Han Tsai |
X-Sources Analysis for Improving the Test Quality. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018, pp. 121-126, 2018, IEEE, 978-1-5386-5180-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Venkat Yellapragada, Suresh Raman, Banadappa Shivaray, Luc Romain, Benoit Nadeau-Dostie, Martin Keim, Jean-Francois Cote, Albert Au, Giri Podichetty, Ashok Anbalan |
Implementing Design-for-Test Within a Tile-Based Design Methodology - Challenges and Solutions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018, pp. 43-48, 2018, IEEE, 978-1-5386-5180-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
1 | Yousuke Miyake, Yasuo Sato, Seiji Kajihara |
On the effects of real time and contiguous measurement with a digital temperature and voltage sensor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017, pp. 125-130, 2017, IEEE, 978-1-5386-3051-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
1 | Masayuki Kawabata, Koji Asami, Shohei Shibuya, Tomonori Yanagida, Haruo Kobayashi 0001 |
Low-distortion signal generation for analog/mixed-signal circuit testing with digital ATE. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017, pp. 2-7, 2017, IEEE, 978-1-5386-3051-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
1 | Mehmet Ince, Ender Yilmaz, Jae Woong Jeong, LeRoy Winemberg, Sule Ozev |
Evaluation of loop transfer function based dynamic testing of LDOs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017, pp. 14-19, 2017, IEEE, 978-1-5386-3051-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
1 | Hans G. Kerkhoff, Ghazanfar Ali, Hassan Ebrahimi, Ahmed Ibrahim 0001 |
An automotive MP-SoC featuring an advanced embedded instrument infrastructure for high dependability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017, pp. 65-70, 2017, IEEE, 978-1-5386-3051-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
1 | Matthew Beckler, R. D. Shawn Blanton |
GPU-accelerated fault dictionary generation for the TRAX fault model. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017, pp. 34-39, 2017, IEEE, 978-1-5386-3051-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
1 | Charles Chia-Hao Hsu, Charles H.-P. Wen |
Speeding up power verification by merging equivalent power domains in RTL design with UPF. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017, pp. 168-173, 2017, IEEE, 978-1-5386-3051-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
1 | Hideyuki Ichihara, Motoi Fukuda, Tsuyoshi Iwagaki, Tomoo Inoue |
State assignment for fault tolerant stochastic computing with linear finite state machines. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017, pp. 156-161, 2017, IEEE, 978-1-5386-3051-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
1 | Young-Woo Lee, Inhyuk Choi, Kang-Hoon Oh, James Jinsoo Ko, Sungho Kang |
Test item priority estimation for high parallel test efficiency under ATE debug time constraints. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017, pp. 150-154, 2017, IEEE, 978-1-5386-3051-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
1 | Tim Cheng |
Keynote I: Hardware security - Verification, test, and defense mechanisms. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017, pp. xii-xv, 2017, IEEE, 978-1-5386-3051-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
1 | Hao Chen 0053, Hung-Chih Lin, Min-Jer Wang |
Fan-out wafer level chip scale package testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017, pp. 84-89, 2017, IEEE, 978-1-5386-3051-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
1 | Yi-Ju Ke, Yi-Chieh Ghen, Jng-Jer Huang |
An integrated design environment of fault tolerant processors with flexible HW/SW solutions for versatile performance/cost/coverage tradeoffs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017, pp. 162-167, 2017, IEEE, 978-1-5386-3051-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
1 | Jais Abraham, Uttam Garg, Glenn Colón-Bonet, Ramesh Sharma, Chennian Di, Benoit Nadeau-Dostie, Etienne Racine, Martin Keim |
Adapting an industrial memory BIST solution for testing CAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017, pp. 112-117, 2017, IEEE, 978-1-5386-3051-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
1 | Yen-Long Lee, Soon-Jyh Chang |
A quick jitter tolerance estimation technique for bang-bang CDRs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017, pp. 8-13, 2017, IEEE, 978-1-5386-3051-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
1 | Abhishek Bhattacharya, Ramesh Tekumalla |
Test strategy for storage SOCs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017, pp. 96-99, 2017, IEEE, 978-1-5386-3051-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
1 | Shyue-Kung Lu, Hung-Kai Huang |
Adaptive block-based refresh techniques for mitigation of data retention faults and reduction of refresh power. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017, pp. 101-106, 2017, IEEE, 978-1-5386-3051-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
1 | |
International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017 ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![IEEE, 978-1-5386-3051-8 The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP BibTeX RDF |
|
1 | Andreina Zambrano, Hans G. Kerkhoff |
A dependable AMR sensor system for automotive applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017, pp. 59-64, 2017, IEEE, 978-1-5386-3051-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
1 | Yervant Zorian |
Tutorial I: Topic: Automotive test strategies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017, pp. ix-xi, 2017, IEEE, 978-1-5386-3051-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
1 | Erik Jan Marinissen, Ferenc Fodor, Bart De Wachter, Jorg Kiesewetter, Eric Hill, Ken Smith |
A fully automatic test system for characterizing large-array fine-pitch micro-bump probe cards. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017, pp. 144-149, 2017, IEEE, 978-1-5386-3051-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
1 | Tsung-Fu Hsieh, Jin-Fu Li 0001, Kuan-Te Wu, Jenn-Shiang Lai, Chih-Yen Lo, Ding-Ming Kwai, Yung-Fa Chou |
Software-hardware-cooperated built-in self-test scheme for channel-based DRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017, pp. 107-111, 2017, IEEE, 978-1-5386-3051-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
1 | Davide Appello, M. Laurino, Marco Pranzo |
A mathematical model to assess the influence of parallelism in a semiconductor back-end test floor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017, pp. 138-143, 2017, IEEE, 978-1-5386-3051-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
1 | Cheng-Wen Wu, Bing-Yang Lin, Hsin-Wei Hung, Shu-Mei Tseng, Chi Chen |
Symbiotic system models for efficient IGT system design and test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017, pp. 71-76, 2017, IEEE, 978-1-5386-3051-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
1 | Rajit Karmakar, Santanu Chattopadhyay, Rohit Kapur |
Enhancing security of logic encryption using embedded key generation unit. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017, pp. 131-136, 2017, IEEE, 978-1-5386-3051-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
1 | Daniel Tille, Benedikt Gottinger, Ulrike Pfannkuchen |
A lightweight X-masking scheme for IoT designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017, pp. 77-82, 2017, IEEE, 978-1-5386-3051-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
1 | Michael A. Kochte, Rafal Baranowski, Hans-Joachim Wunderlich |
Trustworthy reconfigurable access to on-chip infrastructure. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017, pp. 119-124, 2017, IEEE, 978-1-5386-3051-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
1 | Chih-Hao Wang, Tong-Yu Hsieh |
A hybrid concurrent error detection scheme for simultaneous improvement on probability of detection and diagnosability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017, pp. 52-57, 2017, IEEE, 978-1-5386-3051-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
1 | Tang-Jung Chiu, Yu-Lun Tseng, Yen-Cheng Lin, Yi-Chen Wang, Hung-Chih Lin, Min-Jer Wang |
Testing-for-manufacturing (TFM) for ultra-thin IPD on InFO. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017, pp. 90-95, 2017, IEEE, 978-1-5386-3051-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
1 | Shuo-Lian Hong, Kuen-Jong Lee |
A run-pause-resume silicon debug technique for multiple clock domain systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017, pp. 46-51, 2017, IEEE, 978-1-5386-3051-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
1 | Cheng-Hung Wu, Kuen-Jong Lee, Sudhakar M. Reddy |
Test generation for open and delay faults in CMOS circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017, pp. 21-26, 2017, IEEE, 978-1-5386-3051-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
1 | Po-Yao Chuang, Cheng-Wen Wu, Harry H. Chen |
Cell-aware test generation time reduction by using switch-level ATPG. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017, pp. 27-32, 2017, IEEE, 978-1-5386-3051-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
1 | Po-Hao Chen, Chi-Lin Lee, Jing-Yu Chen, Po-Wei Chen, James Chien-Mo Li |
Physical-aware diagnosis of multiple interconnect defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017, pp. 40-45, 2017, IEEE, 978-1-5386-3051-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
Displaying result #101 - #186 of 186 (100 per page; Change: ) Pages: [ <<][ 1][ 2] |
|