|
|
Venues (Conferences, Journals, ...)
|
|
GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 199 occurrences of 154 keywords
|
|
|
Results
Found 896 publication records. Showing 896 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
1 | Irith Pomeranz, Sudhakar M. Reddy |
Input Cubes with Lingering Synchronization Effects and their Use in Random Sequential Test Generation. |
ETS |
2009 |
DBLP DOI BibTeX RDF |
|
1 | Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso, Edgar E. Sánchez, Matteo Sonza Reorda |
Automatic Functional Stress Pattern Generation for SoC Reliability Characterization. |
ETS |
2009 |
DBLP DOI BibTeX RDF |
SoC reliability characterization |
1 | Janusz Rajski |
We Have Got Compression, What Next? |
ETS |
2009 |
DBLP DOI BibTeX RDF |
|
1 | Rajeshwary Tayade, Jacob A. Abraham |
Critical Path Selection for Delay Test Considering Coupling Noise. |
ETS |
2009 |
DBLP DOI BibTeX RDF |
|
1 | Michael A. Kochte, Christian G. Zoellin, Hans-Joachim Wunderlich |
Concurrent Self-Test with Partially Specified Patterns for Low Test Latency and Overhead. |
ETS |
2009 |
DBLP DOI BibTeX RDF |
Concurrent self test, test generation, BIST |
1 | Sehun Kook, Vishwanath Natarajan, Abhijit Chatterjee, Shalabh Goyal, Le Jin |
Testing of High Resolution ADCs Using Lower Resolution DACs via Iterative Transfer Function Estimation. |
ETS |
2009 |
DBLP DOI BibTeX RDF |
|
1 | Olivier Ginez, Jean-Michel Portal, Christophe Muller |
Design and Test Challenges in Resistive Switching RAM (ReRAM): An Electrical Model for Defect Injections. |
ETS |
2009 |
DBLP DOI BibTeX RDF |
ReRAM, Defect Injection, Electrical Simulation, Memory Testing |
1 | Michiko Inoue, Tomokazu Yoneda, Muneo Hasegawa, Hideo Fujiwara |
Partial Scan Approach for Secret Information Protection. |
ETS |
2009 |
DBLP DOI BibTeX RDF |
Cryptographic circuits, Security, Testability, Balanced structure |
1 | Frank-Uwe Faber, Matthias Beck, Markus Rudack, Olivier Barondeau, Thomas Rabenalt, Michael Gössel, Andreas Leininger |
Doubling Test Cell Throughput by On-Loadboard Hardware- Implementation and Experience in a Production Environment. |
ETS |
2009 |
DBLP DOI BibTeX RDF |
|
1 | Jaynarayan T. Tudu, Erik Larsson, Virendra Singh, Vishwani D. Agrawal |
On Minimization of Peak Power for Scan Circuit during Test. |
ETS |
2009 |
DBLP DOI BibTeX RDF |
Power droop, Test vector re-ordering, Low power test, Peak Power |
1 | Mohammed Ashfaq Shukoor, Vishwani D. Agrawal |
A Two Phase Approach for Minimal Diagnostic Test Set Generation. |
ETS |
2009 |
DBLP DOI BibTeX RDF |
generalized fault independence, Fault diagnosis, integer linear programming, fault dictionary, test minimization |
1 | Andreas Apostolakis, Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis, Ishwar Parulkar |
Exploiting Thread-Level Parallelism in Functional Self-Testing of CMT Processors. |
ETS |
2009 |
DBLP DOI BibTeX RDF |
Chip multithreading, micro-processor testing, functional self-testing, test time optimization, multiprocessors, software-based self-testing |
1 | Stephan Eggersglüß, Rolf Drechsler |
Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques. |
ETS |
2009 |
DBLP DOI BibTeX RDF |
ATPG, SAT, Delay Test, Boolean Satisfiability, Dynamic Learning |
1 | Ruifeng Guo, Wu-Tung Cheng, Kun-Han Tsai |
Speed-Path Debug Using At-Speed Scan Test Patterns. |
ETS |
2009 |
DBLP DOI BibTeX RDF |
|
1 | |
14th IEEE European Test Symposium, ETS 2009, Sevilla, Spain, May 25-29, 2009 |
ETS |
2009 |
DBLP BibTeX RDF |
|
1 | Christian Landrault |
Something I Always Wanted to Know About Test, But Was Afraid to Ask. |
ETS |
2009 |
DBLP DOI BibTeX RDF |
|
1 | Kihyuk Han, Joonsung Park, Jae Wook Lee, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo, Sejang Oh |
Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. |
ETS |
2009 |
DBLP DOI BibTeX RDF |
|
1 | Haralampos-G. D. Stratigopoulos, Salvador Mir, Erkan Acar, Sule Ozev |
Defect Filter for Alternate RF Test. |
ETS |
2009 |
DBLP DOI BibTeX RDF |
alternate test, defect filter, density estimation, RF test |
1 | Vezio Malandruccolo, Mauro Ciappa, Wolfgang Fichtner, Hubert Rothleitner |
Novel Solution for the Built-in Gate Oxide Stress Test of LDMOS in Integrated Circuits for Automotive Applications. |
ETS |
2009 |
DBLP DOI BibTeX RDF |
Gate Stress Test, Gate Oxide Reliability, Low Side Switch, Burn-In |
1 | Josep Rius 0001, Luis Elvira Villagra, Maurice Meijer |
A Voltage-Mode Testing Method to Detect IDDQ Defects in Digital Circuits. |
ETS |
2009 |
DBLP DOI BibTeX RDF |
IDDQ testing |
1 | Ho Fai Ko, Nicola Nicolici |
Resource-Efficient Programmable Trigger Units for Post-Silicon Validation. |
ETS |
2009 |
DBLP DOI BibTeX RDF |
programmable trigger unit, false trigger analysis, post-silicon validation |
1 | Xiaoqin Sheng, Hans G. Kerkhoff, Amir Zjajo, Guido Gronthoud |
Algorithms for ADC Multi-site Test with Digital Input Stimulus. |
ETS |
2009 |
DBLP DOI BibTeX RDF |
|
1 | Yasser Sedaghat, Seyed Ghassem Miremadi |
Categorizing and Analysis of Activated Faults in the FlexRay Communication Controller Registers. |
ETS |
2009 |
DBLP DOI BibTeX RDF |
FlexRay protocol, Fault injection, Distributed embedded systems, Safety-critical applications |
1 | Qais Al-Gayem, Hongyuan Liu 0001, Andrew Richardson 0001, Nick Burd |
Built-in Test Solutions for the Electrode Structures in Bio-Fluidic Microsystems. |
ETS |
2009 |
DBLP DOI BibTeX RDF |
bio-fluidics, MNT, self-test, microfluidics, embedded test |
1 | Mohamed Abbas, Kwang-Ting Cheng, Yasuo Furukawa, Satoshi Komatsu, Kunihiro Asada |
Signature-Based Testing for Digitally-Assisted Adaptive Equalizers in High-Speed Serial Links. |
ETS |
2009 |
DBLP DOI BibTeX RDF |
digitally-assisted adaptive equalizers, static signature-based testing, dynamic signature-based testing |
1 | Thomas Rabenalt, Michael Gössel, Andreas Leininger |
Masking of X-values by Use of a Hierarchically Configurable Register. |
ETS |
2009 |
DBLP DOI BibTeX RDF |
X-values, X-masking, DFT |
1 | Michael A. Kochte, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich |
Test Encoding for Extreme Response Compaction. |
ETS |
2009 |
DBLP DOI BibTeX RDF |
Embedded Diagnosis, Design for Test, Test Compression, Response Compaction |
1 | Vladimir A. Zivkovic, Frank van der Heyden, Guido Gronthoud, Frans G. M. de Jong |
Analog Test Bus Infrastructure for RF/AMS Modules in Core-Based Design. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
Modular Test, Analog Test, Test Architecture |
1 | Rajarajan Senguttuvan, Hyun Woo Choi, Donghoon Han, Abhijit Chatterjee |
Built-in Test of Frequency Modulated RF Transmitters Using Embedded Low-Pass Filters. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
|
1 | Swapnil Bahl, Vishal Srivastava |
Self-Programmable Shared BIST for Testing Multiple Memories. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
Memory testing and Semiconductor memory, Built-in Self-test (BIST), Pipeline architecture |
1 | Martin Hilscher, Michael Braun, Michael Richter 0002, Andreas Leininger, Michael Gössel |
Accelerated Shift Registers for X-tolerant Test Data Compaction. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
X-tolerant, Test Compaction, MISR |
1 | Giorgio Di Natale, M. Doulcier, Marie-Lise Flottes, Bruno Rouzeyre |
A Reliable Architecture for the Advanced Encryption Standard. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
AES cryptochip, On-Line Self-Test, Reliability |
1 | Nathan Kupp, Petros Drineas, Mustapha Slamani, Yiorgos Makris |
Confidence Estimation in Non-RF to RF Correlation-Based Specification Test Compaction. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
|
1 | Benoît Godard, Jean Michel Daga, Lionel Torres, Gilles Sassatelli |
Hierarchical Code Correction and Reliability Management in Embedded nor Flash Memories. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
NOR flash memories, reliabilty management, markov modeling |
1 | Stefan Holst, Hans-Joachim Wunderlich |
Adaptive Debug and Diagnosis without Fault Dictionaries. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
VLSI, Test, Debug, Diagnosis |
1 | Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Hiroshi Furukawa, Yuta Yamato, Atsushi Takashima, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja |
A Capture-Safe Test Generation Scheme for At-Speed Scan Testing. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
At-Speed Scan Testing, Test Relaxation, X-Filling, Capture Mode, Yield Loss |
1 | Rajeshwary Tayade, Jacob A. Abraham |
Critical Path Selection for Delay Test Considering Coupling Noise. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
Coupling noise, weighted partial max sat, critical path selection, delay test |
1 | Esa Korhonen, Juha Kostamovaara |
An Improved Algorithm to Identify the Test Stimulus in Histogram-Based A/D Converter Testing. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
histogram test, integral non-linearity (INL), stimulus identification, built-in self-test (BIST), A/D converter (ADC) |
1 | Laura Frigerio, Matteo Alan Radaelli, Fabio Salice |
Convolutional Coding for SEU mitigation. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
SEU mitigation, convolutional coding |
1 | Seongmoon Wang, Wenlong Wei |
Low Overhead Partial Enhanced Scan Technique for Compact and High Fault Coverage Transition Delay Test Patterns. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
Transition delay fault, broadside, skewed-load, enhanced scan |
1 | Cecilia Metra, Daniele Rossi 0001, Martin Omaña 0001, Abhijit Jas, Rajesh Galivanche |
Function-Inherent Code Checking: A New Low Cost On-Line Testing Approach for High Performance Microprocessor Control Logic. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
microprocessor, error detecting codes, on-line testing, control logic |
1 | Eduardo Aldrete-Vidrio, M. Amine Salhi, Josep Altet, Stéphane Grauby, Diego Mateo, H. Michel, L. Clerjaud, Jean-Michel Rampnoux, Antonio Rubio 0001, Wilfrid Claeys, Stefan Dilhaire |
Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
system debug, analog test, Thermal test, RF test, temperature measurements |
1 | Antonio Rubio 0001 |
The Role of Test in Circuits Built with Unreliable Components. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
|
1 | |
13th European Test Symposium, ETS 2008, Verbania, Italy, May 25-29, 2008 |
ETS |
2008 |
DBLP BibTeX RDF |
|
1 | Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso |
An Innovative and Low-Cost Industrial Flow for Reliability Characterization of SoCs. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
reliability characterization, dft, soc |
1 | Yu Huang 0005, Wu-Tung Cheng, Ruifeng Guo |
Diagnose Multiple Stuck-at Scan Chain Faults. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
chain diagnosis, multiple faults, dynamic learning |
1 | Daniele Rossi 0001, Paolo Angelini, Cecilia Metra, Giovanni Campardo, Gian Pietro Vanalli |
Risks for Signal Integrity in System in Package and Possible Remedies. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
Crosstalk, Error Detecting Codes, Signal Integrity, System in Package |
1 | Ardy van den Berg, Pengwei Ren, Erik Jan Marinissen, Georgi Gaydadjiev, Kees Goossens |
Bandwidth Analysis for Reusing Functional Interconnect as Test Access Mechanism. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
testing, reuse, modular, Network-on-Chip, integrated circuit, test access mechanism |
1 | Thomas W. Williams |
The Future Is Low Power and Test. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
|
1 | Maksim Jenihhin, Jaan Raik, Anton Chepurov, Raimund Ubar |
Temporally Extended High-Level Decision Diagrams for PSL Assertions Simulation. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
assertion checking, decision diagrams, Property Specification Language |
1 | Qingqi Dou, Jacob A. Abraham |
Jitter Decomposition in High-Speed Communication Systems. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
Jitter Test, Jitter Analysis, Jitter Decomposition, Autocorrelation, Time domain |
1 | Christian G. Zoellin, Hans-Joachim Wunderlich, Ilia Polian, Bernd Becker 0001 |
Selective Hardening in Early Design Steps. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
Soft error mitigation, reliability |
1 | Alejandro Czutro, Nicolas Houarche, Piet Engelke, Ilia Polian, Mariane Comte, Michel Renovell, Bernd Becker 0001 |
A Simulator of Small-Delay Faults Caused by Resistive-Open Defects. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
Small-delay defects, resistive opens, probabilistic fault coverage, bridging fault simulation |
1 | Irith Pomeranz, Sudhakar M. Reddy |
Safe Fault Collapsing Based on Dominance Relations. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
test generation, bridging faults, fault collapsing, dominance relations |
1 | Quming Zhou, Mihir R. Choudhury, Kartik Mohanram |
Tunable Transient Filters for Soft Error Rate Reduction in Combinational Circuits. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
filters, soft errors, circuit optimization, radiation hardening, fault avoidance |
1 | Ehab Anis Daoud, Nicola Nicolici |
On Bypassing Blocking Bugs during Post-Silicon Validation. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
|
1 | Simone Alpe, Stefano Di Carlo, Paolo Prinetto, Alessandro Savino |
Applying March Tests to K-Way Set-Associative Cache Memories. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
cache memories, memory test, march test |
1 | S. Saqib Khursheed, Paul M. Rosinger, Bashir M. Al-Hashimi, Sudhakar M. Reddy, Peter Harrod |
Bridge Defect Diagnosis for Multiple-Voltage Design. |
ETS |
2008 |
DBLP DOI BibTeX RDF |
Logic based Diagnosis, Multiple-Vdd designs, Resistive Bridging Faults |
1 | Luca Sterpone, Massimo Violante |
Static and Dynamic Analysis of SEU Effects in SRAM-Based FPGAs. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
|
1 | Irith Pomeranz, Sudhakar M. Reddy |
Diagnostic Test Generation Based on Subsets of Faults. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
|
1 | Fawnizu Azmadi Hussin, Tomokazu Yoneda, Hideo Fujiwara |
Optimization of NoC Wrapper Design under Bandwidth and Test Time Constraints. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
|
1 | Sankar Gurumurthy, Ramtilak Vemu, Jacob A. Abraham, Daniel G. Saab |
Automatic Generation of Instructions to Robustly Test Delay Defects in Processors. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
|
1 | Ivo Koren, Frank Demmerle, Roland May, Martin Kaibel, Sebastian Sattler |
FPGA Architecture for RF Transceiver System and Mixed-Signal Low Cost Tests. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
|
1 | Huaxing Tang, Manish Sharma, Janusz Rajski, Martin Keim, Brady Benware |
Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
|
1 | Said Hamdioui, Zaid Al-Ars, Javier Jiménez, Jose Calero |
PPM Reduction on Embedded Memories in System on Chip. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
static faults, PPM reduction, memory testing, dynamic faults |
1 | Andreas Merentitis, Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos |
Selecting Power-Optimal SBST Routines for On-Line Processor Testing. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
|
1 | Philippe Cauvet, Serge Bernard, Michel Renovell |
System-in-Package, a Combination of Challenges and Solutions. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
|
1 | Erik Schüler, Marcelo Negreiros, Pascal Nouet, Luigi Carro |
A Digitally Testable Capacitance-Insensitive Mixed-Signal Filter. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
|
1 | Rene Segers |
If It's All about Yield, Why Talk about Testing? |
ETS |
2007 |
DBLP DOI BibTeX RDF |
|
1 | Philipp Öhler, Sybille Hellebrand, Hans-Joachim Wunderlich |
An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
|
1 | Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin |
Digital Generation of Signals for Low Cost RF BIST. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
|
1 | Tao Xu 0002, Krishnendu Chakrabarty |
Parallel Scan-Like Testing and Fault Diagnosis Techniques for Digital Microfluidic Biochips. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
|
1 | Bart Vermeulen, Kees Goossens, Remco van Steeden, Martijn T. Bennebroek |
Communication-Centric SoC Debug Using Transactions. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
|
1 | |
12th European Test Symposium, ETS 2007, Freiburg, Germany, May 20, 2007 |
ETS |
2007 |
DBLP BibTeX RDF |
|
1 | Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel |
Computation and Application of Absolute Dominators in Industrial Designs. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
|
1 | Norbert Dumas, Zhou Xu, Kostas Georgopoulos, R. John T. Bunyan, Andrew Richardson 0001 |
A Novel Approach for Online Sensor Testing Based on an Encoded Test Stimulus. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
correlation, Online testing, covariance, pseudorandom sequence, MEMS testing |
1 | Klaus Luther |
Embedded Tutorial: IC Test Cost Benchmarking. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
benchmarking, cost, best practice, test time |
1 | Paolo Bernardi, Michelangelo Grosso, Ernesto Sánchez 0001, Matteo Sonza Reorda |
On the Automatic Generation of Test Programs for Path-Delay Faults in Microprocessor Cores. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
|
1 | Nicola Nicolici, Xiaoqing Wen |
Embedded Tutorial on Low Power Test. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
|
1 | Raimund Ubar, Sergei Devadze, Jaan Raik, Artur Jutman |
Ultra Fast Parallel Fault Analysis on Structurally Synthesized BDDs. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
|
1 | Stephen K. Sunter, Aubin Roy |
Purely Digital BIST for Any PLL or DLL. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
|
1 | Stefan Holst, Hans-Joachim Wunderlich |
Adaptive Debug and Diagnosis without Fault Dictionaries. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
VLSI, Test, Debug, Diagnosis |
1 | Alexandre Rousset, Alberto Bosio, Patrick Girard 0001, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel |
DERRIC: A Tool for Unified Logic Diagnosis. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
|
1 | Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell |
"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
|
1 | Alexandre Ney, Patrick Girard 0001, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian |
Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
|
1 | Peter C. Maxwell |
Wafer Level Reliability Screens. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
|
1 | Jaan Raik, Raimund Ubar, Vineeth Govind |
Test Configurations for Diagnosing Faulty Links in NoC Switches. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
|
1 | Ben Bennetts |
Electronics Design-for-Test: Past, Present and Future. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
|
1 | Shaji Krishnan, Rene Jonker, Leon van de Logt |
Variance Reduction for Supply Ramp Based Cheap RF Test Alternatives. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
|
1 | Tomoo Inoue, Takashi Fujii, Hideyuki Ichihara |
Optimal Contexts for the Self-Test of Coarse Grain Dynamically Reconfigurable Processors. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
Dynamically reconfigurable processors, optimal contexts, test frames, self-test, test application time |
1 | Zhanglei Wang, Krishnendu Chakrabarty, Michael Bienek |
A Seed-Selection Method to Increase Defect Coverage for LFSR-Reseeding-Based Test Compression. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
|
1 | Carlos Arthur Lang Lisbôa, Marcelo Ienczczak Erigson, Luigi Carro |
System Level Approaches for Mitigation of Long Duration Transient Faults in Future Technologies. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
|
1 | Olivier Ginez, Jean Michel Daga, Patrick Girard 0001, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel |
Electrical Simulation Model of the 2T-FLOTOX Core-Cell for Defect Injection and Faulty Behavior Prediction in eFlash Memories. |
ETS |
2007 |
DBLP DOI BibTeX RDF |
|
1 | Kentaroh Katoh, Hideo Ito |
Built-In Self-Test for PEs of Coarse Grained Dynamically Reconfigurable Devices. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
Coarse Grained Dynamically Reconfigurable Devices, DRP, BIST(Built-In Self Test), PE, DFT |
1 | Zhuo Zhang 0008, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski, Bashir M. Al-Hashimi |
Enhancing Delay Fault Coverage through Low Power Segmented Scan. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Alexandre M. Amory, Kees Goossens, Erik Jan Marinissen, Marcelo Lubaszewski, Fernando Moraes 0001 |
Wrapper Design for the Reuse of Networks-on-Chip as Test Access Mechanism. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Matthew Collins, Bashir M. Al-Hashimi |
On-Chip Time Measurement Architecture with Femtosecond Timing Resolution. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Sandeep Kumar Goel, Maurice Meijer, José Pineda de Gyvez |
Testing and Diagnosis of Power Switches in SOCs. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
1 | Valentin Gherman, Hans-Joachim Wunderlich, Jürgen Schlöffel, Michael Garbers |
Deterministic Logic BIST for Transition Fault Testing. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
Deterministic logic BIST, delay test |
1 | Matteo Sonza Reorda, Luca Sterpone, Massimo Violante, Marta Portela-García, Celia López-Ongil, Luis Entrena |
Fault Injection-based Reliability Evaluation of SoPCs. |
ETS |
2006 |
DBLP DOI BibTeX RDF |
|
Displaying result #701 - #800 of 896 (100 per page; Change: ) Pages: [ <<][ 1][ 2][ 3][ 4][ 5][ 6][ 7][ 8][ 9][ >>] |
|