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Found 1201 publication records. Showing 1201 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Taiki Uemura, Soonyoung Lee, Dahye Min, Ihlhwa Moon, Seungbae Lee, Sangwoo Pae |
SEIFF: Soft Error Immune Flip-Flop for Mitigating Single Event Upset and Single Event Transient in 10 nm FinFET.  |
IRPS  |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Nam-Hyun Lee, Jongkyun Kim, Donghee Son, Kangjun Kim, Jung Eun Seok |
Comprehensive Study for OFF-State Hot Carrier Degrdation of Scaled nMOSFETs in DRAM. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Kanghyun Choi, Jongwon Lee, Jongwoo Park 0001 |
Nonlinear Mixed Model and Reliability Prediction for OLED Luminance Degradation. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Yolène Sacchettini, Jean-Pierre Carrère, Vincent Goiffon, Pierre Magnan |
Plasma Antenna Charging in CMOS Image Sensors. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Yefan Liu, Hao Yu, Gaspard Hiblot, Anastasiia Kruv, Marc Schaekers, Naoto Horiguchi, Dimitrios Velenis, Ingrid De Wolf |
Study of the Mechanical Stress Impact on Silicide Contact Resistance by 4-Point Bending. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Hang Li, Kalpathy B. Sundaram, Yuanzhong (Paul) Zhou, Javier A. Salcedo, Jean-Jacques Hajjar |
Characterization and Modeling of the Transient Safe Operating Area in LDMOS Transistors. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Ming-Hsien Lin, W. S. Chou, Y. T. Yang, A. S. Oates |
Characterization of Critical Peak Current and General Model of Interconnect Systems Under Short Pulse-Width Conditions. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Peter Moens, Arno Stockman |
A Physical-Statistical Approach to AlGaN/GaN HEMT Reliability. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Gaspard Hiblot, Yefan Liu, Geert Hellings, Geert Van der Plas |
Comparative Analysis of the Degradation Mechanisms in Logic and I/O FinFET Devices Induced by Plasma Damage. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Zhuoyuan Zheng, Bo Chen, Yashraj Gurumukhi, John Cook, Mehmet N. Ates, Nenad Miljkovic, Paul V. Braun, Pingfeng Wang |
Surrogate Model Assisted Design of Silicon Anode Considering Lithiation Induced Stresses. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Geert Hellings, Philippe Roussel, Nian Wang, Roman Boschke, Shih-Hung Chen, Marko Simicic, Mirko Scholz, Soeren Stoedel, Kris Myny, Dimitri Linten, Paul Hellings, Nowab Reza M. D. Ashif |
Concise Analytical Expression for Wunsch-Bell 1-D Pulsed Heating and Applications in ESD Using TLP. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Kaustubh Joshi, Yung-Huei Lee, Yu-Cheng Yao, Shu-Wen Chang, Siao-Syong Bian, P. J. Liao, Jiaw-Ren Shih, Min-Jan Chen |
A Statistical Learning Model for Accurate Prediction of Time-Dependent Dielectric Degradation for Low Failure Rates. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Rui Cao, Jixuan Wu, Wenjing Yang, Jiezhi Chen, Xiangwei Jiang |
Program/Erase Cycling Enhanced Lateral Charge Diffusion in Triple-Level Cell Charge-Trapping 3D NAND Flash Memory. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | M. L. Breeding, Robert A. Reed, K. M. Warren, Michael L. Alles |
Exploration of the Impact of Physical Integration Schemes on Soft Errors in 3D ICs Using Monte Carlo Simulation. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Yuh-Yue Chen, Tsyr-Shyang Liou, Shyh-Chyi Wong |
Novel RC-Clamp Design for High Supply Voltage. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | |
IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019 |
IRPS |
2019 |
DBLP BibTeX RDF |
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| 1 | Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Houman Zahedmanesh, Kristof Croes, Kevin Garello, Gouri Sankar Kar, Francky Catthoor |
Variation-Aware Physics-Based Electromigration Modeling and Experimental Calibration for VLSI Interconnects. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Y. Ji, H. J. Goo, J. Lim, S. B. Lee, S. Lee, Taiki Uemura, J. C. Park, S. I. Han, S. C. Shin, J. H. Lee, Y. J. Song, K. M. Lee, H. M. Shin, S. H. Hwang, B. Y. Seo, Y. K. Lee, J. C. Kim, Gwanhyeob Koh, K. C. Park, Sangwoo Pae, Gi-Tae Jeong, J. S. Yoon, E. S. Jung |
Reliability of 8Mbit Embedded-STT-MRAM in 28nm FDSOI Technology. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Edoardo Ceccarelli, Kevin Manning, Seamus Maxwell, Colm Heffernan |
GIDL Increase Due to HCI Stress: Correlation Study of MOSFET Degradation Parameters and Modelling for Reliability Simulation. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Jyotika Athavale, Riccardo Mariani, Michael Paulitsch |
Flight Safety Certification Implications for Complex Multi-Core Processor Based Avionics Systems. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Bonnie E. Weir, Vani Prasad, Shahriar Moinian, SangJune Park, Joseph Blasko, Jason Brown, Jayanthi Pallinti |
Utilizing a Thorough Understanding of Critical Aging and Failure Mechanisms in finFET Technologies to Enable Reliable High Performance Circuits. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Hyewon Shim, Jeongmin Jo, Yoohwan Kim, Bongyong Jeong, Minji Shon, Hai Jiang 0005, Sangwoo Pae |
Aging-Aware Design Verification Methods Under Real Product Operating Conditions. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Yueyang Liu, Xiangwei Jiang, Liwei Wang 0003, Yunfei En, Runsheng Wang |
Distinguishing Interfacial Hole Traps in (110), (100) High-K Gate Stack. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Nagothu Karmel Kranthi, Boeila Sampath Kumar, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava |
Physical Insights into the Low Current ESD Failure of LDMOS-SCR and its Implication on Power Scalability. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | S. E. Liu, M. H. Hsieh, Y. R. Chen, J. Y. Jao, M. Z. Lin, Y. H. Fang, M. J. Lin |
High Voltage Tolerant Design with Advanced Process for TV Application. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Sandeep R. Bahl, Paul Brohlin |
A New Approach to Validate GaN FET Reliability to Power-Line Surges Under Use-Conditions. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Ayayi C. Ahyi, Sarit Dhar, Zeynep Dilli, Akin Akturk, Neil Goldsman, A. Ghanbari |
Reliability Testing of SiC MOS Devices at 500°C. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Besar Asllani, Alberto Castellazzi, Oriol Avino-Salvado, Asad Fayyaz, Hervé Morel, Dominique Planson |
VTH-Hysteresis and Interface States Characterisation in SiC Power MOSFETs with Planar and Trench Gate. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Matt Ring, Johan De Greve, Bill Cowell, Darren Moore, Jeff Gambino |
BEOL Process Development Using Fast Power Cycling on Test Structures. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Shifan Gao, Bing Chen, Nuo Xu, Yiming Qu, Yi Zhao |
Probing Write Error Rate and Random Telegraph Noise of MgO Based Magnetic Tunnel Juction Using a High Throughput Characterization System. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Kenichiro Tanaka, Masahiro Hikita, Tetsuzo Ueda |
Influence of Donor-Type Hole Traps Under P-GaN Gate in GaN-Based Gate Injection Transistor (GIT). |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Ajit Kanale, Kijeong Han, B. Jayant Baliga, Subhashish Bhattacharya |
Stability of 4H-SiC JBS Diodes Under Repetitive Avalanche Stress. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Wen Yang, Jiann-Shiun Yuan, Balakrishnan Krishnan, Patrick Shea |
Low-Side GaN Power Device Dynamic Ron Characteristics Under Different Substrate Biases. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Jie Jack Zeng, Ruchil Jain, Kyong Jin Hwang, Robert Gauthier 0002 |
A Novel HV-NPN ESD Protection Device with Buried Floating P-Type Implant. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Shouhei Fukuyama, Atsuna Hayakawa, Ryutaro Yasuhara, Shinpei Matsuda, Hiroshi Kinoshita, Ken Takeuchi |
Comprehensive Analysis of Data-Retention and Endurance Trade-Off of 40nm TaOx-based ReRAM. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Chun-Cheng Chen, Ming-Dou Ker |
Investigation on Latch-Up Path Between I/O PMOS and Core PMOS in a 0.18-μm CMOS Process. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Daniel B. Habersat, Ronald Green, Aivars J. Lelis |
Permanent and Transient Effects of High-Temperature Bias Stress on Room- Temperature $V_{T}$ Drift Measurements in SiC Power MOSFETs. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Pavel Bolshakov, Rodolfo A. Rodriguez-Davila, Manuel Quevedo-Lopez, Chadwin D. Young |
Positive Bias Instability in ZnO TFTs with Al2O3 Gate Dielectric. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Chen Wu, Adrian Vaisman Chasin, Andrea Padovani, Alicja Lesniewska, Steven Demuynck, Kris Croes |
Role of Defects in the Reliability of HfO2/Si-Based Spacer Dielectric Stacks for Local Interconnects. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Jae-Gyung Ahn, I-Ru Chen, Ping-Chin Yeh, Jonathan Chang |
Design-For-Reliability Flow in 7nm Products with Data Center and Automotive Applications. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Jay Sarkar, Cory Peterson |
Operational Workload Impact on Robust Solid-State Storage Analyzed with Interpretable Machine Learning. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | James P. Ashton, Patrick M. Lenahan, Daniel J. Lichtenwalner, Aivars J. Lelis, Mark A. Anders 0002 |
Reliability and Performance Issues in SiC MOSFETs: Insight Provided by Spin Dependent Recombination. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Jingchen Cao, Lyuan Xu, Bharat L. Bhuva, Shi-Jie Wen, Richard Wong, Balaji Narasimham, Lloyd W. Massengill |
Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Young-Joon Park, Jungwoo Joh, Jayhoon Chung, Srikanth Krishnan |
Current Crowding Impact on Electromigration in Al Interconnects. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Albert G. Baca, B. A. Klein, A. M. Armstrong, A. A. Allerman, E. A. Douglas, T. R. Fortune, R. J. Kaplar |
Stability in Fluorine-Treated Al-Rich High Electron Mobility Transistors with 85% Al-Barrier Composition. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Benyuan Zhu, E. M. Bazizi, J. H. M. Tng, Z. Li, E. K. Banghart, M. K. Hassan, Y. Hu, D. Zhou, D. Choi, L. Qin, Xuan Wan |
TCAD Simulation on FinFET n-type Power Device HCI Reliability Improvement. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Jun Furuta, Yuto Tsukita, Kodai Yamada, Mitsunori Ebara, Kentaro Kojima, Kazutoshi Kobayashi |
Impact of Combinational Logic Delay for Single Event Upset on Flip Flops in a 65 nm FDSOI Process. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Eric E. Fabris, Matteo Meneghini, Carlo De Santi, Matteo Borga, Gaudenzio Meneghesso, Enrico Zanoni, Y. Kinoshita, Kenichiro Tanaka, H. Ishida, Tetsuzo Ueda |
Hot-Electron Effects in GaN GITs and HD-GITs: A Comprehensive Analysis. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Wang Liao, Masanori Hashimoto, Seiya Manabe, Yukinobu Watanabe, Shin-ichiro Abe, Keita Nakano, Hayato Takeshita, Motonobu Tampo, Soshi Takeshita, Yasuhiro Miyake |
Negative and Positive Muon-Induced SEU Cross Sections in 28-nm and 65-nm Planar Bulk CMOS SRAMs. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Claire McKay Bowen, Nathan DeBardeleben, Sean Blanchard, Christine M. Anderson-Cook |
Do Solar Proton Events Reduce the Number of Faults in Supercomputers?: A Comparative Analysis of Faults During and without Solar Proton Events. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Cheikh Diouf, N. Guitard, M. Rafik, J. J. Martinez, X. Federspiel, Alain Bravaix, D. Muller, David Roy 0001 |
Process Optimization for HCI Improvement in I/O Analog Devices. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Eleonora Canato, Fabrizio Masin, Matteo Borga, Enrico Zanoni, Matteo Meneghini, Gaudenzio Meneghesso, Arno Stockman, Abhishek Banerjee 0003, Peter Moens |
µs-Range Evaluation of Threshold Voltage Instabilities of GaN-on-Si HEMTs with p-GaN Gate. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Sayak Dutta Gupta, Vipin Joshi, Bhawani Shankar, Swati Shikha, Srinivasan Raghavan 0002, Mayank Shrivastava |
UV-Assisted Probing of Deep-Level Interface Traps in GaN MISHEMTs and Their Role in Threshold Voltage & Gate Leakage Instabilities. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Alicja Lesniewska, S. A. Srinivasan, Joris Van Campenhout, Barry J. O'Sullivan, Kris Croes |
Accelerated Device Degradation of High-Speed Ge Waveguide Photodetectors. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Sriram Balasubramanian, Hari Balan, Lei Liu, Kevin Khua, Wah-Peng Neo, Dianji Sui, Tze Ho Simon Chan |
Enhanced Fail Rate Projections Using Negative Design Assist in Automotive Grade SRAMs. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Yuji Yamagishi, Yasuo Cho |
High Resolution Observation of Subsurface Defects at SiO2/4H-SiC Interfaces by Local Deep Level Transient Spectroscopy Based on Time-Resolved Scanning Nonlinear Dielectric Microscopy. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Kyoji Mizoguchi, Kyosuke Maeda, Ken Takeuchi |
Automatic Data Repair Overwrite Pulse for 3D-TLC NAND Flash Memories with 38x Data-Retention Lifetime Extension. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Siddarth Sundaresan, Vamsi Mulpuri, Stoyan Jeliazkov, Ranbir Singh |
Avalanche and Short-Circuit Robustness of 4600 V SiC DMOSFETs. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Niloofar Shakoorzadeh, Amir Hanna, Subramanian S. Iyer |
Bilayer Passivation Film for Cu Interconnects on Si Interconnect Fabric. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Nakul Pande, Gyusung Park, Chris H. Kim, Srikanth Krishnan, Vijay Reddy |
Investigating the Aging Dynamics of Diode-Connected MOS Devices Using an Array-Based Characterization Vehicle in a 65nm Process. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Diganta Das, Edmond Elburn, Michael G. Pecht, Bhanu Sood |
Evaluating Impact of Information Uncertainties on Component Reliability Assessment. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Tian Shen, Abu Naser Zainuddin, Purushothaman Srinivasan, Zakariae Chbili, Kai Zhao, Patrick Justison |
Novel Oxide Top-Off Process Enabling Reliable PC-CA TDDB on IO Devices with Self Aligned Contact. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Lili Cheng, Seungman Choi, Sean P. Ogden, Teck Jung Tang, Robert Fox |
Robust BEOL MIMCAP for Long and Controllable TDDB Lifetime. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | M. Iqbal Mahmud, Amit Gupta, Maria Toledano-Luque, N. Rao Mavilla, J. Johnson, P. Srinivasan 0002, A. Zainuddin, S. Rao, Salvatore Cimino, Byoung Min, Tanya Nigam |
Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in Advanced FinFETs. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | S. A. Wender, J. M. O'Donnell, Lukas Zavorka, Bharat L. Bhuva |
Neutron Beam Attenuation Through Semiconductor Devices During SEU Testing. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Venkata Chaitanya Krishna Chekuri, Arvind Singh, Nihar Dasari, Saibal Mukhopadhyay |
On the Effect of NBTI Induced Aging of Power Stage on the Transient Performance of On-Chip Voltage Regulators. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Mehedi Hasan, Biswajit Ray |
Tolerance of Deep Neural Network Against the Bit Error Rate of NAND Flash Memory. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | A. S. Teng, C. W. Lin, M. N. Chang, Aaron Wang, Ryan Lu |
A Novel Constant E-Field Methodology for Intrinsic TDDB Lifetime Projection. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Jongwon Lee, Sangkil Kim, Yoonsuk Choi, Jongwoo Park 0001 |
Process Variation of Pixel Definition and Effects of Flexible OLED Luminance Degradation. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Florian Cacho, X. Federspiel, D. Nouguier, Cheikh Diouf |
Investigation of NBTI Dynamic Behavior with Ultra-Fast Measurement. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Steve Stoffels, Niels Posthuma, Stefaan Decoutere, Benoit Bakeroot, Andrea Natale Tallarico, Enrico Sangiorgi, Claudio Fiegna, J. Zheng, X. Ma, Matteo Borga, Elena Fabris, Matteo Meneghini, Enrico Zanoni, Gaudenzio Meneghesso, Juraj Priesol, Alexander Satka |
Perimeter Driven Transport in the p-GaN Gate as a Limiting Factor for Gate Reliability. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Michiel Vandemaele, Ben Kaczer, Stanislav Tyaginov, Zlatan Stanojevic, Alexander Makarov, Adrian Vaisman Chasin, Erik Bury, Hans Mertens, Dimitri Linten, Guido Groeseneken |
Full (Vg, Vd) Bias Space Modeling of Hot-Carrier Degradation in Nanowire FETs. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Maria Ruzzarin, Matteo Borga, Enrico Zanoni, Matteo Meneghini, Gaudenzio Meneghesso, Dong Ji, Wenwen Li, Silvia H. Chan, Anchal Agarwal, Chirag Gupta, Stacia Keller, Umesh K. Mishra, Srabanti Chowdhury |
Gate Stability and Robustness of In-Situ Oxide GaN Interlayer Based Vertical Trench MOSFETs (OG-FETs). |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Kin Leong Pey, Alok Ranjan 0001, Nagarajan Raghavan, Kalya Shubhakar, Sean J. O'Shea |
Dielectric Breakdown in 2D Layered Hexagonal Boron Nitride - The Knowns and the Unknowns. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Dmitry Veksler, Gennadi Bersuker, Adam W. Bushmaker, P. R. Shrestha, Kin P. Cheung, Jason P. Campbell |
Switching Variability Factors in Compliance-Free Metal Oxide RRAM. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Sandeep Mallampati, Zaeem Baig, Scott Pozder, Eng Chye Chua |
A Comparison of Environmental Stressing Data and Simulation at the Corner of a Test Chip in a FC-BGA Package. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Erik Bury, Adrian Vaisman Chasin, Michiel Vandemaele, Simon Van Beek, Jacopo Franco, Ben Kaczer, Dimitri Linten |
Array-Based Statistical Characterization of CMOS Degradation Modes and Modeling of the Time-Dependent Variability Induced by Different Stress Patterns in the {VG, VD} bias space. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Tonmoy Dhar, Sachin S. Sapatnekar |
Reliability Analysis of a Delay-Locked Loop Under HCI and BTI Degradation. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Evelyn Landman, Shai Cohen, Noam Brousard, Raanan Gewirtzman, Inbar Weintrob, Eyal Fayne, Yahel David, Yuval Bonen, Omer Niv, Shai Tzroia, Alex Burlak, J. W. McPherson |
Degradation Monitoring - from a Vision to Reality. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Ernest Y. Wu, Baozhen Li, James H. Stathis, Andrew Kim |
Comprehensive Methodology for Multiple Spots Competing Progressive Breakdown for BEOL/FEOL Applications. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Christian Schlünder, Katja Waschneck, Peter Rotter, Susanne Lachenmann, Hans Reisinger, Franz Ungar, Georg Georgakos |
From Device Aging Physics to Automated Circuit Reliability Sign Off. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Kaichen Zhu, Xianhu Liang, Bin Yuan, Marco A. Villena, Chao Wen, Tao Wang, Shaochuan Chen, Mario Lanza, Fei Hui, Yuanyuan Shi |
Tristate Resistive Switching in Heterogenous Van Der Waals Dielectric Structures. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Fernando Leonel Aguirre, Andrea Padovani, Alok Ranjan 0001, Nagarajan Raghavan, Nahuel Vega, Nahuel Muller, Sebastián Matías Pazos, Mario Debray, Joel Molina Reyes, Kin Leong Pey, Felix Palumbo |
Spatio-Temporal Defect Generation Process in Irradiated HfO2 MOS Stacks: Correlated Versus Uncorrelated Mechanisms. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Alexander Hirler, Adnan Alsioufy, Josef Biba, T. Lehndorff, D. Lipp, Helmut Lochner, Mahesh Siddabathula, S. Simon, Torsten Sulima, Maciej Wiatr, Walter Hansch |
Alternating Temperature Stress and Deduction of Effective Stress Levels from Mission Profiles for Semiconductor Reliability. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Shih-Hung Chen, Dimitri Linten, Geert Hellings, Marko Simicic, Ben Kaczer, Thomas Chiarella, Hans Mertens, Jérôme Mitard, Anda Mocuta, N. Horiguchi |
CDM-Time Domain Turn-on Transient of ESD Diodes in Bulk FinFET and GAA NW Technologies. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Huaqiang Wu, Meiran Zhao, Yuyi Liu, Peng Yao, Yue Xi, Xinyi Li, Wei Wu, Qingtian Zhang, Jianshi Tang, Bin Gao 0006, He Qian |
Reliability Perspective on Neuromorphic Computing Based on Analog RRAM. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Niaz Mahmud, Nabihah Azhari, J. R. Lloyd |
Comparative Study of TDDB Models on BEOL Interconnects for Sub-20 nm Spacings. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Xingqi Zou, Liang Yan, Lei Jin, Da Li, Feng Xu, Di Ai, An Zhang 0008, Hongtao Liu, Ming Wang, Wei Li, Yali Song, Huazheng Wei, Yi Chen, Chunlong Li, Zongliang Huo |
Cycling Induced Trap Generation and Recovery Near the Top Select Gate Transistor in 3D NAND. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
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| 1 | Nagothu Karmel Kranthi, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava |
Current Filament Dynamics Under ESD Stress in High Voltage (Bidirectional) SCRs and It's Implications on Power Law Behavior. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | H. W. Wan, Y. J. Hong, Y. T. Cheng, M. Hong |
BTI Characterization of MBE Si-Capped Ge Gate Stack and Defect Reduction via Forming Gas Annealing. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Woojin Ahn, Yen-Pu Chen, Muhammad Ashraful Alam |
An Analytical Transient Joule Heating Model for an Interconnect in a Modern IC: Material Selection (Cu, Co, Ru) and Cooling Strategies. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Christopher H. Bennett, Diana Garland, Robin B. Jacobs-Gedrim, Sapan Agarwal, Matthew J. Marinella |
Wafer-Scale TaOx Device Variability and Implications for Neuromorphic Computing Applications. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Jian-Hsing Lee, Natarajan Mahadeva Iyer, Timothy J. Maloney |
Physical Model for ESD Human Body Model to Transmission Line Pulse. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Zhilu Ye, Rui Liu 0005, Hugh J. Barnaby, Shimeng Yu |
Evaluation of Single Event Effects in SRAM and RRAM Based Neuromorphic Computing System for Inference. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Daniel M. Fleetwood |
Reliability Limiting Defects in MOS Gate Oxides: Mechanisms and Modeling Implications. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Luca Pirro, Alban Zaka, Olaf Zimmerhackl, T. Hermann, Michael Otto, E. M. Bazizi, Jan Hoentschel, X. Li, R. Taylor |
Low-Frequency Noise Reduction in 22FDX®: Impact of Device Geometry and Back Bias. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Shinji Yokogawa, Kyosuke Kunii |
A Simple Prediction Method for Chip-Level Electromigration Lifetime Using Generalized Gamma Distribution. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Jonas Doevenspeck, Robin Degraeve, Andrea Fantini, Peter Debacker, Diederik Verkest, Rudy Lauwereins, Wim Dehaene |
Low Voltage Transient RESET Kinetic Modeling of OxRRAM for Neuromorphic Applications. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | H. Huang, P. S. McLaughin, James J. Kelly, C.-C. Yang, Richard G. Southwick, M. Wang, Griselda Bonilla, Gauri Karve |
Time Dependent Dielectric Breakdown of Cobalt and Ruthenium Interconnects at 36nm Pitch. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
| 1 | Hideya Matsuyama, Takashi Suzuki, Motoki Shiozu, Hideo Ehara, Takeshi Soeda, Hirokazu Hosoi, Masao Oshima, Kikuo Yamabe |
Verification of Copper Stress Migration Under Low Temperature Long Time Stress. |
IRPS |
2019 |
DBLP DOI BibTeX RDF |
|
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