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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 103 occurrences of 69 keywords
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Results
Found 92 publication records. Showing 92 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
47 | Drew C. Ness, Christian J. Hescott, David J. Lilja |
Exploring subsets of standard cell libraries to exploit natural fault masking capabilities for reliable logic. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 17th ACM Great Lakes Symposium on VLSI 2007, Stresa, Lago Maggiore, Italy, March 11-13, 2007, pp. 208-211, 2007, ACM, 978-1-59593-605-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
fault-tolerance, reliability, fault masking |
46 | Kosuke Imamura, Robert B. Heckendorn, Terence Soule, James A. Foster |
N-Version Genetic Programming via Fault Masking. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EuroGP ![In: Genetic Programming, 5th European Conference, EuroGP 2002, Kinsale, Ireland, April 3-5, 2002, Proceedings, pp. 172-181, 2002, Springer, 3-540-43378-3. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
41 | Vilas Sridharan, David R. Kaeli |
Eliminating microarchitectural dependency from Architectural Vulnerability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
HPCA ![In: 15th International Conference on High-Performance Computer Architecture (HPCA-15 2009), 14-18 February 2009, Raleigh, North Carolina, USA, pp. 117-128, 2009, IEEE Computer Society, 978-1-4244-2932-5. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
38 | T. S. Ganesh, Viswanathan Subramanian, Arun K. Somani |
SEU Mitigation Techniques for Microprocessor Control Logic. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EDCC ![In: Sixth European Dependable Computing Conference, EDCC 2006, Coimbra, Portugal, 18-20 October 2006, pp. 77-86, 2006, IEEE Computer Society, 0-7695-2648-9. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
37 | A. J. KleinOsowski, Kevin KleinOsowski, Vijay Rangarajan, Priyadarshini Ranganath, David J. Lilja |
The Recursive NanoBox Processor Grid: A Reliable System Architecture for Unreliable Nanotechnology Devices. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DSN ![In: 2004 International Conference on Dependable Systems and Networks (DSN 2004), 28 June - 1 July 2004, Florence, Italy, Proceedings, pp. 167-176, 2004, IEEE Computer Society, 0-7695-2052-9. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
architecture, VLSI, fault-injection, nanotechnology, fault-masking |
36 | Masoud Zamani, Navid Farazmand, Mehdi Baradaran Tahoori |
Fault Masking and Diagnosis in Reversible Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ETS ![In: 16th European Test Symposium, ETS 2011, Trondheim, Norway, May 23-27, 2011, pp. 69-74, 2011, IEEE Computer Society, 978-0-7695-4433-5. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
Majority voter, Reversible logic, Fault masking |
35 | Lui Sha |
Using COTS Software in High Assurance Control Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
HASE ![In: 4th IEEE International Symposium on High-Assurance Systems Engineering (HASE '99), 17-19 November 1999, Washington, D.C, USA, Proceedings, pp. 118, 1999, IEEE Computer Society, 0-7695-0418-3. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
35 | Joseph L. A. Hughes |
Multiple fault detection using single fault test sets. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 7(1), pp. 100-108, 1988. The full citation details ...](Pics/full.jpeg) |
1988 |
DBLP DOI BibTeX RDF |
|
33 | Mohamed G. Gouda, Jorge Arturo Cobb, Chin-Tser Huang |
Fault Masking in Tri-redundant Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SSS ![In: Stabilization, Safety, and Security of Distributed Systems, 8th International Symposium, SSS 2006, Dallas, TX, USA, November 17-19, 2006, Proceedings, pp. 304-313, 2006, Springer, 978-3-540-49018-0. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
33 | Vincenzo De Florio, Geert Deconinck, Rudy Lauwereins |
The EFTOS Voting Farm: A Software Tool for Fault Masking in Message Passing Parallel Environments. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EUROMICRO ![In: 24th EUROMICRO '98 Conference, Engineering Systems and Software for the Next Decade, 25-27 August 1998, Vesteras, Sweden, pp. 10379-10386, 1998, IEEE Computer Society, 0-8186-8646-4. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
30 | Alessandro Bogliolo, Michele Favalli, Maurizio Damiani |
Enabling testability of fault-tolerant circuits by means of IDDQ-checkable voters. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 8(4), pp. 415-419, 2000. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
27 | Rui Gong, Kui Dai, Zhiying Wang 0003 |
Transient Fault Tolerance on Chip Multiprocessor Based on Dual and Triple Core Redundancy. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PRDC ![In: 14th IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2008, 15-17 December 2008, Taipei, Taiwan, pp. 273-280, 2008, IEEE Computer Society, 978-0-7695-3448-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
27 | Hayssam El-Razouk, Zine Abid |
A New Transistor-Redundant Voter for Defect-Tolerant Digital Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CCECE ![In: Proceedings of the Canadian Conference on Electrical and Computer Engineering, CCECE 2006, May 7-10, 2006, Ottawa Congress Centre, Ottawa, Canada, pp. 1078-1081, 2006, IEEE, 1-4244-0038-4. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
25 | Wenjing Rao, Alex Orailoglu |
Towards fault tolerant parallel prefix adders in nanoelectronic systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Design, Automation and Test in Europe, DATE 2008, Munich, Germany, March 10-14, 2008, pp. 360-365, 2008, ACM, 978-3-9810801-3-1. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
25 | Wenjing Rao, Alex Orailoglu, Ramesh Karri |
Fault Tolerant Approaches to Nanoelectronic Programmable Logic Arrays. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DSN ![In: The 37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2007, 25-28 June 2007, Edinburgh, UK, Proceedings, pp. 216-224, 2007, IEEE Computer Society, 0-7695-2855-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
25 | Luca Breveglieri, Israel Koren, Paolo Maistri |
Incorporating Error Detection and Online Reconfiguration into a Regular Architecture for the Advanced Encryption Standard. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA, pp. 72-80, 2005, IEEE Computer Society, 0-7695-2464-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
25 | Shu-Chin Wang, Kuo-Qin Yan |
Reaching Fault Diagnosis Agreement on Dual Link Failure Mode. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICPADS ![In: Seventh International Conference on Parallel and Distributed Systems, ICPADS 2000, Iwate, Japan, July 4-7, 2000, pp. 291-298, 2000, IEEE Computer Society, 0-7695-0568-6. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
Distributed System, Parallel Processing, Fault Diagnosis, Byzantine Agreement, Interactive Consistency |
24 | Jan Schat |
Calculating the fault coverage for dual neighboring faults using single stuck-at fault patterns. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DDECS ![In: Proceedings of the 11th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2008), Bratislava, Slovakia, April 16-18, 2008, pp. 235-240, 2008, IEEE Computer Society, 978-1-4244-2276-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
22 | Amir Zjajo, José Pineda de Gyvez, Guido Gronthoud |
Structural Fault Modeling and Fault Detection Through Neyman-Pearson Decision Criteria for Analog Integrated Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 22(4-6), pp. 399-409, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
structural fault modeling, analog fault modeling, Neyman-Pearson decision, fault detection, analog test, supply current monitoring |
22 | Joonsung Park, Hongjoong Shin, Jacob A. Abraham |
Parallel Loopback Test of Mixed-Signal Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA, pp. 309-316, 2008, IEEE Computer Society, 978-0-7695-3123-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Test Quality and Reliability, Loopback Test, Characterization, Mixed-signal Test, Parallel Test |
22 | Wenjing Rao, Alex Orailoglu, Ramesh Karri |
Interactive presentation: Logic level fault tolerance approaches targeting nanoelectronics PLAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 2007 Design, Automation and Test in Europe Conference and Exposition, DATE 2007, Nice, France, April 16-20, 2007, pp. 865-869, 2007, EDA Consortium, San Jose, CA, USA, 978-3-9810801-2-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
22 | Gero Mühl, Michael A. Jaeger, Klaus Herrmann 0001, Torben Weis, Andreas Ulbrich, Ludger Fiege |
Self-stabilizing Publish/Subscribe Systems: Algorithms and Evaluation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Euro-Par ![In: Euro-Par 2005, Parallel Processing, 11th International Euro-Par Conference, Lisbon, Portugal, August 30 - September 2, 2005, Proceedings, pp. 664-674, 2005, Springer, 3-540-28700-0. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
21 | Matthias Sand, Volkmar Sieh, Dietmar Fey |
Nano-technology aware investigations on fault-masking techniques in the presence of high fault probabilities. ![Search on Bibsonomy](Pics/bibsonomy.png) |
HPCS ![In: Proceedings of the 2010 International Conference on High Performance Computing & Simulation, HPCS 2010, June 28 - July 2, 2010, Caen, France, pp. 181-187, 2010, IEEE, 978-1-4244-6828-7. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
|
20 | William Heidergott |
SEU tolerant device, circuit and processor design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 42nd Design Automation Conference, DAC 2005, San Diego, CA, USA, June 13-17, 2005, pp. 5-10, 2005, ACM, 1-59593-058-2. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
error detection and correction coding, radiation effects, soft error rate, fault tolerant systems, single event upset, fault masking, temporal redundancy, modular redundancy, fault avoidance |
20 | John C. Ramirez, Rami G. Melhem |
Reducing Message Overhead in TMR Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICDCS ![In: Proceedings of the 19th International Conference on Distributed Computing Systems, Austin, TX, USA, May 31 - June 4, 1999, pp. 45-54, 1999, IEEE Computer Society, 0-7695-0222-9. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
reduced communication overhead, distributed systems, voting, triple modular redundancy, fault masking |
20 | Gholamreza Latif Shabgahi, Julian M. Bass, Stuart Bennett |
Simulation of a Component-Oriented Voter Library for Dependable Control Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EUROMICRO ![In: 24th EUROMICRO '98 Conference, Engineering Systems and Software for the Next Decade, 25-27 August 1998, Vesteras, Sweden, pp. 10372-10378, 1998, IEEE Computer Society, 0-8186-8646-4. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
Component-Oriented Model, Simulation, Fault-Tolerance, Voting, Fault-Masking |
20 | John C. Ramirez, Rami G. Melhem |
Computational Arrays with Flexible Redundancy. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 43(4), pp. 413-430, 1994. The full citation details ...](Pics/full.jpeg) |
1994 |
DBLP DOI BibTeX RDF |
flexible redundancy, computational arrays, processor/switch array, redundant arrays, Markov chain techniques, probability arguments, fault tolerant arrays, defect avoidance, parallel processing, fault tolerant computing, reconfiguration, redundancy, redundancy, embedding, logic design, fault detection, correction, fault masking, faulty processors, reconfiguration algorithms |
20 | Yoram Moses, Orli Waarts |
Coordinated Traversal: (t + 1)-Round Byzantine Agreement in Polynomial Time ![Search on Bibsonomy](Pics/bibsonomy.png) |
FOCS ![In: 29th Annual Symposium on Foundations of Computer Science, White Plains, New York, USA, 24-26 October 1988, pp. 246-255, 1988, IEEE Computer Society, 0-8186-0877-3. The full citation details ...](Pics/full.jpeg) |
1988 |
DBLP DOI BibTeX RDF |
coordinated traversal, arbitrarily malicious failures, protocol, polynomial time, Byzantine agreement, fault masking |
20 | Janusz Rajski, Jerzy Tyszer |
The Influence of Masking Phenomenon on Coverage Capability of Single Fault Test Sets in PLA's. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 35(1), pp. 81-85, 1986. The full citation details ...](Pics/full.jpeg) |
1986 |
DBLP DOI BibTeX RDF |
PLA testing, contact faults, fault coverage, fault masking, multiple fault detection, Combinatorial analysis |
20 | A. Sengupta, D. K. Chattopadhyay, A. Palit, A. K. Bandyopadhyay 0002, Arun K. Choudhury |
Realization of Fault-Tolerant Machines - Linear Code Application. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 30(3), pp. 237-240, 1981. The full citation details ...](Pics/full.jpeg) |
1981 |
DBLP DOI BibTeX RDF |
fault-tolerant machine, fault detection, Correction, linear code, fault masking |
20 | James E. Smith 0001 |
On Necessary and Sufficient Conditions for Multiple Fault Undetectability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 28(10), pp. 801-802, 1979. The full citation details ...](Pics/full.jpeg) |
1979 |
DBLP DOI BibTeX RDF |
multiple fault test sets, Fault detection, multiple faults, fault masking |
20 | Dwight H. Sawin III, Gary K. Maki |
Comments on "Fault-Tolerant Asynchronous Networks". ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 24(7), pp. 756-759, 1975. The full citation details ...](Pics/full.jpeg) |
1975 |
DBLP DOI BibTeX RDF |
Asynchronous sequential machine design, self-testable machines, reliability, fault detection, fault-tolerant design, fault masking |
20 | David T. Wang |
Properties of Faults and Criticalities of Values under Tests for Combinational Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 24(7), pp. 746-750, 1975. The full citation details ...](Pics/full.jpeg) |
1975 |
DBLP DOI BibTeX RDF |
Criticality of values under test, test generation, fault detection, fault location, fault masking, fault equivalence, fault dominance |
19 | Ashraf Armoush, Falk Salewski, Stefan Kowalewski |
A Hybrid Fault Tolerance Method for Recovery Block with a Weak Acceptance Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EUC (1) ![In: 2008 IEEE/IPIP International Conference on Embedded and Ubiquitous Computing (EUC 2008), Shanghai, China, December 17-20, 2008, Volume I, pp. 484-491, 2008, IEEE Computer Society, 978-0-7695-3492-3. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
19 | Shu-Ching Wang, Kuo-Qin Yan |
Revisiting fault diagnosis agreement in a new territory. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM SIGOPS Oper. Syst. Rev. ![In: ACM SIGOPS Oper. Syst. Rev. 38(2), pp. 41-61, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
fault tolerance, distributed system, fault diagnosis, consensus |
19 | Shu-Chin Wang, Kuo-Qin Yan, Chien-Fu Cheng |
Evidence-based MultiCasting Fault Diagnosis Agreement with Fallible Processors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICPP ![In: 32nd International Conference on Parallel Processing (ICPP 2003), 6-9 October 2003, Kaohsiung, Taiwan, pp. 69-, 2003, IEEE Computer Society, 0-7695-2017-0. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
19 | Jien-Chung Lo |
Analysis of a BICS-Only Concurrent Error Detection Method. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 51(3), pp. 241-253, 2002. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
unsafe probability, reliability, fault coverage, testability, concurrent error detection, built-in current sensors, operating speed |
16 | A. Lesiak, Piotr Gawkowski, Janusz Sosnowski |
Error Recovery Problems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DepCoS-RELCOMEX ![In: 2007 International Conference on Dependability of Computer Systems (DepCoS-RELCOMEX 2007), June 14-16, 2007, Szklarska Poreba, Poland, pp. 270-277, 2007, IEEE Computer Society, 0-7695-2850-3. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
16 | Luca Sterpone, Massimo Violante |
A New Reliability-Oriented Place and Route Algorithm for SRAM-Based FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 55(6), pp. 732-744, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
transient fault injection, FPGA, reliability, place and route |
16 | David Bernick, Bill Bruckert, Paul Del Vigna, David García, Robert Jardine, Jim Klecka, Jim Smullen |
NonStop® Advanced Architecture. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DSN ![In: 2005 International Conference on Dependable Systems and Networks (DSN 2005), 28 June - 1 July 2005, Yokohama, Japan, Proceedings, pp. 12-21, 2005, IEEE Computer Society, 0-7695-2282-3. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
16 | Andrew J. Greensted, Andy M. Tyrrell |
Implementation Results for a Fault-Tolerant Multicellular Architecture Inspired by Endocrine Communication. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Evolvable Hardware ![In: 2005 NASA / DoD Conference on Evolvable Hardware (EH 2005), 29 June - 1 July 2005, Washington, DC, USA, pp. 253-261, 2005, IEEE Computer Society, 0-7695-2399-4. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
16 | Stephen J. Spinks, Chris D. Chalk, Ian M. Bell, Mark Zwolinski |
Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 20(1), pp. 11-23, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
analog test generation, fault modeling, fault simulation, catastrophic faults, supply current monitoring |
16 | Vincenzo De Florio, Geert Deconinck, Rudy Lauwereins |
An Algorithm for Tolerating Crash Failures in Distributed Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ECBS ![In: 7th IEEE International Symposium on Engineering of Computer-Based Systems (ECBS 2000), 3-7 April 2000, Edinburgh, Scotland, UK, pp. 9-17, 2000, IEEE Computer Society, 0-7695-0604-6. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
Fault Tolerance, Distributed Systems, Distributed Algorithms, Software-Implemented Fault Tolerance |
16 | Dariusz Bojanowicz |
How Faults can be Simulated in Self-Testable VLSI Digital Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EUROMICRO ![In: 24th EUROMICRO '98 Conference, Engineering Systems and Software for the Next Decade, 25-27 August 1998, Vesteras, Sweden, pp. 10180-10183, 1998, IEEE Computer Society, 0-8186-8646-4. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
16 | Stephen J. Spinks, Chris D. Chalk, Ian M. Bell, Mark Zwolinski |
Generation and Verification of Tests for Analogue Circuits Subject to Process Parameter Deviations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 1997 Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT '97), 20-22 October 1997, Paris, France, pp. 100-109, 1997, IEEE Computer Society, 0-8186-8168-3. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
Analogue fault simulation, Supply current monitoring Test quality evaluation, Analogue circuit testing, Test pattern generation |
16 | Biswajit Bhowmik, Jatindra Kumar Deka, Santosh Biswas |
Selective Fault-Masking for Improving Yield and Performance of On-Chip Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SMC ![In: 2021 IEEE International Conference on Systems, Man, and Cybernetics, SMC 2021, Melbourne, Australia, October 17-20, 2021, pp. 3336-3341, 2021, IEEE, 978-1-6654-4207-7. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
|
16 | Alfredo Ibias, Manuel Núñez 0001 |
Estimating fault masking using squeeziness based on Rényi's entropy. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SAC ![In: SAC '20: The 35th ACM/SIGAPP Symposium on Applied Computing, online event, [Brno, Czech Republic], March 30 - April 3, 2020, pp. 1936-1943, 2020, ACM, 978-1-4503-6866-7. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
16 | Ingrid F. V. Oliveira, Rafael B. Schvittz, Paulo F. Butzen |
Fault masking ratio analysis of majority voters topologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
LATS ![In: 19th IEEE Latin-American Test Symposium, LATS 2018, Sao Paulo, Brazil, March 12-14, 2018, pp. 1-6, 2018, IEEE, 978-1-5386-1472-3. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
16 | Aromhack Saysanasongkham, Satoshi Fukumoto, Masayuki Arai |
Fault masking issue on a dependable processor using BIST under highly electromagnetic environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Comput. Sci. Eng. ![In: Int. J. Comput. Sci. Eng. 14(4), pp. 309-320, 2017. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
16 | György Györök, Bertalan Beszedes |
Duplicated control unit based embedded fault-masking systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SISY ![In: 15th IEEE International Symposium on Intelligent Systems and Informatics, SISY 2017, Subotica, Serbia, September 14-16, 2017, pp. 283-288, 2017, IEEE, 978-1-5386-3855-2. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
16 | Rajdeep Kumar Nath, Bibhash Sen, Rachit Daga, Nilesh Chakraborty, Harsh Tibrewal, Biplab K. Sikdar |
Fault masking in Quantum-dot cellular automata using prohibitive logic circuit. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VDAT ![In: 19th International Symposium on VLSI Design and Test, VDAT 2015, Ahmedabad, India, June 26-29, 2015, pp. 1-5, 2015, IEEE Computer Society, 978-1-4799-1743-3. The full citation details ...](Pics/full.jpeg) |
2015 |
DBLP DOI BibTeX RDF |
|
16 | Vincenzo De Florio, Geert Deconinck, Rudy Lauwereins |
The EFTOS Voting Farm: A Software Tool for Fault Masking in Message Passing Parallel Environments. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1401.2920, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP BibTeX RDF |
|
16 | Vincenzo De Florio, Geert Deconinck, Rudy Lauwereins |
Software Tool Combining Fault Masking with User-Defined Recovery Strategies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/1401.2974, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP BibTeX RDF |
|
16 | Koray Gülcü, Hasan Sözer, Baris Aktemur, Ali Özer Ercan |
Fault masking as a service. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Softw. Pract. Exp. ![In: Softw. Pract. Exp. 44(7), pp. 835-854, 2014. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
16 | Iuri A. C. Gomes, Mayler G. A. Martins, Fernanda Lima Kastensmidt, André Inácio Reis, Renato P. Ribas, Sylvain P. Novales |
Methodology for achieving best trade-off of area and fault masking coverage in ATMR. ![Search on Bibsonomy](Pics/bibsonomy.png) |
LATW ![In: 15th Latin American Test Workshop - LATW 2014, Fortaleza, Brazil, March 12-15, 2014, pp. 1-6, 2014, IEEE. The full citation details ...](Pics/full.jpeg) |
2014 |
DBLP DOI BibTeX RDF |
|
16 | David Clark 0001, Robert M. Hierons |
Squeeziness: An information theoretic measure for avoiding fault masking. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Inf. Process. Lett. ![In: Inf. Process. Lett. 112(8-9), pp. 335-340, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
16 | Kostas Siozios, Dimitrios Soudris |
Trading Fault-Masking with Performance Overhead for FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ARCS Workshops ![In: ARCS 2011 - 24th International Conference on Architecture of Computing Systems 2011, Workshop Proceedings, February 22-23, 2011, Como, Italy., 2011, VDE-Verlag, 978-3-8007-3333-0. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP BibTeX RDF |
|
16 | Sergei Skorobogatov |
Optical Fault Masking Attacks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FDTC ![In: 2010 Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC 2010, Santa Barbara, California, USA, 21 August 2010, pp. 23-29, 2010, IEEE Computer Society, 978-0-7695-4169-3. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
optical fault attacks, semi-invasive methods, write protection, tamper resistance, hardware security |
16 | Yu Wang 0012, M. Ümit Uyar, Samrat S. Batth, Mariusz A. Fecko |
Fault masking by multiple timing faults in timed EFSM models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Comput. Networks ![In: Comput. Networks 53(5), pp. 596-612, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
16 | Baris Baykant Alagöz |
Fault Masking By Probabilistic Voting ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/0901.1181, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP BibTeX RDF |
|
16 | Bernhard Fechner |
Fault-Masking Capabilities of Basic Circuit Structures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DepCoS-RELCOMEX ![In: Fourth International Conference on Dependability of Computer Systems, DepCos-RELCOMEX '09, Brunow, Poland, June 30 - July 2, 2009, pp. 245-253, 2009, IEEE Computer Society, 978-0-7695-3674-3. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
16 | Baris Baykant Alagöz |
Adaptive Fault Masking With Incoherence Scoring ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/0811.3816, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP BibTeX RDF |
|
16 | Gholamreza Latif Shabgahi, Julian M. Bass, Stuart Bennett |
Integrating selected fault masking and self-diagnosis mechanisms. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PDP ![In: Proceedings of the Seventh Euromicro Workshop on Parallel and Distributed Processing. PDP'99, University of Madeira, Funchal, Portugal, February 3-5, 1999, pp. 97-104, 1999, IEEE Computer Society, 0-7695-0059-5. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
16 | Geert Deconinck, Vincenzo De Florio, Rudy Lauwereins |
Software tool combining fault masking with user-defined recovery strategies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEE Proc. Softw. ![In: IEE Proc. Softw. 145(6), pp. 203-211, 1998. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
16 | Manga J. P. Bekambo, Johan Vounckx, Geert Deconinck, R. Cuyvers, Rudy Lauwereins, J. A. Peperstraete |
Kernel services approach to fault-masking in real-time applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
RTS ![In: 7th Euromicro Workshop on Real-Time Systems, EUROMICRO-RTS'95, Odense, Denmark, March 14-16, 1995, pp. 336-343, 1995, IEEE Computer Society, 0-8186-7112-2. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
|
16 | Jien-Chung Lo |
Single fault masking logic designs with error correcting codes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 1995 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 1995, Lafayette, LA, USA, November 13-15, 1995, pp. 296-, 1995, IEEE Computer Society, 0-8186-7107-6. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
|
16 | John M. Rushby |
Formal Specification and Verification of a Fault-Masking and Transient-Recovery Model for Digital Flight-Control Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FTRTFT ![In: Formal Techniques in Real-Time and Fault-Tolerant Systems, Second International Symposium, Nijmegen, The Netherlands, January 8-10, 1992, Proceedings, pp. 237-257, 1992, Springer, 3-540-55092-5. The full citation details ...](Pics/full.jpeg) |
1992 |
DBLP DOI BibTeX RDF |
|
16 | Jürgen Doenhardt |
Fault Masking Probabilities with Single and Multiple Signature Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
STACS ![In: STACS 89, 6th Annual Symposium on Theoretical Aspects of Computer Science, Paderborn, FRG, February 16-18, 1989, Proceedings, pp. 327-338, 1989, Springer, 3-540-50840-6. The full citation details ...](Pics/full.jpeg) |
1989 |
DBLP DOI BibTeX RDF |
|
16 | Klaus Echtle |
Fault Masking and Sequence Agreement by a Voting Protocol with low Message Number. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SRDS ![In: Sixth Symposium on Reliability in Distributed Software and Database Systems, Kingsmill-Williamsburg, VA, USA, March 17-19, 1987, Proceedings, pp. 149-160, 1987, IEEE Computer Society, 0-8186-0737-8. The full citation details ...](Pics/full.jpeg) |
1987 |
DBLP BibTeX RDF |
|
16 | Thomas F. Schwab, Stephen S. Yau |
An Algebraic Model of Fault-Masking Logic Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 32(9), pp. 809-825, 1983. The full citation details ...](Pics/full.jpeg) |
1983 |
DBLP DOI BibTeX RDF |
|
16 | Francisco J. O. Dias |
Fault Masking in Combinational Logic Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 24(5), pp. 476-482, 1975. The full citation details ...](Pics/full.jpeg) |
1975 |
DBLP DOI BibTeX RDF |
|
16 | Marion Dunning, Bernard Kolman |
Reliability and fault-masking in n-variable NOR trees ![Search on Bibsonomy](Pics/bibsonomy.png) |
SWCT ![In: 6th Annual Symposium on Switching Circuit Theory and Logical Design, Ann Arbor, Michigan, USA, October 6-8, 1965, pp. 126-142, 1965, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1965 |
DBLP DOI BibTeX RDF |
|
14 | Lee Pike, Jeffrey Maddalon, Paul S. Miner, Alfons Geser |
Abstractions for Fault-Tolerant Distributed System Verification. ![Search on Bibsonomy](Pics/bibsonomy.png) |
TPHOLs ![In: Theorem Proving in Higher Order Logics, 17th International Conference, TPHOLs 2004, Park City, Utah, USA, September 14-17, 2004, Proceedings, pp. 257-270, 2004, Springer, 3-540-23017-3. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
14 | Guido Bertoni, Luca Breveglieri, Israel Koren, Paolo Maistri, Vincenzo Piuri |
On the Propagation of Faults and Their Detection in a Hardware Implementation of the Advanced Encryption Standard. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASAP ![In: 13th IEEE International Conference on Application-Specific Systems, Architectures, and Processors (ASAP 2002), 17-19 July 2002, San Jose, CA, USA, pp. 303-, 2002, IEEE Computer Society, 0-7695-1712-9. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
14 | Paulo T. de Sousa, Francis P. Mathur |
Modular redundancy without voters decreases complexity of restoring organ. ![Search on Bibsonomy](Pics/bibsonomy.png) |
AFIPS National Computer Conference ![In: American Federation of Information Processing Societies: 1977 National Computer Conference, June 13-16, 1977, Dallas, Texas, USA, pp. 801-806, 1977, AFIPS Press, 978-1-4503-7914-4. The full citation details ...](Pics/full.jpeg) |
1977 |
DBLP DOI BibTeX RDF |
|
11 | Xiaojun Ma, Jing Huang 0001, Cecilia Metra, Fabrizio Lombardi |
Detecting Multiple Faults in One-Dimensional Arrays of Reversible QCA Gates. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 25(1), pp. 39-54, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
Array testing, Nanotechnology, Emerging technology, Reversible computing, QCA |
11 | Sylvie Delaët, Shlomi Dolev, Olivier Peres |
Safe and Eventually Safe: Comparing Self-stabilizing and Non-stabilizing Algorithms on a Common Ground. ![Search on Bibsonomy](Pics/bibsonomy.png) |
OPODIS ![In: Principles of Distributed Systems, 13th International Conference, OPODIS 2009, Nîmes, France, December 15-18, 2009. Proceedings, pp. 315-329, 2009, Springer, 978-3-642-10876-1. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
safety, self-stabilization |
11 | Foad Dabiri, Ani Nahapetian, Tammara Massey, Miodrag Potkonjak, Majid Sarrafzadeh |
General Methodology for Soft-Error-Aware Power Optimization Using Gate Sizing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(10), pp. 1788-1797, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
11 | Foad Dabiri, Ani Nahapetian, Miodrag Potkonjak, Majid Sarrafzadeh |
Soft Error-Aware Power Optimization Using Gate Sizing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PATMOS ![In: Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation, 17th International Workshop, PATMOS 2007, Gothenburg, Sweden, September 3-5, 2007, Proceedings, pp. 255-267, 2007, Springer, 978-3-540-74441-2. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
11 | Kenneth J. Mackin, Takashi Yamaguchi, Eiji Nunohiro, Jong Geol Park, Keitarou Hara, Kotaro Matsushita, Masanori Ohshiro, Kazuko Yamasaki |
Ensemble of artificial neural network based land cover classifiers using satellite data. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SMC ![In: Proceedings of the IEEE International Conference on Systems, Man and Cybernetics, Montréal, Canada, 7-10 October 2007, pp. 1653-1657, 2007, IEEE, 978-1-4244-0990-7. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
11 | Francesco Regazzoni 0001, Thomas Eisenbarth 0001, Johann Großschädl, Luca Breveglieri, Paolo Ienne, Israel Koren, Christof Paar |
Power Attacks Resistance of Cryptographic S-Boxes with Added Error Detection Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy., pp. 508-516, 2007, IEEE Computer Society, 0-7695-2885-6. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
11 | Byoungho Kim, Zhenhai Fu, Jacob A. Abraham |
Transformer-Coupled Loopback Test for Differential Mixed-Signal Specifications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA, pp. 291-296, 2007, IEEE Computer Society, 0-7695-2812-0. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
11 | Kenneth J. Mackin, Eiji Nunohiro, Masanori Ohshiro, Kazuko Yamasaki |
Land Cover Classification from MODIS Satellite Data Using Probabilistically Optimal Ensemble of Artificial Neural Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
KES (3) ![In: Knowledge-Based Intelligent Information and Engineering Systems, 10th International Conference, KES 2006, Bournemouth, UK, October 9-11, 2006, Proceedings, Part III, pp. 820-826, 2006, Springer, 3-540-46542-1. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
11 | Hongjoong Shin, Byoungho Kim, Jacob A. Abraham |
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA, pp. 412-419, 2006, IEEE Computer Society, 0-7695-2514-8. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
11 | Nigamanth Sridhar, Jason O. Hallstrom |
A Behavioral Model for Software Containers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FASE ![In: Fundamental Approaches to Software Engineering, 9th International Conference, FASE 2006, Held as Part of the Joint European Conferences on Theory and Practice of Software, ETAPS 2006, Vienna, Austria, March 27-28, 2006, Proceedings, pp. 139-154, 2006, Springer, 3-540-33093-3. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
11 | Baosheng Wang, Yuejian Wu, André Ivanov |
A Fast Diagnosis Scheme for Distributed Small Embedded SRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: 2005 Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany, pp. 852-857, 2005, IEEE Computer Society, 0-7695-2288-2. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
11 | Daisuke Yamaguchi, Kenneth J. Mackin, Eiichiro Tazaki |
Waste Incinerator Emission Prediction Using Probabilistically Optimal Ensemble of Multi-agents. ![Search on Bibsonomy](Pics/bibsonomy.png) |
KES (3) ![In: Knowledge-Based Intelligent Information and Engineering Systems, 9th International Conference, KES 2005, Melbourne, Australia, September 14-16, 2005, Proceedings, Part III, pp. 526-532, 2005, Springer, 3-540-28896-1. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
11 | Whitney J. Townsend, Jacob A. Abraham, Earl E. Swartzlander Jr. |
Quadruple Time Redundancy Adders. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings, pp. 250-256, 2003, IEEE Computer Society, 0-7695-2042-1. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
11 | Der-Cheng Huang, Wen-Ben Jone |
A parallel built-in self-diagnostic method for embedded memoryarrays. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(4), pp. 449-465, 2002. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
11 | Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das |
A Parallel Built-In Self-Diagnostic Method For Embedded Memory Buffers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 14th International Conference on VLSI Design (VLSI Design 2001), 3-7 January 2001, Bangalore, India, pp. 397-402, 2001, IEEE Computer Society, 0-7695-0831-6. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
11 | Kanad Chakraborty, Pinaki Mazumder |
An efficient, bus-layout based method for early diagnosis of bussed driver shorts in printed circuit boards. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCAD ![In: Proceedings of the 1996 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 1996, San Jose, CA, USA, November 10-14, 1996, pp. 685-688, 1996, IEEE Computer Society / ACM, 0-8186-7597-7. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
bus-layout, bussed driver shorts, early diagnosis, field survivability, interconnect shorts, production yield, printed circuit boards, printed circuit testing |
11 | Henry Y. H. Chuang, Santanu Das |
An approach to the design of highly reliable and fail-safe digital systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
AFIPS National Computer Conference ![In: American Federation of Information Processing Societies: 1974 National Computer Conference, 6-10 May 1974, Chicago, Illinois, USA, pp. 637-642, 1974, AFIPS Press, 978-1-4503-7920-5. The full citation details ...](Pics/full.jpeg) |
1974 |
DBLP DOI BibTeX RDF |
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