Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
1 | Cristiana Bolchini, Antonio Miele, Fabio Salice, Donatella Sciuto, Luigi Pomante |
Reliable System Co-Design: The FIR Case Study. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Nitin Parimi, Xiaoling Sun |
Toggle-Masking for Test-per-Scan VLSI Circuits. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Jing Huang 0001, Mariam Momenzadeh, Mehdi Baradaran Tahoori, Fabrizio Lombardi |
Defect Characterization for Scaling of QCA Devices. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Swarup Bhunia, Hamid Mahmoodi-Meimand, Arijit Raychowdhury, Kaushik Roy 0001 |
First Level Hold: A Novel Low-Overhead Delay Fault Testing Technique. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Adão Antônio de Souza Jr., Luigi Carro |
Robust Low-Cost Analog Signal Acquisition with Self-Test Capabilities. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Michele Favalli |
Annotated Bit Flip Fault Model. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Shanrui Zhang, Minsu Choi, Nohpill Park, Fabrizio Lombardi |
Probabilistic Balancing of Fault Coverage and Test Cost in Combined Built-In Self-Test/Automated Test Equipment Testing Environment. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Yukiya Miura |
Fault Diagnosis of Analog Circuits by Operation-Region Model and X-Y Zoning Method. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Yen-Lin Peng, Jing-Jia Liou, Chih-Tsun Huang, Cheng-Wen Wu |
An Application-Independent Delay Testing Methodology for Island-Style FPGA. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
segment delay fault, FPGA, delay testing, path delay fault |
1 | John Y. Fong, Randy Acklin, John Roscher, Feng Li, Cindy Laird, Cezary Pietrzyk |
Nonvolatile Repair Caches Repair Embedded SRAM and New Nonvolatile Memories. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Dilip P. Vasudevan, Parag K. Lala, James Patrick Parkerson |
Online Testable Reversible Logic Circuit Design using NAND Blocks. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Glenn H. Chapman, Vijay K. Jain, Shekhar Bhansali |
Defect Avoidance in a 3-D Heterogeneous Sensor. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Michele Favalli |
"Victim Gate" Crosstalk Fault Model. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Stefano Bertazzoni, Domenico Di Giovenale, Marcello Salmeri, Arianna Mencattini, Adelio Salsano, M. Florean, Jeffery Wyss, Ricardo Rando, Silvano Lora |
Monitoring Methodology for TID Damaging of SDRAM Devices based on Retention Time Analysis. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Brian Peng, Ing-Yi Chen, Sy-Yen Kuo, Colin Bolger |
IC HTOL Test Stress Condition Optimization. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Hung-Yau Lin, Fu-Min Yeh, Ing-Yi Chen, Sy-Yen Kuo |
An Efficient Perfect Algorithm for Memory Repair Problems. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Ammar Aljer, Philippe Devienne |
Co-Design and Refinement for Safety Critical Systems. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Jerzy J. Dabrowski, Javier Gonzalez Bayon |
Mixed Loopback BiST for RF Digital Transceivers. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Naotake Kamiura, Teijiro Isokawa, Nobuyuki Matsui |
Learning Based on Fault Injection and Weight Restriction for Fault-Tolerant Hopfield Neural Networks. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Yu-Tsao Hsing, Chih-Wea Wang, Ching-Wei Wu, Chih-Tsun Huang, Cheng-Wen Wu |
Failure Factor Based Yield Enhancement for SRAM Designs. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Shanrui Zhang, Minsu Choi, Nohpill Park |
Modeling Yield of Carbon-Nanotube/Silicon-Nanowire FET-Based Nanoarray Architecture with h-hot Addressing Scheme. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Guido Bertoni, Luca Breveglieri, Israel Koren, Paolo Maistri |
An Efficient Hardware-Based Fault Diagnosis Scheme for AES: Performances and Cost. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Masaru Fukushi, Susumu Horiguchi |
Reconfiguration Algorithm for Degradable Processor Arrays Based on Row and Column Rerouting. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Martin Omaña 0001, Daniele Rossi 0001, Cecilia Metra |
Fast and Low-Cost Clock Deskew Buffer. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Gian Carlo Cardarilli, Marco Ottavi, Salvatore Pontarelli, Marco Re, Adelio Salsano |
Data Integrity Evaluations of Reed Solomon Codes for Storage Systems. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Hamidreza Hashempour, Luca Schiano, Fabrizio Lombardi |
Error-Resilient Test Data Compression Using Tunstall Codes. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Roman Barsky, Israel A. Wagner |
Reliability and Yield: A Joint Defect-Oriented Approach. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Najwa Aaraj, Anis Nazer, Ali Chehab, Ayman I. Kayssi |
Transient Current Testing of Dynamic CMOS Circuits. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Gang Zeng, Hideo Ito |
Non-Intrusive Test Compression for SOC Using Embedded FPGA Core. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Ajoy Kumar Palit, Volker Meyer, Walter Anheier, Jürgen Schlöffel |
Modeling and Analysis of Crosstalk Coupling Effect on the Victim Interconnect Using the ABCD Network Model. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Ping-Hsun Hsieh, Ing-Yi Chen, Yu-Ting Lin, Sy-Yen Kuo |
An XOR Based Reed-Solomon Algorithm for Advanced RAID Systems. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Arvind Kumar, Sandip Tiwari |
Testing and Defect Tolerance: A Rent's Rule Based Analysis and Implications on Nanoelectronics. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Jennifer Dworak, James Wingfield, M. Ray Mercer |
A Preliminary Investigation of Observation Diversity for Enhancing Fortuitous Detection of Defects. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Tao Feng, Nohpill Park, Yong-Bin Kim, Fabrizio Lombardi, Fred J. Meyer |
Reliability Modeling and Assurance of Clockless Wave Pipeline. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Michelle L. La Haye, Glenn H. Chapman, Cory Jung, Desmond Y. H. Cheung, Sunjaya Djaja, Benjamin Wang, Gary Liaw, Yves Audet |
Characteristics of Fault-Tolerant Photodiode and Photogate Active Pixel Sensor (APS). |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Mohamed Abbas, Makoto Ikeda, Kunihiro Asada |
Noise Effects on Performance of Low Power Design Schemes in Deep Submicron Regime. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Irith Pomeranz, Sudhakar M. Reddy |
Reducing Fault Latency in Concurrent On-Line Testing by Using Checking Functions over Internal Lines. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Irith Pomeranz, Sudhakar M. Reddy |
Concurrent On-Line Testing of Identical Circuits Through Output Comparison Using Non-Identical Input Vectors. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Carlos Arthur Lang Lisbôa, Luigi Carro |
Arithmetic Operators Robust to Multiple Simultaneous Upsets. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Andrzej Krasniewski |
Concurrent Error Detection in Sequential Circuits Implemented Using Embedded Memory of LUT-Based FPGAs. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Alexandre Schmid, Yusuf Leblebici |
A Highly Fault Tolerant PLA Architecture for Failure-Prone Nanometer CMOS and Novel Quantum Device Technologies. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Yung-Yuan Chen, Kun-Feng Chen |
Incorporating Signature-Monitoring Technique in VLIW Processors. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Régis Leveugle, D. Cimonnet, Abdelaziz Ammari |
System-Level Dependability Analysis with RT-Level Fault Injection Accuracy. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Xiaopeng Wang, Marco Ottavi, Fabrizio Lombardi |
Testing of Inter-Word Coupling Faults in Word-Oriented SRAMs. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
inter-word fault, testing, memory, detection, Coupling fault |
1 | Matteo Sonza Reorda, Massimo Violante |
On-Line Analysis and Perturbation of CAN Networks. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Lorena Anghel, Ernesto Sánchez 0001, Matteo Sonza Reorda, Giovanni Squillero, Raoul Velazco |
Coupling Different Methodologies to Validate Obsolete Microprocessors. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Baosheng Wang, Yuejian Wu, André Ivanov |
Designs for Reducing Test Time of Distributed Small Embedded SRAMs. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
Distributed Small Embedded SRAMs, Data Retention Fault Test, Response Analysis, Test Time |
1 | Nicola Bombieri, Franco Fummi, Graziano Pravadelli |
At-Speed Functional Verification of Programmable Devices. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Hamidreza Hashempour, Fabrizio Lombardi |
Compression of VLSI Test Data by Arithmetic Coding. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Xiaopeng Wang, Marco Ottavi, Fred J. Meyer, Fabrizio Lombardi |
On The Yield of Compiler-Based eSRAMs. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Paolo Bernardi, Maurizio Rebaudengo, Matteo Sonza Reorda |
Exploiting an I-IP for In-Field SOC Test. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Jing Huang 0001, Mehdi Baradaran Tahoori, Fabrizio Lombardi |
On the Defect Tolerance of Nano-Scale Two-Dimensional Crossbars. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
1 | Wangqi Qiu, Xiang Lu, Zhuo Li 0001, D. M. H. Walker, Weiping Shi |
CodSim -- A Combined Delay Fault Simulator. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Bai Hong Fang, Nicola Nicolici |
Power-Constrained Embedded Memory BIST Architecture. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Daniele Rossi 0001, S. Cavallotti, Cecilia Metra |
Error Correcting Codes for Crosstalk Effect Minimization. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Marco S. Dragic, Martin Margala |
Power Supply Current Test Approach for Resistive Fault Screening in Embedded Analog Circuits. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | John Marty Emmert, Jason A. Cheatham, Badhri Jagannathan, Sandeep Umarani |
An FFT Approximation Technique Suitable for On-Chip Generation and Analysis of Sinusoidal Signals. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Vikram Iyengar, Anshuman Chandra |
A Uni.ed SOC Test Approach Based on Test Data Compression and TAM Design. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Vijay K. Jain, Glenn H. Chapman |
Level-Hybrid Optoelectronic TESH Interconnection Network. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Luca Schiano, Fabrizio Lombardi |
On the Test and Diagnosis of the Perfect Shuffle. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | James Wingfield, Jennifer Dworak, M. Ray Mercer |
Function-Based Dynamic Compaction and its Impact on Test Set Sizes. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Konstantinos Rokas, Yiorgos Makris, Dimitris Gizopoulos |
Low Cost Convolutional Code Based Concurrent Error Detection in FSMs. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Gert Jervan, Petru Eles, Zebo Peng, Raimund Ubar, Maksim Jenihhin |
Hybrid BIST Time Minimization for Core-Based Systems with STUMPS Architecture. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Cecilia Metra, T. M. Mak, Daniele Rossi 0001 |
Clock Calibration Faults and their Impact on Quality of High Performance Microprocessors. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Rob Aitken, Neeraj Dogra, Dhrumil Gandhi, Scott Becker |
Redundancy, Repair, and Test Features of a 90nm Embedded SRAM Generator. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Ching-Hwa Cheng |
Design Scan Test Strategy for Single Phase Dynamic Circuits. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Ying Zhang 0041, Krishnendu Chakrabarty |
Fault Recovery Based on Checkpointing for Hard Real-Time Embedded Systems. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Rafic A. Ayoubi, Haissam Ziade, Magdy A. Bayoumi |
Fault Tolerant Hopfield Associative Memory on Torus. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Eiko Sugawara, Masaru Fukushi, Susumu Horiguchi |
Fault Tolerant Multi-Layer Neural Networks with GA Training. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Gang Zeng, Hideo Ito |
Efficient Test Data Decompression for System-on-a-Chip Using an Embedded FPGA Core. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Fulvio Corno, Simonluca Tosato, Paolo Gabrielli |
System-Level Analysis of Fault Effects in an Automotive Environment. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Abdelaziz Ammari, Régis Leveugle, Matteo Sonza Reorda, Massimo Violante |
Detailed Comparison of Dependability Analyses Performed at RT and Gate Levels. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Debjyoti Ghosh, Swarup Bhunia, Kaushik Roy 0001 |
Multiple Scan Chain Design Technique for Power Reduction during Test Application in BIST. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Atul Maheshwari, Israel Koren, Wayne P. Burleson |
Techniques for Transient Fault Sensitivity Analysis and Reduction in VLSI Circuits. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Dirk K. de Vries, Paul L. C. Simon |
Calibration of Open Interconnect Yield Models. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Meng Lu, Yvon Savaria, Bing Qiu 0003, Jacques Taillefer |
IEEE 1149.1 Based Defect and Fault Tolerant Scan Chain for Wafer Scale Integration. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Whitney J. Townsend, Jacob A. Abraham, Earl E. Swartzlander Jr. |
Quadruple Time Redundancy Adders. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Kedarnath J. Balakrishnan, Nur A. Touba |
Scan-Based BIST Diagnosis Using an Embedded Processor. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Parag K. Lala |
A Single Error Correcting and Double Error Detecting Coding Scheme for Computer Memory Systems. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Michael Nicolaidis, Nadir Achouri, Lorena Anghel |
A Memory Built-In Self-Repair for High Defect Densities Based on Error Polarities. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Lorena Anghel, Raoul Velazco, S. Saleh, S. Deswaertes, A. El Moucary |
Preliminary Validation of an Approach Dealing with Processor Obsolescence. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Kartik Mohanram, Nur A. Touba |
Partial Error Masking to Reduce Soft Error Failure Rate in Logic Circuits. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Adam B. Kinsman, Jonathan I. Hewitt, Nicola Nicolici |
Embedded Compact Deterministic Test for IP-Protected Cores. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Jerzy J. Dabrowski |
BiST Model for IC RF-Transceiver Front-End. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Julio Pérez, Matteo Sonza Reorda, Massimo Violante |
Dependability Analysis of CAN Networks: An Emulation-Based Approach. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | |
18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings |
DFT |
2003 |
DBLP BibTeX RDF |
|
1 | Monica Alderighi, Fabio Casini, Sergio D'Angelo, Marcello Mancini, A. Marmo, Sandro Pastore, Giacomo R. Sechi |
A Tool for Injecting SEU-Like Faults into the Configuration Control Mechanism of Xilinx Virtex FPGAs. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Cecilia Metra, Stefano Di Francescantonio, Martin Omaña 0001 |
Automatic Modification of Sequential Circuits for Self-Checking Implementation. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Fengming Zhang, Young-Jun Lee, Thomas Kane, Luca Schiano, Mariam Momenzadeh, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi, Solomon Max, Phil Perkinson |
A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Guido Bertoni, Luca Breveglieri, Israel Koren, Paolo Maistri, Vincenzo Piuri |
Detecting and Locating Faults in VLSI Implementations of the Advanced Encryption Standard. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Gian Carlo Cardarilli, Marco Ottavi, Salvatore Pontarelli, Marco Re, Adelio Salsano |
Error Detection in Signed Digit Arithmetic Circuit with Parity Checker. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | John Marty Emmert, Jason A. Cheatham, Badhri Jagannathan, Sandeep Umarani |
A Monolithic Spectral BIST Technique for Control or Test of Analog or Mixed-Signal Circuits. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Cristiana Bolchini, Fabio Salice, Donatella Sciuto, R. Zavaglia |
An Integrated Design Approach for Self-Checking FPGAs. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Arman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi |
Thermal Management of High Performance Microprocessors. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Mehdi Baradaran Tahoori |
Application-Dependent Testing of FPGA Interconnects. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Sunjaya Djaja, Glenn H. Chapman, Desmond Y. H. Cheung, Yves Audet |
Implementation and Testing of Fault-Tolerant Photodiode-Based Active Pixel Sensor (APS). |
DFT |
2003 |
DBLP DOI BibTeX RDF |
photodiode APS, fault-tolerance, redundancy, SOC, CMOS image sensor, active pixel sensor |
1 | Hiroshi Takahashi, Yasunori Tsugaoka, Hidekazu Ayano, Yuzo Takamatsu |
BIST Based Fault Diagnosis Using Ambiguous Test Set. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Anders Larsson, Erik Larsson, Petru Eles, Zebo Peng |
Buffer and Controller Minimisation for Time-Constrained Testing of System-On-Chip. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Tao Feng, Nohpill Park, Yong-Bin Kim, Vincenzo Piuri |
Yield Modeling and Analysis of a Clockless Asynchronous Wave Pipeline with Pulse Faults. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
1 | Abhijit Prasad, D. M. H. Walker |
Chip Level Power Supply Partitioning for IDDQ Testing Using Built-In Current Sensors. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|