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Publication years (Num. hits)
1993-2003 (18) 2004-2005 (16) 2006-2007 (16) 2008-2017 (15) 2018-2023 (5)
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article(18) data(1) inproceedings(51)
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Found 70 publication records. Showing 70 according to the selection in the facets
Hits ? Authors Title Venue Year Link Author keywords
125Rei-Fu Huang, Chao-Hsun Chen, Cheng-Wen Wu Economic Aspects of Memory Built-in Self-Repair. Search on Bibsonomy IEEE Des. Test Comput. The full citation details ... 2007 DBLP  DOI  BibTeX  RDF BIRA, BIST, yield, overhead, economic models, BISR, redundancy analysis, built-in self-repair
84Yu-Ying Hsiao, Chao-Hsun Chen, Cheng-Wen Wu A Built-In Self-Repair Scheme for NOR-Type Flash Memory. Search on Bibsonomy VTS The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
80Uthman Alsaiari, Resve A. Saleh Power, Delay and Yield Analysis of BIST/BISR PLAs Using Column Redundancy. Search on Bibsonomy ISQED The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
80Lisa M. Guerra, Miodrag Potkonjak, Jan M. Rabaey Behavioral-level synthesis of heterogeneous BISR reconfigurable ASIC's. Search on Bibsonomy IEEE Trans. Very Large Scale Integr. Syst. The full citation details ... 1998 DBLP  DOI  BibTeX  RDF
75Alfredo Benso, Silvia Chiusano, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni A Family of Self-Repair SRAM Cores. Search on Bibsonomy IOLTW The full citation details ... 2000 DBLP  DOI  BibTeX  RDF Memory Self-Repair, Memory BIST, BISR
70Liviu Miclea, Szilárd Enyedi, Alfredo Benso Itelligent Agents and BIST/BISR - Working Together in Distributed Systems. Search on Bibsonomy ITC The full citation details ... 2002 DBLP  DOI  BibTeX  RDF distributed systems BIST, distributed BISR, Intelligent agent, self-repair, embedded testing, high-level testing
67Xingguo Xiong, Yu-Liang Wu, Wen-Ben Jone Material Fatigue and Reliability of MEMS Accelerometers. Search on Bibsonomy DFT The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
67S. Habermann, René Kothe, Heinrich Theodor Vierhaus Built-in Self Repair by Reconfiguration of FPGAs. Search on Bibsonomy IOLTS The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
67Xingguo Xiong, Yu-Liang Wu, Wen-Ben Jone Reliability Analysis of Self-Repairable MEMS Accelerometer. Search on Bibsonomy DFT The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
67Jin-Fu Li 0001, Jen-Chieh Yeh, Rei-Fu Huang, Cheng-Wen Wu A built-in self-repair design for RAMs with 2-D redundancy. Search on Bibsonomy IEEE Trans. Very Large Scale Integr. Syst. The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
67Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu A Processor-Based Built-In Self-Repair Design for Embedded Memories. Search on Bibsonomy Asian Test Symposium The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
67Jin-Fu Li 0001, Jen-Chieh Yeh, Rei-Fu Huang, Cheng-Wen Wu, Peir-Yuan Tsai, Archer Hsu, Eugene Chow A Built-In Self-Repair Scheme for Semiconductor Memories with 2-D Redundancy. Search on Bibsonomy ITC The full citation details ... 2003 DBLP  DOI  BibTeX  RDF built-in redundancy-analysis, built-in self-test, memory testing, semiconductor memory, built-in self-repair
58Da-Ming Chang, Jin-Fu Li 0001, Yu-Jen Huang A Built-In Redundancy-Analysis Scheme for Random Access Memories with Two-Level Redundancy. Search on Bibsonomy J. Electron. Test. The full citation details ... 2008 DBLP  DOI  BibTeX  RDF Built-in self-repair (BISR), Built-in redundancy-analysis (BIRA), Two-level redundancy, Random access memory, System-on-chip (SOC)
58Michael Nicolaidis, Lorena Anghel, Nadir Achouri Memory Defect Tolerance Architectures for Nanotechnologies. Search on Bibsonomy J. Electron. Test. The full citation details ... 2005 DBLP  DOI  BibTeX  RDF word repair, nanotechnologies, BISR, memory repair, high defect densities
51Tsu-Wei Tseng, Chun-Hsien Wu, Yu-Jen Huang, Jin-Fu Li 0001, Alex Pao, Kevin Chiu, Eliot Chen A Built-In Self-Repair Scheme for Multiport RAMs. Search on Bibsonomy VTS The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
51Xingguo Xiong, Yu-Liang Wu, Wen-Ben Jone Design and Analysis of Self-Repairable MEMS Accelerometer. Search on Bibsonomy DFT The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
51Rei-Fu Huang, Chin-Lung Su, Cheng-Wen Wu, Shen-Tien Lin, Kun-Lun Luo, Yeong-Jar Chang Fail Pattern Identification for Memory Built-In Self-Repair. Search on Bibsonomy Asian Test Symposium The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
51Lorena Anghel, Nadir Achouri, Michael Nicolaidis Evaluation of Memory Built-in Self Repair Techniques for High Defect Density Technologie. Search on Bibsonomy PRDC The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
41Rei-Fu Huang, Jin-Fu Li 0001, Jen-Chieh Yeh, Cheng-Wen Wu Raisin: Redundancy Analysis Algorithm Simulation. Search on Bibsonomy IEEE Des. Test Comput. The full citation details ... 2007 DBLP  DOI  BibTeX  RDF repair rate, BIRA, Raisin, yield, BISR, redundancy analysis, algorithm simulation
41Kwang-Ting (Tim) Cheng Cocktail approach to functional verification. Search on Bibsonomy IEEE Des. Test Comput. The full citation details ... 2007 DBLP  DOI  BibTeX  RDF validation, functional verification, multiprocessor SoC, SiP, BISR
41Kang Yi, Kyeong-Hoon Jung, Shih-Yang Cheng, Young-Hwan Park, Fadi J. Kurdahi, Ahmed M. Eltawil Design and Analysis of Low Power Image Filters Toward Defect-Resilient Embedded Memories for Multimedia SoCs. Search on Bibsonomy Asia-Pacific Computer Systems Architecture Conference The full citation details ... 2006 DBLP  DOI  BibTeX  RDF Low power image filter design, Memory yield enhancement, Memory-error resilient design, H.264 codec, BIST, Embedded memory, BISR
41Kanad Chakraborty Testing and Reliability Techniques for High-Bandwidth Embedded RAMs. Search on Bibsonomy J. Electron. Test. The full citation details ... 2004 DBLP  DOI  BibTeX  RDF multiport RAM, BIST (built-in self-test), BISR (built-in self-repair), column-multiplexed addressing, fault tolerance, reliability, bandwidth
41Minsu Choi, Noh-Jin Park, K. M. George, Byoungjae Jin, Nohpill Park, Yong-Bin Kim, Fabrizio Lombardi Fault Tolerant Memory Design for HW/SW Co-Reliability in Massively Parallel Computing Systems. Search on Bibsonomy NCA The full citation details ... 2003 DBLP  DOI  BibTeX  RDF Built-in-self-repair (BISR), Field Reconfiguration, HW/SW Co-reliability, Reliability Assurance, Reliability, High performance computing, Yield, Massively parallel computing, Fault-tolerant memory, Modular Redundancy
34Olivier Ginez, Jean-Michel Portal, Hassen Aziza An on-line testing scheme for repairing purposes in Flash memories. Search on Bibsonomy DDECS The full citation details ... 2009 DBLP  DOI  BibTeX  RDF
34Wei Pei, Wen-Ben Jone, Yiming Hu Fault Modeling and Detection for Drowsy SRAM Caches. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
34Irith Pomeranz, Sudhakar M. Reddy Semi-Concurrent On-Line Testing of Transition Faults Through Output Response Comparison of Identical Circuits. Search on Bibsonomy DFT The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
34Tsu-Wei Tseng, Jin-Fu Li 0001, Da-Ming Chang A built-in redundancy-analysis scheme for RAMs with 2D redundancy using 1D local bitmap. Search on Bibsonomy DATE The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
34Yu-Jen Huang, Da-Ming Chang, Jin-Fu Li 0001 A Built-In Redundancy-Analysis Scheme for Self-Repairable RAMs with Two-Level Redundancy. Search on Bibsonomy DFT The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
34Inki Hong, Miodrag Potkonjak, Ramesh Karri A heterogeneous built-in self-repair approach using system-level synthesis flexibility. Search on Bibsonomy IEEE Trans. Reliab. The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
34Rita Zappa, Carolina Selva, Danilo Rimondi, Cosimo Torelli, M. Crestan, Giovanni Mastrodomenico, Lara Albani Micro Programmable Built-In Self Repair for SRAMs. Search on Bibsonomy MTDT The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
34Minsu Choi, Nohpill Park, Fabrizio Lombardi, Yong-Bin Kim, Vincenzo Piuri Optimal Spare Utilization in Repairable and Reliable Memory Cores. Search on Bibsonomy MTDT The full citation details ... 2003 DBLP  DOI  BibTeX  RDF Embedded Memory Repair and Reliability, Fault-Tolerant Memory Core, System-on-chip, Yield, Built-In-Self-Repair
34Minsu Choi, Nohpill Park, Fabrizio Lombardi, Yong-Bin Kim, Vincenzo Piuri Balanced Redundancy Utilization in Embedded Memory Cores for Dependable Systems. Search on Bibsonomy DFT The full citation details ... 2002 DBLP  DOI  BibTeX  RDF
29Qian Yu, Qing Li 0006, Rui He, Gareth Tyson, Wanxin Shi, Jianhui Lv, Zhenhui Yuan, Peng Zhang, Yulong Lan, Zhicheng Li BiSR: Bidirectionally Optimized Super-Resolution for Mobile Video Streaming. Search on Bibsonomy WWW The full citation details ... 2023 DBLP  DOI  BibTeX  RDF
29Wei Zou, Benoit Nadeau-Dostie Configurable BISR Chain For Fast Repair Data Loading. Search on Bibsonomy ITC The full citation details ... 2022 DBLP  DOI  BibTeX  RDF
29Sabyasachee Banerjee Experimental result of our BISR work. Search on Bibsonomy 2020   DOI  RDF
29Venkat Sundar Gadepalli, Hatice Gulcin Ozer, Ayse Selen Yilmaz, Maciej Pietrzak, Amy Webb BISR-RNAseq: an efficient and scalable RNAseq analysis workflow with interactive report generation. Search on Bibsonomy BMC Bioinform. The full citation details ... 2019 DBLP  DOI  BibTeX  RDF
29Wei-Kai Cheng, Jian-Kai Chen, Shih-Hsu Huang Integration of Retention-aware Refresh and BISR Techniques for DRAM Refresh Power Reduction. Search on Bibsonomy ISOCC The full citation details ... 2018 DBLP  DOI  BibTeX  RDF
29Tianjian Li, Yan Han, Xiaoyao Liang, Hsien-Hsin S. Lee, Li Jiang 0002 Fault clustering technique for 3D memory BISR. Search on Bibsonomy DATE The full citation details ... 2017 DBLP  DOI  BibTeX  RDF
29Chih-Sheng Hou, Jin-Fu Li 0001 High Repair-Efficiency BISR Scheme for RAMs by Reusing Bitmap for Bit Redundancy. Search on Bibsonomy IEEE Trans. Very Large Scale Integr. Syst. The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
29Madhuri Elsa Eapen, C. Pradeep, Anila Ann Varghese, Jisha M. Nair Placement Strategies for Faulty Cells in Module Relocation Based BISR Approach. Search on Bibsonomy IBICA The full citation details ... 2015 DBLP  DOI  BibTeX  RDF
29Andrej Kincel, Marcel Baláz Case study: BISR for a processor multiplier. Search on Bibsonomy DDECS The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
29Gang Wang, Xu Wang, Xinke Chen, Shuangbai Xue Test and Repair Flow for Shared BISR in Asynchronous Multi-processors. Search on Bibsonomy ASYNC The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
29Georgios Zervakis 0001, Nikolaos Eftaxiopoulos-Sarris, Kostas Tsoumanis, Nicholas Axelos, Kiamal Z. Pekmestzi A segmentation-based BISR scheme. Search on Bibsonomy ASP-DAC The full citation details ... 2014 DBLP  DOI  BibTeX  RDF
29Maddu Karunaratne, Bejoy Oomann An Optimal Memory BISR Implementation. Search on Bibsonomy J. Comput. The full citation details ... 2013 DBLP  BibTeX  RDF
29Chun-Chuan Chi, Yung-Fa Chou, Ding-Ming Kwai, Yu-Ying Hsiao, Cheng-Wen Wu, Yu-Tsao Hsing, Li-Ming Denq, Tsung-Hsiang Lin 3D-IC BISR for stacked memories using cross-die spares. Search on Bibsonomy VLSI-DAT The full citation details ... 2012 DBLP  DOI  BibTeX  RDF
29Kun-Chih Chen, Shu-Yen Lin, Wen-Chung Shen, An-Yeu Wu A scalable built-in self-recovery (BISR) VLSI architecture and design methodology for 2D-mesh based on-chip networks. Search on Bibsonomy Des. Autom. Embed. Syst. The full citation details ... 2011 DBLP  DOI  BibTeX  RDF
29Shyue-Kung Lu, Chun-Lin Yang, Yuang-Cheng Hsiao, Cheng-Wen Wu Efficient BISR Techniques for Embedded Memories Considering Cluster Faults. Search on Bibsonomy IEEE Trans. Very Large Scale Integr. Syst. The full citation details ... 2010 DBLP  DOI  BibTeX  RDF
29Kiamal Z. Pekmestzi, Nicholas Axelos, Isidoros Sideris, Nikos K. Moshopoulos A BISR Architecture for Embedded Memories. Search on Bibsonomy IOLTS The full citation details ... 2008 DBLP  DOI  BibTeX  RDF
29Chun-Lin Yang, Yuang-Cheng Hsiao, Shyue-Kung Lu Efficient BISR Techniques for Embedded Memories Considering Cluster Faults. Search on Bibsonomy PRDC The full citation details ... 2007 DBLP  DOI  BibTeX  RDF
29Shyue-Kung Lu, Chun-Lin Yang, Han-Wen Lin Efficient BISR Techniques for Word-Oriented Embedded Memories with Hierarchical Redundancy. Search on Bibsonomy ACIS-ICIS The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
29Li-Ming Denq, Tzu-chiang Wang, Cheng-Wen Wu An Enhanced SRAM BISR Design with Reduced Timing Penalty. Search on Bibsonomy ATS The full citation details ... 2006 DBLP  DOI  BibTeX  RDF
29Gustavo Neuberger, Fernanda Lima Kastensmidt, Ricardo Reis 0001 TOC-BISR: A Self-Repair Scheme for Memories in Embedded Systems. Search on Bibsonomy IESS The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
29Michael Nicolaidis, Slimane Boutobza, Nadir Achouri, R. D. Shawn Blanton, Julie Segal, David Y. Lepejian, Ben Chu, Tony Singh, Harvey Berman Designing and Implementing Efficient BISR Techniques for Embedded RAMs. Search on Bibsonomy LATW The full citation details ... 2001 DBLP  BibTeX  RDF
29Yoshihiro Nagura, Michael Mullins, Anthony Sauvageau, Yoshinoro Fujiwara, Katsuya Furue, Ryuji Ohmura, Tatsunori Komoike, Takenori Okitaka, Tetsushi Tanizaki, Katsumi Dosaka, Kazutami Arimoto, Yukiyoshi Koda, Tetsuo Tada Test cost reduction by at-speed BISR for embedded DRAMs. Search on Bibsonomy ITC The full citation details ... 2001 DBLP  DOI  BibTeX  RDF
29Inki Hong, Miodrag Potkonjak, Ramesh Karri Heterogeneous BISR-approach using System Level Synthesis Flexibility. Search on Bibsonomy ASP-DAC The full citation details ... 1998 DBLP  DOI  BibTeX  RDF
29Miodrag Potkonjak, Lisa M. Guerra, Jan M. Rabaey Heterogeneous BISR techniques for yield and reliability enhancement using high level synthesis transformations. Search on Bibsonomy ASAP The full citation details ... 1993 DBLP  DOI  BibTeX  RDF
24André K. Nieuwland, Richard P. Kleihorst IC Cost Reduction by Applying Embedded Fault Tolerance for Soft Errors. Search on Bibsonomy J. Electron. Test. The full citation details ... 2004 DBLP  DOI  BibTeX  RDF IC cost, IC production, fault tolerant, redundancy, yield, soft error, on-line test, defect density, SEU, SER, BISR
24Kanad Chakraborty, Anurag Gupta, Mayukh Bhattacharya, Shriram Kulkarni, Pinaki Mazumder A Physical Design Tool for Built-in Self-Repairable Static RAMs. Search on Bibsonomy DATE The full citation details ... 1999 DBLP  DOI  BibTeX  RDF Built-in, (BISR), reliability, yield, self-repair
17Uthman Alsaiari, Resve A. Saleh Partitioning for Selective Flip-Flop Redundancy in Sequential Circuits. Search on Bibsonomy ISQED The full citation details ... 2008 DBLP  DOI  BibTeX  RDF Partitioning, Redundancy, Yield, Flip-Flop
17R. Chandramouli Managing Test and Repair of Embedded Memory Subsystem in SoC. Search on Bibsonomy Asian Test Symposium The full citation details ... 2005 DBLP  DOI  BibTeX  RDF
17Chih-Tsun Huang, Jen-Chieh Yeh, Yuan-Yuan Shih, Rei-Fu Huang, Cheng-Wen Wu On Test and Diagnostics of Flash Memories. Search on Bibsonomy Asian Test Symposium The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
17Said Hamdioui, Georgi Gaydadjiev, Ad J. van de Goor The State-of-Art and Future Trends in Testing Embedded Memories. Search on Bibsonomy MTDT The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
17Michael Nicolaidis, Nadir Achouri, Lorena Anghel A Diversified Memory Built-In Self-Repair Approach for Nanotechnologies. Search on Bibsonomy VTS The full citation details ... 2004 DBLP  DOI  BibTeX  RDF ECC codes, word repair, nanotechnologies, memory repair, high defect densities
17Liviu Miclea, Szilárd Enyedi, Gavril Toderean, Alfredo Benso, Paolo Prinetto Towards Microagent based DBIST/DBISR. Search on Bibsonomy ITC The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
17Robert C. Aitken A Modular Wrapper Enabling High Speed BIST and Repair for Small Wide Memories. Search on Bibsonomy ITC The full citation details ... 2004 DBLP  DOI  BibTeX  RDF
17Liviu Miclea, Szilárd Enyedi, Gavril Toderean, Alfredo Benso, Paolo Prinetto Agent Based DBIST/DBISR And Its Web/Wireless Management. Search on Bibsonomy ITC The full citation details ... 2003 DBLP  DOI  BibTeX  RDF
17Rei-Fu Huang, Jin-Fu Li 0001, Jen-Chieh Yeh, Cheng-Wen Wu A Simulator for Evaluating Redundancy Analysis Algorithms of Repairable Embedded Memories. Search on Bibsonomy MTDT The full citation details ... 2002 DBLP  DOI  BibTeX  RDF simulation, memory testing, embedded memory, redundancy analysis, memory repair
17Rei-Fu Huang, Jin-Fu Li 0001, Jen-Chieh Yeh, Cheng-Wen Wu A Simulator for E aluating Redundancy Analysis Algorithms of Repairable Embedded Memories. Search on Bibsonomy IOLTW The full citation details ... 2002 DBLP  DOI  BibTeX  RDF simulation, memory testing, embedded memory, redundancy analysis, memory repair
17Kanad Chakraborty, Shriram Kulkarni, Mayukh Bhattacharya, Pinaki Mazumder, Anurag Gupta A physical design tool for built-in self-repairable RAMs. Search on Bibsonomy IEEE Trans. Very Large Scale Integr. Syst. The full citation details ... 2001 DBLP  DOI  BibTeX  RDF
17Pinaki Mazumder, Jih-Shyr Yih A new built-in self-repair approach to VLSI memory yield enhancement by using neural-type circuits. Search on Bibsonomy IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. The full citation details ... 1993 DBLP  DOI  BibTeX  RDF
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