Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
15 | Michel Renovell, Florence Azaïs, Yves Bertrand |
Optimized Implementations of the Multi-Configuration DFT Technique for Analog Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 1998 Design, Automation and Test in Europe (DATE '98), February 23-26, 1998, Le Palais des Congrès de Paris, Paris, France, pp. 815-821, 1998, IEEE Computer Society, 0-8186-8359-7. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
VLSI, Test, Analog Circuit, Mixed Signal Circuit |
15 | Mehrdad Nourani, Christos A. Papachristou |
A Bypass Scheme for Core-Based System Fault Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 1998 Design, Automation and Test in Europe (DATE '98), February 23-26, 1998, Le Palais des Congrès de Paris, Paris, France, pp. 979-980, 1998, IEEE Computer Society, 0-8186-8359-7. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
15 | Eduardo J. Peralías, Adoración Rueda, Juan A. Prieto, José L. Huertas |
DfT and on-line test of high-performance data converters: a practical case. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998, pp. 534-540, 1998, IEEE Computer Society, 0-7803-5093-6. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
15 | Alaaeldin A. Amin, Mohamed Y. Osman, Radwan E. Abdel-Aal, Husni Al-Muhtaseb |
New fault models and efficient BIST algorithms for dual-port memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 16(9), pp. 987-1000, 1997. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
|
15 | Joel A. Jorgenson, Russell J. Wagner |
Design-For-Test in a Multiple Substrate Multichip Module. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 10(1-2), pp. 97-107, 1997. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
Multichip Module (MCM) Test, Known-Good Die (KGD), Ball Grid Array (BGA), Built-In-Self-Test (BIST), boundary-scan |
15 | Mehrdad Nourani, Christos A. Papachristou |
Structural BIST insertion using behavioral test analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ED&TC ![In: European Design and Test Conference, ED&TC '97, Paris, France, 17-20 March 1997, pp. 64-68, 1997, IEEE Computer Society, 0-8186-7786-4. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
|
15 | Giacomo Buonanno, Fabrizio Ferrandi, L. Ferrandi, Franco Fummi, Donatella Sciuto |
How an "Evolving" Fault Model Improves the Behavioral Test Generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Great Lakes Symposium on VLSI ![In: 7th Great Lakes Symposium on VLSI (GLS-VLSI '97), 13-15 March 1997, Urbana, IL, USA, pp. 124-, 1997, IEEE Computer Society, 0-8186-7904-2. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
|
15 | Suman Kanjilal, Srimat T. Chakradhar, Vishwani D. Agrawal |
A partition and resynthesis approach to testable design of large circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14(10), pp. 1268-1276, 1995. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
|
15 | Niraj K. Jha, Abha Ahuja |
Easily testable nonrestoring and restoring gate-level cellular array dividers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 12(1), pp. 114-123, 1993. The full citation details ...](Pics/full.jpeg) |
1993 |
DBLP DOI BibTeX RDF |
|
15 | Srinivas Devadas, Kurt Keutzer, Sharad Malik |
A synthesis-based test generation and compaction algorithm for multifaults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 4(1), pp. 91-104, 1993. The full citation details ...](Pics/full.jpeg) |
1993 |
DBLP DOI BibTeX RDF |
Iogic synthesis, test generation, multiple fault, test compaction |
15 | Gary D. Hachtel, Reily M. Jacoby, Kurt Keutzer, Christopher R. Morrison |
On properties of algebraic transformations and the synthesis of multifault-irredundant circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(3), pp. 313-321, 1992. The full citation details ...](Pics/full.jpeg) |
1992 |
DBLP DOI BibTeX RDF |
|
15 | Srinivas Devadas, Kurt Keutzer |
Synthesis of robust delay-fault-testable circuits: practice. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(3), pp. 277-300, 1992. The full citation details ...](Pics/full.jpeg) |
1992 |
DBLP DOI BibTeX RDF |
|
15 | D. M. Marcynuk, D. Michael Miller |
The OR-k method for on-line checking of programmable logic arrays. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 3(1), pp. 53-65, 1992. The full citation details ...](Pics/full.jpeg) |
1992 |
DBLP DOI BibTeX RDF |
fault secure design, on-line checking, concurrency, programmable logic array |
15 | Srinivas Devadas, Hi-Keung Tony Ma |
Easily testable PLA-based finite state machines. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 9(6), pp. 604-611, 1990. The full citation details ...](Pics/full.jpeg) |
1990 |
DBLP DOI BibTeX RDF |
|
15 | Debashis Bhattacharya, John P. Hayes |
Designing for high-level test generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 9(7), pp. 752-766, 1990. The full citation details ...](Pics/full.jpeg) |
1990 |
DBLP DOI BibTeX RDF |
|
15 | R. P. van Riessen, Hans G. Kerkhoff, A. Kloppenburg |
Designing and Implementing an Architecture with Boundary Scan. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 7(1), pp. 9-19, 1990. The full citation details ...](Pics/full.jpeg) |
1990 |
DBLP DOI BibTeX RDF |
|
15 | Srinivas Devadas, Hi-Keung Tony Ma, A. Richard Newton, Alberto L. Sangiovanni-Vincentelli |
A synthesis and optimization procedure for fully and easily testable sequential machines. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 8(10), pp. 1100-1107, 1989. The full citation details ...](Pics/full.jpeg) |
1989 |
DBLP DOI BibTeX RDF |
|
15 | Chantal Robach, Daniel Lutoff, Nouar Garcia |
Knowledge-based functional specification of test and maintenance programs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 8(11), pp. 1145-1156, 1989. The full citation details ...](Pics/full.jpeg) |
1989 |
DBLP DOI BibTeX RDF |
|
15 | Yashwant K. Malaiya |
On inherent untestability of unaugmented microprogrammed control. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MICRO ![In: Proceedings of the 22nd Annual Workshop and Symposium on Microprogramming and Microarchitecture, 1989, Dublin, Ireland, August 14-16, 1989, pp. 88-96, 1989, ACM/IEEE, 0-89791-324-8. The full citation details ...](Pics/full.jpeg) |
1989 |
DBLP DOI BibTeX RDF |
|
15 | Sam M. Kim, Robert McNaughton, Robert McCloskey |
An Upper Bound on the Order of Locally Testable Deterministic Finite Automata. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Optimal Algorithms ![In: Optimal Algorithms, International Symposium, Varna, Bulgaria, May 29 - June 2, 1989, Proceedings, pp. 48-65, 1989, Springer, 3-540-51859-2. The full citation details ...](Pics/full.jpeg) |
1989 |
DBLP DOI BibTeX RDF |
|
15 | Pinaki Mazumder, Janak H. Patel, W. Kent Fuchs |
Design and Algorithms for Parallel Testing of Random Access and Content Addressable Memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 24th ACM/IEEE Design Automation Conference. Miami Beach, FL, USA, June 28 - July 1, 1987., pp. 689-694, 1987, IEEE Computer Society Press / ACM. The full citation details ...](Pics/full.jpeg) |
1987 |
DBLP DOI BibTeX RDF |
|
15 | Melvin A. Breuer, Xi-an Zhu |
A knowledge based system for selecting a test methodology for a PLA. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 22nd ACM/IEEE conference on Design automation, DAC 1985, Las Vegas, Nevada, USA, 1985., pp. 259-265, 1985, ACM, 0-8186-0635-5. The full citation details ...](Pics/full.jpeg) |
1985 |
DBLP DOI BibTeX RDF |
|
13 | Irith Pomeranz |
Testability Evaluation for Local Design Modifications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 32(1), pp. 195-199, January 2024. The full citation details ...](Pics/full.jpeg) |
2024 |
DBLP DOI BibTeX RDF |
|
13 | Tianming Ni, Xiaoqing Wen, Hussam Amrouch, Cheng Zhuo, Peilin Song |
Introduction to the Special Issue on Design for Testability and Reliability of Security-aware Hardware. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Design Autom. Electr. Syst. ![In: ACM Trans. Design Autom. Electr. Syst. 29(1), pp. 1:1-1:3, January 2024. The full citation details ...](Pics/full.jpeg) |
2024 |
DBLP DOI BibTeX RDF |
|
13 | Morteza Zakeri Nasrabadi, Saeed Parsa |
Natural Language Requirements Testability Measurement Based on Requirement Smells. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2403.17479, 2024. The full citation details ...](Pics/full.jpeg) |
2024 |
DBLP DOI BibTeX RDF |
|
13 | Soham Roy, Vishwani D. Agrawal |
An Amalgamated Testability Measure Derived from Machine Intelligence. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSID ![In: 37th International Conference on VLSI Design and 23rd International Conference on Embedded Systems, VLSID 2024, Kolkata, India, January 6-10, 2024, pp. 696-701, 2024, IEEE, 979-8-3503-8440-6. The full citation details ...](Pics/full.jpeg) |
2024 |
DBLP DOI BibTeX RDF |
|
13 | Masaya Muramatsu, Yasuhiro Noguchi, Satoru Kogure, Koichi Yamashita, Tatsuhiro Konishi, Yukihiro Itoh |
Classroom Practice with Learning Support System for Program Design Using Mock Technique Based on Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SN Comput. Sci. ![In: SN Comput. Sci. 4(5), pp. 624, September 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
13 | Lok-Won Kim, Quang Hieu Vo, Choong Seon Hong |
Runtime Testability on Autonomous System. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Reliab. ![In: IEEE Trans. Reliab. 72(1), pp. 274-288, March 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
13 | Tushar Sharma 0001, Stefanos Georgiou, Maria Kechagia, Taher A. Ghaleb, Federica Sarro |
Investigating developers' perception on software testability and its effects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Empir. Softw. Eng. ![In: Empir. Softw. Eng. 28(5), pp. 120, October 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
13 | Hyun-Jae Choi, Heung Seok Chae |
Development of Testability Prediction Models Considering Complexity Diversity for C Programs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 11, pp. 98469-98485, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
13 | Gleb Kalachev |
High-dimensional Expansion of Product Codes is Stronger than Robust and Agreement Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2308.02889, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
13 | Panna Tímea Fekete, Gábor Kun |
Easy testability for posets. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2302.11390, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
13 | Pavel Reich, Walid Maalej |
Testability Refactoring in Pull Requests: Patterns and Trends. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2303.14253, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
13 | Isolde Adler, Noleen Köhler, Pan Peng 0001 |
On Testability of First-Order Properties in Bounded-Degree Graphs and Connections to Proximity-Oblivious Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2304.03810, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
13 | Luca Guglielmo, Leonardo Mariani, Giovanni Denaro |
Measuring Software Testability via Automatically Generated Test Cases. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2307.16185, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
13 | Fei Su, Chunsheng Liu, Haralampos-G. Stratigopoulos |
Special Issue on Testability and Dependability of Artificial Intelligence Hardware. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test ![In: IEEE Des. Test 40(2), pp. 5-7, April 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
13 | Partha Pratim Pande |
Special Issue on Testability and Dependability of Artificial Intelligence Hardware. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test ![In: IEEE Des. Test 40(2), pp. 4, April 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
13 | Fei Su, Chunsheng Liu, Haralampos-G. Stratigopoulos |
Testability and Dependability of AI Hardware: Survey, Trends, Challenges, and Perspectives. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test ![In: IEEE Des. Test 40(2), pp. 8-58, April 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
13 | Eran Nevo |
Embedding Divisor and Semi-Prime Testability in f-Vectors of Polytopes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Discret. Comput. Geom. ![In: Discret. Comput. Geom. 70(1), pp. 297-303, July 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
13 | Saeed Parsa |
Software Testing Automation - Testability Evaluation, Refactoring, Test Data Generation and Fault Localization ![Search on Bibsonomy](Pics/bibsonomy.png) |
|
2023 |
DOI RDF |
|
13 | Jens Anders, Pablo Andreu, Bernd Becker 0001, Steffen Becker 0001, Riccardo Cantoro, Nikolaos Ioannis Deligiannis, Nourhan Elhamawy, Tobias Faller, Carles Hernández 0001, Nele Mentens, Mahnaz Namazi Rizi, Ilia Polian, Abolfazl Sajadi, Matthias Sauer 0002, Denis Schwachhofer, Matteo Sonza Reorda, Todor Stefanov, Ilya Tuzov, Stefan Wagner 0001, Nusa Zidaric |
A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: IEEE European Test Symposium, ETS 2023, Venezia, Italy, May 22-26, 2023, pp. 1-10, 2023, IEEE, 979-8-3503-3634-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
13 | Razieh Nabi, Rohit Bhattacharya |
On Testability and Goodness of Fit Tests in Missing Data Models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
UAI ![In: Uncertainty in Artificial Intelligence, UAI 2023, July 31 - 4 August 2023, Pittsburgh, PA, USA., pp. 1467-1477, 2023, PMLR. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP BibTeX RDF |
|
13 | Thomas Vidick |
Quantum Codes, Local Testability and Interactive Proofs: State of the Art and Open Questions (Invited Talk). ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICALP ![In: 50th International Colloquium on Automata, Languages, and Programming, ICALP 2023, July 10-14, 2023, Paderborn, Germany, pp. 4:1-4:1, 2023, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-278-5. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
13 | Dan Bruce, David Kelly, Héctor D. Menéndez 0001, Earl T. Barr, David Clark 0001 |
June: A Type Testability Transformation for Improved ATG Performance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSTA ![In: Proceedings of the 32nd ACM SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2023, Seattle, WA, USA, July 17-21, 2023, pp. 274-284, 2023, ACM. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
13 | Yudai Toyooka, Haruki Watanabe, Toshinori Hosokawa, Masayoshi Yoshimura |
An Evaluation of Estimated Field Random Testability for Data Paths at Register Transfer Level Using Status Signal Sequences Based on k-Consecutive State Transitions for Field Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
13 | Toshinori Hosokawa, Kyohei Iizuka, Masayoshi Yoshimura |
An Evaluation of a Testability Measure for State Assignment to Estimate Transition Fault Coverage for Controllers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
13 | Jin-Fu Li 0001 |
Testing of Computing-In Memories: Faults, Test Algorithms, and Design-for-Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
13 | Mingye Li, Yunkun Lin, Sandeep Gupta 0001 |
Design for testability (DFT) for RSFQ circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 41st IEEE VLSI Test Symposium, VTS 2023, San Diego, CA, USA, April 24-26, 2023, pp. 1-7, 2023, IEEE, 979-8-3503-4630-5. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
13 | Fei Su, Eric Zhang, Arjun Chaudhuri, Michael Paulitsch |
Innovation Practices Track: Testability and Dependability of AI Hardware and Autonomous Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 41st IEEE VLSI Test Symposium, VTS 2023, San Diego, CA, USA, April 24-26, 2023, pp. 1, 2023, IEEE, 979-8-3503-4630-5. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
13 | Pavel Reich, Walid Maalej |
Testability Refactoring in Pull Requests: Patterns and Trends. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSE ![In: 45th IEEE/ACM International Conference on Software Engineering, ICSE 2023, Melbourne, Australia, May 14-20, 2023, pp. 1508-1519, 2023, IEEE, 978-1-6654-5701-9. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
13 | Tapas Nandy, Ashish Joshi, Sanjoy Kumar Dey |
Large Network of Wide- Range Analog Voltage Observers for Debug & Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
APCCAS ![In: IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2023, Hyderabad, India, November 19-22, 2023, pp. 207-211, 2023, IEEE, 979-8-3503-8119-1. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
13 | Raghvinder S. Sangwan, Youakim Badr, Satish Mahadevan Srinivasan, Partha Mukherjee |
On the Testability of Artificial Intelligence and Machine Learning Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Computer ![In: Computer 55(3), pp. 101-105, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
13 | Hari Mohan Gaur, Ashutosh Kumar Singh 0001, Umesh Ghanekar |
An Efficient Design of Scalable Reversible Multiplier with Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Circuits Syst. Comput. ![In: J. Circuits Syst. Comput. 31(10), pp. 2250179:1-2250179:13, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
13 | Mamdouh Alenezi |
Investigating Software Testability and Test cases Effectiveness. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2201.10090, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP BibTeX RDF |
|
13 | Oren Becker, Alexander Lubotzky, Jonathan Mosheiff |
Testability in group theory. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2204.04539, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
13 | Louis Esperet, Sergey Norin |
Testability and local certification of monotone properties in minor-closed classes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2202.00543, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP BibTeX RDF |
|
13 | Fatemeh Sheikh Shoaei, Alireza Nahvy, Zainalabedin Navabi |
Testable Array Multipliers for a Better Utilization of C-Testability and Bijectivity. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2201.11978, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP BibTeX RDF |
|
13 | A. N. Trahtman |
A polynomial time algorithm for local testability and its level. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2205.05434, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
13 | Rohit Bhattacharya, Razieh Nabi |
On Testability of the Front-Door Model via Verma Constraints. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2203.00161, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
13 | Morteza Zakeri Nasrabadi, Saeed Parsa |
An ensemble meta-estimator to predict source code testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2208.09614, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
13 | Razieh Nabi, Rohit Bhattacharya |
On Testability and Goodness of Fit Tests in Missing Data Models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2203.00132, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
13 | Morteza Zakeri Nasrabadi, Saeed Parsa |
An ensemble meta-estimator to predict source code testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Appl. Soft Comput. ![In: Appl. Soft Comput. 129, pp. 109562, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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13 | M. I. Shiny, M. Nirmala Devi 0001 |
Trustworthy Scan Design and Testability Using Obfuscation and Logic Locking Scheme for Wireless Network Application. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Mob. Networks Appl. ![In: Mob. Networks Appl. 27(3), pp. 1000-1018, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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13 | Anthony Leverrier, Vivien Londe, Gilles Zémor |
Towards local testability for quantum coding. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Quantum ![In: Quantum 6, pp. 661, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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13 | Andrea Arcuri, Juan P. Galeotti |
Enhancing Search-based Testing with Testability Transformations for Existing APIs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Softw. Eng. Methodol. ![In: ACM Trans. Softw. Eng. Methodol. 31(1), pp. 1:1-1:34, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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13 | Feng Xie 0002, Yangbo He, Zhi Geng, Zhengming Chen, Ru Hou, Kun Zhang 0001 |
Testability of Instrumental Variables in Linear Non-Gaussian Acyclic Causal Models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Entropy ![In: Entropy 24(4), pp. 512, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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13 | Krishna Patel, Robert M. Hierons, David Clark 0001 |
An information theoretic notion of software testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Inf. Softw. Technol. ![In: Inf. Softw. Technol. 143, pp. 106759, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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13 | Omid Aramoon, Gang Qu 0001, Aijiao Cui |
Building Hardware Security Primitives Using Scan-based Design-for-Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MWSCAS ![In: 65th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2022, Fukuoka, Japan, August 7-10, 2022, pp. 1-6, 2022, IEEE, 978-1-6654-0279-8. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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13 | Amy Wilson, Fadi Wedyan, Safwan Omari |
An Empirical Evaluation and Comparison of the Impact of MVVM and MVC GUI Driven Application Architectures on Maintainability and Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IDSTA ![In: 3rd International Conference on Intelligent Data Science Technologies and Applications, IDSTA 2022, San Antonio, TX, USA, September 5-7, 2022, pp. 101-108, 2022, IEEE, 978-1-6654-9960-6. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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13 | Wei-Ming Ma, William S. Chao |
Architecture Oriented Design to Enhance the Testability of Smart Tourism City IoT System. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PACIS ![In: 26th Pacific Asia Conference on Information Systems, PACIS 2022, Virtual Event / Taipei, Taiwan / Sydney, Australia, July 5-9, 2022, pp. 350, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP BibTeX RDF |
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13 | Rohit Bhattacharya, Razieh Nabi |
On testability of the front-door model via Verma constraints. ![Search on Bibsonomy](Pics/bibsonomy.png) |
UAI ![In: Uncertainty in Artificial Intelligence, Proceedings of the Thirty-Eighth Conference on Uncertainty in Artificial Intelligence, UAI 2022, 1-5 August 2022, Eindhoven, The Netherlands., pp. 202-212, 2022, PMLR. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP BibTeX RDF |
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13 | Louis Esperet, Sergey Norin |
Testability and Local Certification of Monotone Properties in Minor-Closed Classes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICALP ![In: 49th International Colloquium on Automata, Languages, and Programming, ICALP 2022, July 4-8, 2022, Paris, France., pp. 58:1-58:15, 2022, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-235-8. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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13 | Feras Al Kassar, Giulia Clerici, Luca Compagna, Davide Balzarotti, Fabian Yamaguchi |
Testability Tarpits: the Impact of Code Patterns on the Security Testing of Web Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
NDSS ![In: 29th Annual Network and Distributed System Security Symposium, NDSS 2022, San Diego, California, USA, April 24-28, 2022, 2022, The Internet Society. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP BibTeX RDF |
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13 | Abram Detofsky |
Special Session: A Testability Practitioner's Guide to Chiplets. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022, pp. 1-2, 2022, IEEE, 978-1-6654-1060-1. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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13 | Sebastian Huhn 0001, Rolf Drechsler |
Next Generation Design For Testability, Debug and Reliability Using Formal Techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022, pp. 609-618, 2022, IEEE, 978-1-6654-6270-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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13 | Tali Kaufman, Izhar Oppenheim |
High Dimensional Expansion Implies Amplified Local Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
APPROX/RANDOM ![In: Approximation, Randomization, and Combinatorial Optimization. Algorithms and Techniques, APPROX/RANDOM 2022, September 19-21, 2022, University of Illinois, Urbana-Champaign, USA (Virtual Conference)., pp. 5:1-5:10, 2022, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-249-5. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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13 | Yixin Hu, Yigang Sun, Jiao Xue |
Exponential-Based Testability Index Allocation and Feasibility Analysis Method. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 9, pp. 66154-66162, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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13 | Xuezheng Zhu, Chaoshuai Han, Ruiqi Liu, Guohui Yan, Jin Gu |
One universal method of complex system reliability, maintainability, supportability, testability quotas design and trade-off based on improved flower pollination algorithm. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Qual. Reliab. Eng. Int. ![In: Qual. Reliab. Eng. Int. 37(4), pp. 1524-1543, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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13 | S. Rooban, Prasanna D. Lakshmi, Teja K. B. S. Durga, Kumar P. V. Mani |
Carry Select Adder Design with Testability using Reversible Gates. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Perform. Eng. ![In: Int. J. Perform. Eng. 17(6), pp. 536, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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13 | Hsin-Yu Chien, Chin-Yu Huang, Chih-Chiang Fang |
Applying Slicing-based Testability Transformation to Improve Test Data Generation with Symbolic Execution. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Perform. Eng. ![In: Int. J. Perform. Eng. 17(7), pp. 589, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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13 | Joyati Mondal, Arighna Deb, Debesh K. Das |
An Efficient Design for Testability Approach of Reversible Logic Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Circuits Syst. Comput. ![In: J. Circuits Syst. Comput. 30(6), pp. 2150094:1-2150094:31, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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13 | Mahshid Tebyanian, Azadeh Mokhtarpour, Alireza Shafieinejad |
SC-COTD: Hardware Trojan Detection Based on Sequential/Combinational Testability Features using Ensemble Classifier. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 37(4), pp. 473-487, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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13 | Dave Y.-W. Lin, Charles H.-P. Wen |
A Delay-Adjustable, Self-Testable Flip-Flop for Soft-Error Tolerability and Delay-Fault Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Design Autom. Electr. Syst. ![In: ACM Trans. Design Autom. Electr. Syst. 26(6), pp. 50:1-50:12, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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13 | A. N. Trahtman |
An algorithm to verify local threshold testability of deterministic finite automata. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2105.10654, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP BibTeX RDF |
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13 | Luca Guglielmo, Andrea Riboni, Giovanni Denaro |
Towards Evidence-based Testability Measurements. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2102.10877, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP BibTeX RDF |
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13 | Min Li 0019, Zhengyuan Shi, Zezhong Wang 0006, Weiwei Zhang, Yu Huang, Qiang Xu 0001 |
Testability-Aware Low Power Controller Design with Evolutionary Learning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2111.13332, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP BibTeX RDF |
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13 | Eran Nevo |
Embedding Divisor and Semi-Prime Testability in f-vectors of polytopes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2109.08220, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP BibTeX RDF |
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13 | A. N. Trahtman |
A package TESTAS for checking some kinds of testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2105.12583, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP BibTeX RDF |
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13 | A. N. Trahtman |
Verification Tools for Checking some kinds of Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2106.02312, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP BibTeX RDF |
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13 | Tali Kaufman, Izhar Oppenheim |
High dimensional expansion implies amplified local testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2107.10488, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP BibTeX RDF |
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13 | Tomás Masopust, Markus Krötzsch |
Partially Ordered Automata and Piecewise Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Log. Methods Comput. Sci. ![In: Log. Methods Comput. Sci. 17(2), 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP BibTeX RDF |
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13 | Katherine Harrison, Ahmet Börütecene, Jonas Löwgren, Desirée Enlund, Rasmus Ringdahl, Vangelis Angelakis |
Design of Reversible Arithmetic Logic Unit with Built-In Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Technol. Soc. Mag. ![In: IEEE Technol. Soc. Mag. 40(3), pp. 60-65, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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13 | Ramanuj Chouksey, Sachin Kumar Maddheshiya, Chandan Karfa |
VP_TT: A value propagation based equivalence checker for testability transformations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IET Softw. ![In: IET Softw. 15(1), pp. 147-159, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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13 | Isolde Adler, Noleen Köhler, Pan Peng 0001 |
On Testability of First-Order Properties in Bounded-Degree Graphs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SODA ![In: Proceedings of the 2021 ACM-SIAM Symposium on Discrete Algorithms, SODA 2021, Virtual Conference, January 10 - 13, 2021, pp. 1578-1597, 2021, SIAM, 978-1-61197-646-5. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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13 | Anthony Leverrier, Vivien Londe, Gilles Zémor |
Towards Local Testability for Quantum Coding. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITCS ![In: 12th Innovations in Theoretical Computer Science Conference, ITCS 2021, January 6-8, 2021, Virtual Conference., pp. 65:1-65:11, 2021, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-177-1. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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13 | Kangkang Dou, Mengyuan Zhan, Zhen Li 0020, Xiankang Chen |
Testability Evaluation by Multi-sources Bayes Method Applied in Torpedo Weapon System with Improved Jaccard Similarity. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACAI ![In: ACAI 2021: 4th International Conference on Algorithms, Computing and Artificial Intelligence, Sanya, China, December 22 - 24, 2021, pp. 79:1-79:8, 2021, ACM, 978-1-4503-8505-3. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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13 | Oren Becker, Alexander Lubotzky, Jonathan Mosheiff |
Testability of relations between permutations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FOCS ![In: 62nd IEEE Annual Symposium on Foundations of Computer Science, FOCS 2021, Denver, CO, USA, February 7-10, 2022, pp. 286-297, 2021, IEEE, 978-1-6654-2055-6. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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13 | Alexander M. Gruzlikov, Nikolai V. Kolesov |
Testability Distributed Real-Time Computing System. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SysTol ![In: 5th International Conference on Control and Fault-Tolerant Systems, SysTol 2021, Saint-Raphael, France, September 29 - Oct. 1, 2021, pp. 279-284, 2021, IEEE, 978-1-6654-3159-0. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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13 | Morteza Zakeri Nasrabadi, Saeed Parsa |
Learning to Predict Software Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CSICC ![In: 26th International Computer Conference, Computer Society of Iran, CSICC 2021, Tehran, Iran, March 3-4, 2021, pp. 1-5, 2021, IEEE, 978-1-6654-1241-4. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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13 | Anurag Tulsiram, William R. Eisenstadt |
Design for Testability of Low Dropout Regulators. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 39th IEEE VLSI Test Symposium, VTS 2021, San Diego, CA, USA, April 25-28, 2021, pp. 1-7, 2021, IEEE, 978-1-6654-1949-9. The full citation details ...](Pics/full.jpeg) |
2021 |
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