Search results for "single-fault"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
50	Irith Pomeranz, Sudhakar M. Reddy	Unspecified Transition Faults: A Transition Fault Model for At-Speed Fault Simulation and Test Generation.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2008	DBLP DOI BibTeX RDF
37	Irith Pomeranz, Sudhakar M. Reddy	Equivalence and Dominance Relations Between Fault Pairs and Their Use in Fault Pair Collapsing for Fault Diagnosis.	VLSI Design	2007	DBLP DOI BibTeX RDF
35	Nageswara S. V. Rao	On Parallel Algorithms for Single-Fault Diagnosis in Fault Propagation Graph Systems.	IEEE Trans. Parallel Distributed Syst.	1996	DBLP DOI BibTeX RDF	fault propagation graph, operative diagnosis, CREW PRAM and hypercube, Fault diagnosis, single fault
32	Jan Torben Weinkopf, Klaus Harbich, Erich Barke	Parsifal: A Generic and Configurable Fault Emulation Environment with Non-Classical Fault Models.	FPL	2006	DBLP DOI BibTeX RDF
32	Shahrzad Mirkhani, Zainalabedin Navabi	Enhancing Fault Simulation Performance by Dynamic Fault Clustering.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF
29	Roberto Rojas-Cessa, Eiji Oki, H. Jonathan Chao	Concurrent fault detection for a multiple-plane packet switch.	IEEE/ACM Trans. Netw.	2003	DBLP DOI BibTeX RDF	parallel planes, fault detection, packet switch, concurrent testing, single fault
29	Yong Chang Kim, Vishwani D. Agrawal, Kewal K. Saluja	Combinational automatic test pattern generation for acyclic sequential circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2005	DBLP DOI BibTeX RDF
29	Sukumar Ghosh, Arobinda Gupta, Ted Herman, Sriram V. Pemmaraju	Fault-containing self-stabilizing distributed protocols.	Distributed Comput.	2007	DBLP DOI BibTeX RDF	Distributed algorithms, Transformer, Self-stabilization, Fault-containment
28	Tetz C. Huang	An efficient fault-containing self-stabilizing algorithm for the shortest path problem.	Distributed Comput.	2006	DBLP DOI BibTeX RDF	Single-fault situation, Stabilization time, Shortest path problem, Fault-containment, Self-stabilizing algorithm
28	Zoltán Pap, Gyula Csopaki, Sarolta Dibuz	On FSM-Based Fault Diagnosis.	TestCom	2005	DBLP DOI BibTeX RDF	output fault, transfer fault, fault diagnosis, Finite state machine, fault localization
27	Mourad Elhadef, Béchir el Ayeb, Nageswara S. V. Rao	Operative Diagnosis Algorithms for Single-Fault in Graph-Based Systems.	IEA/AIE	2000	DBLP DOI BibTeX RDF
27	Zhide Zeng, Jihua Chen, Hefeng Cao	Research and Implementation of a High Speed Test Generation for Ultra Large Scale Combinational Circuits.	Asian Test Symposium	1999	DBLP DOI BibTeX RDF	finite backtracking test pattern generation, n to 1 tightly coupled integration mode, parallel-pattern, single-fault propagation, ultra large scale combinational circuit (ULSCC
26	Anders Lyhne Christensen, Rehan O'Grady, Mauro Birattari, Marco Dorigo	Fault detection in autonomous robots based on fault injection and learning.	Auton. Robots	2008	DBLP DOI BibTeX RDF	Model-free, Learning, Mobile robots, Fault detection, Fault injection
26	Klaus Echtle, Irene Eusgeld	A Genetic Algorithm for Fault-Tolerant System Design.	LADC	2003	DBLP DOI BibTeX RDF	analysis of fault-tolerant behaviour, genetic algorithm, Fault tolerance, fault model, fitness function
26	Hyung Ki Lee, Dong Sam Ha	HOPE: an efficient parallel fault simulator for synchronous sequential circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1996	DBLP DOI BibTeX RDF
26	Yunzhan Gong, Wanli Xu, Xiaowei Li 0001	An Expression's Single Fault Model and the Testing Methods.	Asian Test Symposium	2003	DBLP DOI BibTeX RDF
24	Wei-Kang Huang, Fabrizio Lombardi	An approach for testing programmable/configurable field programmable gate arrays.	VTS	1996	DBLP DOI BibTeX RDF	behavioral characterization, single fault detection, disjoint one-dimensional arrays, unilateral horizontal connections, common vertical input lines, array testing, logic blocks, field programmable gate arrays, field programmable gate arrays, VLSI, logic testing, integrated circuit testing, stuck-at fault, FPGA testing, functional fault, hybrid fault model
24	Byung S. So, Charles R. Kime	A fault simulation method: Parallel pattern critical path tracing.	J. Electron. Test.	1993	DBLP DOI BibTeX RDF	parallel pattern simulation, single fault propagation, fault simulation, Critical path tracing
24	Jwu E. Chen, Chung-Len Lee 0001, Wen-Zen Shen	Single-fault fault-collapsing analysis in sequential logic circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1991	DBLP DOI BibTeX RDF
23	Irith Pomeranz, Sudhakar M. Reddy	Generation of Broadside Transition-Fault Test Sets That Detect Four-Way Bridging Faults.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2007	DBLP DOI BibTeX RDF
23	Man Fai Lau, Ying Liu, Tsong Yueh Chen, Yuen-Tak Yu	On Detecting Double Literal Faults in Boolean Expressions.	Ada-Europe	2007	DBLP DOI BibTeX RDF	Test case generation, Black-box testing, Fault-based testing, Boolean specification
23	Irith Pomeranz, Sudhakar M. Reddy	Generation of broadside transition fault test sets that detect four-way bridging faults.	DATE	2006	DBLP DOI BibTeX RDF
23	Michiko Inoue, Emil Gizdarski, Hideo Fujiwara	A class of sequential circuits with combinational test generation complexity under single-fault assumption.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	combinational test generation complexity, internally balanced structures, combinational test generation, separable primary inputs, undetectability, fault diagnosis, logic testing, sequential circuits, sequential circuits, automatic test pattern generation, combinational circuits, test sequence, single stuck-at-faults, multiple stuck-at faults, single-fault
23	Xijiang Lin, Wu-Tung Cheng, Irith Pomeranz, Sudhakar M. Reddy	SIFAR: Static Test Compaction for Synchronous Sequential Circuits Based on Single Fault Restoration.	VTS	2000	DBLP DOI BibTeX RDF	Test Segment, Parallel Pattern Simulator, Vector Restoration, Single Fault Restoration, Fault Coverage, Synchronous Sequential Circuits, Test Length, Static Test Compaction
23	Arun K. Somani, Vinod K. Agarwal, David Avis	On the Complexity of Single Fault Set Diagnosability and Diagnosis Problems.	IEEE Trans. Computers	1989	DBLP DOI BibTeX RDF	single fault set diagnosability, diagnosis problems, symmetric invalidation models, polynomial time-complexity algorithm, t-diagnosability, computational complexity, complexity, fault tolerant computing
23	Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu	A New Method for Diagnosing Multiple Stuck-at Faults using Multiple and Single Fault Simulations.	VTS	1999	DBLP DOI BibTeX RDF
22	Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu, Nobuhiro Yanagida	Multiple Fault Diagnosis in Logic Circuits Using EB Tester and Multiple/Single Fault Simulators.	Asian Test Symposium	1999	DBLP DOI BibTeX RDF	single/multiple fault simulators, EB tester, fault diagnosis, combinational circuit, multiple stuck-at fault
22	Vishwani D. Agrawal, Srimat T. Chakradhar	Combinational ATPG theorems for identifying untestable faults in sequential circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1995	DBLP DOI BibTeX RDF
22	Man Fai Lau, Ying Liu, Yuen-Tak Yu	Detecting Double Faults on Term and Literal in Boolean Expressions.	QSIC	2007	DBLP DOI BibTeX RDF
22	Wu-Tung Cheng, Meng-Lin Yu	Differential Fault Simulation - a Fast Method Using Minimal Memory.	DAC	1989	DBLP DOI BibTeX RDF
21	Manan Syal, Michael S. Hsiao	New techniques for untestable fault identification in sequential circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2006	DBLP DOI BibTeX RDF
19	Yung-Chieh Lin, Feng Lu 0002, Kwang-Ting Cheng	Multiple-Fault Diagnosis Based On Adaptive Diagnostic Test Pattern Generation.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2007	DBLP DOI BibTeX RDF
19	Hin-Sing Siu, Yeh-Hao Chin, Wei-Pang Yang	Byzantine Agreement in the Presence of Mixed Faults on Processors and Links.	IEEE Trans. Parallel Distributed Syst.	1998	DBLP DOI BibTeX RDF	synchronization, Byzantine agreement, fault-tolerant distributed system, hybrid fault model, general network
19	Anurag Dasgupta, Sukumar Ghosh, Xin Xiao	Probabilistic Fault-Containment.	SSS	2007	DBLP DOI BibTeX RDF
19	Yinlei Yu, Jian Xu, Wei-Kang Huang, Fabrizio Lombardi	Diagnosing Single Faults for Interconnects in SRAM Based FPGAs.	ASP-DAC	1999	DBLP DOI BibTeX RDF	FPGA, testing, fault diagnosis, fault model
19	Cheng Gong, Zheng Zheng 0001, Yunqian Zhang, Zhenyu Zhang 0004, Yunzhi Xue	Factorising the Multiple Fault Localization Problem: Adapting Single-Fault Localizer to Multi-fault Programs.	APSEC	2012	DBLP DOI BibTeX RDF
18	Yung-Chieh Lin, Kwang-Ting Cheng	Multiple-fault diagnosis based on single-fault activation and single-output observation.	DATE	2006	DBLP DOI BibTeX RDF
18	Yigang He, Wenji Zhu	Fault Diagnosis of Nonlinear Analog Circuits Using Neural Networks and Multi-Space Transformations.	ISNN (3)	2009	DBLP DOI BibTeX RDF	Bilinear Transformation, Space Transformation, Neural Network, Fault Diagnosis, Analog Circuits
18	Jiang Brandon Liu, Andreas G. Veneris	Incremental fault diagnosis.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2005	DBLP DOI BibTeX RDF
18	Koji Hashimoto, Tatsuhiro Tsuchiya, Tohru Kikuno	Fault-Secure Scheduling of Arbitrary Task Graphs to Multiprocessor Systems.	DSN	2000	DBLP DOI BibTeX RDF	fault-secure scheduling, tests, multiprocessors, task graphs, fault security
18	Marcello Dalpasso, Michele Favalli, Piero Olivo, Bruno Riccò	Fault simulation of parametric bridging faults in CMOS IC's.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1993	DBLP DOI BibTeX RDF
18	Thomas M. Niermann, Wu-Tung Cheng, Janak H. Patel	PROOFS: a fast, memory-efficient sequential circuit fault simulator.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1992	DBLP DOI BibTeX RDF
17	Gary D. Hachtel, Reily M. Jacoby, Kurt Keutzer, Christopher R. Morrison	On properties of algebraic transformations and the synthesis of multifault-irredundant circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1992	DBLP DOI BibTeX RDF
17	Ji-Cherng Lin, Tetz C. Huang	An Efficient Fault-Containing Self-Stabilizing Algorithm for Finding a Maximal Independent Set.	IEEE Trans. Parallel Distributed Syst.	2003	DBLP DOI BibTeX RDF	Central demon, single transient fault, restrictions on guard conditions, primary variables, auxiliary secondary variables, stabilization time, contamination number, maximal independent set, fault-containment
15	Anurag Dasgupta, Sukumar Ghosh, Xin Xiao	Fault-Containment in Weakly-Stabilizing Systems.	SSS	2009	DBLP DOI BibTeX RDF
15	Honghai Feng, Baoyan Liu, Liyun He, Bingru Yang, Yueli Li, Zhao Shuo	Using Rough Set to Induce More Abstract Rules from Rule Base.	KES (1)	2006	DBLP DOI BibTeX RDF
15	Michael A. Kochte, Marcel Schaal, Hans-Joachim Wunderlich, Christian G. Zoellin	Efficient fault simulation on many-core processors.	DAC	2010	DBLP DOI BibTeX RDF	PPSFP, parallel fault simulation, many-core processors
15	Hung-Chuan Lai, Shi-Jinn Horng, Yong-Yuan Chen, Pingzhi Fan, Yi Pan 0001	A New Concurrent Detection of Control Flow Errors Based on DCT Technique.	PRDC	2007	DBLP DOI BibTeX RDF
15	Dhiraj K. Pradhan, Chunsheng Liu	EBIST: a novel test generator with built-in fault detection capability.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2005	DBLP DOI BibTeX RDF
15	Zhiyuan Wang, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski	Multiple Fault Diagnosis Using n-Detection Tests.	ICCD	2003	DBLP DOI BibTeX RDF
15	Kumar N. Dwarakanath, R. D. (Shawn) Blanton	Exploiting Dominance and Equivalence using Fault Tuples.	VTS	2002	DBLP DOI BibTeX RDF
15	Irith Pomeranz, Sudhakar M. Reddy, Ruifeng Guo	Static test compaction for synchronous sequential circuits based on vector restoration.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1999	DBLP DOI BibTeX RDF
15	Wolfgang Meyer 0002, Raul Camposano	Active timing multilevel fault-simulation with switch-level accuracy.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1995	DBLP DOI BibTeX RDF
15	Peter C. Maxwell, Robert C. Aitken	IDDQ testing as a component of a test suite: The need for several fault coverage metrics.	J. Electron. Test.	1992	DBLP DOI BibTeX RDF	quality, fault coverage, scan, functional testing, Current testing, physical defects
15	Robert C. Aitken	Diagnosis of leakage faults with IDDQ.	J. Electron. Test.	1992	DBLP DOI BibTeX RDF	leakage fault model, Fault diagnosis, I DDQ testing
15	Wu-Tung Cheng, Janak H. Patel	PROOFS: a super fast fault simulator for sequential circuits.	EURO-DAC	1990	DBLP DOI BibTeX RDF
15	Thomas M. Niermann, Wu-Tung Cheng, Janak H. Patel	Proofs: A Fast, Memory Efficient Sequential Circuit Fault Simulator.	DAC	1990	DBLP DOI BibTeX RDF
14	Dan Alexandrescu, Lorena Anghel, Michael Nicolaidis	Simulating Single Event Transients in VDSM ICs for Ground Level Radiation.	J. Electron. Test.	2004	DBLP DOI BibTeX RDF	single fault propagation, fault simulation, soft-errors, single event upsets
14	Kuen-Jong Lee, Jing-Jou Tang, Tsung-Chu Huang, Cheng-Liang Tsai	Combination Of Automatic Test Pattern Generation And Built-In Intermediate Voltage Sensing For Detecting CMOS Bridging Faults.	Asian Test Symposium	1996	DBLP DOI BibTeX RDF	CMOS bridging faults detection, ATPG system, built-in intermediate voltage sensing, BIFEST system, PODEM-like process, PPSFP-based process, logic monitoring, gate threshold ranges, Byzantine General's Command Problem, feedback bridging faults, parallel pattern single fault propagation, fault modelling, fault simulation, fault coverage, greedy algorithm, CMOS logic circuits
14	Jianli Sun, Eduard Cerny, Jan Gecsei	Fault Tolerance in a Class of Sorting Networks.	IEEE Trans. Computers	1994	DBLP DOI BibTeX RDF	comparators (circuits), single-fault tolerance, 1-fault tolerant design, balanced sorting network, 2-fault tolerant design, fault tolerance, reliability, parallel processing, fault tolerant computing, fault tolerant computing, sorting, comparators, sorting networks, multistage network
14	Tse-Yun Feng, Chuan-lin Wu	Fault-Diagnosis for a Class of Multistage Interconnection Networks.	IEEE Trans. Computers	1981	DBLP DOI BibTeX RDF	Baseline network, fault detection and location, parallel processing, fault model, multistage interconnection networks, multiple faults, single fault
14	Vinod K. Agarwal	Multiple Fault Detection in Programmable Logic Arrays.	IEEE Trans. Computers	1980	DBLP DOI BibTeX RDF	single fault coverage, Contact faults, PLA fault detection, PLA modeling, programmable logic arrays, masking, multiple fault detection
14	Kolar L. Kodandapani, Sharad C. Seth	On Combinational Networks with Restricted Fan-Out.	IEEE Trans. Computers	1978	DBLP DOI BibTeX RDF	single fault location, Characterization of fan-out-free networks, counting of fan-out-free, fan-out-free networks, localized fan outs, functional decomposition, combinational networks, multiple fault detection
14	Dennis A. Reynolds, Gernot Metze	Fault Detection Capabilities of Alternating Logic.	IEEE Trans. Computers	1978	DBLP DOI BibTeX RDF	Alternating logic, alternating systems, on-line detection, synchronous machine, stuck-at-faults, combinational network, time redundancy, single fault, totally self-checking
14	Aikata, Banashri Karmakar, Dhiman Saha	DESIV: Differential Fault Analysis of SIV-Rijndael256 with a Single Fault.	HOST	2020	DBLP DOI BibTeX RDF
14	David Landsberg, Youcheng Sun, Daniel Kroening	Optimising Spectrum Based Fault Localisation for Single Fault Programs Using Specifications.	FASE	2018	DBLP DOI BibTeX RDF
14	Alexandre Perez, Rui Abreu 0001, Marcelo d'Amorim	Prevalence of Single-Fault Fixes and Its Impact on Fault Localization.	ICST	2017	DBLP DOI BibTeX RDF
14	Xin Xia 0001, Liang Gong, Tien-Duy B. Le, David Lo 0001, Lingxiao Jiang, Hongyu Zhang 0002	Diversity maximization speedup for localizing faults in single-fault and multi-fault programs.	Autom. Softw. Eng.	2016	DBLP DOI BibTeX RDF
14	Raimund Ubar, Sergei Kostin, Jaan Raik	Synthesis of multiple fault oriented test groups from single fault test sets.	DTIS	2013	DBLP DOI BibTeX RDF
14	Xin-jie Zhao 0001, Shize Guo, Fan Zhang 0010, Tao Wang 0008, Zhijie Shi, Keke Ji	Algebraic Differential Fault Attacks on LED using a Single Fault Injection.	IACR Cryptol. ePrint Arch.	2012	DBLP BibTeX RDF
14	Yoseop Lim, Jaeseok Park, Sungho Kang	An accurate diagnosis of transition fault clusters based on single fault simulation.	IEICE Electron. Express	2012	DBLP DOI BibTeX RDF
14	Ruilin Li, Bing Sun 0001, Chao Li 0002, Jianxiong You	Differential Fault Analysis on SMS4 using a single fault.	Inf. Process. Lett.	2011	DBLP DOI BibTeX RDF
14	Michael Tunstall, Debdeep Mukhopadhyay, Subidh Ali	Differential Fault Analysis of the Advanced Encryption Standard Using a Single Fault.	WISTP	2011	DBLP DOI BibTeX RDF
14	Subidh Ali, Debdeep Mukhopadhyay	A Differential Fault Analysis on AES Key Schedule Using Single Fault.	FDTC	2011	DBLP DOI BibTeX RDF
14	Ruilin Li, Bing Sun 0001, Chao Li 0002, Jianxiong You	Differential Fault Analysis on SMS4 Using a Single Fault.	IACR Cryptol. ePrint Arch.	2010	DBLP BibTeX RDF
14	Subidh Ali, Debdeep Mukhopadhyay	Acceleration of Differential Fault Analysis of the Advanced Encryption Standard Using Single Fault.	IACR Cryptol. ePrint Arch.	2010	DBLP BibTeX RDF
14	Michael Tunstall, Debdeep Mukhopadhyay	Differential Fault Analysis of the Advanced Encryption Standard using a Single Fault.	IACR Cryptol. ePrint Arch.	2009	DBLP BibTeX RDF
14	K. Lai, Parag K. Lala	Multiple Fault Detection in Fan-Out Free Circuits Using Minimal Single Fault Test Set.	IEEE Trans. Computers	1996	DBLP DOI BibTeX RDF	fan-out-free circuit, output count, test generation, Multiple faults
14	Jens Güthoff, Volkmar Sieh	Combining Software-Implemented and Simulation-Based Fault Injection into a Single Fault Injection Method.	FTCS	1995	DBLP DOI BibTeX RDF
14	Wen-Ben Jone, Patrick H. Madden	Multiple fault testing using minimal single fault test set for fanout-free circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1993	DBLP DOI BibTeX RDF
14	Tah-Yuan Kuo, Jhing-Fa Wang, Jau-Yien Lee	Enhancing the multiple-fault detection of single-fault test sets.	Comput. Aided Des.	1992	DBLP DOI BibTeX RDF
14	Hyung Ki Lee, Dong Sam Ha	An Efficient, Forward Fault Simulation Algorithm Based on the Parallel Pattern Single Fault Propagation.	ITC	1991	DBLP DOI BibTeX RDF
14	Ken Kubiak, W. Kent Fuchs	Multiple-Fault Simulation and Coverage of Deterministic Single-Fault Test Sets.	ITC	1991	DBLP DOI BibTeX RDF
14	Jwu E. Chen, Chung-Len Lee 0001, Wen-Zen Shen	Single-fault fault collapsing analysis in sequential logic circuits.	ITC	1990	DBLP DOI BibTeX RDF
14	Joseph L. A. Hughes	Multiple fault detection using single fault test sets.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1988	DBLP DOI BibTeX RDF
14	John A. Waicukauski, Eric Lindbloom, Vijay S. Iyengar, Barry K. Rosen	Transition Fault Simulation by Parallel Pattern Single Fault Propagation.	ITC	1986	DBLP BibTeX RDF
14	Vinod K. Agarwal, Andy S. F. Fung	Multiple Fault Testing of Large Circuits by Single Fault Test Sets.	IEEE Trans. Computers	1981	DBLP DOI BibTeX RDF
14	Ingebjørg Theiss, Olav Lysne	FRoots: A Fault Tolerant and Topology-Flexible Routing Technique.	IEEE Trans. Parallel Distributed Syst.	2006	DBLP DOI BibTeX RDF	path redundancy, interconnection networks, Fault-tolerant routing, deadlock freedom
14	Kalpesh Kapoor	Formal Analysis of Coupling Hypothesis for Logical Faults.	Innov. Syst. Softw. Eng.	2006	DBLP DOI BibTeX RDF	Logical fault, Software testing, Mutation testing, Fault-based testing, Boolean specification
14	Jason Waddle, David A. Wagner 0001	Fault Attacks on Dual-Rail Encoded Systems.	ACSAC	2005	DBLP DOI BibTeX RDF
14	Sabine M. Böhm, Klaus Echtle	State Space Reduction in SDL Models of Fault-Tolerant Systems.	IPDPS	2004	DBLP DOI BibTeX RDF
14	Jayabrata Ghosh-Dastidar, Nur A. Touba	A Systematic Approach for Diagnosing Multiple Delay Faults.	DFT	1998	DBLP DOI BibTeX RDF
14	Li-C. Wang, M. Ray Mercer, Sophia W. Kao, Thomas W. Williams	On the decline of testing efficiency as fault coverage approaches 100%.	VTS	1995	DBLP DOI BibTeX RDF	single stuck-at fault model, ISCAS benchmark circuits, nontarget defects, fault diagnosis, logic testing, integrated circuit testing, automatic testing, fault coverage, test pattern generation, manufacturing process, test quality, production testing, testing efficiency, circuit sizes
14	Antoine Nonclercq, Laurent Lonys, Anne Vanhoestenberghe, Andreas Demosthenous, Nick Donaldson	Safety of multi-channel stimulation implants: a single blocking capacitor per channel is not sufficient after single-fault failure.	Medical Biol. Eng. Comput.	2012	DBLP DOI BibTeX RDF
12	Jan Schat	Calculating the fault coverage for dual neighboring faults using single stuck-at fault patterns.	DDECS	2008	DBLP DOI BibTeX RDF
12	Iwan Tabakow	Using Place and Transition Fault Net Models for Sequential Diagnosis Time Assessment in Discrete Event Systems.	IEA/AIE	2008	DBLP DOI BibTeX RDF
12	Zhiyuan Wang, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski	Analysis and methodology for multiple-fault diagnosis.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2006	DBLP DOI BibTeX RDF
12	Hayssam El-Razouk, Zine Abid	A New Transistor-Redundant Voter for Defect-Tolerant Digital Circuits.	CCECE	2006	DBLP DOI BibTeX RDF
12	Sining Liu, Brian King, Wei Wang 0003	A CRT-RSA Algorithm Secure against Hardware Fault Attacks.	DASC	2006	DBLP DOI BibTeX RDF	algorithm, smart card, RSA, Chinese Remainder Theorem
12	Vishwani D. Agrawal, Alok S. Doshi	Concurrent Test Generation.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF