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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 3212 occurrences of 1532 keywords
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Results
Found 5103 publication records. Showing 5103 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
12 | Venkata U. B. Challagulla, Farokh B. Bastani, I-Ling Yen, Raymond A. Paul |
Empirical Assessment of Machine Learning based Software Defect Prediction Techniques. |
WORDS |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Cory Jung, Mohammad Hadi Izadi, Michelle L. La Haye |
Noise Analysis of Fault Tolerant Active Pixel Sensors. |
DFT |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Haixia Gao, Yintang Yang, Xiaohua Ma, Gang Dong |
Testing for Resistive Shorts in FPGA Interconnects. |
ISQED |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Michel Côté, Philippe Hurat |
Standard Cell Printability Grading and Hot Spot Detection. |
ISQED |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Victor R. Basili, Forrest Shull |
Evolving Defect "Folklore": A Cross-Study Analysis of Software Defect Behavior. |
ISPW |
2005 |
DBLP DOI BibTeX RDF |
|
12 | G. Bhaskar Rao, Keerthi Timmaraju, Thomas Weigert |
Network Element Testing Using TTCN-3: Benefits and Comparison. |
SDL Forum |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Jin-Fu Li 0001, Chou-Kun Lin |
Modeling and Testing Comparison Faults for Ternary Content Addressable Memories. |
VTS |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Dhruva Acharyya, Jim Plusquellic |
Hardware Results Demonstrating Defect Detection Using Power Supply Signal Measurements. |
VTS |
2005 |
DBLP DOI BibTeX RDF |
|
12 | David Leon, Wes Masri, Andy Podgurski |
An empirical evaluation of test case filtering techniques based on exercising complex information flows. |
ICSE |
2005 |
DBLP DOI BibTeX RDF |
dynamic information flow analysis, test case filtering, software testing, dynamic slicing, program dependences, observation-based testing |
12 | Nachiappan Nagappan, Thomas Ball |
Static analysis tools as early indicators of pre-release defect density. |
ICSE |
2005 |
DBLP DOI BibTeX RDF |
statistical methods, fault-proneness, defect density, static analysis tools |
12 | Richard K. Cheng |
A False Measure of Success "I'd rather have an ounce of cure over this 200 pounds of prevention". |
AGILE |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Peng Guo, Taihua Chang |
MGPC Based on Hopfield Network and Its Application in a Thermal Power Unit Load System. |
ICMLC |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Claes Wohlin |
Are Individual Differences in Software Development Performance Possible to Capture Using a Quantitative Survey?. |
Empir. Softw. Eng. |
2004 |
DBLP DOI BibTeX RDF |
Individual performance, development experience, quantitative survey, Personal Software Process |
12 | Xiaoliang Bai, Sujit Dey |
High-level crosstalk defect Simulation methodology for system-on-chip interconnects. |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Frank Padberg, Thomas Ragg, Ralf Schoknecht |
Using Machine Learning for Estimating the Defect Content After an Inspection. |
IEEE Trans. Software Eng. |
2004 |
DBLP DOI BibTeX RDF |
Defect content estimation, neural networks, software inspections, empirical methods, nonlinear regression |
12 | Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi |
DFT for Delay Fault Testing of High-Performance Digital Circuits. |
IEEE Des. Test Comput. |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Clifford A. Reiter |
With J: image processing 1: smoothing filters. |
ACM SIGAPL APL Quote Quad |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Tor Stålhane, Cat Kutay, Hiyam Al-Kilidar, D. Ross Jeffery |
Teaching the Process of Code Review. |
Australian Software Engineering Conference |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Olga Duran, Kaspar Althoefer, Lakmal D. Seneviratne |
Automated Pipe Inspection using ANN and Laser Data Fusion. |
ICRA |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Amador Durán 0001, Beatriz Bernárdez 0001, Marcela Genero, Mario Piattini |
Empirically Driven Use Case Metamodel Evolution. |
UML |
2004 |
DBLP DOI BibTeX RDF |
metamodel evolution, use cases, empirical software engineering |
12 | Melvin A. Breuer |
Intelligible Test Techniques to Support Error-Tolerance. |
Asian Test Symposium |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Hongbin Jia, Yi Lu Murphey, Jianjun Shi, Tzyy-Shuh Chang |
An Intelligent Real-time Vision System for Surface Defect Detection. |
ICPR (3) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Joachim Schmid 0003 |
The Main Steps to Data Quality. |
ICDM |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Patrik Kenger |
Benefits of Modularity and Module Level Tests. |
BASYS |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Nachiappan Nagappan, Laurie A. Williams, John P. Hudepohl, Will Snipes, Mladen A. Vouk |
Preliminary Results On Using Static Analysis Tools For Software Inspection. |
ISSRE |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Tianqi Zhang, Xiaokang Lin, Zhengzhong Zhou |
Use PCA Neural Network to Extract the PN Sequence in Lower SNR DS/SS Signals. |
ISNN (1) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Youngshin Han, Dongsik Park, Chilgee Lee |
On the Repair of Memory Cells with Spare Rows and Columns for Yield Improvement. |
AsiaSim |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Daisuke Maruyama, Akira Kanuma, Takashi Mochiyama, Hiroaki Komatsu, Yaroku Sugiyama, Noriyuki Ito |
Detection of multiple transitions in delay fault test of SPARC64 microprocessor. |
ICCAD |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Young-Chul Song, Doo-Hyun Choi, Kil-Houm Park |
Morphological Blob-Mura Defect Detection Method for TFT-LCD Panel Inspection. |
KES |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Arvind Kumar, Sandip Tiwari |
Defect tolerance for nanocomputer architecture. |
SLIP |
2004 |
DBLP DOI BibTeX RDF |
wire length estimation, FPGA, reliability, reconfigurability, defect tolerance, nanoelectronics, Rent's rule, nanocomputing |
12 | Sameep Mehta, Kaden Hazzard, Raghu Machiraju, Srinivasan Parthasarathy 0001, John Wilkins |
Detection and Visualization of Anomalous Structures in Molecular Dynamics Simulation Data. |
IEEE Visualization |
2004 |
DBLP DOI BibTeX RDF |
Scientific Data Visualization, Data Mining, Feature Extraction, Transfer Functions, Molecular Dynamics, Iso-surface |
12 | Darrell Reimer, Edith Schonberg, Kavitha Srinivas, Harini Srinivasan, Bowen Alpern, Robert D. Johnson, Aaron Kershenbaum, Larry Koved |
SABER: smart analysis based error reduction. |
ISSTA |
2004 |
DBLP DOI BibTeX RDF |
defect understanding, frameworks, program analysis |
12 | Pekka Abrahamsson, Juha Koskela |
Extreme Programming: A Survey of Empirical Data from a Controlled Case Study. |
ISESE |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Pierre-Louis Bazin, Dzung L. Pham |
Topology Smoothing for Segmentation and Surface Reconstruction. |
MICCAI (1) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | John Y. Fong, Randy Acklin, John Roscher, Feng Li, Cindy Laird, Cezary Pietrzyk |
Nonvolatile Repair Caches Repair Embedded SRAM and New Nonvolatile Memories. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Najwa Aaraj, Anis Nazer, Ali Chehab, Ayman I. Kayssi |
Transient Current Testing of Dynamic CMOS Circuits. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Arvind Kumar, Sandip Tiwari |
Testing and Defect Tolerance: A Rent's Rule Based Analysis and Implications on Nanoelectronics. |
DFT |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Tetsuya Iizuka, Makoto Ikeda, Kunihiro Asada |
Exact Wiring Fault Minimization via Comprehensive Layout Synthesis for CMOS Logic Cells. |
ISQED |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Manish Sharma, Janak H. Patel |
What Does Robust Testing a Subset of Paths, Tell us about the Untested Paths in the Circuit? |
VTS |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Sule Ozev, Christian Olgaard |
Wafer-level RF Test and DfT for VCO Modulating Transceiver Architecures. |
VTS |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Jennifer Dworak, David Dorsey, Amy Wang, M. Ray Mercer |
Excitation, Observation, and ELF-MD: Optimization Criteria for High Quality Test Sets. |
VTS |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Carl Gould 0001, Zhendong Su 0001, Premkumar T. Devanbu |
Static Checking of Dynamically Generated Queries in Database Applications. |
ICSE |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Sanjay Sengupta |
Test Strategies for Nanometer Technologies. |
ITC |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Benjamin M. Mauck, Vishnumohan Ravichandran, Usman Azeez Mughal |
A Design for Test Technique for Parametric Analysis of SRAM: On-Die Low Yield Analysis. |
ITC |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Quming Zhou, Kartik Mohanram |
Analysis of delay caused by bridging faults in RLC interconnects. |
ITC |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Phil Nigh, Anne E. Gattiker |
Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions. |
ITC |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Yuyi Tang, Hans-Joachim Wunderlich, Harald P. E. Vranken, Friedrich Hapke, Michael Wittke, Piet Engelke, Ilia Polian, Bernd Becker 0001 |
X-Masking During Logic BIST and Its Impact on Defect Coverage. |
ITC |
2004 |
DBLP DOI BibTeX RDF |
X-Masking, Resistive Bridging Faults, Defect Coverage, Logic BIST |
12 | Pamela S. Gillis, Francis Woytowich, Andrew Ferko, Kevin McCauley |
Low Overhead Delay Testing of ASICS. |
ITC |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Hans G. Kerkhoff, Arun A. Joseph |
Testability Issues in Superconductor Electronic. |
DELTA |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Masaki Hashizume, Tetsuo Akita, Hiroyuki Yotsuyanagi, Takeomi Tamesada |
CMOS Open Fault Detection by Appearance Time of Switching Supply Current. |
DELTA |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Gethin Norman, David Parker 0001, Marta Z. Kwiatkowska, Sandeep K. Shukla |
Evaluating the Reliability of Defect-Tolerant Architectures for Nanotechnology with Probabilistic Model Checking. |
VLSI Design |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Michel Renovell, Jean Marc Gallière, Florence Azaïs, Yves Bertrand |
Modeling the Random Parameters Effects in a Non-Split Model of Gate Oxide Short. |
J. Electron. Test. |
2003 |
DBLP DOI BibTeX RDF |
minimal-length transistors, fault modeling, gate oxide short |
12 | Wanli Jiang, Eric Peterson |
Performance Comparison of VLV, ULV, and ECR Tests. |
J. Electron. Test. |
2003 |
DBLP DOI BibTeX RDF |
very low voltage test, dynamic current test, test threshold, test effectiveness, test efficiency |
12 | Stefan Biffl, Michael Halling |
Investigating the Defect Detection Effectiveness and Cost Benefit of Nominal Inspection Teams. |
IEEE Trans. Software Eng. |
2003 |
DBLP DOI BibTeX RDF |
cost-benefit modeling, empirical software engineering, Software inspection, reading techniques |
12 | Tong Fang, Mohsen A. Jafari, Stephen C. Danforth, Ahmad Safari |
Signature analysis and defect detection in layered manufacturing of ceramic sensors and actuators. |
Mach. Vis. Appl. |
2003 |
DBLP DOI BibTeX RDF |
Layered manufacturing, Inspection system, Fused deposition of ceramics, Signature analysis, Defect detection |
12 | Noriaki Yoshiura |
Decision Procedures for Several Properties of Reactive System Specifications. |
ISSS |
2003 |
DBLP DOI BibTeX RDF |
Specification Description, Temporal Logic, Reactive System |
12 | Hitoshi Yamauchi, Jörg Haber, Hans-Peter Seidel |
Image Restoration using Multiresolution Texture Synthesis and Image Inpainting. |
Computer Graphics International |
2003 |
DBLP DOI BibTeX RDF |
multiresolution texture synthesis, image in-painting, frequency decomposition, image restoration |
12 | Christian Denger, Daniel M. Berry, Erik Kamsties |
Higher Quality Requirements Specifications through Natural Language Patterns. |
SwSTE |
2003 |
DBLP DOI BibTeX RDF |
embedded systems, authoring, patterns, quality, metamodel, natural language, completeness, accuracy, requirements specification, ambiguity, rewriting, precision |
12 | Giovanni Cantone, Luca Colasanti, Zeiad A. Abdulnabi, Anna Lomartire, Giuseppe Calavaro |
Evaluating Checklist-Based and Use-Case-Driven Reading Techniques as Applied to Software Analysis and Design UML Artifacts. |
ESERNET |
2003 |
DBLP DOI BibTeX RDF |
|
12 | Chenggang Bai, Kai-Yuan Cai, T. Y. Chen |
An Efficient Defect Estimation Method for Software Defect Curves. |
COMPSAC |
2003 |
DBLP DOI BibTeX RDF |
|
12 | Stefan Mankefors, Richard Torkar, Andreas Boklund |
New Quality Estimations in Random Testing. |
ISSRE |
2003 |
DBLP DOI BibTeX RDF |
|
12 | David Leon, Andy Podgurski |
A Comparison of Coverage-Based and Distribution-Based Techniques for Filtering and Prioritizing Test Cases. |
ISSRE |
2003 |
DBLP DOI BibTeX RDF |
|
12 | Jean-Philippe Andreu, Alfred Rinnhofer |
Modeling Knot Geometry in Norway Spruce from Industrial CT Images. |
SCIA |
2003 |
DBLP DOI BibTeX RDF |
|
12 | Minsu Choi, Nohpill Park, Fabrizio Lombardi, Yong-Bin Kim, Vincenzo Piuri |
Optimal Spare Utilization in Repairable and Reliable Memory Cores. |
MTDT |
2003 |
DBLP DOI BibTeX RDF |
Embedded Memory Repair and Reliability, Fault-Tolerant Memory Core, System-on-chip, Yield, Built-In-Self-Repair |
12 | Stefan Biffl, Michael Halling, Sabine T. Köszegi |
Investigating the Accuracy of Defect Estimation Models for Individuals and Teams Based on Inspection Data. |
ISESE |
2003 |
DBLP DOI BibTeX RDF |
|
12 | Amr Kamel, Paul G. Sorenson |
The Application of Capture-Recapture Log-Linear Models To Software Inspections Data. |
ISESE |
2003 |
DBLP DOI BibTeX RDF |
|
12 | Paul Grünbacher, Michael Halling, Stefan Biffl, Hasan Kitapci, Barry W. Boehm |
Repeatable Quality Assurance Techniques for Requirements Negotiations. |
HICSS |
2003 |
DBLP DOI BibTeX RDF |
Pre-requirements, quality assurance techniques, GSS support, empirical evaluation, requirements negotiation |
12 | Wangqi Qiu, Xiang Lu, Zhuo Li 0001, D. M. H. Walker, Weiping Shi |
CodSim -- A Combined Delay Fault Simulator. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
12 | Charles F. Hawkins, Ali Keshavarzi, Jaume Segura 0001 |
A View from the Bottom: Nanometer Technology AC Parametric Failures -- Why, Where, and How to Detect. |
DFT |
2003 |
DBLP DOI BibTeX RDF |
|
12 | Tsung-Chuan Huang, Chu-Sing Yang, Chao-Chieh Huang, Sheng-Wen Bai |
Hierarchical Grown Bluetrees (HGB) - An Effective Topology for Bluetooth Scatternets. |
ISPA |
2003 |
DBLP DOI BibTeX RDF |
|
12 | Andy Podgurski, David Leon, Patrick Francis, Wes Masri, Melinda Minch, Jiayang Sun, Bin Wang |
Automated Support for Classifying Software Failure Reports. |
ICSE |
2003 |
DBLP DOI BibTeX RDF |
|
12 | Suzette Vandivier, Mark Wahl, Jeff Rearick |
First IC Validation of IEEE Std. 1149.6. |
ITC |
2003 |
DBLP DOI BibTeX RDF |
1149.6, test receiver |
12 | Kenneth P. Parker |
Defect Coverage of Boundary-Scan Tests: What does it mean when a Boundary-Scan test passes? |
ITC |
2003 |
DBLP DOI BibTeX RDF |
|
12 | Arun A. Joseph, Hans G. Kerkhoff |
Towards Structural Testing of Superconductor Electronics. |
ITC |
2003 |
DBLP DOI BibTeX RDF |
|
12 | Thomas S. Barnett, Adit D. Singh |
Relating Yield Models to Burn-In Fall-Out in Time. |
ITC |
2003 |
DBLP DOI BibTeX RDF |
|
12 | Tong-Seng Quah, Mie Mie Thet Thwin |
Application of Neural Networks for Software Quality Prediction Using Object-Oriented Metrics. |
ICSM |
2003 |
DBLP DOI BibTeX RDF |
|
12 | Jef Jacobs, J. H. van Moll, Paul J. Krause, Rob J. Kusters, Jos J. M. Trienekens |
Effects of Virtual Development on Product Quality: Exploring Defect Causes. |
STEP |
2003 |
DBLP DOI BibTeX RDF |
Virtual development, Defect injection, Defect Causal Analysis, Defect detection, Product Quality |
12 | Norman E. Fenton, Paul Krause, Martin Neil |
Software Measurement: Uncertainty and Causal Modeling. |
IEEE Softw. |
2002 |
DBLP DOI BibTeX RDF |
software quality estimation, Bayesian networks, risk management, Software measurement, causal modeling |
12 | Tsong Yueh Chen, Pak-Lok Poon, Sau-Fun Tang, T. H. Tse, Yuen-Tak Yu |
Towards a Problem-Driven Approach to Perspective-Based Reading. |
HASE |
2002 |
DBLP DOI BibTeX RDF |
Defect-Based Reading, Requirements Inspection, Software Inspection, Perspective-Based Reading, Classification-Tree Method |
12 | Stuart E. Schechter |
How to Buy Better Testing. |
InfraSec |
2002 |
DBLP DOI BibTeX RDF |
|
12 | Khalil Maalmi, A. El-Ouaazizi, Rachid Benslimane, Lew Fock Chong Lew Yan Voon, A. Diou, Patrick Gorria |
Crack Defect Detection and Localization Using Genetic-Based Inverse Voting Hough Transform. |
ICPR (3) |
2002 |
DBLP DOI BibTeX RDF |
|
12 | Rodrigo Rodrigues 0001, Barbara Liskov, Liuba Shrira |
The design of a robust peer-to-peer system. |
ACM SIGOPS European Workshop |
2002 |
DBLP DOI BibTeX RDF |
|
12 | Amitabh Srivastava, Jay Thiagarajan |
Effectively prioritizing tests in development environment. |
ISSTA |
2002 |
DBLP DOI BibTeX RDF |
software testing, regression testing, test selection, test prioritization, test minimization |
12 | Claes Wohlin |
Is Prior Knowledge of a Programming Language Important for Software Quality?. |
ISESE |
2002 |
DBLP DOI BibTeX RDF |
|
12 | Rosa Rodríguez-Montañés, D. Muñoz, Luz Balado, Joan Figueras |
Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours. |
IOLTW |
2002 |
DBLP DOI BibTeX RDF |
|
12 | Arun Krishnamachary, Jacob A. Abraham |
Test generation for resistive opens in CMOS. |
ACM Great Lakes Symposium on VLSI |
2002 |
DBLP DOI BibTeX RDF |
resistive opens, delay testing, defect detection |
12 | Minsu Choi, Nohpill Park, Fabrizio Lombardi, Yong-Bin Kim, Vincenzo Piuri |
Balanced Redundancy Utilization in Embedded Memory Cores for Dependable Systems. |
DFT |
2002 |
DBLP DOI BibTeX RDF |
|
12 | Frank Padberg |
Empirical interval estimates for the defect content after an inspection. |
ICSE |
2002 |
DBLP DOI BibTeX RDF |
|
12 | Takashi Hiroi, Chie Shishido, Masahiro Watanabe |
Pattern Alignment Method Based on Consistency Among Local Registration Candidates for LSI Wafer Pattern Inspection. |
WACV |
2002 |
DBLP DOI BibTeX RDF |
|
12 | Nilmoni Deb, R. D. (Shawn) Blanton |
Built-In Self Test of CMOS-MEMS Accelerometers. |
ITC |
2002 |
DBLP DOI BibTeX RDF |
|
12 | Ronald D. Blanton, John T. Chen, Rao Desineni, Kumar N. Dwarakanath, Wojciech Maly, Thomas J. Vogels |
Fault Tuples in Diagnosis of Deep-Submicron Circuits. |
ITC |
2002 |
DBLP DOI BibTeX RDF |
fault model and characterization, diagnosis, failure analysis |
12 | Pekka Abrahamsson, Karlheinz Kautz |
Personal Software Process: Classroom Experiences from Finland. |
ECSQ |
2002 |
DBLP DOI BibTeX RDF |
|
12 | Dimitris A. Karras, Basil G. Mertzios |
Improved Defect Detection Using Novel Wavelet Feature Extraction Involving Principal Component Analysis and Neural Network Techniques. |
Australian Joint Conference on Artificial Intelligence |
2002 |
DBLP DOI BibTeX RDF |
Neural Networks, Wavelets, Defect detection |
12 | Mechelle Gittens, Hanan Lutfi Lutfiyya, Michael A. Bauer 0001, David Godwin, Yong Woo Kim, Pramod Gupta |
An empirical evaluation of system and regression testing. |
CASCON |
2002 |
DBLP BibTeX RDF |
|
12 | Stefan Biffl |
Lesetechniken fuer die Inspektion von Software-Anforderungsdokumenten - Ein kontrolliertes Experiment zur Untersuchung der Effektivität und Verwendung von Zeit bei der Anwendung verschiedener Lesetechniken. |
Inform. Forsch. Entwickl. |
2001 |
DBLP DOI BibTeX RDF |
Software-Inspektion, Techniken zum Erkennen von Fehlern, Inspektionsplanung, kontrolliertes Experiment, Empirische Softwaretechnik |
12 | Ismed Hartanto, Srikanth Venkataraman, W. Kent Fuchs, Elizabeth M. Rudnick, Janak H. Patel, Sreejit Chakravarty |
Diagnostic simulation of stuck-at faults in sequential circuits using compact lists. |
ACM Trans. Design Autom. Electr. Syst. |
2001 |
DBLP DOI BibTeX RDF |
stuck-at fault diagnosis, Fault simulation |
12 | Michiel van Genuchten, Cor van Dijk, Henk Scholten, Douglas R. Vogel |
Using Group Support Systems for Software Inspections. |
IEEE Softw. |
2001 |
DBLP DOI BibTeX RDF |
|
12 | Kevin Stanley |
High-Accuracy Flush-and-Scan Software Diagnostic. |
IEEE Des. Test Comput. |
2001 |
DBLP DOI BibTeX RDF |
|
12 | Alessandro Bianchi, Danilo Caivano, Filippo Lanubile, Giuseppe Visaggio |
Evaluating Software Degradation through Entropy. |
IEEE METRICS |
2001 |
DBLP DOI BibTeX RDF |
|
12 | Prasanna Sundararajan, Steve Guccione |
Run-Time defect tolerance using JBits. |
FPGA |
2001 |
DBLP DOI BibTeX RDF |
Java, FPGA, cores, defect tolerance, run-time reconfiguration |
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