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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 98 occurrences of 61 keywords
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Results
Found 69 publication records. Showing 69 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
113 | Sunghoon Chun, Sangwook Kim, Hong-Sik Kim, Sungho Kang 0001 |
An Efficient Dictionary Organization for Maximum Diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 22(1), pp. 37-48, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
static diagnosis, dynamic diagnosis, lossless compression, fault dictionary |
106 | Irith Pomeranz, Sudhakar M. Reddy |
A Same/Different Fault Dictionary: An Extended Pass/Fail Fault Dictionary with Improved Diagnostic Resolution. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Design, Automation and Test in Europe, DATE 2008, Munich, Germany, March 10-14, 2008, pp. 1474-1479, 2008, ACM, 978-3-9810801-3-1. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
80 | Vamsi Boppana, Ismed Hartanto, W. Kent Fuchs |
Full fault dictionary storage based on labeled tree encoding. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 14th IEEE VLSI Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, USA, pp. 174-179, 1996, IEEE Computer Society, 0-8186-7304-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
digital storage, full fault dictionary storage, labeled tree encoding, fault dictionary compaction, binary string code, implicit storage, VLSI, fault diagnosis, logic testing, integrated circuit testing, encoding, automatic testing, circuit analysis computing, fault trees |
59 | Yu-Ru Hong, Juinn-Dar Huang |
Reducing fault dictionary size for million-gate large circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Design Autom. Electr. Syst. ![In: ACM Trans. Design Autom. Electr. Syst. 14(2), pp. 27:1-27:14, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
fault diagnosis, Fault dictionary, diagnostic resolution |
59 | Zbigniew Kalbarczyk, Ravishankar K. Iyer, Gregory L. Ries, Jaqdish U. Patel, Myeong S. Lee, Yuxiao Xiao |
Hierarchical Simulation Approach to Accurate Fault Modeling for System Dependability Evaluation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Software Eng. ![In: IEEE Trans. Software Eng. 25(5), pp. 619-632, 1999. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
Hierarchical simulation, accurate fault modeling, dependability evaluation, fault dictionaries |
59 | Sudip Chakrabarti, Abhijit Chatterjee |
Compact Fault Dictionary Construction for Efficient Isolation of Faults in Analog and Mixed-Signal Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ARVLSI ![In: 18th Conference on Advanced Research in VLSI (ARVLSI '99), 21-24 March 1999, Atlanta, GA, USA, pp. 327-341, 1999, IEEE Computer Society, 0-7695-0056-0. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
fault diagnosis, analog, Design automation, mixed-signal, fault isolation |
50 | Sreejit Chakravarty, Yiming Gong |
Voting model based diagnosis of bridging faults in combinational circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 8th International Conference on VLSI Design (VLSI Design 1995), 4-7 January 1995, New Delhi, India, pp. 338-342, 1995, IEEE Computer Society, 0-8186-6905-5. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
MOS logic circuits, voting model based diagnosis, fault list, stuck-at fault dictionary, fault dropping rules, time efficiency, fault diagnosis, logic testing, combinational circuits, combinational circuits, bridging faults, diagnosis algorithm, space efficiency, majority logic, compact data structure |
50 | José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski |
Testing a PWM circuit using functional fault models and compact test vectors for operational amplifiers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, pp. 96-, 2000, IEEE Computer Society, 0-7695-0887-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
PWM circuit, compact test vectors, analog VLSI technology, functional fault macromodels, compact test vector construction, open loop gain, CMMR, analog circuit simulation complexity, VLSI, integrated circuit testing, design for testability, automatic test pattern generation, fault modeling, fault simulation, fault simulation, operational amplifiers, operational amplifiers, test pattern, functional fault models, analogue circuits, fault dictionary, pulse width modulation, slew-rate |
46 | Yvan Maidon, Thomas Zimmer, André Ivanov |
An Analog Circuit Fault Characterization Methodology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 21(2), pp. 127-134, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
analog circuit testing, analog fault diagnosis, analog fault characterization |
46 | V. C. Prasad, N. Sarat Chandra Babu |
On minimal set of test nodes for fault dictionary of analog circuit fault diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 7(3), pp. 255-258, 1995. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
test nodes, analog circuits, fault dictionary |
44 | Carles Pous, Joan Colomer, Joaquím Meléndez |
Extending a Fault Dictionary Towards a Case Based Reasoning System for Linear Electronic Analog Circuits Diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ECCBR ![In: Advances in Case-Based Reasoning, 7th European Conference, ECCBR 2004, Madrid, Spain, August 30 - September 2, 2004, Proceedings, pp. 748-762, 2004, Springer, 3-540-22882-9. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
41 | Yu-Ru Hong, Juinn-Dar Huang |
Fault Dictionary Size Reduction for Million-Gate Large Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASP-DAC ![In: Proceedings of the 12th Conference on Asia South Pacific Design Automation, ASP-DAC 2007, Yokohama, Japan, January 23-26, 2007, pp. 829-834, 2007, IEEE Computer Society, 1-4244-0629-3. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
41 | Vamsi Boppana, W. Kent Fuchs |
Fault dictionary compaction by output sequence removal. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCAD ![In: Proceedings of the 1994 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 1994, San Jose, California, USA, November 6-10, 1994, pp. 576-579, 1994, IEEE Computer Society / ACM, 0-89791-690-5. The full citation details ...](Pics/full.jpeg) |
1994 |
DBLP DOI BibTeX RDF |
|
40 | Brian Chess, Tracy Larrabee |
Creating small fault dictionaries [logic circuit fault diagnosis]. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18(3), pp. 346-356, 1999. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
39 | Irith Pomeranz |
On Pass/Fail Dictionaries for Scan Circuits . ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, pp. 51-56, 2001, IEEE Computer Society, 0-7695-1378-6. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
39 | Terry Lee, Weitong Chuang, Ibrahim N. Hajj, W. Kent Fuchs |
Circuit-level dictionaries of CMOS bridging faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14(5), pp. 596-603, 1995. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
|
37 | Dimitrios K. Konstantinou, Michael G. Dimopoulos, Dimitris K. Papakostas, Alkis A. Hatzopoulos, Alexios Spyronasios |
Testing an Emergency Luminaire Circuit Using a Fault Dictionary Approach. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DDECS ![In: Proceedings of the 11th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2008), Bratislava, Slovakia, April 16-18, 2008, pp. 251-254, 2008, IEEE Computer Society, 978-1-4244-2276-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
36 | Irith Pomeranz, Sudhakar M. Reddy |
On Dictionary-Based Fault Location in Digital Logic Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 46(1), pp. 48-59, 1997. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
Compact fault dictionary, dynamic fault diagnosis, fault diagnosis, fault dictionary |
33 | Sukumar Nandi, Santanu Chattopadhyay, Parimal Pal Chaudhuri |
Programmable cellular automata based testbed for fault diagnosis in VLSI circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 9th International Conference on VLSI Design (VLSI Design 1996), 3-6 January 1996, Bangalore, India, pp. 61-64, 1996, IEEE Computer Society, 0-8186-7228-5. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
programmable cellular automata, polynomial algebraic tools, faulty signatures, multiple attractor, fault dictionary size, cascadable structure, VLSI, fault diagnosis, fault diagnosis, logic testing, partitions, cellular automata, integrated circuit testing, automatic testing, VLSI circuits, logic partitioning, signature analyzer |
31 | Salvador Mir, Marcelo Lubaszewski, Bernard Courtois |
Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 9(1-2), pp. 43-57, 1996. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
analog ATPG, fault diagnosis, fault-based testing, analog BIST |
29 | José Vicente Calvano, Antonio Carneiro de Mesquita Filho, Vladimir Castro Alves, Marcelo Lubaszewski |
Fault Models and Test Generation for OpAmp Circuits - The FFM. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 17(2), pp. 121-138, 2001. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
test generation, fault model, analog test, operational amplifiers |
27 | Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan |
Low-cost diagnosis of defects in MCM substrate interconnections. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 14th IEEE VLSI Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, USA, pp. 260-265, 1996, IEEE Computer Society, 0-8186-7304-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
low-cost diagnosis, MCM substrate interconnections, substrate interconnect defects, defect location, defect size, fault diagnosis, integrated circuit testing, fault location, multichip modules, integrated circuit interconnections, fault-dictionary, substrates |
27 | Irith Pomeranz, Sudhakar M. Reddy |
Same/different fault dictionary: an extended pass/fail fault dictionary with improved diagnostic resolution. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IET Comput. Digit. Tech. ![In: IET Comput. Digit. Tech. 3(1), pp. 85-93, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
24 | Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda |
A Pattern Ordering Algorithm for Reducing the Size of Fault Dictionaries. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA, pp. 386-391, 2006, IEEE Computer Society, 0-7695-2514-8. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
24 | Mohamed Azimane, Ananta K. Majhi |
New Test Methodology for Resistive Open Defect Detection in Memory Address Decoders. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004, Napa Valley, CA, USA, pp. 123-128, 2004, IEEE Computer Society, 0-7695-2134-7. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
24 | Paul G. Ryan, W. Kent Fuchs |
Dynamic fault dictionaries and two-stage fault isolation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 6(1), pp. 176-180, 1998. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
23 | Sudip Chakrabarti, Abhijit Chatterjee |
Fault modeling and fault sampling for isolating faults in analog and mixed-signal circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS (2) ![In: Proceedings of the 1999 International Symposium on Circuits and Systems, ISCAS 1999, Orlando, Florida, USA, May 30 - June 2, 1999, pp. 444-447, 1999, IEEE, 0-7803-5471-0. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
23 | Ronald W. Mehler, M. Ray Mercer |
Multi-Level Logic Minimization through Fault Dictionary Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCD ![In: Proceedings of the IEEE International Conference On Computer Design, VLSI in Computers and Processors, ICCD '99, Austin, Texas, USA, October 10-13, 1999, pp. 315-318, 1999, IEEE Computer Society, 0-7695-0406-X. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
optimization, logic minimization |
21 | Yigang He, Yanghong Tan, Yichuang Sun |
A neural network approach for fault diagnosis of large-scale analogue circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS (1) ![In: Proceedings of the 2002 International Symposium on Circuits and Systems, ISCAS 2002, Scottsdale, Arizona, USA, May 26-29, 2002, pp. 153-156, 2002, IEEE, 0-7803-7448-7. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
21 | Yiming Gong, Sreejit Chakravarty |
Locating bridging faults using dynamically computed stuck-at fault dictionaries. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 17(9), pp. 876-887, 1998. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
20 | Fatih Kocan, Daniel G. Saab |
Dynamic Fault Diagnosis of Combinational and Sequential Circuits on Reconfigurable Hardware. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 23(5), pp. 405-420, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Dynamic fault diagnosis, FPGA, Emulation, Stuck-at faults, Circuits, Gate-level |
18 | Carles Pous, Joan Colomer, Joaquím Meléndez, Josep Lluís de la Rosa |
Case Base Management for Analog Circuits Diagnosis Improvement. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCBR ![In: Case-Based Reasoning Research and Development, 5th International Conference on Case-Based Reasoning, ICCBR 2003, Trondheim, Norway, June 23-26, 2003, Proceedings, pp. 437-451, 2003, Springer, 3-540-40433-3. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
18 | Matthew Beckler, R. D. Shawn Blanton |
GPU-accelerated fault dictionary generation for the TRAX fault model. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC-Asia ![In: International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017, pp. 34-39, 2017, IEEE, 978-1-5386-3051-8. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
18 | N. Sarat Chandra Babu, V. C. Prasad, S. P. Venu Madhava Rao, K. Lal Kishore |
Multi-Frequency Approach to Fault Dictionary of Linear Analog Fault Diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Circuits Syst. Comput. ![In: J. Circuits Syst. Comput. 17(5), pp. 905-928, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
18 | J. Soares Augusto, C. F. Beltrá Almeida |
Fully automatic DC fault dictionary construction and test nodes selection for analogue fault diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ED&TC ![In: 1995 European Design and Test Conference, ED&TC 1995, Paris, France, March 6-9, 1995, pp. 605, 1995, IEEE Computer Society, 0-8186-7039-8. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
|
18 | Mohammed Ashfaq Shukoor, Vishwani D. Agrawal |
A Two Phase Approach for Minimal Diagnostic Test Set Generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 14th IEEE European Test Symposium, ETS 2009, Sevilla, Spain, May 25-29, 2009, pp. 115-120, 2009, IEEE Computer Society, 978-0-7695-3703-0. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
generalized fault independence, Fault diagnosis, integer linear programming, fault dictionary, test minimization |
18 | Ozgur Sinanoglu, Alex Orailoglu |
Efficient RT-Level Fault Diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Comput. Sci. Technol. ![In: J. Comput. Sci. Technol. 20(2), pp. 166-174, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
RT-level diagnosis, dictionary compaction, fault bit location tracing, fault diagnosis, fault simulation, fault dictionary |
18 | Manoj Sachdev |
A realistic defect oriented testability methodology for analog circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 6(3), pp. 265-276, 1995. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
inductive fault analysis, fault model, faults, defects, fault dictionary |
15 | Pradipta Maji, Parimal Pal Chaudhuri |
Fault Diagnosis of Electronic Circuits Using Cellular Automata Based Pattern Classifier. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Soft Computing Applications in Industry ![In: Soft Computing Applications in Industry, pp. 225-246, 2008, Springer, 978-3-540-77464-8. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
15 | Alexandre Ney, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin |
A Design-for-Diagnosis Technique for SRAM Write Drivers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Design, Automation and Test in Europe, DATE 2008, Munich, Germany, March 10-14, 2008, pp. 1480-1485, 2008, ACM, 978-3-9810801-3-1. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
15 | Alexandre Ney, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin |
An SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage Sensing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA, pp. 89-94, 2008, IEEE Computer Society, 978-0-7695-3123-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
write driver, design-for-diagnosis, diagnosis, SRAM |
14 | Michele Basso, Giovanni Donati, Marco Mugnaini |
Smart Fault Dictionary for Active Magnetic Bearings Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MetroInd4.0&IoT ![In: 2023 IEEE International Workshop on Metrology for Industry 4.0 & IoT, MetroInd4.0&IoT 2023, Brescia, Italy, June 6-8, 2023, pp. 360-365, 2023, IEEE, 979-8-3503-9657-7. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
14 | Sergey G. Mosin |
Entropy-based method of reducing the training set dimension at constructing a neuromorphic fault dictionary for analog and mixed-signal ICs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MECO ![In: 7th Mediterranean Conference on Embedded Computing, MECO 2018, Budva, Montenegro, June 10-14, 2018, pp. 1-4, 2018, IEEE, 978-1-5386-5683-9. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
14 | Yiqian Cui, Junyou Shi, Zili Wang |
Analog Circuit Test Point Selection Incorporating Discretization-Based Fuzzification and Extended Fault Dictionary to Handle Component Tolerances. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 32(6), pp. 661-679, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
14 | Mohammed Ashfaq Shukoor, Vishwani D. Agrawal |
Diagnostic Test Set Minimization and Full-Response Fault Dictionary. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 28(2), pp. 177-187, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
14 | Wojciech Toczek, Zbigniew Czaja |
Diagnosis of fully differential circuits based on a fault dictionary implemented in the microcontroller systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Microelectron. Reliab. ![In: Microelectron. Reliab. 51(8), pp. 1413-1421, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
14 | Chenglin Yang, Shulin Tian, Bing Long, Fang Chen |
A Novel Test Point Selection Method for Analog Fault Dictionary Techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 26(5), pp. 523-534, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
14 | Chenglin Yang, Shulin Tian, Bing Long |
Application of Heuristic Graph Search to Test-Point Selection for Analog Fault Dictionary Techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Instrum. Meas. ![In: IEEE Trans. Instrum. Meas. 58(7), pp. 2145-2158, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
14 | Chenglin Yang, Shulin Tian, Bing Long |
Test Points Selection for Analog Fault Dictionary Techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 25(2-3), pp. 157-168, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
14 | Jun Pi, Jiaquan Lin, Xiangjiang Li |
Self-Organizing Map-Based Fault Dictionary Application Research on Rolling Bearing Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICNC (3) ![In: Fourth International Conference on Natural Computation, ICNC 2008, Jinan, Shandong, China, 18-20 October 2008, Volume 3, pp. 311-315, 2008, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
14 | Ruifeng Guo, Yu Huang 0005, Wu-Tung Cheng |
Fault Dictionary Based Scan Chain Failure Diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ATS ![In: 16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007, pp. 45-52, 2007, IEEE, 0-7695-2890-2. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
14 | Andrzej Pulka |
A Heuristic Fault Dictionary Reduction Methodology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICECS ![In: 14th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2007, Marrakech, Morocco, December 11-14, 2007, pp. 1115-1118, 2007, IEEE, 978-1-4244-1377-5. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
14 | Janusz A. Starzyk, Dong Liu, Zhi-Hong Liu, Dale E. Nelson, Jerzy Rutkowski |
Entropy-based optimum test points selection for analog fault dictionary techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Instrum. Meas. ![In: IEEE Trans. Instrum. Meas. 53(3), pp. 754-761, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
14 | Minfang Peng, Yigang He, Tiejun Cao, Jingxiang Lv |
A New Fault Dictionary Method for Diagnosis of Tolerance Circuit. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CCCT (1) ![In: Proceedings of the 2nd International Conference Computing, Communications and Control Technologies, CCCT 2004, Austin, TX, USA, August 14-17, 2004, Volume 1., pp. 378-382, 2004, The International Institute of Informatics and Systemics (IIIS). The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP BibTeX RDF |
|
14 | Carles Pous |
Case based reasoning as an extension of fault dictionary methods for linear electronic analog circuits diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
|
2004 |
RDF |
|
14 | Baris Arslan, Alex Orailoglu |
Fault Dictionary Size Reduction through Test Response Superposition. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCD ![In: 20th International Conference on Computer Design (ICCD 2002), VLSI in Computers and Processors, 16-18 September 2002, Freiburg, Germany, Proceedings, pp. 480-, 2002, IEEE Computer Society, 0-7695-1700-5. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
14 | Jerzy Rutkowski, Jan Machniewski |
Integer-code DC fault dictionary. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS ![In: IEEE International Symposium on Circuits and Systems, ISCAS 2000, Emerging Technologies for the 21st Century, Geneva, Switzerland, 28-31 May 2000, Proceedings, pp. 713-716, 2000, IEEE. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
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14 | Jerzy Rutkowski |
A Two-Stage Neural Network DC Fault Dictionary. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS ![In: 1994 IEEE International Symposium on Circuits and Systems, ISCAS 1994, London, England, UK, May 30 - June 2, 1994, pp. 299-302, 1994, IEEE, 0-7803-1916-8. The full citation details ...](Pics/full.jpeg) |
1994 |
DBLP DOI BibTeX RDF |
|
14 | Paul G. Ryan, W. Kent Fuchs, Irith Pomeranz |
Fault dictionary compression and equivalence class computation for sequential circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCAD ![In: Proceedings of the 1993 IEEE/ACM International Conference on Computer-Aided Design, 1993, Santa Clara, California, USA, November 7-11, 1993, pp. 508-511, 1993, IEEE Computer Society / ACM, 0-8186-4490-7. The full citation details ...](Pics/full.jpeg) |
1993 |
DBLP DOI BibTeX RDF |
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14 | Hidetoshi Tanaka, Masato Kawai, Izumi Sugasaki, Tadanobu Hakuba |
System Level Fault Dictionary Generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988, pp. 884-887, 1988, IEEE Computer Society, 0-8186-0870-6. The full citation details ...](Pics/full.jpeg) |
1988 |
DBLP DOI BibTeX RDF |
|
14 | Vin Ratford, Paul Keating |
Integrating Guided Probe and Fault Dictionary: An Enhanced Diagnostic Approach. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986, pp. 304-311, 1986, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1986 |
DBLP BibTeX RDF |
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14 | Jeremy Richman, Kenneth R. Bowden |
The Modern Fault Dictionary. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985, pp. 696-702, 1985, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1985 |
DBLP BibTeX RDF |
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12 | Biplab K. Sikdar, Niloy Ganguly, Parimal Pal Chaudhuri |
Fault diagnosis of VLSI circuits with cellular automata based pattern classifier. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(7), pp. 1115-1131, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Janusz A. Starzyk, Dong Liu |
Locating stuck faults in analog circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISCAS (3) ![In: Proceedings of the 2002 International Symposium on Circuits and Systems, ISCAS 2002, Scottsdale, Arizona, USA, May 26-29, 2002, pp. 153-156, 2002, IEEE, 0-7803-7448-7. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
12 | Shi-Yu Huang |
Towards the logic defect diagnosis for partial-scan designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASP-DAC ![In: Proceedings of ASP-DAC 2001, Asia and South Pacific Design Automation Conference 2001, January 30-February 2, 2001, Yokohama, Japan, pp. 313-318, 2001, ACM, 0-7803-6634-4. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
12 | John W. Sheppard, William R. Simpson |
Improving the accuracy of diagnostics provided by fault dictionaries. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 14th IEEE VLSI Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, USA, pp. 180-185, 1996, IEEE Computer Society, 0-8186-7304-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
diagnostics accuracy improvement, digital circuit diagnosis, information flow model, VLSI, fault diagnosis, logic testing, integrated circuit testing, automatic testing, circuit analysis computing, digital integrated circuits, fault dictionaries, nearest neighbor classification |
9 | Kranthi K. Pinjala, Bruce C. Kim |
An Approach for Selection of Test Points for Analog Fault Diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings, pp. 287-294, 2003, IEEE Computer Society, 0-7695-2042-1. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
9 | Chintan Patel, Jim Plusquellic |
A Process and Technology-Tolerant IDDQ Method for IC Diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA, pp. 145-152, 2001, IEEE Computer Society, 0-7695-1122-8. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
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9 | Debesh Kumar Das, Susanta Chakraborty, Bhargab B. Bhattacharya |
New BIST Techniques for Universal and Robust Testing of CMOS Stuck-Open Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 10th International Conference on VLSI Design (VLSI Design 1997), 4-7 January 1997, Hyderabad, India, pp. 303-309, 1997, IEEE Computer Society, 0-8186-7755-4. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
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