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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 244 occurrences of 166 keywords
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Results
Found 205 publication records. Showing 205 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
50 | Irith Pomeranz, Sudhakar M. Reddy |
Unspecified Transition Faults: A Transition Fault Model for At-Speed Fault Simulation and Test Generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(1), pp. 137-146, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
37 | Irith Pomeranz, Sudhakar M. Reddy |
Equivalence and Dominance Relations Between Fault Pairs and Their Use in Fault Pair Collapsing for Fault Diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 20th International Conference on VLSI Design (VLSI Design 2007), Sixth International Conference on Embedded Systems (ICES 2007), 6-10 January 2007, Bangalore, India, pp. 498-503, 2007, IEEE Computer Society, 0-7695-2762-0. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
35 | Nageswara S. V. Rao |
On Parallel Algorithms for Single-Fault Diagnosis in Fault Propagation Graph Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Parallel Distributed Syst. ![In: IEEE Trans. Parallel Distributed Syst. 7(12), pp. 1217-1223, 1996. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
fault propagation graph, operative diagnosis, CREW PRAM and hypercube, Fault diagnosis, single fault |
32 | Jan Torben Weinkopf, Klaus Harbich, Erich Barke |
Parsifal: A Generic and Configurable Fault Emulation Environment with Non-Classical Fault Models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FPL ![In: Proceedings of the 2006 International Conference on Field Programmable Logic and Applications (FPL), Madrid, Spain, August 28-30, 2006, pp. 1-6, 2006, IEEE, 1-4244-0312-X. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
32 | Shahrzad Mirkhani, Zainalabedin Navabi |
Enhancing Fault Simulation Performance by Dynamic Fault Clustering. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India, pp. 278-283, 2005, IEEE Computer Society, 0-7695-2481-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
29 | Roberto Rojas-Cessa, Eiji Oki, H. Jonathan Chao |
Concurrent fault detection for a multiple-plane packet switch. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE/ACM Trans. Netw. ![In: IEEE/ACM Trans. Netw. 11(4), pp. 616-627, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
parallel planes, fault detection, packet switch, concurrent testing, single fault |
29 | Yong Chang Kim, Vishwani D. Agrawal, Kewal K. Saluja |
Combinational automatic test pattern generation for acyclic sequential circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(6), pp. 948-956, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
29 | Sukumar Ghosh, Arobinda Gupta, Ted Herman, Sriram V. Pemmaraju |
Fault-containing self-stabilizing distributed protocols. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Distributed Comput. ![In: Distributed Comput. 20(1), pp. 53-73, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Distributed algorithms, Transformer, Self-stabilization, Fault-containment |
28 | Tetz C. Huang |
An efficient fault-containing self-stabilizing algorithm for the shortest path problem. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Distributed Comput. ![In: Distributed Comput. 19(2), pp. 149-161, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Single-fault situation, Stabilization time, Shortest path problem, Fault-containment, Self-stabilizing algorithm |
28 | Zoltán Pap, Gyula Csopaki, Sarolta Dibuz |
On FSM-Based Fault Diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
TestCom ![In: Testing of Communicating Systems, 17th IFIP TC6/WG 6.1 International Conference, TestCom 2005, Montreal, Canada, May 31 - June 2, 2005, Proceedings, pp. 159-174, 2005, Springer, 3-540-26054-4. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
output fault, transfer fault, fault diagnosis, Finite state machine, fault localization |
27 | Mourad Elhadef, Béchir el Ayeb, Nageswara S. V. Rao |
Operative Diagnosis Algorithms for Single-Fault in Graph-Based Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEA/AIE ![In: Intelligent Problem Solving, Methodologies and Approaches, 13th International Conference on Industrial and Engineering Applications of Artificial Intelligence and Expert Systems, IEA/AIE 2000, New Orleans, Louisiana, USA, June 19-22, 2000, Proceedings, pp. 192-197, 2000, Springer, 3-540-67689-9. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
27 | Zhide Zeng, Jihua Chen, Hefeng Cao |
Research and Implementation of a High Speed Test Generation for Ultra Large Scale Combinational Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 8th Asian Test Symposium (ATS '99), 16-18 November 1999, Shanghai, China, pp. 70-74, 1999, IEEE Computer Society, 0-7695-0315-2. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
finite backtracking test pattern generation, n to 1 tightly coupled integration mode, parallel-pattern, single-fault propagation, ultra large scale combinational circuit (ULSCC |
26 | Anders Lyhne Christensen, Rehan O'Grady, Mauro Birattari, Marco Dorigo |
Fault detection in autonomous robots based on fault injection and learning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Auton. Robots ![In: Auton. Robots 24(1), pp. 49-67, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Model-free, Learning, Mobile robots, Fault detection, Fault injection |
26 | Klaus Echtle, Irene Eusgeld |
A Genetic Algorithm for Fault-Tolerant System Design. ![Search on Bibsonomy](Pics/bibsonomy.png) |
LADC ![In: Dependable Computing, First Latin-American Symposium, LADC 2003, Sao Paulo, Brazil, October 21-24, 2003, Proceedings, pp. 197-213, 2003, Springer, 3-540-20224-2. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
analysis of fault-tolerant behaviour, genetic algorithm, Fault tolerance, fault model, fitness function |
26 | Hyung Ki Lee, Dong Sam Ha |
HOPE: an efficient parallel fault simulator for synchronous sequential circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 15(9), pp. 1048-1058, 1996. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
|
26 | Yunzhan Gong, Wanli Xu, Xiaowei Li 0001 |
An Expression's Single Fault Model and the Testing Methods. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, pp. 110-115, 2003, IEEE Computer Society, 0-7695-1951-2. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
24 | Wei-Kang Huang, Fabrizio Lombardi |
An approach for testing programmable/configurable field programmable gate arrays. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 14th IEEE VLSI Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, USA, pp. 450-455, 1996, IEEE Computer Society, 0-8186-7304-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
behavioral characterization, single fault detection, disjoint one-dimensional arrays, unilateral horizontal connections, common vertical input lines, array testing, logic blocks, field programmable gate arrays, field programmable gate arrays, VLSI, logic testing, integrated circuit testing, stuck-at fault, FPGA testing, functional fault, hybrid fault model |
24 | Byung S. So, Charles R. Kime |
A fault simulation method: Parallel pattern critical path tracing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 4(3), pp. 255-265, 1993. The full citation details ...](Pics/full.jpeg) |
1993 |
DBLP DOI BibTeX RDF |
parallel pattern simulation, single fault propagation, fault simulation, Critical path tracing |
24 | Jwu E. Chen, Chung-Len Lee 0001, Wen-Zen Shen |
Single-fault fault-collapsing analysis in sequential logic circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 10(12), pp. 1559-1568, 1991. The full citation details ...](Pics/full.jpeg) |
1991 |
DBLP DOI BibTeX RDF |
|
23 | Irith Pomeranz, Sudhakar M. Reddy |
Generation of Broadside Transition-Fault Test Sets That Detect Four-Way Bridging Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(7), pp. 1311-1319, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
23 | Man Fai Lau, Ying Liu, Tsong Yueh Chen, Yuen-Tak Yu |
On Detecting Double Literal Faults in Boolean Expressions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Ada-Europe ![In: Reliable Software Technologies - Ada Europe 2007, 12th Ada-Europe International Conference on Reliable Software Technologies, Geneva, Switzerland, June 25-29, 2007, Proceedings, pp. 55-68, 2007, Springer, 978-3-540-73229-7. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Test case generation, Black-box testing, Fault-based testing, Boolean specification |
23 | Irith Pomeranz, Sudhakar M. Reddy |
Generation of broadside transition fault test sets that detect four-way bridging faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006, pp. 907-912, 2006, European Design and Automation Association, Leuven, Belgium, 3-9810801-1-4. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
23 | Michiko Inoue, Emil Gizdarski, Hideo Fujiwara |
A class of sequential circuits with combinational test generation complexity under single-fault assumption. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, pp. 398-403, 2000, IEEE Computer Society, 0-7695-0887-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
combinational test generation complexity, internally balanced structures, combinational test generation, separable primary inputs, undetectability, fault diagnosis, logic testing, sequential circuits, sequential circuits, automatic test pattern generation, combinational circuits, test sequence, single stuck-at-faults, multiple stuck-at faults, single-fault |
23 | Xijiang Lin, Wu-Tung Cheng, Irith Pomeranz, Sudhakar M. Reddy |
SIFAR: Static Test Compaction for Synchronous Sequential Circuits Based on Single Fault Restoration. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada, pp. 205-212, 2000, IEEE Computer Society, 0-7695-0613-5. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
Test Segment, Parallel Pattern Simulator, Vector Restoration, Single Fault Restoration, Fault Coverage, Synchronous Sequential Circuits, Test Length, Static Test Compaction |
23 | Arun K. Somani, Vinod K. Agarwal, David Avis |
On the Complexity of Single Fault Set Diagnosability and Diagnosis Problems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 38(2), pp. 195-201, 1989. The full citation details ...](Pics/full.jpeg) |
1989 |
DBLP DOI BibTeX RDF |
single fault set diagnosability, diagnosis problems, symmetric invalidation models, polynomial time-complexity algorithm, t-diagnosability, computational complexity, complexity, fault tolerant computing |
23 | Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu |
A New Method for Diagnosing Multiple Stuck-at Faults using Multiple and Single Fault Simulations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 17th IEEE VLSI Test Symposium (VTS '99), 25-30 April 1999, San Diego, CA, USA, pp. 64-69, 1999, IEEE Computer Society, 0-7695-0146-X. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
22 | Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu, Nobuhiro Yanagida |
Multiple Fault Diagnosis in Logic Circuits Using EB Tester and Multiple/Single Fault Simulators. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 8th Asian Test Symposium (ATS '99), 16-18 November 1999, Shanghai, China, pp. 341-346, 1999, IEEE Computer Society, 0-7695-0315-2. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
single/multiple fault simulators, EB tester, fault diagnosis, combinational circuit, multiple stuck-at fault |
22 | Vishwani D. Agrawal, Srimat T. Chakradhar |
Combinational ATPG theorems for identifying untestable faults in sequential circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14(9), pp. 1155-1160, 1995. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
|
22 | Man Fai Lau, Ying Liu, Yuen-Tak Yu |
Detecting Double Faults on Term and Literal in Boolean Expressions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
QSIC ![In: Seventh International Conference on Quality Software (QSIC 2007), 11-12 October 2007, Portland, Oregon, USA, pp. 117-126, 2007, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
22 | Wu-Tung Cheng, Meng-Lin Yu |
Differential Fault Simulation - a Fast Method Using Minimal Memory. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 26th ACM/IEEE Design Automation Conference, Las Vegas, Nevada, USA, June 25-29, 1989., pp. 424-428, 1989, ACM Press. The full citation details ...](Pics/full.jpeg) |
1989 |
DBLP DOI BibTeX RDF |
|
21 | Manan Syal, Michael S. Hsiao |
New techniques for untestable fault identification in sequential circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(6), pp. 1117-1131, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
19 | Yung-Chieh Lin, Feng Lu 0002, Kwang-Ting Cheng |
Multiple-Fault Diagnosis Based On Adaptive Diagnostic Test Pattern Generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(5), pp. 932-942, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
19 | Hin-Sing Siu, Yeh-Hao Chin, Wei-Pang Yang |
Byzantine Agreement in the Presence of Mixed Faults on Processors and Links. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Parallel Distributed Syst. ![In: IEEE Trans. Parallel Distributed Syst. 9(4), pp. 335-345, 1998. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
synchronization, Byzantine agreement, fault-tolerant distributed system, hybrid fault model, general network |
19 | Anurag Dasgupta, Sukumar Ghosh, Xin Xiao |
Probabilistic Fault-Containment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SSS ![In: Stabilization, Safety, and Security of Distributed Systems, 9th International Symposium, SSS 2007, Paris, France, November 14-16, 2007, Proceedings, pp. 189-203, 2007, Springer, 978-3-540-76626-1. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
19 | Yinlei Yu, Jian Xu, Wei-Kang Huang, Fabrizio Lombardi |
Diagnosing Single Faults for Interconnects in SRAM Based FPGAs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASP-DAC ![In: Proceedings of the 1999 Conference on Asia South Pacific Design Automation, Wanchai, Hong Kong, China, January 18-21, 1999, pp. 283-286, 1999, IEEE Computer Society, 0-7803-5012-X. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
FPGA, testing, fault diagnosis, fault model |
19 | Cheng Gong, Zheng Zheng 0001, Yunqian Zhang, Zhenyu Zhang 0004, Yunzhi Xue |
Factorising the Multiple Fault Localization Problem: Adapting Single-Fault Localizer to Multi-fault Programs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
APSEC ![In: 19th Asia-Pacific Software Engineering Conference, APSEC 2012, Hong Kong, China, December 4-7, 2012, pp. 729-732, 2012, IEEE, 978-0-7695-4922-4. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
18 | Yung-Chieh Lin, Kwang-Ting Cheng |
Multiple-fault diagnosis based on single-fault activation and single-output observation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DATE ![In: Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006, pp. 424-429, 2006, European Design and Automation Association, Leuven, Belgium, 3-9810801-1-4. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
18 | Yigang He, Wenji Zhu |
Fault Diagnosis of Nonlinear Analog Circuits Using Neural Networks and Multi-Space Transformations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISNN (3) ![In: Advances in Neural Networks - ISNN 2009, 6th International Symposium on Neural Networks, ISNN 2009, Wuhan, China, May 26-29, 2009, Proceedings, Part III, pp. 714-723, 2009, Springer, 978-3-642-01512-0. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
Bilinear Transformation, Space Transformation, Neural Network, Fault Diagnosis, Analog Circuits |
18 | Jiang Brandon Liu, Andreas G. Veneris |
Incremental fault diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(2), pp. 240-251, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
18 | Koji Hashimoto, Tatsuhiro Tsuchiya, Tohru Kikuno |
Fault-Secure Scheduling of Arbitrary Task Graphs to Multiprocessor Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DSN ![In: 2000 International Conference on Dependable Systems and Networks (DSN 2000) (formerly FTCS-30 and DCCA-8), 25-28 June 2000, New York, NY, USA, pp. 203-212, 2000, IEEE Computer Society, 0-7695-0707-7. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
fault-secure scheduling, tests, multiprocessors, task graphs, fault security |
18 | Marcello Dalpasso, Michele Favalli, Piero Olivo, Bruno Riccò |
Fault simulation of parametric bridging faults in CMOS IC's. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 12(9), pp. 1403-1410, 1993. The full citation details ...](Pics/full.jpeg) |
1993 |
DBLP DOI BibTeX RDF |
|
18 | Thomas M. Niermann, Wu-Tung Cheng, Janak H. Patel |
PROOFS: a fast, memory-efficient sequential circuit fault simulator. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(2), pp. 198-207, 1992. The full citation details ...](Pics/full.jpeg) |
1992 |
DBLP DOI BibTeX RDF |
|
17 | Gary D. Hachtel, Reily M. Jacoby, Kurt Keutzer, Christopher R. Morrison |
On properties of algebraic transformations and the synthesis of multifault-irredundant circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(3), pp. 313-321, 1992. The full citation details ...](Pics/full.jpeg) |
1992 |
DBLP DOI BibTeX RDF |
|
17 | Ji-Cherng Lin, Tetz C. Huang |
An Efficient Fault-Containing Self-Stabilizing Algorithm for Finding a Maximal Independent Set. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Parallel Distributed Syst. ![In: IEEE Trans. Parallel Distributed Syst. 14(8), pp. 742-754, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
Central demon, single transient fault, restrictions on guard conditions, primary variables, auxiliary secondary variables, stabilization time, contamination number, maximal independent set, fault-containment |
15 | Anurag Dasgupta, Sukumar Ghosh, Xin Xiao |
Fault-Containment in Weakly-Stabilizing Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SSS ![In: Stabilization, Safety, and Security of Distributed Systems, 11th International Symposium, SSS 2009, Lyon, France, November 3-6, 2009. Proceedings, pp. 209-223, 2009, Springer, 978-3-642-05117-3. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
15 | Honghai Feng, Baoyan Liu, Liyun He, Bingru Yang, Yueli Li, Zhao Shuo |
Using Rough Set to Induce More Abstract Rules from Rule Base. ![Search on Bibsonomy](Pics/bibsonomy.png) |
KES (1) ![In: Knowledge-Based Intelligent Information and Engineering Systems, 10th International Conference, KES 2006, Bournemouth, UK, October 9-11, 2006, Proceedings, Part I, pp. 498-505, 2006, Springer, 3-540-46535-9. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
15 | Michael A. Kochte, Marcel Schaal, Hans-Joachim Wunderlich, Christian G. Zoellin |
Efficient fault simulation on many-core processors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 47th Design Automation Conference, DAC 2010, Anaheim, California, USA, July 13-18, 2010, pp. 380-385, 2010, ACM, 978-1-4503-0002-5. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
PPSFP, parallel fault simulation, many-core processors |
15 | Hung-Chuan Lai, Shi-Jinn Horng, Yong-Yuan Chen, Pingzhi Fan, Yi Pan 0001 |
A New Concurrent Detection of Control Flow Errors Based on DCT Technique. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PRDC ![In: 13th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2007), 17-19 December, 2007, Melbourne, Victoria, Australia, pp. 201-209, 2007, IEEE Computer Society, 0-7695-3054-0. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
15 | Dhiraj K. Pradhan, Chunsheng Liu |
EBIST: a novel test generator with built-in fault detection capability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(9), pp. 1457-1466, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
15 | Zhiyuan Wang, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski |
Multiple Fault Diagnosis Using n-Detection Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCD ![In: 21st International Conference on Computer Design (ICCD 2003),VLSI in Computers and Processors, 13-15 October 2003, San Jose, CA, USA, Proceedings, pp. 198-, 2003, IEEE Computer Society, 0-7695-2025-1. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
15 | Kumar N. Dwarakanath, R. D. (Shawn) Blanton |
Exploiting Dominance and Equivalence using Fault Tuples. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April - 2 May 2002, Monterey, CA, USA, pp. 269-274, 2002, IEEE Computer Society, 0-7695-1570-3. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
15 | Irith Pomeranz, Sudhakar M. Reddy, Ruifeng Guo |
Static test compaction for synchronous sequential circuits based on vector restoration. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18(7), pp. 1040-1049, 1999. The full citation details ...](Pics/full.jpeg) |
1999 |
DBLP DOI BibTeX RDF |
|
15 | Wolfgang Meyer 0002, Raul Camposano |
Active timing multilevel fault-simulation with switch-level accuracy. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14(10), pp. 1241-1256, 1995. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
|
15 | Peter C. Maxwell, Robert C. Aitken |
IDDQ testing as a component of a test suite: The need for several fault coverage metrics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 3(4), pp. 305-316, 1992. The full citation details ...](Pics/full.jpeg) |
1992 |
DBLP DOI BibTeX RDF |
quality, fault coverage, scan, functional testing, Current testing, physical defects |
15 | Robert C. Aitken |
Diagnosis of leakage faults with IDDQ. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 3(4), pp. 367-375, 1992. The full citation details ...](Pics/full.jpeg) |
1992 |
DBLP DOI BibTeX RDF |
leakage fault model, Fault diagnosis, I DDQ testing |
15 | Wu-Tung Cheng, Janak H. Patel |
PROOFS: a super fast fault simulator for sequential circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EURO-DAC ![In: European Design Automation Conference, EURO-DAC 1990, Glasgow, Scotland, UK, March 12-15, 1990, pp. 475-479, 1990, IEEE Computer Society, 0-8186-2024-2. The full citation details ...](Pics/full.jpeg) |
1990 |
DBLP DOI BibTeX RDF |
|
15 | Thomas M. Niermann, Wu-Tung Cheng, Janak H. Patel |
Proofs: A Fast, Memory Efficient Sequential Circuit Fault Simulator. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 27th ACM/IEEE Design Automation Conference. Orlando, Florida, USA, June 24-28, 1990., pp. 535-540, 1990, IEEE Computer Society Press, 0-89791-363-9. The full citation details ...](Pics/full.jpeg) |
1990 |
DBLP DOI BibTeX RDF |
|
14 | Dan Alexandrescu, Lorena Anghel, Michael Nicolaidis |
Simulating Single Event Transients in VDSM ICs for Ground Level Radiation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 20(4), pp. 413-421, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
single fault propagation, fault simulation, soft-errors, single event upsets |
14 | Kuen-Jong Lee, Jing-Jou Tang, Tsung-Chu Huang, Cheng-Liang Tsai |
Combination Of Automatic Test Pattern Generation And Built-In Intermediate Voltage Sensing For Detecting CMOS Bridging Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 5th Asian Test Symposium (ATS '96), November 20-22, 1996, Hsinchu, Taiwan, pp. 100-, 1996, IEEE Computer Society, 0-8186-7478-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
CMOS bridging faults detection, ATPG system, built-in intermediate voltage sensing, BIFEST system, PODEM-like process, PPSFP-based process, logic monitoring, gate threshold ranges, Byzantine General's Command Problem, feedback bridging faults, parallel pattern single fault propagation, fault modelling, fault simulation, fault coverage, greedy algorithm, CMOS logic circuits |
14 | Jianli Sun, Eduard Cerny, Jan Gecsei |
Fault Tolerance in a Class of Sorting Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 43(7), pp. 827-837, 1994. The full citation details ...](Pics/full.jpeg) |
1994 |
DBLP DOI BibTeX RDF |
comparators (circuits), single-fault tolerance, 1-fault tolerant design, balanced sorting network, 2-fault tolerant design, fault tolerance, reliability, parallel processing, fault tolerant computing, fault tolerant computing, sorting, comparators, sorting networks, multistage network |
14 | Tse-Yun Feng, Chuan-lin Wu |
Fault-Diagnosis for a Class of Multistage Interconnection Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 30(10), pp. 743-758, 1981. The full citation details ...](Pics/full.jpeg) |
1981 |
DBLP DOI BibTeX RDF |
Baseline network, fault detection and location, parallel processing, fault model, multistage interconnection networks, multiple faults, single fault |
14 | Vinod K. Agarwal |
Multiple Fault Detection in Programmable Logic Arrays. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 29(6), pp. 518-522, 1980. The full citation details ...](Pics/full.jpeg) |
1980 |
DBLP DOI BibTeX RDF |
single fault coverage, Contact faults, PLA fault detection, PLA modeling, programmable logic arrays, masking, multiple fault detection |
14 | Kolar L. Kodandapani, Sharad C. Seth |
On Combinational Networks with Restricted Fan-Out. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 27(4), pp. 309-318, 1978. The full citation details ...](Pics/full.jpeg) |
1978 |
DBLP DOI BibTeX RDF |
single fault location, Characterization of fan-out-free networks, counting of fan-out-free, fan-out-free networks, localized fan outs, functional decomposition, combinational networks, multiple fault detection |
14 | Dennis A. Reynolds, Gernot Metze |
Fault Detection Capabilities of Alternating Logic. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 27(12), pp. 1093-1098, 1978. The full citation details ...](Pics/full.jpeg) |
1978 |
DBLP DOI BibTeX RDF |
Alternating logic, alternating systems, on-line detection, synchronous machine, stuck-at-faults, combinational network, time redundancy, single fault, totally self-checking |
14 | Aikata, Banashri Karmakar, Dhiman Saha |
DESIV: Differential Fault Analysis of SIV-Rijndael256 with a Single Fault. ![Search on Bibsonomy](Pics/bibsonomy.png) |
HOST ![In: 2020 IEEE International Symposium on Hardware Oriented Security and Trust, HOST 2020, San Jose, CA, USA, December 7-11, 2020, pp. 241-251, 2020, IEEE, 978-1-7281-7405-1. The full citation details ...](Pics/full.jpeg) |
2020 |
DBLP DOI BibTeX RDF |
|
14 | David Landsberg, Youcheng Sun, Daniel Kroening |
Optimising Spectrum Based Fault Localisation for Single Fault Programs Using Specifications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FASE ![In: Fundamental Approaches to Software Engineering, 21st International Conference, FASE 2018, Held as Part of the European Joint Conferences on Theory and Practice of Software, ETAPS 2018, Thessaloniki, Greece, April 14-20, 2018, Proceedings., pp. 246-263, 2018, Springer, 978-3-319-89362-4. The full citation details ...](Pics/full.jpeg) |
2018 |
DBLP DOI BibTeX RDF |
|
14 | Alexandre Perez, Rui Abreu 0001, Marcelo d'Amorim |
Prevalence of Single-Fault Fixes and Its Impact on Fault Localization. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICST ![In: 2017 IEEE International Conference on Software Testing, Verification and Validation, ICST 2017, Tokyo, Japan, March 13-17, 2017, pp. 12-22, 2017, IEEE Computer Society, 978-1-5090-6031-3. The full citation details ...](Pics/full.jpeg) |
2017 |
DBLP DOI BibTeX RDF |
|
14 | Xin Xia 0001, Liang Gong, Tien-Duy B. Le, David Lo 0001, Lingxiao Jiang, Hongyu Zhang 0002 |
Diversity maximization speedup for localizing faults in single-fault and multi-fault programs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Autom. Softw. Eng. ![In: Autom. Softw. Eng. 23(1), pp. 43-75, 2016. The full citation details ...](Pics/full.jpeg) |
2016 |
DBLP DOI BibTeX RDF |
|
14 | Raimund Ubar, Sergei Kostin, Jaan Raik |
Synthesis of multiple fault oriented test groups from single fault test sets. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DTIS ![In: Proceedings of the 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2013, 26-28 March, 2013, Abu Dhabi, UAE, pp. 98-103, 2013, IEEE, 978-1-4673-6038-8. The full citation details ...](Pics/full.jpeg) |
2013 |
DBLP DOI BibTeX RDF |
|
14 | Xin-jie Zhao 0001, Shize Guo, Fan Zhang 0010, Tao Wang 0008, Zhijie Shi, Keke Ji |
Algebraic Differential Fault Attacks on LED using a Single Fault Injection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IACR Cryptol. ePrint Arch. ![In: IACR Cryptol. ePrint Arch. 2012, pp. 347, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP BibTeX RDF |
|
14 | Yoseop Lim, Jaeseok Park, Sungho Kang |
An accurate diagnosis of transition fault clusters based on single fault simulation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEICE Electron. Express ![In: IEICE Electron. Express 9(19), pp. 1528-1533, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
14 | Ruilin Li, Bing Sun 0001, Chao Li 0002, Jianxiong You |
Differential Fault Analysis on SMS4 using a single fault. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Inf. Process. Lett. ![In: Inf. Process. Lett. 111(4), pp. 156-163, 2011. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
14 | Michael Tunstall, Debdeep Mukhopadhyay, Subidh Ali |
Differential Fault Analysis of the Advanced Encryption Standard Using a Single Fault. ![Search on Bibsonomy](Pics/bibsonomy.png) |
WISTP ![In: Information Security Theory and Practice. Security and Privacy of Mobile Devices in Wireless Communication - 5th IFIP WG 11.2 International Workshop, WISTP 2011, Heraklion, Crete, Greece, June 1-3, 2011. Proceedings, pp. 224-233, 2011, Springer, 978-3-642-21039-6. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
14 | Subidh Ali, Debdeep Mukhopadhyay |
A Differential Fault Analysis on AES Key Schedule Using Single Fault. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FDTC ![In: 2011 Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC 2011, Tokyo, Japan, September 29, 2011, pp. 35-42, 2011, IEEE Computer Society, 978-1-4577-1463-4. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
14 | Ruilin Li, Bing Sun 0001, Chao Li 0002, Jianxiong You |
Differential Fault Analysis on SMS4 Using a Single Fault. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IACR Cryptol. ePrint Arch. ![In: IACR Cryptol. ePrint Arch. 2010, pp. 63, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP BibTeX RDF |
|
14 | Subidh Ali, Debdeep Mukhopadhyay |
Acceleration of Differential Fault Analysis of the Advanced Encryption Standard Using Single Fault. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IACR Cryptol. ePrint Arch. ![In: IACR Cryptol. ePrint Arch. 2010, pp. 451, 2010. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP BibTeX RDF |
|
14 | Michael Tunstall, Debdeep Mukhopadhyay |
Differential Fault Analysis of the Advanced Encryption Standard using a Single Fault. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IACR Cryptol. ePrint Arch. ![In: IACR Cryptol. ePrint Arch. 2009, pp. 575, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP BibTeX RDF |
|
14 | K. Lai, Parag K. Lala |
Multiple Fault Detection in Fan-Out Free Circuits Using Minimal Single Fault Test Set. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 45(6), pp. 763-765, 1996. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
fan-out-free circuit, output count, test generation, Multiple faults |
14 | Jens Güthoff, Volkmar Sieh |
Combining Software-Implemented and Simulation-Based Fault Injection into a Single Fault Injection Method. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FTCS ![In: Digest of Papers: FTCS-25, The Twenty-Fifth International Symposium on Fault-Tolerant Computing, Pasadena, California, USA, June 27-30, 1995, pp. 196-206, 1995, IEEE Computer Society, 0-8186-7079-7. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
|
14 | Wen-Ben Jone, Patrick H. Madden |
Multiple fault testing using minimal single fault test set for fanout-free circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 12(1), pp. 149-157, 1993. The full citation details ...](Pics/full.jpeg) |
1993 |
DBLP DOI BibTeX RDF |
|
14 | Tah-Yuan Kuo, Jhing-Fa Wang, Jau-Yien Lee |
Enhancing the multiple-fault detection of single-fault test sets. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Comput. Aided Des. ![In: Comput. Aided Des. 24(5), pp. 243-250, 1992. The full citation details ...](Pics/full.jpeg) |
1992 |
DBLP DOI BibTeX RDF |
|
14 | Hyung Ki Lee, Dong Sam Ha |
An Efficient, Forward Fault Simulation Algorithm Based on the Parallel Pattern Single Fault Propagation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991, pp. 946-955, 1991, IEEE Computer Society, 0-8186-9156-5. The full citation details ...](Pics/full.jpeg) |
1991 |
DBLP DOI BibTeX RDF |
|
14 | Ken Kubiak, W. Kent Fuchs |
Multiple-Fault Simulation and Coverage of Deterministic Single-Fault Test Sets. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991, pp. 956-962, 1991, IEEE Computer Society, 0-8186-9156-5. The full citation details ...](Pics/full.jpeg) |
1991 |
DBLP DOI BibTeX RDF |
|
14 | Jwu E. Chen, Chung-Len Lee 0001, Wen-Zen Shen |
Single-fault fault collapsing analysis in sequential logic circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1990, Washington, D.C., USA, September 10-14, 1990, pp. 809-814, 1990, IEEE Computer Society, 0-8186-9064-X. The full citation details ...](Pics/full.jpeg) |
1990 |
DBLP DOI BibTeX RDF |
|
14 | Joseph L. A. Hughes |
Multiple fault detection using single fault test sets. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 7(1), pp. 100-108, 1988. The full citation details ...](Pics/full.jpeg) |
1988 |
DBLP DOI BibTeX RDF |
|
14 | John A. Waicukauski, Eric Lindbloom, Vijay S. Iyengar, Barry K. Rosen |
Transition Fault Simulation by Parallel Pattern Single Fault Propagation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986, pp. 542-551, 1986, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
1986 |
DBLP BibTeX RDF |
|
14 | Vinod K. Agarwal, Andy S. F. Fung |
Multiple Fault Testing of Large Circuits by Single Fault Test Sets. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 30(11), pp. 855-865, 1981. The full citation details ...](Pics/full.jpeg) |
1981 |
DBLP DOI BibTeX RDF |
|
14 | Ingebjørg Theiss, Olav Lysne |
FRoots: A Fault Tolerant and Topology-Flexible Routing Technique. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Parallel Distributed Syst. ![In: IEEE Trans. Parallel Distributed Syst. 17(10), pp. 1136-1150, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
path redundancy, interconnection networks, Fault-tolerant routing, deadlock freedom |
14 | Kalpesh Kapoor |
Formal Analysis of Coupling Hypothesis for Logical Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Innov. Syst. Softw. Eng. ![In: Innov. Syst. Softw. Eng. 2(2), pp. 80-87, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Logical fault, Software testing, Mutation testing, Fault-based testing, Boolean specification |
14 | Jason Waddle, David A. Wagner 0001 |
Fault Attacks on Dual-Rail Encoded Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACSAC ![In: 21st Annual Computer Security Applications Conference (ACSAC 2005), 5-9 December 2005, Tucson, AZ, USA, pp. 483-494, 2005, IEEE Computer Society, 0-7695-2461-3. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
14 | Sabine M. Böhm, Klaus Echtle |
State Space Reduction in SDL Models of Fault-Tolerant Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IPDPS ![In: 18th International Parallel and Distributed Processing Symposium (IPDPS 2004), CD-ROM / Abstracts Proceedings, 26-30 April 2004, Santa Fe, New Mexico, USA, 2004, IEEE Computer Society, 0-7695-2132-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
14 | Jayabrata Ghosh-Dastidar, Nur A. Touba |
A Systematic Approach for Diagnosing Multiple Delay Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '98), 2-4 November 1998, Austin, TX, USA, Proceedings, pp. 211-216, 1998, IEEE Computer Society, 0-8186-8832-7. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
14 | Li-C. Wang, M. Ray Mercer, Sophia W. Kao, Thomas W. Williams |
On the decline of testing efficiency as fault coverage approaches 100%. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 13th IEEE VLSI Test Symposium (VTS'95), April 30 - May 3, 1995, Princeton, New Jersey, USA, pp. 74-83, 1995, IEEE Computer Society, 0-8186-7000-2. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
single stuck-at fault model, ISCAS benchmark circuits, nontarget defects, fault diagnosis, logic testing, integrated circuit testing, automatic testing, fault coverage, test pattern generation, manufacturing process, test quality, production testing, testing efficiency, circuit sizes |
14 | Antoine Nonclercq, Laurent Lonys, Anne Vanhoestenberghe, Andreas Demosthenous, Nick Donaldson |
Safety of multi-channel stimulation implants: a single blocking capacitor per channel is not sufficient after single-fault failure. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Medical Biol. Eng. Comput. ![In: Medical Biol. Eng. Comput. 50(4), pp. 403-410, 2012. The full citation details ...](Pics/full.jpeg) |
2012 |
DBLP DOI BibTeX RDF |
|
12 | Jan Schat |
Calculating the fault coverage for dual neighboring faults using single stuck-at fault patterns. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DDECS ![In: Proceedings of the 11th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2008), Bratislava, Slovakia, April 16-18, 2008, pp. 235-240, 2008, IEEE Computer Society, 978-1-4244-2276-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Iwan Tabakow |
Using Place and Transition Fault Net Models for Sequential Diagnosis Time Assessment in Discrete Event Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEA/AIE ![In: New Frontiers in Applied Artificial Intelligence, 21st International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2008, Wroclaw, Poland, June 18-20, 2008, Proceedings, pp. 677-686, 2008, Springer, 978-3-540-69045-0. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
12 | Zhiyuan Wang, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski |
Analysis and methodology for multiple-fault diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(3), pp. 558-575, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
12 | Hayssam El-Razouk, Zine Abid |
A New Transistor-Redundant Voter for Defect-Tolerant Digital Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CCECE ![In: Proceedings of the Canadian Conference on Electrical and Computer Engineering, CCECE 2006, May 7-10, 2006, Ottawa Congress Centre, Ottawa, Canada, pp. 1078-1081, 2006, IEEE, 1-4244-0038-4. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
12 | Sining Liu, Brian King, Wei Wang 0003 |
A CRT-RSA Algorithm Secure against Hardware Fault Attacks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DASC ![In: Second International Symposium on Dependable Autonomic and Secure Computing (DASC 2006), 29 September - 1 October 2006, Indianapolis, Indiana, USA, pp. 51-60, 2006, IEEE Computer Society, 0-7695-2539-3. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
algorithm, smart card, RSA, Chinese Remainder Theorem |
12 | Vishwani D. Agrawal, Alok S. Doshi |
Concurrent Test Generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India, pp. 294-299, 2005, IEEE Computer Society, 0-7695-2481-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
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