Search results for "data-backgrounds"

Found 15 publication records. Showing 15 according to the selection in the facets

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
52	Ad J. van de Goor, Ivo Schanstra	Address and Data Scrambling: Causes and Impact on Memory Tests.	DELTA	2002	DBLP DOI BibTeX RDF	Address-scrambling, data-scrambling, fault models, memory tests, data backgrounds
34	Ad J. van de Goor, Said Hamdioui, Rob Wadsworth	Detecting Faults in the Peripheral Circuits and an Evaluation of SRAM Tests.	ITC	2004	DBLP DOI BibTeX RDF	address directions, peripheral circuit faults, fault coverage, March tests, data-backgrounds
25	Said Hamdioui, Rob Wadsworth, John Delos Reyes, Ad J. van de Goor	Memory Fault Modeling Trends: A Case Study.	J. Electron. Test.	2004	DBLP DOI BibTeX RDF	static faults, fault models, fault coverage, memory tests, dynamic faults, data backgrounds
25	Zaid Al-Ars, Said Hamdioui, Ad J. van de Goor	Effects of Bit Line Coupling on the Faulty Behavior of DRAMs.	VTS	2004	DBLP DOI BibTeX RDF	bit line coupling, DRAMs, Spice simulation, data backgrounds, faulty behavior
25	Ad J. van de Goor, Issam B. S. Tlili	A Systematic Method for Modifying March Tests for Bit-Oriented Memories into Tests for Word-Oriented Memories.	IEEE Trans. Computers	2003	DBLP DOI BibTeX RDF	Bit-oriented memories, word-oriented memories, fault models, march tests, data backgrounds
25	Said Hamdioui, Ad J. van de Goor, Mike Rodgers	Detecting Intra-Word Faults in Word-Oriented Memories.	VTS	2003	DBLP DOI BibTeX RDF	Bit-oriented/word-oriented memories, fault models, memory tests, data backgrounds
25	Ad J. van de Goor, Magdy S. Abadir, Alan Carlin	Minimal Test for Coupling Faults in Word-Oriented Memories.	DATE	2002	DBLP DOI BibTeX RDF	State coupling faults, word-oriented memories, tests, data backgrounds, m-out-of-n codes
25	Ad J. van de Goor, Issam B. S. Tlili	March Tests for Word-Oriented Memories.	DATE	1998	DBLP DOI BibTeX RDF	Bit-oriented memories, word-oriented memories, fault models, memory tests, march tests, data backgrounds
11	Koichi Kise, Yasuo Miki, Keinosuke Matsumoto	Backgrounds as Information Carriers for Printed Documents.	ICPR	2000	DBLP DOI BibTeX RDF
9	Ioannis Voyiatzis	An ALU-Based BIST Scheme for Word-Organized RAMs.	IEEE Trans. Computers	2008	DBLP DOI BibTeX RDF	Memory control and access, Reliability, Test generation, Built-In Tests, Testing and Fault-Tolerance, Semiconductor Memories
9	Slimane Boutobza, Michael Nicolaidis, Kheiredine M. Lamara, Andrea Costa	A Transparent based Programmable Memory BIST.	ETS	2006	DBLP DOI BibTeX RDF
9	Ivo Schanstra, Ad J. van de Goor	Consequences of RAM Bitline Twisting for Test Coverage.	DATE	2003	DBLP DOI BibTeX RDF
9	Olivier Caty, Ismet Bayraktaroglu, Amitava Majumdar 0002, Richard Lee, John Bell, Lisa Curhan	Instruction Based BIST for Board/System Level Test of External Memories and Internconnects.	ITC	2003	DBLP DOI BibTeX RDF
9	Kuo-Liang Cheng, Ming-Fu Tsai, Cheng-Wen Wu	Neighborhood pattern-sensitive fault testing and diagnostics for random-access memories.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2002	DBLP DOI BibTeX RDF
9	Kuo-Liang Cheng, Ming-Fu Tsai, Cheng-Wen Wu	Efficient Neighborhood Pattern-Sensitive Fault Test Algorithms for Semiconductor Memories.	VTS	2001	DBLP DOI BibTeX RDF