Search results for "tests"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
13	Ron Kohavi, Roger Longbotham, Dan Sommerfield, Randal M. Henne	Controlled experiments on the web: survey and practical guide.	Data Min. Knowl. Discov.	2009	DBLP DOI BibTeX RDF	A/B testing, Website optimization, MultiVariable Testing, MVT, e-commerce, Controlled experiments
13	Sebastian G. Elbaum, Hui Nee Chin, Matthew B. Dwyer, Matthew Jorde	Carving and Replaying Differential Unit Test Cases from System Test Cases.	IEEE Trans. Software Eng.	2009	DBLP DOI BibTeX RDF
13	Min Tang 0001, Sean Curtis, Sung-Eui Yoon, Dinesh Manocha	ICCD: Interactive Continuous Collision Detection between Deformable Models Using Connectivity-Based Culling.	IEEE Trans. Vis. Comput. Graph.	2009	DBLP DOI BibTeX RDF
13	Matteo Miraz, Pier Luca Lanzi, Luciano Baresi	TestFul: using a hybrid evolutionary algorithm for testing stateful systems.	GECCO	2009	DBLP DOI BibTeX RDF	stateful systems, evolutionary algorithms, multi-objective optimization, test generation, object-oriented paradigm
13	Jan Wloka, Barbara G. Ryder, Frank Tip, Xiaoxia Ren	Safe-commit analysis to facilitate team software development.	ICSE	2009	DBLP DOI BibTeX RDF
13	Zaid Al-Ars, Said Hamdioui, Georgi Gaydadjiev, Stamatis Vassiliadis	Test Set Development for Cache Memory in Modern Microprocessors.	IEEE Trans. Very Large Scale Integr. Syst.	2008	DBLP DOI BibTeX RDF
13	R. Harris, T. Impelluso	Virtual stress testing machine and the cyber-infrastructure.	Eng. Comput.	2008	DBLP DOI BibTeX RDF	Physics-based virtual reality, Cyberinfrastructure, Client/Server
13	Mattias Krysander, Fredrik Heintz, Jacob Roll, Erik Frisk	Dynamic test selection for reconfigurable diagnosis.	CDC	2008	DBLP DOI BibTeX RDF
13	Sounil Biswas, R. D. (Shawn) Blanton	Test Compaction for Mixed-Signal Circuits Using Pass-Fail Test Data.	VTS	2008	DBLP DOI BibTeX RDF	pass-fail test data, boolean minimization, minimum constrained subset cover, Mixed-signal test, test compaction
13	Andrea Arcuri	On the automation of fixing software bugs.	ICSE Companion	2008	DBLP DOI BibTeX RDF	automatic bug fixing, genetic programming, co-evolution, automated debugging, repair
13	Daniel Brenner, Colin Atkinson 0001, Rainer Malaka, Matthias Merdes, Barbara Paech, Dima Suliman	Reducing verification effort in component-based software engineering through built-in testing.	Inf. Syst. Frontiers	2007	DBLP DOI BibTeX RDF	Run-time testing, MORABIT, Built-in test, Integration test
13	Huimin Hu, Li Ding 0004, Chunxin Yang, Xiugan Yuan	Investigation on Ergonomics Characteristics of Protective Clothing Based on Capture of Three-Dimensional Body Movements.	HCI (12)	2007	DBLP DOI BibTeX RDF	motion performance, range of motion (ROM), partial pressure suit (PPS), protective clothing (PC), ergonomics evaluation
13	Teemu Kanstrén	Towards Trace Based Model Synthesis for Program Understanding and Test Automation.	ICSEA	2007	DBLP DOI BibTeX RDF
13	Qiang Zhu 0008, Aviral Shrivastava, Nikil D. Dutt	Interactive presentation: Functional and timing validation of partially bypassed processor pipelines.	DATE	2007	DBLP DOI BibTeX RDF
13	Gennaro Costagliola, Vittorio Fuccella, Massimiliano Giordano, Giuseppe Polese	Logging and Visualization of Learner Behaviour in Web-Based E-Testing.	ICWL	2007	DBLP DOI BibTeX RDF
13	Cyrille Artho, Zhongwei Chen, Shinichi Honiden	AOP-based automated unit test classification of large benchmarks.	COMPSAC (2)	2007	DBLP DOI BibTeX RDF
13	Stefan Baerisch	Model-driven test-case construction.	ESEC/SIGSOFT FSE	2007	DBLP DOI BibTeX RDF	model-driven testing, test automation, acceptance testing
13	Mohammad Donyaee, Ahmed Seffah, Juergen Rilling	Benchmarking usability of early designs using predictive metrics.	SMC	2007	DBLP DOI BibTeX RDF
13	Sanjoy K. Baruah	Techniques for Multiprocessor Global Schedulability Analysis.	RTSS	2007	DBLP DOI BibTeX RDF
13	Xiaoxia Ren, Barbara G. Ryder	Heuristic ranking of java program edits for fault localization.	ISSTA	2007	DBLP DOI BibTeX RDF	heuristic ranking, java, testing, debugging, fault localization, change impact analysis
13	Yuhong Cai, John C. Grundy, John G. Hosking	Synthesizing client load models for performance engineering via web crawling.	ASE	2007	DBLP DOI BibTeX RDF	form chart, web load testing, web user behaviour modelling
13	Gefu Xu, Adit D. Singh	Delay Test Scan Flip-Flop: DFT for High Coverage Delay Testing.	VLSI Design	2007	DBLP DOI BibTeX RDF
13	Mario Larch, Janette F. Walde	Lag or Error? - Detecting the Nature of Spatial Correlation.	GfKl	2007	DBLP DOI BibTeX RDF
13	Ivan Damgård, Gudmund Skovbjerg Frandsen	An Extended Quadratic Frobenius Primality Test with Average- and Worst-Case Error Estimate.	J. Cryptol.	2006	DBLP DOI BibTeX RDF
13	Tao Xie 0001, David Notkin	Tool-assisted unit-test generation and selection based on operational abstractions.	Autom. Softw. Eng.	2006	DBLP DOI BibTeX RDF
13	S. J. Fakih, T. K. Das	LEAD: A Methodology for Learning Efficient Approaches to Medical Diagnosis.	IEEE Trans. Inf. Technol. Biomed.	2006	DBLP DOI BibTeX RDF
13	Josef Strnadel, Arghya Kumar Dhali	Novel Optimizing Approach in the Area of STEP-Based Construction of Sessionless, Power-Constrainted, TAM and Time Optimal Test Schedules.	ECBS	2006	DBLP DOI BibTeX RDF
13	Johannes Maria Zaha, Antonia Albani	Compatibility Test for Coordination Aspects of Software Components.	ASWEC	2006	DBLP DOI BibTeX RDF
13	Renée C. Bryce, Ajitha Rajan, Mats Per Erik Heimdahl	Interaction Testing in Model-Based Development: Effect on Model-Coverage.	APSEC	2006	DBLP DOI BibTeX RDF
13	Gefu Xu, Adit D. Singh	Low Cost Launch-on-Shift Delay Test with Slow Scan Enable.	ETS	2006	DBLP DOI BibTeX RDF
13	Stéphane Ducasse, Tudor Gîrba, Roel Wuyts	Object-Oriented Legacy System Trace-based Logic Testing.	CSMR	2006	DBLP DOI BibTeX RDF	testing, logic programming, legacy systems, dynamic information
13	Sebastian G. Elbaum, Hui Nee Chin, Matthew B. Dwyer, Jonathan Dokulil	Carving differential unit test cases from system test cases.	SIGSOFT FSE	2006	DBLP DOI BibTeX RDF	carving and replay, regression testing, automated test generation
13	Ian Holden, Dave Dalton	Improving Testing Efficiency using Cumulative Test Analysis.	TAIC PART	2006	DBLP DOI BibTeX RDF
13	Victor S. Sheng, Charles X. Ling	Feature value acquisition in testing: a sequential batch test algorithm.	ICML	2006	DBLP DOI BibTeX RDF
13	Patricio Bulic, Veselko Gustin	An efficient way to filter out data dependences with a sufficiently large distance between memory references.	ACM SIGPLAN Notices	2005	DBLP DOI BibTeX RDF	SIMD microprocessors, vectorizing compilers, data dependence analysis
13	Thomas A. Alspaugh, Debra J. Richardson, Thomas A. Standish	Scenarios, state machines and purpose-driven testing.	ACM SIGSOFT Softw. Eng. Notes	2005	DBLP DOI BibTeX RDF
13	Said Hamdioui, John Eleazar Q. Delos Reyes	New data-background sequences and their industrial evaluation for word-oriented random-access memories.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2005	DBLP DOI BibTeX RDF
13	Xiao Liu 0010, Michael S. Hsiao, Sreejit Chakravarty, Paul J. Thadikaran	Efficient techniques for transition testing.	ACM Trans. Design Autom. Electr. Syst.	2005	DBLP DOI BibTeX RDF	test chain, test data volume reduction, transition faults, Test application time reduction, yield loss
13	Philippe Golle, Nicolas Ducheneaut	Preventing bots from playing online games.	Comput. Entertain.	2005	DBLP DOI BibTeX RDF	reverse Turing test, agents, games, CAPTCHAs, bots
13	Simon Lever	Eclipse Platform Integration of Jester - The JUnit Test Tester.	XP	2005	DBLP DOI BibTeX RDF
13	Christian Schwarz, Stein Kåre Skytteren, Trond Marius Øvstetun	AutAT: an eclipse plugin for automatic acceptance testing of web applications.	OOPSLA Companion	2005	DBLP DOI BibTeX RDF	automatic acceptance test, web application, test driven development, change control
13	Anders Larsson, Erik Larsson, Petru Eles, Zebo Peng	SOC Test Scheduling with Test Set Sharing and Broadcasting.	Asian Test Symposium	2005	DBLP DOI BibTeX RDF
13	Viktor Zykov, Josh C. Bongard, Hod Lipson	Co-evolutionary Variance Can Guide Physical Testing in Evolutionary System Identification.	Evolvable Hardware	2005	DBLP DOI BibTeX RDF
13	Takaharu Yamazaki, Tetsu Watanabe, Yoshikazu Nakajima, Kazuomi Sugamoto, Tetsuya Tomita, Hideki Yoshikawa, Shinichi Tamura	Improvement of depth position in 2-D/3-D registration of knee implants using single-plane fluoroscopy.	IEEE Trans. Medical Imaging	2004	DBLP DOI BibTeX RDF
13	Daniela De Canditiis, Theofanis Sapatinas	Testing for additivity and joint effects in multivariate nonparametric regression using Fourier and wavelet methods.	Stat. Comput.	2004	DBLP DOI BibTeX RDF	joint effects, tensor product Hilbert spaces, wavelet transform, Fourier transform, hypothesis testing, nonparametric regression, additive models
13	Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor, Mike Rodgers	Linked faults in random access memories: concept, fault models, test algorithms, and industrial results.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2004	DBLP DOI BibTeX RDF
13	Henry Muccini, Antonia Bertolino, Paola Inverardi	Using Software Architecture for Code Testing.	IEEE Trans. Software Eng.	2004	DBLP DOI BibTeX RDF	Software engineering, software architectures, tracing, testing strategies, testing and debugging
13	Jennitta Andrea	Putting a Motor on the Canoo WebTest Acceptance Testing Framework.	XP	2004	DBLP DOI BibTeX RDF	Canoo WebTest, framework extension, test automation patterns, user acceptance testing, Automated testing, testing strategy
13	Polyhronis Spanoudakis, Nikos Tsourveloudis, Kimon P. Valavanis	Design Specifications for an Unmanned VTOL.	ICRA	2004	DBLP DOI BibTeX RDF
13	Yonsang Cho, Irith Pomeranz, Sudhakar M. Reddy	Test Application Time Reduction for Scan Circuits Using Limited Scan Operations.	ISQED	2004	DBLP DOI BibTeX RDF
13	Hangkyu Lee, Irith Pomeranz, Sudhakar M. Reddy	Scan BIST Targeting Transition Faults Using a Markov Source.	ISQED	2004	DBLP DOI BibTeX RDF
13	Shahdad Irajpour, Sandeep K. Gupta 0001, Melvin A. Breuer	Timing-Independent Testing of Crosstalk in the Presence of Delay Producing Defects Using Surrogate Fault Models.	ITC	2004	DBLP DOI BibTeX RDF
13	Mats Skoglund, Per Runeson	A Case Study on Regression Test Suite Maintenance in System Evolution.	ICSM	2004	DBLP DOI BibTeX RDF
13	Moez Krichen, Stavros Tripakis	Real-Time Testing with Timed Automata Testers and Coverage Criteria.	FORMATS/FTRTFT	2004	DBLP DOI BibTeX RDF
13	Elizeu Coutinho de Macedo, Fernando C. Capovilla, Cleber Diana, Fernanda Orsati, Carolina Nikaedo	Development of a Test Battery to Assess Deaf Language Skills via WWW.	WebMedia/LA-WEB	2004	DBLP DOI BibTeX RDF
13	Jörg E. Vollrath	Testing and Characterization of SDRAMs.	IEEE Des. Test Comput.	2003	DBLP DOI BibTeX RDF
13	Rick Mugridge, Bruce A. MacDonald, Partha S. Roop	A Customer Test Generator for Web-Based Systems.	XP	2003	DBLP DOI BibTeX RDF
13	Patricio Bulic, Veselko Gustin	Data Dependence Analysis for Intra-Register Vectorization.	ISPDC	2003	DBLP DOI BibTeX RDF
13	Ivan Damgård, Gudmund Skovbjerg Frandsen	An Extended Quadratic Frobenius Primality Test with Average and Worst Case Error Estimates.	FCT	2003	DBLP DOI BibTeX RDF
13	M. C. Scott, M. O. Peralta, Jo Dale Carothers	System and Framework for QA of Process Design Kits.	ISQED	2003	DBLP DOI BibTeX RDF
13	Kwang Hee Ko, Takashi Maekawa, Nicholas M. Patrikalakis, H. Masuda, Franz-Erich Wolter	Shape intrinsic fingerprints for free-form object matching.	Symposium on Solid Modeling and Applications	2003	DBLP DOI BibTeX RDF	umbilics, localization, matching, similarity, fingerprints, registration, NURBS, partial matching
13	Srivaths Ravi 0001, Ganesh Lakshminarayana, Niraj K. Jha	High-level test compaction techniques.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2002	DBLP DOI BibTeX RDF
13	Dave Thomas, Andy Hunt	Mock Objects.	IEEE Softw.	2002	DBLP DOI BibTeX RDF
13	Tobias Polzin, Siavash Vahdati Daneshmand	Extending Reduction Techniques for the Steiner Tree Problem.	ESA	2002	DBLP DOI BibTeX RDF	Reductions, Steiner Problem
13	Sandeep Koranne	On Test Scheduling for Core-Based SOCs.	ASP-DAC/VLSI Design	2002	DBLP DOI BibTeX RDF
13	Luís Torgo	A Study on End-Cut Preference in Least Squares Regression Trees.	EPIA	2001	DBLP DOI BibTeX RDF
13	Joachim Wegener, Matthias Grochtmann	Evolutionärer Test von Realzeitsystemen.	Inform. Forsch. Entwickl.	2000	DBLP DOI BibTeX RDF	Realzeitsystem, Zeitverhalten, Evolutionärer Test, Evolutionäre Algorithmen, Test
13	Pramodchandran N. Variyam, Abhijit Chatterjee	Specification-driven test generation for analog circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2000	DBLP DOI BibTeX RDF
13	Phil Koopman, John DeVale	The Exception Handling Effectiveness of POSIX Operating Systems.	IEEE Trans. Software Eng.	2000	DBLP DOI BibTeX RDF	Ballista, multiversion comparison, testing, robustness, operating systems, Exception handling, POSIX
13	Irith Pomeranz, Sudhakar M. Reddy	Functional Test Generation for Full Scan Circuits.	DATE	2000	DBLP DOI BibTeX RDF
13	Gonçalo Quadros, Antonio Alves, Edmundo Monteiro, Fernando Boavida	An Effective Scheduler for IP Routers.	ISCC	2000	DBLP DOI BibTeX RDF
13	Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, Masashi Takeda	Testability Analysis of IDDQ Testing with Large Threshold Value.	DFT	2000	DBLP DOI BibTeX RDF
13	Benoit Baudry, Vu Le Hanh, Yves Le Traon	Testing-for-Trust: The Genetic Selection Model Applied to Component Qualification.	TOOLS (33)	2000	DBLP DOI BibTeX RDF
13	Raghuram S. Tupuri, Jacob A. Abraham, Daniel G. Saab	Hierarchical Test Generation for Systems On a Chip.	VLSI Design	2000	DBLP DOI BibTeX RDF
13	Ronen Basri, Yael Moses	When is it Possible to Identify 3D Objects From Single Images Using Class Constraints?	Int. J. Comput. Vis.	1999	DBLP DOI BibTeX RDF	class-based recognition, object recognition, viewpoint invariance
13	Gerard J. Holzmann	The Engineering of a Model Checker: The Gnu i-Protocol Case Study Revisited.	SPIN	1999	DBLP DOI BibTeX RDF
13	Jörg E. Vollrath	Tutorial: Characterizing SDRAMS.	MTDT	1999	DBLP DOI BibTeX RDF
13	Soumitra Bose, Prathima Agrawal, Vishwani D. Agrawal	A rated-clock test method for path delay faults.	IEEE Trans. Very Large Scale Integr. Syst.	1998	DBLP DOI BibTeX RDF
13	Abhik Roychoudhury, C. R. Ramakrishnan 0001, I. V. Ramakrishnan, R. Sekar 0001	A Conservative Technique to Improve Deterministic Evaluation of Logic Programs.	ICCL	1998	DBLP DOI BibTeX RDF	Optimization of Logic Programs, Program Specialization, Determinacy
13	Debaleena Das, Mark G. Karpovsky	Exhaustive and Near-Exhaustive Memory Testing Techniques and their BIST Implementations.	J. Electron. Test.	1997	DBLP DOI BibTeX RDF	exhaustive codes, near-exhaustive codes, built-in self-test, memory testing, pattern sensitive faults
13	Donald Staab, Eugene R. Hnatek	Diagnosing IC Failures in a Fast Environment.	IEEE Des. Test Comput.	1997	DBLP DOI BibTeX RDF
13	Ad J. van de Goor, Issam B. S. Tlili	Disturb Neighborhood Pattern Sensitive Fault.	VTS	1997	DBLP DOI BibTeX RDF	Memory fault models, disturb coupling fault model, neighborhood pattern sensitive faults, test algorithms
13	Kuo-Chung Tai	Theory of Fault-Based Predicate Testing for Computer Programs.	IEEE Trans. Software Eng.	1996	DBLP DOI BibTeX RDF	predicate testing, boolean operator faults, relational operator faults, off-by-$epsilon$ faults, Software testing, fault-based testing
13	Donald Geman, Bruno Jedynak	An Active Testing Model for Tracking Roads in Satellite Images.	IEEE Trans. Pattern Anal. Mach. Intell.	1996	DBLP DOI BibTeX RDF	active testing, SPOT images, Decision tree, model-based tracking, roads
13	Richard Gerber 0001, Ladan Gharai	Experiments with Digital Video Playback.	SIGMETRICS	1996	DBLP DOI BibTeX RDF
13	Tapan J. Chakraborty, Vishwani D. Agrawal	Design for high-speed testability of stuck-at faults.	VLSI Design	1996	DBLP DOI BibTeX RDF	design for high-speed testability, stuck-at fault detection, signal transition, timing hazard, multivalue algebra, dh-robust test, sequential feedback, reconvergent fanout, cycle-free sequential circuit, fault diagnosis, logic testing, delays, design for testability, logic design, sequential circuits, partial scan, test generation algorithm, critical path delay
13	Kyu-Young Whang, Ju-Won Song, Ji-Woong Chang, Ji-Yun Kim, Wan-Sup Cho, Chong-Mok Park, Il-Yeol Song	Octree-R: An Adaptive Octree for Efficient Ray Tracing.	IEEE Trans. Vis. Comput. Graph.	1995	DBLP DOI BibTeX RDF	Ray tracing octree, Octree-R, space subdivision
13	Hiroshi Takahashi, Nobuhiro Yanagida, Yuzo Takamatsu	Enhancing multiple fault diagnosis in combinational circuits based on sensitized paths and EB testing.	Asian Test Symposium	1995	DBLP DOI BibTeX RDF	electron beam testing, multiple fault diagnosis, sensitized paths, EB testing, TP-1, TP-2, TP-3, TP-4, electron-beam tester, internal lines, VLSI, fault diagnosis, logic testing, combinational circuits, combinational circuits, fault location, fault location, stuck-at faults, diagnostic resolution
13	Andrej Zemva, Franc Brglez	Detectable perturbations: a paradigm for technology-specific multi-fault test generation.	VTS	1995	DBLP DOI BibTeX RDF	detectable perturbations, technology-specific multi-fault test generation, multiple bridging, open faults, single-output modules, multi-output modules, mutation faults, technology-mapped cells, fault diagnosis, logic testing, integrated circuit testing, combinational circuits, combinational circuits, automatic testing, stuck-at faults, cellular arrays, benchmark circuits, generic system
13	Linda S. Milor, Alberto L. Sangiovanni-Vincentelli	Minimizing production test time to detect faults in analog circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1994	DBLP DOI BibTeX RDF
13	Zoltan Somogyi, David B. Kemp, James Harland, Kotagiri Ramamohanarao	Subsumption-Free Bottom-up Evaluation of Logic Programs with Partially Instantiated Data Structures.	EDBT	1994	DBLP DOI BibTeX RDF
13	Peter C. Maxwell, Robert C. Aitken	IDDQ testing as a component of a test suite: The need for several fault coverage metrics.	J. Electron. Test.	1992	DBLP DOI BibTeX RDF	quality, fault coverage, scan, functional testing, Current testing, physical defects
13	J.-M. Lippens, J. Arnol	Testing and Integrating a Large Embedded Real-Time System.	Ada-Europe	1991	DBLP DOI BibTeX RDF
13	Linda S. Milor, V. Visvanathan	Detection of catastrophic faults in analog integrated circuits.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	1989	DBLP DOI BibTeX RDF
13	W. Edward Hammond	Patient management systems: the early years.	History of Medical Informatics	1987	DBLP DOI BibTeX RDF
13	Takuji Ogihara, Shuichi Saruyama, Shinichi Murai	PATEGE: an automatic DC parametric test generation system for series gated ECL circuits.	DAC	1985	DBLP DOI BibTeX RDF
13	Richard Kennaway, C. A. R. Hoare	A Theory of Nondeterminism.	ICALP	1980	DBLP DOI BibTeX RDF	axiomatic sematnics, complementary definitions, powerdomains, operational semantics, nondeterminism
12	Ming Gao, Hsiu-Ming Chang 0001, Peter Lisherness, Kwang-Ting (Tim) Cheng	Time-Multiplexed Online Checking.	IEEE Trans. Computers	2011	DBLP DOI BibTeX RDF	fault tolerance, Availability, built-in tests, error-checking
12	Sandra Irobi, Zaid Al-Ars, Said Hamdioui	Memory Test Optimization for Parasitic Bit Line Coupling in SRAMs.	ETS	2011	DBLP DOI BibTeX RDF	Parasitic Bit Line coupling, SRAMs, Memory tests
12	Andrea Valente, Emanuela Marchetti	Please Don't Make Me Draw!.	eKNOW	2010	DBLP DOI BibTeX RDF	rich pictures, qualitative tests, learning, knowledge acquisition, object-oriented analysis