Search results for "ETS"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
98	Tadeusz Lasota, Zbigniew Telec, Bogdan Trawinski, Krzysztof Trawinski	Evolving Fuzzy Systems Based on the eTS Learning Algorithm for the Valuation of Residential Premises.	IDEAL	2009	DBLP DOI BibTeX RDF	evolving fuzzy systems, eTS learning algorithm, property valuation, feature selection, GIS
73	Scott Lystig Fritchie	A study of Erlang ETS table implementations and performance.	Erlang Workshop	2003	DBLP DOI BibTeX RDF	Judy array, in-memory database, Erlang, B-tree, hash table, AVL tree
68	Brian Sierkowski, Carol Rhodes, William Goveia	Creating usable simplicity in a text-based "quick help" website.	SIGUCCS	2001	DBLP DOI BibTeX RDF	usability, information technology, web site, redesign
68	Jordi Cortadella, Michael Kishinevsky, Luciano Lavagno, Alexandre Yakovlev	Synthesizing Petri nets from state-based models.	ICCAD	1995	DBLP DOI BibTeX RDF	Petri nets, Synthesis, Finite State Machines, Asynchronous Circuits, Transition Systems
61	Said Hamdioui, Giorgio Di Natale, Bram Kruseman, Maria K. Michael, Haralampos-G. D. Stratigopoulos	ETS 2016 foreword.	ETS	2016	DBLP DOI BibTeX RDF
61	Hans-Joachim Wunderlich, Peter C. Maxwell	ETS 2015 best paper.	ETS	2016	DBLP DOI BibTeX RDF
51	Eiman Tamah Al-Shammari, Jessica Lin 0001	Towards an error-free Arabic stemming.	CIKM-iNEWS	2008	DBLP DOI BibTeX RDF	text mining, tokenization, stemming, Arabic, lemmatization
51	Dar-Zen Chen, Wen-Yau Cathy Lin, Mu-Hsuan Huang	Using Essential Patent Index and Essential Technological Strength to evaluate industrial technological innovation competitiveness.	Scientometrics	2007	DBLP DOI BibTeX RDF
50	Feng Cao, Saadat Malik	Security Analysis for IP-based Government Emergency Telephony Service.	ARES	2006	DBLP DOI BibTeX RDF	Emergency Telephony Service (ETS), Government ETS (GETS), Security and Privacy, Voice over IP, IP Telephony, Incidence Response
45	Antônio M. F. Crespo, Chun Wang	Carbon Emission Trading Systems (ETS), Industry Business Dynamics, and the Aviation System: a survey on economic modeling and ETS implementation impacts assessment techniques.	ISSE	2019	DBLP DOI BibTeX RDF
45	Patrik Nyblom	Erlang ETS tables and software transactional memory: how transactions make ETS tables more like ordinary actors.	Erlang Workshop	2011	DBLP DOI BibTeX RDF
42		Conference Reports.	IEEE Des. Test Comput.	2005	DBLP DOI BibTeX RDF	ETS 05, European Test Workshop, Eastern Europe, NATW 05, outlier screening, analog test, TTTC, embedded test, defect-based test, yield management
42	Angelos P. Varvitsiotis, Despina Polemi, Andy Marsh	EUROMED-JAVA: Trusted Third Party Services for Securing Medical Java Applets.	ESORICS	1998	DBLP DOI BibTeX RDF	Telemedical Applications, Trusted Third Party Services, EUROMED, EUROMED-ETS, Java, Web
38		IEEE European Test Symposium, ETS 2023, Venezia, Italy, May 22-26, 2023	ETS	2023	DBLP DOI BibTeX RDF
38	Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Ulf Schlichtmann, Giovanni Squillero	Semi-Supervised Deep Learning for Microcontroller Performance Screening.	ETS	2023	DBLP DOI BibTeX RDF
38	Payam Habiby, Natalia Lylina, Chih-Hao Wang, Hans-Joachim Wunderlich, Sebastian Huhn 0001, Rolf Drechsler	Synthesis of IJTAG Networks for Multi-Power Domain Systems on Chips.	ETS	2023	DBLP DOI BibTeX RDF
38	L. Ammoura, Marie-Lise Flottes, Patrick Girard 0001, Jean-Philippe Noel, Arnaud Virazel	Intra-cell Resistive-Open Defect Analysis on a Foundry 8T SRAM-based IMC Architecture.	ETS	2023	DBLP DOI BibTeX RDF
38	Nikolaos Ioannis Deligiannis, Tobias Faller, Chenghan Zhou, Riccardo Cantoro, Bernd Becker 0001, Matteo Sonza Reorda	Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing.	ETS	2023	DBLP DOI BibTeX RDF
38	Gildas Léger, Antonio J. Ginés, Eduardo J. Peralías, Valentin Gutierrez, C. Dominguez, Maria Angeles Jalón, L. Carranza	A Single-Event Latchup setup for high-precision AMS circuits.	ETS	2023	DBLP DOI BibTeX RDF
38	Ching-Yuan Chen, Biresh Kumar Joardar, Janardhan Rao Doppa, Partha Pratim Pande, Krishnendu Chakrabarty	Attacking Memristor-Mapped Graph Neural Network by Inducing Slow-to-Write Errors.	ETS	2023	DBLP DOI BibTeX RDF
38	Giorgio Insinga, M. Battilana, M. Coppetta, N. Mautone, G. Carnevale, M. Giltrelli, P. Scaramuzza, Rudolf Ullmann	Density-oriented diagnostic data compression strategy for characterization of embedded memories in Automotive Systems-on-Chip.	ETS	2023	DBLP DOI BibTeX RDF
38	Abhishek Kumar Mishra, Anup Das 0001, Nagarajan Kandasamy	Online Performance Monitoring of Neuromorphic Computing Systems.	ETS	2023	DBLP DOI BibTeX RDF
38	Mohammad Hasan Ahmadilivani, Mahdi Taheri, Jaan Raik, Masoud Daneshtalab, Maksim Jenihhin	DeepVigor: VulnerabIlity Value RanGes and FactORs for DNNs' Reliability Assessment.	ETS	2023	DBLP DOI BibTeX RDF
38	Josie E. Rodriguez Condia, Juan-David Guerrero-Balaguera, Edward Javier Patiño Nuñez, Robert Limas Sierra, Matteo Sonza Reorda	Evaluating the Prevalence of SFUs in the Reliability of GPUs.	ETS	2023	DBLP DOI BibTeX RDF
38	Stefan Holst, Ruijun Ma, Xiaoqing Wen, Aibin Yan, Hui Xu	BiSTAHL: A Built-In Self-Testable Soft-Error-Hardened Scan-Cell.	ETS	2023	DBLP DOI BibTeX RDF
38	Alperen Bolat, Yahya Can Tugrul, Seyyid Hikmet Çelik, Sakir Sezer, Marco Ottavi, Oguz Ergin	DEV-PIM: Dynamic Execution Validation with Processing-in-Memory.	ETS	2023	DBLP DOI BibTeX RDF
38	Peter Domanski, Dirk Pflüger, Raphaël Latty	Learn to Tune: Robust Performance Tuning in Post-Silicon Validation.	ETS	2023	DBLP DOI BibTeX RDF
38	Anurup Saha, Chandramouli N. Amarnath, Abhijit Chatterjee	A Resilience Framework for Synapse Weight Errors and Firing Threshold Perturbations in RRAM Spiking Neural Networks.	ETS	2023	DBLP DOI BibTeX RDF
38	Mahta Mayahinia, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian	On-chip Electromigration Sensor for Silicon Lifecycle Management of Nanoscale VLSI.	ETS	2023	DBLP DOI BibTeX RDF
38	Yanning Ji, Ruize Wang, Kalle Ngo, Elena Dubrova, Linus Backlund	A Side-Channel Attack on a Hardware Implementation of CRYSTALS-Kyber.	ETS	2023	DBLP DOI BibTeX RDF
38	Khaled Galal Abdelwahab Abdelaziz, Ralph Görgen, Görschwin Fey	FINaL: Driving High-Level Fault Injection Campaigns with Natural Language.	ETS	2023	DBLP DOI BibTeX RDF
38	Fabio Pavanello, Cédric Marchand 0002, Ian O'Connor, Régis Orobtchouk, Fabien Mandorlo, Xavier Letartre, Sébastien Cueff, Elena Ioana Vatajelu, Giorgio Di Natale, Benoit Cluzel, Aurelien Coillet, Benoît Charbonnier, Pierre Noe, Frantisek Kavan, Martin Zoldak, Michal Szaj, Peter Bienstman, Thomas Van Vaerenbergh, Ulrich Rührmair, Paulo F. Flores, Luís Guerra e Silva, Ricardo Chaves, Luís Miguel Silveira, Mariano Ceccato, Dimitris Gizopoulos, George Papadimitriou 0001, Vasileios Karakostas, Axel Brando, Francisco J. Cazorla, Ramon Canal, Pau Closas, Adria Gusi-Amigo, Paolo Crovetti, Alessio Carpegna, Tzamn Melendez Carmona, Stefano Di Carlo, Alessandro Savino	EUROPULS: NEUROmorphic energy-efficient secure accelerators based on Phase change materials aUgmented siLicon photonicS.	ETS	2023	DBLP DOI BibTeX RDF
38	Janusz Rajski, Maciej Trawka, Jerzy Tyszer, Bartosz Wlodarczak	Hybrid Ring Generators for In-System Test Applications.	ETS	2023	DBLP DOI BibTeX RDF
38	Jiaoyan Yao, Ying Zhang, Yifeng Hua, Yuanxiang Li, Jizhong Yang, Xin Chen	Spotlight: An Impairing Packet Transmission Attack Targeting Specific Node in NoC-based TCMP.	ETS	2023	DBLP DOI BibTeX RDF
38	Soyed Tuhin Ahmed, Roman Rakhmatullin, Mehdi B. Tahoori	Online Fault-Tolerance for Memristive Neuromorphic Fabric Based on Local Approximation.	ETS	2023	DBLP DOI BibTeX RDF
38	Matthias Ludwig 0005, Ann-Christin Bette, Bernhard Lippmann, Georg Sigl	Counterfeit Detection by Semiconductor Process Technology Inspection.	ETS	2023	DBLP DOI BibTeX RDF
38	Kwondo Ma, Chandramouli N. Amarnath, Abhijit Chatterjee	Error Resilient Transformers: A Novel Soft Error Vulnerability Guided Approach to Error Checking and Suppression.	ETS	2023	DBLP DOI BibTeX RDF
38	Chaofang Ma, Jianan Mu, Jing Ye 0001, Shuai Chen, Yuan Cao 0003, Huawei Li 0001, Xiaowei Li 0001	Online Reliability Evaluation Design: Select Reliable CRPs for Arbiter PUF and Its Variants.	ETS	2023	DBLP DOI BibTeX RDF
38	Athanasios Xynos, Vasileios Tenentes, Yiorgos Tsiatouhas	SiCBit-PUF: Strong in-Cache Bitflip PUF Computation for Trusted SoCs.	ETS	2023	DBLP DOI BibTeX RDF
38	Deniz Kasap, Alessio Carpegna, Alessandro Savino, Stefano Di Carlo	Micro-Architectural features as soft-error markers in embedded safety-critical systems: preliminary study.	ETS	2023	DBLP DOI BibTeX RDF
38	Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen	High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis.	ETS	2023	DBLP DOI BibTeX RDF
38	Francesco Lorenzelli, Asser Elsayed, Clement Godfrin, Alexander Grill, Stefan Kubicek, Ruoyu Li, Michele Stucchi, Danny Wan, Kristiaan De Greve, Erik Jan Marinissen, Georges G. E. Gielen	Study of Transistor Metrics for Room-Temperature Screening of Single Electron Transistors for Silicon Spin Qubit Applications.	ETS	2023	DBLP DOI BibTeX RDF
38	Ferhat Can Ataman, Muslum Emir Avci, Y. B. Chethan Kumar, Sule Ozev	Global Tuning for System Performance Optimization of RF MIMO Radars.	ETS	2023	DBLP DOI BibTeX RDF
38	S. L. Tweehuysen, G. L. A. Adriaans, M. Gomony	Stimuli Generation for IC Design Verification using Reinforcement Learning with an Actor-Critic Model.	ETS	2023	DBLP DOI BibTeX RDF
38	Brojogopal Sapui, Jonas Krautter, Mahta Mayahinia, Atousa Jafari, Dennis Gnad, Sergej Meschkov, Mehdi B. Tahoori	Power Side-Channel Attacks and Countermeasures on Computation-in-Memory Architectures and Technologies.	ETS	2023	DBLP DOI BibTeX RDF
38	Abdalrhman Badran, Somayeh Sadeghi Kohan, Jan Dennis Reimer, Sybille Hellebrand	Approximate Communication: Balancing Performance, Power, Reliability, and Safety.	ETS	2023	DBLP DOI BibTeX RDF
38	Bruno E. Forlin, Wouter van Huffelen, Carlo Cazzaniga, Paolo Rech, Nikolaos Alachiotis 0001, Marco Ottavi	An unprotected RISC-V Soft-core processor on an SRAM FPGA: Is it as bad as it sounds?	ETS	2023	DBLP DOI BibTeX RDF
38	Zaheer Tabassam, Andreas Steininger	SET Effects on Quasi Delay Insensitive and Synchronous Circuits.	ETS	2023	DBLP DOI BibTeX RDF
38	Katayoon Basharkhah, Raheleh Sadat Mirhashemi, Nooshin Nosrati, Mohammad-Javad Zare, Zainalabedin Navabi	Learning Electrical Behavior of Core Interconnects for System-Level Crosstalk Prediction.	ETS	2023	DBLP DOI BibTeX RDF
38	Tobias Faller, Nikolaos Ioannis Deligiannis, Markus Schwörer, Matteo Sonza Reorda, Bernd Becker 0001	Constraint-Based Automatic SBST Generation for RISC-V Processor Families.	ETS	2023	DBLP DOI BibTeX RDF
38	Moritz Fieback, Filip Bradaric, Mottaqiallah Taouil, Said Hamdioui	Online Fault Detection and Diagnosis in RRAM.	ETS	2023	DBLP DOI BibTeX RDF
38	Marcello Traiola, Angeliki Kritikakou, Olivier Sentieys	harDNNing: a machine-learning-based framework for fault tolerance assessment and protection of DNNs.	ETS	2023	DBLP DOI BibTeX RDF
38	Asimina Koutra, Vasileios Tenentes	High Throughput and Energy Efficient SHA-2 ASIC Design for Continuous Integrity Checking Applications.	ETS	2023	DBLP DOI BibTeX RDF
38	Yi He 0010, Yanjing Li	Understanding Permanent Hardware Failures in Deep Learning Training Accelerator Systems.	ETS	2023	DBLP DOI BibTeX RDF
38	Gabriele Gavarini, Annachiara Ruospo, Ernesto Sánchez 0001	SCI-FI: a Smart, aCcurate and unIntrusive Fault-Injector for Deep Neural Networks.	ETS	2023	DBLP DOI BibTeX RDF
38	Fernando Fernandes dos Santos, Luigi Carro, Paolo Rech	Understanding and Improving GPUs' Reliability Combining Beam Experiments with Fault Simulation.	ETS	2023	DBLP DOI BibTeX RDF
38	Denis Schwachhofer, Maik Betka, Steffen Becker 0001, Stefan Wagner 0001, Matthias Sauer 0002, Ilia Polian	Automating Greybox System-Level Test Generation.	ETS	2023	DBLP DOI BibTeX RDF
38	Manil Dev Gomony, Anteneh Gebregiorgis, Moritz Fieback, Marc Geilen, Sander Stuijk, Jan Richter-Brockmann, Rajendra Bishnoi, Sven Argo, Lara Arche Andradas, Tim Güneysu, Mottaqiallah Taouil, Henk Corporaal, Said Hamdioui	Dependability of Future Edge-AI Processors: Pandora's Box.	ETS	2023	DBLP DOI BibTeX RDF
38	Tao Zhang, Mark M. Tehranipoor, Farimah Farahmandi	BitFREE: On Significant Speedup and Security Applications of FPGA Bitstream Format Reverse Engineering.	ETS	2023	DBLP DOI BibTeX RDF
38	Marti Alonso, David Andreu 0003, Ramon Canal, Stefano Di Carlo, Cristiano Pegoraro Chenet, Juanjo Costa, Andreu Girones, Dimitris Gizopoulos, Vasileios Karakostas, Beatriz Otero, George Papadimitriou 0001, Eva Rodríguez, Alessandro Savino	Validation, Verification, and Testing (VVT) of future RISC-V powered cloud infrastructures: the Vitamin-V Horizon Europe Project perspective.	ETS	2023	DBLP DOI BibTeX RDF
38	Eslam Yassien, Yongjia Xu, Hui Jiang, Thach Nguyen, Jennifer Dworak, Theodore W. Manikas, Kundan Nepal	Harvesting Wasted Clock Cycles for Efficient Online Testing.	ETS	2023	DBLP DOI BibTeX RDF
38	Xhesila Xhafa, Aymen Ladhar, Eric Faehn, Lorena Anghel, Gregory di Pendina, Patrick Girard 0001, Arnaud Virazel	On Using Cell-Aware Methodology for SRAM Bit Cell Testing.	ETS	2023	DBLP DOI BibTeX RDF
38	Lorenzo Masciullo, Roberto Passerone, Francesco Regazzoni 0001, Ilia Polian	Secrets Leaking Through Quicksand: Covert Channels in Approximate Computing.	ETS	2023	DBLP DOI BibTeX RDF
38	Marcel Merten, Sebastian Huhn 0001, Rolf Drechsler	Increasing SAT-Resilience of Logic Locking Mechanisms using Formal Methods.	ETS	2023	DBLP DOI BibTeX RDF
38	Shao-Chun Hung, Arjun Chaudhuri, Krishnendu Chakrabarty	Test-Point Insertion for Power-Safe Testing of Monolithic 3D ICs using Reinforcement Learning*.	ETS	2023	DBLP DOI BibTeX RDF
38	Markus Ulbricht 0002, Yvan Tortorella, Michael Rogenmoser, Li Lu, Junchao Chen 0001, Francesco Conti 0001, Milos Krstic, Luca Benini	PULP Fiction No More - Dependable PULP Systems for Space.	ETS	2023	DBLP DOI BibTeX RDF
38	Annachiara Ruospo, Gabriele Gavarini, A. Porsia, Matteo Sonza Reorda, Ernesto Sánchez 0001, Riccardo Mariani, J. Aribido, Jyotika Athavale	Image Test Libraries for the on-line self-test of functional units in GPUs running CNNs.	ETS	2023	DBLP DOI BibTeX RDF
38	Hanzhi Xun, Moritz Fieback, Sicong Yuan, Ziwei Zhang, Mottaqiallah Taouil, Said Hamdioui	Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs.	ETS	2023	DBLP DOI BibTeX RDF
38	Changming Cui, Tuanhui Xu, Haitao Fu, Junlin Huang	Physical-aware Interconnect Testing and Repairing of Chiplets.	ETS	2023	DBLP DOI BibTeX RDF
38	Jens Anders, Pablo Andreu, Bernd Becker 0001, Steffen Becker 0001, Riccardo Cantoro, Nikolaos Ioannis Deligiannis, Nourhan Elhamawy, Tobias Faller, Carles Hernández 0001, Nele Mentens, Mahnaz Namazi Rizi, Ilia Polian, Abolfazl Sajadi, Matthias Sauer 0002, Denis Schwachhofer, Matteo Sonza Reorda, Todor Stefanov, Ilya Tuzov, Stefan Wagner 0001, Nusa Zidaric	A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors.	ETS	2023	DBLP DOI BibTeX RDF
38	Jayeeta Chaudhuri, Krishnendu Chakrabarty	Criticality Analysis of Ring Oscillators in FPGA Bitstreams *.	ETS	2023	DBLP DOI BibTeX RDF
38	Theofilos Spyrou, Haralampos-G. Stratigopoulos	On-Line Testing of Neuromorphic Hardware.	ETS	2023	DBLP DOI BibTeX RDF
38	Upoma Das, M. Sazadur Rahman, N. Nalla Anandakumar, Kimia Zamiri Azar, Fahim Rahman, Mark M. Tehranipoor, Farimah Farahmandi	PSC-Watermark: Power Side Channel Based IP Watermarking Using Clock Gates.	ETS	2023	DBLP DOI BibTeX RDF
38	Ferhat Can Ataman, Mohammed Aladsani, Georgios C. Trichopoulos, Y. B. Chethan Kumar, Sule Ozev	Mismatch Measurement for MIMO mm-Wave Radars via Simple Power Monitors.	ETS	2023	DBLP DOI BibTeX RDF
38	Xhesila Xhafa, Patrick Girard 0001, Arnaud Virazel	Learning-Based Characterization Models for Quality Assurance of Emerging Memory Technologies.	ETS	2023	DBLP DOI BibTeX RDF
38		IEEE European Test Symposium, ETS 2022, Barcelona, Spain, May 23-27, 2022	ETS	2022	DBLP DOI BibTeX RDF
38	Yogendra Sao, Anjum Riaz, Satyadev Ahlawat, Sk Subidh Ali	Evaluating Security of New Locking SIB-based Architectures.	ETS	2022	DBLP DOI BibTeX RDF
38	Soyed Tuhin Ahmed, Mahta Mayahinia, Michael Hefenbrock, Christopher Münch, Mehdi B. Tahoori	Process and Runtime Variation Robustness for Spintronic-Based Neuromorphic Fabric.	ETS	2022	DBLP DOI BibTeX RDF
38	Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer, Bartosz Wlodarczak	X-Masking for In-System Deterministic Test.	ETS	2022	DBLP DOI BibTeX RDF
38	Lucas Matana Luza, Frederic Wrobel, Luis Entrena, Luigi Dilillo	Impact of Atmospheric and Space Radiation on Sensitive Electronic Devices.	ETS	2022	DBLP DOI BibTeX RDF
38	Johanna Sepúlveda, Dominik Winkler	Super Acceleration of Dilithium in MPSoCs Critical Environments.	ETS	2022	DBLP DOI BibTeX RDF
38	Vahid Eftekhari Moghadam, Paolo Prinetto, Gianluca Roascio	Real-Time Control-Flow Integrity for Multicore Mixed-Criticality IoT Systems.	ETS	2022	DBLP DOI BibTeX RDF
38	Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli	An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip.	ETS	2022	DBLP DOI BibTeX RDF
38	Arunkumar Vijayan, Mehdi B. Tahoori, Ewald Kintzli, Timm Lohmann, Juergen Hans Handl	A Data-driven Approach for Fault Detection in the Alternator Unit of Automotive Systems.	ETS	2022	DBLP DOI BibTeX RDF
38	Tobias Kilian, Markus Hanel, Daniel Tille, Martin Huch, Ulf Schlichtmann	Reducing Routing Overhead by Self-Enabling Functional Path Ring Oscillators.	ETS	2022	DBLP DOI BibTeX RDF
38	Alban Haynse Immanuel, Jeyendran Nithyanadam	WLAN Rx PER Test Implementation in ATE.	ETS	2022	DBLP DOI BibTeX RDF
38	Abraham Steenhoek, Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi 0001, Degang Chen 0001	Graph Theory Approach for Multi-site ATE Board Parameter Extraction.	ETS	2022	DBLP DOI BibTeX RDF
38	Nooshin Nosrati, Seyedeh Maryam Ghasemi, Mahboobe Sadeghipour Roodsari, Zainalabedin Navabi	Concurrent Error Detection for LSTM Accelerators.	ETS	2022	DBLP DOI BibTeX RDF
38	S. Lapeyre, Nicolas Valette, Marc Merandat, Marie-Lise Flottes, Bruno Rouzeyre, Arnaud Virazel	A Lightweight, Plug-and-Play and Autonomous JTAG Authentication IP for Secure Device Testing.	ETS	2022	DBLP DOI BibTeX RDF
38	William R. Eisenstadt, Mark Roos, Devin Morris, José Luis González-Jiménez, Christopery Mounet, Manuel J. Barragán, Gildas Léger, Florent Cilici, Estelle Lauga-Larroze, Salvador Mir, Sylvain Bourdel, Marc Margalef-Rovira, Issa Alaji, Haitham Ghanem, Guillaume Ducournau, Christophe Gaquière	Special Session on RF/5G Test.	ETS	2022	DBLP DOI BibTeX RDF
38	Florian Neugebauer, Stefan Holst, Ilia Polian	On the Impact of Hardware Timing Errors on Stochastic Computing based Neural Networks.	ETS	2022	DBLP DOI BibTeX RDF
38	Vladimir A. Zivkovic, Michele Palazzi, Ming Chuen Alvan Lam, Mogens Isager	AMS Test Vector Generation using AMS Verification and IEEE P1687.2.	ETS	2022	DBLP DOI BibTeX RDF
38	Hussam Amrouch, Krishnendu Chakrabarty, Dirk Pflüger, Ilia Polian, Matthias Sauer 0002, Matteo Sonza Reorda	Machine Learning for Test, Diagnosis, Post-Silicon Validation and Yield Optimization.	ETS	2022	DBLP DOI BibTeX RDF
38	Katharina Ruep, Daniel Große	SpinalFuzz: Coverage-Guided Fuzzing for SpinalHDL Designs.	ETS	2022	DBLP DOI BibTeX RDF
38	Riccardo Cantoro, Francesco Garau, Patrick Girard 0001, Nima Kolahimahmoudi, Sandro Sartoni, Matteo Sonza Reorda, Arnaud Virazel	Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries.	ETS	2022	DBLP DOI BibTeX RDF
38	Anteneh Gebregiorgis, Artemis Zografou, Said Hamdioui	RRAM Crossbar-Based Fault-Tolerant Binary Neural Networks (BNNs).	ETS	2022	DBLP DOI BibTeX RDF
38	Sergio Vinagrero Gutierrez	Memristor-based security primitives.	ETS	2022	DBLP DOI BibTeX RDF
38	Moritz Fieback, Christopher Münch, Anteneh Gebregiorgis, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Mehdi B. Tahoori	PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory.	ETS	2022	DBLP DOI BibTeX RDF
38	Michail Moraitis, Elena Dubrova	FPGA Design Deobfuscation by Iterative LUT Modifications at Bitstream Level.	ETS	2022	DBLP DOI BibTeX RDF
38	Mohamed Thouabtia, Alexander Stephan Oleszczuk, Thomas Girg, Martin Allinger	Novel Method to Measure Common Mode Transient Immunity of Isolators.	ETS	2022	DBLP DOI BibTeX RDF