Search results for "defects"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
34	Sang-Wook Sohn, Dae-Young Lee, Hun Choi, Jae-Won Suh, Hyeon-Deok Bae	Detection of Various Defects in TFT-LCD Polarizing Film.	ICANNGA (2)	2007	DBLP DOI BibTeX RDF
34	Moustapha Sene, Michel Barret, Kurosh Madani	Bearing's Behavior Modeling for Mechanical Defects' Detection and Diagnosis.	CISIM	2007	DBLP DOI BibTeX RDF
34	Swaroop Ghosh, Patrick Ndai, Swarup Bhunia, Kaushik Roy 0001	Tolerance to Small Delay Defects by Adaptive Clock Stretching.	IOLTS	2007	DBLP DOI BibTeX RDF
34	Suchendra M. Bhandarkar, Xingzhi Luo, Richard F. Daniels, Ernest William Tollner	A novel feature-based tracking approach to the detection, localization, and 3-D reconstruction of internal defects in hardwood logs using computer tomography.	Pattern Anal. Appl.	2006	DBLP DOI BibTeX RDF	Internal defect detection, Feature-based tracking, Nondestructive evaluation, Automated lumber production, Kalman filter, Computer tomography
34	Hong-Dar Lin, Chih-Hao Chien	Automated Detection of Color Non-Uniformity Defects in TFT-LCD.	IJCNN	2006	DBLP DOI BibTeX RDF
34	Richard Putman, Rahul Gawde	Enhanced Timing-Based Transition Delay Testing for Small Delay Defects.	VTS	2006	DBLP DOI BibTeX RDF
34	Paul Luo Li, James D. Herbsleb, Mary Shaw	Finding Predictors of Field Defects for Open Source Software Systems in Commonly Available Data Sources: A Case Study of OpenBSD.	IEEE METRICS	2005	DBLP DOI BibTeX RDF	Field defect prediction, CVS repository, request tracking system, mailing list archives, deployment and usage metrics, software and hardware configurations metrics, Reliability, Measurement, Documentation, open source software, Experimentation, reliability modeling, Software quality assurance, Product metrics, Process metrics, Software science
34	Jennifer Dworak	An Investigation of Excitation Balance and Additional Mandatory Conditions for the Diagnosis of Fortuitously Detected Defects.	MTV	2005	DBLP DOI BibTeX RDF
34	Koen A. Vermeer, Frans Vos, Hans G. Lemij, Albert M. Vossepoel	Detecting Wedge Shaped Defects in Polarimetric Images of the Retinal Nerve Fiber Layer.	MICCAI (1)	2002	DBLP DOI BibTeX RDF
34	Yasuo Sato, Iwao Yamazaki, Hiroki Yamanaka, Toshio Ikeda, Masahiro Takakura	A Persistent Diagnostic Technique for Unstable Defects.	ITC	2002	DBLP DOI BibTeX RDF
34	Guilherme Travassos, Forrest Shull, Michael Fredericks, Victor R. Basili	Detecting Defects in Object-Oriented Designs: Using Reading Techniques to Increase Software Quality.	OOPSLA	1999	DBLP DOI BibTeX RDF	object oriented software quality, object testing and metrics, software inspection, software engineering practices
32	Yi Wang, Min Zhang 0002	Penalty policies in professional software development practice: a multi-method field study.	ICSE (2)	2010	DBLP DOI BibTeX RDF	penalty policies, perception and performance of software developers, software defects
32	Yomi Kastro, Ayse Basar Bener	A defect prediction method for software versioning.	Softw. Qual. J.	2008	DBLP DOI BibTeX RDF	Neural networks, Defect prediction, Software defects
32	Jörg Rech, Axel Spriestersbach	A Survey about the Intent to Use Visual Defect Annotations for Software Models.	ECMDA-FA	2008	DBLP DOI BibTeX RDF	Visual Annotations, Quality Defects, Software Diagnostics, MDSD, Software Models, Intelligent Assistance
32	Mechelle Gittens, Yong Kim, David Godwin	The Vital Few Versus the Trivial Many: Examining the Pareto Principle for Software.	COMPSAC (1)	2005	DBLP DOI BibTeX RDF	Pareto principle, Empirical study, defects
32	Lee J. White, Brian Robinson	Industrial Real-Time Regression Testing and Analysis Using Firewalls.	ICSM	2004	DBLP DOI BibTeX RDF	Testing Firewall, Software Testing, Deadlock, Regression Testing, Software Defects, Real-Time Software
32	Norman E. Fenton, Martin Neil	A Critique of Software Defect Prediction Models.	IEEE Trans. Software Eng.	1999	DBLP DOI BibTeX RDF	Software faults and failures, fault-density, defects, Bayesian Belief Networks, complexity metrics
32	Lutz Prechelt, Walter F. Tichy	A Controlled Experiment to Assess the Benefits of Procedure Argument Type Checking.	IEEE Trans. Software Eng.	1998	DBLP DOI BibTeX RDF	quality, productivity, controlled experiment, defects, Type checking
32	Paul B. Chou, A. Ravishankar Rao, Martin C. Sturzenbecker, Frederick Y. Wu, Virginia H. Brecher	Automatic defect classification for semiconductor manufacturing.	Mach. Vis. Appl.	1997	DBLP DOI BibTeX RDF	Classification, Machine vision, Process control, Defects, Semiconductor manufacturing
32	Rosa Rodríguez-Montañés, Joan Figueras	Bridges in sequential CMOS circuits: current-voltage signatur.	VTS	1997	DBLP DOI BibTeX RDF	sequential CMOS circuits, current-voltage signature, I/sub DDQ/-V/sub DD/ signature, control loop nodes, fault diagnosis, fault diagnosis, temperature dependence, bridging defects
32	Manoj Sachdev	A realistic defect oriented testability methodology for analog circuits.	J. Electron. Test.	1995	DBLP DOI BibTeX RDF	inductive fault analysis, fault model, faults, defects, fault dictionary
32	Manoj Sachdev	Reducing the CMOS RAM test complexity withIDDQ and voltage testing.	J. Electron. Test.	1995	DBLP DOI BibTeX RDF	fault model, faults, defects, March test, I DDQ testing
32	Li-C. Wang, M. Ray Mercer, Sophia W. Kao, Thomas W. Williams	On the decline of testing efficiency as fault coverage approaches 100%.	VTS	1995	DBLP DOI BibTeX RDF	single stuck-at fault model, ISCAS benchmark circuits, nontarget defects, fault diagnosis, logic testing, integrated circuit testing, automatic testing, fault coverage, test pattern generation, manufacturing process, test quality, production testing, testing efficiency, circuit sizes
32	Inderpal S. Bhandari, Michael J. Halliday, Eric Tarver, David Brown, Jarir K. Chaar, Ram Chillarege	A Case Study of Software Process Improvement During Development.	IEEE Trans. Software Eng.	1993	DBLP DOI BibTeX RDF	defect data analysis, process activities, process correction, machine-assisted approach, defect-based process improvement, in-process metrics, software engineering, software engineering, semantics, case study, project management, software metrics, knowledge discovery, software process improvement, attributes, software defects, data exploration, data handling, project team
31	Michael Crocker, Xiaobo Sharon Hu, Michael T. Niemier	Defects and faults in QCA-based PLAs.	ACM J. Emerg. Technol. Comput. Syst.	2009	DBLP DOI BibTeX RDF	logic mapping, Nanotechnology, faults, defects, quantum-dot cellular automata
31	Juan Liu, Hui Ju	Fuzzy Inspection of Fabric Defects Based on Particle Swarm Optimization (PSO).	RSKT	2008	DBLP DOI BibTeX RDF	Fabric Defects Inspection, Principal Component Analysis (PCA), Particle Swarm Optimization (PSO), Fuzzy C-Mean Clustering (FCM)
31	Manoj Kumar Goparaju, Spyros Tragoudas	A Novel ATPG Framework to Detect Weight Related Defects in Threshold Logic Gates.	VTS	2008	DBLP DOI BibTeX RDF	Weght defects, ATPG, Threshold logic, Parametric faults
31	Luigi Dilillo, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian	Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits.	J. Electron. Test.	2007	DBLP DOI BibTeX RDF	Resistive-open defects, Pre-charge circuits, Memory testing, Dynamic faults
31	Ad J. van de Goor, J. E. Simonse	Defining SRAM Resistive Defects and Their Simulation Stimuli.	Asian Test Symposium	1999	DBLP DOI BibTeX RDF	Resistive defects, simulation stimuli, SRAM functional faults, SPICE simulation
31	Claude Thibeault	Detection and location of faults and defects using digital signal processing.	VTS	1995	DBLP DOI BibTeX RDF	sampled current, sampled voltage, quiescent current, parasitic resistive contacts, DSP technique, fault diagnosis, logic testing, integrated circuit testing, fault detection, diagnosis, signal processing, digital signal processing, fault location, fault location, defects, digital integrated circuits, test method
31	William W. Agresti, William M. Evanco	Projecting Software Defects From Analyzing Ada Designs.	IEEE Trans. Software Eng.	1992	DBLP DOI BibTeX RDF	software defects projection, context coupling, Ada designs, process characteristics, import-export of declarations, reuse level, regression analyses, Ada, static analysis, software quality, software quality, software metrics, software reliability, statistical analysis, visibility, defect density
29	Anita Kumari, Javier F. Pulecio, Sanjukta Bhanja	Defect characterization in magnetic field coupled arrays.	ISQED	2009	DBLP DOI BibTeX RDF
29	Chenggang Bai, Kai-Yuan Cai, Q. P. Hu, Szu Hui Ng	On the Trend of Remaining Software Defect Estimation.	IEEE Trans. Syst. Man Cybern. Part A	2008	DBLP DOI BibTeX RDF
29	Youngki Hong, Jongmoon Baik, In-Young Ko, Ho-Jin Choi	A Value-Added Predictive Defect Type Distribution Model Based on Project Characteristics.	ACIS-ICIS	2008	DBLP DOI BibTeX RDF	In-process Defect Prediction, Defect Type Distribution, Weibull Function, Software Reliability, Maximum Likelihood Estimation
29	Mechelle Gittens, Pramod Gupta, David Godwin, Hebert Pereyra, Jeff Riihimaki	Focused iterative testing: a test automation case study.	DBTest	2008	DBLP DOI BibTeX RDF	testing, database management systems, multi-threaded
29	Kirsi Korhonen, Outi Salo	Exploring Quality Metrics to Support Defect Management Process in a Multi-site Organization - A Case Study.	ISSRE	2008	DBLP DOI BibTeX RDF
29	Matthieu Voiry, Kurosh Madani, Véronique Amarger, Joël Bernier	Optical Devices Diagnosis by Neural Classifier Exploiting Invariant Data Representation and Dimensionality Reduction Ability.	IWANN	2007	DBLP DOI BibTeX RDF
29	Tiziana D'Orazio, Marco Leo, Cataldo Guaragnella, Arcangelo Distante	Analysis of Image Sequences for Defect Detection in Composite Materials.	ACIVS	2007	DBLP DOI BibTeX RDF
29	Stelios Neophytou, Maria K. Michael	Hierarchical Fault Compatibility Identification for Test Generation with a Small Number of Specified Bits.	DFT	2007	DBLP DOI BibTeX RDF
29	Shuji Morisaki, Akito Monden, Tomoko Matsumura, Haruaki Tamada, Ken-ichi Matsumoto	Defect Data Analysis Based on Extended Association Rule Mining.	MSR	2007	DBLP DOI BibTeX RDF
29	Jane Huffman Hayes, Jeff Offutt	Input validation analysis and testing.	Empir. Softw. Eng.	2006	DBLP DOI BibTeX RDF	Specificationanalysis, Inputvalidation, Fault-based analysis, Fault-basedtesting, Empiricalresearch, Syntax-based, Interfaceverification, Systemtesting, Staticanalysis, Dynamictesting, Casestudy, Software testing
29	Smruti R. Sarangi, Abhishek Tiwari 0002, Josep Torrellas	Phoenix: Detecting and Recovering from Permanent Processor Design Bugs with Programmable Hardware.	MICRO	2006	DBLP DOI BibTeX RDF
29	Pankaj Jalote, Rajesh Munshi, Todd A. Proebsting	Components Have Test Buddies.	CBSE	2006	DBLP DOI BibTeX RDF
29	Swapna S. Gokhale, Robert E. Mullen	Queuing Models for Field Defect Resolution Process.	ISSRE	2006	DBLP DOI BibTeX RDF
29	Zarrin Langari, Anne Banks Pidduck	Quality, cleanroom and formal methods.	ACM SIGSOFT Softw. Eng. Notes	2005	DBLP DOI BibTeX RDF	cleanroom, formal methods, software quality
29	Stefan Wagner 0001, Jan Jürjens, Claudia Koller, Peter Trischberger	Comparing Bug Finding Tools with Reviews and Tests.	TestCom	2005	DBLP DOI BibTeX RDF
29	Jun-Suk Oh, Ho-Jin Choi	A Reflective Practice of Automated and Manual Code Reviews for a Studio Project.	ACIS-ICIS	2005	DBLP DOI BibTeX RDF
29	Liya Thomas, Lamine Mili, Clifford A. Shaffer, Ed Thomas	Defect detection on hardwood logs using high resolution three dimensional laser scan data.	ICIP	2004	DBLP DOI BibTeX RDF
29	Parastoo Mohagheghi, Reidar Conradi, Ole M. Killi, Henrik Schwarz	An Empirical Study of Software Reuse vs. Defect-Density and Stability.	ICSE	2004	DBLP DOI BibTeX RDF
29	Sergio Hernández, Doris Sáez, Domingo Mery	Neuro-Fuzzy Method for Automated Defect Detection in Aluminium Castings.	ICIAR (2)	2004	DBLP DOI BibTeX RDF	neuro-fuzzy methods, aluminium castings, ROC curves, automated visual inspection
29	Osamu Mizuno, Eijiro Shigematsu, Yasunari Takagi, Tohru Kikuno	On Estimating Testing Effort Needed to Assure Field Quality in Software Development.	ISSRE	2002	DBLP DOI BibTeX RDF
29	Alessandro Bianchi, Filippo Lanubile, Giuseppe Visaggio	A Controlled Experiment To Assess The Effectiveness Of Inspection Meetings.	IEEE METRICS	2001	DBLP DOI BibTeX RDF
29	Nurit Dor, Michael Rodeh, Shmuel Sagiv	Cleanness Checking of String Manipulations in C Programs via Integer Analysis.	SAS	2001	DBLP DOI BibTeX RDF
29	Wieslaw Kuzmicz, Witold A. Pleskacz, Jaan Raik, Raimund Ubar	Defect-Oriented Fault Simulation and Test Generation in Digital Circuits.	ISQED	2001	DBLP DOI BibTeX RDF
29	Wojciech Maly	Realistic Fault Modeling for VLSI Testing.	DAC	1987	DBLP DOI BibTeX RDF
29	Evelyn Moritz	Case study: How analysis of customer found defects can be used by system test to improve quality.	ICSE Companion	2009	DBLP DOI BibTeX RDF
29	Hongyu Zhang 0002	An investigation of the relationships between lines of code and defects.	ICSM	2009	DBLP DOI BibTeX RDF
29	Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras	Experimental Characterization of CMOS Interconnect Open Defects.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2008	DBLP DOI BibTeX RDF
29	Marc Eaddy, Thomas Zimmermann 0001, Kaitin D. Sherwood, Vibhav Garg, Gail C. Murphy, Nachiappan Nagappan, Alfred V. Aho	Do Crosscutting Concerns Cause Defects?	IEEE Trans. Software Eng.	2008	DBLP DOI BibTeX RDF
29	Matthew Arnold, Martin T. Vechev, Eran Yahav	QVM: an efficient runtime for detecting defects in deployed systems.	OOPSLA	2008	DBLP DOI BibTeX RDF	algorithms, reliability, virtual machines
29	Xin Bi, Han Ding	Detection of Local Mura Defects in TFT-LCD Using Machine Vision.	ICIRA (1)	2008	DBLP DOI BibTeX RDF	Mura, defect inspection, real Gabor filter, machine vision, TFT-LCD
29	Mohammad Gh. Mohammad, Kewal K. Saluja	Testing Flash Memories for Tunnel Oxide Defects.	VLSI Design	2008	DBLP DOI BibTeX RDF
29	Margarita Vinnikov, Robert S. Allison, Dominik Swierad	Real-time simulation of visual defects with gaze-contingent display.	ETRA	2008	DBLP DOI BibTeX RDF	eye disease, foveated imaging, head-eye tracking system, variable resolution image, image processing, low vision, gaze contingent display, visual fields
29	Liya Thomas, Lamine Mili	A Robust GM-Estimator for the Automated Detection of External Defects on Barked Hardwood Logs and Stems.	IEEE Trans. Signal Process.	2007	DBLP DOI BibTeX RDF
29	Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi	Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages.	VTS	2007	DBLP DOI BibTeX RDF	Current Based Diagnosis, Current Signatures, I_DDQ, Very Low Voltage, CMOS, Bridging Defect
29	Adrian Schröter	Predicting Defects and Changes with Import Relations.	MSR	2007	DBLP DOI BibTeX RDF
29	Josh Yang, Baosheng Wang, Yuejian Wu, André Ivanov	Fast detection of data retention faults and other SRAM cell open defects.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2006	DBLP DOI BibTeX RDF
29	Shih-Yu Yang, Christos A. Papachristou	A method for detecting interconnect DSM defects in systems on chip.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2006	DBLP DOI BibTeX RDF
29	Bram Kruseman, Manuel Heiligers	On test conditions for the detection of open defects.	DATE	2006	DBLP DOI BibTeX RDF
29	Kui Yue, Daniel Huber, Burcu Akinci, Ramesh Krishnamurti	The ASDMCon Project: The Challenge of Detecting Defects on Construction Sites.	3DPVT	2006	DBLP DOI BibTeX RDF
29	Jozsef Dudas, Cory Jung, Linda Wu, Glenn H. Chapman, Israel Koren, Zahava Koren	On-Line Mapping of In-Field Defects in Image Sensor Arrays.	DFT	2006	DBLP DOI BibTeX RDF
29	Naouel Moha, Yann-Gaël Guéhéneuc, Pierre Leduc	Automatic Generation of Detection Algorithms for Design Defects.	ASE	2006	DBLP DOI BibTeX RDF
29	Xijiang Lin, Janusz Rajski	The Impacts of Untestable Defects on Transition Fault Testing.	VTS	2006	DBLP DOI BibTeX RDF
29	Timo Koponen	Life cycle of Defects in Open Source Software Projects. (PDF / PS)	OSS	2006	DBLP DOI BibTeX RDF
29	Taiga Nakamura	ACM student research competition reception - HPCBugBase: an experience base for HPC defects.	SC	2006	DBLP DOI BibTeX RDF
29	Taiga Nakamura	ACM student research competition finalists - HPCBugBase: an experience base for HPC defects.	SC	2006	DBLP DOI BibTeX RDF
29	Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram	Timing-based delay test for screening small delay defects.	DAC	2006	DBLP DOI BibTeX RDF	test generation, delay testing
29	Jonathan R. Carter, Sule Ozev, Daniel J. Sorin	Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown.	DATE	2005	DBLP DOI BibTeX RDF
29	Ketan Mehta, Matthew Lee 0001, T. J. Jankun-Kelly	Exploring Defects in Nematic Liquid Crystals.	IEEE Visualization	2005	DBLP DOI BibTeX RDF
29	Jennifer Dworak, Brad Cobb, James Wingfield, M. Ray Mercer	Balanced Excitation and Its Effect on the Fortuitous Detection of Dynamic Defects.	DATE	2004	DBLP DOI BibTeX RDF
29	Luigi Dilillo, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan	Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution.	Asian Test Symposium	2004	DBLP DOI BibTeX RDF
29	Hui Zeng, David Rine	Estimation of Software Defects Fix Effort Using Neural Networks.	COMPSAC Workshops	2004	DBLP DOI BibTeX RDF
29	Jennifer Dworak, James Wingfield, M. Ray Mercer	A Preliminary Investigation of Observation Diversity for Enhancing Fortuitous Detection of Defects.	DFT	2004	DBLP DOI BibTeX RDF
29	Edward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, François-Fabien Ferhani, Edward Li, Subhasish Mitra	ELF-Murphy Data on Defects and Test Sets.	VTS	2004	DBLP DOI BibTeX RDF
29	Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski	Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model.	ITC	2004	DBLP DOI BibTeX RDF
29	Shahdad Irajpour, Sandeep K. Gupta 0001, Melvin A. Breuer	Timing-Independent Testing of Crosstalk in the Presence of Delay Producing Defects Using Surrogate Fault Models.	ITC	2004	DBLP DOI BibTeX RDF
29	Dave Mark, Jenny Fan	Localizing Open Interconnect Defects using Targeted Routing in FPGA's.	ITC	2004	DBLP DOI BibTeX RDF
29	Scott Thomas, Rafic Z. Makki, Sai Kishore Vavilala	Measurement and Analysis of Physical Defects for Dynamic Supply Current Testing.	DELTA	2004	DBLP DOI BibTeX RDF
29	Ramanath Subramanyam, Mayuram S. Krishnan	Empirical Analysis of CK Metrics for Object-Oriented Design Complexity: Implications for Software Defects.	IEEE Trans. Software Eng.	2003	DBLP DOI BibTeX RDF	software metrics validation, Java, C++, Object-oriented design, object-oriented languages
29	José A. Calderón-Martínez, Pascual Campoy Cervera	Defects Detection in Continuous Manufacturing by Means of Convolutional Neural Networks.	IWANN (2)	2003	DBLP DOI BibTeX RDF
29	Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo	Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test.	Asian Test Symposium	2003	DBLP DOI BibTeX RDF
29	Puneet Gupta, Michael S. Hsiao	High Quality ATPG for Delay Defects.	ITC	2003	DBLP DOI BibTeX RDF
29	Li-C. Wang, Angela Krstic, Leonard Lee, Kwang-Ting Cheng, M. Ray Mercer, Thomas W. Williams, Magdy S. Abadir	Using Logic Models To Predict The Detection Behavior Of Statistical Timing Defects.	ITC	2003	DBLP DOI BibTeX RDF
29	Evanthia Papadopoulou	Critical area computation for missing material defects in VLSIcircuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2001	DBLP DOI BibTeX RDF
29	Suchendra M. Bhandarkar, Timothy D. Faust, Mengjin Tang	CATALOG: a system for detection and rendering of internal log defects using computer tomography.	Mach. Vis. Appl.	1999	DBLP DOI BibTeX RDF	Automated log inspection, Automated lumber grading, Non-destructive evaluation, Non-destructive quality assessment, Computer tomography
29	Eugeni Isern 0001, Miquel Roca 0001, Jaume Segura 0001	Analyzing the Need for ATPG Targeting GOS Defects.	VTS	1999	DBLP DOI BibTeX RDF
29	Carsten Lehr, Claus-E. Liedtke	3D Reconstruction of Volume Defects from Few X-Ray Images.	CAIP	1999	DBLP DOI BibTeX RDF	calibration, tomography, X-ray
29	Víctor H. Champac, Joan Figueras	Testability of floating gate defects in sequential circuits.	VTS	1995	DBLP DOI BibTeX RDF	floating gate defect testability, logic detectability conditions, defective transistors, logically untestable branches, scan path cell, CMOS latch cell, scan path flip-flops, fault diagnosis, logic testing, integrated circuit testing, sequential circuits, sequential circuits, simulated results, flip-flops, CMOS logic circuits, integrated circuit modelling, I/sub DDQ/ testing
29	José Pineda de Gyvez, Chennian Di	IC defect sensitivity for footprint-type spot defects.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1992	DBLP DOI BibTeX RDF
29	E. Rorris, R. R. O'Brien, F. F. Morehead, R. F. Lever, J. P. Peng, G. R. Srinivasan	A new approach to the simulation of the coupled point defects and impurity diffusion.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1990	DBLP DOI BibTeX RDF