Search results for "compaction"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
41	Irith Pomeranz, Sudhakar M. Reddy	An approach for improving the levels of compaction achieved by vector omission.	ICCAD	1999	DBLP DOI BibTeX RDF
41	Alain Darte, Guillaume Huard	Loop Shifting for Loop Compaction.	LCPC	1999	DBLP DOI BibTeX RDF
41	Ruifeng Guo, Irith Pomeranz, Sudhakar M. Reddy	On Speeding-Up Vector Restoration Based Static Compaction of Test Sequences for Sequential Circuits .	Asian Test Symposium	1998	DBLP DOI BibTeX RDF
41	Marc Pouzet	The Program Compaction Revisited: the Functional Framework.	Euro-Par	1995	DBLP DOI BibTeX RDF
41	Janusz Rajski, Jerzy Tyszer	Test responses compaction in accumulators with rotate carry adders.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1993	DBLP DOI BibTeX RDF
41	Chung-Kuan Cheng, Xiaotie Deng, Yuh-Zen Liao, So-Zen Yao	Symbolic layout compaction under conditional design rules.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1992	DBLP DOI BibTeX RDF
41	Chung-Kuan Cheng, David N. Deutsch, Craig Shohara, Mark Taparauskas, Mark Bubien	Geometric compaction on channel routing.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1992	DBLP DOI BibTeX RDF
41	Kurt Mehlhorn, Stefan Näher	A faster compaction algorithm with automatic jog insertion.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1990	DBLP DOI BibTeX RDF
41	Pei-Yung Hsiao, Wu-Shiung Feng	Using a multiple storage quad tree on a hierarchical VLSI compaction scheme.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1990	DBLP DOI BibTeX RDF
41	John Valainis, Sinan Kaptanoglu, Erwin Liu, Roberto Suaya	Two-dimensional IC layout compaction based on topological design rule checking.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1990	DBLP DOI BibTeX RDF
41	Gaétan Hains	The Compaction of Acyclic Terms.	PARLE (2)	1989	DBLP DOI BibTeX RDF	Implementation, memory management, systolic algorithm
41	Hyunchul Shin, Chi-Yuan Lo	An Efficient Two-Dimensional Layout Compaction Algorithm.	DAC	1989	DBLP DOI BibTeX RDF
41	J. Royle, Mikael Palczewski, H. VerHeyen, N. Naccache, Jiri Soukup	Geometrical Compaction in One Dimension for Channel Routing.	DAC	1987	DBLP DOI BibTeX RDF
41	Joseph A. Fisher, David Landskov, Bruce D. Shriver	Microcode compaction: looking backward and looking forward.	AFIPS National Computer Conference	1981	DBLP DOI BibTeX RDF
41	Dennis W. Ting	Allocation and compaction - a mathematical model for memory management.	SIGMETRICS	1976	DBLP DOI BibTeX RDF
40	Shabbir H. Batterywala, Sambuddha Bhattacharya, Subramanian Rajagopalan, Hi-Keung Tony Ma, Narendra V. Shenoy	Cell Swapping Based Migration Methodology for Analog and Custom Layouts.	ISQED	2008	DBLP DOI BibTeX RDF	Layout migration, compaction, constraint generation
40	Sambuddha Bhattacharya, Shabbir H. Batterywala, Subramanian Rajagopalan, Hi-Keung Tony Ma, Narendra V. Shenoy	On Efficient and Robust Constraint Generation for Practical Layout Legalization.	ISQED	2008	DBLP DOI BibTeX RDF	Layout legalization, constraint reduction, compaction, constraint generation
40	Ta-Te Lu, Kuo-Wei Wen, Pao-Chi Chang	Block Reordering Wavelet Packet SPIHT Image Coding.	IEEE Pacific Rim Conference on Multimedia	2001	DBLP DOI BibTeX RDF	Block reordering, Energy compaction, image coding, Wavelet packet, SPIHT
40	Surendra Bommu, Kiran B. Doreswamy, Srimat T. Chakradhar	A Practical Vector Restoration Technique for Large Sequential Circuits.	J. Electron. Test.	2000	DBLP DOI BibTeX RDF	vector restoration, validation and refinement, fault diagnosis, fault simulation, compaction
40	Nikolaos G. Bourbakis, Mohammad Mortazavi	An efficient building block layout methodology for compact placement.	Great Lakes Symposium on VLSI	1995	DBLP DOI BibTeX RDF	building block layout methodology, compact placement, synthesis placement, GEOMETRIA, geometric reshapings, VLSI regulation, functional performance, connection lines, occupied chip area, neighboring relations, dead space, open holes, channels merging process, legal overlapping, VLSI, formal languages, formal language, network routing, circuit layout CAD, compaction, global routing, integrated circuit layout, integrated circuit interconnections, local routing
37	Tomoharu Ugawa, Masahiro Yasugi, Taiichi Yuasa	Replication-Based Incremental Compaction.	ISORC	2008	DBLP DOI BibTeX RDF	embedded system, compaction, real-time garbage collection
37	Heon-Mo Koo, Prabhat Mishra 0001	Specification-based compaction of directed tests for functional validation of pipelined processors.	CODES+ISSS	2008	DBLP DOI BibTeX RDF	processor validation, test compaction
37	Doina Logofatu, Rolf Drechsler	Comparative Study by Solving the Test Compaction Problem.	ISMVL	2008	DBLP DOI BibTeX RDF	Backtracking, Multi-Valued Logic, Test Compaction, Set Cover Problem, Greedy, Don't Cares
37	Zheng Wang, D. M. H. Walker	Dynamic Compaction for High Quality Delay Test.	VTS	2008	DBLP DOI BibTeX RDF	dynamic compaction, test generation, delay test, path delay fault
37	Ritesh Garg, Richard Putman, Nur A. Touba	Increasing Output Compaction in Presence of Unknowns Using an X-Canceling MISR with Deterministic Observation.	VTS	2008	DBLP DOI BibTeX RDF	X-tolerant, Linear Compression, Gaussian Elimination, Response Compaction
37	Grzegorz Mrugalski, Janusz Rajski, Chen Wang 0014, Artur Pogiel, Jerzy Tyszer	Isolation of Failing Scan Cells through Convolutional Test Response Compaction.	J. Electron. Test.	2007	DBLP DOI BibTeX RDF	convolutional compactors, fault diagnosis, test response compaction, scan-based designs
37	Sounil Biswas, Ronald D. Blanton	Statistical Test Compaction Using Binary Decision Trees.	IEEE Des. Test Comput.	2006	DBLP DOI BibTeX RDF	statistical test compaction, redundant tests, kept tests, go/no-go testing, heterogeneous devices, binary decision trees
37	Mango Chia-Tso Chao, Kwang-Ting Cheng, Seongmoon Wang, Srimat T. Chakradhar, Wenlong Wei	Unknown-tolerance analysis and test-quality control for test response compaction using space compactors.	DAC	2006	DBLP DOI BibTeX RDF	design for test, test response compaction
37	Bjorn De Sutter, Bruno De Bus, Koen De Bosschere	Link-time binary rewriting techniques for program compaction.	ACM Trans. Program. Lang. Syst.	2005	DBLP DOI BibTeX RDF	code abstraction, linker, whole-program optimization, compaction, interprocedural analysis, Program representation, binary rewriting
37	Irith Pomeranz, Sudhakar M. Reddy	Procedures for Static Compaction of Test Sequences for Synchronous Sequential Circuits.	IEEE Trans. Computers	2000	DBLP DOI BibTeX RDF	synchronous sequential circuits, test application time, Static test compaction
37	Irith Pomeranz, Sudhakar M. Reddy	Static Test Compaction for Scan-Based Designs to Reduce Test Application Time.	J. Electron. Test.	2000	DBLP DOI BibTeX RDF	scan circuits, test application time, static test compaction
37	Toshiyuki Maeda, Kozo Kinoshita	Compaction of IDDQ Test Sequence Using Reassignment Method.	J. Electron. Test.	2000	DBLP DOI BibTeX RDF	reassignment method, weighted random vector, sequential circuit, IDDQ testing, test compaction
37	Xijiang Lin, Wu-Tung Cheng, Irith Pomeranz, Sudhakar M. Reddy	SIFAR: Static Test Compaction for Synchronous Sequential Circuits Based on Single Fault Restoration.	VTS	2000	DBLP DOI BibTeX RDF	Test Segment, Parallel Pattern Simulator, Vector Restoration, Single Fault Restoration, Fault Coverage, Synchronous Sequential Circuits, Test Length, Static Test Compaction
37	Ruifeng Guo, Irith Pomeranz, Sudhakar M. Reddy	Procedures for Static Compaction of Test Sequences for Synchronous Sequential Circuits Based on Vector Restoration.	DATE	1998	DBLP DOI BibTeX RDF	static test compaction synchronous sequential circuits
37	Nicola Dragone, Roberto Zafalon, Carlo Guardiani, Cristina Silvano	Power invariant vector compaction based on bit clustering and temporal partitioning.	ISLPED	1998	DBLP DOI BibTeX RDF	low power VLSI design, vector compaction, Markov chains, power estimation
37	Seiji Kajihara, Kewal K. Saluja	On Test Pattern Compaction Using Random Pattern Fault Simulation.	VLSI Design	1998	DBLP DOI BibTeX RDF	test generation, combinational circuit, fault simulation, stuck-at fault, test compaction
37	Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel	Fast Algorithms for Static Compaction of Sequential Circuit Test Vectors.	VTS	1997	DBLP DOI BibTeX RDF	inert subsequence, recurrence subsequence, test set compaction
37	Elizabeth M. Rudnick, Janak H. Patel	Simulation-based techniques for dynamic test sequence compaction.	ICCAD	1996	DBLP DOI BibTeX RDF	dynamic test compaction, compact test sets, genetic algorithms, sequential circuit test generation
37	Sunil R. Das, Nishith Goel, Wen-Ben Jone, Amiya R. Nayak	Syndrome signature in output compaction for VLSI BIST.	VLSI Design	1996	DBLP DOI BibTeX RDF	syndrome signature, output compaction, VLSI BIST, input patterns, n-input combinational circuit, primary syndrome, subsyndromes, subfunctions, single-output circuit, multiple output, VLSI, logic testing, data compression, built-in self test, integrated circuit testing, combinational circuits, switching functions, exhaustive testing
37	Slawomir Pilarski, André Ivanov, Tiko Kameda	On minimizing aliasing in scan-based compaction.	J. Electron. Test.	1994	DBLP DOI BibTeX RDF	built-in self-test, linear feedback shift register, signature analysis, Aliasing probability, scan path, test response compaction
37	Srinivas Devadas, Kurt Keutzer, Sharad Malik	A synthesis-based test generation and compaction algorithm for multifaults.	J. Electron. Test.	1993	DBLP DOI BibTeX RDF	Iogic synthesis, test generation, multiple fault, test compaction
35	Shuohao Zhang, Curtis E. Dyreson, Zhe Dang	Compacting XML Data.	DASFAA	2006	DBLP DOI BibTeX RDF
35	Lih-Yang Wang, Yen-Tai Lai	Graph-theory-based simplex algorithm for VLSI layout spacingproblems with multiple variable constraints.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2001	DBLP DOI BibTeX RDF
35	Youtao Zhang, Rajiv Gupta 0001	Timestamped Whole Program Path Representation and its Applications.	PLDI	2001	DBLP DOI BibTeX RDF
32	Ioannis Voyiatzis	An Accumulator-Based Compaction Scheme For Online BIST of RAMs.	IEEE Trans. Very Large Scale Integr. Syst.	2008	DBLP DOI BibTeX RDF
32	Michael Westergaard, Lars Michael Kristensen, Gerth Stølting Brodal, Lars Arge	The ComBack Method - Extending Hash Compaction with Backtracking.	ICATPN	2007	DBLP DOI BibTeX RDF
32	Gert Jervan, Elmet Orasson, Helena Kruus, Raimund Ubar	Hybrid BIST Optimization Using Reseeding and Test Set Compaction.	DSD	2007	DBLP DOI BibTeX RDF
32	Aiman H. El-Maleh, S. Saqib Khursheed, Sadiq M. Sait	Efficient Static Compaction Techniques for Sequential Circuits Based on Reverse-Order Restoration and Test Relaxation.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2006	DBLP DOI BibTeX RDF
32	Christian Galke, U. Gätzschmann, Heinrich Theodor Vierhaus	Scan-Based SoC Test Using Space / Time Pattern Compaction Schemes.	DSD	2006	DBLP DOI BibTeX RDF
32	Masayasu Fukunaga, Seiji Kajihara, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato	A dynamic test compaction procedure for high-quality path delay testing.	ASP-DAC	2006	DBLP DOI BibTeX RDF
32	Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Shin-ya Kobayashi, Yuzo Takamatsu	Compaction of pass/fail-based diagnostic test vectors for combinational and sequential circuits.	ASP-DAC	2006	DBLP DOI BibTeX RDF
32	Keiji Kida, Takehiko Matsuo, Tetsuya Tashiro, Shigetoshi Nakatake	Sequence-Pair Based Compaction under Equi-Length Constraint.	APCCAS	2006	DBLP DOI BibTeX RDF
32	Harald P. E. Vranken, Sandeep Kumar Goel, Andreas Glowatz, Jürgen Schlöffel, Friedrich Hapke	Fault detection and diagnosis with parity trees for space compaction of test responses.	DAC	2006	DBLP DOI BibTeX RDF	fault diagnosis, fault detection, test data compression
32	Aiman H. El-Maleh, S. Saqib Khursheed, Sadiq M. Sait	Efficient Static Compaction Techniques for Sequential Circuits Based on Reverse Order Restoration and Test Relaxation.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF
32	Irith Pomeranz, Sudhakar M. Reddy	Dynamic Test Compaction for Bridging Faults.	ISQED	2005	DBLP DOI BibTeX RDF
32	Yongfeng Ju, Guangfeng Lin, Yindi Fan, Zongyi Liu	Intelligent Compaction Control Based on Fuzzy Neural Network.	PDCAT	2005	DBLP DOI BibTeX RDF
32	Subhasish Mitra, Kee Sup Kim	X-compact: an efficient response compaction technique.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2004	DBLP DOI BibTeX RDF
32	O. N. Malykh, Yu. S. Shakhnovskii	Optimization of a Data Dependence Graph for the Local Microcode Compaction Problem. Part 1: Problem Statement.	Program. Comput. Softw.	2004	DBLP DOI BibTeX RDF
32	O. N. Malykh, Yu. S. Shakhnovskii	Optimization of a Data Dependence Graph for the Local Microcode Compaction Problem. Part 2: Algorithms and Experimental Verification.	Program. Comput. Softw.	2004	DBLP DOI BibTeX RDF
32	Michael G. Dimopoulos, Panagiotis Linardis	Efficient Static Compaction of Test Sequence Sets through the Application of Set Covering Techniques.	DATE	2004	DBLP DOI BibTeX RDF
32	Yinhe Han 0001, Yu Hu 0001, Huawei Li 0001, Xiaowei Li 0001, Anshuman Chandra	Response Compaction for Test Time and Test Pins Reduction Based on Advanced Convolutional Codes.	DFT	2004	DBLP DOI BibTeX RDF
32	Irith Pomeranz, Sudhakar M. Reddy	Transparent scan: a new approach to test generation and test compaction for scan circuits that incorporates limited scan operations.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2003	DBLP DOI BibTeX RDF
32	Irith Pomeranz, Sudhakar M. Reddy	A New Approach to Test Generation and Test Compaction for Scan Circuits.	DATE	2003	DBLP DOI BibTeX RDF
32	Yinhe Han 0001, Yongjun Xu, Huawei Li 0001, Xiaowei Li 0001, Anshuman Chandra	Test Resource Partitioning Based on Efficient Response Compaction for Test Time and Teste.	Asian Test Symposium	2003	DBLP DOI BibTeX RDF
32	Petros Drineas, Yiorgos Makris	Independent Test Sequence Compaction through Integer Programming.	ICCD	2003	DBLP DOI BibTeX RDF
32	James Wingfield, Jennifer Dworak, M. Ray Mercer	Function-Based Dynamic Compaction and its Impact on Test Set Sizes.	DFT	2003	DBLP DOI BibTeX RDF
32	Janusz Rajski, Jerzy Tyszer, Chen Wang 0014, Sudhakar M. Reddy	Convolutional Compaction of Test Responses.	ITC	2003	DBLP DOI BibTeX RDF
32	Irith Pomeranz, Sudhakar M. Reddy	Static Test Compaction for Full-Scan Circuits Based on Combinational Test Sets and Non-Scan Sequential Test Sequences.	VLSI Design	2003	DBLP DOI BibTeX RDF
32	Sunil R. Das, Mansour H. Assaf, Emil M. Petriu, Sujoy Mukherjee	Design of Aliasing Free Space Compressor in BIST with Maximal Compaction Ratio Using Concepts of Strong and Weak Compatibilities of Response Data Outputs and Generalized Sequence Mergeability.	IWDC	2002	DBLP DOI BibTeX RDF
32	Chih-Yang Hsu, Chaur-Wen Wei, Wen-Zen Shen	A pattern compaction technique for power estimation based on power sensitivity information.	ISCAS (5)	2001	DBLP DOI BibTeX RDF
32	Gunnar W. Klau, Petra Mutzel	Combining Graph Labeling and Compaction.	GD	1999	DBLP DOI BibTeX RDF
32	Krishnendu Chakrabarty, John P. Hayes	Zero-aliasing space compaction of test responses using multiple parity signatures.	IEEE Trans. Very Large Scale Integr. Syst.	1998	DBLP DOI BibTeX RDF
32	Krishnendu Chakrabarty, John P. Hayes	On the quality of accumulator-based compaction of test responses.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1997	DBLP DOI BibTeX RDF
32	Xiaoling Sun, Wes Tutak	Error Identification and Data Recovery in MISR-based Data Compaction.	DFT	1997	DBLP DOI BibTeX RDF
32	Miroslaw Kutylowski, Tomasz Wierzbicki	Approximate Compaction and Padded-Sorting on Exclusive Write PRAMs.	IPPS	1996	DBLP DOI BibTeX RDF
32	André Ivanov, Yervant Zorian	Count-based BIST compaction schemes and aliasing probability computation.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1992	DBLP DOI BibTeX RDF
32	Hyunchul Shin, Alberto L. Sangiovanni-Vincentelli, Carlo H. Séquin	'Zone-refining' techniques for IC layout compaction.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1990	DBLP DOI BibTeX RDF
32	J. L. Linn, C. D. Ardoin	All example of using pseudofields to eliminate version shuffling in horizontal code compaction.	MICRO	1989	DBLP DOI BibTeX RDF
32	Shantanu Ganguly, Vijay Pitchumani	Compaction of a Routed Channel on the Connection Machine.	DAC	1989	DBLP DOI BibTeX RDF
32	Micaela Serra, Jon C. Muzio	Space compaction for multiple-output circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1988	DBLP DOI BibTeX RDF
32	Wayne H. Wolf, Robert G. Mathews, John A. Newkirk, Robert W. Dutton	Algorithms for optimizing, two-dimensional symbolic layout compaction.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1988	DBLP DOI BibTeX RDF
32	Werner L. Schiele	Compaction with Incremental Over-Constraint Resolution.	DAC	1988	DBLP BibTeX RDF
32	D. B. Polkl	A Three-Layer Gridless Channel Router with Compaction.	DAC	1987	DBLP DOI BibTeX RDF
31	Tomoharu Ugawa, Hideya Iwasaki, Taiichi Yuasa	Improved replication-based incremental garbage collection for embedded systems.	ISMM	2010	DBLP DOI BibTeX RDF	embedded systems, garbage collection, fragmentation, compaction, real-time garbage collection
31	Joon-Sung Yang, Nur A. Touba	Expanding Trace Buffer Observation Window for In-System Silicon Debug through Selective Capture.	VTS	2008	DBLP DOI BibTeX RDF	Trace Buffer Observation Window, Two-Dimensional (2-D) Compaction, Cycling Register, Silicon Debug, MISR
31	Dominique Chanet, Bjorn De Sutter, Bruno De Bus, Ludo Van Put, Koen De Bosschere	Automated reduction of the memory footprint of the Linux kernel.	ACM Trans. Embed. Comput. Syst.	2007	DBLP DOI BibTeX RDF	operating system, compression, compaction, specialization, system calls, Linux kernel
31	Jing Wang 0006, Duncan M. Hank Walker, Xiang Lu, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul J. A. M. van de Wiel, Stefan Eichenberger	Modeling Power Supply Noise in Delay Testing.	IEEE Des. Test Comput.	2007	DBLP DOI BibTeX RDF	power supply noise model, filling, delay test, compaction
31	Max H. Garzon, Kiranchand V. Bobba, Andrew Neel	Efficiency and Reliability of Semantic Retrieval in DNA-Based Memories.	DNA	2003	DBLP DOI BibTeX RDF	DNA-based memories, optimal concentration, data mining in vitro, pattern classification, semantic retrieval, data compaction
31	Ming-Der Shieh, Hsin-Fu Lo, Ming-Hwa Sheu	High-speed generation of LFSR signatures.	Asian Test Symposium	2000	DBLP DOI BibTeX RDF	high-speed generation, LFSR signatures, compaction simulation, single-input signature register, equivalent multiple-input implementation, finite field theory, high-speed signature computations, lookahead technique, internal-XOR LFSR, external-XOR LFSR, performance evaluation, logic testing, built-in self test, integrated circuit testing, automatic test pattern generation, BIST, linear feedback shift register, binary sequences, subsequences
29	Lingzhe Zhang, Xiang-Dong Huang, Yan-Kai Wang, Jialin Qiao, Shaoxu Song, Jian-Min Wang	Time-tired compaction: An elastic compaction scheme for LSM-tree based time-series database.	Adv. Eng. Informatics	2024	DBLP DOI BibTeX RDF
29	Junkai Yao, Mao Yue, Hongsheng Ma, Changwei Yang	Wave Propagation Characteristics and Compaction Status of Subgrade during Vibratory Compaction.	Sensors	2023	DBLP DOI BibTeX RDF
29	Rajitha Ranasinghe, Arooran Sounthararajah, Jayantha Kodikara 0001	An Intelligent Compaction Analyzer: A Versatile Platform for Real-Time Recording, Monitoring, and Analyzing of Road Material Compaction.	Sensors	2023	DBLP DOI BibTeX RDF
29	Ruicheng Liu, Peiquan Jin, Xiaoliang Wang, Yongping Luo, Zhaole Chu, Yigui Yuan	Closing the Performance Gap between Leveling and Tiering Compaction via Bundle Compaction.	HPDC	2023	DBLP DOI BibTeX RDF
29	Irith Pomeranz	Compaction of a Functional Broadside Test Set through the Compaction of a Functional Test Sequence without Sequential Fault Simulation.	ITC	2019	DBLP DOI BibTeX RDF
29	Jiajun Wang, Denghua Zhong, Binping Wu, Mengnan Shi	Evaluation of Compaction Quality Based on SVR with CFA: Case Study on Compaction Quality of Earth-Rock Dam.	J. Comput. Civ. Eng.	2018	DBLP DOI BibTeX RDF
29	Narayan Vikas	Computational Complexity Relationship between Compaction, Vertex-Compaction, and Retraction.	J. Discrete Algorithms	2018	DBLP DOI BibTeX RDF
29	Fengfeng Pan, Yinliang Yue, Jin Xiong	dCompaction: Speeding up Compaction of the LSM-Tree via Delayed Compaction.	J. Comput. Sci. Technol.	2017	DBLP DOI BibTeX RDF
29	Narayan Vikas	Computational Complexity Relationship between Compaction, Vertex-Compaction, and Retraction.	IWOCA	2017	DBLP DOI BibTeX RDF
29	Narayan Vikas	Algorithms for Partition of Some Class of Graphs under Compaction and Vertex-Compaction.	Algorithmica	2013	DBLP DOI BibTeX RDF
29	Tarun Kumar Goyal, Amarpal Singh, Rahul Aggarwal	Efficient selective compaction and un-compaction of inconsequential logical design units in the schematic representation of a design.	EWDTS	2011	DBLP DOI BibTeX RDF