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GrowBag graphs for keyword ? (Num. hits/coverage)
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Results
Found 38 publication records. Showing 38 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
36 | Chor Ping Low, Hon Wai Leong |
A New Class of Efficient Algorithms for Reconfiguration of Memory Arrays. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 45(5), pp. 614-618, 1996. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
RRAMs, NP-completeness, throughput, heuristic algorithms, vertex covers, sparsity |
28 | Maryam Akbari, Sattar Mirzakuchaki, Daniel Arumí, Salvador Manich, Álvaro Gómez-Pau, Francesca Campabadal, Mireia Bargallo González, Rosa Rodríguez-Montañés |
True Random Number Generator Based on the Variability of the High Resistance State of RRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 11, pp. 66682-66693, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
28 | Letícia Maria Veiras Bolzani |
Embedded Tutorial - RRAMs: How to Guarantee Their Quality Test after Manufacturing? ![Search on Bibsonomy](Pics/bibsonomy.png) |
DDECS ![In: 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023, Tallinn, Estonia, May 3-5, 2023, pp. 167-168, 2023, IEEE, 979-8-3503-3277-3. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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28 | Sara Vecchi, Paolo Pavan, Francesco Maria Puglisi |
A Unified Framework to Explain Random Telegraph Noise Complexity in MOSFETs and RRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IRPS ![In: IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023, pp. 1-6, 2023, IEEE, 978-1-6654-5672-2. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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28 | Hanzhi Xun, Moritz Fieback, Sicong Yuan, Ziwei Zhang, Mottaqiallah Taouil, Said Hamdioui |
Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: IEEE European Test Symposium, ETS 2023, Venezia, Italy, May 22-26, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-3634-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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28 | Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mathijs Heidekamp, Thiago Copetti, Letícia Maria Veiras Bolzani Poehls, Mottaqiallah Taouil, Said Hamdioui |
Characterization and Test of Intermittent Over RESET in RRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ATS ![In: 32nd IEEE Asian Test Symposium, ATS 2023, Beijing, China, October 14-17, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-0310-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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28 | Hanzhi Xun, Sicong Yuan, Moritz Fieback, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
Device-Aware Test for Ion Depletion Defects in RRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 246-255, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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28 | Moritz Fieback, Guilherme Cardoso Medeiros, Lizhou Wu, Hassen Aziza, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui |
Defects, Fault Modeling, and Test Development Framework for RRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM J. Emerg. Technol. Comput. Syst. ![In: ACM J. Emerg. Technol. Comput. Syst. 18(3), pp. 52:1-52:26, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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28 | Thiago Santos Copetti, M. Nilovic, Moritz Fieback, Tobias Gemmeke, Said Hamdioui, Letícia Maria Bolzani Poehls |
Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
LATS ![In: 23rd IEEE Latin American Test Symposium, LATS 2022, Montevideo, Uruguay, September 5-8, 2022, pp. 1-6, 2022, IEEE, 978-1-6654-5707-1. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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28 | David Maldonado, Francisco Jiménez-Molinos, Juan Bautista Roldán, M. B. González, Francesca Campabadal |
An enhanced Verilog-A compact model for bipolar RRAMs including transient thermal effects and series resistance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DCIS ![In: 37th Conference on Design of Circuits and Integrated Systems, DCIS 2022, Pamplona, Spain, November 16-18, 2022, pp. 1-6, 2022, IEEE, 978-1-6654-5950-1. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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28 | Aaron Ruen, Abhijeet Barua, Rashmi Jha, John Marty Emmert |
Fully BEOL-Compatible Switch Boxes Using RRAMs and Thin Film Transistors for Reconfigurable and Secure ICs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MWSCAS ![In: 64th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2021, Lansing, MI, USA, August 9-11, 2021, pp. 820-825, 2021, IEEE, 978-1-6654-2461-5. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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28 | Thiago Santos Copetti, Tobias Gemmeke, Letícia Maria Bolzani Pöhls |
A DfT Strategy for Detecting Emerging Faults in RRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI-SoC (Selected Papers) ![In: VLSI-SoC: Technology Advancement on SoC Design - 29th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2021, Singapore, October 4-8, 2021, Revised and Extended Selected Papers, pp. 93-111, 2021, Springer, 978-3-031-16817-8. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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28 | Thiago Santos Copetti, Tobias Gemmeke, Letícia Maria Veiras Bolzani |
Validating a DFT Strategy's Detection Capability regarding Emerging Faults in RRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI-SoC ![In: 29th IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2021, Singapore, Singapore, October 4-7, 2021, pp. 1-6, 2021, IEEE, 978-1-6654-2614-5. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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28 | Hassen Aziza, Said Hamdioui, Moritz Fieback, Mottaqiallah Taouil, Mathieu Moreau |
Density Enhancement of RRAMs using a RESET Write Termination for MLC Operation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Design, Automation & Test in Europe Conference & Exhibition, DATE 2021, Grenoble, France, February 1-5, 2021, pp. 1877-1880, 2021, IEEE, 978-3-9819263-5-4. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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28 | Moritz Fieback, Guilherme Cardoso Medeiros, Anteneh Gebregiorgis, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
Intermittent Undefined State Fault in RRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 26th IEEE European Test Symposium, ETS 2021, Bruges, Belgium, May 24-28, 2021, pp. 1-6, 2021, IEEE, 978-1-6654-1849-2. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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28 | E. Brum, Moritz Fieback, Thiago Santos Copetti, H. Jiayi, Said Hamdioui, Fabian Vargas 0001, Letícia Maria Veiras Bolzani |
Evaluating the Impact of Process Variation on RRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
LATS ![In: 22nd IEEE Latin American Test Symposium, LATS 2021, Punta del Este, Uruguay, October 27-29, 2021, pp. 1-6, 2021, IEEE, 978-1-6654-2057-0. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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28 | Mamidala Saketh Ram, Karl-Magnus Persson, Lars-Erik Wernersson |
Controlling Filament Stability in Scaled Oxides (3 nm) for High Endurance (>106) Low Voltage ITO/HfO2 RRAMs for Future 3D Integration. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DRC ![In: Device Research Conference, DRC 2021, Santa Barbara, CA, USA, June 20-23, 2021, pp. 1-2, 2021, IEEE, 978-1-6654-1240-7. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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28 | Hassen Aziza, Mathieu Moreau, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui |
An Energy-Efficient Current-Controlled Write and Read Scheme for Resistive RAMs (RRAMs). ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Access ![In: IEEE Access 8, pp. 137263-137274, 2020. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
28 | Gerardo González-Cordero, M. B. González, Francesca Campabadal, Francisco Jiménez-Molinos, Juan Bautista Roldán |
A physically based SPICE model for RRAMs including RTN. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DCIS ![In: XXXV Conference on Design of Circuits and Integrated Systems, DCIS 2020, Segovia, Spain, November 18-20, 2020, pp. 1-6, 2020, IEEE, 978-1-7281-9132-4. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
28 | Teyuh Chou, Wei Tang 0010, Jacob Botimer, Zhengya Zhang |
CASCADE: Connecting RRAMs to Extend Analog Dataflow In An End-To-End In-Memory Processing Paradigm. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MICRO ![In: Proceedings of the 52nd Annual IEEE/ACM International Symposium on Microarchitecture, MICRO 2019, Columbus, OH, USA, October 12-16, 2019., pp. 114-125, 2019, ACM, 978-1-4503-6938-1. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
28 | Toufik Sadi, Oves Badami, Vihar P. Georgiev, Asen Asenov |
Kinetic Monte Carlo Analysis of the Operation and Reliability of Oxide Based RRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
LSSC ![In: Large-Scale Scientific Computing - 12th International Conference, LSSC 2019, Sozopol, Bulgaria, June 10-14, 2019, Revised Selected Papers, pp. 429-437, 2019, Springer, 978-3-030-41031-5. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
28 | Mohammed E. Fouda, Emre Neftci, Ahmed M. Eltawil, Fadi J. Kurdahi |
Effect of Asymmetric Nonlinearity Dynamics in RRAMs on Spiking Neural Network Performance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACSSC ![In: 53rd Asilomar Conference on Signals, Systems, and Computers, ACSCC 2019, Pacific Grove, CA, USA, November 3-6, 2019, pp. 495-499, 2019, IEEE, 978-1-7281-4301-9. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
28 | Zongxian Yang, Lan Wei |
Logic Circuit and Memory Design for In-Memory Computing Applications using Bipolar RRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS ![In: IEEE International Symposium on Circuits and Systems, ISCAS 2019, Sapporo, Japan, May 26-29, 2019, pp. 1-5, 2019, IEEE, 978-1-7281-0397-6. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
28 | Zongxian Yang, Yixiao Ma, Lan Wei |
Functionally Complete Boolean Logic and Adder Design Based on 2T2R RRAMs for Post-CMOS In-Memory Computing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 2019 on Great Lakes Symposium on VLSI, GLSVLSI 2019, Tysons Corner, VA, USA, May 9-11, 2019, pp. 147-152, 2019, ACM, 978-1-4503-6252-8. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
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28 | Aditya Shukla, Sidharth Prasad, Sandip Lashkare, Udayan Ganguly |
A case for multiple and parallel RRAMs as synaptic model for training SNNs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1803.04773, 2018. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP BibTeX RDF |
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28 | Aditya Shukla, Sidharth Prasad, Sandip Lashkare, Udayan Ganguly |
A case for multiple and parallel RRAMs as synaptic model for training SNNs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IJCNN ![In: 2018 International Joint Conference on Neural Networks, IJCNN 2018, Rio de Janeiro, Brazil, July 8-13, 2018, pp. 1-8, 2018, IEEE, 978-1-5090-6014-6. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
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28 | Toufik Sadi, Asen Asenov |
Microscopic KMC Modeling of Oxide RRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
NMA ![In: Numerical Methods and Applications - 9th International Conference, NMA 2018, Borovets, Bulgaria, August 20-24, 2018, Revised Selected Papers, pp. 290-297, 2018, Springer, 978-3-030-10691-1. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
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28 | Xinyu Wu 0002, Vishal Saxena |
Enabling bio-plausible multi-level STDP using CMOS neurons with dendrites and bistable RRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IJCNN ![In: 2017 International Joint Conference on Neural Networks, IJCNN 2017, Anchorage, AK, USA, May 14-19, 2017, pp. 3522-3526, 2017, IEEE, 978-1-5090-6182-2. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
28 | Xinyu Wu 0002, Vishal Saxena |
Enabling Bio-Plausible Multi-level STDP using CMOS Neurons with Dendrites and Bistable RRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1612.01491, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP BibTeX RDF |
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28 | Juli Blasco, Jordi Suñé, Enrique Miranda 0002 |
Modeling of the conduction characteristics of voltage-driven bipolar RRAMs including turning point effects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESSDERC ![In: 45th European Solid State Device Research Conference, ESSDERC 2015, Graz, Austria, September 14-18, 2015, pp. 44-47, 2015, IEEE, 978-1-4673-7133-9. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
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28 | Pierre-Emmanuel Gaillardon, Xifan Tang, Jury Sandrini, Maxime Thammasack, Somayyeh Rahimian Omam, Davide Sacchetto, Yusuf Leblebici, Giovanni De Micheli |
A ultra-low-power FPGA based on monolithically integrated RRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015, pp. 1203-1208, 2015, ACM, 978-3-9815370-4-8. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP BibTeX RDF |
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28 | Elisa Vianello, Olivier Thomas, M. Harrand, Santhosh Onkaraiah, T. Cabout, Boubacar Traore, T. Diokh, Houcine Oucheikh, Luca Perniola, Gabriel Molas, Philippe Blaise, J.-F. Nodin, Eric Jalaguier, Barbara De Salvo |
Back-end 3D integration of HfO2-based RRAMs for low-voltage advanced IC digital design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICICDT ![In: Proceedings of 2013 International Conference on IC Design & Technology, ICICDT 2013, Pavia, Italy, May 29-31, 2013, pp. 235-238, 2013, IEEE, 978-1-4673-4740-2. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
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28 | Sangho Shin, Kyungmin Kim 0001, Sung-Mo Kang |
Analysis of Passive Memristive Devices Array: Data-Dependent Statistical Model and Self-Adaptable Sense Resistance for RRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Proc. IEEE ![In: Proc. IEEE 100(6), pp. 2021-2032, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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28 | Nor Zaidi Haron, Said Hamdioui |
DfT schemes for resistive open defects in RRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 2012 Design, Automation & Test in Europe Conference & Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012, pp. 799-804, 2012, IEEE, 978-1-4577-2145-8. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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28 | Yi-Chung Chen, Wei Zhang 0012, Hai Li 0001 |
A Look Up Table design with 3D bipolar RRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASP-DAC ![In: Proceedings of the 17th Asia and South Pacific Design Automation Conference, ASP-DAC 2012, Sydney, Australia, January 30 - February 2, 2012, pp. 73-78, 2012, IEEE, 978-1-4673-0770-3. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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28 | Paulo R. F. Rocha, Asal Kiazadeh, Qian Chen 0025, Henrique L. Gomes |
Dynamic Behavior of Resistive Random Access Memories (RRAMS) Based on Plastic Semiconductor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DoCEIS ![In: Technological Innovation for Value Creation - Third IFIP WG 5.5/SOCOLNET Doctoral Conference on Computing, Electrical and Industrial Systems, DoCEIS 2012, Costa de Caparica, Portugal, February 27-29, 2012. Proceedings, pp. 535-540, 2012, Springer, 978-3-642-28254-6. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
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28 | Asal Kiazadeh, Paulo R. F. Rocha, Qian Chen 0025, Henrique L. Gomes |
Resistive Random Access Memories (RRAMs) Based on Metal Nanoparticles. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DoCEIS ![In: Technological Innovation for Sustainability - Second IFIP WG 5.5/SOCOLNET Doctoral Conference on Computing, Electrical and Industrial Systems, DoCEIS 2011, Costa de Caparica, Portugal, February 21-23, 2011. Proceedings, pp. 591-595, 2011, Springer, 978-3-642-19169-5. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
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28 | Fabrizio Lombardi, Wei-Kang Huang |
Approaches for the repair of VLSI/WSI RRAMs by row/column deletion. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FTCS ![In: Proceedings of the Eighteenth International Symposium on Fault-Tolerant Computing, FTCS 1988, Tokyo, Japan, 27-30 June, 1988, pp. 342-347, 1988, IEEE Computer Society, 0-8186-0867-6. The full citation details ...](Pics/full.jpeg) |
1988 |
DBLP DOI BibTeX RDF |
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