Search results for "wearout"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
149	John Y. Oliver, Rajeevan Amirtharajah, Venkatesh Akella, Frederic T. Chong	Credit-based dynamic reliability management using online wearout detection.	Conf. Computing Frontiers	2008	DBLP DOI BibTeX RDF	wear-out, reliability
108	Jason A. Blome, Shuguang Feng, Shantanu Gupta, Scott A. Mahlke	Self-calibrating Online Wearout Detection.	MICRO	2007	DBLP DOI BibTeX RDF
41	David Fick, Andrew DeOrio, Jin Hu, Valeria Bertacco, David T. Blaauw, Dennis Sylvester	Vicis: a reliable network for unreliable silicon.	DAC	2009	DBLP DOI BibTeX RDF	hard faults, fault tolerance, built-in-self-test, Network-on-Chip, reconfiguration, torus, N-modular redundancy
41	Sule Ozev, Daniel J. Sorin, Mahmut Yilmaz	Low-cost run-time diagnosis of hard delay faults in the functional units of a microprocessor.	ICCD	2007	DBLP DOI BibTeX RDF
36	Mehmet Basoglu, Michael Orshansky, Mattan Erez	NBTI-aware DVFS: a new approach to saving energy and increasing processor lifetime.	ISLPED	2010	DBLP DOI BibTeX RDF	wearout, energy efficiency, process variation, DVFS, NBTI
27	Ahmad A. M. Alwreikat, Husam Rjoub	Impact of Mobile Ad Wearout on Consumer Irritation, Perceived Intrusiveness, Engagement, and Loyalty: A PLS-SEM Analysis.	J. Organ. End User Comput.	2021	DBLP DOI BibTeX RDF
27	Doohwang Chang, Jennifer N. Kitchen, Sayfe Kiaei, Sule Ozev	In-Field Recovery of RF Circuits from Wearout Based Performance Degradation.	IEEE Trans. Emerg. Top. Comput.	2020	DBLP DOI BibTeX RDF
27	Shu-Han Hsu, Kexin Yang 0001, Linda Milor	Machine Learning for Detection of Competing Wearout Mechanisms.	IRPS	2019	DBLP DOI BibTeX RDF
27	Marco Mugnaini, Elia Landi, Ada Fort, Tommaso Addabbo, Valerio Vignoli	Smart Braking Material Wearout Monitoring for Part Life Assessment.	ISSE	2019	DBLP DOI BibTeX RDF
27	Alexander S. Rumyantsev, Evgeny Ivashko, Ilya Chernov, Dmitry Kositsyn, Anton I. Shabaev, Vadim Ponomarev	Latency/Wearout in a Flash-Based Storage System with Replication on Write.	FRUCT	2019	DBLP DOI BibTeX RDF
27	Rui Zhang 0048, Kexin Yang 0001, Taizhi Liu, Linda Milor	Impact of Front-End Wearout Mechanisms on the Performance of a Ring Oscillator-Based Thermal Sensor.	IWASI	2019	DBLP DOI BibTeX RDF
27	Rui Zhang 0048, Kexin Yang 0001, Taizhi Liu, Linda Milor	Estimation of the Optimal Accelerated Test Region for FinFET SRAMs Degraded by Front-End and Back-End Wearout Mechanisms.	DCIS	2018	DBLP DOI BibTeX RDF
27	Alejandro Valero, Negar Miralaei, Salvador Petit, Julio Sahuquillo, Timothy M. Jones 0001	On Microarchitectural Mechanisms for Cache Wearout Reduction.	IEEE Trans. Very Large Scale Integr. Syst.	2017	DBLP DOI BibTeX RDF
27	Dae-Hyun Kim 0003, Linda Milor	Analysis of errors in estimating wearout characteristics of time-dependent dielectric breakdown using system-level accelerated life test.	Microelectron. Reliab.	2017	DBLP DOI BibTeX RDF
27	Xinfei Guo, Mircea R. Stan	Deep Healing: Ease the BTI and EM Wearout Crisis by Activating Recovery.	DSN Workshops	2017	DBLP DOI BibTeX RDF
27	Sina Asadi, Amir Mahdi Hosseini Monazzah, Hamed Farbeh, Seyed Ghassem Miremadi	WIPE: Wearout Informed Pattern Elimination to Improve the Endurance of NVM-based Caches.	ASP-DAC	2017	DBLP DOI BibTeX RDF
27	Woongrae Kim, Taizhi Liu, Linda Milor	On-line monitoring of system health using on-chip SRAMs as a wearout sensor.	IOLTS	2017	DBLP DOI BibTeX RDF
27	Zhaoxia Deng, Ariel Feldman, Stuart A. Kurtz, Frederic T. Chong	Lemonade from Lemons: Harnessing Device Wearout to Create Limited-Use Security Architectures.	ISCA	2017	DBLP DOI BibTeX RDF
27	Woongrae Kim, Chang-Chih Chen, Dae Hyun Kim 0003, Linda Milor	Built-In Self-Test Methodology With Statistical Analysis for Electrical Diagnosis of Wearout in a Static Random Access Memory Array.	IEEE Trans. Very Large Scale Integr. Syst.	2016	DBLP DOI BibTeX RDF
27	Alec Roelke, Mircea R. Stan	Attacking an SRAM-Based PUF through Wearout.	ISVLSI	2016	DBLP DOI BibTeX RDF
27	Xinfei Guo, Mircea R. Stan	Work hard, sleep well - Avoid irreversible IC wearout with proactive rejuvenation.	ASP-DAC	2016	DBLP DOI BibTeX RDF
27	Elham Kashefi, Hamid R. Zarandi, Ann Gordon-Ross	Postponing wearout failures in chip multiprocessors using thermal management and thread migration.	ReCoSoC	2016	DBLP DOI BibTeX RDF
27	Dean Michael Ancajas, Kshitij Bhardwaj, Koushik Chakraborty, Sanghamitra Roy	Wearout Resilience in NoCs Through an Aging Aware Adaptive Routing Algorithm.	IEEE Trans. Very Large Scale Integr. Syst.	2015	DBLP DOI BibTeX RDF
27	Chang-Chih Chen, Linda S. Milor	Microprocessor Aging Analysis and Reliability Modeling Due to Back-End Wearout Mechanisms.	IEEE Trans. Very Large Scale Integr. Syst.	2015	DBLP DOI BibTeX RDF
27	Arseniy Vitkovskiy, Vassos Soteriou, Paul V. Gratz	Clotho: Proactive wearout deceleration in Chip-Multiprocessor interconnects.	ICCD	2015	DBLP DOI BibTeX RDF
27	Woongrae Kim, Chang-Chih Chen, Taizhi Liu, Soonyoung Cha, Linda Milor	Estimation of remaining life using embedded SRAM for wearout parameter extraction.	IWASI	2015	DBLP DOI BibTeX RDF
27	William J. Roesch, Philip Rains	Separating HBT wearout from defects during early life operation.	Microelectron. Reliab.	2014	DBLP DOI BibTeX RDF
27	Vikram B. Suresh, Wayne P. Burleson	Fine grained wearout sensing using metastability resolution time.	ISQED	2014	DBLP DOI BibTeX RDF
27	Woongrae Kim, Linda Milor	Built-in self test methodology for diagnosis of backend wearout mechanisms in SRAM cells.	VTS	2014	DBLP DOI BibTeX RDF
27	Chang-Chih Chen, Linda Milor	System-level modeling and microprocessor reliability analysis for backend wearout mechanisms.	DATE	2013	DBLP DOI BibTeX RDF
27	Hossein Tajik, Houman Homayoun, Nikil D. Dutt	VAWOM: temperature and process variation aware wearout management in 3D multicore architecture.	DAC	2013	DBLP DOI BibTeX RDF
27	Jose María Ruíz, Raúl Fernández-García, Ignacio Gil, Marta Morata	Current Consumption and Power Integrity of CMOS Digital Circuits Under NBTI Wearout.	J. Electron. Test.	2012	DBLP DOI BibTeX RDF
27	Fabian Oboril, Mehdi Baradaran Tahoori	ExtraTime: Modeling and analysis of wearout due to transistor aging at microarchitecture-level.	DSN	2012	DBLP DOI BibTeX RDF
27	Fabian Oboril, Mehdi Baradaran Tahoori	Reducing wearout in embedded processors using proactive fine-grain dynamic runtime adaptation.	ETS	2012	DBLP DOI BibTeX RDF
27	Fabian Oboril, Farshad Firouzi, Saman Kiamehr, Mehdi Baradaran Tahoori	Reducing NBTI-induced processor wearout by exploiting the timing slack of instructions.	CODES+ISSS	2012	DBLP DOI BibTeX RDF
27	Chang-Chih Chen, Fahad Ahmed, Linda Milor	A comparative study of wearout mechanisms in state-of-art microprocessors.	ICCD	2012	DBLP DOI BibTeX RDF
27	Fahad Ahmed, Mohamed M. Sabry, David Atienza, Linda Milor	Wearout-aware compiler-directed register assignment for embedded systems.	ISQED	2012	DBLP DOI BibTeX RDF
27	Néstor Berbel, Raúl Fernández-García, Ignacio Gil, Binhong Li, Alexandre Boyer, Sonia Bendhia	Experimental verification of the usefulness of the nth power law MOSFET model under hot carrier wearout.	Microelectron. Reliab.	2011	DBLP DOI BibTeX RDF
27	Bardia Zandian, Murali Annavaram	Cross-layer resilience using wearout aware design flow.	DSN	2011	DBLP DOI BibTeX RDF
27	Fahad Ahmed, Linda Milor	Via wearout detection with on-chip monitors.	Microelectron. J.	2010	DBLP DOI BibTeX RDF
27	Pascal Lecuyer, Hélène Frémont, Jean-Pierre Landesman, Manoubi Auguste Bahi	Wearout estimation using the Robustness Validation methodology for components in 150 degreeC ambient automotive applications.	Microelectron. Reliab.	2010	DBLP DOI BibTeX RDF
27	Shantanu Gupta, Amin Ansari, Shuguang Feng, Scott A. Mahlke	StageWeb: Interweaving pipeline stages into a wearout and variation tolerant CMP fabric.	DSN	2010	DBLP DOI BibTeX RDF
27	Mircea Stan	Reliability/wearout-aware design.	Green Computing Conference	2010	DBLP DOI BibTeX RDF
27	Prashant Singh, Cheng Zhuo, Eric Karl, David T. Blaauw, Dennis Sylvester	Sensor-Driven Reliability and Wearout Management.	IEEE Des. Test Comput.	2009	DBLP DOI BibTeX RDF
27	Jeonghee Shin, Victor V. Zyuban, Pradip Bose, Timothy Mark Pinkston	A Proactive Wearout Recovery Approach for Exploiting Microarchitectural Redundancy to Extend Cache SRAM Lifetime.	ISCA	2008	DBLP DOI BibTeX RDF
27	Subhasish Mitra	Circuit Failure Prediction Enables Robust System Design Resilient to Aging and Wearout.	IOLTS	2007	DBLP DOI BibTeX RDF
27	Mohammed Al-Haj Ebrahem, James J. Higgins	Non-parametric analysis of a proportional wearout model for accelerated degradation data.	Appl. Math. Comput.	2006	DBLP DOI BibTeX RDF
27	Peter Jacob, Albert Kunz, Giovanni Nicoletti	Reliability and wearout characterisation of LEDs.	Microelectron. Reliab.	2006	DBLP DOI BibTeX RDF
27	Andreas Gehring, Siegfried Selberherr	Statistical simulation of gate dielectric wearout, leakage, and breakdown.	Microelectron. Reliab.	2004	DBLP DOI BibTeX RDF
20	Kenneth M. Zick, John P. Hayes	On-line sensing for healthier FPGA systems.	FPGA	2010	DBLP DOI BibTeX RDF	on-line sensing, physically-adaptive computing., fpgas, reliability, process variation, leakage, temperature, dynamic power, ring oscillator, static power, health management
20	Dimitris Gizopoulos	Online Periodic Self-Test Scheduling for Real-Time Processor-Based Systems Dependability Enhancement.	IEEE Trans. Dependable Secur. Comput.	2009	DBLP DOI BibTeX RDF
20	Markus Schläpfer, Jonathan L. Shapiro	Modeling Failure Propagation in Large-Scale Engineering Networks.	Complex (2)	2009	DBLP DOI BibTeX RDF	cascading events, failure dynamics, decaying networks, large-scale engineering systems, mean field approximation
20	Michael DeBole, Krishnan Ramakrishnan, Varsha Balakrishnan, Wenping Wang, Hong Luo, Yu Wang 0002, Yuan Xie 0001, Yu Cao 0001, Narayanan Vijaykrishnan	A framework for estimating NBTI degradation of microarchitectural components.	ASP-DAC	2009	DBLP DOI BibTeX RDF
20	Peter D. Ungsunan, Chuang Lin 0002, Yang Wang 0018, Yi Gai	Network processing performability evaluation on heterogeneous reliability multicore processors using SRN model.	IPDPS	2009	DBLP DOI BibTeX RDF
20	Shantanu Gupta, Shuguang Feng, Amin Ansari, Jason A. Blome, Scott A. Mahlke	The StageNet fabric for constructing resilient multicore systems.	MICRO	2008	DBLP DOI BibTeX RDF
20	Shantanu Gupta, Shuguang Feng, Amin Ansari, Jason A. Blome, Scott A. Mahlke	StageNetSlice: a reconfigurable microarchitecture building block for resilient CMP systems.	CASES	2008	DBLP DOI BibTeX RDF	reliability, architecture, pipeline, multicore
20	Andrea Pellegrini, Kypros Constantinides, Dan Zhang 0004, Shobana Sudhakar, Valeria Bertacco, Todd M. Austin	CrashTest: A fast high-fidelity FPGA-based resiliency analysis framework.	ICCD	2008	DBLP DOI BibTeX RDF
20	Smitha Shyam, Kypros Constantinides, Sujay Phadke, Valeria Bertacco, Todd M. Austin	Ultra low-cost defect protection for microprocessor pipelines.	ASPLOS	2006	DBLP DOI BibTeX RDF	defect-protection, reliability, pipelines, low-cost
20	Pamela S. Gillis, Francis Woytowich, Andrew Ferko, Kevin McCauley	Low Overhead Delay Testing of ASICS.	ITC	2004	DBLP DOI BibTeX RDF
20	Ricky Valentin, Jeremy Cunningham, Michael D. Osterman, Abhijit Dasgupta 0002, Michael G. Pecht, Dinos Tsagos	Weapon and communication systems: virtual life assessment of electronic hardware used in the Advanced Amphibious Assault Vehicle (AAAV).	WSC	2002	DBLP DOI BibTeX RDF
20	Algirdas Avizienis	A Fault Tolerance Infrastructure for Dependable Computing with High-Performance COTS Components.	DSN	2000	DBLP DOI BibTeX RDF
20	Siyad C. Ma, Edward J. McCluskey	Open faults in BiCMOS gates.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1995	DBLP DOI BibTeX RDF