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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 10898 occurrences of 5061 keywords
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Results
Found 15681 publication records. Showing 15681 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
26 | Kostas Fragos, Yannis Maistros |
A goodness of fit test approach in information retrieval. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Inf. Retr. ![In: Inf. Retr. 9(3), pp. 331-342, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Information Retrieval, goodness of fit tests |
26 | Said Hamdioui, Ad J. van de Goor |
Consequences of port restrictions on testing two-port memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998, pp. 63-72, 1998, IEEE Computer Society, 0-7803-5093-6. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
Multi-port memories, single-port memories, memory fault models, weak faults, read-only and write-only ports, fault coverage, march tests, test length |
26 | L. Rodney Long, Lewis E. Berman, George R. Thoma |
Client/Server Design for Fast Retrieval of Large Images on the Internet. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CBMS ![In: Eighth Annual IEEE Symposium on Computer-Based Medical Systems (CBMS'95), June 9-10, 1995, Lubbock, Texas, USA, pp. 284-291, 1995, IEEE Computer Society, 0-8186-7117-3. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
client/server design, fast image retrieval, large images, application-level technique, transmission rate improvement, cervical X-ray image files, FTP transmission, high-level design concepts, Internet, Internet, information retrieval, statistics, statistics, medical image processing, portable, PACS, client-server systems, visual databases, performance tests, channel capacity, robust technique |
26 | Peter C. Maxwell |
The use of IDDQ testing in low stuck-at coverage situations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 13th IEEE VLSI Test Symposium (VTS'95), April 30 - May 3, 1995, Princeton, New Jersey, USA, pp. 84-88, 1995, IEEE Computer Society, 0-8186-7000-2. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
stuck-at coverage situations, quality goal, graded coverage, composite metric, fault diagnosis, logic testing, logic tests, integrated circuit testing, automatic testing, application specific integrated circuits, ASIC, CMOS logic circuits, IDDQ testing, IC testing |
26 | Tapan J. Chakraborty, Vishwani D. Agrawal |
Robust testing for stuck-at faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 8th International Conference on VLSI Design (VLSI Design 1995), 4-7 January 1995, New Delhi, India, pp. 42-46, 1995, IEEE Computer Society, 0-8186-6905-5. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
logic circuit testing, d-robust tests, fault diagnosis, logic testing, delays, sequential circuits, sequential circuits, fault models, combinational circuits, combinational circuit, robust testing, single stuck-at faults, circuit models |
25 | Martin Kropp, Wolfgang Schwaiger |
Reverse generation and refactoring of fit acceptance tests for legacy code. ![Search on Bibsonomy](Pics/bibsonomy.png) |
OOPSLA Companion ![In: Companion to the 24th Annual ACM SIGPLAN Conference on Object-Oriented Programming, Systems, Languages, and Applications, OOPSLA 2009, October 25-29, 2009, Orlando, Florida, USA, pp. 659-664, 2009, ACM, 978-1-60558-768-4. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
testing, code generation, refactoring, maintenance, eclipse |
25 | Adenilso da Silva Simão, Alexandre Petrenko, Nina Yevtushenko 0001 |
Generating Reduced Tests for FSMs with Extra States. ![Search on Bibsonomy](Pics/bibsonomy.png) |
TestCom/FATES ![In: Testing of Software and Communication Systems, 21st IFIP WG 6.1 International Conference, TESTCOM 2009 and 9th International Workshop, FATES 2009, Eindhoven, The Netherlands, November 2-4, 2009. Proceedings, pp. 129-145, 2009, Springer, 978-3-642-05030-5. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
25 | João Brunet, Dalton Serey Guerrero, Jorge C. A. de Figueiredo |
Design tests: An approach to programmatically check your code against design rules. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSE Companion ![In: 31st International Conference on Software Engineering, ICSE 2009, May 16-24, 2009, Vancouver, Canada, Companion Volume, pp. 255-258, 2009, IEEE, 978-1-4244-3494-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
25 | Wencheng Wang, Jing Li, Hanqiu Sun, Enhua Wu |
Layer-Based Representation of Polyhedrons for Point Containment Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Vis. Comput. Graph. ![In: IEEE Trans. Vis. Comput. Graph. 14(1), pp. 73-83, 2008. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
25 | Geoffrey C. Bohling |
Information Fusion in Regularized Inversion of Tomographic Pumping Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Quantitative Information Fusion for Hydrological Sciences ![In: Quantitative Information Fusion for Hydrological Sciences, pp. 137-162, 2008, Springer, 978-3-540-75383-4. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
25 | Reza Yaesoubi, Stephen D. Roberts |
How much is a health insurer willing to pay for Colorectal Cancer screening tests? ![Search on Bibsonomy](Pics/bibsonomy.png) |
WSC ![In: Proceedings of the 2008 Winter Simulation Conference, Global Gateway to Discovery, WSC 2008, InterContinental Hotel, Miami, Florida, USA, December 7-10, 2008, pp. 1624-1631, 2008, WSC, 978-1-4244-2708-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
25 | K. R. Jayaram, Aditya P. Mathur |
On the Adequacy of Statecharts as a Source of Tests for Cryptographic Protocols. ![Search on Bibsonomy](Pics/bibsonomy.png) |
COMPSAC ![In: Proceedings of the 32nd Annual IEEE International Computer Software and Applications Conference, COMPSAC 2008, 28 July - 1 August 2008, Turku, Finland, pp. 937-942, 2008, IEEE Computer Society, 978-0-7695-3262-2. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
TLS protocol, MC/DC coverage, Security protocol, Statechart, Security Vulnerability |
25 | Soheila Bashardoust-Tajali, Jean-Pierre Corriveau |
On Extracting Tests from a Testable Model in the Context of Domain Engineering. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICECCS ![In: 13th International Conference on Engineering of Complex Computer Systems (ICECCS 2008), March 31 2008 - April 3 2008, Belfast, Northern Ireland, pp. 98-107, 2008, IEEE Computer Society, 0-7695-3139-3. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
25 | Ralph Guderlei, Johannes Mayer |
Statistical Metamorphic Testing Testing Programs with Random Output by Means of Statistical Hypothesis Tests and Metamorphic Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
QSIC ![In: Seventh International Conference on Quality Software (QSIC 2007), 11-12 October 2007, Portland, Oregon, USA, pp. 404-409, 2007, IEEE Computer Society. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
25 | Irith Pomeranz, Sudhakar M. Reddy |
Functional Broadside Tests with Different Levels of Reachability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 20th International Conference on VLSI Design (VLSI Design 2007), Sixth International Conference on Embedded Systems (ICES 2007), 6-10 January 2007, Bangalore, India, pp. 799-804, 2007, IEEE Computer Society, 0-7695-2762-0. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
25 | Hamidah Ibrahim, Ali Amer Alwan, Nur Izura Udzir |
Checking Integrity Constraints with Various Types of Integrity Tests for Distributed Databases. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PDCAT ![In: Eighth International Conference on Parallel and Distributed Computing, Applications and Technologies (PDCAT 2007), 3-6 December 2007, Adelaide, Australia, pp. 151-152, 2007, IEEE Computer Society, 0-7695-3049-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
25 | Adit D. Singh, Gefu Xu |
Output Hazard-Free Transition Tests for Silicon Calibrated Scan Based Delay Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA, pp. 349-357, 2006, IEEE Computer Society, 0-7695-2514-8. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Hazard-Free, Test, Delay, Transition |
25 | Josh C. Bongard, Hod Lipson |
Nonlinear System Identification Using Coevolution of Models and Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Evol. Comput. ![In: IEEE Trans. Evol. Comput. 9(4), pp. 361-384, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
25 | Mohammad Gh. Mohammad, Kewal K. Saluja |
Optimizing program disturb fault tests using defect-based testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(6), pp. 905-915, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
25 | Nikolai Tillmann, Wolfram Schulte |
Parameterized unit tests with unit meister. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESEC/SIGSOFT FSE ![In: Proceedings of the 10th European Software Engineering Conference held jointly with 13th ACM SIGSOFT International Symposium on Foundations of Software Engineering, 2005, Lisbon, Portugal, September 5-9, 2005, pp. 241-244, 2005, ACM, 1-59593-014-0. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
automatic test input generation, unit testing, symbolic execution, constraint solving, algebraic data types |
25 | Dirk Niggemeyer, Elizabeth M. Rudnick |
Automatic Generation of Diagnostic Memory Tests Based on Fault Decomposition and Output Tracing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 53(9), pp. 1134-1146, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
25 | Petru Cascaval, Stuart Bennett, Corneliu Hutanu |
Efficient March Tests for a Reduced 3-Coupling and 4-Coupling Faults in Random-Access Memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 20(3), pp. 227-243, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
fault simulation, memory testing, march test, coupling faults, functional faults |
25 | Bret Pettichord, Brian Marick, Paul Rogers, Jonathan Kohl |
Scripting Web Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
XP/Agile Universe ![In: Extreme Programming and Agile Methods - XP/Agile Universe 2004, 4th Conference on Extreme Programming and Agile Methods, Calgary, Canada, August 15-18, 2004, Proceedings, pp. 224-225, 2004, Springer, 3-540-22839-X. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
25 | Johannes Maria Zaha |
Automated Compatibility Tests for Business Related Aspects of Software Components. ![Search on Bibsonomy](Pics/bibsonomy.png) |
OTM Workshops ![In: On the Move to Meaningful Internet Systems 2004: OTM 2004 Workshops: OTM Confederated International Workshops and Posters, GADA, JTRES, MIOS, WORM, WOSE, PhDS, and INTEROP 2004, Agia Napa, Cyprus, October 25-29, 2004. Proceedings, pp. 834-841, 2004, Springer, 3-540-23664-3. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
Compatibility test, software reuse, software components |
25 | Amitabh Srivastava, Jay Thiagarajan |
Effectively prioritizing tests in development environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSTA ![In: Proceedings of the International Symposium on Software Testing and Analysis, ISSTA 2002, Roma, Italy, July 22-24, 2002, pp. 97-106, 2002, ACM, 1-58113-562-9. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
software testing, regression testing, test selection, test prioritization, test minimization |
25 | Ralf Treinen |
Predicate Logic and Tree Automata with Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FoSSaCS ![In: Foundations of Software Science and Computation Structures, Third International Conference, FOSSACS 2000, Held as Part of the Joint European Conferences on Theory and Practice of Software,ETAPS 2000, Berlin, Germany, March 25 - April 2, 2000, Proceedings, pp. 329-343, 2000, Springer, 3-540-67257-5. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
25 | Alvin Jee, Jonathon E. Colburn, V. Swamy Irrinki, Mukesh Puri |
Optimizing Memory Tests by Analyzing Defect Coverage. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MTDT ![In: 8th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2000), 7-8 August 2000, San Jose, CA, USA, pp. 20-28, 2000, IEEE Computer Society, 0-7695-0689-5. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
25 | Tei-Wei Kuo, Yu-Hua Liu, Kwei-Jay Lin |
Efficient On-Line Schedulability Tests for Priority Driven Real-Time Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Real Time Technology and Applications Symposium ![In: Proceedings of the Sixth IEEE Real Time Technology and Applications Symposium, RTAS 2000, Washington, DC, USA, May 31 - June 2, 2000, pp. 4-13, 2000, IEEE Computer Society, 0-7695-0713-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
25 | Jan Otterstedt, Dirk Niggemeyer, T. W. Williams |
Detection of CMOS address decoder open faults with March and pseudo random memory tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998, pp. 53-62, 1998, IEEE Computer Society, 0-7803-5093-6. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
25 | Pedro Delicado, Marcelo Smrekar |
Measuring non-linear dependence for two random variables distributed along a curve. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Stat. Comput. ![In: Stat. Comput. 19(3), pp. 255-269, 2009. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
Independence tests, Rényi’s axioms, Similarity measures for pairs of variables, Principal curves, Linearity tests, Dependence measures |
25 | Tapas Kanungo, Robert M. Haralick, Henry S. Baird, Werner Stuetzle, David Madigan |
A Statistical, Nonparametric Methodology for Document Degradation Model Validation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Pattern Anal. Mach. Intell. ![In: IEEE Trans. Pattern Anal. Mach. Intell. 22(11), pp. 1209-1223, 2000. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
nonparametric statistical tests, permutation tests, document degradation models, OCR, simulation models, Model validation |
25 | Peter Hellekalek, Harald Niederreiter |
The Weighted Spectral Test: Diaphony. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Model. Comput. Simul. ![In: ACM Trans. Model. Comput. Simul. 8(1), pp. 43-60, 1998. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
stochastic stimulation, theoretical tests, discrepancy, correlation analysis, pseudorandom number generators, spectral test, empirical tests |
24 | Sergiy Boroday, Alexandre Petrenko, Andreas Ulrich |
Implementing MSC Tests with Quiescence Observation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
TestCom/FATES ![In: Testing of Software and Communication Systems, 21st IFIP WG 6.1 International Conference, TESTCOM 2009 and 9th International Workshop, FATES 2009, Eindhoven, The Netherlands, November 2-4, 2009. Proceedings, pp. 49-65, 2009, Springer, 978-3-642-05030-5. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
sound tests, test implementations, fault detection power, Message Sequence Charts, Distributed testing |
24 | Jesus Hernandez Galán, J. Ángel Martinez Usero, M. Jesús Varela Méndez |
User tests demonstration: real experiences in measuring web accessibility needs for people with disabilities and the elderly. ![Search on Bibsonomy](Pics/bibsonomy.png) |
W4A ![In: Proceedings of the International Cross-Disciplinary Conference on Web Accessibility, W4A 2009, Madrid, Spain, April 20-21, 2009, pp. 93-95, 2009, ACM, 978-1-60558-561-1. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
web accessibility, user tests, elderly people, web usability, people with disabilities |
24 | Irith Pomeranz, Sudhakar M. Reddy |
Expanded Definition of Functional Operation Conditions and its Effects on the Computation of Functional Broadside Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA, pp. 317-322, 2008, IEEE Computer Society, 978-0-7695-3123-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
functional broadside tests, test generation, transition faults, reachable states, full-scan circuits |
24 | Ivan Chubov, Dmitri A. Droujkov |
User Stories and Acceptance Tests as Negotiation Tools in Offshore Software Development. ![Search on Bibsonomy](Pics/bibsonomy.png) |
XP ![In: Agile Processes in Software Engineering and Extreme Programming, 8th International Conference, XP 2007, Como, Italy, June 18-22, 2007, Proceedings, pp. 167-168, 2007, Springer, 978-3-540-73100-9. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
offshore development, collaboration with customers, acceptance tests, user stories |
24 | Dirk Bade, Georg Nüssel, Gerd Wilts |
Online feedback by tests and reporting for elearning and certification programs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
WWW (Alternate Track Papers & Posters) ![In: Proceedings of the 13th international conference on World Wide Web - Alternate Track Papers & Posters, WWW 2004, New York, NY, USA, May 17-20, 2004, pp. 432-433, 2004, ACM, 1-58113-912-8. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
eLearning, blended learning, online tests |
24 | William G. Morein, Angelos Stavrou, Debra L. Cook, Angelos D. Keromytis, Vishal Misra, Dan Rubenstein |
Using graphic turing tests to counter automated DDoS attacks against web servers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CCS ![In: Proceedings of the 10th ACM Conference on Computer and Communications Security, CCS 2003, Washington, DC, USA, October 27-30, 2003, pp. 8-19, 2003, ACM, 1-58113-738-9. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
graphic turing tests, Java, web proxies |
24 | Yingxu Wang 0001, Graham King |
A European COTS Architecture with Built-in Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
OOIS ![In: Object-Oriented. Information Systems, 8th International Conference, OOIS 2002, Montpellier, France, September 2-5, 2002, Proceedings, pp. 336-347, 2002, Springer, 3-540-44087-9. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
test reuse, run-time testing, Software engineering, architecture, component, COTS, built-in tests, real-time software, industrial practices, OO |
24 | Dexter Kozen |
On Hoare logic and Kleene algebra with tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Comput. Log. ![In: ACM Trans. Comput. Log. 1(1), pp. 60-76, 2000. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
specification, dynamic logic, Hoare logic, Kleene algebra, Kleene algebra with tests |
24 | Vinay Dabholkar, Sreejit Chakravarty |
Computing Stress Tests for Gate Oxide Shorts. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 11th International Conference on VLSI Design (VLSI Design 1991), 4-7 January 1998, Chennai, India, pp. 378-391, 1998, IEEE Computer Society, 0-8186-8224-8. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
burn-in, stress tests, gate oxide shorts |
24 | Abhijit Chatterjee, Rathish Jayabharathi, Pankaj Pant, Jacob A. Abraham |
Non-robust tests for stuck-fault detection using signal waveform analysis: feasibility and advantages. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 14th IEEE VLSI Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, USA, pp. 354-361, 1996, IEEE Computer Society, 0-8186-7304-4. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
waveform analysis, nonrobust tests, stuck-fault detection, signal waveform analysis, signal waveform integration, directed random test generation techniques, fault diagnosis, logic testing, redundancy, integrated circuit testing, combinational circuits, combinational circuits, automatic testing, detectability, fault coverage, test application time, redundant faults |
24 | Naotake Kamiura, Yutaka Hata, Kazuharu Yamato |
A cellular array designed from a Multiple-valued Decision Diagram and its fault tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 4th Asian Test Symposium (ATS '95), November 23-24, 1995. Bangalore, India, pp. 20-, 1995, IEEE Computer Society, 0-8186-7129-7. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
multiple-valued decision diagram, fault tests, testable cellular arrays, VLSI, fault diagnosis, logic testing, logic CAD, cellular arrays, cellular array, multivalued logic circuits, switch functions, multiple stuck-at faults |
24 | David H. Pitt, David Freestone |
The Derivation of Conformance Tests from LOTOS Specifications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Software Eng. ![In: IEEE Trans. Software Eng. 16(12), pp. 1337-1343, 1990. The full citation details ...](Pics/full.jpeg) |
1990 |
DBLP DOI BibTeX RDF |
formal description technique LOTOS, International Standards Organization, basic LOTOS operators, theoretical notion, canonical testers, finite test suites, test suite design, formal specification, protocols, standards, communication protocols, open systems, formal languages, conformance tests, conformance testing, OSI, protocol specifications, test processes |
24 | D. G. Papworth |
Exact tests of fit for a poisson distribution. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Computing ![In: Computing 31(1), pp. 33-45, 1983. The full citation details ...](Pics/full.jpeg) |
1983 |
DBLP DOI BibTeX RDF |
exact tests of fit, dispersion index, Poisson distribution, goodness-of-fit, chi-square |
24 | Filippo Ricca, Marco Torchiano, Mariano Ceccato, Paolo Tonella |
Talking tests: an empirical assessment of the role of fit acceptance tests in clarifying requirements. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IWPSE ![In: 9th International Workshop on Principles of Software Evolution (IWPSE 2007), in conjunction with the 6th ESEC/FSE joint meeting, Dubrovnik, Croatia, September 3-4, 2007, pp. 51-58, 2007, ACM, 978-1-59593-722-3. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
fit tables, empirical studies, requirements, acceptance testing |
23 | Robert Law |
Using student blogs for documentation in software development projects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITiCSE ![In: Proceedings of the 16th Annual SIGCSE Conference on Innovation and Technology in Computer Science Education, ITiCSE 2011, Darmstadt, Germany, June 27-29, 2011, pp. 366, 2011, ACM, 978-1-4503-0697-3. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
23 | Albrecht Schmidt 0001 |
Engineering interactive ubiquitous computing systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EICS ![In: Proceedings of the 3rd ACM SIGCHI Symposium on Engineering Interactive Computing System, EICS 2011, Pisa, Italy, June 13-16, 2011, pp. 229-230, 2011, ACM, 978-1-4503-0670-6. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
|
23 | Fan Yang 0060, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, Irith Pomeranz |
Detectability of internal bridging faults in scan chains. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ASP-DAC ![In: Proceedings of the 14th Asia South Pacific Design Automation Conference, ASP-DAC 2009, Yokohama, Japan, January 19-22, 2009, pp. 678-683, 2009, IEEE, 978-1-4244-2748-2. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
23 | Wujie Zheng, Michael R. Lyu, Tao Xie |
Test selection for result inspection via mining predicate rules. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSE Companion ![In: 31st International Conference on Software Engineering, ICSE 2009, May 16-24, 2009, Vancouver, Canada, Companion Volume, pp. 219-222, 2009, IEEE, 978-1-4244-3494-7. The full citation details ...](Pics/full.jpeg) |
2009 |
DBLP DOI BibTeX RDF |
|
23 | Batu Sat, Benjamin W. Wah |
Statistical Testing of Off-line Comparative Subjective Evaluations for Optimizing Perceptual Conversational Quality in VoIP. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISM ![In: Tenth IEEE International Symposium on Multimedia (ISM2008), December 15-17, 2008, Berkeley, California, USA, pp. 424-431, 2008, IEEE Computer Society, 978-0-7695-3454-1. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
23 | Onur Guzey, Li-C. Wang, Jeremy R. Levitt, Harry Foster |
Functional test selection based on unsupervised support vector analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DAC ![In: Proceedings of the 45th Design Automation Conference, DAC 2008, Anaheim, CA, USA, June 8-13, 2008, pp. 262-267, 2008, ACM, 978-1-60558-115-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
learning, functional verification, support vector |
23 | Piotr Berman, Bhaskar DasGupta, Ming-Yang Kao |
Tight Approximability Results for Test Set Problems in Bioinformatics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SWAT ![In: Algorithm Theory - SWAT 2004, 9th Scandinavian Workshop on Algorithm Theory, Humlebaek, Denmark, July 8-10, 2004, Proceedings, pp. 39-50, 2004, Springer, 3-540-22339-8. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
23 | Wanli Jiang, Bapiraju Vinnakota |
Defect-oriented test scheduling. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Very Large Scale Integr. Syst. ![In: IEEE Trans. Very Large Scale Integr. Syst. 9(3), pp. 427-438, 2001. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
23 | Rajesh Kannah, C. P. Ravikumar |
Functional Testing of Microprocessors with Graded Fault Coverage. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, pp. 204-, 2000, IEEE Computer Society, 0-7695-0887-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
23 | Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell |
CMOS IC reliability indicators and burn-in economics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998, pp. 194-203, 1998, IEEE Computer Society, 0-7803-5093-6. The full citation details ...](Pics/full.jpeg) |
1998 |
DBLP DOI BibTeX RDF |
|
23 | Mandyam-Komar Srinivas, Michael L. Bushnell, Vishwani D. Agrawal |
Flags and Algebra for Sequential Circuit VNR Path Delay Fault Test Generation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 10th International Conference on VLSI Design (VLSI Design 1997), 4-7 January 1997, Hyderabad, India, pp. 88-94, 1997, IEEE Computer Society, 0-8186-7755-4. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
|
22 | Tobias Hoppe, Stefan Kiltz, Jana Dittmann |
Security Threats to Automotive CAN Networks - Practical Examples and Selected Short-Term Countermeasures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SAFECOMP ![In: Computer Safety, Reliability, and Security, 27th International Conference, SAFECOMP 2008, Newcastle upon Tyne, UK, September 22-25, 2008, Proceedings, pp. 235-248, 2008, Springer, 978-3-540-87697-7. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
Practical tests, Exemplary threats and countermeasures, Safety, Automotive, IT-Security |
22 | Irith Pomeranz, Sudhakar M. Reddy |
Synthesis for Broadside Testability of Transition Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA, pp. 221-226, 2008, IEEE Computer Society, 978-0-7695-3123-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
broadside tests, standard scan, transition faults, test synthesis, full-scan circuits |
22 | Aristides Gionis, Heikki Mannila, Taneli Mielikäinen, Panayiotis Tsaparas |
Assessing data mining results via swap randomization. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Knowl. Discov. Data ![In: ACM Trans. Knowl. Discov. Data 1(3), pp. 14, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
0-1 data, randomization tests, swaps, Significance testing |
22 | Aristides Gionis, Heikki Mannila, Taneli Mielikäinen, Panayiotis Tsaparas |
Assessing data mining results via swap randomization. ![Search on Bibsonomy](Pics/bibsonomy.png) |
KDD ![In: Proceedings of the Twelfth ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, Philadelphia, PA, USA, August 20-23, 2006, pp. 167-176, 2006, ACM, 1-59593-339-5. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
0-1 data, randomization tests, swaps, significance testing |
22 | Peter Hellekalek, Stefan Wegenkittl |
Empirical evidence concerning AES. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Model. Comput. Simul. ![In: ACM Trans. Model. Comput. Simul. 13(4), pp. 322-333, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
block ciphers, AES, diffusion, statistical tests, confusion |
22 | Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor, Mike Rodgers |
March SL: A Test For All Static Linked Memory Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, pp. 372-377, 2003, IEEE Computer Society, 0-7695-1951-2. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
fault coverage, Memory testing, march tests, functional fault models, linked faults |
22 | Zaid Al-Ars, Said Hamdioui, Ad J. van de Goor |
A Fault Primitive Based Analysis of Linked Faults in RAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MTDT ![In: 11th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2003), 28-29 July 2003, San Jose, CA, USA, pp. 33-, 2003, IEEE Computer Society, 0-7695-2004-9. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
Memory testing, march tests, functional fault models, linked faults, fault primitives |
22 | Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor |
Testing Static and Dynamic Faults in Random Access Memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April - 2 May 2002, Monterey, CA, USA, pp. 395-400, 2002, IEEE Computer Society, 0-7695-1570-3. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
static faults, fault coverage, memory tests, dynamic faults, fault primitives |
22 | Ioannis S. Pantazopoulos, Spyros G. Tzafestas |
An Efficient Algorithm for Ray Tracing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Intell. Robotic Syst. ![In: J. Intell. Robotic Syst. 28(1-2), pp. 171-180, 2000. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
divide-and-conquer technique, transitive-between relations, first hit calculations, light-visibility tests, ray tracing |
22 | Kleanthis Psarris, Xiangyun Kong, David Klappholz |
The Direction Vector I Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Parallel Distributed Syst. ![In: IEEE Trans. Parallel Distributed Syst. 4(11), pp. 1280-1290, 1993. The full citation details ...](Pics/full.jpeg) |
1993 |
DBLP DOI BibTeX RDF |
direction vector I test, data dependence tests, Banerjee test, arbitrary direction vector, GCD test, parallelism detection, parallel programming, parallelization, algorithm theory |
22 | Warren H. Debany Jr., Carlos R. P. Hartmann |
Bounds on the sizes of irredundant test sets and sequences for combinational logic networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 2(4), pp. 325-338, 1991. The full citation details ...](Pics/full.jpeg) |
1991 |
DBLP DOI BibTeX RDF |
Digital logic testing, irredundant tests, test complexity, test counting |
22 | Adrian Lienhard, Tudor Gîrba, Orla Greevy, Oscar Nierstrasz |
Test Blueprint - Exposing Side Effects in Execution Traces to Support Writing Unit Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CSMR ![In: 12th European Conference on Software Maintenance and Reengineering, CSMR 2008, April 1-4, 2008, Athens, Greece, pp. 83-92, 2008, IEEE Computer Society, 978-1-4244-2157-2. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
|
22 | Heon-Mo Koo, Prabhat Mishra 0001 |
Specification-based compaction of directed tests for functional validation of pipelined processors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CODES+ISSS ![In: Proceedings of the 6th International Conference on Hardware/Software Codesign and System Synthesis, CODES+ISSS 2008, Atlanta, GA, USA, October 19-24, 2008, pp. 137-142, 2008, ACM, 978-1-60558-470-6. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
processor validation, test compaction |
22 | Ioanna Lykourentzou, Giorgos Mpardis, Vassilis Nikolopoulos, Vassilis Loumos |
Dynamic Reliability Assessment of Multiple Choice Tests in distributed E-Leaning Environments: A Case Study. ![Search on Bibsonomy](Pics/bibsonomy.png) |
AIAI ![In: Artificial Intelligence and Innovations 2007: from Theory to Applications, Proceedings of the 4th IFIP International Conference on Artificial Intelligence Applications and Innovations (AIAI 2007), 19-21 September 2007, Peania, Athens, Greece, pp. 73-80, 2007, Springer, 978-0-387-74160-4. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
22 | Santiago Remersaro, Xijiang Lin, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski |
Low Shift and Capture Power Scan Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 20th International Conference on VLSI Design (VLSI Design 2007), Sixth International Conference on Embedded Systems (ICES 2007), 6-10 January 2007, Bangalore, India, pp. 793-798, 2007, IEEE Computer Society, 0-7695-2762-0. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
|
22 | Ralph Guderlei, Johannes Mayer, Christoph Schneckenburger, Frank Fleischer |
Testing randomized software by means of statistical hypothesis tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SOQUA ![In: Fourth International Workshop on Software Quality Assurance, SOQUA 2007, in conjunction with the 6th ESEC/FSE joint meeting, Dubrovnik, Croatia, September 3-4, 2007, pp. 46-54, 2007, ACM, 978-1-59593-724-7. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
randomized software, test oracle, test evaluation, statistical hypothesis test |
22 | Nikolai Tillmann, Wolfram Schulte |
Unit Tests Reloaded: Parameterized Unit Testing with Symbolic Execution. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Softw. ![In: IEEE Softw. 23(4), pp. 38-47, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
test coverage of code, formal methods, validation, symbolic execution, testing tools, test design |
22 | George Din, Sorin Tolea, Ina Schieferdecker |
Distributed Load Tests with TTCN-3. ![Search on Bibsonomy](Pics/bibsonomy.png) |
TestCom ![In: Testing of Communicating Systems, 18th IFIP TC6/WG6.1 International Conference, TestCom 2006, New York, NY, USA, May 16-18, 2006, Proceedings, pp. 177-196, 2006, Springer, 3-540-34184-6. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
22 | Matthias Merdes, Rainer Malaka, Dima Suliman, Barbara Paech, Daniel Brenner, Colin Atkinson 0001 |
Ubiquitous RATs: how resource-aware run-time tests can improve ubiquitous software systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SEM ![In: Proceedings of the 6th International Workshop on Software Engineering and Middleware, SEM 2006, Portland, Oregon, USA, November 10, 2006, pp. 55-62, 2006, ACM, 1-59593-585-1. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
MORABIT, resource-aware test (RAT), run-time testing, ubiquitous software, built-in test (BIT) |
22 | Henry Been-Lirn Duh, Gerald C. B. Tan, Vivian Hsueh-hua Chen |
Usability evaluation for mobile device: a comparison of laboratory and field tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Mobile HCI ![In: Proceedings of the 8th Conference on Human-Computer Interaction with Mobile Devices and Services, Mobile HCI 2006, Helsinki, Finland, September 12-15, 2006, pp. 181-186, 2006, ACM, 1-59593-390-5. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
usability, mobile devices, dynamics environment |
22 | Guoqing Xu 0001 |
A regression tests selection technique for aspect-oriented programs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
WTAOP ![In: Proceedings of the 2nd Workshop on Testing Aspect-Oriented Programs, held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2006), WTAOP 2006, Portland, Maine, USA, July 20, 2006, pp. 15-20, 2006, ACM, 1-59593-415-4. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
aspect-oriented programming, program analysis, regression test selection |
22 | Yijian Wu, Wenyun Zhao, Xin Peng 0001, Yunjiao Xue |
A Concept Model for Computer-based Spoken Language Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
AICT/ICIW ![In: Advanced International Conference on Telecommunications and International Conference on Internet and Web Applications and Services (AICT/ICIW 2006), 19-25 February 2006, Guadeloupe, French Caribbean, pp. 4, 2006, IEEE Computer Society, 0-7695-2522-9. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
22 | Yongjian Li, Jun Pang 0001 |
Generalized Unsolicited Tests for Authentication Protocol Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
PDCAT ![In: Seventh International Conference on Parallel and Distributed Computing, Applications and Technologies (PDCAT 2006), 4-7 December 2006, Taipei, Taiwan, pp. 509-514, 2006, IEEE Computer Society, 0-7695-2736-1. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
the Otway-Rees protocol, authentication, cryptographic protocols, strand space |
22 | Øyvind Langsrud |
Rotation tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Stat. Comput. ![In: Stat. Comput. 15(1), pp. 53-60, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
conditional inference, multiple testing, random orthogonal matrix, adjusted p-value, multiple endpoints, spherical distribution, microarray data analysis |
22 | Gustav Hast |
Nearly One-Sided Tests and the Goldreich?Levin Predicate. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Cryptol. ![In: J. Cryptol. 17(3), pp. 209-229, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
Nearly one-sided statistical test, Goldreich-Levin predicate, List decoding of Hadamard code, Provable security, Pseudo-random generator |
22 | Ad J. van de Goor |
An Industrial Evaluation of DRAM Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 21(5), pp. 430-440, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
22 | Markus Gälli, Michele Lanza, Oscar Nierstrasz, Roel Wuyts |
Ordering Broken Unit Tests for Focused Debugging. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSM ![In: 20th International Conference on Software Maintenance (ICSM 2004), 11-17 September 2004, Chicago, IL, USA, pp. 114-123, 2004, IEEE Computer Society, 0-7695-2213-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
debugging, Unit testing |
22 | Kuang-Chi Chen |
Effects of Nuisance Parameters on the Family-based Linkage Tests under General Disease Models. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISPAN ![In: 7th International Symposium on Parallel Architectures, Algorithms, and Networks (I-SPAN 2004), 10-12 May 2004, Hong Kong, SAR, China, pp. 614-618, 2004, IEEE Computer Society, 0-7695-2135-5. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
22 | Gustav Hast |
Nearly One-Sided Tests and the Goldreich-Levin Predicate. ![Search on Bibsonomy](Pics/bibsonomy.png) |
EUROCRYPT ![In: Advances in Cryptology - EUROCRYPT 2003, International Conference on the Theory and Applications of Cryptographic Techniques, Warsaw, Poland, May 4-8, 2003, Proceedings, pp. 195-210, 2003, Springer, 3-540-14039-5. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
Nearly one-sided statistical test, Goldreich-Levin predicate, Provable security, List decoding, Pseudo-random generator |
22 | Sultan M. Al-Harbi, Sandeep K. Gupta 0001 |
Generating Complete and Optimal March Tests for Linked Faults in Memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA, pp. 254-266, 2003, IEEE Computer Society, 0-7695-1924-5. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
22 | Wanli Jiang, Eric Peterson, Bob Robotka |
Effectiveness Improvement of ECR Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, pp. 699-708, 2003, IEEE Computer Society, 0-7803-8106-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
22 | Dirk Niggemeyer, Elizabeth M. Rudnick |
Automatic Generation of Diagnostic March Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA, pp. 299-305, 2001, IEEE Computer Society, 0-7695-1122-8. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
22 | Seiji Kajihara, Tsutomu Sasao |
On the Adders with Minimum Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 6th Asian Test Symposium (ATS '97), 17-18 November 1997, Akita, Japan, pp. 10-15, 1997, IEEE Computer Society, 0-8186-8209-4. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
ripple carry adder, minimum test set, test generation, stuck-at fault, carry look-ahead adders |
22 | Liang-Chi Chen, Sandeep K. Gupta 0001, Melvin A. Breuer |
High Quality Robust Tests for Path Delay Faults. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 15th IEEE VLSI Test Symposium (VTS'97), April 27-May 1, 1997, Monterey, California, USA, pp. 88-93, 1997, IEEE Computer Society, 0-8186-7810-0. The full citation details ...](Pics/full.jpeg) |
1997 |
DBLP DOI BibTeX RDF |
test generation, fault modeling, delay test, robust test |
22 | Dexter Kozen, Frederick Smith |
Kleene Algebra with Tests: Completeness and Decidability. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CSL ![In: Computer Science Logic, 10th International Workshop, CSL '96, Annual Conference of the EACSL, Utrecht, The Netherlands, September 21-27, 1996, Selected Papers, pp. 244-259, 1996, Springer, 3-540-63172-0. The full citation details ...](Pics/full.jpeg) |
1996 |
DBLP DOI BibTeX RDF |
|
21 | Norizam Sulaiman, Mohd Nasir Taib, Sahrim Lias, Zunairah Hj Murat, Siti Armiza Mohd Aris, Mahfuzah Mustafa, Nazre bin Abdul Rashid, Noor Hayatee Abdul Hamid |
Intelligent System for Assessing Human Stress Using EEG Signals and Psychoanalysis Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CICSyN ![In: Third International Conference on Computational Intelligence, Communication Systems and Networks, CICSyN 2011, Bali, Indonesia, 26-28 July, 2011, pp. 363-367, 2011, IEEE Computer Society, 978-1-4577-0975-3. The full citation details ...](Pics/full.jpeg) |
2011 |
DBLP DOI BibTeX RDF |
Psychoanalysis tests, Stress Level, EEG dominant index, GUI, Intelligent system, EEG signals |
21 | Sajjad Mahmood |
The Impact of Acceptance Tests on Analyzing Component-Based Systems Specifications: An Experimental Evaluation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CIT ![In: 10th IEEE International Conference on Computer and Information Technology, CIT 2010, Bradford, West Yorkshire, UK, June 29-July 1, 2010, pp. 241-248, 2010, IEEE Computer Society, 978-0-7695-4108-2. The full citation details ...](Pics/full.jpeg) |
2010 |
DBLP DOI BibTeX RDF |
Fit Tables, Software Components, Component Based Systems, Acceptance Tests |
21 | Catherine Gloaguen, F. Fleischer, Hendrik Schmidt, Volker Schmidt |
Fitting of stochastic telecommunication network models via distance measures and Monte-Carlo tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Telecommun. Syst. ![In: Telecommun. Syst. 31(4), pp. 353-377, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
Telecommunication network modelling, Random tessellations, Statistical fitting, Monte-Carlo tests, Access network, Stochastic geometry |
21 | Tsuyoshi Shinogi, Masahiro Ushio, Terumine Hayashi |
Cyclic greedy generation method for limited number of IDDQ tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, pp. 362-, 2000, IEEE Computer Society, 0-7695-0887-1. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
cyclic greedy generation method, undetected faults, ISCAS85Y circuits, short circuit faults, fault diagnosis, integrated circuit testing, iterative methods, iterative method, CMOS integrated circuits, IDDQ tests, test patterns, CMOS IC, electric current measurement, cyclic, random patterns |
21 | Vinay Dabholkar, Sreejit Chakravarty, J. Najm, Janak H. Patel |
Cyclic stress tests for full scan circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 13th IEEE VLSI Test Symposium (VTS'95), April 30 - May 3, 1995, Princeton, New Jersey, USA, pp. 89-94, 1995, IEEE Computer Society, 0-8186-7000-2. The full citation details ...](Pics/full.jpeg) |
1995 |
DBLP DOI BibTeX RDF |
cyclic stress tests, fully testable unpackaged dies, burn-in process, cyclic input sequences, stress related problems, ISCAS89 benchmark circuits, monitored burn-in problems, IC reliability, VLSI, VLSI, logic testing, integrated circuit testing, CMOS, CMOS logic circuits, boundary scan testing, MCMs, integrated circuit reliability, full scan circuits |
21 | Vijay Raghavan 0002 |
On Asymmetric Invalidation with Partial Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Computers ![In: IEEE Trans. Computers 42(6), pp. 764-768, 1993. The full citation details ...](Pics/full.jpeg) |
1993 |
DBLP DOI BibTeX RDF |
asymmetric invalidation, partial tests, diagnosability problem, co-NP complete, computational complexity, fault diagnosis, logic testing, diagnosis algorithm |
21 | Augustus K. Uht |
Requirements for Optimal Execution of Loops with Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Parallel Distributed Syst. ![In: IEEE Trans. Parallel Distributed Syst. 3(5), pp. 573-581, 1992. The full citation details ...](Pics/full.jpeg) |
1992 |
DBLP DOI BibTeX RDF |
loops with tests, branch intensive code, dynamic branches, Booleanrecurrence, order one, dependence cycle, time cycle, imperative code, parallelprogramming, loop iterations |
21 | A. B. Cantor |
Exact tests of significance in 2xM contingency tables. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Southeast Regional Conference ![In: Proceedings of the 17th Annual Southeast Regional Conference, 1979, Orlando, Florida, USA, April 9-11, 1979, pp. 12-14, 1979, ACM, 978-1-4503-7330-2. The full citation details ...](Pics/full.jpeg) |
1979 |
DBLP DOI BibTeX RDF |
Congingency tables, Fisher's test, exact tests |
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