Search results for "defects"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
14	Watts S. Humphrey, James W. Over	The Personal Software Process (PSP): A Full-Day Tutorial.	ICSE	1997	DBLP DOI BibTeX RDF	personal process, testing, measurement, software, quality, process, estimating, productivity, TSP, process improvement, yield, defects, data, PROBE, PSP, discipline
14	Steven D. Millman	Improving quality: Yield versus test coverage.	J. Electron. Test.	1994	DBLP DOI BibTeX RDF	quality, Fault modeling, yield, test economics, physical defects
14	Peter C. Maxwell, Robert C. Aitken	IDDQ testing as a component of a test suite: The need for several fault coverage metrics.	J. Electron. Test.	1992	DBLP DOI BibTeX RDF	quality, fault coverage, scan, functional testing, Current testing, physical defects
14	Jerry M. Soden, Charles F. Hawkins, Ravi K. Gulati, Weiwei Mao	IDDQ testing: A review.	J. Electron. Test.	1992	DBLP DOI BibTeX RDF	IC quality, fault models, defects, Current testing, CMOS IC, I DDQ
14	Dhamin Al-Khalili, Côme Rozon, B. Stewart	Testability analysis and fault modeling of BiCMOS circuits.	J. Electron. Test.	1992	DBLP DOI BibTeX RDF	modeling, testability, faults, defects, BiCMOS
14	Adit D. Singh, Hee Yong Youn	A Modular Fault-Tolerant Binary Tree Architecture with Short Links.	IEEE Trans. Computers	1991	DBLP DOI BibTeX RDF	binary tree architecture, operational faults, fabrication defects, board level multichip designs, SOFT approach, fault-tolerant, VLSI, fault tolerant computing, computer architecture
14	Gurindar S. Sohi	Cache Memory Organization to Enhance the Yield of High-Performance VLSI Processors.	IEEE Trans. Computers	1989	DBLP DOI BibTeX RDF	cache memory organization, high performance VLSI processors, tolerance of defects faults, linear RAMs, trace-driven simulation analysis, storage management chips, VLSI, yield, fault location, buffer storage, performance degradation, random-access storage, integrated memory circuits
12	Jason Cong, Kirill Minkovich	LUT-based FPGA technology mapping for reliability (abstract only).	FPGA	2010	DBLP DOI BibTeX RDF	logic synthesis, error analysis, windowing, technology mapping, don't cares, fpga lookup table
12	Umer Farooq, León Welicki, Dieter Zirkler	API usability peer reviews: a method for evaluating the usability of application programming interfaces.	CHI	2010	DBLP DOI BibTeX RDF	api usability, usability breakdowns, usability evaluation method (uem), usability inspection, software bugs
12	Nicolas Palix, Julia Lawall, Gilles Muller	Tracking code patterns over multiple software versions with Herodotos.	AOSD	2010	DBLP DOI BibTeX RDF	Herodotos, bug tracking, history of pattern occurrences
12	Hao Zhong 0001, Suresh Thummalapenta, Tao Xie 0001, Lu Zhang 0023, Qing Wang	Mining API mapping for language migration.	ICSE (1)	2010	DBLP DOI BibTeX RDF	API mapping relation, language migration
12	Yoonki Song, Xiaoyin Wang, Tao Xie 0001, Lu Zhang 0023, Hong Mei 0001	JDF: detecting duplicate bug reports in Jazz.	ICSE (2)	2010	DBLP DOI BibTeX RDF	execution information, information retrieval, bug report
12	Jason Cong, Kirill Minkovich	LUT-based FPGA technology mapping for reliability.	DAC	2010	DBLP DOI BibTeX RDF	logic synthesis, error analysis, windowing, technology mapping, don't cares, FPGA lookup table
12	Du-Ming Tsai, Su-Ta Chuang	1D-based defect detection in patterned TFT-LCD panels using characteristic fractal dimension and correlations.	Mach. Vis. Appl.	2009	DBLP DOI BibTeX RDF	Characteristic fractal dimension, Line images, Defect detection, Normalized cross correlation, TFT-LCD
12	Sakura She, Sasindran Sivapalan, Ian Warren	Hermes: A Tool for Testing Mobile Device Applications.	Australian Software Engineering Conference	2009	DBLP DOI BibTeX RDF
12	Martin Schmettow	Controlling the usability evaluation process under varying defect visibility.	BCS HCI	2009	DBLP BibTeX RDF	count data models, usability business, reliability, usability evaluation, maximum likelihood, process control
12	Amin Ansari, Shantanu Gupta, Shuguang Feng, Scott A. Mahlke	ZerehCache: armoring cache architectures in high defect density technologies.	MICRO	2009	DBLP DOI BibTeX RDF	fault-tolerant cache, process variation, manufacturing yield
12	Chung-Ho Noh, Seok-Lyong Lee, Deok-Hwan Kim, Chin-Wan Chung	Effective defect classification for flat display panel film images.	ICHIT	2009	DBLP DOI BibTeX RDF	flat display panel, image analysis, shape descriptor, defect classification
12	Ming-Chien Tsai, Ching-Hwa Cheng	A full-synthesizable high-precision built-in delay time measurement circuit.	ASP-DAC	2009	DBLP DOI BibTeX RDF
12	Eusebio de la Fuente López, Félix Miguel Trespaderne	Inspection of Stamped Sheet Metal Car Parts Using a Multiresolution Image Fusion Technique.	ICVS	2009	DBLP DOI BibTeX RDF
12	Andriy V. Miranskyy, Enzo Cialini, David Godwin	Selection of customers for operational and usage profiling.	DBTest	2009	DBLP DOI BibTeX RDF	customer usage, data mining, optimization, customers, operational profile
12	Ali Jannesari, Kaibin Bao, Victor Pankratius, Walter F. Tichy	Helgrind+: An efficient dynamic race detector.	IPDPS	2009	DBLP DOI BibTeX RDF
12	Yean Yin, Ke Zhang, WenBing Lu	Textile Flaw Classification by Wavelet Reconstruction and BP Neural Network.	ISNN (2)	2009	DBLP DOI BibTeX RDF	Textile flaw detection, Histogram, BP neural network
12	Joseph Hassoun	Resiliency in Elemental Computing.	ARC	2009	DBLP DOI BibTeX RDF
12	Addisson Salazar, Arturo Serrano, Raul Llinares, Luis Vergara, Jorge Igual	ICA Mixture Modeling for the Classification of Materials in Impact-Echo Testing.	ICA	2009	DBLP DOI BibTeX RDF	ICA mixtures, Non-destructive evaluation, Impact-echo testing, ICA
12	Shujiang Yang, Mohammed Lach-hab, Iosif I. Vaisman, Estela Blaisten-Barojas	A Cheminformatics Approach for Zeolite Framework Determination.	ICCS (2)	2009	DBLP DOI BibTeX RDF
12	Jewgenij Botaschanjan, Benjamin Hummel	Specifying the worst case: orthogonal modeling of hardware errors.	ISSTA	2009	DBLP DOI BibTeX RDF	af/stem case tool, error filters, error mode specification, modelling hardware errors, error models
12	Lorenzo Martignoni, Roberto Paleari, Giampaolo Fresi Roglia, Danilo Bruschi	Testing CPU emulators.	ISSTA	2009	DBLP DOI BibTeX RDF	software testing, emulation, automatic test generation, fuzzing
12	Sylvie Trudel, Alain Abran	Functional Size Measurement Quality Challenges for Inexperienced Measurers.	IWSM/Mensura	2009	DBLP DOI BibTeX RDF	Functional size, COSMIC - ISO 19761, measure, quality, FSM
12	Rachel Aine Yotter, Robert Dahnke, Christian Gaser	Topological Correction of Brain Surface Meshes Using Spherical Harmonics.	MICCAI (1)	2009	DBLP DOI BibTeX RDF
12	Mehdi Baradaran Tahoori	BISM: built-in self map for hybrid crossbar nano-architectures.	ACM Great Lakes Symposium on VLSI	2009	DBLP DOI BibTeX RDF	crossbar array, emerging nanotechnologies, logic mapping
12	Sreeranga P. Rajan, Oksana Tkachuk, Mukul R. Prasad, Indradeep Ghosh, Nitin Goel, Tadahiro Uehara	WEAVE: WEb Applications Validation Environment.	ICSE Companion	2009	DBLP DOI BibTeX RDF
12	Matteo Cacciola, Salvatore Calcagno 0001, Filippo Laganá, Giuseppe Megali, Diego Pellicanò, Mario Versaci, Francesco Carlo Morabito	Advanced Integration of Neural Networks for Characterizing Voids in Welded Strips.	ICANN (2)	2009	DBLP DOI BibTeX RDF	Void Characterization, Welded strips, Rotating Magnetic Field, Neural Networks
12	Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer	Defect Aware to Power Conscious Tests - The New DFT Landscape.	VLSI Design	2009	DBLP DOI BibTeX RDF
12	Thomas Zimmermann 0001	Changes and bugs - Mining and predicting development activities.	ICSM	2009	DBLP DOI BibTeX RDF
12	Martin Dimitrov, Huiyang Zhou	Anomaly-based bug prediction, isolation, and validation: an automated approach for software debugging.	ASPLOS	2009	DBLP DOI BibTeX RDF	automated debugging, architectural support
12	Mohamed El-Attar 0001, James Miller 0001	Producing robust use case diagrams via reverse engineering of use case descriptions.	Softw. Syst. Model.	2008	DBLP DOI BibTeX RDF
12	Erkan Acar, Sule Ozev	Defect-Oriented Testing of RF Circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2008	DBLP DOI BibTeX RDF
12	Zhanglei Wang, Krishnendu Chakrabarty	Test-Quality/Cost Optimization Using Output-Deviation-Based Reordering of Test Patterns.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2008	DBLP DOI BibTeX RDF
12	Minsik Cho, Hua Xiang 0001, Ruchir Puri, David Z. Pan	Track Routing and Optimization for Yield.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2008	DBLP DOI BibTeX RDF
12	Roberto Gómez 0001, Alejandro Girón, Víctor H. Champac	A Test Generation Methodology for Interconnection Opens Considering Signals at the Coupled Lines.	J. Electron. Test.	2008	DBLP DOI BibTeX RDF	Interconnection opens, Boolean testing, Favorable logic conditions, Test generation methodology, Coupling capacitances
12	Lei Fang 0002, Michael S. Hsiao	Bilateral Testing of Nano-scale Fault-Tolerant Circuits.	J. Electron. Test.	2008	DBLP DOI BibTeX RDF	Bilateral fault model, Fault-tolerant, ATPG, Nanoelectronics
12	Jeffrey C. Carver, Nachiappan Nagappan, Alan Page	The Impact of Educational Background on the Effectiveness of Requirements Inspections: An Empirical Study.	IEEE Trans. Software Eng.	2008	DBLP DOI BibTeX RDF
12	Neelam Soundarajan, Jason O. Hallstrom, Guoqiang Shu, Adem Delibas	Patterns: from system design to software testing.	Innov. Syst. Softw. Eng.	2008	DBLP DOI BibTeX RDF	Testing, Design patterns, Contracts
12	Erik Jan Marinissen	Bugs, moths, grasshoppers, and whales.	IEEE Des. Test Comput.	2008	DBLP DOI BibTeX RDF
12	Krzysztof J. Opielinski, Tadeusz Gudra, Joachim Migda	Computer Ultrasonic Imaging of the Tongue Shape Changes in the Process of Articulation of Vowels.	Computer Recognition Systems 2	2008	DBLP DOI BibTeX RDF
12	Simon Baker, Fiora Au, Gillian Dobbie, Ian Warren	Automated Usability Testing Using HUI Analyzer.	Australian Software Engineering Conference	2008	DBLP DOI BibTeX RDF
12	Pavel Kisilev	Automatic context-aware dust and scratch removal in scanned images.	ICIP	2008	DBLP DOI BibTeX RDF
12	Haihao Shen, Sai Zhang 0001, Jianjun Zhao 0001, Jianhong Fang, Shiyuan Yao	XFindBugs: eXtended FindBugs for AspectJ.	PASTE	2008	DBLP DOI BibTeX RDF
12	Hidetake Uwano, Akito Monden, Ken-ichi Matsumoto	DRESREM 2: An Analysis System for Multi-document Software Review Using Reviewers' Eye Movements.	ICSEA	2008	DBLP DOI BibTeX RDF
12	V. Suma 0001, T. R. Gopalakrishnan Nair	Enhanced Approaches in Defect Detection and Prevention Strategies in Small and Medium Scale Industries.	ICSEA	2008	DBLP DOI BibTeX RDF	Defect detection and Prevention, Software Engineering, Testing, Software Quality, Software Process, Inspections
12	Hamid Mcheick, Aymen Sioud, Joumana Dargham	An Object Memory Management Prototype Based on Mark and Sweep Algorithm Using Separation of Concerns.	ICSEA	2008	DBLP DOI BibTeX RDF
12	Rui Abreu 0001, Alberto González 0002, Peter Zoeteweij, Arjan J. C. van Gemund	Automatic software fault localization using generic program invariants.	SAC	2008	DBLP DOI BibTeX RDF	black box diagnosis, error detection, fault localization, program invariants, program spectra
12	Chia-Chi Teng, Linda G. Shapiro, Richard A. Hopper, Jon Ver Halen	Pediatric cranial defect surface analysis for craniosynostosis postoperation CT images.	ISBI	2008	DBLP DOI BibTeX RDF
12	Yen-Tzu Lin, Osei Poku, Naresh K. Bhatti, Ronald D. Blanton	Physically-Aware N-Detect Test Pattern Selection.	DATE	2008	DBLP DOI BibTeX RDF
12	Swaroop Ghosh, Patrick Ndai, Kaushik Roy 0001	A Novel Low Overhead Fault Tolerant Kogge-Stone Adder Using Adaptive Clocking.	DATE	2008	DBLP DOI BibTeX RDF
12	Thilo Streichert, Michael Glaß, Rolf Wanka, Christian Haubelt, Jürgen Teich	Topology-Aware Replica Placement in Fault-Tolerant Embedded Networks.	ARCS	2008	DBLP DOI BibTeX RDF
12	Shuo Wang, Jianwei Dai, Lei Wang 0003	Defect-tolerant digital filtering with unreliable molecular electronics.	SiPS	2008	DBLP DOI BibTeX RDF
12	Miguel E. R. Bezerra, Adriano L. I. Oliveira, Paulo J. L. Adeodato, Silvio R. L. Meira	Enhancing RBF-DDA Algorithm's Robustness: Neural Networks Applied to Prediction of Fault-Prone Software Modules.	IFIP AI	2008	DBLP DOI BibTeX RDF
12	Jianquan Dong, Chao Tan, Yunqi Zhang	A Reputation Evaluation Method in P2P Anonymous Environment.	ICYCS	2008	DBLP DOI BibTeX RDF
12	Brian Robinson, Lee J. White	Testing of User-Configurable Software Systems Using Firewalls.	ISSRE	2008	DBLP DOI BibTeX RDF
12	Kouhi Shinohara, Minoru Watanabe	Defect tolerance of holographic configurations in ORGAs.	IPDPS	2008	DBLP DOI BibTeX RDF
12	Alexandre Mallet, Lionel Gueguen, Mihai Datcu	Complexity Based Image Artifact Detection.	DCC	2008	DBLP DOI BibTeX RDF	images artifacts, kolmogorov complexity
12	Lingxiao Jiang, Zhendong Su 0001	Profile-guided program simplification for effective testing and analysis.	SIGSOFT FSE	2008	DBLP DOI BibTeX RDF	testing and analysis, profiling, statistical debugging, program simplification
12	Nuo Li, JeeHyun Hwang, Tao Xie 0001	Multiple-implementation testing for XACML implementations.	TAV-WEB	2008	DBLP DOI BibTeX RDF	multiple-implementation testing, policy decision point, testing, XACML, access control policy
12	Matthew Harker, Paul O'Leary	Least squares surface reconstruction from measured gradient fields.	CVPR	2008	DBLP DOI BibTeX RDF
12	Cyrille Artho	Iterative Delta Debugging.	Haifa Verification Conference	2008	DBLP DOI BibTeX RDF
12	Thomas J. Ostrand, Elaine J. Weyuker	Progress in Automated Software Defect Prediction.	Haifa Verification Conference	2008	DBLP DOI BibTeX RDF	negative binomial model, automated tool, software fault prediction
12	Mingjie Lin, Steve Ferguson, Yaling Ma, Timothy Greene	HAFT: A hybrid FPGA with amorphous and fault-tolerant architecture.	ISCAS	2008	DBLP DOI BibTeX RDF
12	Tiejun Pan, Leina Zheng, Chengbin Fang	Defect Tracing System Based on Orthogonal Defect Classification.	CSSE (2)	2008	DBLP DOI BibTeX RDF
12	Giovanni Aiello, Emanuele Dilettoso, Nunzio Salerno	Development of a Finite Element Code for Non-Destructive Evaluation of Concrete Structures by Means of Ultrasonic Waves.	ICCSA (2)	2008	DBLP DOI BibTeX RDF
12	Barbara Cannas, Sara Carcangiu, Francesca Cau, Alessandra Fanni, Augusto Montisci	Time and Frequency Approaches to Non Destructive Testing in Concrete Pillars Using Neural Networks.	ICCSA (2)	2008	DBLP DOI BibTeX RDF	neural networks, ultrasonic waves, Non Destructive Testing
12	Antonino Musolino, Marco Raugi, Mauro Tucci, Florin Turcu	Time, Wavelet and Hilbert-Huang Domain Analysis of Signals from Ultrasonic Based Equipment for the Non Destructive Evaluation of Concrete and Brick Masonry Walls.	ICCSA (2)	2008	DBLP DOI BibTeX RDF	Magnetostrictive transducers and sensors, Wavelet transform, Hilbert-Huang transform, Ultrasonic waves, Non Destructive Test
12	Raimund Moser, Witold Pedrycz, Giancarlo Succi	Analysis of the reliability of a subset of change metrics for defect prediction.	ESEM	2008	DBLP DOI BibTeX RDF	feature selection, software metrics, defect prediction
12	Philipp V. Panitz, Markus Olbrich, Erich Barke, Markus Bühler, Jürgen Koehl	Considering possible opens in non-tree topology wire delay calculation.	ACM Great Lakes Symposium on VLSI	2008	DBLP DOI BibTeX RDF	non-tree topologies, yield, static timing analysis, delay analysis
12	Michael T. Niemier, Michael Crocker, Xiaobo Sharon Hu	Fabrication Variations and Defect Tolerance for Nanomagnet-Based QCA.	DFT	2008	DBLP DOI BibTeX RDF
12	Yoonjae Huh, Yoon-Hwa Choi	Module Grouping for Defect Tolerance in Nanoscale Memory.	DFT	2008	DBLP DOI BibTeX RDF
12	Jason G. Brown, R. D. (Shawn) Blanton	Automated Standard Cell Library Analysis for Improved Defect Modeling.	ISQED	2008	DBLP DOI BibTeX RDF	test generation, diagnosis, fault simulation, fault, defect
12	Juan Li 0001, Lishan Hou, Zhongsen Qin, Qing Wang 0001, Guisheng Chen	An Empirically-Based Process to Improve the Practice of Requirement Review.	ICSP	2008	DBLP DOI BibTeX RDF	requirement review, requirement quality characteristic, quantitative, role-based
12	Arkady N. Soloviev, Polina S. Kourbatova, Nikolai I. Saprounov, Sergey N. Shevtsov	The Neural Networks Approach to Identification of Local Damages in Elastic Structures.	NAA	2008	DBLP DOI BibTeX RDF	defect’s reconstruction, learning sets, identification, finite element, Perceptron
12	Ming-Chien Tsai, Ching-Hwa Cheng, Chiou-Mao Yang	An All-Digital High-Precision Built-In Delay Time Measurement Circuit.	VTS	2008	DBLP DOI BibTeX RDF
12	Gursimran Singh Walia, Jeffrey C. Carver, Nachiappan Nagappan	The effect of the number of inspectors on the defect estimates produced by capture-recapture models.	ICSE	2008	DBLP DOI BibTeX RDF	capture-recapture models, requirements, inspections, validation and verification
12	Uvais Qidwai, Mohammed Maqbool	On hybrid-fuzzy classifier design: An empirical modeling scenario for corrosion detection in gas pipelines.	AICCSA	2008	DBLP DOI BibTeX RDF
12	Srikanth Venkataraman, Nagesh Tamarapalli	DFM / DFT / SiliconDebug / Diagnosis.	VLSI Design	2008	DBLP DOI BibTeX RDF
12	Adit D. Singh	Scan Delay Testing of Nanometer SoCs.	VLSI Design	2008	DBLP DOI BibTeX RDF
12	Marco D'Ambros	Supporting software evolution analysis with historical dependencies and defect information.	ICSM	2008	DBLP DOI BibTeX RDF
12	Antonio Zenteno Ramírez, Guillermo Espinosa, Víctor H. Champac	Design-for-Test Techniques for Opens in Undetected Branches in CMOS Latches and Flip-Flops.	IEEE Trans. Very Large Scale Integr. Syst.	2007	DBLP DOI BibTeX RDF
12	Pallav Gupta, Niraj K. Jha, Loganathan Lingappan	A Test Generation Framework for Quantum Cellular Automata Circuits.	IEEE Trans. Very Large Scale Integr. Syst.	2007	DBLP DOI BibTeX RDF
12	Les Hatton	Empirical Test Observations in Client-Server Systems.	Computer	2007	DBLP DOI BibTeX RDF	language parsing, software testing, client-server systems
12	Kypros Constantinides, Stephen Plaza, Jason A. Blome, Valeria Bertacco, Scott A. Mahlke, Todd M. Austin, Bin Zhang 0011, Michael Orshansky	Architecting a reliable CMP switch architecture.	ACM Trans. Archit. Code Optim.	2007	DBLP DOI BibTeX RDF	CMP switch, reliability, defect-tolerance
12	Tad Hogg, Greg Snider	Defect-tolerant Logic with Nanoscale Crossbar Circuits.	J. Electron. Test.	2007	DBLP DOI BibTeX RDF	fault modeling, nanotechnology, molecular electronics, circuit reliability
12	Rahul Telang, Sunil Wattal	An Empirical Analysis of the Impact of Software Vulnerability Announcements on Firm Stock Price.	IEEE Trans. Software Eng.	2007	DBLP DOI BibTeX RDF	software vendors, quality, Information security, patching, software vulnerability, event-study
12	Wes Masri, Andy Podgurski, David Leon	An Empirical Study of Test Case Filtering Techniques Based on Exercising Information Flows.	IEEE Trans. Software Eng.	2007	DBLP DOI BibTeX RDF	test case filtering, coverage-based filtering, distribution-based filtering, software testing, empirical studies, Information flow, dynamic slicing, test suite minimization
12	Xianghua Xie, Majid Mirmehdi	TEXEMS: Texture Exemplars for Defect Detection on Random Textured Surfaces.	IEEE Trans. Pattern Anal. Mach. Intell.	2007	DBLP DOI BibTeX RDF	texem model, EM algorithm, mixture model, texture analysis, Defect detection
12	Aleksandar Dogandzic, Benhong Zhang	Bayesian NDE Defect Signal Analysis.	IEEE Trans. Signal Process.	2007	DBLP DOI BibTeX RDF
12	Gary Wassermann, Carl Gould 0001, Zhendong Su 0001, Premkumar T. Devanbu	Static checking of dynamically generated queries in database applications.	ACM Trans. Softw. Eng. Methodol.	2007	DBLP DOI BibTeX RDF	database queries, JDBC, Static checking, context-free language reachability
12	Valerio Pascucci, Giorgio Scorzelli, Peer-Timo Bremer, Ajith Mascarenhas	Robust on-line computation of Reeb graphs: simplicity and speed.	ACM Trans. Graph.	2007	DBLP DOI BibTeX RDF
12	Artem Marchenko, Pekka Abrahamsson	Predicting Software Defect Density: A Case Study on Automated Static Code Analysis.	XP	2007	DBLP DOI BibTeX RDF	defect estimation, case study, quality, automation, embedded software, agile software development, static code analysis
12	Addisson Salazar, Juan M. Unió, Arturo Serrano, Jorge Gosálbez	Neural Networks for Defect Detection in Non-destructive Evaluation by Sonic Signals.	IWANN	2007	DBLP DOI BibTeX RDF
12	Hyunjin Lee, Sangyeun Cho, Bruce R. Childers	Performance of Graceful Degradation for Cache Faults.	ISVLSI	2007	DBLP DOI BibTeX RDF