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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 3212 occurrences of 1532 keywords
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Results
Found 5103 publication records. Showing 5103 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
12 | Constance L. Heitmeyer |
On the Utility of Formal Methods in the Development and Certification of Software. ![Search on Bibsonomy](Pics/bibsonomy.png) |
TPHOLs ![In: Theorem Proving in Higher Order Logics, 20th International Conference, TPHOLs 2007, Kaiserslautern, Germany, September 10-13, 2007, Proceedings, pp. 1-2, 2007, Springer, 978-3-540-74590-7. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Axel Martinez-Möller, Nassir Navab, Markus Schwaiger, Stephan G. Nekolla |
Photon Attenuation Correction in Misregistered Cardiac PET/CT. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Bildverarbeitung für die Medizin ![In: Bildverarbeitung für die Medizin 2007, Algorithmen, Systeme, Anwendungen, Proceedings des Workshops vom 25.-27. März 2007 in München, pp. 227-231, 2007, Springer, 978-3-540-71090-5. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Bassem S. Rabil, Mona A. Fahmy, Gamal M. Aly |
Task allocation using inherited area density multiobjective particle Swarm Optimization. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Congress on Evolutionary Computation ![In: Proceedings of the IEEE Congress on Evolutionary Computation, CEC 2007, 25-28 September 2007, Singapore, pp. 3300-3307, 2007, IEEE, 978-1-4244-1339-3. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Olivier Ginez, Jean Michel Daga, Patrick Girard 0001, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel |
Electrical Simulation Model of the 2T-FLOTOX Core-Cell for Defect Injection and Faulty Behavior Prediction in eFlash Memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 12th European Test Symposium, ETS 2007, Freiburg, Germany, May 20, 2007, pp. 77-84, 2007, IEEE Computer Society, 978-0-7695-2827-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Anita Gupta, Odd Petter N. Slyngstad, Reidar Conradi, Parastoo Mohagheghi, Harald Rønneberg, Einar Landre |
A Case Study of Defect-Density and Change-Density and their Progress over Time. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CSMR ![In: 11th European Conference on Software Maintenance and Reengineering, Software Evolution in Complex Software Intensive Systems, CSMR 2007, 21-23 March 2007, Amsterdam, The Netherlands, pp. 7-16, 2007, IEEE Computer Society, 0-7695-2802-3. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Jacek Ratzinger, Harald C. Gall, Martin Pinzger 0001 |
Quality Assessment Based on Attribute Series of Software Evolution. ![Search on Bibsonomy](Pics/bibsonomy.png) |
WCRE ![In: 14th Working Conference on Reverse Engineering (WCRE 2007), 28-31 October 2007, Vancouver, BC, Canada, pp. 80-89, 2007, IEEE Computer Society, 0-7695-3034-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Abdul Talib Bon, Jean-Marc Ogier, Ahmad Mahir Razali |
Modelling in Manufacturing Industry: Parameters Selection Using Regression Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asia International Conference on Modelling and Simulation ![In: First Asia International Conference on Modelling and Simulation, AMS 2007, Phuket, Thailand, March 27-30, 2007, pp. 521-526, 2007, IEEE Computer Society, 978-0-7695-2845-8. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Dariusz Król 0001, Tadeusz Lasota, Maciej Siarkowski, Bogdan Trawinski |
Investigation of Application Specific Metrics to Data Quality Assessment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
BIS ![In: Business Information Systems, 10th International Conference, BIS 2007, Poznan, Poland, April 25-27, 2007, Proceedings, pp. 438-448, 2007, Springer, 978-3-540-72034-8. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Anu Gupta, Ravinder Kumar Singla |
An Empirical Investigation of Defect Management in Free/Open Source Software Projects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SCSS (1) ![In: Advances in Computer and Information Sciences and Engineering, Proceedings of the 2007 International Conference on Systems, Computing Sciences and Software Engineering (SCSS), part of the International Joint Conferences on Computer, Information, and Systems Sciences, and Engineering (CISSE 2007), Bridgeport, CT, USA, December 3-12, 2007, pp. 68-73, 2007, Springer, 978-1-4020-8740-0. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Marcel van Amstel, Christian F. J. Lange, Michel R. V. Chaudron |
Four Automated Approaches to Analyze the Quality of UML Sequence Diagrams. ![Search on Bibsonomy](Pics/bibsonomy.png) |
COMPSAC (2) ![In: 31st Annual International Computer Software and Applications Conference, COMPSAC 2007, Beijing, China, July 24-27, 2007. Volume 2, pp. 415-424, 2007, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Timothy K. Shih |
Digital inpainting: a tutorial. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Multimedia ![In: Proceedings of the 15th International Conference on Multimedia 2007, Augsburg, Germany, September 24-29, 2007, pp. 4-5, 2007, ACM, 978-1-59593-702-5. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
3D surface inpainting, image completion, video inpainting, image inpainting |
12 | Xiaoguang Zhang 0004, Shijin Ren, Xing-gan Zhang, Fan Zhao |
Fuzzy Neural Network Classification Design Using Support Vector Machine in Welding Defect. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISNN (2) ![In: Advances in Neural Networks - ISNN 2007, 4th International Symposium on Neural Networks, ISNN 2007, Nanjing, China, June 3-7, 2007, Proceedings, Part II, pp. 216-223, 2007, Springer, 978-3-540-72392-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Andrzej Wasylkowski, Andreas Zeller, Christian Lindig |
Detecting object usage anomalies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESEC/SIGSOFT FSE ![In: Proceedings of the 6th joint meeting of the European Software Engineering Conference and the ACM SIGSOFT International Symposium on Foundations of Software Engineering, 2007, Dubrovnik, Croatia, September 3-7, 2007, pp. 35-44, 2007, ACM, 978-1-59593-811-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
automated defect detection, automated specification generation, data mining for software engineering, object usage anomalies, programming rules, pattern recognition, static analysis |
12 | Wook-Shin Han, Soon Ki Jung, Jeyong Shin, Jinsoo Lee, Mina Yoon, Chang Geol Yoon, Won Seok Seo, Sang Ok Koo |
A Scalable Pipeline Data Processing Framework Using Database and Visualization Techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICIC (1) ![In: Advanced Intelligent Computing Theories and Applications. With Aspects of Theoretical and Methodological Issues, Third International Conference on Intelligent Computing, ICIC 2007, Qingdao, China, August 21-24, 2007, Proceedings, pp. 334-344, 2007, Springer, 978-3-540-74170-1. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Scalable processing, Intelligent PIGs, Time series data |
12 | Neelam Soundarajan, Jason O. Hallstrom, Adem Delibas, Guoqiang Shu |
Testing Patterns. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SEW ![In: 31st Annual IEEE / NASA Software Engineering Workshop (SEW-31 2007), 6-8 March 2007, Loyola College, Columbia, MD, USA, pp. 109-120, 2007, IEEE Computer Society, 0-7695-2862-7. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Matteo Cacciola, Maurizio Campolo, Fabio La Foresta, Francesco Carlo Morabito, Mario Versaci |
A Kernel Based Learning by Sample Technique for Defect Identification Through the Inversion of a Typical Electric Problem. ![Search on Bibsonomy](Pics/bibsonomy.png) |
KES (3) ![In: Knowledge-Based Intelligent Information and Engineering Systems, 11th International Conference, KES 2007, XVII Italian Workshop on Neural Networks, Vietri sul Mare, Italy, September 12-14, 2007, Proceedings, Part III, pp. 243-250, 2007, Springer, 978-3-540-74828-1. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Non Destructive Testing and Evaluation, Electromagnetic Inverse Problems, Support Vector Regression Machines |
12 | Prashant Dubey, Akhil Garg 0001, Sravan Kumar Bhaskarani |
GALS Based Shared Test Architecture for Embedded Memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS ![In: International Symposium on Circuits and Systems (ISCAS 2007), 27-20 May 2007, New Orleans, Louisiana, USA, pp. 157-160, 2007, IEEE, 1-4244-0920-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Dayong Li, Ming Liu, Wei Wang 0003 |
Fault Tolerance Circuit for AM-OLED. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS ![In: International Symposium on Circuits and Systems (ISCAS 2007), 27-20 May 2007, New Orleans, Louisiana, USA, pp. 2272-2274, 2007, IEEE, 1-4244-0920-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | T. M. Mak |
Infant Mortality--The Lesser Known Reliability Issue. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece, pp. 122, 2007, IEEE Computer Society, 0-7695-2918-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Frank Weil, Brian E. Mastenbrook, David Nelson, Paul Dietz, Aswin van den Berg |
Automated Semantic Analysis of Design Models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MoDELS ![In: Model Driven Engineering Languages and Systems, 10th International Conference, MoDELS 2007, Nashville, USA, September 30 - October 5, 2007, Proceedings, pp. 166-180, 2007, Springer, 978-3-540-75208-0. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Stefan Christov, Bin Chen 0018, George S. Avrunin, Lori A. Clarke, Leon J. Osterweil, David Brown, Lucinda Cassells, Wilson Mertens |
Rigorously Defining and Analyzing Medical Processes: An Experience Report. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MoDELS (Workshops) ![In: Models in Software Engineering, Workshops and Symposia at MoDELS 2007, Nashville, TN, USA, September 30 - October 5, 2007, Reports and Revised Selected Papers, pp. 118-131, 2007, Springer, 978-3-540-69069-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Wm. Arthur Conklin, Glenn B. Dietrich |
Secure Software Engineering: A New Paradigm. ![Search on Bibsonomy](Pics/bibsonomy.png) |
HICSS ![In: 40th Hawaii International International Conference on Systems Science (HICSS-40 2007), CD-ROM / Abstracts Proceedings, 3-6 January 2007, Waikoloa, Big Island, HI, USA, pp. 272, 2007, IEEE Computer Society, 0-7695-2755-8. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Yan-e Mao, Xia Chen, Zhen Luo, Yuanwei Jing, Siying Zhang |
An Improved Method of Variable Structure Control for Uncertain Discrete-Time Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FSKD (1) ![In: Fourth International Conference on Fuzzy Systems and Knowledge Discovery, FSKD 2007, 24-27 August 2007, Haikou, Hainan, China, Proceedings, Volume 1, pp. 732-735, 2007, IEEE Computer Society, 0-7695-2874-0. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Juha Itkonen, Mika Mäntylä, Casper Lassenius |
Defect Detection Efficiency: Test Case Based vs. Exploratory Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESEM ![In: Proceedings of the First International Symposium on Empirical Software Engineering and Measurement, ESEM 2007, September 20-21, 2007, Madrid, Spain, pp. 61-70, 2007, ACM / IEEE Computer Society, 0-7695-2886-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Christopher Ackermann, Forrest Shull, Ralf Carbon, Christian Denger, Mikael Lindvall |
Assessing the Quality Impact of Design Inspections. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESEM ![In: Proceedings of the First International Symposium on Empirical Software Engineering and Measurement, ESEM 2007, September 20-21, 2007, Madrid, Spain, pp. 470-472, 2007, ACM / IEEE Computer Society, 0-7695-2886-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Carina Andersson, Per Runeson |
Investigating Test Teams' Defect Detection in Function test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESEM ![In: Proceedings of the First International Symposium on Empirical Software Engineering and Measurement, ESEM 2007, September 20-21, 2007, Madrid, Spain, pp. 458-460, 2007, ACM / IEEE Computer Society, 0-7695-2886-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Abderrahim Doumar, Kentaroh Katoh, Hideo Ito |
Fault Tolerant SoC Architecture Design for JPEG2000 Using Partial Reconfigurability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy., pp. 31-40, 2007, IEEE Computer Society, 0-7695-2885-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Manoj Kumar Goparaju, Spyros Tragoudas |
A Fault Tolerant Design Methodology for Threshold Logic Gates and Its Optimizations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA, pp. 420-425, 2007, IEEE Computer Society, 978-0-7695-2795-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Robert C. Aitken |
Defect or Variation? Characterizing Standard Cell Behavior at 90nm and below. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA, pp. 693-698, 2007, IEEE Computer Society, 978-0-7695-2795-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Tim Menzies, Oussama El-Rawas, Jairus Hihn, Martin S. Feather, Raymond J. Madachy, Barry W. Boehm |
The business case for automated software engineering. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASE ![In: 22nd IEEE/ACM International Conference on Automated Software Engineering (ASE 2007), November 5-9, 2007, Atlanta, Georgia, USA, pp. 303-312, 2007, ACM, 978-1-59593-882-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
simulated annealing, COCOMO, bayes, COQUALMO |
12 | Teryl Arnold, Bryan S. Morse |
Interactive Image Repair with Assisted Structure and Texture Completion. ![Search on Bibsonomy](Pics/bibsonomy.png) |
WACV ![In: 8th IEEE Workshop on Applications of Computer Vision (WACV 2007), 20-21 February 2007, Austin, Texas, USA, pp. 11, 2007, IEEE Computer Society, 978-0-7695-2794-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Eun-Ser Lee, Je-Min Bae |
Design Agent for the Reliable Web Security Requirement Control. ![Search on Bibsonomy](Pics/bibsonomy.png) |
KES-AMSTA ![In: Agent and Multi-Agent Systems: Technologies and Applications, First KES International Symposium, KES-AMSTA 2007, Wroclaw, Poland, May 31- June 1, 2007, Proceedings, pp. 765-774, 2007, Springer, 978-3-540-72829-0. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Security lifecycle, Agent, Require management |
12 | Haeng-Kon Kim, Sun-myoung Hwang, Eun-Ser Lee |
Design of Intelligence Mobile Agent Lifecycle for the Progress Management and Mobile Computing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
KES-AMSTA ![In: Agent and Multi-Agent Systems: Technologies and Applications, First KES International Symposium, KES-AMSTA 2007, Wroclaw, Poland, May 31- June 1, 2007, Proceedings, pp. 721-727, 2007, Springer, 978-3-540-72829-0. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Xiangqian Wu 0002, David Zhang 0001, Kuanquan Wang, Ning Qi |
Fusion of Palmprint and Iris for Personal Authentication. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ADMA ![In: Advanced Data Mining and Applications, Third International Conference, ADMA 2007, Harbin, China, August 6-8, 2007, Proceedings, pp. 466-475, 2007, Springer, 978-3-540-73870-1. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Xiangqian Wu 0002, Kuanquan Wang, David Zhang 0001, Ning Qi |
Combining Left and Right Irises for Personal Authentication. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EMMCVPR ![In: Energy Minimization Methods in Computer Vision and Pattern Recognition, 6th International Conference, EMMCVPR 2007, Ezhou, China, August 27-29, 2007, Proceedings, pp. 145-152, 2007, Springer, 978-3-540-74195-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
12 | Takaaki Aoki, Kaiichiro Ota, Koji Kurata, Toshio Aoyagi |
Ordering Process of Self-Organizing Maps Improved by Asymmetric Neighborhood Function. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICONIP (1) ![In: Neural Information Processing, 14th International Conference, ICONIP 2007, Kitakyushu, Japan, November 13-16, 2007, Revised Selected Papers, Part I, pp. 426-435, 2007, Springer, 978-3-540-69154-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Asymmetric Neighborhood Function, Fast ordering, Self-Organizing Map |
12 | Suk Ho Lee, Jin Keun Seo, Chunjae Park, Byung Il Lee, Eung Je Woo, Soo Yeol Lee, Ohin Kwon, Jooyoung Hahn |
Conductivity image reconstruction from defective data in MREIT: numerical Simulation and animal experiment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Medical Imaging ![In: IEEE Trans. Medical Imaging 25(2), pp. 168-176, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
12 | José Carlos Maldonado, Jeffrey C. Carver, Forrest Shull, Sandra Camargo Pinto Ferraz Fabbri, Emerson Dória, Luciana Andréia Fondazzi Martimiano, Manoel G. Mendonça, Victor R. Basili |
Perspective-Based Reading: A Replicated Experiment Focused on Individual Reviewer Effectiveness. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Empir. Softw. Eng. ![In: Empir. Softw. Eng. 11(1), pp. 119-142, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Experimental replication, Laboratory package, Software reading techniques, Software inspections, Requirements documents |
12 | Daniel M. Germán |
An empirical study of fine-grained software modifications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Empir. Softw. Eng. ![In: Empir. Softw. Eng. 11(3), pp. 369-393, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Software evolution, Software visualization, Version control, Software artifacts |
12 | Yuyi Tang, Hans-Joachim Wunderlich, Piet Engelke, Ilia Polian, Bernd Becker 0001, Jürgen Schlöffel, Friedrich Hapke, Michael Wittke |
X-masking during logic BIST and its impact on defect coverage. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 14(2), pp. 193-202, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
12 | Giuseppe Acciani, Gioacchino Brunetti, Girolamo Fornarelli |
Application of neural networks in optical inspection and classification of solder joints in surface mount technology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Ind. Informatics ![In: IEEE Trans. Ind. Informatics 2(3), pp. 200-209, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
12 | Stefan Biffl, Paul Grünbacher, Michael Halling |
A family of experiments to investigate the effects of groupware for software inspection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Autom. Softw. Eng. ![In: Autom. Softw. Eng. 13(3), pp. 373-394, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Inspection meeting, Software quality measurement, Empirical software engineering, Tool support, Controlled experiment, Software inspection, Defect detection |
12 | Oguzhan Urhan, M. Kemal Güllü, Sarp Ertürk |
Modified phase-correlation based robust hard-cut detection with application to archive film. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Circuits Syst. Video Technol. ![In: IEEE Trans. Circuits Syst. Video Technol. 16(6), pp. 753-770, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
12 | Qinbao Song, Martin J. Shepperd, Michelle Cartwright, Carolyn Mair |
Software Defect Association Mining and Defect Correction Effort Prediction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Software Eng. ![In: IEEE Trans. Software Eng. 32(2), pp. 69-82, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
defect association, defect isolation effort, defect correction effort, Software defect prediction |
12 | Jiang Zheng 0001, Laurie A. Williams, Nachiappan Nagappan, Will Snipes, John P. Hudepohl, Mladen A. Vouk |
On the Value of Static Analysis for Fault Detection in Software. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Software Eng. ![In: IEEE Trans. Software Eng. 32(4), pp. 240-253, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Code inspections, walkthroughs |
12 | David J. A. Cooper, Mun Wai Chan, Gautam Mehra, Peter Woodward, Brian R. von Konsky, Michael C. Robey, Michael Harding |
Using Dependence Graphs to Assist Manual and Automated Object Oriented Software Inspections. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASWEC ![In: 17th Australian Software Engineering Conference (ASWEC 2006), 18-21 April 2006, Sydney, Australia, pp. 262-269, 2006, IEEE Computer Society, 0-7695-2551-2. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
12 | Noah Bamford, Rekha Bangalore, Eric Chapman, Hector Chavez, Rajeev Dasari, Yinfang Lin, Edgar Jimenez |
Challenges in System on Chip Verification. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MTV ![In: Seventh International Workshop on Microprocessor Test and Verification (MTV 2006), Common Challenges and Solutions, 4-5 December 2006, Austin, Texas, USA, pp. 52-60, 2006, IEEE Computer Society, 978-0-7695-2839-7. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
12 | David Russell 0002, Nilesh Patel |
Increasing Software Engineering Efficiency Through Defect Tracking Integration. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSEA ![In: Proceedings of the International Conference on Software Engineering Advances (ICSEA 2006), October 28 - November 2, 2006, Papeete, Tahiti, French Polynesia, pp. 5, 2006, IEEE Computer Society, 0-7695-2703-5. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
testing, quality assurance, integrated development environment (IDE), Defect tracking |
12 | Pallav Gupta, Niraj K. Jha, Loganathan Lingappan |
Test generation for combinational quantum cellular automata (QCA) circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006, pp. 311-316, 2006, European Design and Automation Association, Leuven, Belgium, 3-9810801-1-4. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
12 | Frank Poehl, Jan Rzeha, Matthias Beck, Michael Gössel, Ralf Arnold, Peter Ossimitz |
On-Chip Evaluation, Compensation, and Storage of Scan Diagnosis Data - A Test Time Efficient Scan Diagnosis Architecture. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 11th European Test Symposium, ETS 2006, Southhampton, UK, May 21-24, 2006, pp. 239-246, 2006, IEEE Computer Society, 0-7695-2566-0. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
12 | Cheng Hua Li, Soon Cheol Park |
High Performance Text Categorization System Based on a Novel Neural Network Algorithm. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CIT ![In: Sixth International Conference on Computer and Information Technology (CIT 2006), 20-22 September 2006, Seoul, Korea, pp. 21, 2006, IEEE Computer Society, 0-7695-2687-X. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
12 | Du-Ming Tsai, Yan-Hsin Tseng, Shin-Min Chao, Chao-Hsuan Yen |
Independent component analysis based filter design for defect detection in low-contrast textured images. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICPR (2) ![In: 18th International Conference on Pattern Recognition (ICPR 2006), 20-24 August 2006, Hong Kong, China, pp. 231-234, 2006, IEEE Computer Society, 0-7695-2521-0. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
12 | Anne E. Gattiker |
IC failure mechanisms yesterday, today, tomorrow: implications from test to DFM. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISPD ![In: Proceedings of the 2006 International Symposium on Physical Design, ISPD 2006, San Jose, California, USA, April 9-12, 2006, pp. 47, 2006, ACM, 1-59593-299-2. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
12 | Dong-Xiao Niu, Bo Zhang, Mian Xing |
Application of Neural Network Based on Particle Swarm Optimization in Short-Term Load Forecasting. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISNN (2) ![In: Advances in Neural Networks - ISNN 2006, Third International Symposium on Neural Networks, Chengdu, China, May 28 - June 1, 2006, Proceedings, Part II, pp. 1269-1276, 2006, Springer, 3-540-34437-3. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
12 | Robert W. Ferguson, Giuseppe Lami |
An Empirical Study on the Relationship between Defective Requirements and Test Failures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SEW ![In: 30th Annual IEEE / NASA Software Engineering Workshop (SEW-30 2006), 25-28 April 2006, Loyola College Graduate Center, Columbia, MD, USA, pp. 7-10, 2006, IEEE Computer Society, 0-7695-2624-1. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
12 | Timea Illes, Barbara Paech |
An Analysis of Use Case Based Testing Approaches Based on a Defect Taxonomy. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SET ![In: Software Engineering Techniques: Design for Quality, SET 2006, October 17-20, 2006, Warsaw, Poland, pp. 211-222, 2006, Springer, 978-0-387-39387-2. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
12 | Ruey-Shun Chen, Kun-Chieh Yeh, Chan-Chine Chang, H. H. Chien |
Using Data Mining Technology to improve Manufacturing Quality - A Case Study of LCD Driver IC Packaging Industry. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SNPD ![In: Seventh International Conference on Software Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing (SNPD 2006), 19-20 June 2006, Las Vegas, Nevada, USA, pp. 115-119, 2006, IEEE Computer Society, 0-7695-2611-X. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
LCD driver IC packaging, Data mining, Decision tree, Data warehouse |
12 | Monvorath Phongpaibul, Barry W. Boehm |
An empirical comparison between pair development and software inspection in Thailand. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISESE ![In: 2006 International Symposium on Empirical Software Engineering (ISESE 2006), September 21-22, 2006, Rio de Janeiro, Brazil, pp. 85-94, 2006, ACM, 1-59593-218-6. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
empirical study, software verification, software process model, pair programming, software inspection, peer review |
12 | Lulu He, Jeffrey C. Carver |
PBR vs. checklist: a replication in the n-fold inspection context. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISESE ![In: 2006 International Symposium on Empirical Software Engineering (ISESE 2006), September 21-22, 2006, Rio de Janeiro, Brazil, pp. 95-104, 2006, ACM, 1-59593-218-6. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
PBR, n-fold inspection, experimentation, human subjects |
12 | Christian Denger, Ronny Kolb |
Testing and inspecting reusable product line components: first empirical results. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISESE ![In: 2006 International Symposium on Empirical Software Engineering (ISESE 2006), September 21-22, 2006, Rio de Janeiro, Brazil, pp. 184-193, 2006, ACM, 1-59593-218-6. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
software product line, inspection, controlled experiment, quality assurance, functional testing, reusable components |
12 | Cecilia Metra, Martin Omaña 0001, Daniele Rossi 0001, José Manuel Cazeaux, T. M. Mak |
Path (Min) Delay Faults and Their Impact on Self-Checking Circuits' Operation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 10-12 July 2006, Como, Italy, pp. 17-22, 2006, IEEE Computer Society, 0-7695-2620-9. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
12 | Marcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Fabian Vargas 0001, Jorge Semião, Isabel C. Teixeira, João Paulo Teixeira 0001 |
Dynamic Fault Detection in Digital Systems Using Dynamic Voltage Scaling and Multi-Temperature Schemes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTS ![In: 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 10-12 July 2006, Como, Italy, pp. 257-262, 2006, IEEE Computer Society, 0-7695-2620-9. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
12 | Christian F. J. Lange, Bart Du Bois, Michel R. V. Chaudron, Serge Demeyer |
An Experimental Investigation of UML Modeling Conventions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MoDELS ![In: Model Driven Engineering Languages and Systems, 9th International Conference, MoDELS 2006, Genova, Italy, October 1-6, 2006, Proceedings, pp. 27-41, 2006, Springer, 3-540-45772-0. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
12 | Cheng Hua Li, Soon Cheol Park |
A Novel Algorithm for Text Categorization Using Improved Back-Propagation Neural Network. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FSKD ![In: Fuzzy Systems and Knowledge Discovery, Third International Conference, FSKD 2006, Xi'an, China, September 24-28, 2006, Proceedings, pp. 452-460, 2006, Springer, 3-540-45916-2. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
12 | Ting Wu 0002, Martin Engelhardt, Lorenz Fieten, Aleksandra Popovic, Klaus Radermacher 0001 |
Anatomically Constrained Deformation for Design of Cranial Implant: Methodology and Validation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MICCAI (1) ![In: Medical Image Computing and Computer-Assisted Intervention - MICCAI 2006, 9th International Conference, Copenhagen, Denmark, October 1-6, 2006, Proceedings, Part I, pp. 9-16, 2006, Springer, 3-540-44707-5. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
12 | Eun-Ser Lee, Sang Ho Lee 0004 |
Design Opportunity Tree for Schedule Management and Evaluation by COQUALMO. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCSA (4) ![In: Computational Science and Its Applications - ICCSA 2006, International Conference, Glasgow, UK, May 8-11, 2006, Proceedings, Part IV, pp. 1070-1080, 2006, Springer, 3-540-34077-7. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Defect cause prioritization, Defect reduction, Project Schedule Management, Opportunity Tree, Quality, Software Process Improvement, COQUALMO, Defect Management |
12 | Ajoy Kumar Palit, Kishore K. Duganapalli, Walter Anheier |
Influence of Resistive Bridging Fault on Crosstalk Coupling Effects in On-Chip Aggressor-Victim Interconnects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA, pp. 336-344, 2006, IEEE Computer Society, 0-7695-2706-X. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
defective interconnects, defect’s severity, fault model, crosstalk, bridging fault |
12 | Lei Fang 0002, Michael S. Hsiao |
Bilateral Testing of Nano-scale Fault-tolerant Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA, pp. 309-317, 2006, IEEE Computer Society, 0-7695-2706-X. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
12 | Hayssam El-Razouk, Zine Abid |
A New Transistor-Redundant Voter for Defect-Tolerant Digital Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CCECE ![In: Proceedings of the Canadian Conference on Electrical and Computer Engineering, CCECE 2006, May 7-10, 2006, Ottawa Congress Centre, Ottawa, Canada, pp. 1078-1081, 2006, IEEE, 1-4244-0038-4. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
12 | Ashutosh Sharma, Anura P. Jayasumana, Yashwant K. Malaiya |
X-IDDQ: A Novel Defect Detection Technique Using IDDQ Data. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA, pp. 180-185, 2006, IEEE Computer Society, 0-7695-2514-8. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Defect Correlation, Principal Component Analysis, IDDQ, Binning, Test Optimization |
12 | Sebastià A. Bota, M. Rosales, José Luis Rosselló, Jaume Segura 0001 |
Low V_D_D vs. Delay: Is it Really a Good Correlation Metric for Nanometer ICs?. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA, pp. 358-363, 2006, IEEE Computer Society, 0-7695-2514-8. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
12 | Li Meng, Xiaoyuan He, Sontakke Ashok |
Defect Prevention: A General Framework and Its Application. ![Search on Bibsonomy](Pics/bibsonomy.png) |
QSIC ![In: Sixth International Conference on Quality Software (QSIC 2006), 26-28 October 2006, Beijing, China, pp. 281-286, 2006, IEEE Computer Society, 0-7695-2718-3. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
12 | Luong Dinh Hung, Masahiro Goshima, Shuichi Sakai |
SEVA: A Soft-Error- and Variation-Aware Cache Architecture. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PRDC ![In: 12th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2006), 18-20 December, 2006, University of California, Riverside, USA, pp. 47-54, 2006, IEEE Computer Society, 0-7695-2724-8. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
12 | Christian Denger, Barbara Paech, Bernd G. Freimut |
Achieving high quality of use-case-based requirements. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Inform. Forsch. Entwickl. ![In: Inform. Forsch. Entwickl. 20(1-2), pp. 11-23, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
Requirements, Quality, Use cases, Guidelines, Inspections, Quality assurance, Defect classification, Perspective-based reading |
12 | Viera Stopjaková, Pavol Malosek, Marek Matej, Vladislav Nagy, Martin Margala |
Defect detection in analog and mixed circuits by neural networks using wavelet analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Reliab. ![In: IEEE Trans. Reliab. 54(3), pp. 441-448, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Sanghyeon Baeg, Sung Soo Chung |
Analytical test buffer design for differential signaling I/O buffers by error syndrome analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 13(3), pp. 370-383, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
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12 | Matteo Galli, Daniele Bajoni, M. Belotti, F. Paleari, Maddalena Patrini, Giorgio Guizzetti, Dario Gerace, M. Agio, Lucio C. Andreani, D. Peyrade, Y. Chen |
Measurement of photonic mode dispersion and linewidths in silicon-on-insulator photonic crystal slabs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE J. Sel. Areas Commun. ![In: IEEE J. Sel. Areas Commun. 23(7), pp. 1402-1410, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Simone Borri, Magali Hage-Hassan, Luigi Dilillo, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel |
Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 21(2), pp. 169-179, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
address decoders, core-cells, memory testing, dynamic faults |
12 | Fred A. Bower, Sule Ozev, Daniel J. Sorin |
Autonomic Microprocessor Execution via Self-Repairing Arrays. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Dependable Secur. Comput. ![In: IEEE Trans. Dependable Secur. Comput. 2(4), pp. 297-310, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
Logic design reliability and testing, microprocessors and microcomputers |
12 | Gerard J. Holzmann, Rajeev Joshi |
Reliable Software Systems Design: Defect Prevention, Detection, and Containment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VSTTE ![In: Verified Software: Theories, Tools, Experiments, First IFIP TC 2/WG 2.3 Conference, VSTTE 2005, Zurich, Switzerland, October 10-13, 2005, Revised Selected Papers and Discussions, pp. 237-244, 2005, Springer, 978-3-540-69147-1. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Bin Xue, D. M. H. Walker |
Is IDDQ Test of Microprocessors Feasible? ![Search on Bibsonomy](Pics/bibsonomy.png) |
MTV ![In: Sixth International Workshop on Microprocessor Test and Verification (MTV 2005), Common Challenges and Solutions, 3-4 November 2005, Austin, Texas, USA, pp. 63-69, 2005, IEEE Computer Society, 0-7695-2627-6. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
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12 | Mircea Gh. Negoita |
Artificial Immune Systems-An Emergent Technology for Autonomous Intelligent Systems and Data Mining. ![Search on Bibsonomy](Pics/bibsonomy.png) |
AIS-ADM ![In: Autonomous Intelligent Systems: Agents and Data Mining, International Workshop, AIS-ADM 2005, St. Petersburg, Russia, June 6-8, 2005, Proceedings, pp. 19-36, 2005, Springer, 3-540-26164-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
12 | João Luís Sobral |
Leather Inspection Based on Wavelets. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IbPRIA (2) ![In: Pattern Recognition and Image Analysis, Second Iberian Conference, IbPRIA 2005, Estoril, Portugal, June 7-9, 2005, Proceedings, Part II, pp. 682-688, 2005, Springer, 3-540-26154-0. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Melvin A. Breuer |
Multi-media Applications and Imprecise Computation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DSD ![In: Eighth Euromicro Symposium on Digital Systems Design (DSD 2005), 30 August - 3 September 2005, Porto, Portugal, pp. 2-7, 2005, IEEE Computer Society, 0-7695-2433-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
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12 | Joachim Sudbrock, Jaan Raik, Raimund Ubar, Wieslaw Kuzmicz, Witold A. Pleskacz |
Defect-Oriented Test- and Layout-Generation for Standard-Cell ASIC Designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DSD ![In: Eighth Euromicro Symposium on Digital Systems Design (DSD 2005), 30 August - 3 September 2005, Porto, Portugal, pp. 79-82, 2005, IEEE Computer Society, 0-7695-2433-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Radhika B. Selvamani, Deepak Khemani |
Decision Tree Induction with CBR. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PReMI ![In: Pattern Recognition and Machine Intelligence, First International Conference, PReMI 2005, Kolkata, India, December 20-22, 2005, Proceedings, pp. 786-791, 2005, Springer, 3-540-30506-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Xijiang Lin, Janusz Rajski |
Propagation delay fault: a new fault model to test delay faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASP-DAC ![In: Proceedings of the 2005 Conference on Asia South Pacific Design Automation, ASP-DAC 2005, Shanghai, China, January 18-21, 2005, pp. 178-183, 2005, ACM Press, 0-7803-8737-6. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Vikram Iyengar, Phil Nigh |
Defect-Oriented Test for Ultra-Low DPM. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India, pp. 455, 2005, IEEE Computer Society, 0-7695-2481-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Nilanjan Mukherjee 0001 |
Improving Test Quality Using Test Data Compression. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India, pp. 463, 2005, IEEE Computer Society, 0-7695-2481-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
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12 | Hiroyuki Nakamura, Akio Shirokane, Yoshihito Nishizaki, Anis Uzzaman, Vivek Chickermane, Brion L. Keller, Tsutomu Ube, Yoshihiko Terauchi |
Low Cost Delay Testing of Nanometer SoCs Using On-Chip Clocking and Test Compression. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India, pp. 156-161, 2005, IEEE Computer Society, 0-7695-2481-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Pushpa G. Koneri, Gert-Jan de Vreede, Douglas L. Dean, Ann L. Fruhling, Peter Wolcott |
The Design and Field Evaluation of a Repeatable Collaborative Software Code Inspection Process. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CRIWG ![In: Groupware: Design, Implementation, and Use, 11th International Workshop, CRIWG 2005, Porto de Galinhas, Brazil, September 25-29, 2005, Proceedings, pp. 325-340, 2005, Springer, 3-540-29110-5. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
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12 | Ching-Pao Chang, Jia-Lyn Lv, Chih-Ping Chu |
A Defect Estimation Approach for Sequential Inspection Using a Modified Capture-Recapture Model. ![Search on Bibsonomy](Pics/bibsonomy.png) |
COMPSAC (1) ![In: 29th Annual International Computer Software and Applications Conference, COMPSAC 2005, Edinburgh, Scotland, UK, July 25-28, 2005. Volume 1, pp. 41-46, 2005, IEEE Computer Society, 0-7695-2413-3. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
capture-recapture model, defect estimation and re-inspection model, inspection |
12 | Timothy K. Shih, Rong-Chi Chang, Yu-Ping Chen |
Motion picture inpainting on aged films. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Multimedia ![In: Proceedings of the 13th ACM International Conference on Multimedia, Singapore, November 6-11, 2005, pp. 319-322, 2005, ACM, 1-59593-044-2. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
motion estimation, software tool, defect detection, inpainting, image completion, video inpainting |
12 | Rami Rautkorpi, Jukka Iivarinen |
Shape-Based Co-occurrence Matrices for Defect Classification. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SCIA ![In: Image Analysis, 14th Scandinavian Conference, SCIA 2005, Joensuu, Finland, June 19-22, 2005, Proceedings, pp. 588-597, 2005, Springer, 3-540-26320-9. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Valentin Dallmeier, Christian Lindig, Andreas Zeller |
Lightweight Defect Localization for Java. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ECOOP ![In: ECOOP 2005 - Object-Oriented Programming, 19th European Conference, Glasgow, UK, July 25-29, 2005, Proceedings, pp. 528-550, 2005, Springer, 3-540-27992-X. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Paul Baker, Paul Bristow, Clive Jervis, David J. King, Robert Thomson 0002, Bill Mitchell, Simon Burton 0001 |
Detecting and resolving semantic pathologies in UML sequence diagrams. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESEC/SIGSOFT FSE ![In: Proceedings of the 10th European Software Engineering Conference held jointly with 13th ACM SIGSOFT International Symposium on Foundations of Software Engineering, 2005, Lisbon, Portugal, September 5-9, 2005, pp. 50-59, 2005, ACM, 1-59593-014-0. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
communication semantics, requirements, MSC, UML 2.0 |
12 | Omar Hussain Alhazmi, Yashwant K. Malaiya, Indrajit Ray |
Security Vulnerabilities in Software Systems: A Quantitative Perspective. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DBSec ![In: Data and Applications Security XIX, 19th Annual IFIP WG 11.3 Working Conference on Data and Applications Security, Storrs, CT, USA, August 7-10, 2005, Proceedings, pp. 281-294, 2005, Springer, 3-540-28138-X. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Xianghua Xie, Majid Mirmehdi |
Texture Exemplars for Defect Detection on Random Textures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICAPR (2) ![In: Pattern Recognition and Image Analysis, Third International Conference on Advances in Pattern Recognition, ICAPR 2005, Bath, UK, August 22-25, 2005, Proceedings, Part II, pp. 404-413, 2005, Springer, 3-540-28833-3. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Marek Leszak |
Software Defect Analysis of a Multi-release Telecommunications System. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PROFES ![In: Product Focused Software Process Improvement, 6th International Conference, PROFES 2005, Oulu, Finland, June 13-15, 2005, Proceedings, pp. 98-114, 2005, Springer, 3-540-26200-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
software process metrics, errorproneness, Case study, defect prediction, defect density |
12 | Jerzy J. Dabrowski, Javier Gonzalez Bayon |
Techniques for sensitizing RF path under SER test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS (5) ![In: International Symposium on Circuits and Systems (ISCAS 2005), 23-26 May 2005, Kobe, Japan, pp. 4843-4846, 2005, IEEE, 0-7803-8834-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
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