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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 4169 occurrences of 2344 keywords
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Results
Found 8307 publication records. Showing 8307 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
24 | Philippe Raipin Parvédy, Michel Raynal |
Reliable Compare & Swap for Fault-Tolerant Synchronization. ![Search on Bibsonomy](Pics/bibsonomy.png) |
WORDS ![In: 8th IEEE International Workshop on Object-Oriented Real-Time Dependable Systems (WORDS 2003), 15-17 January 2003, Guadalajara, Mexico, pp. 50-55, 2003, IEEE Computer Society, 0-7695-1929-6. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
Compare&Swap, Fault-Tolerance, Graceful Degradation, Crash Failure, Wait-free Synchronization, Omission Failure |
24 | Xiangdong Xuan, Abhijit Chatterjee |
Sensitivity and Reliability Evaluation for Mixed-Signal ICs under Electromigration and Hot-Carrier Effects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 24-26 October 2001, San Francisco, CA, USA, Proceedings, pp. 323-328, 2001, IEEE Computer Society, 0-7695-1203-8. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
hot-carrier, hierarchical analysis, hot-spot, performance degradation, Electromigration |
24 | Ramesh Karri, Kyosun Kim, Miodrag Potkonjak |
Computer Aided Design of Fault-Tolerant Application Specific Programmable Processors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 49(11), pp. 1272-1284, 2000. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
Application specific programmable processors, fault tolerance, graceful degradation, behavioral synthesis |
24 | Chris Faisstnauer, Dieter Schmalstieg, Werner Purgathofer |
Priority Round-Robin Scheduling for Very Large Virtual Environments. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VR ![In: Virtual Reality 2000 Conference, VR'00, New Brunswick, New Jersey, USA, March 18-22, 2000, Proceedings, pp. 135-142, 2000, IEEE Computer Society, 0-7695-0478-7. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
scheduling, virtual environments, competition, priorities, graceful degradation, bottleneck, starvation, round robin, output sensitive |
24 | Andreas Savva, Takashi Nanya |
A Gracefully Degrading Massively Parallel System Using the BSP Model, and Its Evaluation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 48(1), pp. 38-52, 1999. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
memory duplication, RSM, fault tolerance, PRAM, graceful degradation, MPP, BSP model |
24 | Michael J. Vrhel, B. L. Trus |
Multi-channel restoration of electron micrographs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICIP ![In: Proceedings 1995 International Conference on Image Processing, Washington, DC, USA, October 23-26, 1995, pp. 516-519, 1995, IEEE Computer Society, 0-8186-7310-9. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
electron micrographs, projection based multichannel restoration method, degradation uncertainty, multichannel deconvolution, simulation, image restoration, sensitivity, noise reduction, deconvolution, interference suppression, electron microscopy, input signal |
23 | Basab Datta, Wayne P. Burleson |
Circuit-level NBTI macro-models for collaborative reliability monitoring. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 20th ACM Great Lakes Symposium on VLSI 2009, Providence, Rhode Island, USA, May 16-18 2010, pp. 453-458, 2010, ACM, 978-1-4503-0012-4. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
macro-models, on-chip sensors, calibration, NBTI |
23 | Bipul Chandra Paul, Kunhyuk Kang, Haldun Kufluoglu, Muhammad Ashraful Alam, Kaushik Roy 0001 |
Negative Bias Temperature Instability: Estimation and Design for Improved Reliability of Nanoscale Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(4), pp. 743-751, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
23 | Hong Luo, Yu Wang 0002, Ku He, Rong Luo, Huazhong Yang, Yuan Xie 0001 |
Modeling of PMOS NBTI Effect Considering Temperature Variation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA, pp. 139-144, 2007, IEEE Computer Society, 978-0-7695-2795-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
23 | Zbigniew M. Wójcik |
System Health Prognostic Model Using Rough Sets. ![Search on Bibsonomy](Pics/bibsonomy.png) |
RSFDGrC (1) ![In: Rough Sets, Fuzzy Sets, Data Mining, and Granular Computing, 10th International Conference, RSFDGrC 2005, Regina, Canada, August 31 - September 3, 2005, Proceedings, Part I, pp. 522-531, 2005, Springer, 3-540-28653-5. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
23 | Minoru Mori |
Video text recognition using feature compensation as category-dependent feature extraction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICDAR ![In: 7th International Conference on Document Analysis and Recognition (ICDAR 2003), 2-Volume Set, 3-6 August 2003, Edinburgh, Scotland, UK, pp. 645-649, 2003, IEEE Computer Society, 0-7695-1960-1. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
23 | Steve F. Hiebert, Ratna Babij Chinnam |
Role of Artificial Neural Networks and Wavelets in On-Line Reliability Monitoring of Physical Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IJCNN (6) ![In: Proceedings of the IEEE-INNS-ENNS International Joint Conference on Neural Networks, IJCNN 2000, Neural Computing: New Challenges and Perspectives for the New Millennium, Como, Italy, July 24-27, 2000, Volume 6, pp. 369-374, 2000, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
20 | Yue Hai, Mei Liang, Yuze Yang, Hailian Sun, Ruonan Li, Yanzheng Yang, Hua Zheng |
Detection of Typical Forest Degradation Patterns: Characteristics and Drivers of Forest Degradation in Northeast China. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Remote. Sens. ![In: Remote. Sens. 16(8), pp. 1389, April 2024. The full citation details ...](Pics/full.jpeg) |
2024 |
DBLP DOI BibTeX RDF |
|
20 | Man Ho Ling, Suk Joo Bae |
A random-effect gamma process model with random initial degradation for accelerated destructive degradation testing data. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Qual. Reliab. Eng. Int. ![In: Qual. Reliab. Eng. Int. 40(1), pp. 374-387, February 2024. The full citation details ...](Pics/full.jpeg) |
2024 |
DBLP DOI BibTeX RDF |
|
20 | Fengming Kang, Lirong Cui, Zhisheng Ye 0001, Yu Zhou 0032 |
Reliability analysis for systems with self-healing mechanism in degradation-shock dependence processes with changing degradation rate. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Reliab. Eng. Syst. Saf. ![In: Reliab. Eng. Syst. Saf. 241, pp. 109671, January 2024. The full citation details ...](Pics/full.jpeg) |
2024 |
DBLP DOI BibTeX RDF |
|
20 | Kangzhe He, Qiuzhuang Sun, Min Xie 0001, Way Kuo |
Sequential Bayesian Planning for Accelerated Degradation Tests Considering Sensor Degradation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Reliab. ![In: IEEE Trans. Reliab. 72(3), pp. 964-974, September 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
20 | Bokai Zheng, Cen Chen, Yigang Lin, Xuerong Ye, Guofu Zhai |
Reliability Analysis Based on a Bivariate Degradation Model Considering Random Initial State and Its Correlation With Degradation Rate. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Reliab. ![In: IEEE Trans. Reliab. 72(1), pp. 37-48, March 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
20 | Yang Li 0088, Shuiqing Xu, Hongtian Chen, Li Jia 0002, Kun Ma 0002 |
A General Degradation Process of Useful Life Analysis Under Unreliable Signals for Accelerated Degradation Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Ind. Informatics ![In: IEEE Trans. Ind. Informatics 19(6), pp. 7742-7750, June 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
20 | Xin Wu, Tingting Huang, Jie Liu 0005 |
Common stochastic effects induced multivariate degradation process with temporal dependency in degradation characteristic and unit dimensions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Reliab. Eng. Syst. Saf. ![In: Reliab. Eng. Syst. Saf. 239, pp. 109505, November 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
20 | Wanjun Hou, Yizhen Peng |
Adaptive ensemble gaussian process regression-driven degradation prognosis with applications to bearing degradation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Reliab. Eng. Syst. Saf. ![In: Reliab. Eng. Syst. Saf. 239, pp. 109479, November 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
20 | Cheng Zhang, Yu Zhu 0004, Qingsen Yan, Jinqiu Sun, Yanning Zhang |
All-in-one Multi-degradation Image Restoration Network via Hierarchical Degradation Representation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2308.03021, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
20 | Yue Sun, Kai Wang 0023, Aidong Xu, Beiye Guan, Ruiqi Li, Bo Zhang, Xiufang Zhou |
Degradation-Sensitive Health Indicator Construction for Precise Insulation Degradation Monitoring of Electromagnetic Coils. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Entropy ![In: Entropy 25(9), pp. 1354, September 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
20 | Qi Song, Wu Shi, Guojing Ge, Liang Chang 0001 |
Degradation Conditioned GAN for Degradation Generalization of Face Restoration Models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICIP ![In: IEEE International Conference on Image Processing, ICIP 2023, Kuala Lumpur, Malaysia, October 8-11, 2023, pp. 520-524, 2023, IEEE, 978-1-7281-9835-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
20 | Chen Zhang 0018, Zefan Huang, Beatrix Xue Lin Tung, Marcelo H. Ang, Daniela Rus |
SMART-Degradation: A Dataset for LiDAR Degradation Evaluation in Rain. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IROS ![In: IROS, pp. 7400-7406, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
20 | Cheng Zhang, Yu Zhu 0004, Qingsen Yan, Jinqiu Sun, Yanning Zhang |
All-in-one Multi-degradation Image Restoration Network via Hierarchical Degradation Representation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Multimedia ![In: Proceedings of the 31st ACM International Conference on Multimedia, MM 2023, Ottawa, ON, Canada, 29 October 2023- 3 November 2023, pp. 2285-2293, 2023, ACM. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
20 | Kun Wang |
Degradation analysis for helical springs based on degradation amount distribution with new model selection criteria. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EITCE ![In: Proceedings of the 2023 7th International Conference on Electronic Information Technology and Computer Engineering, EITCE 2023, Xiamen, China, October 20-22, 2023, pp. 198-203, 2023, ACM. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
20 | Karl Montalban |
Advancing LiDAR Perception in Degraded Visual Environments: a Probabilistic Approach for Degradation Analysis and Inference of Visibility. (Perception LiDAR dans des Environnements Visuels Dégradés: Une Approche Probabiliste pour l'Analyse de la Dégradation et l'Inférence de la Visibilité). ![Search on Bibsonomy](Pics/bibsonomy.png) |
|
2023 |
RDF |
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20 | Bokai Zheng, Cen Chen, Yigang Lin, Yifan Hu, Xuerong Ye, Guofu Zhai, Enrico Zio |
Optimal design of step-stress accelerated degradation test oriented by nonlinear and distributed degradation process. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Reliab. Eng. Syst. Saf. ![In: Reliab. Eng. Syst. Saf. 217, pp. 108087, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
20 | Isyaku Muhammad, Xin-gang Wang, Changyou Li, Mingming Yan, Mustapha Mukhtar, Mustapha Muhammad |
Reliability Analysis with Wiener-Transmuted Truncated Normal Degradation Model for Linear and Non-Negative Degradation Data. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Symmetry ![In: Symmetry 14(2), pp. 353, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
20 | Bin Xue, Fangmin Xu, Xing Huang, Zhongbin Xu, Xuechang Zhang |
Improved similarity based prognostics method for turbine engine degradation with degradation consistency test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Appl. Intell. ![In: Appl. Intell. 52(9), pp. 10181-10201, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
20 | Sravan Pannala, Valentin Sulzer, Jason B. Siegel, Anna G. Stefanopoulou |
Methodology for Accelerated Inter-Cycle Simulations of Li-ion Battery Degradation with Intra-Cycle Resolved Degradation Mechanisms. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACC ![In: American Control Conference, ACC 2022, Atlanta, GA, USA, June 8-10, 2022, pp. 1788-1793, 2022, IEEE, 978-1-6654-5196-3. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
20 | Dongzhen Lyu, Bin Zhang 0008, Enrico Zio, Tao Yang |
The explainable uncertainty in degradation process: a discovery from non-accelerated batteries degradation experiment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IECON ![In: IECON 2022 - 48th Annual Conference of the IEEE Industrial Electronics Society, Brussels, Belgium, October 17-20, 2022, pp. 1-6, 2022, IEEE, 978-1-6654-8025-3. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
|
20 | Charles Lorenzo, David Bouquain, Samuel Hibon, Daniel Hissel |
Synthesis of degradation mechanisms and of their impacts on degradation rates on proton-exchange membrane fuel cells and lithium-ion nickel-manganese-cobalt batteries in hybrid transport applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Reliab. Eng. Syst. Saf. ![In: Reliab. Eng. Syst. Saf. 212, pp. 107369, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
20 | Guilherme A. Veloso, Rosangela Helena Loschi |
Dynamic linear degradation model: Dealing with heterogeneity in degradation paths. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Reliab. Eng. Syst. Saf. ![In: Reliab. Eng. Syst. Saf. 210, pp. 107446, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
20 | Miaoxin Chang, Xianzhen Huang, Frank P. A. Coolen, Tahani Coolen-Maturi |
Reliability analysis for systems based on degradation rates and hard failure thresholds changing with degradation levels. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Reliab. Eng. Syst. Saf. ![In: Reliab. Eng. Syst. Saf. 216, pp. 108007, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
20 | Zhen Chen, Yaping Li, Di Zhou, Tangbin Xia, Ershun Pan |
Two-phase degradation data analysis with change-point detection based on Gaussian process degradation model. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Reliab. Eng. Syst. Saf. ![In: Reliab. Eng. Syst. Saf. 216, pp. 107916, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
20 | Yanting Pei, Yaping Huang, Qi Zou, Xingyuan Zhang, Song Wang 0002 |
Effects of Image Degradation and Degradation Removal to CNN-Based Image Classification. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Pattern Anal. Mach. Intell. ![In: IEEE Trans. Pattern Anal. Mach. Intell. 43(4), pp. 1239-1253, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
20 | Zhen Chen, Tangbin Xia, Yanting Li, Ershun Pan |
Tweedie Exponential Dispersion Processes for Degradation Modeling, Prognostic, and Accelerated Degradation Test Planning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Reliab. ![In: IEEE Trans. Reliab. 69(3), pp. 887-902, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
20 | Qiuzhuang Sun, Zhi-Sheng Ye 0001, Xiaoyan Zhu |
Managing component degradation in series systems for balancing degradation through reallocation and maintenance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IISE Trans. ![In: IISE Trans. 52(7), pp. 797-810, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
20 | Jianzhong Zhou, Yahui Shan, Jie Liu 0017, Yanhe Xu, Yang Zheng 0004 |
Degradation Tendency Prediction for Pumped Storage Unit Based on Integrated Degradation Index Construction and Hybrid CNN-LSTM Model. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sensors ![In: Sensors 20(15), pp. 4277, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
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20 | Koceila Abid |
Data-driven Approach for Fault Prognostics of Industrial Systems - From Using No, Insufficient, to Multiple Historical Degradation Sequences. (Approche guidée par les données pour le pronostic des pannes des systèmes industriels - de l'utilisation d'aucune, peu, à de multples séquences de dégradation historiques). ![Search on Bibsonomy](Pics/bibsonomy.png) |
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2020 |
RDF |
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20 | Tran Minh Hao La |
Modélisation stochastique de la dégradation et de la maintenance de systèmes dynamiques dans le plan complexe. (Stochastic modelling of degradation and of maintenance for dynamical systems in complex plane). ![Search on Bibsonomy](Pics/bibsonomy.png) |
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2020 |
RDF |
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20 | Lijuan Shen, Yudong Wang, Qingqing Zhai, Yincai Tang |
Degradation Modeling Using Stochastic Processes With Random Initial Degradation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Reliab. ![In: IEEE Trans. Reliab. 68(4), pp. 1320-1329, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
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20 | Donghui Pan, Siliang Lu, Yongbin Liu, Wenzhi Yang, Jia-Bao Liu |
Degradation Data Analysis Using a Wiener Degradation Model With Three-Source Uncertainties. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 7, pp. 37896-37907, 2019. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
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20 | Marjorie Bournat |
Graceful Degradation and Speculation for Robots in Highly Dynamic Environments. (Dégradation progressive et spéculation pour les robots dans des environnements hautement dynamiques). ![Search on Bibsonomy](Pics/bibsonomy.png) |
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2019 |
RDF |
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20 | Jianwei Shi 0004 |
Simulation de la pyrolyse de gaines de câbles électriques exposés au feu : Caractérisation et modélisation de la morphologie et de la conductivité thermique selon l'état de dégradation. (Simulation of the pyrolysis of electrical cable sheaths exposed to fire : Characterization and modelling of the morphology and thermal conductivity evolution during the degradation). ![Search on Bibsonomy](Pics/bibsonomy.png) |
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2019 |
RDF |
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20 | Rivert P. Braga Oliveira, Rosangela Helena Loschi, Marta A. Freitas |
Skew-Heavy-Tailed Degradation Models: An Application to Train Wheel Degradation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Reliab. ![In: IEEE Trans. Reliab. 67(1), pp. 129-141, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
20 | Somayeh Mireh, Ahmad Khodadadi, Firoozeh Haghighi |
Joint Modeling of Linear Degradation and Multiple Dependent Competing Risks Data under a Step-Stress Accelerated Degradation Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Stat. Theory Appl. ![In: J. Stat. Theory Appl. 17(2), pp. 340-358, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
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20 | Faisal Khan 0003, Omer Faruk Eker, Atif Khan, Wasim A. Orfali |
Adaptive Degradation Prognostic Reasoning by Particle Filter with a Neural Network Degradation Model for Turbofan Jet Engine. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Data ![In: Data 3(4), pp. 49, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
20 | Jiawan Zhang, Han Tao |
On-site immersive visualization and rapid degradation annotation for mural degradation interactive analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Vis. ![In: J. Vis. 21(5), pp. 841-855, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
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20 | Jacopo Franco, Ben Kaczer, Adrian Vaisman Chasin, Erik Bury, Dimitri Linten |
Hot electron and hot hole induced degradation of SiGe p-FinFETs studied by degradation maps in the entire bias space. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018, pp. 5, 2018, IEEE, 978-1-5386-5479-8. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
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20 | Weiwen Peng, Yan-Feng Li, Yuanjian Yang, Jinhua Mi, Hong-Zhong Huang |
Bayesian Degradation Analysis With Inverse Gaussian Process Models Under Time-Varying Degradation Rates. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Reliab. ![In: IEEE Trans. Reliab. 66(1), pp. 84-96, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
20 | Ya Shun Wang, Xun Chen, Yuan-yuan Tan |
Optimal Design of Step-stress Accelerated Degradation Test with Multiple Stresses and Multiple Degradation Measures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Qual. Reliab. Eng. Int. ![In: Qual. Reliab. Eng. Int. 33(8), pp. 1655-1668, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
20 | Han Wang 0013, Yu Zhao 0003, Xiaobing Ma 0001, Li Yang 0004 |
Equivalence analysis of accelerated degradation mechanism based on stochastic degradation models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Qual. Reliab. Eng. Int. ![In: Qual. Reliab. Eng. Int. 33(8), pp. 2281-2294, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
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20 | Yong Yu 0013, Changhua Hu, Xiaosheng Si, Jianxun Zhang 0001 |
Degradation Data-Driven Remaining Useful Life Estimation in the Absence of Prior Degradation Knowledge. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Control. Sci. Eng. ![In: J. Control. Sci. Eng. 2017, pp. 4375690:1-4375690:11, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
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20 | Wonwook Oh, Soo Hyun Bae, Sung-Il Chan, Hae-Seok Lee, Donghwan Kim, Nochang Park |
Field degradation prediction of potential induced degradation of the crystalline silicon photovoltaic modules based on accelerated test and climatic data. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 76-77, pp. 596-600, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
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20 | Sheng-Tsaing Tseng, I-Chen Lee |
Optimum Allocation Rule for Accelerated Degradation Tests With a Class of Exponential-Dispersion Degradation Models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Technometrics ![In: Technometrics 58(2), pp. 244-254, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
20 | Tzong-Ru Tsai, Wen-Yun Sung, Yuhlong Lio, Shing I. Chang, Jye-Chyi Lu |
Optimal Two-Variable Accelerated Degradation Test Plan for Gamma Degradation Processes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Reliab. ![In: IEEE Trans. Reliab. 65(1), pp. 459-468, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
20 | Xun Xiao, Zhisheng Ye 0001 |
Optimal Design for Destructive Degradation Tests With Random Initial Degradation Values Using the Wiener Process. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Reliab. ![In: IEEE Trans. Reliab. 65(3), pp. 1327-1342, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
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20 | Tianyu Liu, Quan Sun, Zhengqiang Pan, Jing Feng, Yanzhen Tang |
Irregular Time-Varying Stress Degradation Path Modeling: a Case Study on Lithium-ion Cell Degradation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Qual. Reliab. Eng. Int. ![In: Qual. Reliab. Eng. Int. 32(5), pp. 1889-1902, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
20 | Tao Yuan, Suk Joo Bae, Xiaoyan Zhu 0002 |
A Bayesian approach to degradation-based burn-in optimization for display products exhibiting two-phase degradation patterns. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Reliab. Eng. Syst. Saf. ![In: Reliab. Eng. Syst. Saf. 155, pp. 55-63, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
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20 | Jianlin Huang, Dusan S. Golubovic, Sau Koh, Dao-Guo Yang, Xiupeng Li, Xuejun Fan, G. Q. Zhang |
Lumen degradation modeling of white-light LEDs in step stress accelerated degradation test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Reliab. Eng. Syst. Saf. ![In: Reliab. Eng. Syst. Saf. 154, pp. 152-159, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
20 | Stéphen Pirlot |
Survivabilité dans les réseaux de transport de vidéo et d'audio sans dégradation de la qualité de service perçue par l'utilisateur. (Survivability in video and audio communication networks without qualité of experience degradation). ![Search on Bibsonomy](Pics/bibsonomy.png) |
|
2016 |
RDF |
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20 | Alicia Salerno |
Évaluation de l'efficacité de dégradation et de décontamination cutanée du CeO2 vis-à-vis d'un composé organophosphoré, le Paraoxon. (Evaluating the effectiveness of CeO2 for the degradation and skin decontamination of an organophosphorus pesticide, Paraoxon). ![Search on Bibsonomy](Pics/bibsonomy.png) |
|
2016 |
RDF |
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20 | Firoozeh Haghighi, Suk Joo Bae |
Reliability Estimation from Linear Degradation and Failure Time Data With Competing Risks Under a Step-Stress Accelerated Degradation Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Reliab. ![In: IEEE Trans. Reliab. 64(3), pp. 960-971, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
20 | Ye Zhang, Haitao Liao |
Analysis of Destructive Degradation Tests for a Product With Random Degradation Initiation Time. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Reliab. ![In: IEEE Trans. Reliab. 64(1), pp. 516-527, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
20 | Jyun-You Chiang, Yuhlong Lio, Tzong-Ru Tsai |
Degradation Tests Using Geometric Brownian Motion Process for Lumen Degradation Data. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Qual. Reliab. Eng. Int. ![In: Qual. Reliab. Eng. Int. 31(8), pp. 1797-1806, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
20 | Nuria C. Caballé, I. T. Castro, C. J. Pérez 0001, José Manuel Lanza-Gutiérrez |
A condition-based maintenance of a dependent degradation-threshold-shock model in a system with multiple degradation processes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Reliab. Eng. Syst. Saf. ![In: Reliab. Eng. Syst. Saf. 134, pp. 98-109, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
20 | Cheng-Hung Hu, Ming-Yung Lee, Jen Tang |
Optimum step-stress accelerated degradation test for Wiener degradation process under constraints. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Eur. J. Oper. Res. ![In: Eur. J. Oper. Res. 241(2), pp. 412-421, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
20 | Heonsang Lim |
Optimum Accelerated Degradation Tests for the Gamma Degradation Process Case under the Constraint of Total Cost. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Entropy ![In: Entropy 17(5), pp. 2556-2572, 2015. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
20 | Aude Nuscia Taïbi |
Désertification et dégradation. Ré-interrogation des concepts à la lumière d'exemples africains. (Desertification and degradation. Rethinking key concepts from african examples). ![Search on Bibsonomy](Pics/bibsonomy.png) |
|
2015 |
RDF |
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20 | Van Cuong Kieu |
Modèle de dégradation d'images de documents anciens pour la génération de données semi-synthétiques. (Semi-synthetic ancient document image generation by using document degradation models). ![Search on Bibsonomy](Pics/bibsonomy.png) |
|
2014 |
RDF |
|
20 | Luis A. Bojórquez-Tapia, Gustavo M. Cruz-Bello, Laura Luna-González |
Connotative land degradation mapping: A knowledge-based approach to land degradation assessment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Environ. Model. Softw. ![In: Environ. Model. Softw. 40, pp. 51-64, 2013. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
20 | Prashant Singh, Eric Karl, David T. Blaauw, Dennis Sylvester |
Compact Degradation Sensors for Monitoring NBTI and Oxide Degradation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 20(9), pp. 1645-1655, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
20 | Sun Quan, Paul H. Kvam |
Multi-cause degradation path model: a case study on rubidium lamp degradation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Qual. Reliab. Eng. Int. ![In: Qual. Reliab. Eng. Int. 27(6), pp. 781-793, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
20 | Rafael Muñoz-Tamayo |
Modélisation mathématique de la dégradation des hydrates de carbone dans le côlon humain. (Mathematical modelling of carbohydrate degradation in the human colon). ![Search on Bibsonomy](Pics/bibsonomy.png) |
|
2010 |
RDF |
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20 | Sheng-Tsaing Tseng, Narayanaswamy Balakrishnan 0001, Chih-Chun Tsai |
Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Reliab. ![In: IEEE Trans. Reliab. 58(4), pp. 611-618, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
20 | Marta A. Freitas, Maria Luíza G. de Toledo, Enrico A. Colosimo, Magda C. Pires |
Using degradation data to assess reliability: a case study on train wheel degradation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Qual. Reliab. Eng. Int. ![In: Qual. Reliab. Eng. Int. 25(5), pp. 607-629, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
20 | Elie Maricau, Pieter De Wit, Georges G. E. Gielen |
An analytical model for hot carrier degradation in nanoscale CMOS suitable for the simulation of degradation in analog IC applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 48(8-9), pp. 1576-1580, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
20 | R. Dreesen, Kris Croes, Jean Manca, Ward De Ceuninck, Luc De Schepper, A. Pergoot, Guido Groeseneken |
A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 41(3), pp. 437-443, 2001. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
19 | Harold van Heerde, Maarten M. Fokkinga, Nicolas Anciaux |
A Framework to Balance Privacy and Data Usability Using Data Degradation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CSE (3) ![In: Proceedings of the 12th IEEE International Conference on Computational Science and Engineering, CSE 2009, Vancouver, BC, Canada, August 29-31, 2009, pp. 146-153, 2009, IEEE Computer Society, 978-1-4244-5334-4. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
19 | Nagi Gebraeel, Mark A. Lawley |
A Neural Network Degradation Model for Computing and Updating Residual Life Distributions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans Autom. Sci. Eng. ![In: IEEE Trans Autom. Sci. Eng. 5(1), pp. 154-163, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
19 | Xueyuan Zhao, Zhengang Pan, Peter W. C. Chan, Chih-Lin I, Roger Shu-Kwan Cheng, Vincent K. N. Lau |
Degradation in Convolutionally Coded V-BLAST System and A Performance Improvement Method. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTC Spring ![In: Proceedings of the 67th IEEE Vehicular Technology Conference, VTC Spring 2008, 11-14 May 2008, Singapore, pp. 544-548, 2008, IEEE. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
19 | Shai Halevi, Tal Rabin |
Degradation and Amplification of Computational Hardness. ![Search on Bibsonomy](Pics/bibsonomy.png) |
TCC ![In: Theory of Cryptography, Fifth Theory of Cryptography Conference, TCC 2008, New York, USA, March 19-21, 2008., pp. 626-643, 2008, Springer, 978-3-540-78523-1. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
19 | Yin Wang, Ke Gong, Zhaowu Chen |
Theoretical Analysis of Performance Degradation Due to Phase Noise and I/Q Imbalance in MQAM-OFDM Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICC ![In: Proceedings of IEEE International Conference on Communications, ICC 2008, Beijing, China, 19-23 May 2008, pp. 3627-3631, 2008, IEEE. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
19 | Nilanjan Banerjee, Charles Augustine, Kaushik Roy 0001 |
Fault-Tolerance with Graceful Degradation in Quality: A Design Methodology and Its Application to Digital Signal Processing Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA, pp. 323-331, 2008, IEEE Computer Society, 978-0-7695-3365-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
19 | Kewal K. Saluja, Shriram Vijayakumar, Warin Sootkaneung, Xaingning Yang |
NBTI Degradation: A Problem or a Scare? ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 21st International Conference on VLSI Design (VLSI Design 2008), 4-8 January 2008, Hyderabad, India, pp. 137-142, 2008, IEEE Computer Society, 0-7695-3083-4. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
19 | Fernando Ramírez-Mireles |
Quantifying the Degradation of Combined MUI and Multipath Effects in Impulse-Radio UWB. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Wirel. Commun. ![In: IEEE Trans. Wirel. Commun. 6(8), pp. 2831-2836, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
19 | Masayoshi Kobayashi, Tutomu Murase |
Scalable QoS Degradation Locating from End-to-End Quality of Flows on Various Routes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SAINT Workshops ![In: 2007 International Symposium on Applications and the Internet - Workshops (SAINT 2007 Workshops), 15-19 January 2007, Hiroshima, Japan, pp. 79, 2007, IEEE Computer Society, 0-7695-2757-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
19 | Nadia Busi, Claudio Zandron |
On the Computational Power of Genetic Gates with Interleaving Semantics: The Power of Inhibition and Degradation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FCT ![In: Fundamentals of Computation Theory, 16th International Symposium, FCT 2007, Budapest, Hungary, August 27-30, 2007, Proceedings, pp. 173-186, 2007, Springer, 978-3-540-74239-5. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
19 | Kunhyuk Kang, Sang Phill Park, Kaushik Roy 0001, Muhammad Ashraful Alam |
Estimation of statistical variation in temporal NBTI degradation and its impact on lifetime circuit performance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCAD ![In: 2007 International Conference on Computer-Aided Design, ICCAD 2007, San Jose, CA, USA, November 5-8, 2007, pp. 730-734, 2007, IEEE Computer Society, 1-4244-1382-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
19 | Jaume Abella 0001, Xavier Vera, Osman S. Unsal, Oguz Ergin, Antonio González 0001 |
Fuse: A Technique to Anticipate Failures due to Degradation in ALUs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece, pp. 15-22, 2007, IEEE Computer Society, 0-7695-2918-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
19 | Xiangning Yang, Kewal K. Saluja |
Combating NBTI Degradation via Gate Sizing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA, pp. 47-52, 2007, IEEE Computer Society, 978-0-7695-2795-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
19 | Chris Hale, Elisa H. Barney Smith |
Human Image Preference and Document Degradation Models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICDAR ![In: 9th International Conference on Document Analysis and Recognition (ICDAR 2007), 23-26 September, Curitiba, Paraná, Brazil, pp. 257-261, 2007, IEEE Computer Society, 978-0-7695-2822-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
19 | V. Roshan Joseph, I-Tang Yu |
Reliability improvement experiments with degradation data. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Reliab. ![In: IEEE Trans. Reliab. 55(1), pp. 149-157, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
19 | Jian Li 0021, Yeqiong Song, Françoise Simonot-Lion |
Providing Real-Time Applications With Graceful Degradation of QoS and Fault Tolerance According to(m, k)-Firm Model. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Ind. Informatics ![In: IEEE Trans. Ind. Informatics 2(2), pp. 112-119, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
19 | Fei Su, Krishnendu Chakrabarty |
Defect Tolerance Based on Graceful Degradation and Dynamic Reconfiguration for Digital Microfluidics-Based Biochips. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(12), pp. 2944-2953, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
19 | Xiangdong Xuan, Adit D. Singh, Abhijit Chatterjee |
Lifetime Prediction and Design-for-Reliability of IC Interconnections with Electromigration Induced Degradation in the Presence of Manufacturing Defects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 22(4-6), pp. 471-482, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
IC reliability, reliability simulation, design for reliability, interconnect, electromigration, defect modeling |
19 | Leping Huang, Hiroshi Yamane, Kanta Matsuura, Kaoru Sezaki |
Silent Cascade: Enhancing Location Privacy Without Communication QoS Degradation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SPC ![In: Security in Pervasive Computing, Third International Conference, SPC 2006, York, UK, April 18-21, 2006, Proceedings, pp. 165-180, 2006, Springer, 3-540-33376-2. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
19 | Wei Huang, D. L. Dietrich |
An alternative degradation reliability modeling approach using maximum likelihood estimation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Reliab. ![In: IEEE Trans. Reliab. 54(2), pp. 310-317, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
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