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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 10 occurrences of 6 keywords
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Results
Found 44 publication records. Showing 44 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
57 | Betty Prince |
Embedded non-volatile memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SBCCI ![In: Proceedings of the 20th Annual Symposium on Integrated Circuits and Systems Design, SBCCI 2007, Copacabana, Rio de Janeiro, Brazil, September 3-6, 2007, pp. 9, 2007, ACM, 978-1-59593-816-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
FeRAM, MONOS, PC-RAM, SONOS, floating gate memory, nanocrystal memory, nitride storage memory, trapping site memory, flash memory, embedded memory, non-volatile memory, MRAM |
54 | Victor Chao-Wei Kuo, Chih-Ming Chao, Chih-Kai Kang, Li-Wei Liu, Tzung-Bin Huang, Liang-Tai Kuo, Shi-Hsien Chen, Houng-Chi Wei, Hann-Ping Hwang, Saysamone Pittikoun |
Detailed Comparisons of Program, Erase and Data Retention Characteristics between P+- and N+-Poly SONOS NAND Flash Memory. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MTDT ![In: 14th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2006), 2-4 August 2006, Taipei, Taiwan, pp. 77-79, 2006, IEEE Computer Society, 0-7695-2572-5. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
54 | Jia-Lin Wu, Hua-Ching Chien, Chien-Wei Liao, Cheng-Yen Wu, Chih-Yuan Lee, Houng-Chi Wei, Shih-Hsien Chen, Hann-Ping Hwang, Saysamone Pittikoun, Travis Cho, Chin-Hsing Kao |
Comparison of Electrical and Reliability Characteristics of Different Tunnel Oxides in SONOS Flash Memory. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MTDT ![In: 14th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2006), 2-4 August 2006, Taipei, Taiwan, pp. 80-84, 2006, IEEE Computer Society, 0-7695-2572-5. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
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31 | Zsolt J. Horváth, Péter Basa |
New Trends in Non-volatile Semiconductor Memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Towards Intelligent Engineering and Information Technology ![In: Towards Intelligent Engineering and Information Technology, pp. 323-333, 2009, Springer, 978-3-642-03736-8. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
nanocrystal memories, SONOS, FeRAMs, flash memories, phase-change memories, MRAMs |
31 | Erwin J. Prinz |
The zen of nonvolatile memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 43rd Design Automation Conference, DAC 2006, San Francisco, CA, USA, July 24-28, 2006, pp. 815-820, 2006, ACM, 1-59593-381-6. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
FeRAM, SONOS, nanocrystal, oating gate, phase change memory, MRAM, nonvolatile memories |
27 | Hongyang Hu, Xiwei Wang, Zi Wang, Haiyang Zhou, Danian Dong, Jinshan Yue, Wan Pang, Xiaoxin Xu, Chunmeng Dou |
A 40-nm SONOS Digital CIM Using Simplified LUT Multiplier and Continuous Sample-Hold Sense Amplifier for AI Edge Inference. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 31(12), pp. 2044-2052, December 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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27 | Radouane Habhab, Vincenzo Della Marca, Pascal Masson, Nadia Miridi, Clement Pribat, Simon Jeannot, Thibault Kempf, Marc Mantelli, Philippe Lorenzini, Jean-Marc Voisin, Arnaud Régnier, Stephan Niel, Francesco La Rosa |
40nm SONOS Embedded Select in Trench Memory. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESSDERC ![In: 53rd IEEE European Solid-State Device Research Conference, ESSDERC 2023, Lisbon, Portugal, September 11-14, 2023, pp. 21-24, 2023, IEEE, 979-8-3503-0423-7. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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27 | Yasuhiro Taniguchi, Shoji Yoshida, Teruhiko Egashira, ChihBin Kuo, YiYang Shie, YuChun Wang, ChenYu Huang, Tsuyoshi Tamatsu, Keiji Okamoto, Masanobu Hishiki, Yasushi Sasaki, Fukuo Owada, Nobuhiko Ito, Yutaka Shinagawa, ChihMing Kuo, Satoshi Noda, Toshikazu Matsui, Kosuke Okuyama |
SONOS Embedded Flash IP Using Trap-Depth-Controlled SiN Film Enabling Data Retention more than 10 years at 200°C. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IMW ![In: IEEE International Memory Workshop, IMW 2023, Monterey, CA, USA, May 21-24, 2023, pp. 1-4, 2023, IEEE, 978-1-6654-7459-7. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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27 | T. Patrick Xiao, Ben Feinberg, Christopher H. Bennett, Vineet Agrawal, Prashant Saxena, Venkatraman Prabhakar, Krishnaswamy Ramkumar, Harsha Medu, Vijay Raghavan, Ramesh Chettuvetty, Sapan Agarwal, Matthew J. Marinella |
An Accurate, Error-Tolerant, and Energy-Efficient Neural Network Inference Engine Based on SONOS Analog Memory. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Circuits Syst. I Regul. Pap. ![In: IEEE Trans. Circuits Syst. I Regul. Pap. 69(4), pp. 1480-1493, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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27 | Su-In Yi, A. Alec Talin, Matthew J. Marinella, Richard Stanley Williams |
Physical Compact Model for Three-Terminal SONOS Synaptic Circuit Element. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Adv. Intell. Syst. ![In: Adv. Intell. Syst. 4(9), 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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27 | Su-In Yi, A. Alec Talin, Matthew J. Marinella, R. Stanley Williams |
Physical Compact Model for Three-Terminal SONOS Synaptic Circuit Element. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Adv. Intell. Syst. ![In: Adv. Intell. Syst. 4(9), 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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27 | Franz Schanovsky, Devin Verreck, Antonio Arreghini, Gerhard Rzepa, Zlatan Stanojevic, Christian Kernstock, Oskar Baumgartner, Maarten Rosmeulen, Markus Karner |
A TCAD Compatible SONOS Trapping Layer Model for Accurate Programming Dynamics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IMW ![In: IEEE International Memory Workshop, IMW 2021, Dresden, Germany, May 16-19, 2021, pp. 1-4, 2021, IEEE, 978-1-7281-8517-0. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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27 | Christopher H. Bennett, T. Patrick Xiao, Ryan Dellana, Vineet Agrawal, Ben Feinberg, Venkatraman Prabhakar, Krishnaswamy Ramkumar, Long Hinh, Swatilekha Saha, Vijay Raghavan, Ramesh Chettuvetty, Sapan Agarwal, Matthew J. Marinella |
Device-aware inference operations in SONOS nonvolatile memory arrays. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2004.00802, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP BibTeX RDF |
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27 | Jun-Kyo Jeong, Jae-Young Sung, Hee-Hun Yang, Hi-Deok Lee, Ga-Won Lee 0001 |
Reliability Analysis by Charge Migration of 3D SONOS Flash Memory. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020, pp. 1-5, 2020, IEEE, 978-1-7281-3199-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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27 | Krishnaswamy Ramkumar, Venkatraman Prabhakar, Vineet Agrawal, Long Hinh, Swatilekha Saha, Santanu Kumar Samanta, Ravindra M. Kapre |
Reliability Aspects of SONOS Based Analog Memory for Neuromorphic Computing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020, pp. 1-5, 2020, IEEE, 978-1-7281-3199-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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27 | Christopher H. Bennett, T. Patrick Xiao, Ryan Dellana, Ben Feinberg, Sapan Agarwal, Matthew J. Marinella, Vineet Agrawal, Venkatraman Prabhakar, Krishnaswamy Ramkumar, Long Hinh, Swatilekha Saha, Vijay Raghavan, Ramesh Chettuvetty |
Device-aware inference operations in SONOS nonvolatile memory arrays. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-3199-3. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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27 | Koji Nii, Yasuhiro Taniguchi, Kosuke Okuyama |
A Cost-Effective Embedded Nonvolatile Memory with Scalable LEE Flash®-G2 SONOS for Secure IoT and Computing-in-Memory (CiM) Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI-DAT ![In: 2020 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2020, Hsinchu, Taiwan, August 10-13, 2020, pp. 1-4, 2020, IEEE, 978-1-7281-6083-2. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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27 | Zhaozhao Xu, Donghua Liu, Wei Xiong, Jun Hu, Wenting Duan, Hualun Chen, Wensheng Qian, Weiran Kong, Shichang Zou |
Investigation and impact of LDD variations on the drain disturb in normally-on SONOS NOR flash device. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 84, pp. 157-162, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
27 | Takashi Ito, Yasuhiko Taito |
SONOS Split-Gate eFlash Memory. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Embedded Flash Memory for Embedded Systems ![In: Embedded Flash Memory for Embedded Systems: Technology, Design for Sub-systems, and Innovations., pp. 209-244, 2018, Springer, 978-3-319-55305-4. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
27 | Hidenori Mitani, Ken Matsubara |
SONOS 1Tr eFlash Memory. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Embedded Flash Memory for Embedded Systems ![In: Embedded Flash Memory for Embedded Systems: Technology, Design for Sub-systems, and Innovations., pp. 179-208, 2018, Springer, 978-3-319-55305-4. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
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27 | Jin Hyung Choi, Chong-Gun Yu, Jong Tae Park 0003 |
Nanowire width dependence of data retention and endurance characteristics in nanowire SONOS flash memory. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 64, pp. 215-219, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
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27 | Chun-Hsiung Hung, Meng-Fan Chang, Yih-Shan Yang, Yao-Jen Kuo, Tzu-Neng Lai, Shin-Jang Shen, Jo-Yu Hsu, Shuo-Nan Hung, Hang-Ting Lue, Yen-Hao Shih, Shih-Lin Huang, Ti-Wen Chen, Tzung Shen Chen, Chung Kuang Chen, Chi-Yu Hung, Chih-Yuan Lu |
Layer-Aware Program-and-Read Schemes for 3D Stackable Vertical-Gate BE-SONOS NAND Flash Against Cross-Layer Process Variations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE J. Solid State Circuits ![In: IEEE J. Solid State Circuits 50(6), pp. 1491-1501, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
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27 | Johannes Ocker, Stefan Slesazeck, Thomas Mikolajick, S. Buschbeck, S. Günther, E. Yurchuk, R. Hoffmann, V. Beyer |
On the voltage scaling potential of SONOS non-volatile memory transistors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESSDERC ![In: 45th European Solid State Device Research Conference, ESSDERC 2015, Graz, Austria, September 14-18, 2015, pp. 118-121, 2015, IEEE, 978-1-4673-7133-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
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27 | Gagan Deep Verma, Manisha Pattanaik |
Performance study of side block oxide band gap engineered SONOS: A device simulation approach. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VDAT ![In: 19th International Symposium on VLSI Design and Test, VDAT 2015, Ahmedabad, India, June 26-29, 2015, pp. 1-4, 2015, IEEE Computer Society, 978-1-4799-1743-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
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27 | Fengying Qiao, Liyang Pan, Xiao Yu, Haozhi Ma, Dong Wu, Jun Xu |
Total ionizing radiation effects of 2-T SONOS for 130 nm/4 Mb NOR flash memory technology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sci. China Inf. Sci. ![In: Sci. China Inf. Sci. 57(6), pp. 1-9, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
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27 | Jin Hyung Choi, Jin-Woo Han, Chong-Gun Yu, Jong Tae Park 0003 |
Hot carrier and PBTI induced degradation in silicon nanowire gate-all-around SONOS MOSFETs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 54(9-10), pp. 2325-2328, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
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27 | Yue Xu, Chun-bo Wu, Xiaoli Ji, Feng Yan 0002 |
An 8-level 3-bit cell programming technique in NOR-type nano-scaled SONOS memory devices. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 54(1), pp. 331-334, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
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27 | Lifang Liu, Antonio Arreghini, Geert Van den Bosch, Liyang Pan, Jan Van Houdt |
Assessment methodology of the lateral migration component in data retention of 3D SONOS memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 54(9-10), pp. 1697-1701, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
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27 | Xiaoli Ji, Chun-bo Wu, Yue Xu, Yi-ming Liao, Jianguang Chang, Li-juang Ma, Feng Yan 0002 |
The promising multi-bit/level programming operations for nano-scaled SONOS memory. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 54(1), pp. 119-123, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
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27 | Shipra Bassi, Manisha Pattanaik |
TID effects on retention of 0.13 μm SONOS memory cell: A device simulation approach. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VDAT ![In: 18th International Symposium on VLSI Design and Test, VDAT 2014, Coimbatore, India, July 16-18, 2014, pp. 1-6, 2014, IEEE, 978-1-4799-5088-1. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
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27 | Yue Xu, Chun-bo Wu, Xiaoli Ji, Feng Yan 0002, Yi Shi |
An improved multilevel cell programming technique for 4-bits/cell localized trapping SONOS memory devices. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 53(1), pp. 118-122, 2013. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
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27 | Masamichi Suzuki, Atsuhiro Kinoshita, Yuichiro Mitani |
Improvement of gate disturb degradation in SONOS FETs for Vth mismatch compensation in CMOS analog circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICICDT ![In: Proceedings of 2013 International Conference on IC Design & Technology, ICICDT 2013, Pavia, Italy, May 29-31, 2013, pp. 195-198, 2013, IEEE, 978-1-4673-4740-2. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
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27 | Wen-Ching Hsieh, Hao-Tien Daniel Lee, Fuh-Cheng Jong, Shich-Chuan Wu, D. Heh |
UV nonvolatile sensor by using SONOS capacitor device. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICAIT ![In: 6th IEEE International Conference on Advanced Infocomm Technology, ICAIT 2013, Hsinchu, Taiwan, July 6-9, 2013, pp. 163-164, 2013, IEEE. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
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27 | Yue Xu, Feng Yan 0002, ZhiGuo Li, Fan Yang, Jianguang Chang, Yonggang Wang |
Investigation of STI edge effect on programming disturb in localized charge trapping SONOS flash memory cells. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 52(7), pp. 1337-1341, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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27 | Jian Liu 0027, Zitao Shi, Xin Wang 0031, Hui Zhao 0014, L. Wang, Chen Zhang 0017, Zongyu Dong, L. Lin, Albert Z. Wang, Yuhua Cheng, Bin Zhao 0002 |
Field programmable SONOS ESD protection design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CICC ![In: Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, CICC 2012, San Jose, CA, USA, September 9-12, 2012, pp. 1-4, 2012, IEEE, 978-1-4673-1555-5. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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27 | Jae Sub Oh, Kwang Il Choi, Young Su Kim, Min Ho Kang, Myeong Ho Song, Sung Kyu Lim, Dong Eun Yoo, Jeong Gyu Park, Hi Deok Lee, Ga Won Lee 0001 |
SONOS-Type Flash Memory with HfO2 Thinner than 4 nm as Trapping Layer Using Atomic Layer Deposition. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEICE Trans. Electron. ![In: IEICE Trans. Electron. 93-C(5), pp. 590-595, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
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27 | Chun-Yu Wu, Ta-Chuan Liao, Ming-H Yu, Sheng-Kai Chen, Chung-Min Tsai, Huang-Chung Cheng |
Field enhancement of omega-shaped-gated poly-Si TFT SONOS memory fabricated by a simple sidewall spacer formation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 50(5), pp. 704-708, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
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27 | Doo-Hyun Kim, Il-Han Park, Seongjae Cho, Jong Duk Lee, Hyungcheol Shin, Byung-Gook Park |
Simulation of Retention Characteristics in Double-Gate Structure Multi-Bit SONOS Flash Memory. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEICE Trans. Electron. ![In: IEICE Trans. Electron. 92-C(5), pp. 659-663, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
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27 | Han-A-Reum Jung, Kyoung-Rok Han, Young-Min Kim, Jong-Ho Lee |
Device Design of SONOS Flash Memory Cell with Saddle Type Channel Structure. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEICE Trans. Electron. ![In: IEICE Trans. Electron. 91-C(5), pp. 736-741, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
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27 | Nan Wang, Xiang Yao, Yu Lei, Guoyou Feng, Qiaohua Dong, Liang Xu, Lu Guo, Zi Wang, T. S. Tang |
A million cycle 0.13um 1Mb embedded SONOS Flash memory using Successive Approximated Read Calibration. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CICC ![In: Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008, pp. 427-430, 2008, IEEE, 978-1-4244-2018-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
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27 | Byung-Cheul Kim |
Spatial Distribution of Localized Charge Carriers in SONOS Memory Cells. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Inform. and Commun. Convergence Engineering ![In: J. Inform. and Commun. Convergence Engineering 4(2), pp. 84-87, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP BibTeX RDF |
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27 | Liyang Pan, Dong Wu, Guangjun Yang, Lei Sun, Huiqing Pang, Jun Zhu |
180nm 4Mb High Speed High Reliability Embedded SONOS Flash Memory. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CICC ![In: Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, CICC 2006, DoubleTree Hotel, San Jose, California, USA, September 10-13, 2006, pp. 305-308, 2006, IEEE, 1-4244-0075-9. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
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27 | Myoung-Kyu Seo, Soung-Hoon Sim, Myoung-Hee Oh, Hyo-Sang Lee, Sang-Won Kim, In-Wook Cho, Gyu-Hong Kim, Moon-Gone Kim |
A 130-nm 0.9-V 66-MHz 8-Mb (256K × 32) local SONOS embedded flash EEPROM. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE J. Solid State Circuits ![In: IEEE J. Solid State Circuits 40(4), pp. 877-883, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
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26 | Francesco Viola, Michael A. Ellis, William F. Walker |
Time-Domain Optimized Near-Field Estimator for Ultrasound Imaging: Initial Development and Results. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Medical Imaging ![In: IEEE Trans. Medical Imaging 27(1), pp. 99-110, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
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