Search results for "defects"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
12	Venkata U. B. Challagulla, Farokh B. Bastani, I-Ling Yen, Raymond A. Paul	Empirical Assessment of Machine Learning based Software Defect Prediction Techniques.	WORDS	2005	DBLP DOI BibTeX RDF
12	Cory Jung, Mohammad Hadi Izadi, Michelle L. La Haye	Noise Analysis of Fault Tolerant Active Pixel Sensors.	DFT	2005	DBLP DOI BibTeX RDF
12	Haixia Gao, Yintang Yang, Xiaohua Ma, Gang Dong	Testing for Resistive Shorts in FPGA Interconnects.	ISQED	2005	DBLP DOI BibTeX RDF
12	Michel Côté, Philippe Hurat	Standard Cell Printability Grading and Hot Spot Detection.	ISQED	2005	DBLP DOI BibTeX RDF
12	Victor R. Basili, Forrest Shull	Evolving Defect "Folklore": A Cross-Study Analysis of Software Defect Behavior.	ISPW	2005	DBLP DOI BibTeX RDF
12	G. Bhaskar Rao, Keerthi Timmaraju, Thomas Weigert	Network Element Testing Using TTCN-3: Benefits and Comparison.	SDL Forum	2005	DBLP DOI BibTeX RDF
12	Jin-Fu Li 0001, Chou-Kun Lin	Modeling and Testing Comparison Faults for Ternary Content Addressable Memories.	VTS	2005	DBLP DOI BibTeX RDF
12	Dhruva Acharyya, Jim Plusquellic	Hardware Results Demonstrating Defect Detection Using Power Supply Signal Measurements.	VTS	2005	DBLP DOI BibTeX RDF
12	David Leon, Wes Masri, Andy Podgurski	An empirical evaluation of test case filtering techniques based on exercising complex information flows.	ICSE	2005	DBLP DOI BibTeX RDF	dynamic information flow analysis, test case filtering, software testing, dynamic slicing, program dependences, observation-based testing
12	Nachiappan Nagappan, Thomas Ball	Static analysis tools as early indicators of pre-release defect density.	ICSE	2005	DBLP DOI BibTeX RDF	statistical methods, fault-proneness, defect density, static analysis tools
12	Richard K. Cheng	A False Measure of Success "I'd rather have an ounce of cure over this 200 pounds of prevention".	AGILE	2005	DBLP DOI BibTeX RDF
12	Peng Guo, Taihua Chang	MGPC Based on Hopfield Network and Its Application in a Thermal Power Unit Load System.	ICMLC	2005	DBLP DOI BibTeX RDF
12	Claes Wohlin	Are Individual Differences in Software Development Performance Possible to Capture Using a Quantitative Survey?.	Empir. Softw. Eng.	2004	DBLP DOI BibTeX RDF	Individual performance, development experience, quantitative survey, Personal Software Process
12	Xiaoliang Bai, Sujit Dey	High-level crosstalk defect Simulation methodology for system-on-chip interconnects.	IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.	2004	DBLP DOI BibTeX RDF
12	Frank Padberg, Thomas Ragg, Ralf Schoknecht	Using Machine Learning for Estimating the Defect Content After an Inspection.	IEEE Trans. Software Eng.	2004	DBLP DOI BibTeX RDF	Defect content estimation, neural networks, software inspections, empirical methods, nonlinear regression
12	Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi	DFT for Delay Fault Testing of High-Performance Digital Circuits.	IEEE Des. Test Comput.	2004	DBLP DOI BibTeX RDF
12	Clifford A. Reiter	With J: image processing 1: smoothing filters.	ACM SIGAPL APL Quote Quad	2004	DBLP DOI BibTeX RDF
12	Tor Stålhane, Cat Kutay, Hiyam Al-Kilidar, D. Ross Jeffery	Teaching the Process of Code Review.	Australian Software Engineering Conference	2004	DBLP DOI BibTeX RDF
12	Olga Duran, Kaspar Althoefer, Lakmal D. Seneviratne	Automated Pipe Inspection using ANN and Laser Data Fusion.	ICRA	2004	DBLP DOI BibTeX RDF
12	Amador Durán 0001, Beatriz Bernárdez 0001, Marcela Genero, Mario Piattini	Empirically Driven Use Case Metamodel Evolution.	UML	2004	DBLP DOI BibTeX RDF	metamodel evolution, use cases, empirical software engineering
12	Melvin A. Breuer	Intelligible Test Techniques to Support Error-Tolerance.	Asian Test Symposium	2004	DBLP DOI BibTeX RDF
12	Hongbin Jia, Yi Lu Murphey, Jianjun Shi, Tzyy-Shuh Chang	An Intelligent Real-time Vision System for Surface Defect Detection.	ICPR (3)	2004	DBLP DOI BibTeX RDF
12	Joachim Schmid 0003	The Main Steps to Data Quality.	ICDM	2004	DBLP DOI BibTeX RDF
12	Patrik Kenger	Benefits of Modularity and Module Level Tests.	BASYS	2004	DBLP DOI BibTeX RDF
12	Nachiappan Nagappan, Laurie A. Williams, John P. Hudepohl, Will Snipes, Mladen A. Vouk	Preliminary Results On Using Static Analysis Tools For Software Inspection.	ISSRE	2004	DBLP DOI BibTeX RDF
12	Tianqi Zhang, Xiaokang Lin, Zhengzhong Zhou	Use PCA Neural Network to Extract the PN Sequence in Lower SNR DS/SS Signals.	ISNN (1)	2004	DBLP DOI BibTeX RDF
12	Youngshin Han, Dongsik Park, Chilgee Lee	On the Repair of Memory Cells with Spare Rows and Columns for Yield Improvement.	AsiaSim	2004	DBLP DOI BibTeX RDF
12	Daisuke Maruyama, Akira Kanuma, Takashi Mochiyama, Hiroaki Komatsu, Yaroku Sugiyama, Noriyuki Ito	Detection of multiple transitions in delay fault test of SPARC64 microprocessor.	ICCAD	2004	DBLP DOI BibTeX RDF
12	Young-Chul Song, Doo-Hyun Choi, Kil-Houm Park	Morphological Blob-Mura Defect Detection Method for TFT-LCD Panel Inspection.	KES	2004	DBLP DOI BibTeX RDF
12	Arvind Kumar, Sandip Tiwari	Defect tolerance for nanocomputer architecture.	SLIP	2004	DBLP DOI BibTeX RDF	wire length estimation, FPGA, reliability, reconfigurability, defect tolerance, nanoelectronics, Rent's rule, nanocomputing
12	Sameep Mehta, Kaden Hazzard, Raghu Machiraju, Srinivasan Parthasarathy 0001, John Wilkins	Detection and Visualization of Anomalous Structures in Molecular Dynamics Simulation Data.	IEEE Visualization	2004	DBLP DOI BibTeX RDF	Scientific Data Visualization, Data Mining, Feature Extraction, Transfer Functions, Molecular Dynamics, Iso-surface
12	Darrell Reimer, Edith Schonberg, Kavitha Srinivas, Harini Srinivasan, Bowen Alpern, Robert D. Johnson, Aaron Kershenbaum, Larry Koved	SABER: smart analysis based error reduction.	ISSTA	2004	DBLP DOI BibTeX RDF	defect understanding, frameworks, program analysis
12	Pekka Abrahamsson, Juha Koskela	Extreme Programming: A Survey of Empirical Data from a Controlled Case Study.	ISESE	2004	DBLP DOI BibTeX RDF
12	Pierre-Louis Bazin, Dzung L. Pham	Topology Smoothing for Segmentation and Surface Reconstruction.	MICCAI (1)	2004	DBLP DOI BibTeX RDF
12	John Y. Fong, Randy Acklin, John Roscher, Feng Li, Cindy Laird, Cezary Pietrzyk	Nonvolatile Repair Caches Repair Embedded SRAM and New Nonvolatile Memories.	DFT	2004	DBLP DOI BibTeX RDF
12	Najwa Aaraj, Anis Nazer, Ali Chehab, Ayman I. Kayssi	Transient Current Testing of Dynamic CMOS Circuits.	DFT	2004	DBLP DOI BibTeX RDF
12	Arvind Kumar, Sandip Tiwari	Testing and Defect Tolerance: A Rent's Rule Based Analysis and Implications on Nanoelectronics.	DFT	2004	DBLP DOI BibTeX RDF
12	Tetsuya Iizuka, Makoto Ikeda, Kunihiro Asada	Exact Wiring Fault Minimization via Comprehensive Layout Synthesis for CMOS Logic Cells.	ISQED	2004	DBLP DOI BibTeX RDF
12	Manish Sharma, Janak H. Patel	What Does Robust Testing a Subset of Paths, Tell us about the Untested Paths in the Circuit?	VTS	2004	DBLP DOI BibTeX RDF
12	Sule Ozev, Christian Olgaard	Wafer-level RF Test and DfT for VCO Modulating Transceiver Architecures.	VTS	2004	DBLP DOI BibTeX RDF
12	Jennifer Dworak, David Dorsey, Amy Wang, M. Ray Mercer	Excitation, Observation, and ELF-MD: Optimization Criteria for High Quality Test Sets.	VTS	2004	DBLP DOI BibTeX RDF
12	Carl Gould 0001, Zhendong Su 0001, Premkumar T. Devanbu	Static Checking of Dynamically Generated Queries in Database Applications.	ICSE	2004	DBLP DOI BibTeX RDF
12	Sanjay Sengupta	Test Strategies for Nanometer Technologies.	ITC	2004	DBLP DOI BibTeX RDF
12	Benjamin M. Mauck, Vishnumohan Ravichandran, Usman Azeez Mughal	A Design for Test Technique for Parametric Analysis of SRAM: On-Die Low Yield Analysis.	ITC	2004	DBLP DOI BibTeX RDF
12	Quming Zhou, Kartik Mohanram	Analysis of delay caused by bridging faults in RLC interconnects.	ITC	2004	DBLP DOI BibTeX RDF
12	Phil Nigh, Anne E. Gattiker	Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions.	ITC	2004	DBLP DOI BibTeX RDF
12	Yuyi Tang, Hans-Joachim Wunderlich, Harald P. E. Vranken, Friedrich Hapke, Michael Wittke, Piet Engelke, Ilia Polian, Bernd Becker 0001	X-Masking During Logic BIST and Its Impact on Defect Coverage.	ITC	2004	DBLP DOI BibTeX RDF	X-Masking, Resistive Bridging Faults, Defect Coverage, Logic BIST
12	Pamela S. Gillis, Francis Woytowich, Andrew Ferko, Kevin McCauley	Low Overhead Delay Testing of ASICS.	ITC	2004	DBLP DOI BibTeX RDF
12	Hans G. Kerkhoff, Arun A. Joseph	Testability Issues in Superconductor Electronic.	DELTA	2004	DBLP DOI BibTeX RDF
12	Masaki Hashizume, Tetsuo Akita, Hiroyuki Yotsuyanagi, Takeomi Tamesada	CMOS Open Fault Detection by Appearance Time of Switching Supply Current.	DELTA	2004	DBLP DOI BibTeX RDF
12	Gethin Norman, David Parker 0001, Marta Z. Kwiatkowska, Sandeep K. Shukla	Evaluating the Reliability of Defect-Tolerant Architectures for Nanotechnology with Probabilistic Model Checking.	VLSI Design	2004	DBLP DOI BibTeX RDF
12	Michel Renovell, Jean Marc Gallière, Florence Azaïs, Yves Bertrand	Modeling the Random Parameters Effects in a Non-Split Model of Gate Oxide Short.	J. Electron. Test.	2003	DBLP DOI BibTeX RDF	minimal-length transistors, fault modeling, gate oxide short
12	Wanli Jiang, Eric Peterson	Performance Comparison of VLV, ULV, and ECR Tests.	J. Electron. Test.	2003	DBLP DOI BibTeX RDF	very low voltage test, dynamic current test, test threshold, test effectiveness, test efficiency
12	Stefan Biffl, Michael Halling	Investigating the Defect Detection Effectiveness and Cost Benefit of Nominal Inspection Teams.	IEEE Trans. Software Eng.	2003	DBLP DOI BibTeX RDF	cost-benefit modeling, empirical software engineering, Software inspection, reading techniques
12	Tong Fang, Mohsen A. Jafari, Stephen C. Danforth, Ahmad Safari	Signature analysis and defect detection in layered manufacturing of ceramic sensors and actuators.	Mach. Vis. Appl.	2003	DBLP DOI BibTeX RDF	Layered manufacturing, Inspection system, Fused deposition of ceramics, Signature analysis, Defect detection
12	Noriaki Yoshiura	Decision Procedures for Several Properties of Reactive System Specifications.	ISSS	2003	DBLP DOI BibTeX RDF	Specification Description, Temporal Logic, Reactive System
12	Hitoshi Yamauchi, Jörg Haber, Hans-Peter Seidel	Image Restoration using Multiresolution Texture Synthesis and Image Inpainting.	Computer Graphics International	2003	DBLP DOI BibTeX RDF	multiresolution texture synthesis, image in-painting, frequency decomposition, image restoration
12	Christian Denger, Daniel M. Berry, Erik Kamsties	Higher Quality Requirements Specifications through Natural Language Patterns.	SwSTE	2003	DBLP DOI BibTeX RDF	embedded systems, authoring, patterns, quality, metamodel, natural language, completeness, accuracy, requirements specification, ambiguity, rewriting, precision
12	Giovanni Cantone, Luca Colasanti, Zeiad A. Abdulnabi, Anna Lomartire, Giuseppe Calavaro	Evaluating Checklist-Based and Use-Case-Driven Reading Techniques as Applied to Software Analysis and Design UML Artifacts.	ESERNET	2003	DBLP DOI BibTeX RDF
12	Chenggang Bai, Kai-Yuan Cai, T. Y. Chen	An Efficient Defect Estimation Method for Software Defect Curves.	COMPSAC	2003	DBLP DOI BibTeX RDF
12	Stefan Mankefors, Richard Torkar, Andreas Boklund	New Quality Estimations in Random Testing.	ISSRE	2003	DBLP DOI BibTeX RDF
12	David Leon, Andy Podgurski	A Comparison of Coverage-Based and Distribution-Based Techniques for Filtering and Prioritizing Test Cases.	ISSRE	2003	DBLP DOI BibTeX RDF
12	Jean-Philippe Andreu, Alfred Rinnhofer	Modeling Knot Geometry in Norway Spruce from Industrial CT Images.	SCIA	2003	DBLP DOI BibTeX RDF
12	Minsu Choi, Nohpill Park, Fabrizio Lombardi, Yong-Bin Kim, Vincenzo Piuri	Optimal Spare Utilization in Repairable and Reliable Memory Cores.	MTDT	2003	DBLP DOI BibTeX RDF	Embedded Memory Repair and Reliability, Fault-Tolerant Memory Core, System-on-chip, Yield, Built-In-Self-Repair
12	Stefan Biffl, Michael Halling, Sabine T. Köszegi	Investigating the Accuracy of Defect Estimation Models for Individuals and Teams Based on Inspection Data.	ISESE	2003	DBLP DOI BibTeX RDF
12	Amr Kamel, Paul G. Sorenson	The Application of Capture-Recapture Log-Linear Models To Software Inspections Data.	ISESE	2003	DBLP DOI BibTeX RDF
12	Paul Grünbacher, Michael Halling, Stefan Biffl, Hasan Kitapci, Barry W. Boehm	Repeatable Quality Assurance Techniques for Requirements Negotiations.	HICSS	2003	DBLP DOI BibTeX RDF	Pre-requirements, quality assurance techniques, GSS support, empirical evaluation, requirements negotiation
12	Wangqi Qiu, Xiang Lu, Zhuo Li 0001, D. M. H. Walker, Weiping Shi	CodSim -- A Combined Delay Fault Simulator.	DFT	2003	DBLP DOI BibTeX RDF
12	Charles F. Hawkins, Ali Keshavarzi, Jaume Segura 0001	A View from the Bottom: Nanometer Technology AC Parametric Failures -- Why, Where, and How to Detect.	DFT	2003	DBLP DOI BibTeX RDF
12	Tsung-Chuan Huang, Chu-Sing Yang, Chao-Chieh Huang, Sheng-Wen Bai	Hierarchical Grown Bluetrees (HGB) - An Effective Topology for Bluetooth Scatternets.	ISPA	2003	DBLP DOI BibTeX RDF
12	Andy Podgurski, David Leon, Patrick Francis, Wes Masri, Melinda Minch, Jiayang Sun, Bin Wang	Automated Support for Classifying Software Failure Reports.	ICSE	2003	DBLP DOI BibTeX RDF
12	Suzette Vandivier, Mark Wahl, Jeff Rearick	First IC Validation of IEEE Std. 1149.6.	ITC	2003	DBLP DOI BibTeX RDF	1149.6, test receiver
12	Kenneth P. Parker	Defect Coverage of Boundary-Scan Tests: What does it mean when a Boundary-Scan test passes?	ITC	2003	DBLP DOI BibTeX RDF
12	Arun A. Joseph, Hans G. Kerkhoff	Towards Structural Testing of Superconductor Electronics.	ITC	2003	DBLP DOI BibTeX RDF
12	Thomas S. Barnett, Adit D. Singh	Relating Yield Models to Burn-In Fall-Out in Time.	ITC	2003	DBLP DOI BibTeX RDF
12	Tong-Seng Quah, Mie Mie Thet Thwin	Application of Neural Networks for Software Quality Prediction Using Object-Oriented Metrics.	ICSM	2003	DBLP DOI BibTeX RDF
12	Jef Jacobs, J. H. van Moll, Paul J. Krause, Rob J. Kusters, Jos J. M. Trienekens	Effects of Virtual Development on Product Quality: Exploring Defect Causes.	STEP	2003	DBLP DOI BibTeX RDF	Virtual development, Defect injection, Defect Causal Analysis, Defect detection, Product Quality
12	Norman E. Fenton, Paul Krause, Martin Neil	Software Measurement: Uncertainty and Causal Modeling.	IEEE Softw.	2002	DBLP DOI BibTeX RDF	software quality estimation, Bayesian networks, risk management, Software measurement, causal modeling
12	Tsong Yueh Chen, Pak-Lok Poon, Sau-Fun Tang, T. H. Tse, Yuen-Tak Yu	Towards a Problem-Driven Approach to Perspective-Based Reading.	HASE	2002	DBLP DOI BibTeX RDF	Defect-Based Reading, Requirements Inspection, Software Inspection, Perspective-Based Reading, Classification-Tree Method
12	Stuart E. Schechter	How to Buy Better Testing.	InfraSec	2002	DBLP DOI BibTeX RDF
12	Khalil Maalmi, A. El-Ouaazizi, Rachid Benslimane, Lew Fock Chong Lew Yan Voon, A. Diou, Patrick Gorria	Crack Defect Detection and Localization Using Genetic-Based Inverse Voting Hough Transform.	ICPR (3)	2002	DBLP DOI BibTeX RDF
12	Rodrigo Rodrigues 0001, Barbara Liskov, Liuba Shrira	The design of a robust peer-to-peer system.	ACM SIGOPS European Workshop	2002	DBLP DOI BibTeX RDF
12	Amitabh Srivastava, Jay Thiagarajan	Effectively prioritizing tests in development environment.	ISSTA	2002	DBLP DOI BibTeX RDF	software testing, regression testing, test selection, test prioritization, test minimization
12	Claes Wohlin	Is Prior Knowledge of a Programming Language Important for Software Quality?.	ISESE	2002	DBLP DOI BibTeX RDF
12	Rosa Rodríguez-Montañés, D. Muñoz, Luz Balado, Joan Figueras	Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours.	IOLTW	2002	DBLP DOI BibTeX RDF
12	Arun Krishnamachary, Jacob A. Abraham	Test generation for resistive opens in CMOS.	ACM Great Lakes Symposium on VLSI	2002	DBLP DOI BibTeX RDF	resistive opens, delay testing, defect detection
12	Minsu Choi, Nohpill Park, Fabrizio Lombardi, Yong-Bin Kim, Vincenzo Piuri	Balanced Redundancy Utilization in Embedded Memory Cores for Dependable Systems.	DFT	2002	DBLP DOI BibTeX RDF
12	Frank Padberg	Empirical interval estimates for the defect content after an inspection.	ICSE	2002	DBLP DOI BibTeX RDF
12	Takashi Hiroi, Chie Shishido, Masahiro Watanabe	Pattern Alignment Method Based on Consistency Among Local Registration Candidates for LSI Wafer Pattern Inspection.	WACV	2002	DBLP DOI BibTeX RDF
12	Nilmoni Deb, R. D. (Shawn) Blanton	Built-In Self Test of CMOS-MEMS Accelerometers.	ITC	2002	DBLP DOI BibTeX RDF
12	Ronald D. Blanton, John T. Chen, Rao Desineni, Kumar N. Dwarakanath, Wojciech Maly, Thomas J. Vogels	Fault Tuples in Diagnosis of Deep-Submicron Circuits.	ITC	2002	DBLP DOI BibTeX RDF	fault model and characterization, diagnosis, failure analysis
12	Pekka Abrahamsson, Karlheinz Kautz	Personal Software Process: Classroom Experiences from Finland.	ECSQ	2002	DBLP DOI BibTeX RDF
12	Dimitris A. Karras, Basil G. Mertzios	Improved Defect Detection Using Novel Wavelet Feature Extraction Involving Principal Component Analysis and Neural Network Techniques.	Australian Joint Conference on Artificial Intelligence	2002	DBLP DOI BibTeX RDF	Neural Networks, Wavelets, Defect detection
12	Mechelle Gittens, Hanan Lutfi Lutfiyya, Michael A. Bauer 0001, David Godwin, Yong Woo Kim, Pramod Gupta	An empirical evaluation of system and regression testing.	CASCON	2002	DBLP BibTeX RDF
12	Stefan Biffl	Lesetechniken fuer die Inspektion von Software-Anforderungsdokumenten - Ein kontrolliertes Experiment zur Untersuchung der Effektivität und Verwendung von Zeit bei der Anwendung verschiedener Lesetechniken.	Inform. Forsch. Entwickl.	2001	DBLP DOI BibTeX RDF	Software-Inspektion, Techniken zum Erkennen von Fehlern, Inspektionsplanung, kontrolliertes Experiment, Empirische Softwaretechnik
12	Ismed Hartanto, Srikanth Venkataraman, W. Kent Fuchs, Elizabeth M. Rudnick, Janak H. Patel, Sreejit Chakravarty	Diagnostic simulation of stuck-at faults in sequential circuits using compact lists.	ACM Trans. Design Autom. Electr. Syst.	2001	DBLP DOI BibTeX RDF	stuck-at fault diagnosis, Fault simulation
12	Michiel van Genuchten, Cor van Dijk, Henk Scholten, Douglas R. Vogel	Using Group Support Systems for Software Inspections.	IEEE Softw.	2001	DBLP DOI BibTeX RDF
12	Kevin Stanley	High-Accuracy Flush-and-Scan Software Diagnostic.	IEEE Des. Test Comput.	2001	DBLP DOI BibTeX RDF
12	Alessandro Bianchi, Danilo Caivano, Filippo Lanubile, Giuseppe Visaggio	Evaluating Software Degradation through Entropy.	IEEE METRICS	2001	DBLP DOI BibTeX RDF
12	Prasanna Sundararajan, Steve Guccione	Run-Time defect tolerance using JBits.	FPGA	2001	DBLP DOI BibTeX RDF	Java, FPGA, cores, defect tolerance, run-time reconfiguration