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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 98 occurrences of 61 keywords
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Results
Found 69 publication records. Showing 69 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
113 | Sunghoon Chun, Sangwook Kim, Hong-Sik Kim, Sungho Kang 0001 |
An Efficient Dictionary Organization for Maximum Diagnosis. |
J. Electron. Test. |
2006 |
DBLP DOI BibTeX RDF |
static diagnosis, dynamic diagnosis, lossless compression, fault dictionary |
106 | Irith Pomeranz, Sudhakar M. Reddy |
A Same/Different Fault Dictionary: An Extended Pass/Fail Fault Dictionary with Improved Diagnostic Resolution. |
DATE |
2008 |
DBLP DOI BibTeX RDF |
|
80 | Vamsi Boppana, Ismed Hartanto, W. Kent Fuchs |
Full fault dictionary storage based on labeled tree encoding. |
VTS |
1996 |
DBLP DOI BibTeX RDF |
digital storage, full fault dictionary storage, labeled tree encoding, fault dictionary compaction, binary string code, implicit storage, VLSI, fault diagnosis, logic testing, integrated circuit testing, encoding, automatic testing, circuit analysis computing, fault trees |
59 | Yu-Ru Hong, Juinn-Dar Huang |
Reducing fault dictionary size for million-gate large circuits. |
ACM Trans. Design Autom. Electr. Syst. |
2009 |
DBLP DOI BibTeX RDF |
fault diagnosis, Fault dictionary, diagnostic resolution |
59 | Zbigniew Kalbarczyk, Ravishankar K. Iyer, Gregory L. Ries, Jaqdish U. Patel, Myeong S. Lee, Yuxiao Xiao |
Hierarchical Simulation Approach to Accurate Fault Modeling for System Dependability Evaluation. |
IEEE Trans. Software Eng. |
1999 |
DBLP DOI BibTeX RDF |
Hierarchical simulation, accurate fault modeling, dependability evaluation, fault dictionaries |
59 | Sudip Chakrabarti, Abhijit Chatterjee |
Compact Fault Dictionary Construction for Efficient Isolation of Faults in Analog and Mixed-Signal Circuits. |
ARVLSI |
1999 |
DBLP DOI BibTeX RDF |
fault diagnosis, analog, Design automation, mixed-signal, fault isolation |
50 | Sreejit Chakravarty, Yiming Gong |
Voting model based diagnosis of bridging faults in combinational circuits. |
VLSI Design |
1995 |
DBLP DOI BibTeX RDF |
MOS logic circuits, voting model based diagnosis, fault list, stuck-at fault dictionary, fault dropping rules, time efficiency, fault diagnosis, logic testing, combinational circuits, combinational circuits, bridging faults, diagnosis algorithm, space efficiency, majority logic, compact data structure |
50 | José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski |
Testing a PWM circuit using functional fault models and compact test vectors for operational amplifiers. |
Asian Test Symposium |
2000 |
DBLP DOI BibTeX RDF |
PWM circuit, compact test vectors, analog VLSI technology, functional fault macromodels, compact test vector construction, open loop gain, CMMR, analog circuit simulation complexity, VLSI, integrated circuit testing, design for testability, automatic test pattern generation, fault modeling, fault simulation, fault simulation, operational amplifiers, operational amplifiers, test pattern, functional fault models, analogue circuits, fault dictionary, pulse width modulation, slew-rate |
46 | Yvan Maidon, Thomas Zimmer, André Ivanov |
An Analog Circuit Fault Characterization Methodology. |
J. Electron. Test. |
2005 |
DBLP DOI BibTeX RDF |
analog circuit testing, analog fault diagnosis, analog fault characterization |
46 | V. C. Prasad, N. Sarat Chandra Babu |
On minimal set of test nodes for fault dictionary of analog circuit fault diagnosis. |
J. Electron. Test. |
1995 |
DBLP DOI BibTeX RDF |
test nodes, analog circuits, fault dictionary |
44 | Carles Pous, Joan Colomer, Joaquím Meléndez |
Extending a Fault Dictionary Towards a Case Based Reasoning System for Linear Electronic Analog Circuits Diagnosis. |
ECCBR |
2004 |
DBLP DOI BibTeX RDF |
|
41 | Yu-Ru Hong, Juinn-Dar Huang |
Fault Dictionary Size Reduction for Million-Gate Large Circuits. |
ASP-DAC |
2007 |
DBLP DOI BibTeX RDF |
|
41 | Vamsi Boppana, W. Kent Fuchs |
Fault dictionary compaction by output sequence removal. |
ICCAD |
1994 |
DBLP DOI BibTeX RDF |
|
40 | Brian Chess, Tracy Larrabee |
Creating small fault dictionaries [logic circuit fault diagnosis]. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
1999 |
DBLP DOI BibTeX RDF |
|
39 | Irith Pomeranz |
On Pass/Fail Dictionaries for Scan Circuits . |
Asian Test Symposium |
2001 |
DBLP DOI BibTeX RDF |
|
39 | Terry Lee, Weitong Chuang, Ibrahim N. Hajj, W. Kent Fuchs |
Circuit-level dictionaries of CMOS bridging faults. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
1995 |
DBLP DOI BibTeX RDF |
|
37 | Dimitrios K. Konstantinou, Michael G. Dimopoulos, Dimitris K. Papakostas, Alkis A. Hatzopoulos, Alexios Spyronasios |
Testing an Emergency Luminaire Circuit Using a Fault Dictionary Approach. |
DDECS |
2008 |
DBLP DOI BibTeX RDF |
|
36 | Irith Pomeranz, Sudhakar M. Reddy |
On Dictionary-Based Fault Location in Digital Logic Circuits. |
IEEE Trans. Computers |
1997 |
DBLP DOI BibTeX RDF |
Compact fault dictionary, dynamic fault diagnosis, fault diagnosis, fault dictionary |
33 | Sukumar Nandi, Santanu Chattopadhyay, Parimal Pal Chaudhuri |
Programmable cellular automata based testbed for fault diagnosis in VLSI circuits. |
VLSI Design |
1996 |
DBLP DOI BibTeX RDF |
programmable cellular automata, polynomial algebraic tools, faulty signatures, multiple attractor, fault dictionary size, cascadable structure, VLSI, fault diagnosis, fault diagnosis, logic testing, partitions, cellular automata, integrated circuit testing, automatic testing, VLSI circuits, logic partitioning, signature analyzer |
31 | Salvador Mir, Marcelo Lubaszewski, Bernard Courtois |
Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets. |
J. Electron. Test. |
1996 |
DBLP DOI BibTeX RDF |
analog ATPG, fault diagnosis, fault-based testing, analog BIST |
29 | José Vicente Calvano, Antonio Carneiro de Mesquita Filho, Vladimir Castro Alves, Marcelo Lubaszewski |
Fault Models and Test Generation for OpAmp Circuits - The FFM. |
J. Electron. Test. |
2001 |
DBLP DOI BibTeX RDF |
test generation, fault model, analog test, operational amplifiers |
27 | Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan |
Low-cost diagnosis of defects in MCM substrate interconnections. |
VTS |
1996 |
DBLP DOI BibTeX RDF |
low-cost diagnosis, MCM substrate interconnections, substrate interconnect defects, defect location, defect size, fault diagnosis, integrated circuit testing, fault location, multichip modules, integrated circuit interconnections, fault-dictionary, substrates |
27 | Irith Pomeranz, Sudhakar M. Reddy |
Same/different fault dictionary: an extended pass/fail fault dictionary with improved diagnostic resolution. |
IET Comput. Digit. Tech. |
2009 |
DBLP DOI BibTeX RDF |
|
24 | Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda |
A Pattern Ordering Algorithm for Reducing the Size of Fault Dictionaries. |
VTS |
2006 |
DBLP DOI BibTeX RDF |
|
24 | Mohamed Azimane, Ananta K. Majhi |
New Test Methodology for Resistive Open Defect Detection in Memory Address Decoders. |
VTS |
2004 |
DBLP DOI BibTeX RDF |
|
24 | Paul G. Ryan, W. Kent Fuchs |
Dynamic fault dictionaries and two-stage fault isolation. |
IEEE Trans. Very Large Scale Integr. Syst. |
1998 |
DBLP DOI BibTeX RDF |
|
23 | Sudip Chakrabarti, Abhijit Chatterjee |
Fault modeling and fault sampling for isolating faults in analog and mixed-signal circuits. |
ISCAS (2) |
1999 |
DBLP DOI BibTeX RDF |
|
23 | Ronald W. Mehler, M. Ray Mercer |
Multi-Level Logic Minimization through Fault Dictionary Analysis. |
ICCD |
1999 |
DBLP DOI BibTeX RDF |
optimization, logic minimization |
21 | Yigang He, Yanghong Tan, Yichuang Sun |
A neural network approach for fault diagnosis of large-scale analogue circuits. |
ISCAS (1) |
2002 |
DBLP DOI BibTeX RDF |
|
21 | Yiming Gong, Sreejit Chakravarty |
Locating bridging faults using dynamically computed stuck-at fault dictionaries. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
1998 |
DBLP DOI BibTeX RDF |
|
20 | Fatih Kocan, Daniel G. Saab |
Dynamic Fault Diagnosis of Combinational and Sequential Circuits on Reconfigurable Hardware. |
J. Electron. Test. |
2007 |
DBLP DOI BibTeX RDF |
Dynamic fault diagnosis, FPGA, Emulation, Stuck-at faults, Circuits, Gate-level |
18 | Carles Pous, Joan Colomer, Joaquím Meléndez, Josep Lluís de la Rosa |
Case Base Management for Analog Circuits Diagnosis Improvement. |
ICCBR |
2003 |
DBLP DOI BibTeX RDF |
|
18 | Matthew Beckler, R. D. Shawn Blanton |
GPU-accelerated fault dictionary generation for the TRAX fault model. |
ITC-Asia |
2017 |
DBLP DOI BibTeX RDF |
|
18 | N. Sarat Chandra Babu, V. C. Prasad, S. P. Venu Madhava Rao, K. Lal Kishore |
Multi-Frequency Approach to Fault Dictionary of Linear Analog Fault Diagnosis. |
J. Circuits Syst. Comput. |
2008 |
DBLP DOI BibTeX RDF |
|
18 | J. Soares Augusto, C. F. Beltrá Almeida |
Fully automatic DC fault dictionary construction and test nodes selection for analogue fault diagnosis. |
ED&TC |
1995 |
DBLP DOI BibTeX RDF |
|
18 | Mohammed Ashfaq Shukoor, Vishwani D. Agrawal |
A Two Phase Approach for Minimal Diagnostic Test Set Generation. |
ETS |
2009 |
DBLP DOI BibTeX RDF |
generalized fault independence, Fault diagnosis, integer linear programming, fault dictionary, test minimization |
18 | Ozgur Sinanoglu, Alex Orailoglu |
Efficient RT-Level Fault Diagnosis. |
J. Comput. Sci. Technol. |
2005 |
DBLP DOI BibTeX RDF |
RT-level diagnosis, dictionary compaction, fault bit location tracing, fault diagnosis, fault simulation, fault dictionary |
18 | Manoj Sachdev |
A realistic defect oriented testability methodology for analog circuits. |
J. Electron. Test. |
1995 |
DBLP DOI BibTeX RDF |
inductive fault analysis, fault model, faults, defects, fault dictionary |
15 | Pradipta Maji, Parimal Pal Chaudhuri |
Fault Diagnosis of Electronic Circuits Using Cellular Automata Based Pattern Classifier. |
Soft Computing Applications in Industry |
2008 |
DBLP DOI BibTeX RDF |
|
15 | Alexandre Ney, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin |
A Design-for-Diagnosis Technique for SRAM Write Drivers. |
DATE |
2008 |
DBLP DOI BibTeX RDF |
|
15 | Alexandre Ney, Patrick Girard 0001, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin |
An SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage Sensing. |
VTS |
2008 |
DBLP DOI BibTeX RDF |
write driver, design-for-diagnosis, diagnosis, SRAM |
14 | Michele Basso, Giovanni Donati, Marco Mugnaini |
Smart Fault Dictionary for Active Magnetic Bearings Systems. |
MetroInd4.0&IoT |
2023 |
DBLP DOI BibTeX RDF |
|
14 | Sergey G. Mosin |
Entropy-based method of reducing the training set dimension at constructing a neuromorphic fault dictionary for analog and mixed-signal ICs. |
MECO |
2018 |
DBLP DOI BibTeX RDF |
|
14 | Yiqian Cui, Junyou Shi, Zili Wang |
Analog Circuit Test Point Selection Incorporating Discretization-Based Fuzzification and Extended Fault Dictionary to Handle Component Tolerances. |
J. Electron. Test. |
2016 |
DBLP DOI BibTeX RDF |
|
14 | Mohammed Ashfaq Shukoor, Vishwani D. Agrawal |
Diagnostic Test Set Minimization and Full-Response Fault Dictionary. |
J. Electron. Test. |
2012 |
DBLP DOI BibTeX RDF |
|
14 | Wojciech Toczek, Zbigniew Czaja |
Diagnosis of fully differential circuits based on a fault dictionary implemented in the microcontroller systems. |
Microelectron. Reliab. |
2011 |
DBLP DOI BibTeX RDF |
|
14 | Chenglin Yang, Shulin Tian, Bing Long, Fang Chen |
A Novel Test Point Selection Method for Analog Fault Dictionary Techniques. |
J. Electron. Test. |
2010 |
DBLP DOI BibTeX RDF |
|
14 | Chenglin Yang, Shulin Tian, Bing Long |
Application of Heuristic Graph Search to Test-Point Selection for Analog Fault Dictionary Techniques. |
IEEE Trans. Instrum. Meas. |
2009 |
DBLP DOI BibTeX RDF |
|
14 | Chenglin Yang, Shulin Tian, Bing Long |
Test Points Selection for Analog Fault Dictionary Techniques. |
J. Electron. Test. |
2009 |
DBLP DOI BibTeX RDF |
|
14 | Jun Pi, Jiaquan Lin, Xiangjiang Li |
Self-Organizing Map-Based Fault Dictionary Application Research on Rolling Bearing Faults. |
ICNC (3) |
2008 |
DBLP DOI BibTeX RDF |
|
14 | Ruifeng Guo, Yu Huang 0005, Wu-Tung Cheng |
Fault Dictionary Based Scan Chain Failure Diagnosis. |
ATS |
2007 |
DBLP DOI BibTeX RDF |
|
14 | Andrzej Pulka |
A Heuristic Fault Dictionary Reduction Methodology. |
ICECS |
2007 |
DBLP DOI BibTeX RDF |
|
14 | Janusz A. Starzyk, Dong Liu, Zhi-Hong Liu, Dale E. Nelson, Jerzy Rutkowski |
Entropy-based optimum test points selection for analog fault dictionary techniques. |
IEEE Trans. Instrum. Meas. |
2004 |
DBLP DOI BibTeX RDF |
|
14 | Minfang Peng, Yigang He, Tiejun Cao, Jingxiang Lv |
A New Fault Dictionary Method for Diagnosis of Tolerance Circuit. |
CCCT (1) |
2004 |
DBLP BibTeX RDF |
|
14 | Carles Pous |
Case based reasoning as an extension of fault dictionary methods for linear electronic analog circuits diagnosis. |
|
2004 |
RDF |
|
14 | Baris Arslan, Alex Orailoglu |
Fault Dictionary Size Reduction through Test Response Superposition. |
ICCD |
2002 |
DBLP DOI BibTeX RDF |
|
14 | Jerzy Rutkowski, Jan Machniewski |
Integer-code DC fault dictionary. |
ISCAS |
2000 |
DBLP DOI BibTeX RDF |
|
14 | Jerzy Rutkowski |
A Two-Stage Neural Network DC Fault Dictionary. |
ISCAS |
1994 |
DBLP DOI BibTeX RDF |
|
14 | Paul G. Ryan, W. Kent Fuchs, Irith Pomeranz |
Fault dictionary compression and equivalence class computation for sequential circuits. |
ICCAD |
1993 |
DBLP DOI BibTeX RDF |
|
14 | Hidetoshi Tanaka, Masato Kawai, Izumi Sugasaki, Tadanobu Hakuba |
System Level Fault Dictionary Generation. |
ITC |
1988 |
DBLP DOI BibTeX RDF |
|
14 | Vin Ratford, Paul Keating |
Integrating Guided Probe and Fault Dictionary: An Enhanced Diagnostic Approach. |
ITC |
1986 |
DBLP BibTeX RDF |
|
14 | Jeremy Richman, Kenneth R. Bowden |
The Modern Fault Dictionary. |
ITC |
1985 |
DBLP BibTeX RDF |
|
12 | Biplab K. Sikdar, Niloy Ganguly, Parimal Pal Chaudhuri |
Fault diagnosis of VLSI circuits with cellular automata based pattern classifier. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Janusz A. Starzyk, Dong Liu |
Locating stuck faults in analog circuits. |
ISCAS (3) |
2002 |
DBLP DOI BibTeX RDF |
|
12 | Shi-Yu Huang |
Towards the logic defect diagnosis for partial-scan designs. |
ASP-DAC |
2001 |
DBLP DOI BibTeX RDF |
|
12 | John W. Sheppard, William R. Simpson |
Improving the accuracy of diagnostics provided by fault dictionaries. |
VTS |
1996 |
DBLP DOI BibTeX RDF |
diagnostics accuracy improvement, digital circuit diagnosis, information flow model, VLSI, fault diagnosis, logic testing, integrated circuit testing, automatic testing, circuit analysis computing, digital integrated circuits, fault dictionaries, nearest neighbor classification |
9 | Kranthi K. Pinjala, Bruce C. Kim |
An Approach for Selection of Test Points for Analog Fault Diagnosis. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
9 | Chintan Patel, Jim Plusquellic |
A Process and Technology-Tolerant IDDQ Method for IC Diagnosis. |
VTS |
2001 |
DBLP DOI BibTeX RDF |
|
9 | Debesh Kumar Das, Susanta Chakraborty, Bhargab B. Bhattacharya |
New BIST Techniques for Universal and Robust Testing of CMOS Stuck-Open Faults. |
VLSI Design |
1997 |
DBLP DOI BibTeX RDF |
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