|
|
Venues (Conferences, Journals, ...)
|
|
GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 3212 occurrences of 1532 keywords
|
|
|
Results
Found 5103 publication records. Showing 5103 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
14 | Watts S. Humphrey, James W. Over |
The Personal Software Process (PSP): A Full-Day Tutorial. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSE ![In: Pulling Together, Proceedings of the 19th International Conference on Software Engineering, Boston, Massachusetts, USA, May 17-23, 1997., pp. 645-646, 1997, ACM, 0-89791-914-9. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
personal process, testing, measurement, software, quality, process, estimating, productivity, TSP, process improvement, yield, defects, data, PROBE, PSP, discipline |
14 | Steven D. Millman |
Improving quality: Yield versus test coverage. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 5(2-3), pp. 253-261, 1994. The full citation details ...](Pics/full.jpeg) |
1994 |
DBLP DOI BibTeX RDF |
quality, Fault modeling, yield, test economics, physical defects |
14 | Peter C. Maxwell, Robert C. Aitken |
IDDQ testing as a component of a test suite: The need for several fault coverage metrics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 3(4), pp. 305-316, 1992. The full citation details ...](Pics/full.jpeg) |
1992 |
DBLP DOI BibTeX RDF |
quality, fault coverage, scan, functional testing, Current testing, physical defects |
14 | Jerry M. Soden, Charles F. Hawkins, Ravi K. Gulati, Weiwei Mao |
IDDQ testing: A review. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 3(4), pp. 291-303, 1992. The full citation details ...](Pics/full.jpeg) |
1992 |
DBLP DOI BibTeX RDF |
IC quality, fault models, defects, Current testing, CMOS IC, I DDQ |
14 | Dhamin Al-Khalili, Côme Rozon, B. Stewart |
Testability analysis and fault modeling of BiCMOS circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 3(3), pp. 207-217, 1992. The full citation details ...](Pics/full.jpeg) |
1992 |
DBLP DOI BibTeX RDF |
modeling, testability, faults, defects, BiCMOS |
14 | Adit D. Singh, Hee Yong Youn |
A Modular Fault-Tolerant Binary Tree Architecture with Short Links. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 40(7), pp. 882-890, 1991. The full citation details ...](Pics/full.jpeg) |
1991 |
DBLP DOI BibTeX RDF |
binary tree architecture, operational faults, fabrication defects, board level multichip designs, SOFT approach, fault-tolerant, VLSI, fault tolerant computing, computer architecture |
14 | Gurindar S. Sohi |
Cache Memory Organization to Enhance the Yield of High-Performance VLSI Processors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 38(4), pp. 484-492, 1989. The full citation details ...](Pics/full.jpeg) |
1989 |
DBLP DOI BibTeX RDF |
cache memory organization, high performance VLSI processors, tolerance of defects faults, linear RAMs, trace-driven simulation analysis, storage management chips, VLSI, yield, fault location, buffer storage, performance degradation, random-access storage, integrated memory circuits |
12 | Jason Cong, Kirill Minkovich |
LUT-based FPGA technology mapping for reliability (abstract only). ![Search on Bibsonomy](Pics/bibsonomy.png) |
FPGA ![In: Proceedings of the ACM/SIGDA 18th International Symposium on Field Programmable Gate Arrays, FPGA 2010, Monterey, California, USA, February 21-23, 2010, pp. 288, 2010, ACM, 978-1-60558-911-4. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
logic synthesis, error analysis, windowing, technology mapping, don't cares, fpga lookup table |
12 | Umer Farooq, León Welicki, Dieter Zirkler |
API usability peer reviews: a method for evaluating the usability of application programming interfaces. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CHI ![In: Proceedings of the 28th International Conference on Human Factors in Computing Systems, CHI 2010, Atlanta, Georgia, USA, April 10-15, 2010, pp. 2327-2336, 2010, ACM, 978-1-60558-929-9. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
api usability, usability breakdowns, usability evaluation method (uem), usability inspection, software bugs |
12 | Nicolas Palix, Julia Lawall, Gilles Muller |
Tracking code patterns over multiple software versions with Herodotos. ![Search on Bibsonomy](Pics/bibsonomy.png) |
AOSD ![In: Proceedings of the 9th International Conference on Aspect-Oriented Software Development, AOSD 2010, Rennes and Saint-Malo, France, March 15-19, 2010, pp. 169-180, 2010, ACM, 978-1-60558-958-9. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
Herodotos, bug tracking, history of pattern occurrences |
12 | Hao Zhong 0001, Suresh Thummalapenta, Tao Xie 0001, Lu Zhang 0023, Qing Wang |
Mining API mapping for language migration. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSE (1) ![In: Proceedings of the 32nd ACM/IEEE International Conference on Software Engineering - Volume 1, ICSE 2010, Cape Town, South Africa, 1-8 May 2010, pp. 195-204, 2010, ACM, 978-1-60558-719-6. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
API mapping relation, language migration |
12 | Yoonki Song, Xiaoyin Wang, Tao Xie 0001, Lu Zhang 0023, Hong Mei 0001 |
JDF: detecting duplicate bug reports in Jazz. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSE (2) ![In: Proceedings of the 32nd ACM/IEEE International Conference on Software Engineering - Volume 2, ICSE 2010, Cape Town, South Africa, 1-8 May 2010, pp. 315-316, 2010, ACM. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
execution information, information retrieval, bug report |
12 | Jason Cong, Kirill Minkovich |
LUT-based FPGA technology mapping for reliability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 47th Design Automation Conference, DAC 2010, Anaheim, California, USA, July 13-18, 2010, pp. 517-522, 2010, ACM, 978-1-4503-0002-5. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
logic synthesis, error analysis, windowing, technology mapping, don't cares, FPGA lookup table |
12 | Du-Ming Tsai, Su-Ta Chuang |
1D-based defect detection in patterned TFT-LCD panels using characteristic fractal dimension and correlations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Mach. Vis. Appl. ![In: Mach. Vis. Appl. 20(6), pp. 423-434, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
Characteristic fractal dimension, Line images, Defect detection, Normalized cross correlation, TFT-LCD |
12 | Sakura She, Sasindran Sivapalan, Ian Warren |
Hermes: A Tool for Testing Mobile Device Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Australian Software Engineering Conference ![In: 20th Australian Software Engineering Conference (ASWEC 2009), 14-17 April 2009, Gold Cost, Australia, pp. 121-130, 2009, IEEE Computer Society, 978-0-7695-3599-9. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
12 | Martin Schmettow |
Controlling the usability evaluation process under varying defect visibility. ![Search on Bibsonomy](Pics/bibsonomy.png) |
BCS HCI ![In: Proceedings of the 2009 British Computer Society Conference on Human-Computer Interaction, BCS-HCI 2009, Cambridge, United Kingdom, 1-5 September 2009, pp. 188-197, 2009, ACM. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP BibTeX RDF |
count data models, usability business, reliability, usability evaluation, maximum likelihood, process control |
12 | Amin Ansari, Shantanu Gupta, Shuguang Feng, Scott A. Mahlke |
ZerehCache: armoring cache architectures in high defect density technologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MICRO ![In: 42st Annual IEEE/ACM International Symposium on Microarchitecture (MICRO-42 2009), December 12-16, 2009, New York, New York, USA, pp. 100-110, 2009, ACM, 978-1-60558-798-1. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
fault-tolerant cache, process variation, manufacturing yield |
12 | Chung-Ho Noh, Seok-Lyong Lee, Deok-Hwan Kim, Chin-Wan Chung |
Effective defect classification for flat display panel film images. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICHIT ![In: Proceedings of the 2009 International Conference on Hybrid Information Technology, ICHIT 2009, Daejeon, Korea, August 27-29, 2009, pp. 264-267, 2009, ACM, 978-1-60558-662-5. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
flat display panel, image analysis, shape descriptor, defect classification |
12 | Ming-Chien Tsai, Ching-Hwa Cheng |
A full-synthesizable high-precision built-in delay time measurement circuit. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASP-DAC ![In: Proceedings of the 14th Asia South Pacific Design Automation Conference, ASP-DAC 2009, Yokohama, Japan, January 19-22, 2009, pp. 123-124, 2009, IEEE, 978-1-4244-2748-2. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
12 | Eusebio de la Fuente López, Félix Miguel Trespaderne |
Inspection of Stamped Sheet Metal Car Parts Using a Multiresolution Image Fusion Technique. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICVS ![In: Computer Vision Systems, 7th International Conference on Computer Vision Systems, ICVS 2009, Liège, Belgium, October 13-15, 2009, Proceedings, pp. 345-353, 2009, Springer, 978-3-642-04666-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
12 | Andriy V. Miranskyy, Enzo Cialini, David Godwin |
Selection of customers for operational and usage profiling. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DBTest ![In: Proceedings of the 2nd International Workshop on Testing Database Systems, DBTest 2009, Providence, Rhode Island, USA, June 29, 2009, 2009, ACM, 978-1-60558-706-6. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
customer usage, data mining, optimization, customers, operational profile |
12 | Ali Jannesari, Kaibin Bao, Victor Pankratius, Walter F. Tichy |
Helgrind+: An efficient dynamic race detector. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IPDPS ![In: 23rd IEEE International Symposium on Parallel and Distributed Processing, IPDPS 2009, Rome, Italy, May 23-29, 2009, pp. 1-13, 2009, IEEE. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
12 | Yean Yin, Ke Zhang, WenBing Lu |
Textile Flaw Classification by Wavelet Reconstruction and BP Neural Network. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISNN (2) ![In: Advances in Neural Networks - ISNN 2009, 6th International Symposium on Neural Networks, ISNN 2009, Wuhan, China, May 26-29, 2009, Proceedings, Part II, pp. 694-701, 2009, Springer, 978-3-642-01509-0. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
Textile flaw detection, Histogram, BP neural network |
12 | Joseph Hassoun |
Resiliency in Elemental Computing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ARC ![In: Reconfigurable Computing: Architectures, Tools and Applications, 5th International Workshop, ARC 2009, Karlsruhe, Germany, March 16-18, 2009. Proceedings, pp. 2, 2009, Springer, 978-3-642-00640-1. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
12 | Addisson Salazar, Arturo Serrano, Raul Llinares, Luis Vergara, Jorge Igual |
ICA Mixture Modeling for the Classification of Materials in Impact-Echo Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICA ![In: Independent Component Analysis and Signal Separation, 8th International Conference, ICA 2009, Paraty, Brazil, March 15-18, 2009. Proceedings, pp. 702-709, 2009, Springer, 978-3-642-00598-5. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
ICA mixtures, Non-destructive evaluation, Impact-echo testing, ICA |
12 | Shujiang Yang, Mohammed Lach-hab, Iosif I. Vaisman, Estela Blaisten-Barojas |
A Cheminformatics Approach for Zeolite Framework Determination. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCS (2) ![In: Computational Science - ICCS 2009, 9th International Conference, Baton Rouge, LA, USA, May 25-27, 2009, Proceedings, Part II, pp. 160-168, 2009, Springer, 978-3-642-01972-2. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
12 | Jewgenij Botaschanjan, Benjamin Hummel |
Specifying the worst case: orthogonal modeling of hardware errors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSTA ![In: Proceedings of the Eighteenth International Symposium on Software Testing and Analysis, ISSTA 2009, Chicago, IL, USA, July 19-23, 2009, pp. 273-284, 2009, ACM, 978-1-60558-338-9. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
af/stem case tool, error filters, error mode specification, modelling hardware errors, error models |
12 | Lorenzo Martignoni, Roberto Paleari, Giampaolo Fresi Roglia, Danilo Bruschi |
Testing CPU emulators. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSTA ![In: Proceedings of the Eighteenth International Symposium on Software Testing and Analysis, ISSTA 2009, Chicago, IL, USA, July 19-23, 2009, pp. 261-272, 2009, ACM, 978-1-60558-338-9. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
software testing, emulation, automatic test generation, fuzzing |
12 | Sylvie Trudel, Alain Abran |
Functional Size Measurement Quality Challenges for Inexperienced Measurers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IWSM/Mensura ![In: Software Process and Product Measurement, International Conferences IWSM 2009 and Mensura 2009, Amsterdam, The Netherlands, November 4-6, 2009. Proceedings, pp. 157-169, 2009, Springer, 978-3-642-05414-3. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
Functional size, COSMIC - ISO 19761, measure, quality, FSM |
12 | Rachel Aine Yotter, Robert Dahnke, Christian Gaser |
Topological Correction of Brain Surface Meshes Using Spherical Harmonics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MICCAI (1) ![In: Medical Image Computing and Computer-Assisted Intervention - MICCAI 2009, 12th International Conference, London, UK, September 20-24, 2009, Proceedings, Part II, pp. 125-132, 2009, Springer, 978-3-642-04270-6. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
12 | Mehdi Baradaran Tahoori |
BISM: built-in self map for hybrid crossbar nano-architectures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 19th ACM Great Lakes Symposium on VLSI 2009, Boston Area, MA, USA, May 10-12 2009, pp. 153-156, 2009, ACM, 978-1-60558-522-2. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
crossbar array, emerging nanotechnologies, logic mapping |
12 | Sreeranga P. Rajan, Oksana Tkachuk, Mukul R. Prasad, Indradeep Ghosh, Nitin Goel, Tadahiro Uehara |
WEAVE: WEb Applications Validation Environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSE Companion ![In: 31st International Conference on Software Engineering, ICSE 2009, May 16-24, 2009, Vancouver, Canada, Companion Volume, pp. 101-111, 2009, IEEE, 978-1-4244-3494-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
12 | Matteo Cacciola, Salvatore Calcagno 0001, Filippo Laganá, Giuseppe Megali, Diego Pellicanò, Mario Versaci, Francesco Carlo Morabito |
Advanced Integration of Neural Networks for Characterizing Voids in Welded Strips. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICANN (2) ![In: Artificial Neural Networks - ICANN 2009, 19th International Conference, Limassol, Cyprus, September 14-17, 2009, Proceedings, Part II, pp. 455-464, 2009, Springer, 978-3-642-04276-8. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
Void Characterization, Welded strips, Rotating Magnetic Field, Neural Networks |
12 | Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer |
Defect Aware to Power Conscious Tests - The New DFT Landscape. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: VLSI Design 2009: Improving Productivity through Higher Abstraction, The 22nd International Conference on VLSI Design, New Delhi, India, 5-9 January 2009, pp. 23-25, 2009, IEEE Computer Society, 978-0-7695-3506-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
12 | Thomas Zimmermann 0001 |
Changes and bugs - Mining and predicting development activities. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSM ![In: 25th IEEE International Conference on Software Maintenance (ICSM 2009), September 20-26, 2009, Edmonton, Alberta, Canada, pp. 443-446, 2009, IEEE Computer Society, 978-1-4244-4897-5. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
12 | Martin Dimitrov, Huiyang Zhou |
Anomaly-based bug prediction, isolation, and validation: an automated approach for software debugging. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASPLOS ![In: Proceedings of the 14th International Conference on Architectural Support for Programming Languages and Operating Systems, ASPLOS 2009, Washington, DC, USA, March 7-11, 2009, pp. 61-72, 2009, ACM, 978-1-60558-406-5. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
automated debugging, architectural support |
12 | Mohamed El-Attar 0001, James Miller 0001 |
Producing robust use case diagrams via reverse engineering of use case descriptions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Softw. Syst. Model. ![In: Softw. Syst. Model. 7(1), pp. 67-83, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Erkan Acar, Sule Ozev |
Defect-Oriented Testing of RF Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(5), pp. 920-931, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Zhanglei Wang, Krishnendu Chakrabarty |
Test-Quality/Cost Optimization Using Output-Deviation-Based Reordering of Test Patterns. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(2), pp. 352-365, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Minsik Cho, Hua Xiang 0001, Ruchir Puri, David Z. Pan |
Track Routing and Optimization for Yield. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(5), pp. 872-882, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Roberto Gómez 0001, Alejandro Girón, Víctor H. Champac |
A Test Generation Methodology for Interconnection Opens Considering Signals at the Coupled Lines. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 24(6), pp. 529-538, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Interconnection opens, Boolean testing, Favorable logic conditions, Test generation methodology, Coupling capacitances |
12 | Lei Fang 0002, Michael S. Hsiao |
Bilateral Testing of Nano-scale Fault-Tolerant Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 24(1-3), pp. 285-296, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Bilateral fault model, Fault-tolerant, ATPG, Nanoelectronics |
12 | Jeffrey C. Carver, Nachiappan Nagappan, Alan Page |
The Impact of Educational Background on the Effectiveness of Requirements Inspections: An Empirical Study. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Software Eng. ![In: IEEE Trans. Software Eng. 34(6), pp. 800-812, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Neelam Soundarajan, Jason O. Hallstrom, Guoqiang Shu, Adem Delibas |
Patterns: from system design to software testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Innov. Syst. Softw. Eng. ![In: Innov. Syst. Softw. Eng. 4(1), pp. 71-85, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Testing, Design patterns, Contracts |
12 | Erik Jan Marinissen |
Bugs, moths, grasshoppers, and whales. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 25(3), pp. 288, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Krzysztof J. Opielinski, Tadeusz Gudra, Joachim Migda |
Computer Ultrasonic Imaging of the Tongue Shape Changes in the Process of Articulation of Vowels. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Computer Recognition Systems 2 ![In: Computer Recognition Systems 2, pp. 629-636, 2008, Springer, 978-3-540-75174-8. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Simon Baker, Fiora Au, Gillian Dobbie, Ian Warren |
Automated Usability Testing Using HUI Analyzer. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Australian Software Engineering Conference ![In: 19th Australian Software Engineering Conference (ASWEC 2008), March 25-28, 2008, Perth, Australia, pp. 579-588, 2008, IEEE Computer Society, 978-0-7695-3100-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Pavel Kisilev |
Automatic context-aware dust and scratch removal in scanned images. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICIP ![In: Proceedings of the International Conference on Image Processing, ICIP 2008, October 12-15, 2008, San Diego, California, USA, pp. 2628-2631, 2008, IEEE, 978-1-4244-1765-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Haihao Shen, Sai Zhang 0001, Jianjun Zhao 0001, Jianhong Fang, Shiyuan Yao |
XFindBugs: eXtended FindBugs for AspectJ. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PASTE ![In: Proceedings of the 8th ACM SIGPLAN-SIGSOFT Workshop on Program Analysis for Software Tools and Engineering, PASTE'08, Atlanta, Georgia, November 9-10, 2008, pp. 70-76, 2008, ACM, 978-1-60558-382-2. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Hidetake Uwano, Akito Monden, Ken-ichi Matsumoto |
DRESREM 2: An Analysis System for Multi-document Software Review Using Reviewers' Eye Movements. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSEA ![In: Proceedings of the Third International Conference on Software Engineering Advances, ICSEA 2008, October 26-31, 2008, Sliema, Malta, pp. 177-183, 2008, IEEE Computer Society, 978-0-7695-3372-8. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | V. Suma 0001, T. R. Gopalakrishnan Nair |
Enhanced Approaches in Defect Detection and Prevention Strategies in Small and Medium Scale Industries. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSEA ![In: Proceedings of the Third International Conference on Software Engineering Advances, ICSEA 2008, October 26-31, 2008, Sliema, Malta, pp. 389-393, 2008, IEEE Computer Society, 978-0-7695-3372-8. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Defect detection and Prevention, Software Engineering, Testing, Software Quality, Software Process, Inspections |
12 | Hamid Mcheick, Aymen Sioud, Joumana Dargham |
An Object Memory Management Prototype Based on Mark and Sweep Algorithm Using Separation of Concerns. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSEA ![In: Proceedings of the Third International Conference on Software Engineering Advances, ICSEA 2008, October 26-31, 2008, Sliema, Malta, pp. 71-76, 2008, IEEE Computer Society, 978-0-7695-3372-8. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Rui Abreu 0001, Alberto González 0002, Peter Zoeteweij, Arjan J. C. van Gemund |
Automatic software fault localization using generic program invariants. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SAC ![In: Proceedings of the 2008 ACM Symposium on Applied Computing (SAC), Fortaleza, Ceara, Brazil, March 16-20, 2008, pp. 712-717, 2008, ACM, 978-1-59593-753-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
black box diagnosis, error detection, fault localization, program invariants, program spectra |
12 | Chia-Chi Teng, Linda G. Shapiro, Richard A. Hopper, Jon Ver Halen |
Pediatric cranial defect surface analysis for craniosynostosis postoperation CT images. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISBI ![In: Proceedings of the 2008 IEEE International Symposium on Biomedical Imaging: From Nano to Macro, Paris, France, May 14-17, 2008, pp. 620-623, 2008, IEEE, 978-1-4244-2003-2. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Yen-Tzu Lin, Osei Poku, Naresh K. Bhatti, Ronald D. Blanton |
Physically-Aware N-Detect Test Pattern Selection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Design, Automation and Test in Europe, DATE 2008, Munich, Germany, March 10-14, 2008, pp. 634-639, 2008, ACM, 978-3-9810801-3-1. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Swaroop Ghosh, Patrick Ndai, Kaushik Roy 0001 |
A Novel Low Overhead Fault Tolerant Kogge-Stone Adder Using Adaptive Clocking. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Design, Automation and Test in Europe, DATE 2008, Munich, Germany, March 10-14, 2008, pp. 366-371, 2008, ACM, 978-3-9810801-3-1. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Thilo Streichert, Michael Glaß, Rolf Wanka, Christian Haubelt, Jürgen Teich |
Topology-Aware Replica Placement in Fault-Tolerant Embedded Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ARCS ![In: Architecture of Computing Systems - ARCS 2008, 21st International Conference, Dresden, Germany, February 25-28, 2008, Proceedings, pp. 23-37, 2008, Springer, 978-3-540-78152-3. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Shuo Wang, Jianwei Dai, Lei Wang 0003 |
Defect-tolerant digital filtering with unreliable molecular electronics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SiPS ![In: Proceedings of the IEEE Workshop on Signal Processing Systems, SiPS 2008, October 8-10, 2008, Washington, D.C. Metro Area, USA, pp. 194-199, 2008, IEEE, 978-1-4244-2924-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Miguel E. R. Bezerra, Adriano L. I. Oliveira, Paulo J. L. Adeodato, Silvio R. L. Meira |
Enhancing RBF-DDA Algorithm's Robustness: Neural Networks Applied to Prediction of Fault-Prone Software Modules. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IFIP AI ![In: Artificial Intelligence in Theory and Practice II, IFIP 20th World Computer Congress, TC 12: IFIP AI 2008 Stream, September 7-10, 2008, Milano, Italy, pp. 119-128, 2008, Springer, 978-0-387-09694-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Jianquan Dong, Chao Tan, Yunqi Zhang |
A Reputation Evaluation Method in P2P Anonymous Environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICYCS ![In: Proceedings of the 9th International Conference for Young Computer Scientists, ICYCS 2008, Zhang Jia Jie, Hunan, China, November 18-21, 2008, pp. 1516-1521, 2008, IEEE Computer Society, 978-0-7695-3398-8. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Brian Robinson, Lee J. White |
Testing of User-Configurable Software Systems Using Firewalls. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSRE ![In: 19th International Symposium on Software Reliability Engineering (ISSRE 2008), 11-14 November 2008, Seattle/Redmond, WA, USA, pp. 177-186, 2008, IEEE Computer Society, 978-0-7695-3405-3. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Kouhi Shinohara, Minoru Watanabe |
Defect tolerance of holographic configurations in ORGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IPDPS ![In: 22nd IEEE International Symposium on Parallel and Distributed Processing, IPDPS 2008, Miami, Florida USA, April 14-18, 2008, pp. 1-8, 2008, IEEE. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Alexandre Mallet, Lionel Gueguen, Mihai Datcu |
Complexity Based Image Artifact Detection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DCC ![In: 2008 Data Compression Conference (DCC 2008), 25-27 March 2008, Snowbird, UT, USA, pp. 534, 2008, IEEE Computer Society, 978-0-7695-3121-2. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
images artifacts, kolmogorov complexity |
12 | Lingxiao Jiang, Zhendong Su 0001 |
Profile-guided program simplification for effective testing and analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SIGSOFT FSE ![In: Proceedings of the 16th ACM SIGSOFT International Symposium on Foundations of Software Engineering, 2008, Atlanta, Georgia, USA, November 9-14, 2008, pp. 48-58, 2008, ACM, 978-1-59593-995-1. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
testing and analysis, profiling, statistical debugging, program simplification |
12 | Nuo Li, JeeHyun Hwang, Tao Xie 0001 |
Multiple-implementation testing for XACML implementations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
TAV-WEB ![In: Proceedings of the 2008 Workshop on Testing, Analysis, and Verification of Web Services and Applications, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), TAV-WEB 2008, Seattle, Washington, USA, July 21, 2008, pp. 27-33, 2008, ACM, 978-1-60558-053-1. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
multiple-implementation testing, policy decision point, testing, XACML, access control policy |
12 | Matthew Harker, Paul O'Leary |
Least squares surface reconstruction from measured gradient fields. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CVPR ![In: 2008 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR 2008), 24-26 June 2008, Anchorage, Alaska, USA, 2008, IEEE Computer Society, 978-1-4244-2242-5. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Cyrille Artho |
Iterative Delta Debugging. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Haifa Verification Conference ![In: Hardware and Software: Verification and Testing, 4th International Haifa Verification Conference, HVC 2008, Haifa, Israel, October 27-30, 2008. Proceedings, pp. 99-113, 2008, Springer, 978-3-642-01701-8. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Thomas J. Ostrand, Elaine J. Weyuker |
Progress in Automated Software Defect Prediction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Haifa Verification Conference ![In: Hardware and Software: Verification and Testing, 4th International Haifa Verification Conference, HVC 2008, Haifa, Israel, October 27-30, 2008. Proceedings, pp. 200-204, 2008, Springer, 978-3-642-01701-8. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
negative binomial model, automated tool, software fault prediction |
12 | Mingjie Lin, Steve Ferguson, Yaling Ma, Timothy Greene |
HAFT: A hybrid FPGA with amorphous and fault-tolerant architecture. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS ![In: International Symposium on Circuits and Systems (ISCAS 2008), 18-21 May 2008, Sheraton Seattle Hotel, Seattle, Washington, USA, pp. 1348-1351, 2008, IEEE, 978-1-4244-1683-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Tiejun Pan, Leina Zheng, Chengbin Fang |
Defect Tracing System Based on Orthogonal Defect Classification. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CSSE (2) ![In: International Conference on Computer Science and Software Engineering, CSSE 2008, Volume 2: Software Engineering, December 12-14, 2008, Wuhan, China, pp. 574-577, 2008, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Giovanni Aiello, Emanuele Dilettoso, Nunzio Salerno |
Development of a Finite Element Code for Non-Destructive Evaluation of Concrete Structures by Means of Ultrasonic Waves. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCSA (2) ![In: Computational Science and Its Applications - ICCSA 2008, International Conference, Perugia, Italy, June 30 - July 3, 2008, Proceedings, Part II, pp. 555-565, 2008, Springer, 978-3-540-69840-1. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Barbara Cannas, Sara Carcangiu, Francesca Cau, Alessandra Fanni, Augusto Montisci |
Time and Frequency Approaches to Non Destructive Testing in Concrete Pillars Using Neural Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCSA (2) ![In: Computational Science and Its Applications - ICCSA 2008, International Conference, Perugia, Italy, June 30 - July 3, 2008, Proceedings, Part II, pp. 606-616, 2008, Springer, 978-3-540-69840-1. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
neural networks, ultrasonic waves, Non Destructive Testing |
12 | Antonino Musolino, Marco Raugi, Mauro Tucci, Florin Turcu |
Time, Wavelet and Hilbert-Huang Domain Analysis of Signals from Ultrasonic Based Equipment for the Non Destructive Evaluation of Concrete and Brick Masonry Walls. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCSA (2) ![In: Computational Science and Its Applications - ICCSA 2008, International Conference, Perugia, Italy, June 30 - July 3, 2008, Proceedings, Part II, pp. 566-581, 2008, Springer, 978-3-540-69840-1. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Magnetostrictive transducers and sensors, Wavelet transform, Hilbert-Huang transform, Ultrasonic waves, Non Destructive Test |
12 | Raimund Moser, Witold Pedrycz, Giancarlo Succi |
Analysis of the reliability of a subset of change metrics for defect prediction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESEM ![In: Proceedings of the Second International Symposium on Empirical Software Engineering and Measurement, ESEM 2008, October 9-10, 2008, Kaiserslautern, Germany, pp. 309-311, 2008, ACM, 978-1-59593-971-5. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
feature selection, software metrics, defect prediction |
12 | Philipp V. Panitz, Markus Olbrich, Erich Barke, Markus Bühler, Jürgen Koehl |
Considering possible opens in non-tree topology wire delay calculation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 18th ACM Great Lakes Symposium on VLSI 2008, Orlando, Florida, USA, May 4-6, 2008, pp. 17-22, 2008, ACM, 978-1-59593-999-9. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
non-tree topologies, yield, static timing analysis, delay analysis |
12 | Michael T. Niemier, Michael Crocker, Xiaobo Sharon Hu |
Fabrication Variations and Defect Tolerance for Nanomagnet-Based QCA. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA, pp. 534-542, 2008, IEEE Computer Society, 978-0-7695-3365-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Yoonjae Huh, Yoon-Hwa Choi |
Module Grouping for Defect Tolerance in Nanoscale Memory. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA, pp. 16-23, 2008, IEEE Computer Society, 978-0-7695-3365-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Jason G. Brown, R. D. (Shawn) Blanton |
Automated Standard Cell Library Analysis for Improved Defect Modeling. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 9th International Symposium on Quality of Electronic Design (ISQED 2008), 17-19 March 2008, San Jose, CA, USA, pp. 643-648, 2008, IEEE Computer Society, 978-0-7695-3117-5. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
test generation, diagnosis, fault simulation, fault, defect |
12 | Juan Li 0001, Lishan Hou, Zhongsen Qin, Qing Wang 0001, Guisheng Chen |
An Empirically-Based Process to Improve the Practice of Requirement Review. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSP ![In: Making Globally Distributed Software Development a Success Story, International Conference on Software Process, ICSP 2008, Leipzig, Germany, May 10-11, 2008, Proceedings, pp. 135-146, 2008, Springer, 978-3-540-79587-2. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
requirement review, requirement quality characteristic, quantitative, role-based |
12 | Arkady N. Soloviev, Polina S. Kourbatova, Nikolai I. Saprounov, Sergey N. Shevtsov |
The Neural Networks Approach to Identification of Local Damages in Elastic Structures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
NAA ![In: Numerical Analysis and Its Applications, 4th International Conference, NAA 2008, Lozenetz, Bulgaria, June 16-20, 2008. Revised Selected Papers, pp. 540-547, 2008, Springer, 978-3-642-00463-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
defect’s reconstruction, learning sets, identification, finite element, Perceptron |
12 | Ming-Chien Tsai, Ching-Hwa Cheng, Chiou-Mao Yang |
An All-Digital High-Precision Built-In Delay Time Measurement Circuit. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA, pp. 249-254, 2008, IEEE Computer Society, 978-0-7695-3123-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Gursimran Singh Walia, Jeffrey C. Carver, Nachiappan Nagappan |
The effect of the number of inspectors on the defect estimates produced by capture-recapture models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSE ![In: 30th International Conference on Software Engineering (ICSE 2008), Leipzig, Germany, May 10-18, 2008, pp. 331-340, 2008, ACM, 978-1-60558-079-1. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
capture-recapture models, requirements, inspections, validation and verification |
12 | Uvais Qidwai, Mohammed Maqbool |
On hybrid-fuzzy classifier design: An empirical modeling scenario for corrosion detection in gas pipelines. ![Search on Bibsonomy](Pics/bibsonomy.png) |
AICCSA ![In: The 6th ACS/IEEE International Conference on Computer Systems and Applications, AICCSA 2008, Doha, Qatar, March 31 - April 4, 2008, pp. 884-890, 2008, IEEE Computer Society, 978-1-4244-1967-8. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Srikanth Venkataraman, Nagesh Tamarapalli |
DFM / DFT / SiliconDebug / Diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 21st International Conference on VLSI Design (VLSI Design 2008), 4-8 January 2008, Hyderabad, India, pp. 5-6, 2008, IEEE Computer Society, 0-7695-3083-4. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Adit D. Singh |
Scan Delay Testing of Nanometer SoCs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 21st International Conference on VLSI Design (VLSI Design 2008), 4-8 January 2008, Hyderabad, India, pp. 13, 2008, IEEE Computer Society, 0-7695-3083-4. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Marco D'Ambros |
Supporting software evolution analysis with historical dependencies and defect information. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSM ![In: 24th IEEE International Conference on Software Maintenance (ICSM 2008), September 28 - October 4, 2008, Beijing, China, pp. 412-415, 2008, IEEE Computer Society, 978-1-4244-2613-3. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Antonio Zenteno Ramírez, Guillermo Espinosa, Víctor H. Champac |
Design-for-Test Techniques for Opens in Undetected Branches in CMOS Latches and Flip-Flops. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 15(5), pp. 572-577, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Pallav Gupta, Niraj K. Jha, Loganathan Lingappan |
A Test Generation Framework for Quantum Cellular Automata Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 15(1), pp. 24-36, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Les Hatton |
Empirical Test Observations in Client-Server Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Computer ![In: Computer 40(5), pp. 24-29, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
language parsing, software testing, client-server systems |
12 | Kypros Constantinides, Stephen Plaza, Jason A. Blome, Valeria Bertacco, Scott A. Mahlke, Todd M. Austin, Bin Zhang 0011, Michael Orshansky |
Architecting a reliable CMP switch architecture. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Archit. Code Optim. ![In: ACM Trans. Archit. Code Optim. 4(1), pp. 2, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
CMP switch, reliability, defect-tolerance |
12 | Tad Hogg, Greg Snider |
Defect-tolerant Logic with Nanoscale Crossbar Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 23(2-3), pp. 117-129, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
fault modeling, nanotechnology, molecular electronics, circuit reliability |
12 | Rahul Telang, Sunil Wattal |
An Empirical Analysis of the Impact of Software Vulnerability Announcements on Firm Stock Price. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Software Eng. ![In: IEEE Trans. Software Eng. 33(8), pp. 544-557, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
software vendors, quality, Information security, patching, software vulnerability, event-study |
12 | Wes Masri, Andy Podgurski, David Leon |
An Empirical Study of Test Case Filtering Techniques Based on Exercising Information Flows. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Software Eng. ![In: IEEE Trans. Software Eng. 33(7), pp. 454-477, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
test case filtering, coverage-based filtering, distribution-based filtering, software testing, empirical studies, Information flow, dynamic slicing, test suite minimization |
12 | Xianghua Xie, Majid Mirmehdi |
TEXEMS: Texture Exemplars for Defect Detection on Random Textured Surfaces. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Pattern Anal. Mach. Intell. ![In: IEEE Trans. Pattern Anal. Mach. Intell. 29(8), pp. 1454-1464, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
texem model, EM algorithm, mixture model, texture analysis, Defect detection |
12 | Aleksandar Dogandzic, Benhong Zhang |
Bayesian NDE Defect Signal Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Signal Process. ![In: IEEE Trans. Signal Process. 55(1), pp. 372-378, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Gary Wassermann, Carl Gould 0001, Zhendong Su 0001, Premkumar T. Devanbu |
Static checking of dynamically generated queries in database applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Softw. Eng. Methodol. ![In: ACM Trans. Softw. Eng. Methodol. 16(4), pp. 14, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
database queries, JDBC, Static checking, context-free language reachability |
12 | Valerio Pascucci, Giorgio Scorzelli, Peer-Timo Bremer, Ajith Mascarenhas |
Robust on-line computation of Reeb graphs: simplicity and speed. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Graph. ![In: ACM Trans. Graph. 26(3), pp. 58, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Artem Marchenko, Pekka Abrahamsson |
Predicting Software Defect Density: A Case Study on Automated Static Code Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
XP ![In: Agile Processes in Software Engineering and Extreme Programming, 8th International Conference, XP 2007, Como, Italy, June 18-22, 2007, Proceedings, pp. 137-140, 2007, Springer, 978-3-540-73100-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
defect estimation, case study, quality, automation, embedded software, agile software development, static code analysis |
12 | Addisson Salazar, Juan M. Unió, Arturo Serrano, Jorge Gosálbez |
Neural Networks for Defect Detection in Non-destructive Evaluation by Sonic Signals. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IWANN ![In: Computational and Ambient Intelligence, 9th International Work-Conference on Artificial Neural Networks, IWANN 2007, San Sebastián, Spain, June 20-22, 2007, Proceedings, pp. 638-645, 2007, Springer, 978-3-540-73006-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Hyunjin Lee, Sangyeun Cho, Bruce R. Childers |
Performance of Graceful Degradation for Cache Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISVLSI ![In: 2007 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2007), May 9-11, 2007, Porto Alegre, Brazil, pp. 409-415, 2007, IEEE Computer Society, 0-7695-2896-1. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
Displaying result #601 - #700 of 5103 (100 per page; Change: ) Pages: [ <<][ 1][ 2][ 3][ 4][ 5][ 6][ 7][ 8][ 9][ 10][ 11][ 12][ 13][ 14][ 15][ 16][ >>] |
|