Search results for "NBTI"

Hits ?▲	Authors	Title	Venue	Year	Link
18	Arthur Ceratti, Thiago Copetti, Letícia Maria Bolzani Poehls, Fabian Vargas 0001	On-chip aging sensor to monitor NBTI effect in nano-scale SRAM.	DDECS	2012	DBLP DOI BibTeX RDF
18	Reef Eilers, Malte Metzdorf, Sven Rosinger, Domenik Helms, Wolfgang Nebel	Phase Space Based NBTI Model.	PATMOS	2012	DBLP DOI BibTeX RDF
18	Hossein Karimiyan Alidash, Andrea Calimera, Alberto Macii, Enrico Macii, Massimo Poncino	On-Chip NBTI and PBTI Tracking through an All-Digital Aging Monitor Architecture.	PATMOS	2012	DBLP DOI BibTeX RDF
18	Farshad Firouzi, Saman Kiamehr, Mehdi Baradaran Tahoori	NBTI mitigation by optimized NOP assignment and insertion.	DATE	2012	DBLP DOI BibTeX RDF
18	Zhengliang Lv, Linda Milor, Shiyuan Yang	Impact of NBTI on analog components.	ETS	2012	DBLP DOI BibTeX RDF
18	Fabian Oboril, Farshad Firouzi, Saman Kiamehr, Mehdi Baradaran Tahoori	Reducing NBTI-induced processor wearout by exploiting the timing slack of instructions.	CODES+ISSS	2012	DBLP DOI BibTeX RDF
18	Yao Wang 0002, Sorin Dan Cotofana, Liang Fang	Statistical reliability analysis of NBTI impact on FinFET SRAMs and mitigation technique using independent-gate devices.	NANOARCH	2012	DBLP DOI BibTeX RDF
18	Saurabh Kothawade, Dean Michael Ancajas, Koushik Chakraborty, Sanghamitra Roy	Mitigating NBTI in the physical register file through stress prediction.	ICCD	2012	DBLP DOI BibTeX RDF
18	Wen-Pin Tu, Shih-Wei Wu, Shih-Hsu Huang, Mely Chen Chi	NBTI-aware dual threshold voltage assignment for leakage power reduction.	ISCAS	2012	DBLP DOI BibTeX RDF
18	Tony T. Kim, Pong-Fei Lu, Chris H. Kim	Design of ring oscillator structures for measuring isolated NBTI and PBTI.	ISCAS	2012	DBLP DOI BibTeX RDF
18	Jackson Pachito, Celestino V. Martins, Jorge Semião, Marcelino Bicho Dos Santos, Isabel C. Teixeira, João Paulo Teixeira 0001	The influence of clock-gating on NBTI-induced delay degradation.	IOLTS	2012	DBLP DOI BibTeX RDF
18	Davide Zoni, William Fornaciari	A sensor-less NBTI mitigation methodology for NoC architectures.	SoCC	2012	DBLP DOI BibTeX RDF
18	Yuichiro Mitani, Shigeto Fukatsu, Daisuke Hagishima, Kazuya Matsuzawa	Lifetime prediction of channel hot carrier degradation in pMOSFETs separating NBTI component.	ICICDT	2012	DBLP DOI BibTeX RDF
18	Arthur Ceratti, Thiago Copetti, Letícia Maria Veiras Bolzani, Fabian Vargas 0001	Investigating the use of an on-chip sensor to monitor NBTI effect in SRAM.	LATW	2012	DBLP DOI BibTeX RDF
18	Wei Liu 0016, Sandeep Miryala, Valerio Tenace, Andrea Calimera, Enrico Macii, Massimo Poncino	NBTI effects on tree-like clock distribution networks.	ACM Great Lakes Symposium on VLSI	2012	DBLP DOI BibTeX RDF
18	Simone Corbetta, William Fornaciari	NBTI mitigation in microprocessor designs.	ACM Great Lakes Symposium on VLSI	2012	DBLP DOI BibTeX RDF
18	Bhavitavya Bhadviya, Ayan Mandal, Sunil P. Khatri	Alleviating NBTI-induced failure in off-chip output drivers.	ACM Great Lakes Symposium on VLSI	2012	DBLP DOI BibTeX RDF
18	Saman Kiamehr, Farshad Firouzi, Mehdi Baradaran Tahoori	Input and transistor reordering for NBTI and HCI reduction in complex CMOS gates.	ACM Great Lakes Symposium on VLSI	2012	DBLP DOI BibTeX RDF
18	Takashi Sato, Hiromitsu Awano, Hirofttmi Shimizu, Hiroshi Tsutsui, Hiroyuki Ochi	Statistical observations of NBTI-induced threshold voltage shifts on small channel-area devices.	ISQED	2012	DBLP DOI BibTeX RDF
18	Yuji Kunitake, Toshinori Sato, Hiroto Yasuura, Takanori Hayashida	Guidelines for mitigating NBTI degradation in on-chip memories.	ISCIT	2012	DBLP DOI BibTeX RDF
18	Zhao Chuan Lee, Kim Ming Ho, Zhi-Hui Kong, Tony T. Kim	NBTI/PBTI-aware wordline voltage control with no boosted supply for stability improvement of half-selected SRAM cells.	ISOCC	2012	DBLP DOI BibTeX RDF
18	Syed Askari, Mehrdad Nourani, Mini Rawat	An on-chip NBTI monitor for estimating analog circuit degradation.	VTS	2012	DBLP DOI BibTeX RDF
18	Ming-Chien Tsai, Yi-Wei Lin, Hao-I Yang, Ming-Hsien Tu, Wei-Chiang Shih, Nan-Chun Lien, Kuen-Di Lee, Shyh-Jye Jou, Ching-Te Chuang, Wei Hwang	Embedded SRAM ring oscillator for in-situ measurement of NBTI and PBTI degradation in CMOS 6T SRAM array.	VLSI-DAT	2012	DBLP DOI BibTeX RDF
18	Jayanand Asok Kumar, Kenneth M. Butler, Heesoo Kim, Shobha Vasudevan	Early prediction of NBTI effects using RTL source code analysis.	DAC	2012	DBLP DOI BibTeX RDF
18	Hao-I Yang, Wei Hwang, Ching-Te Chuang	Impacts of NBTI/PBTI and Contact Resistance on Power-Gated SRAM With High-kappa Metal-Gate Devices.	IEEE Trans. Very Large Scale Integr. Syst.	2011	DBLP DOI BibTeX RDF
18	Yuji Kunitake, Toshinori Sato, Hiroto Yasuura	Short Term Cell-Flipping Technique for Mitigating SNM Degradation Due to NBTI.	IEICE Trans. Electron.	2011	DBLP DOI BibTeX RDF
18	Hiroaki Konoura, Yukio Mitsuyama, Masanori Hashimoto, Takao Onoye	Stress Probability Computation for Estimating NBTI-Induced Delay Degradation.	IEICE Trans. Fundam. Electron. Commun. Comput. Sci.	2011	DBLP DOI BibTeX RDF
18	Masaoud Houshmand Kaffashian, Reza Lotfi, Khalil Mafinezhad, Hamid Mahmoodi	Impact of NBTI on performance of domino logic circuits in nano-scale CMOS.	Microelectron. J.	2011	DBLP DOI BibTeX RDF
18	R. S. Oliveira, Jorge Semião, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira 0001	On-Line BIST for Performance Failure Prediction Under NBTI-Induced Aging in Safety-Critical Applications.	J. Low Power Electron.	2011	DBLP DOI BibTeX RDF
18	Ru Huang, Runsheng Wang, Changze Liu, Liangliang Zhang, Jing Zhuge, Yu Tao, Jinbin Zou, Yuchao Liu, Yangyuan Wang	HCI and NBTI induced degradation in gate-all-around silicon nanowire transistors.	Microelectron. Reliab.	2011	DBLP DOI BibTeX RDF
18	Jiann-Shiun Yuan, Wen-Kuan Yeh, Shuyu Chen, Chia-Wei Hsu	NBTI reliability on high-k metal-gate SiGe transistor and circuit performances.	Microelectron. Reliab.	2011	DBLP DOI BibTeX RDF
18	Ivica Manic, Danijel Dankovic, Aneta Prijic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Zoran Prijic, Ninoslav Stojadinovic	NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions.	Microelectron. Reliab.	2011	DBLP DOI BibTeX RDF
18	Hao-I Yang, Shyh-Chyi Yang, Wei Hwang, Ching-Te Chuang	Impacts of NBTI/PBTI on Timing Control Circuits and Degradation Tolerant Design in Nanoscale CMOS SRAM.	IEEE Trans. Circuits Syst. I Regul. Pap.	2011	DBLP DOI BibTeX RDF
18	Prashant Singh, Eric Karl, Dennis Sylvester, David T. Blaauw	Dynamic NBTI Management Using a 45 nm Multi-Degradation Sensor.	IEEE Trans. Circuits Syst. I Regul. Pap.	2011	DBLP DOI BibTeX RDF
18	Hassan Mostafa, Mohab Anis, Mohamed I. Elmasry	Adaptive Body Bias for Reducing the Impacts of NBTI and Process Variations on 6T SRAM Cells.	IEEE Trans. Circuits Syst. I Regul. Pap.	2011	DBLP DOI BibTeX RDF
18	Masaoud Houshmand Kaffashian, Reza Lotfi, Khalil Mafinezhad, Hamid Mahmoodi	An optimization method for NBTI-aware design of domino logic circuits in nano-scale CMOS.	IEICE Electron. Express	2011	DBLP DOI BibTeX RDF
18	Toshihiro Kameda, Hiroaki Konoura, Yukio Mitsuyama, Masanori Hashimoto, Takao Onoye	NBTI Mitigation by Giving Random Scan-in Vectors during Standby Mode.	PATMOS	2011	DBLP DOI BibTeX RDF
18	Seyab Khan, Said Hamdioui	ReverseAge: An online NBTI combating technique using time borrowing.	IDT	2011	DBLP DOI BibTeX RDF
18	Asen Asenov, Andrew R. Brown, Binjie Cheng	Statistical aspects of NBTI/PBTI and impact on SRAM yield.	DATE	2011	DBLP DOI BibTeX RDF
18	Tuck-Boon Chan, John Sartori, Puneet Gupta 0001, Rakesh Kumar 0002	On the efficacy of NBTI mitigation techniques.	DATE	2011	DBLP DOI BibTeX RDF
18	Andrea Calimera, Mirko Loghi, Enrico Macii, Massimo Poncino	Partitioned cache architectures for reduced NBTI-induced aging.	DATE	2011	DBLP DOI BibTeX RDF
18	Yongho Lee, Taewhan Kim	A fine-grained technique of NBTI-aware voltage scaling and body biasing for standard cell based designs.	ASP-DAC	2011	DBLP DOI BibTeX RDF
18	Ming-Chao Lee, Yu-Guang Chen, Ding-Kei Huang, Shih-Chieh Chang	NBTI-aware power gating design.	ASP-DAC	2011	DBLP DOI BibTeX RDF
18	Ashutosh Chakraborty, David Z. Pan	Controlling NBTI degradation during static burn-in testing.	ASP-DAC	2011	DBLP DOI BibTeX RDF
18	Jyothi Bhaskarr Velamala, Venkatesa Ravi, Yu Cao 0001	Failure diagnosis of asymmetric aging under NBTI.	ICCAD	2011	DBLP DOI BibTeX RDF
18	Yao Wang 0002, Sorin Cotofana, Liang Fang	A unified aging model of NBTI and HCI degradation towards lifetime reliability management for nanoscale MOSFET circuits.	NANOARCH	2011	DBLP DOI BibTeX RDF
18	Saman Kiamehr, Abdulazim Amouri, Mehdi Baradaran Tahoori	Investigation of NBTI and PBTI induced aging in different LUT implementations.	FPT	2011	DBLP DOI BibTeX RDF
18	Kai-Chiang Wu, Diana Marculescu, Ming-Chao Lee, Shih-Chieh Chang	Analysis and mitigation of NBTI-induced performance degradation for power-gated circuits.	ISLPED	2011	DBLP BibTeX RDF
18	Chin-Hung Lin, Ing-Chao Lin, Kuan-Hui Li	TG-based technique for NBTI degradation and leakage optimization.	ISLPED	2011	DBLP BibTeX RDF
18	Seyab Khan, Said Hamdioui	Modeling and mitigating NBTI in nanoscale circuits.	IOLTS	2011	DBLP DOI BibTeX RDF
18	Cesare Ferri, Dimitra Papagiannopoulou, R. Iris Bahar, Andrea Calimera	NBTI-aware data allocation strategies for scratchpad memory based embedded systems.	LATW	2011	DBLP DOI BibTeX RDF
18	Shi-Qun Zheng, Ing-Chao Lin, Yen-Han Lee	Analyzing throughput of power and thermal-constraint multicore processor under NBTI effect.	ACM Great Lakes Symposium on VLSI	2011	DBLP DOI BibTeX RDF
18	Farshad Firouzi, Saman Kiamehr, Mehdi Baradaran Tahoori	A linear programming approach for minimum NBTI vector selection.	ACM Great Lakes Symposium on VLSI	2011	DBLP DOI BibTeX RDF
18	Seyab Khan, Nor Zaidi Haron, Said Hamdioui, Francky Catthoor	NBTI Monitoring and Design for Reliability in Nanoscale Circuits.	DFT	2011	DBLP DOI BibTeX RDF
18	Saurabh Kothawade, Koushik Chakraborty, Sanghamitra Roy	Analysis and mitigation of NBTI aging in register file: An end-to-end approach.	ISQED	2011	DBLP DOI BibTeX RDF
18	Taniya Siddiqua, Sudhanva Gurumurthi, Mircea R. Stan	Modeling and analyzing NBTI in the presence of Process Variation.	ISQED	2011	DBLP DOI BibTeX RDF
18	Hong Luo, Xiaoming Chen 0003, Jyothi Velamala, Yu Wang 0002, Yu Cao 0001, Vikas Chandra, Yuchun Ma, Huazhong Yang	Circuit-level delay modeling considering both TDDB and NBTI.	ISQED	2011	DBLP DOI BibTeX RDF
18	Masahiro Fukui, Yoriaki Nagata, Shuji Tsukiyama	A power grid optimization algorithm considering timing degradation by NBTI.	ISOCC	2011	DBLP DOI BibTeX RDF
18	Teruki Nakasato, Toru Nakura, Kunihiro Asada	Stress-balance Flip-Flops for NBTI tolerant circuit based on Fine-Grain Redundancy.	ISOCC	2011	DBLP DOI BibTeX RDF
18	Tony Tae-Hyoung Kim, Zhi-Hui Kong	Impacts of NBTI/PBTI on SRAM VMIN and design techniques for SRAM VMIN improvement.	ISOCC	2011	DBLP DOI BibTeX RDF
18	Wenping Wang, Shengqi Yang, Sarvesh Bhardwaj, Sarma B. K. Vrudhula, Frank Liu 0001, Yu Cao 0001	The Impact of NBTI Effect on Combinational Circuit: Modeling, Simulation, and Analysis.	IEEE Trans. Very Large Scale Integr. Syst.	2010	DBLP DOI BibTeX RDF
18	John Keane 0001, Tony Tae-Hyoung Kim, Chris H. Kim	An On-Chip NBTI Sensor for Measuring pMOS Threshold Voltage Degradation.	IEEE Trans. Very Large Scale Integr. Syst.	2010	DBLP DOI BibTeX RDF
18	Yiran Chen 0001, Hai Li 0001, Cheng-Kok Koh, Guangyu Sun 0003, Jing Li 0073, Yuan Xie 0001, Kaushik Roy 0001	Variable-Latency Adder (VL-Adder) Designs for Low Power and NBTI Tolerance.	IEEE Trans. Very Large Scale Integr. Syst.	2010	DBLP DOI BibTeX RDF
18	Elie Maricau, Georges G. E. Gielen	Efficient Variability-Aware NBTI and Hot Carrier Circuit Reliability Analysis.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2010	DBLP DOI BibTeX RDF
18	Andrea Calimera, Enrico Macii, Massimo Poncino	NBTI-Aware Clustered Power Gating.	ACM Trans. Design Autom. Electr. Syst.	2010	DBLP DOI BibTeX RDF
18	Paulo F. Butzen, Vinícius Dal Bem, André Inácio Reis, Renato P. Ribas	Transistor network restructuring against NBTI degradation.	Microelectron. Reliab.	2010	DBLP DOI BibTeX RDF
18	Sharifah Wan Muhamad Hatta, Norhayati Soin, D. Abd Hadi, Jianfu Zhang 0001	NBTI degradation effect on advanced-process 45 nm high-k PMOSFETs with geometric and process variations.	Microelectron. Reliab.	2010	DBLP DOI BibTeX RDF
18	Dong Wook Kim, Woo Sang Park, Jong Tae Park 0003	The optimum fin width in p-MuGFETs with the consideration of NBTI and hot carrier degradation.	Microelectron. Reliab.	2010	DBLP DOI BibTeX RDF
18	Jin-Young Kim, Jun-Seok Oh, Won-Ju Cho, Jong Tae Park 0003	NBTI and hot carrier effect of Schottky-barrier p-MOSFETs.	Microelectron. Reliab.	2010	DBLP DOI BibTeX RDF
18	Taniya Siddiqua, Sudhanva Gurumurthi	Recovery Boosting: A Technique to Enhance NBTI Recovery in SRAM Arrays.	ISVLSI	2010	DBLP DOI BibTeX RDF
18	Seyab, Said Hamdioui	NBTI modeling in the framework of temperature variation.	DATE	2010	DBLP DOI BibTeX RDF
18	Lin Li, Youtao Zhang, Jun Yang 0002, Jianhua Zhao	Proactive NBTI mitigation for busy functional units in out-of-order microprocessors.	DATE	2010	DBLP DOI BibTeX RDF
18	Andrew J. Ricketts, Jawar Singh, Krishnan Ramakrishnan, Narayanan Vijaykrishnan, Dhiraj K. Pradhan	Investigating the impact of NBTI on different power saving cache strategies.	DATE	2010	DBLP DOI BibTeX RDF
18	Mitsumasa Noda, Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen, Yukiya Miura	On estimation of NBTI-Induced delay degradation.	ETS	2010	DBLP DOI BibTeX RDF
18	Jin Sun 0006, Roman L. Lysecky, Karthik Shankar, Avinash Karanth Kodi, Ahmed Louri, Janet Meiling Wang	Workload capacity considering NBTI degradation in multi-core systems.	ASP-DAC	2010	DBLP DOI BibTeX RDF
18	Prashant Singh, Eric Karl, Dennis Sylvester, David T. Blaauw	Dynamic NBTI management using a 45nm multi-degradation sensor.	CICC	2010	DBLP DOI BibTeX RDF
18	Michitarou Yabuuchi, Kazutoshi Kobayashi	Evaluation of FPGA design guardband caused by inhomogeneous NBTI degradation considering process variations.	FPT	2010	DBLP DOI BibTeX RDF
18	Tong Boon Tang, Alan F. Murray, Binjie Cheng, Asen Asenov	Statistical NBTI-effect prediction for ULSI circuits.	ISCAS	2010	DBLP DOI BibTeX RDF
18	Andrea Calimera, Enrico Macii, Massimo Poncino	Analysis of NBTI-induced SNM degradation in power-gated SRAM cells.	ISCAS	2010	DBLP DOI BibTeX RDF
18	Georgios Karakonstantis, Charles Augustine, Kaushik Roy 0001	A self-consistent model to estimate NBTI degradation and a comprehensive on-line system lifetime enhancement technique.	IOLTS	2010	DBLP DOI BibTeX RDF
18	Seyab Khan, Said Hamdioui	Temperature dependence of NBTI induced delay.	IOLTS	2010	DBLP DOI BibTeX RDF
18	Sangwoo Han, Juho Kim	NBTI-aware statistical timing analysis framework.	SoCC	2010	DBLP DOI BibTeX RDF
18	Yuriy Shiyanovskii, Francis G. Wolff, Aravind Rajendran, Christos A. Papachristou, Daniel J. Weyer, W. Clay	Process reliability based trojans through NBTI and HCI effects.	AHS	2010	DBLP DOI BibTeX RDF
18	Hamed Abrishami, Safar Hatami, Massoud Pedram	Multi-corner, energy-delay optimized, NBTI-aware flip-flop design.	ISQED	2010	DBLP DOI BibTeX RDF
18	Yuji Kunitake, Toshinori Sato, Hiroto Yasuura	Signal probability control for relieving NBTI in SRAM cells.	ISQED	2010	DBLP DOI BibTeX RDF
18	Hiroaki Konoura, Yukio Mitsuyama, Masanori Hashimoto, Takao Onoye	Comparative study on delay degrading estimation due to NBTI with circuit/instance/transistor-level stress probability consideration.	ISQED	2010	DBLP DOI BibTeX RDF
18	Abhishek A. Sinkar, Nam Sung Kim	Analyzing and minimizing effects of temperature variation and NBTI on active leakage power of power-gated circuits.	ISQED	2010	DBLP DOI BibTeX RDF
18	Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine	Detecting NBTI induced failures in SRAM core-cells.	VTS	2010	DBLP DOI BibTeX RDF
18	Fahad Ahmed, Linda Milor	Reliable cache design with on-chip monitoring of NBTI degradation in SRAM cells using BIST.	VTS	2010	DBLP DOI BibTeX RDF
18	Hong Luo, Yu Wang 0002, Rong Luo, Huazhong Yang, Yuan Xie 0001	Temperature-Aware NBTI Modeling Techniques in Digital Circuits.	IEICE Trans. Electron.	2009	DBLP DOI BibTeX RDF
18	Anastasios A. Katsetos, Andrew C. Brendler	NBTI model development with regression analysis.	Microelectron. Reliab.	2009	DBLP DOI BibTeX RDF
18	Yong Woo Jeon, Dae Hyun Ka, Chong-Gun Yu, Won-Ju Cho, M. Saif Islam, Jong Tae Park 0003	NBTI and hot carrier effect of SOI p-MOSFETs fabricated in strained Si SOI wafer.	Microelectron. Reliab.	2009	DBLP DOI BibTeX RDF
18	Nozomu Kawai, Yasuhiro Dohi, Nobuyuki Wakai	Study for pulse stress NBTI characteristics degradation stress.	Microelectron. Reliab.	2009	DBLP DOI BibTeX RDF
18	Chi-Woo Lee, Isabelle Ferain, Aryan Afzalian, Ran Yan, Nima Dehdashti, Pedram Razavi, Jean-Pierre Colinge, Jong Tae Park 0003	NBTI and hot-carrier effects in accumulation-mode Pi-gate pMOSFETs.	Microelectron. Reliab.	2009	DBLP DOI BibTeX RDF
18	R. Fernández-García, Ben Kaczer, Guido Groeseneken	A CMOS circuit for evaluating the NBTI over a wide frequency range.	Microelectron. Reliab.	2009	DBLP DOI BibTeX RDF
18	Aditya Bansal, Rahul M. Rao, Jae-Joon Kim, Sufi Zafar, James H. Stathis, Ching-Te Chuang	Impacts of NBTI and PBTI on SRAM static/dynamic noise margins and cell failure probability.	Microelectron. Reliab.	2009	DBLP DOI BibTeX RDF
18	David R. Bild, Gregory E. Bok, Robert P. Dick	Minimization of NBTI performance degradation using internal node control.	DATE	2009	DBLP DOI BibTeX RDF
18	Ashutosh Chakraborty, Gokul Ganesan, Anand Rajaram, David Z. Pan	Analysis and optimization of NBTI induced clock skew in gated clock trees.	DATE	2009	DBLP DOI BibTeX RDF
18	Kai-Chiang Wu, Diana Marculescu	Joint logic restructuring and pin reordering against NBTI-induced performance degradation.	DATE	2009	DBLP DOI BibTeX RDF
18	Stefan Drapatz, Thomas Fischer, Karl Hofmann, Ettore Amirante, Peter Huber, Martin Ostermayr, Georg Georgakos, Doris Schmitt-Landsiedel	Fast stability analysis of large-scale SRAM arrays and the impact of NBTI degradation.	ESSCIRC	2009	DBLP DOI BibTeX RDF