Search results for "defects"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
12	Constance L. Heitmeyer	On the Utility of Formal Methods in the Development and Certification of Software.	TPHOLs	2007	DBLP DOI BibTeX RDF
12	Axel Martinez-Möller, Nassir Navab, Markus Schwaiger, Stephan G. Nekolla	Photon Attenuation Correction in Misregistered Cardiac PET/CT.	Bildverarbeitung für die Medizin	2007	DBLP DOI BibTeX RDF
12	Bassem S. Rabil, Mona A. Fahmy, Gamal M. Aly	Task allocation using inherited area density multiobjective particle Swarm Optimization.	IEEE Congress on Evolutionary Computation	2007	DBLP DOI BibTeX RDF
12	Olivier Ginez, Jean Michel Daga, Patrick Girard 0001, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel	Electrical Simulation Model of the 2T-FLOTOX Core-Cell for Defect Injection and Faulty Behavior Prediction in eFlash Memories.	ETS	2007	DBLP DOI BibTeX RDF
12	Anita Gupta, Odd Petter N. Slyngstad, Reidar Conradi, Parastoo Mohagheghi, Harald Rønneberg, Einar Landre	A Case Study of Defect-Density and Change-Density and their Progress over Time.	CSMR	2007	DBLP DOI BibTeX RDF
12	Jacek Ratzinger, Harald C. Gall, Martin Pinzger 0001	Quality Assessment Based on Attribute Series of Software Evolution.	WCRE	2007	DBLP DOI BibTeX RDF
12	Abdul Talib Bon, Jean-Marc Ogier, Ahmad Mahir Razali	Modelling in Manufacturing Industry: Parameters Selection Using Regression Analysis.	Asia International Conference on Modelling and Simulation	2007	DBLP DOI BibTeX RDF
12	Dariusz Król 0001, Tadeusz Lasota, Maciej Siarkowski, Bogdan Trawinski	Investigation of Application Specific Metrics to Data Quality Assessment.	BIS	2007	DBLP DOI BibTeX RDF
12	Anu Gupta, Ravinder Kumar Singla	An Empirical Investigation of Defect Management in Free/Open Source Software Projects.	SCSS (1)	2007	DBLP DOI BibTeX RDF
12	Marcel van Amstel, Christian F. J. Lange, Michel R. V. Chaudron	Four Automated Approaches to Analyze the Quality of UML Sequence Diagrams.	COMPSAC (2)	2007	DBLP DOI BibTeX RDF
12	Timothy K. Shih	Digital inpainting: a tutorial.	ACM Multimedia	2007	DBLP DOI BibTeX RDF	3D surface inpainting, image completion, video inpainting, image inpainting
12	Xiaoguang Zhang 0004, Shijin Ren, Xing-gan Zhang, Fan Zhao	Fuzzy Neural Network Classification Design Using Support Vector Machine in Welding Defect.	ISNN (2)	2007	DBLP DOI BibTeX RDF
12	Andrzej Wasylkowski, Andreas Zeller, Christian Lindig	Detecting object usage anomalies.	ESEC/SIGSOFT FSE	2007	DBLP DOI BibTeX RDF	automated defect detection, automated specification generation, data mining for software engineering, object usage anomalies, programming rules, pattern recognition, static analysis
12	Wook-Shin Han, Soon Ki Jung, Jeyong Shin, Jinsoo Lee, Mina Yoon, Chang Geol Yoon, Won Seok Seo, Sang Ok Koo	A Scalable Pipeline Data Processing Framework Using Database and Visualization Techniques.	ICIC (1)	2007	DBLP DOI BibTeX RDF	Scalable processing, Intelligent PIGs, Time series data
12	Neelam Soundarajan, Jason O. Hallstrom, Adem Delibas, Guoqiang Shu	Testing Patterns.	SEW	2007	DBLP DOI BibTeX RDF
12	Matteo Cacciola, Maurizio Campolo, Fabio La Foresta, Francesco Carlo Morabito, Mario Versaci	A Kernel Based Learning by Sample Technique for Defect Identification Through the Inversion of a Typical Electric Problem.	KES (3)	2007	DBLP DOI BibTeX RDF	Non Destructive Testing and Evaluation, Electromagnetic Inverse Problems, Support Vector Regression Machines
12	Prashant Dubey, Akhil Garg 0001, Sravan Kumar Bhaskarani	GALS Based Shared Test Architecture for Embedded Memories.	ISCAS	2007	DBLP DOI BibTeX RDF
12	Dayong Li, Ming Liu, Wei Wang 0003	Fault Tolerance Circuit for AM-OLED.	ISCAS	2007	DBLP DOI BibTeX RDF
12	T. M. Mak	Infant Mortality--The Lesser Known Reliability Issue.	IOLTS	2007	DBLP DOI BibTeX RDF
12	Frank Weil, Brian E. Mastenbrook, David Nelson, Paul Dietz, Aswin van den Berg	Automated Semantic Analysis of Design Models.	MoDELS	2007	DBLP DOI BibTeX RDF
12	Stefan Christov, Bin Chen 0018, George S. Avrunin, Lori A. Clarke, Leon J. Osterweil, David Brown, Lucinda Cassells, Wilson Mertens	Rigorously Defining and Analyzing Medical Processes: An Experience Report.	MoDELS (Workshops)	2007	DBLP DOI BibTeX RDF
12	Wm. Arthur Conklin, Glenn B. Dietrich	Secure Software Engineering: A New Paradigm.	HICSS	2007	DBLP DOI BibTeX RDF
12	Yan-e Mao, Xia Chen, Zhen Luo, Yuanwei Jing, Siying Zhang	An Improved Method of Variable Structure Control for Uncertain Discrete-Time Systems.	FSKD (1)	2007	DBLP DOI BibTeX RDF
12	Juha Itkonen, Mika Mäntylä, Casper Lassenius	Defect Detection Efficiency: Test Case Based vs. Exploratory Testing.	ESEM	2007	DBLP DOI BibTeX RDF
12	Christopher Ackermann, Forrest Shull, Ralf Carbon, Christian Denger, Mikael Lindvall	Assessing the Quality Impact of Design Inspections.	ESEM	2007	DBLP DOI BibTeX RDF
12	Carina Andersson, Per Runeson	Investigating Test Teams' Defect Detection in Function test.	ESEM	2007	DBLP DOI BibTeX RDF
12	Abderrahim Doumar, Kentaroh Katoh, Hideo Ito	Fault Tolerant SoC Architecture Design for JPEG2000 Using Partial Reconfigurability.	DFT	2007	DBLP DOI BibTeX RDF
12	Manoj Kumar Goparaju, Spyros Tragoudas	A Fault Tolerant Design Methodology for Threshold Logic Gates and Its Optimizations.	ISQED	2007	DBLP DOI BibTeX RDF
12	Robert C. Aitken	Defect or Variation? Characterizing Standard Cell Behavior at 90nm and below.	ISQED	2007	DBLP DOI BibTeX RDF
12	Tim Menzies, Oussama El-Rawas, Jairus Hihn, Martin S. Feather, Raymond J. Madachy, Barry W. Boehm	The business case for automated software engineering.	ASE	2007	DBLP DOI BibTeX RDF	simulated annealing, COCOMO, bayes, COQUALMO
12	Teryl Arnold, Bryan S. Morse	Interactive Image Repair with Assisted Structure and Texture Completion.	WACV	2007	DBLP DOI BibTeX RDF
12	Eun-Ser Lee, Je-Min Bae	Design Agent for the Reliable Web Security Requirement Control.	KES-AMSTA	2007	DBLP DOI BibTeX RDF	Security lifecycle, Agent, Require management
12	Haeng-Kon Kim, Sun-myoung Hwang, Eun-Ser Lee	Design of Intelligence Mobile Agent Lifecycle for the Progress Management and Mobile Computing.	KES-AMSTA	2007	DBLP DOI BibTeX RDF
12	Xiangqian Wu 0002, David Zhang 0001, Kuanquan Wang, Ning Qi	Fusion of Palmprint and Iris for Personal Authentication.	ADMA	2007	DBLP DOI BibTeX RDF
12	Xiangqian Wu 0002, Kuanquan Wang, David Zhang 0001, Ning Qi	Combining Left and Right Irises for Personal Authentication.	EMMCVPR	2007	DBLP DOI BibTeX RDF
12	Takaaki Aoki, Kaiichiro Ota, Koji Kurata, Toshio Aoyagi	Ordering Process of Self-Organizing Maps Improved by Asymmetric Neighborhood Function.	ICONIP (1)	2007	DBLP DOI BibTeX RDF	Asymmetric Neighborhood Function, Fast ordering, Self-Organizing Map
12	Suk Ho Lee, Jin Keun Seo, Chunjae Park, Byung Il Lee, Eung Je Woo, Soo Yeol Lee, Ohin Kwon, Jooyoung Hahn	Conductivity image reconstruction from defective data in MREIT: numerical Simulation and animal experiment.	IEEE Trans. Medical Imaging	2006	DBLP DOI BibTeX RDF
12	José Carlos Maldonado, Jeffrey C. Carver, Forrest Shull, Sandra Camargo Pinto Ferraz Fabbri, Emerson Dória, Luciana Andréia Fondazzi Martimiano, Manoel G. Mendonça, Victor R. Basili	Perspective-Based Reading: A Replicated Experiment Focused on Individual Reviewer Effectiveness.	Empir. Softw. Eng.	2006	DBLP DOI BibTeX RDF	Experimental replication, Laboratory package, Software reading techniques, Software inspections, Requirements documents
12	Daniel M. Germán	An empirical study of fine-grained software modifications.	Empir. Softw. Eng.	2006	DBLP DOI BibTeX RDF	Software evolution, Software visualization, Version control, Software artifacts
12	Yuyi Tang, Hans-Joachim Wunderlich, Piet Engelke, Ilia Polian, Bernd Becker 0001, Jürgen Schlöffel, Friedrich Hapke, Michael Wittke	X-masking during logic BIST and its impact on defect coverage.	IEEE Trans. Very Large Scale Integr. Syst.	2006	DBLP DOI BibTeX RDF
12	Giuseppe Acciani, Gioacchino Brunetti, Girolamo Fornarelli	Application of neural networks in optical inspection and classification of solder joints in surface mount technology.	IEEE Trans. Ind. Informatics	2006	DBLP DOI BibTeX RDF
12	Stefan Biffl, Paul Grünbacher, Michael Halling	A family of experiments to investigate the effects of groupware for software inspection.	Autom. Softw. Eng.	2006	DBLP DOI BibTeX RDF	Inspection meeting, Software quality measurement, Empirical software engineering, Tool support, Controlled experiment, Software inspection, Defect detection
12	Oguzhan Urhan, M. Kemal Güllü, Sarp Ertürk	Modified phase-correlation based robust hard-cut detection with application to archive film.	IEEE Trans. Circuits Syst. Video Technol.	2006	DBLP DOI BibTeX RDF
12	Qinbao Song, Martin J. Shepperd, Michelle Cartwright, Carolyn Mair	Software Defect Association Mining and Defect Correction Effort Prediction.	IEEE Trans. Software Eng.	2006	DBLP DOI BibTeX RDF	defect association, defect isolation effort, defect correction effort, Software defect prediction
12	Jiang Zheng 0001, Laurie A. Williams, Nachiappan Nagappan, Will Snipes, John P. Hudepohl, Mladen A. Vouk	On the Value of Static Analysis for Fault Detection in Software.	IEEE Trans. Software Eng.	2006	DBLP DOI BibTeX RDF	Code inspections, walkthroughs
12	David J. A. Cooper, Mun Wai Chan, Gautam Mehra, Peter Woodward, Brian R. von Konsky, Michael C. Robey, Michael Harding	Using Dependence Graphs to Assist Manual and Automated Object Oriented Software Inspections.	ASWEC	2006	DBLP DOI BibTeX RDF
12	Noah Bamford, Rekha Bangalore, Eric Chapman, Hector Chavez, Rajeev Dasari, Yinfang Lin, Edgar Jimenez	Challenges in System on Chip Verification.	MTV	2006	DBLP DOI BibTeX RDF
12	David Russell 0002, Nilesh Patel	Increasing Software Engineering Efficiency Through Defect Tracking Integration.	ICSEA	2006	DBLP DOI BibTeX RDF	testing, quality assurance, integrated development environment (IDE), Defect tracking
12	Pallav Gupta, Niraj K. Jha, Loganathan Lingappan	Test generation for combinational quantum cellular automata (QCA) circuits.	DATE	2006	DBLP DOI BibTeX RDF
12	Frank Poehl, Jan Rzeha, Matthias Beck, Michael Gössel, Ralf Arnold, Peter Ossimitz	On-Chip Evaluation, Compensation, and Storage of Scan Diagnosis Data - A Test Time Efficient Scan Diagnosis Architecture.	ETS	2006	DBLP DOI BibTeX RDF
12	Cheng Hua Li, Soon Cheol Park	High Performance Text Categorization System Based on a Novel Neural Network Algorithm.	CIT	2006	DBLP DOI BibTeX RDF
12	Du-Ming Tsai, Yan-Hsin Tseng, Shin-Min Chao, Chao-Hsuan Yen	Independent component analysis based filter design for defect detection in low-contrast textured images.	ICPR (2)	2006	DBLP DOI BibTeX RDF
12	Anne E. Gattiker	IC failure mechanisms yesterday, today, tomorrow: implications from test to DFM.	ISPD	2006	DBLP DOI BibTeX RDF
12	Dong-Xiao Niu, Bo Zhang, Mian Xing	Application of Neural Network Based on Particle Swarm Optimization in Short-Term Load Forecasting.	ISNN (2)	2006	DBLP DOI BibTeX RDF
12	Robert W. Ferguson, Giuseppe Lami	An Empirical Study on the Relationship between Defective Requirements and Test Failures.	SEW	2006	DBLP DOI BibTeX RDF
12	Timea Illes, Barbara Paech	An Analysis of Use Case Based Testing Approaches Based on a Defect Taxonomy.	SET	2006	DBLP DOI BibTeX RDF
12	Ruey-Shun Chen, Kun-Chieh Yeh, Chan-Chine Chang, H. H. Chien	Using Data Mining Technology to improve Manufacturing Quality - A Case Study of LCD Driver IC Packaging Industry.	SNPD	2006	DBLP DOI BibTeX RDF	LCD driver IC packaging, Data mining, Decision tree, Data warehouse
12	Monvorath Phongpaibul, Barry W. Boehm	An empirical comparison between pair development and software inspection in Thailand.	ISESE	2006	DBLP DOI BibTeX RDF	empirical study, software verification, software process model, pair programming, software inspection, peer review
12	Lulu He, Jeffrey C. Carver	PBR vs. checklist: a replication in the n-fold inspection context.	ISESE	2006	DBLP DOI BibTeX RDF	PBR, n-fold inspection, experimentation, human subjects
12	Christian Denger, Ronny Kolb	Testing and inspecting reusable product line components: first empirical results.	ISESE	2006	DBLP DOI BibTeX RDF	software product line, inspection, controlled experiment, quality assurance, functional testing, reusable components
12	Cecilia Metra, Martin Omaña 0001, Daniele Rossi 0001, José Manuel Cazeaux, T. M. Mak	Path (Min) Delay Faults and Their Impact on Self-Checking Circuits' Operation.	IOLTS	2006	DBLP DOI BibTeX RDF
12	Marcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Fabian Vargas 0001, Jorge Semião, Isabel C. Teixeira, João Paulo Teixeira 0001	Dynamic Fault Detection in Digital Systems Using Dynamic Voltage Scaling and Multi-Temperature Schemes.	IOLTS	2006	DBLP DOI BibTeX RDF
12	Christian F. J. Lange, Bart Du Bois, Michel R. V. Chaudron, Serge Demeyer	An Experimental Investigation of UML Modeling Conventions.	MoDELS	2006	DBLP DOI BibTeX RDF
12	Cheng Hua Li, Soon Cheol Park	A Novel Algorithm for Text Categorization Using Improved Back-Propagation Neural Network.	FSKD	2006	DBLP DOI BibTeX RDF
12	Ting Wu 0002, Martin Engelhardt, Lorenz Fieten, Aleksandra Popovic, Klaus Radermacher 0001	Anatomically Constrained Deformation for Design of Cranial Implant: Methodology and Validation.	MICCAI (1)	2006	DBLP DOI BibTeX RDF
12	Eun-Ser Lee, Sang Ho Lee 0004	Design Opportunity Tree for Schedule Management and Evaluation by COQUALMO.	ICCSA (4)	2006	DBLP DOI BibTeX RDF	Defect cause prioritization, Defect reduction, Project Schedule Management, Opportunity Tree, Quality, Software Process Improvement, COQUALMO, Defect Management
12	Ajoy Kumar Palit, Kishore K. Duganapalli, Walter Anheier	Influence of Resistive Bridging Fault on Crosstalk Coupling Effects in On-Chip Aggressor-Victim Interconnects.	DFT	2006	DBLP DOI BibTeX RDF	defective interconnects, defect’s severity, fault model, crosstalk, bridging fault
12	Lei Fang 0002, Michael S. Hsiao	Bilateral Testing of Nano-scale Fault-tolerant Circuits.	DFT	2006	DBLP DOI BibTeX RDF
12	Hayssam El-Razouk, Zine Abid	A New Transistor-Redundant Voter for Defect-Tolerant Digital Circuits.	CCECE	2006	DBLP DOI BibTeX RDF
12	Ashutosh Sharma, Anura P. Jayasumana, Yashwant K. Malaiya	X-IDDQ: A Novel Defect Detection Technique Using IDDQ Data.	VTS	2006	DBLP DOI BibTeX RDF	Defect Correlation, Principal Component Analysis, IDDQ, Binning, Test Optimization
12	Sebastià A. Bota, M. Rosales, José Luis Rosselló, Jaume Segura 0001	Low V_D_D vs. Delay: Is it Really a Good Correlation Metric for Nanometer ICs?.	VTS	2006	DBLP DOI BibTeX RDF
12	Li Meng, Xiaoyuan He, Sontakke Ashok	Defect Prevention: A General Framework and Its Application.	QSIC	2006	DBLP DOI BibTeX RDF
12	Luong Dinh Hung, Masahiro Goshima, Shuichi Sakai	SEVA: A Soft-Error- and Variation-Aware Cache Architecture.	PRDC	2006	DBLP DOI BibTeX RDF
12	Christian Denger, Barbara Paech, Bernd G. Freimut	Achieving high quality of use-case-based requirements.	Inform. Forsch. Entwickl.	2005	DBLP DOI BibTeX RDF	Requirements, Quality, Use cases, Guidelines, Inspections, Quality assurance, Defect classification, Perspective-based reading
12	Viera Stopjaková, Pavol Malosek, Marek Matej, Vladislav Nagy, Martin Margala	Defect detection in analog and mixed circuits by neural networks using wavelet analysis.	IEEE Trans. Reliab.	2005	DBLP DOI BibTeX RDF
12	Sanghyeon Baeg, Sung Soo Chung	Analytical test buffer design for differential signaling I/O buffers by error syndrome analysis.	IEEE Trans. Very Large Scale Integr. Syst.	2005	DBLP DOI BibTeX RDF
12	Matteo Galli, Daniele Bajoni, M. Belotti, F. Paleari, Maddalena Patrini, Giorgio Guizzetti, Dario Gerace, M. Agio, Lucio C. Andreani, D. Peyrade, Y. Chen	Measurement of photonic mode dispersion and linewidths in silicon-on-insulator photonic crystal slabs.	IEEE J. Sel. Areas Commun.	2005	DBLP DOI BibTeX RDF
12	Simone Borri, Magali Hage-Hassan, Luigi Dilillo, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel	Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test.	J. Electron. Test.	2005	DBLP DOI BibTeX RDF	address decoders, core-cells, memory testing, dynamic faults
12	Fred A. Bower, Sule Ozev, Daniel J. Sorin	Autonomic Microprocessor Execution via Self-Repairing Arrays.	IEEE Trans. Dependable Secur. Comput.	2005	DBLP DOI BibTeX RDF	Logic design reliability and testing, microprocessors and microcomputers
12	Gerard J. Holzmann, Rajeev Joshi	Reliable Software Systems Design: Defect Prevention, Detection, and Containment.	VSTTE	2005	DBLP DOI BibTeX RDF
12	Bin Xue, D. M. H. Walker	Is IDDQ Test of Microprocessors Feasible?	MTV	2005	DBLP DOI BibTeX RDF
12	Mircea Gh. Negoita	Artificial Immune Systems-An Emergent Technology for Autonomous Intelligent Systems and Data Mining.	AIS-ADM	2005	DBLP DOI BibTeX RDF
12	João Luís Sobral	Leather Inspection Based on Wavelets.	IbPRIA (2)	2005	DBLP DOI BibTeX RDF
12	Melvin A. Breuer	Multi-media Applications and Imprecise Computation.	DSD	2005	DBLP DOI BibTeX RDF
12	Joachim Sudbrock, Jaan Raik, Raimund Ubar, Wieslaw Kuzmicz, Witold A. Pleskacz	Defect-Oriented Test- and Layout-Generation for Standard-Cell ASIC Designs.	DSD	2005	DBLP DOI BibTeX RDF
12	Radhika B. Selvamani, Deepak Khemani	Decision Tree Induction with CBR.	PReMI	2005	DBLP DOI BibTeX RDF
12	Xijiang Lin, Janusz Rajski	Propagation delay fault: a new fault model to test delay faults.	ASP-DAC	2005	DBLP DOI BibTeX RDF
12	Vikram Iyengar, Phil Nigh	Defect-Oriented Test for Ultra-Low DPM.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF
12	Nilanjan Mukherjee 0001	Improving Test Quality Using Test Data Compression.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF
12	Hiroyuki Nakamura, Akio Shirokane, Yoshihito Nishizaki, Anis Uzzaman, Vivek Chickermane, Brion L. Keller, Tsutomu Ube, Yoshihiko Terauchi	Low Cost Delay Testing of Nanometer SoCs Using On-Chip Clocking and Test Compression.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF
12	Pushpa G. Koneri, Gert-Jan de Vreede, Douglas L. Dean, Ann L. Fruhling, Peter Wolcott	The Design and Field Evaluation of a Repeatable Collaborative Software Code Inspection Process.	CRIWG	2005	DBLP DOI BibTeX RDF
12	Ching-Pao Chang, Jia-Lyn Lv, Chih-Ping Chu	A Defect Estimation Approach for Sequential Inspection Using a Modified Capture-Recapture Model.	COMPSAC (1)	2005	DBLP DOI BibTeX RDF	capture-recapture model, defect estimation and re-inspection model, inspection
12	Timothy K. Shih, Rong-Chi Chang, Yu-Ping Chen	Motion picture inpainting on aged films.	ACM Multimedia	2005	DBLP DOI BibTeX RDF	motion estimation, software tool, defect detection, inpainting, image completion, video inpainting
12	Rami Rautkorpi, Jukka Iivarinen	Shape-Based Co-occurrence Matrices for Defect Classification.	SCIA	2005	DBLP DOI BibTeX RDF
12	Valentin Dallmeier, Christian Lindig, Andreas Zeller	Lightweight Defect Localization for Java.	ECOOP	2005	DBLP DOI BibTeX RDF
12	Paul Baker, Paul Bristow, Clive Jervis, David J. King, Robert Thomson 0002, Bill Mitchell, Simon Burton 0001	Detecting and resolving semantic pathologies in UML sequence diagrams.	ESEC/SIGSOFT FSE	2005	DBLP DOI BibTeX RDF	communication semantics, requirements, MSC, UML 2.0
12	Omar Hussain Alhazmi, Yashwant K. Malaiya, Indrajit Ray	Security Vulnerabilities in Software Systems: A Quantitative Perspective.	DBSec	2005	DBLP DOI BibTeX RDF
12	Xianghua Xie, Majid Mirmehdi	Texture Exemplars for Defect Detection on Random Textures.	ICAPR (2)	2005	DBLP DOI BibTeX RDF
12	Marek Leszak	Software Defect Analysis of a Multi-release Telecommunications System.	PROFES	2005	DBLP DOI BibTeX RDF	software process metrics, errorproneness, Case study, defect prediction, defect density
12	Jerzy J. Dabrowski, Javier Gonzalez Bayon	Techniques for sensitizing RF path under SER test.	ISCAS (5)	2005	DBLP DOI BibTeX RDF