Search results for "line-test"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
51	Sungwon Kang, Jihyun Lee, Myungchul Kim 0001, Woojin Lee	Towards a Formal Framework for Product Line Test Development.	CIT	2007	DBLP DOI BibTeX RDF
48	Jacob Savir	On testing safety-sensitive digital systems.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	aerospace testing, safety systems, safety-sensitive digital systems, off-line test, flight critical missions, digital airborne system, repair capabilities, diagnosis capabilities, mission reliability, reliability, fault diagnosis, redundancy, digital systems, online test
37	Akira Taneda, Hikaru Oku, Daiji Namba	An on-line test program for peripheral devices.	AFIPS National Computer Conference	1976	DBLP DOI BibTeX RDF
34	Ioannis Voyiatzis, Dimitris Nikolos, Antonis M. Paschalis, Constantinos Halatsis, Th. Haniotakis	An efficient comparative concurrent Built-In Self-Test technique.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	off-line test generation, comparative concurrent BIST, test latency, windowed-CBIST, VLSI, logic testing, built-in self test, integrated circuit testing, concurrent engineering, VLSI circuits, test sequence, hardware overhead
33	Ernesto Sánchez 0001, Matteo Sonza Reorda, Giovanni Squillero	On the Transformation of Manufacturing Test Sets into On-Line Test Sets for Microprocessors.	DFT	2005	DBLP DOI BibTeX RDF
32	António C. Valente, Óscar Mealha	Virtual images as a "line-test" to real image animation.	CA	1997	DBLP DOI BibTeX RDF	virtual images, line-test, real image animation, laser beams, virtual animation prediction process, computer animation
26	José Luis Huertas	Test and design-for-test of mixed-signal integrated circuits.	SBCCI	2004	DBLP DOI BibTeX RDF
24	René Kothe, Christian Galke, Heinrich Theodor Vierhaus	A Multi-Purpose Concept for SoC Self Test Including Diagnostic Features.	IOLTS	2005	DBLP DOI BibTeX RDF
22	Praveen Bhojwani, Rabi N. Mahapatra	An Infrastructure IP for Online Testing of Network-on-Chip Based SoCs.	ISQED	2007	DBLP DOI BibTeX RDF
21	Yiorgos Makris, Alex Orailoglu	Exploiting Off-Line Hierarchical Test Paths in Module Diagnosis and On-Line Test.	LATW	2000	DBLP BibTeX RDF
21	Haralampos-G. D. Stratigopoulos, Yiorgos Makris	An Analog Checker with Input-Relative Tolerance for Duplicate Signals.	J. Electron. Test.	2004	DBLP DOI BibTeX RDF	analog checkers, on-line test, analog test, concurrent test
20	Yiorgos Makris, Ismet Bayraktaroglu, Alex Orailoglu	Invariance-Based On-Line Test for RTL Controller-Datapath Circuits.	VTS	2000	DBLP DOI BibTeX RDF
20	Ilia Polian, Damian Nowroth, Bernd Becker 0001	Identification of Critical Errors in Imaging Applications.	IOLTS	2007	DBLP DOI BibTeX RDF	Low-cost on-line test, Selective hardening, Imaging applications, Error tolerance
20	George Xenoulis, Dimitris Gizopoulos, Nektarios Kranitis, Antonis M. Paschalis	Low-Cost, On-Line Software-Based Self-Testing of Embedded Processor Cores.	IOLTS	2003	DBLP DOI BibTeX RDF
17	Mohammad A. Naal, Emmanuel Simeu, Salvador Mir	On-Line Testable Decimation Filter Design for AMS Systems.	IOLTS	2003	DBLP DOI BibTeX RDF	non-concurrent, semi-concurrent, SigmaDelta, decimation filters, analogue BIST, on-line testing
16	Salvador Mir, Marcelo Lubaszewski, Bernard Courtois	Unified built-in self-test for fully differential analog circuits.	J. Electron. Test.	1996	DBLP DOI BibTeX RDF	on-line/off-line analog test, unified BIST, fully differential analog circuits, common-mode feedback, analog BIST
16	Christian Galke, Marcus Grabow, Heinrich Theodor Vierhaus	Perspectives of Combining on-line and off-line Test Technology for Dependable Systems on a Chip.	IOLTS	2003	DBLP DOI BibTeX RDF
16	Jacob Savir	On-line and off-line test of airborne digital systems: a reliability study.	ITC	2000	DBLP DOI BibTeX RDF
15	Yoichi Maeda, Jun Matsushima, Ron Press	Automotive IC On-line Test Techniques and the Application of Deterministic ATPG-Based Runtime Test.	ATS	2017	DBLP DOI BibTeX RDF
15	Sebastian Abele, Michael Weyrich	A combined fault diagnosis and test case selection assistant for automotive end-of-line test systems.	INDIN	2016	DBLP DOI BibTeX RDF
15	Sungwon Kang, Haeun Baek, Jungmin Kim, Jihyun Lee	Systematic Software Product Line Test Case Derivation for Test Data Reuse.	COMPSAC Workshops	2015	DBLP DOI BibTeX RDF
15	Nathalie Bertrand 0001, Thierry Jéron, Amélie Stainer, Moez Krichen	Off-line test selection with test purposes for non-deterministic timed automata	Log. Methods Comput. Sci.	2012	DBLP DOI BibTeX RDF
15	Matteo Sonza Reorda	On-line test of embedded systems: Which role for functional test?	DDECS	2012	DBLP DOI BibTeX RDF
15	Nathalie Bertrand 0001, Thierry Jéron, Amélie Stainer, Moez Krichen	Off-Line Test Selection with Test Purposes for Non-deterministic Timed Automata.	TACAS	2011	DBLP DOI BibTeX RDF
15	Yixin Zhao, Xia Yin, Bo Han, Jianping Wu	On-Line Test System Applied in Routing Protocol Test.	MASCOTS	2001	DBLP DOI BibTeX RDF
15	Thierry Michel	Test en ligne des systèmes à base de microprocesseur. (One-line test in microprocessor based systems).		1993	RDF
15	Masayuki Matsumoto	Assurance Technology of System Test Based on Operators' Aspects.	HASE	2008	DBLP DOI BibTeX RDF
14	Ismet Bayraktaroglu, Alex Orailoglu	Low-Cost On-Line Test for Digital Filters.	VTS	1999	DBLP DOI BibTeX RDF
14	Nan Guan, Martin Stigge, Wang Yi 0001, Ge Yu 0001	Cache-aware scheduling and analysis for multicores.	EMSOFT	2009	DBLP DOI BibTeX RDF	real-time systems, multicores, schedulability analysis, cache partitioning
14	Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin	Low Cost On-Line Testing Strategy for RF Circuits.	J. Electron. Test.	2005	DBLP DOI BibTeX RDF	on-line analog testing, DSP-based testing, analog test
14	Marcelo Lubaszewski, Salvador Mir, Vladimir Kolarik, C. Nielsen, Bernard Courtois	Design of self-checking fully differential circuits and boards.	IEEE Trans. Very Large Scale Integr. Syst.	2000	DBLP DOI BibTeX RDF
13	Jason D. Lee, Nikhil Gupta 0004, Praveen Bhojwani, Rabi N. Mahapatra	An On-Demand Test Triggering Mechanism for NoC-Based Safety-Critical Systems.	ISQED	2008	DBLP DOI BibTeX RDF	test triggering, network on chip, on-line test
13	André K. Nieuwland, Richard P. Kleihorst	IC Cost Reduction by Applying Embedded Fault Tolerance for Soft Errors.	J. Electron. Test.	2004	DBLP DOI BibTeX RDF	IC cost, IC production, fault tolerant, redundancy, yield, soft error, on-line test, defect density, SEU, SER, BISR
13	Albrecht P. Stroele, Steffen Tarnick	Embedded Checker Architectures for Cyclic and Low-Cost Arithmetic Codes.	J. Electron. Test.	2000	DBLP DOI BibTeX RDF	code checkers, code word accumulators, code word generators, embedded checkers, cyclic arithmetic codes, low-cost arithmetic codes, built-in self-test, on-line test, totally self-checking checkers
13	Alex Orailoglu	On-Line Fault Resilience Through Gracefully Degradable ASICs.	J. Electron. Test.	1998	DBLP DOI BibTeX RDF	fault tolerant ICs, reconfigurable ASICs, high level synthesis, on-line test, graceful degradation
13	Nilanjan Mukherjee, Ramesh Karri	Versatile BIST: An Integrated Approach to On-line/Off-line BIST for Data-Dominated Architectures.	J. Electron. Test.	1998	DBLP DOI BibTeX RDF	data-path architectures, response compactor, concurrency, built-in self test, high-level synthesis, on-line test, pattern generator, test function
13	Sacha Reis, Andreas Metzger, Klaus Pohl	Integration Testing in Software Product Line Engineering: A Model-Based Technique.	FASE	2007	DBLP DOI BibTeX RDF
12	Gerd Krüger 0001	A tool for hierarchical test generation.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1991	DBLP DOI BibTeX RDF
11	Rodrigo M. Santos, Giuseppe Lipari, Enrico Bini	Efficient On-line Schedulability Test for Feedback Scheduling of Soft Real-Time Tasks under Fixed-Priority.	IEEE Real-Time and Embedded Technology and Applications Symposium	2008	DBLP DOI BibTeX RDF	adaptive reservations, on-line admission test, real-time scheduling, fixed priority scheduling, sporadic server
11	Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin	A Statistical Sampler for a New On-Line Analog Test Method.	J. Electron. Test.	2003	DBLP DOI BibTeX RDF	DSP-based testing, on-line testing, analog test
11	Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin	A Statistical Sampler for a New On-line Analog Test Method.	IOLTW	2002	DBLP DOI BibTeX RDF
11	Vladimir Kolarik, Salvador Mir, Marcelo Lubaszewski, Bernard Courtois	Analog checkers with absolute and relative tolerances.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1995	DBLP DOI BibTeX RDF
11	Guijun Gao, Youren Wang, Jiang Cui, Rui Yao	Research on Multi-objective On-Line Evolution Technology of Digital Circuit Based on FPGA Model.	ICES	2007	DBLP DOI BibTeX RDF	On-line Evolution, Multi-objective Evolutionary Method, FPGA Model, Digital Circuit, Evolvable Hardware
11	Santosh Biswas, Siddhartha Mukhopadhyay, Amit Patra	A Formal Approach to On-Line Monitoring of Digital VLSI Circuits: Theory, Design and Implementation.	J. Electron. Test.	2005	DBLP DOI BibTeX RDF	detection latency, discrete event systems, ordered binary decision diagrams, fault detection and diagnosis
11	Antti Jääskeläinen, Mika Katara, Antti Kervinen, Mika Maunumaa, Tuula Pääkkönen, Tommi Takala, Heikki Virtanen	Automatic GUI test generation for smartphone applications - an evaluation.	ICSE Companion	2009	DBLP DOI BibTeX RDF
11	Alberto Manzone, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Ernesto Sánchez 0001, Matteo Sonza Reorda	Integrating BIST Techniques for On-Line SoC Testing.	IOLTS	2005	DBLP DOI BibTeX RDF
11	Yiorgos Makris, Ismet Bayraktaroglu, Alex Orailoglu	Enhancing reliability of RTL controller-datapath circuits via Invariant-based concurrent test.	IEEE Trans. Reliab.	2004	DBLP DOI BibTeX RDF
10	Feiyu Fang, Lykourgos Kekempanos	VDSL Single Ended Line Test baselining with Uncalibrated Echo Response data.	ICSPCS	2023	DBLP DOI BibTeX RDF
10	Feiyu Fang, Lykourgos Kekempanos	VDSL fault detection using Single Ended Line Test Uncalibrated Echo Response data.	ICSPCS	2023	DBLP DOI BibTeX RDF
10	Peter Wißbrock, David Pelkmann, Yvonne Richter	Discussion of Features for Acoustic Anomaly Detection under Industrial Disturbing Noise in an End-of-Line Test of Geared Motors.	INDIN	2023	DBLP DOI BibTeX RDF
10	Brian M. Deegan, Dara Molloy, Jordan Cahill, Jonathan Horgan, Enda Ward, Edward Jones, Martin Glavin	The influence of image capture and processing on MTF for end of line test and validation.	Autonomous Vehicles and Machines	2023	DBLP DOI BibTeX RDF
10	Peter Wißbrock, David Pelkmann, Yvonne Richter	Discussion of Features for Acoustic Anomaly Detection under Industrial Disturbing Noise in an End-of-Line Test of Geared Motors.	CoRR	2022	DBLP DOI BibTeX RDF
10	Xijun Huang, Chuan-pei Xu, Long Zhang	On-Line Test of Pin-Constrained Digital Microfluidic Biochips with Connect-5 Structure.	J. Electron. Test.	2021	DBLP DOI BibTeX RDF
10	Liyan Zhao	Research and Development of Computer Control System for Production Line Test of Bone Microphone.	AIAM (ACM)	2021	DBLP DOI BibTeX RDF
10	Kleber L. Petry, Edson OliveiraJr, Leandro T. Costa, Aline Zanin, Avelino F. Zorzo	SMartyTesting: A Model-Based Testing Approach for Deriving Software Product Line Test Sequences.	ICEIS (2)	2021	DBLP DOI BibTeX RDF
10	Leonardo Bisch Piccoli, Renato V. B. Henriques, Tiago R. Balen	Design of an Integrated System for On-line Test and Diagnosis of Rotary Actuators.	J. Electron. Test.	2020	DBLP DOI BibTeX RDF
10	Thiago do Nascimento Ferreira, Silvia Regina Vergilio, Marouane Kessentini	Many-objective Search-based Selection of Software Product Line Test Products with Nautilus.	SPLC (B)	2020	DBLP DOI BibTeX RDF
10	Jihyun Lee	An Introductory Study on an Architecture-Based Software Product Line Test Generation Method.	Int. J. Softw. Eng. Knowl. Eng.	2019	DBLP DOI BibTeX RDF
10	Shuai Wang 0001, Shaukat Ali 0001, Arnaud Gotlieb, Marius Liaaen	Automated product line test case selection: industrial case study and controlled experiment.	Softw. Syst. Model.	2017	DBLP DOI BibTeX RDF
10	Sungwon Kang, Jungmin Kim, Haeun Baek, Hwi Ahn, Pilsu Jung, Jihyun Lee	Comparison of software product line test derivation methods from the reuse viewpoint.	ICSCA	2017	DBLP DOI BibTeX RDF
10	Yuling Fan, Tao Xu, Likai Dong, Dong Wang 0021	The Study on Grade Categorization Model of Question Based on on-Line Test Data.	ICIC (2)	2017	DBLP DOI BibTeX RDF
10	Manuel Escudero-Lopez, Francesc Moll, Antonio Rubio 0001, Ioannis Vourkas	An on-line test strategy and analysis for a 1T1R crossbar memory.	IOLTS	2017	DBLP DOI BibTeX RDF
10	Mats Carlsson, Arnaud Gotlieb, Dusica Marijan	Software Product Line Test Suite Reduction with Constraint Optimization.	ICSOFT (Selected Papers)	2016	DBLP DOI BibTeX RDF
10	Biswajit Bhowmik, Jatindra Kumar Deka, Santosh Biswas	An on-line test solution for addressing interconnect shorts in on-chip networks.	IOLTS	2016	DBLP DOI BibTeX RDF
10	Brian L. Ji, H. Li, Q. Ye, S. Gausepohl, S. Deora, Dmitry Veksler, S. Vivekanand, H. Chong, H. Stamper, T. Burroughs, C. Johnson, M. Smalley, S. Bennett, V. Kaushik, J. Piccirillo, M. Rodgers, M. Passaro, M. Liehr	In-Line-Test of Variability and Bit-Error-Rate of HfOx-Based Resistive Memory.	CoRR	2015	DBLP BibTeX RDF
10	Hidemasa Kimura, Jumpei Hayashi, Yuichi Demise, Dai Hasegawa, Hiroshi Sakuta	The effects of listening agent in speech-based on-line test system.	EDUCON	2015	DBLP DOI BibTeX RDF
10	Christopher Henard, Mike Papadakis, Yves Le Traon	Mutation-Based Generation of Software Product Line Test Configurations.	SSBSE	2014	DBLP DOI BibTeX RDF
10	Anna Vaskova, Marta Portela-García, Mario García-Valderas, Celia López-Ongil, Matteo Sonza Reorda	Permanent faults on LIN networks: On-line test generation.	IOLTS	2014	DBLP DOI BibTeX RDF
10	Tobias Koal, Markus Ulbricht 0002, Piet Engelke, Heinrich Theodor Vierhaus	On the feasibility of combining on-line-test and self repair for logic circuits.	DDECS	2013	DBLP DOI BibTeX RDF
10	Sungwon Kang, Jihyun Lee	A Systematic Product Line Test Derivation from Activity Diagrams.	CSE	2013	DBLP DOI BibTeX RDF
10	Boyang Du, Matteo Sonza Reorda, Luca Sterpone, Luis Parra, Marta Portela-García, Almudena Lindoso, Luis Entrena	Exploiting the debug interface to support on-line test of control flow errors.	IOLTS	2013	DBLP DOI BibTeX RDF
10	Antoni Fertner, Daniel Cederholm, Per Ola Börjesson	Determination of the Propagation Constant From Single-Ended Line Test Data.	IEEE Trans. Instrum. Meas.	2012	DBLP DOI BibTeX RDF
10	Danel Ahman, Marko Kääramees	Constraint-Based Heuristic On-line Test Generation from Non-deterministic I/O EFSMs	MBT	2012	DBLP DOI BibTeX RDF
10	Lyl M. Ciganda, Marco Gaudesi, Evelyne Lutton, Ernesto Sánchez 0001, Giovanni Squillero, Alberto Paolo Tonda	Automatic Generation of On-Line Test Programs through a Cooperation Scheme.	MTV	2012	DBLP DOI BibTeX RDF
10	Boutheina Bannour, Jose Pablo Escobedo, Christophe Gaston, Pascale Le Gall	Off-Line Test Case Generation for Timed Symbolic Model-Based Conformance Testing.	ICTSS	2012	DBLP DOI BibTeX RDF
10	Jason D. Lee, Rabi N. Mahapatra, Praveen Bhojwani	A distributed concurrent on-line test scheduling protocol for many-core NoC-based systems.	ICCD	2009	DBLP DOI BibTeX RDF
10	Mounir Benabdenbi, François Pêcheux, Etienne Faure	On-line test and monitoring of multi-processor SoCs: A software-based approach.	LATW	2009	DBLP DOI BibTeX RDF
10	Yann Oddos, Katell Morin-Allory, Dominique Borrione, Marc Boule, Zeljko Zilic	MYGEN: automata-based on-line test generator for assertion-based verification.	ACM Great Lakes Symposium on VLSI	2009	DBLP DOI BibTeX RDF	generator, psl, test vector generation
10	Antoine Reverdy, Philippe Perdu, H. Murray, M. de la Bardonnie, Patrick Poirier	Fast and rigorous use of thermal time constant to characterize back end of the line test structure in advanced technology.	Microelectron. Reliab.	2008	DBLP DOI BibTeX RDF
10	Jui-Jer Huang, Chiuan-Che Li, Jiun-Lang Huang	Testing LCD Source Driver IC with Built-on-Scribe-Line Test Circuitry.	ATS	2008	DBLP DOI BibTeX RDF
10	Yann Oddos, Katell Morin-Allory, Dominique Borrione	Prototyping Generators for On-line Test Vector Generation Based on PSL Properties.	DDECS	2007	DBLP DOI BibTeX RDF
10	W. Di Palma, Danilo Ravotto, Edgar E. Sánchez, Massimiliano Schillaci, Matteo Sonza Reorda, Giovanni Squillero	Automotive Microcontroller End-of-Line Test via Software-Based Methodologies.	MTV	2007	DBLP DOI BibTeX RDF
10	Praveen Bhojwani, Rabi N. Mahapatra	A Robust Protocol for Concurrent On-Line Test (COLT) of NoC-based Systems-on-a-Chip.	DAC	2007	DBLP DOI BibTeX RDF
10	Petros Oikonomakos, Mark Zwolinski	An Integrated High-Level On-Line Test Synthesis Tool.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2006	DBLP DOI BibTeX RDF
10	Paolo Bernardi, Letícia Maria Veiras Bolzani, Alberto Manzone, Massimo Osella, Massimo Violante, Matteo Sonza Reorda	Software-Based On-Line Test of Communication Peripherals in Processor-Based Systems for Automotive Applications.	MTV	2006	DBLP DOI BibTeX RDF
10	Yann Oddos, Katell Morin-Allory, Dominique Borrione	On-Line Test Vector Generation from Temporal Constraints Written in PSL.	VLSI-SoC	2006	DBLP DOI BibTeX RDF
10	Rahul Nadkarni, Igor Arsovski, Reid Wistort, Valerie Chickanosky	Improved Match-Line Test and Repair Methodology Including Power-Supply Noise Testing for Content-Addressable Memories.	ITC	2006	DBLP DOI BibTeX RDF
10	Carl Jeffrey, Zhou Xu, Andrew Richardson 0001	Bias Superposition - An On-Line Test Strategy for a MEMS Based Conductivity Sensor.	ETS	2005	DBLP DOI BibTeX RDF
10	Régis Leveugle, R. Cercueil	High Level Modifications of VHDL Descriptions for On-Line Test or Fault Tolerance.	DFT	2001	DBLP DOI BibTeX RDF	circuit architectures, fault tolerance, VHDL, on-line testing
10	Bill Bottoms, Jim Chung, Bernd Koenemann, Glenn Shirley, Lisa Spainhower	Guaranteeing Quality throughout the Product Life Cycle: On-Line Test and Repair to the Rescue.	VTS	2001	DBLP DOI BibTeX RDF
10	Samuel Norman Hamilton, Alex Orailoglu	On-line test for fault-secure fault identification.	IEEE Trans. Very Large Scale Integr. Syst.	2000	DBLP DOI BibTeX RDF
10	Ismet Bayraktaroglu, Alex Orailoglu	Unifying methodologies for high fault coverage concurrent and off-line test of digital filters.	ISCAS	2000	DBLP DOI BibTeX RDF
10	M. E. Nillesen, A. Del Pizzo, M. Pasquariello, R. Rizzo	A Very Flexible DSP-Based Controller for On-Line Test and Control of Industrial Processes.	IOLTW	2000	DBLP DOI BibTeX RDF	avionics and industrial applications, Controller, DSP, automotive, railway
10	Matthias Pflanz, Heinrich Theodor Vierhaus, F. Pompsch	An efficient on-line-test and back-up scheme for embedded processors.	ITC	1999	DBLP DOI BibTeX RDF
10	Eduardo J. Peralías, Adoración Rueda, Juan A. Prieto, José L. Huertas	DfT and on-line test of high-performance data converters: a practical case.	ITC	1998	DBLP DOI BibTeX RDF
10	Diego Vázquez, Adoración Rueda, José L. Huertas	A solution for the on-line test of analog ladder filters.	VTS	1995	DBLP DOI BibTeX RDF	ladder filters, analog ladder filters, stability problems, design for test methodology, solution feasibility, analogue ICs, integrated circuit testing, design for testability, on-line testing, analogue integrated circuits, active filters, active filters, circuit stability
10	Régis Leveugle, T. Michel, Gabriele Saucier	Design of microprocessors with built-in on-line test.	FTCS	1990	DBLP DOI BibTeX RDF
10	R. H. T. Cartwright	4TEL Automated Subscriber Line Test System.	IEEE Trans. Commun.	1982	DBLP DOI BibTeX RDF
10	Mahmoud El-Banna, Dimitar P. Filev, Ratna Babu Chinnam	Automotive Manufacturing: Intelligent Resistance Welding.	Computational Intelligence in Automotive Applications	2008	DBLP DOI BibTeX RDF
10	Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin	Low Cost On-Line Testing of RF Circuits.	IOLTS	2004	DBLP DOI BibTeX RDF