Search results for "wear-out"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
58	Nak Hee Seong, Dong Hyuk Woo, Hsien-Hsin S. Lee	Security refresh: prevent malicious wear-out and increase durability for phase-change memory with dynamically randomized address mapping.	ISCA	2010	DBLP DOI BibTeX RDF	dynamic address remapping, security, phase change memory, wear leveling
44	Bianca Schroeder, Garth A. Gibson	Understanding disk failure rates: What does an MTTF of 1, 000, 000 hours mean to you?	ACM Trans. Storage	2007	DBLP DOI BibTeX RDF	Hard drive replacements, annual failure rates, annual replacement rates, datasheet MTTF, failure correlation, hard drive failure, infant mortality, storage reliability, time between failure, wear-out, MTTF
35	Dongyoung Seo, Dongkun Shin	WAM: Wear wear-out-aware memory management for SCRAM-based low power mobile systems.	IEEE Trans. Consumer Electron.	2013	DBLP DOI BibTeX RDF
31	Kazuyuki Suzuki, Mesbahul Alam, Takuji Yoshikawa, Wataru Yamamoto	Two Methods for Estimating Product Lifetimes from only Warranty Claims Data.	SSIRI	2008	DBLP DOI BibTeX RDF	random failure, wear-out failure, usage time distribution, censoring distribution, Reliability
31	John Y. Oliver, Rajeevan Amirtharajah, Venkatesh Akella, Frederic T. Chong	Credit-based dynamic reliability management using online wearout detection.	Conf. Computing Frontiers	2008	DBLP DOI BibTeX RDF	wear-out, reliability
29	Fan Yang, Chengqi Xiao, Jun Li 0062, Zhibing Sha, Zhigang Cai, Jianwei Liao 0001	Out-of-channel data placement for balancing wear-out and I/O workloads in RAID-enabled SSDs.	DATE	2023	DBLP DOI BibTeX RDF
25	Andrea Marongiu, Andrea Acquaviva, Luca Benini	OpenMP Support for NBTI-Induced Aging Tolerance in MPSoCs.	SSS	2009	DBLP DOI BibTeX RDF
25	Jin Sun 0006, Avinash Karanth Kodi, Ahmed Louri, Janet Meiling Wang	NBTI aware workload balancing in multi-core systems.	ISQED	2009	DBLP DOI BibTeX RDF
25	Abhishek Pillai, Wei Zhang 0002, Dimitrios Kagaris	Detecting VLIW Hard Errors Cost-Effectively through a Software-Based Approach.	AINA Workshops (1)	2007	DBLP DOI BibTeX RDF
25	Dennis Sylvester, David T. Blaauw, Eric Karl	ElastIC: An Adaptive Self-Healing Architecture for Unpredictable Silicon.	IEEE Des. Test Comput.	2006	DBLP DOI BibTeX RDF	unpredictable silicon, runtime self-diagnosis, adaptivity, architecture, process variations, self-healing, ElastIC, technology scaling
25	Jayanth Srinivasan, Sarita V. Adve, Pradip Bose, Jude A. Rivers	The Case for Lifetime Reliability-Aware Microprocessors.	ISCA	2004	DBLP DOI BibTeX RDF
23	Stuart E. Schechter, Gabriel H. Loh, Karin Strauss, Doug Burger	Use ECP, not ECC, for hard failures in resistive memories.	ISCA	2010	DBLP DOI BibTeX RDF	hard failures, resistive memories, memory, error correction, phase change memory
23	Ohhoon Kwon, Jaewoo Lee, Kern Koh	EF-Greedy: A Novel Garbage Collection Policy for Flash Memory Based Embedded Systems.	International Conference on Computational Science (4)	2007	DBLP DOI BibTeX RDF	Embedded systems, Garbage collection, Flash memory
23	Ohhoon Kwon, Yeonseung Ryu, Kern Koh	An Efficient Garbage Collection Policy for Flash Memory Based Swap Systems.	ICCSA (1)	2007	DBLP DOI BibTeX RDF	Swap systems, Garbage collection, Flash memory
22	Yingzhou Peng, Haoran Wang, Huai Wang	A Method for Separation of Power Semiconductor Packaging-Related Wear-Out Mechanisms Under Converter Operation.	IEEE Trans. Ind. Electron.	2024	DBLP DOI BibTeX RDF
22	Isabel Martón, Ana Isabel Sánchez, Sofía Carlos, Rubén Mullor, Sebastián Martorell	Prognosis of wear-out effect on of safety equipment reliability for nuclear power plants long-term safe operation.	Reliab. Eng. Syst. Saf.	2023	DBLP DOI BibTeX RDF
22	María Dolores Berrade, E. Calvo, Francisco Germán Badía	Maintenance of systems with critical components. Prevention of early failures and wear-out.	Comput. Ind. Eng.	2023	DBLP DOI BibTeX RDF
22	Jegadeeshwaran Rakkiyannan, Lakshmipathi Jakkamputi, Mohanraj Thangamuthu, Abhishek D. Patange, Sakthivel Gnanasekaran	Development of Online Tool Wear-Out Detection System Using Silver-Polyester Thick Film Sensor for Low-Duty Cycle Machining Operations.	Sensors	2022	DBLP DOI BibTeX RDF
22	Alexander Teverovsky	Infant Mortality and Wear-Out Failures in Polymer and MnO2 Tantalum Capacitors.	IRPS	2022	DBLP DOI BibTeX RDF
22	Ana Cláudia Souza Vidal de Negreiros, Isis Didier Lins, Márcio José das Chagas Moura, Enrique López Droguett	Reliability data analysis of systems in the wear-out phase using a (corrected) q-Exponential likelihood.	Reliab. Eng. Syst. Saf.	2020	DBLP DOI BibTeX RDF
22	Flavia Dalia Frumosu, Georg Ørnskov Rønsch, Murat Kulahci	Mould wear-out prediction in the plastic injection moulding industry: a case study.	Int. J. Comput. Integr. Manuf.	2020	DBLP DOI BibTeX RDF
22	Chang Liu 0010, Eric Schneider, Hans-Joachim Wunderlich	Using Programmable Delay Monitors for Wear-Out and Early Life Failure Prediction.	DATE	2020	DBLP DOI BibTeX RDF
22	Yanfeng Shen, Andrii Chub, Huai Wang, Dmitri Vinnikov, Elizaveta Liivik, Frede Blaabjerg	Wear-Out Failure Analysis of an Impedance-Source PV Microinverter Based on System-Level Electrothermal Modeling.	IEEE Trans. Ind. Electron.	2019	DBLP DOI BibTeX RDF
22	Takatoshi Sugiyama, Toru Ogura, Takakazu Sugiyama	Estimation of the threshold parameter of a wear-out failure period in the case of a three-parameter Weibull distribution.	Int. J. Knowl. Eng. Soft Data Paradigms	2019	DBLP DOI BibTeX RDF
22	Ting-Yi Wu, Lav R. Varshney, Vincent Y. F. Tan	On the Throughput of Channels That Wear Out.	IEEE Trans. Commun.	2019	DBLP DOI BibTeX RDF
22	Nikos Foutris, Christos Kotselidis, Mikel Luján	Simulating Wear-out Effects of Asymmetric Multicores at the Architecture Level.	DFT	2019	DBLP DOI BibTeX RDF
22	Kan Takeuchi, Masaki Shimada, Takeshi Okagaki, Koji Shibutani, Koji Nii, Fumio Tsuchiya	Wear-out stress monitor utilising temperature and voltage sensitive ring oscillators.	IET Circuits Devices Syst.	2018	DBLP DOI BibTeX RDF
22	Michal Baszynski, P. Rydygier, Mariusz Wojcik	Experimental studies of: Laminate composition, drill bit wear out, and chloride ion concentration as factors affecting CAF formation rate.	Microelectron. Reliab.	2018	DBLP DOI BibTeX RDF
22	Chang Liu 0010, Eric Schneider, Matthias Kampmann, Sybille Hellebrand, Hans-Joachim Wunderlich	Extending Aging Monitors for Early Life and Wear-Out Failure Prevention.	ATS	2018	DBLP DOI BibTeX RDF
22	Elizaveta Liivik, Andrii Chub, Ariya Sangwongwanich, Yanfeng Shen, Dmitri Vinnikov, Frede Blaabjerg	Wear-Out Failure Analysis of Solar Optiverter Operating with 60- and 72-Cell Si Crystalline PV Modules.	IECON	2018	DBLP DOI BibTeX RDF
22	Sheriff Sadiqbatcha, Chase Cook, Zeyu Sun 0001, Sheldon X.-D. Tan	Accelerating Electromigration Wear-Out Effects Based on Configurable Sink-Structured Wires.	SMACD	2018	DBLP DOI BibTeX RDF
22	Patrick Cronin, Chengmo Yang, Yongpan Liu	A collaborative defense against wear out attacks in non-volatile processors.	DAC	2018	DBLP DOI BibTeX RDF
22	Graeme Jenkinson	It's Better to Rust Than Wear Out.	login Usenix Mag.	2017	DBLP BibTeX RDF
22	Haiyu Mao, Xian Zhang 0001, Guangyu Sun 0003, Jiwu Shu	Protect non-volatile memory from wear-out attack based on timing difference of row buffer hit/miss.	DATE	2017	DBLP DOI BibTeX RDF
22	Xiaojian Liu, Chenrui Wu, Lemiao Qiu, Yang Wang, Shuyou Zhang 0001	A geometric errors analysis method integrated clamping error and wear out error over working space.	CASE	2017	DBLP DOI BibTeX RDF
22	Yohwan Choi, Hongseok Kim	Optimal scheduling of energy storage system for self-sustainable base station operation considering battery wear-out cost.	ICUFN	2016	DBLP DOI BibTeX RDF
22	Kan Takeuchi, Masaki Shimada, Takeshi Okagaki, Koji Shibutani, Koji Nii, Fumio Tsuchiya	FEOL/BEOL wear-out estimator using stress-to-frequency conversion of voltage/temperature-sensitive ring oscillators for 28nm automotive MCUs.	ESSCIRC	2016	DBLP DOI BibTeX RDF
22	Fabian Paschke, Christian Bayer 0002, Olaf Enge-Rosenblatt	A generic approach for detection of wear-out situations in machine subsystems.	ETFA	2016	DBLP DOI BibTeX RDF
22	Alf Inge Wang	The wear out effect of a game-based student response system.	Comput. Educ.	2015	DBLP DOI BibTeX RDF
22	Laurent Doyen 0002	Semi-parametric estimation of Brown-Proschan preventive maintenance effects and intrinsic wear-out.	Comput. Stat. Data Anal.	2014	DBLP DOI BibTeX RDF
22	Huang-Chen Lee, Yu-Chang Chang, Yen-Shuo Huang	A Reliable Wireless Sensor System for Monitoring Mechanical Wear-Out of Parts.	IEEE Trans. Instrum. Meas.	2014	DBLP DOI BibTeX RDF
22	Caio Hoffman, Luiz Ramos, Rodolfo Azevedo, Guido Araujo	Wear-out analysis of Error Correction Techniques in Phase-Change Memory.	DATE	2014	DBLP DOI BibTeX RDF
22	Hyungjun Kim, Arseniy Vitkovskiy, Paul V. Gratz, Vassos Soteriou	Use it or lose it: wear-out and lifetime in future chip multiprocessors.	MICRO	2013	DBLP DOI BibTeX RDF
22	Parthasarathy M. B. Rao, Abdulazim Amouri, Saman Kiamehr, Mehdi Baradaran Tahoori	Altering LUT configuration for wear-out mitigation of FPGA-mapped designs.	FPL	2013	DBLP DOI BibTeX RDF
22	Angel Cuadras, Victoria-Julia Ovejas, Marcos Quilez	Entropy as a wear out indicator: The resistor example.	SSD	2013	DBLP DOI BibTeX RDF
22	Laurent Doyen 0002	Reliability analysis and joint assessment of Brown-Proschan preventive maintenance efficiency and intrinsic wear-out.	Comput. Stat. Data Anal.	2012	DBLP DOI BibTeX RDF
22	Matthew Beckler, R. D. (Shawn) Blanton	On-chip diagnosis for early-life and wear-out failures.	ITC	2012	DBLP DOI BibTeX RDF
22	Nak Hee Seong, Dong Hyuk Woo, Hsien-Hsin S. Lee	Security Refresh: Protecting Phase-Change Memory against Malicious Wear Out.	IEEE Micro	2011	DBLP DOI BibTeX RDF
22	Urban Ingelsson, Shih-Yen Chang, Erik Larsson	Measurement point selection for in-operation wear-out monitoring.	DDECS	2011	DBLP DOI BibTeX RDF
22	Yangyang Pan, Guiqiang Dong, Tong Zhang 0002	Exploiting Memory Device Wear-Out Dynamics to Improve NAND Flash Memory System Performance.	FAST	2011	DBLP BibTeX RDF
22	Qi Wu 0006, Guiqiang Dong, Tong Zhang 0002	Exploiting Heat-Accelerated Flash Memory Wear-Out Recovery to Enable Self-Healing SSDs.	HotStorage	2011	DBLP BibTeX RDF
22	Jayakrishnan V. Iyer, Heeyeol Yu, Hogil Kim, Eun Jung Kim 0001, Ki Hwan Yum, Pyeong Soo Mah	Assuring K-coverage in the presence of mobility and wear-out failures in wireless sensor networks.	Int. J. Sens. Networks	2009	DBLP DOI BibTeX RDF
22	Shin Yoo, Mark Harman, Shmuel Ur	Measuring and Improving Latency to Avoid Test Suite Wear Out.	ICST Workshops	2009	DBLP DOI BibTeX RDF
22	P. J. van der Wel, S. J. C. H. Theeuwen, J. A. Bielen, Y. Li, R. A. van den Heuvel, J. G. Gommans, F. van Rijs, P. Bron, H. J. F. Peuscher	Wear out failure mechanisms in aluminium and gold based LDMOS RF power applications.	Microelectron. Reliab.	2006	DBLP DOI BibTeX RDF
22	T. Pompl, A. Kerber, M. Röhner, Martin Kerber	Gate voltage and oxide thickness dependence of progressive wear-out of ultra-thin gate oxides.	Microelectron. Reliab.	2006	DBLP DOI BibTeX RDF
22	Xiangdong Xuan, Abhijit Chatterjee, Adit D. Singh	Application of local design-for-reliability techniques for reducing wear-out degradation of CMOS combinational logic circuits.	ETS	2004	DBLP DOI BibTeX RDF
22	Ketut Buda Artana, Kenji Ishida	Spreadsheet modeling of optimal maintenance schedule for components in wear-out phase.	Reliab. Eng. Syst. Saf.	2002	DBLP DOI BibTeX RDF
22	Frederic Monsieur, E. Vincent, G. Pananakakis, Gérard Ghibaudo	Wear-out, breakdown occurrence and failure detection in 18-25 Å ultrathin oxides.	Microelectron. Reliab.	2001	DBLP DOI BibTeX RDF
22	S. Bruyère, David Roy 0001, E. Robilliart, E. Vincent, Gérard Ghibaudo	Body effect induced wear-out acceleration in ultra-thin oxides.	Microelectron. Reliab.	2001	DBLP DOI BibTeX RDF
22	Gwan S. Choi, Ravishankar K. Iyer	Wear-Out Simulation Environment for VLSI Designs.	FTCS	1993	DBLP DOI BibTeX RDF
22	S. Zacks	Estimating the Shift to Wear-Out of Systems Having Exponential-Weibull Life Distributions.	Oper. Res.	1984	DBLP DOI BibTeX RDF
14	Joe Sullivan, Conor Ryan	A Destructive Evolutionary Algorithm Process.	FBIT	2007	DBLP DOI BibTeX RDF
14	Cecilia Metra, Martin Omaña 0001, Daniele Rossi 0001, José Manuel Cazeaux, T. M. Mak	Path (Min) Delay Faults and Their Impact on Self-Checking Circuits' Operation.	IOLTS	2006	DBLP DOI BibTeX RDF
12	Mehmet Basoglu, Michael Orshansky, Mattan Erez	NBTI-aware DVFS: a new approach to saving energy and increasing processor lifetime.	ISLPED	2010	DBLP DOI BibTeX RDF	wearout, energy efficiency, process variation, DVFS, NBTI
12	Pramod Subramanyan, Virendra Singh, Kewal K. Saluja, Erik Larsson	Energy-efficient redundant execution for chip multiprocessors.	ACM Great Lakes Symposium on VLSI	2010	DBLP DOI BibTeX RDF	redundant execution, microarchitecture, transient faults, permanent faults
12	Mahesh Balakrishnan 0001, Asim Kadav, Vijayan Prabhakaran, Dahlia Malkhi	Differential RAID: rethinking RAID for SSD reliability.	EuroSys	2010	DBLP DOI BibTeX RDF	RAID, flash, SSD
12	David Roberts, Taeho Kgil, Trevor N. Mudge	Integrating NAND flash devices onto servers.	Commun. ACM	2009	DBLP DOI BibTeX RDF
12	Ulya R. Karpuzcu, Brian Greskamp, Josep Torrellas	The BubbleWrap many-core: popping cores for sequential acceleration.	MICRO	2009	DBLP DOI BibTeX RDF	power wall, process scaling, processor aging, voltage scaling
12	Diogo José Costa Alves, Edna Barros	A logic built-in self-test architecture that reuses manufacturing compressed scan test patterns.	SBCCI	2009	DBLP DOI BibTeX RDF	LBIST, compressed test patterns, test, SoC, self-test
12	Henning Klein, Jörg Keller 0001	Storage architecture with integrity, redundancy and encryption.	IPDPS	2009	DBLP DOI BibTeX RDF
12	Joseph Hassoun	Resiliency in Elemental Computing.	ARC	2009	DBLP DOI BibTeX RDF
12	Joe Kelly, Dean Nicholson, Edwin Lowery, Victor Grothen	Light-Enhanced FET Switch Improves ATE RF Power Settling.	IEEE Des. Test Comput.	2008	DBLP DOI BibTeX RDF	FET, RF switch, power settling, HVM, high-volume manufacturing, ATE, test time, settling time
12	Ajit Ashok Shenvi	Design for six sigma: software product quality.	ISEC	2008	DBLP DOI BibTeX RDF	CTQs, DFSS, black belt, cost of non-quality, risk-benefit, voice of customer, FMEA
12	Xin Fu, Tao Li 0006, José A. B. Fortes	NBTI tolerant microarchitecture design in the presence of process variation.	MICRO	2008	DBLP DOI BibTeX RDF
12	Marcus Furuholmen, Kyrre Glette, Jim Tørresen, Mats Høvin	Indirect Online Evolution - A Conceptual Framework for Adaptation in Industrial Robotic Systems.	ICES	2008	DBLP DOI BibTeX RDF
12	Maryam Ashouei, Adit D. Singh, Abhijit Chatterjee	Reconfiguring CMOS as Pseudo N/PMOS for Defect Tolerance in Nano-Scale CMOS.	VLSI Design	2008	DBLP DOI BibTeX RDF
12	Kypros Constantinides, Stephen Plaza, Jason A. Blome, Valeria Bertacco, Scott A. Mahlke, Todd M. Austin, Bin Zhang 0011, Michael Orshansky	Architecting a reliable CMP switch architecture.	ACM Trans. Archit. Code Optim.	2007	DBLP DOI BibTeX RDF	CMP switch, reliability, defect-tolerance
12	Philip M. Wells, Koushik Chakraborty, Gurindar S. Sohi	Adapting to Intermittent Faults in Future Multicore Systems.	PACT	2007	DBLP DOI BibTeX RDF
12	Mojtaba Mehrara, Mona Attariyan, Smitha Shyam, Kypros Constantinides, Valeria Bertacco, Todd M. Austin	Low-cost protection for SER upsets and silicon defects.	DATE	2007	DBLP DOI BibTeX RDF
12	Joe Sullivan, Conor Ryan	A destructive evolutionary process: a pilot implementation.	GECCO	2007	DBLP DOI BibTeX RDF	silicon design, reliability, experimentation, flash memory
12	Mohammed G. Khatib, Berend-Jan van der Zwaag, Pieter H. Hartel, Gerard J. M. Smit	Interposing Flash between Disk and DRAM to Save Energy for Streaming Workloads.	ESTIMedia	2007	DBLP DOI BibTeX RDF
12	Kypros Constantinides, Stephen Plaza, Jason A. Blome, Bin Zhang 0011, Valeria Bertacco, Scott A. Mahlke, Todd M. Austin, Michael Orshansky	BulletProof: a defect-tolerant CMP switch architecture.	HPCA	2006	DBLP DOI BibTeX RDF
12	Paul L. Master	Reconfigurable Hardware and Software Architectural Constructs for the Enablement of Resilient Computing Systems.	ASAP	2006	DBLP DOI BibTeX RDF
12	Qin Xin 0005, Thomas J. E. Schwarz, Ethan L. Miller	Disk Infant Mortality in Large Storage Systems.	MASCOTS	2005	DBLP DOI BibTeX RDF
12	Yi Zou, Krishnendu Chakrabarty	Fault-Tolerant Self-organization in Sensor Networks.	DCOSS	2005	DBLP DOI BibTeX RDF
12	Chandu Visweswariah	Statistical analysis and design: from picoseconds to probabilities.	SBCCI	2004	DBLP DOI BibTeX RDF
12	Alenka Brezavscek, Alenka Hudoklin	Joint optimization of block-replacement and periodic-review spare-provisioning policy.	IEEE Trans. Reliab.	2003	DBLP DOI BibTeX RDF
12	Peter May, Keith Mander, Jon Timmis	Software Vaccination: An Artificial Immune System Approach to Mutation Testing.	ICARIS	2003	DBLP DOI BibTeX RDF
12	Ralph H. J. M. Otten, Raul Camposano, Patrick Groeneveld	Design Automation for Deepsubmicron: Present and Future.	DATE	2002	DBLP DOI BibTeX RDF