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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 452 occurrences of 271 keywords
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Results
Found 1308 publication records. Showing 1308 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
17 | Vijay Kumar Sharma |
Parity generators in QCA nanotechnology for nanocommunication systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Nano Commun. Networks ![In: Nano Commun. Networks 36, pp. 100440, June 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Andreas Pfützner, Barbora Tencer, Boris Stamm, Mandar Mehta, Preeti Sharma, Rustam Gilyazev, Hendrick Jensch, Nicole Thomé, Michael Huth 0002 |
Miniaturization of an Osmotic Pressure-Based Glucose Sensor for Continuous Intraperitoneal and Subcutaneous Glucose Monitoring by Means of Nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sensors ![In: Sensors 23(9), pp. 4541, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Francisco J. Tovar-Lopez |
Recent Progress in Micro- and Nanotechnology-Enabled Sensors for Biomedical and Environmental Challenges. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sensors ![In: Sensors 23(12), pp. 5406, 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Elisabetta Poeta, Aris Liboà, Simone Mistrali, Estefanía Núñez-Carmona, Veronica Sberveglieri |
Nanotechnology and E-Sensing for Food Chain Quality and Safety. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Sensors ![In: Sensors 23(20), pp. 8429, October 2023. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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17 | Salama Alhameli, Amna Almazrouei, Amal Almenhali, Ahmed Shuhaiber |
Towards an Infrastructure and Architecture of Nanotechnology in Agriculture for Abu Dhabi. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SmartNets ![In: International Conference on Smart Applications, Communications and Networking, SmartNets 2023, Istanbul, Turkey, July 25-27, 2023, pp. 1-7, 2023, IEEE, 979-8-3503-0252-3. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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17 | Konstantinos Kalovrektis, Ioannis Dimos, Apostolos Xanakis, Athanasios Kakarountas |
Nanotechnology as a Tool for Computational Thinking Skills using Open Hardware, Embedded Systems and Repository Platform, in Industry 4.0 Era. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SEEDA-CECNSM ![In: 8th South-East Europe Design Automation, Computer Engineering, Computer Networks and Social Media Conference, SEEDA-CECNSM 2023, Piraeus, Greece, November 10-12, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-8367-6. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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17 | Luca Cassano, Mihalis Psarakis, Marcello Traiola, Alberto Bosio (eds.) |
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023 ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![IEEE, 979-8-3503-1500-4 The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Momona Mizota, Toshinori Hosokawa, Masayoshi Yoshimura, Masayuki Arai |
A Block Partitioning Method for Region Exhaustive Test to Reduce the Number of Test Patterns and Improve Gate Exhaustive Fault Coverage. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Tobias Kilian, Abhishek Sengupta, Daniel Tille, Martin Huch, Ulf Schlichtmann |
An efficient High-Volume Production Performance Screening using On-Chip Ring Oscillators. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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17 | Govind Rajhans Jadhav, Sonali Shukla, Virendra Singh |
On Attacking Scan-based Logic Locking Schemes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-4, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
17 | S. Bouat, Stéphanie Anceau, Laurent Maingault, Jessy Clédière, Luc Salvo, Rémi Tucoulou |
X ray nanoprobe for fault attacks and circuit edits on 28-nm integrated circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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17 | Christos Georgakidis, Dimitris Valiantzas, Stavros Simoglou, Iordanis Lilitsis, Nikolaos Chatzivangelis, Ilias Golfos, Marko S. Andjelkovic, Christos P. Sotiriou, Milos Krstic |
Towards a Comprehensive SET Analysis Flow for VLSI Circuits using Static Timing Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Zahin Ibnat, Hadi Mardani Kamali, Farimah Farahmandi |
Iterative Mitigation of Insecure Resource Sharing Produced by High-level Synthesis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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17 | Shruti Dutta, Sai Charan Rachamadugu Chinni, Abhishek Das, Nur A. Touba |
Highly Efficient Layered Syndrome-based Double Error Correction Utilizing Current Summing in RRAM Cells to Simplify Decoder. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-4, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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17 | Yudai Toyooka, Haruki Watanabe, Toshinori Hosokawa, Masayoshi Yoshimura |
An Evaluation of Estimated Field Random Testability for Data Paths at Register Transfer Level Using Status Signal Sequences Based on k-Consecutive State Transitions for Field Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Toshinori Hosokawa, Kyohei Iizuka, Masayoshi Yoshimura |
An Evaluation of a Testability Measure for State Assignment to Estimate Transition Fault Coverage for Controllers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Krishnendu Guha, Gouriprasad Bhattacharyya |
A Self Aware Security Approach for Real Time Neural Network Applications from Row Hammer Attacks in Multi FPGA Multi User Environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-4, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Payam Habiby, Sebastian Huhn 0001, Rolf Drechsler |
RC-IJTAG: A Methodology for Designing Remotely-Controlled IEEE 1687 Scan Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Amalia-Artemis Koufopoulou, Athanasios Papadimitriou, Aggelos Pikrakis, Mihalis Psarakis, David Hély |
On the Prediction of Hardware Security Properties of HLS Designs Using Graph Neural Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Kevin Böhmer, Bruno Forlin, Carlo Cazzaniga, Paolo Rech, Gianluca Furano, Nikolaos Alachiotis 0001, Marco Ottavi |
Neutron Radiation Tests of the NEORV32 RISC-V SoC on Flash-Based FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Francisco Fuentes, Sergi Alcaide, Raimon Casanova, Jaume Abella 0001 |
Black-Box IP Validation with the SafeTI Traffic Injector: A Success Story. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-4, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Yu Xie, Wen-Yue Yu, Ning Zhang, He Chen, Yizhuang Xie |
Partial Triple Modular Redundancy Method for Fault-Tolerant Circuit based on HITS Algorithm. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-4, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Senling Wang, Shaoqi Wei, Jun Ma, Hiroshi Kai, Yoshinobu Higami, Hiroshi Takahashi, Akihiro Shimizu, Xiaoqing Wen, Tianming Ni |
SASL-JTAG: A Light-Weight Dependable JTAG. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-3, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Alexandra Takou, Pavlos Stoikos, Moysis Moysis, George Floros 0002, Nestoras E. Evmorfopoulos, Georgios I. Stamoulis |
An Efficient Security Closure Methodology for EM-based Attacks on Power Grid Structures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-4, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Carolina Imianosky, Douglas A. dos Santos, Douglas R. Melo, Felipe Viel, Luigi Dilillo |
Implementation and Reliability Evaluation of a RISC-V Vector Extension Unit. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Yu-Guang Chen, Ying-Jing Tsai |
Reliability of Computing-In-Memories: Threats, Detection Methods, and Mitigation Approaches. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Cristiana Bolchini, Luca Cassano, Antonio Miele, Alessandro Nazzari, Dario Passarello |
Analyzing the Reliability of Alternative Convolution Implementations for Deep Learning Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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17 | Riccardo Cantoro, Sandro Sartoni, Matteo Sonza Reorda, Lorena Anghel, Michele Portolan |
Evaluating the Impact of Aging on Path-Delay Self-Test Libraries. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-7, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Victor M. van Santen, Florian Klemme, Paul R. Genssler, Hussam Amrouch |
Challenges in Machine Learning Techniques to Estimate Reliability from Transistors to Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Douglas A. dos Santos, André Martins Pio de Mattos, Douglas R. Melo, Luigi Dilillo |
Characterization of a Fault-Tolerant RISC-V System-on-Chip for Space Environments. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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17 | Rahul Chaurasia, Abhinav Reddy Asireddy, Anirban Sengupta |
Fault Secured JPEG-Codec Hardware Accelerator with Piracy Detective Control using Secure Fingerprint Template. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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17 | Georgios Ioannis Paliaroutis, Pelopidas Tsoumanis, Dimitrios Garyfallou, Anastasis Vagenas, Nestoras E. Evmorfopoulos, Georgios I. Stamoulis |
Accurate Soft Error Rate Evaluation Using Event-Driven Dynamic Timing Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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17 | Konstantin Shibin, Maksim Jenihhin, Artur Jutman, Sergei Devadze, Anton Tsertov |
On-Chip Sensors Data Collection and Analysis for SoC Health Management. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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17 | V. Turco, Annachiara Ruospo, Gabriele Gavarini, Ernesto Sánchez 0001, Matteo Sonza Reorda |
Uncovering hidden vulnerabilities in CNNs through evolutionary-based Image Test Libraries. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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17 | Oana Boncalo, Alexandru Amaricai |
Gradient Descent Iterative Correction Unit for Fixed Point Parity Based Codes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-4, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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17 | Benjamin W. Mezger, Douglas A. dos Santos, Luigi Dilillo, Douglas R. Melo |
Hardening a Real-Time Operating System for a Dependable RISC-V System-on-Chip. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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17 | Alessandro Palumbo, Luca Cassano, Pedro Reviriego, Marco Ottavi |
Improving the Detection of Hardware Trojan Horses in Microprocessors via Hamming Codes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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17 | Natsuki Ota, Toshinori Hosokawa, Koji Yamazaki, Yukari Yamauchi, Masayuki Arai |
An Estimation Method of Defect Types Using Artificial Neural Networks and Fault Detection Information. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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17 | Junchao Chen 0001, Marko S. Andjelkovic, Milos Krstic, Fabian Luis Vargas 0001 |
A Machine Learning-driven EDAC Method for Space-Application Memory. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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17 | Jin-Fu Li 0001 |
Testing of Computing-In Memories: Faults, Test Algorithms, and Design-for-Testability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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17 | Gabriele Gavarini, Annachiara Ruospo, Ernesto Sánchez 0001 |
On the resilience of representative and novel data formats in CNNs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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17 | Salvatore Pappalardo, Ali Piri, Annachiara Ruospo, Ian O'Connor, Bastien Deveautour, Ernesto Sánchez 0001, Alberto Bosio |
Investigating the effect of approximate multipliers on the resilience of a systolic array DNN accelerator. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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17 | Clément Fanjas, Driss Aboulkassimi, Simon Pontié, Jessy Clédière |
Exploration of System-on-Chip Secure-Boot Vulnerability to Fault-Injection by Side-Channel Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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17 | Hasan Al Shaikh, Mohammad Bin Monjil, Kimia Zamiri Azar, Farimah Farahmandi, Mark M. Tehranipoor, Fahim Rahman |
QuardTropy: Detecting and Quantifying Unauthorized Information Leakage in Hardware Designs using g-entropy. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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17 | Haralampos-G. Stratigopoulos, Theofilos Spyrou, Spyridon Raptis |
Testing and Reliability of Spiking Neural Networks: A Review of the State-of-the-Art. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-8, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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17 | Alessandro Palumbo, Marco Ottavi, Luca Cassano |
Built-in Software Obfuscation for Protecting Microprocessors against Hardware Trojan Horses. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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17 | Glenn H. Chapman, Klinsmann J. Coelho Silva Meneses, Linda Wu, Israel Koren, Zahava Koren |
Image Degradation in Time Due to Interacting Hot Pixels. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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17 | Shih-Hsu Huang, Wei-Che Cheng, Jin-Fu Li 0001 |
Hardware Trojans of Computing-In-Memories: Issues and Methods. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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17 | Wesley Grignani, Douglas A. dos Santos, Luigi Dilillo, Felipe Viel, Douglas R. Melo |
A Low-Cost Hardware Accelerator for CCSDS 123 Lossless Hyperspectral Image Compression. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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17 | Mohammad Hasan Ahmadilivani, Jaan Raik, Masoud Daneshtalab, Alar Kuusik |
Analysis and Improvement of Resilience for Long Short-Term Memory Neural Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-4, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Nasr-Eddine Ouldei Tebina, Nacer-Eddine Zergainoh, Guillaume Hubert, Paolo Maistri |
Simulation Methodology for Assessing X-Ray Effects on Digital Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Raghunandana K. K, Yogesh Prasad K. R, Matteo Sonza Reorda, Virendra Singh |
DDSR: An Online GPGPU Instruction Decoder Error Detecting and Correcting Architecture. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
17 | Mridha Md Mashahedur Rahman, Shams Tarek, Kimia Zamiri Azar, Farimah Farahmandi |
EnSAFe: Enabling Sustainable SoC Security Auditing using eFPGA-based Accelerators. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023, pp. 1-6, 2023, IEEE, 979-8-3503-1500-4. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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17 | Zaman Amirzadeh, Mohammad Gholami |
Selective counter design in quantum-dot cellular automata nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Concurr. Comput. Pract. Exp. ![In: Concurr. Comput. Pract. Exp. 34(10), 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Shubham Rai, Satwik Patnaik, Ansh Rupani, Johann Knechtel, Ozgur Sinanoglu, Akash Kumar 0001 |
Security Promises and Vulnerabilities in Emerging Reconfigurable Nanotechnology-Based Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Emerg. Top. Comput. ![In: IEEE Trans. Emerg. Top. Comput. 10(2), pp. 763-778, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Deng Luo, Alexandre Kouyoumdjian, Ondrej Strnad, Haichao Miao, Ivan Barisic, Ivan Viola |
SynopSet: Multiscale Visual Abstraction Set for Explanatory Analysis of DNA Nanotechnology Simulations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2205.01628, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Joanicjusz Nazarko, Joanna Ejdys, Alicja E. Gudanowska, Katarzyna Halicka, Anna Kononiuk, Andrzej Magruk, Lukasz Nazarko |
Roadmapping in Regional Technology Foresight: A Contribution to Nanotechnology Development Strategy. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Engineering Management ![In: IEEE Trans. Engineering Management 69(1), pp. 179-194, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Sadia Batool, Hafezeh Nabipour, Seeram Ramakrishna, Masoud Mozafari |
Nanotechnology and quantum science enabled advances in neurological medical applications: diagnostics and treatments. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Medical Biol. Eng. Comput. ![In: Medical Biol. Eng. Comput. 60(12), pp. 3341-3356, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Yadong Ma |
New progress in international nanotechnology research in the past ten years - visual analysis based on CitesSpace. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Comput. Methods Sci. Eng. ![In: J. Comput. Methods Sci. Eng. 22(1), pp. 265-277, 2022. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Brylle Raphael Uy Bigcas, Maricar Sison Prudente, Socorro Echevarria Aguja |
Improving Health Science Students' Performance in Nanotechnology Using Socio-Scientific Issues-based Module. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IC4E ![In: IC4E 2022: 13th International Conference on E-Education, E-Business, E-Management, and E-Learning, Tokyo, Japan, January 14 - 17, 2022, pp. 286-293, 2022, ACM, 978-1-4503-8718-7. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Tamanna Tabassum, Fatema Akter, Mohammed Nasir Uddin |
QPROM: Quantum Nanotechnology for Data Storage Using Programmable Read Only Memory. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MIET (2) ![In: Machine Intelligence and Emerging Technologies - First International Conference, MIET 2022, Noakhali, Bangladesh, September 23-25, 2022, Proceedings, Part II, pp. 447-459, 2022, Springer, 978-3-031-34621-7. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Sagar Bhatt, Rakesh Dani, Sonu Kumar Katnoriya, Yashwant Singh Rawal, Ashulekha Gupta, Kapil Joshi |
Acceptance of the Nanotechnology in the Food Industry for customer Satisfaction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCCS ![In: 7th International Conference on Computing, Communication and Security, ICCCS 2022, Seoul, Korea, Republic of, November 3-5, 2022, pp. 1-6, 2022, IEEE, 979-8-3503-0990-4. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Bindu Bashyal, Shahad Ahmed, Anchal Shrestha, Nada AlSallami, Nawzat Sadiq Ahmed, Omar Hisham Alsadoon, Shaymaa Ismail Ali |
Nanotechnology Based Photodynamic Therapy for Cancer Treatment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICR ![In: Proceedings of the ICR'22 International Conference on Innovations in Computing Research, Athens, Greece, 29-31 August, 2022, pp. 93-101, 2022, Springer, 978-3-031-14053-2. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Luca Cassano, Sreejit Chakravarty, Alberto Bosio (eds.) |
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022 ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![IEEE, 978-1-6654-5938-9 The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Endri Kaja, Nicolas Gerlin, Monideep Bora, Keerthikumara Devarajegowda, Dominik Stoffel, Wolfgang Kunz, Wolfgang Ecker |
MetaFS: Model-driven Fault Simulation Framework. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022, pp. 1-4, 2022, IEEE, 978-1-6654-5938-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Stéphane Burel, Adrian Evans, Lorena Anghel |
Improving DNN Fault Tolerance in Semantic Segmentation Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022, pp. 1-6, 2022, IEEE, 978-1-6654-5938-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Edian B. Annink, Gerard K. Rauwerda, Edwin A. Hakkennes, Alessandra Menicucci, Stefano Di Mascio, Gianluca Furano, Marco Ottavi |
Preventing Soft Errors and Hardware Trojans in RISC-V Cores. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022, pp. 1-6, 2022, IEEE, 978-1-6654-5938-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Christos Georgakidis, Stavros Simoglou, Christos P. Sotiriou |
RADPlace-MS: A Timing-Driven Placer and Optimiser for ASICs Radiation Hardening. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022, pp. 1-6, 2022, IEEE, 978-1-6654-5938-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Nasr-Eddine Ouldei Tebina, Nacer-Eddine Zergainoh, Paolo Maistri |
X-Ray Fault Injection: Reviewing Defensive Approaches from a Security Perspective. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022, pp. 1-4, 2022, IEEE, 978-1-6654-5938-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Irith Pomeranz |
Storage-Based Logic Built-In Self-Test with Variable-Length Test Data. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022, pp. 1-6, 2022, IEEE, 978-1-6654-5938-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Shanshan Liu 0001, Jing Guo 0004, Xiaochen Tang, Pedro Reviriego, Fabrizio Lombardi |
A Polarity-Driven Radiation-Hardened Latch design for Single Event Upset Tolerance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022, pp. 1-6, 2022, IEEE, 978-1-6654-5938-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Antian Wang, Weihang Tan, Keshab K. Parhi, Yingjie Lao |
Integral Sampler and Polynomial Multiplication Architecture for Lattice-based Cryptography. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022, pp. 1-6, 2022, IEEE, 978-1-6654-5938-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Panagiota Nikolaou, Yiannakis Sazeides, Maria K. Michael |
INTERPLAY: An Intelligent Model for Predicting Performance Degradation due to Multi-cache Way-disabling. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022, pp. 1-7, 2022, IEEE, 978-1-6654-5938-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Konstantinos Nomikos, Athanasios Papadimitriou, Mihalis Psarakis, Aggelos Pikrakis, Vincent Beroulle |
Evaluation of Hiding-based Countermeasures against Deep Learning Side Channel Attacks with Pre-trained Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022, pp. 1-6, 2022, IEEE, 978-1-6654-5938-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Claudia Tempesta, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli |
Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022, pp. 1-6, 2022, IEEE, 978-1-6654-5938-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Raghda El Shehaby, Andreas Steininger |
Study and Comparison of QDI Pipeline Components' Sensitivity to Permanent Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022, pp. 1-6, 2022, IEEE, 978-1-6654-5938-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Luca Cassano, Stefano Di Mascio, Alessandro Palumbo, Alessandra Menicucci, Gianluca Furano, Giuseppe Bianchi 0001, Marco Ottavi |
Is RISC-V ready for Space? A Security Perspective. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022, pp. 1-6, 2022, IEEE, 978-1-6654-5938-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi 0001, Degang Chen 0001 |
Cross-Correlation Approach to Detecting Issue Test Sites in Massive Parallel Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022, pp. 1-6, 2022, IEEE, 978-1-6654-5938-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Hao Qiu, Semiu A. Olowogemo, Bor-Tyng Lin, William H. Robinson, Daniel B. Limbrick |
Understanding time-varying vulnerability accross GPU Program Lifetime. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022, pp. 1-6, 2022, IEEE, 978-1-6654-5938-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Masayoshi Yoshimura, Atsuya Tsujikawa, Hiroshi Yamazaki, Toshinori Hosokawa |
CRLock: A SAT and FALL Attacks Resistant Logic Locking Method at Register Transfer Level. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022, pp. 1-6, 2022, IEEE, 978-1-6654-5938-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Anmol Singh Narwariya, Pabitra Das, Saqib Khursheed, Amit Acharyya |
Operational Age Estimation of ICs using Gaussian Process Regression. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022, pp. 1-5, 2022, IEEE, 978-1-6654-5938-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Pengzhou He, Yazheng Tu, Ayesha Khalid, Máire O'Neill, Jiafeng Xie |
HPMA-NTRU: High-Performance Polynomial Multiplication Accelerator for NTRU. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022, pp. 1-6, 2022, IEEE, 978-1-6654-5938-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Amlan Ghosh, Saroj Satapathy, Jaydeep P. Kulkarni, Prashant D. Joshi |
Aging Effects On Clock Gated Memory Phase Paths. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022, pp. 1-5, 2022, IEEE, 978-1-6654-5938-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Alberto Bosio, Stefano Di Carlo, Maurizio Rebaudengo, Alessandro Savino |
Toward the hardening of real-time operating systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022, pp. 1-6, 2022, IEEE, 978-1-6654-5938-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Piyush Beegala, Debapriya Basu Roy, Prasanna Ravi, Shivam Bhasin, Anupam Chattopadhyay, Debdeep Mukhopadhyay |
Efficient Loop Abort Fault Attacks on Supersingular Isogeny based Key Exchange (SIKE). ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022, pp. 1-6, 2022, IEEE, 978-1-6654-5938-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Glenn H. Chapman, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren |
Image Degradation due to Interacting Adjacent Hot Pixels. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022, pp. 1-6, 2022, IEEE, 978-1-6654-5938-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Masoomeh Karami, Mohammad Hashem Haghbayan, Masoumeh Ebrahimi, Antonio Miele, Juha Plosila |
Thread-level Parallelism in Fault Simulation of Deep Neural Networks on Multi-Processor Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022, pp. 1-4, 2022, IEEE, 978-1-6654-5938-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Zaheer Tabassam, Andreas Steininger |
SET Hardened Derivatives of QDI Buffer Template. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022, pp. 1-6, 2022, IEEE, 978-1-6654-5938-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Zhen Gao 0005, Yinghao Cheng, Pedro Reviriego |
Evaluation of the Effects of SEUs on Configuration Memories in FPGA Implemented QC-LDPC Decoders. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022, pp. 1-6, 2022, IEEE, 978-1-6654-5938-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Semiu A. Olowogemo, Hao Qiu, Bor-Tyng Lin, William H. Robinson, Daniel B. Limbrick |
Model-Based Analysis of Single-Event Upset (SEU) Vulnerability of 6T SRAM Using FinFET Technologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022, pp. 1-4, 2022, IEEE, 978-1-6654-5938-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Cristiana Bolchini, Luca Cassano, Antonio Miele, Alessandro Nazzari |
Selective Hardening of CNNs based on Layer Vulnerability Estimation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022, pp. 1-6, 2022, IEEE, 978-1-6654-5938-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Corrado De Sio, Sarah Azimi, Luca Sterpone, David Merodio Codinachs |
Analysis of Proton-induced Single Event Effect in the On-Chip Memory of Embedded Process. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022, pp. 1-6, 2022, IEEE, 978-1-6654-5938-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Douglas A. dos Santos, André Martins Pio de Mattos, Lucas M. Luza, Carlo Cazzaniga, Maria Kastriotou, Douglas R. Melo, Luigi Dilillo |
Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022, pp. 1-6, 2022, IEEE, 978-1-6654-5938-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Jianan Wen, Andrea Baroni, Eduardo Perez, Markus Ulbricht 0002, Christian Wenger, Milos Krstic |
Evaluating Read Disturb Effect on RRAM based AI Accelerator with Multilevel States and Input Voltages. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022, pp. 1-6, 2022, IEEE, 978-1-6654-5938-9. The full citation details ...](Pics/full.jpeg) |
2022 |
DBLP DOI BibTeX RDF |
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17 | Xiaobin Shu, Li-Na Li, Miao-miao Ren, Bayan Omar Mohammed |
A new binary to gray code converter based on quantum-dot cellular automata nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Photonic Netw. Commun. ![In: Photonic Netw. Commun. 41(1), pp. 102-108, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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17 | Emrobowansan Monday Idamokoro, Yiseyon Sunday Hosu |
Global Research Trends on the Use of Nanotechnology to Boost Meat Production: A Scientometric Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Frontiers Res. Metrics Anal. ![In: Frontiers Res. Metrics Anal. 6, pp. 793853, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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17 | Jun-Cheol Jeon |
Designing nanotechnology QCA-multiplexer using majority function-based NAND for quantum computing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Supercomput. ![In: J. Supercomput. 77(2), pp. 1562-1578, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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17 | Sourabh Kulkarni, Sachin Bhat, Csaba Andras Moritz |
Architecting for Artificial Intelligence with Emerging Nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM J. Emerg. Technol. Comput. Syst. ![In: ACM J. Emerg. Technol. Comput. Syst. 17(3), pp. 26:1-26:33, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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17 | Elva Luz Crespo Neira, Ashkan Ebadi, Catherine Beaudry, Andrea Schiffauerova |
Influence of cognitive, geographical, and collaborative proximity on knowledge production of Canadian nanotechnology. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CoRR ![In: CoRR abs/2106.02110, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP BibTeX RDF |
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17 | Yoscelina I. Hernandez-Garcia, Mónica Anzaldo Montoya |
Flow of ideas in the study of communication channels and references in publications on nanotechnology applied to food and agriculture in Mexico. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Scientometrics ![In: Scientometrics 126(2), pp. 995-1017, 2021. The full citation details ...](Pics/full.jpeg) |
2021 |
DBLP DOI BibTeX RDF |
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