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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 3212 occurrences of 1532 keywords
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Results
Found 5103 publication records. Showing 5103 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
12 | Venkata U. B. Challagulla, Farokh B. Bastani, I-Ling Yen, Raymond A. Paul |
Empirical Assessment of Machine Learning based Software Defect Prediction Techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
WORDS ![In: 10th IEEE International Workshop on Object-Oriented Real-Time Dependable Systems (WORDS 2005), 2-4 February 2005, Sedona, AZ, USA, pp. 263-270, 2005, IEEE Computer Society, 0-7695-2347-1. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Cory Jung, Mohammad Hadi Izadi, Michelle L. La Haye |
Noise Analysis of Fault Tolerant Active Pixel Sensors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA, pp. 140-148, 2005, IEEE Computer Society, 0-7695-2464-8. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Haixia Gao, Yintang Yang, Xiaohua Ma, Gang Dong |
Testing for Resistive Shorts in FPGA Interconnects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 6th International Symposium on Quality of Electronic Design (ISQED 2005), 21-23 March 2005, San Jose, CA, USA, pp. 159-163, 2005, IEEE Computer Society, 0-7695-2301-3. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Michel Côté, Philippe Hurat |
Standard Cell Printability Grading and Hot Spot Detection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 6th International Symposium on Quality of Electronic Design (ISQED 2005), 21-23 March 2005, San Jose, CA, USA, pp. 264-269, 2005, IEEE Computer Society, 0-7695-2301-3. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Victor R. Basili, Forrest Shull |
Evolving Defect "Folklore": A Cross-Study Analysis of Software Defect Behavior. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISPW ![In: Unifying the Software Process Spectrum, International Software Process Workshop, SPW 2005, Beijing, China, May 25-27, 2005, Revised Selected Papers, pp. 1-9, 2005, Springer, 3-540-31112-2. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
12 | G. Bhaskar Rao, Keerthi Timmaraju, Thomas Weigert |
Network Element Testing Using TTCN-3: Benefits and Comparison. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SDL Forum ![In: SDL 2005: Model Driven, 12th International SDL Forum, Grimstad, Norway, June 20-23, 2005, Proceedings, pp. 265-280, 2005, Springer, 3-540-26612-7. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Jin-Fu Li 0001, Chou-Kun Lin |
Modeling and Testing Comparison Faults for Ternary Content Addressable Memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA, pp. 60-65, 2005, IEEE Computer Society, 0-7695-2314-5. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Dhruva Acharyya, Jim Plusquellic |
Hardware Results Demonstrating Defect Detection Using Power Supply Signal Measurements. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA, pp. 433-438, 2005, IEEE Computer Society, 0-7695-2314-5. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
12 | David Leon, Wes Masri, Andy Podgurski |
An empirical evaluation of test case filtering techniques based on exercising complex information flows. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSE ![In: 27th International Conference on Software Engineering (ICSE 2005), 15-21 May 2005, St. Louis, Missouri, USA, pp. 412-421, 2005, ACM. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
dynamic information flow analysis, test case filtering, software testing, dynamic slicing, program dependences, observation-based testing |
12 | Nachiappan Nagappan, Thomas Ball |
Static analysis tools as early indicators of pre-release defect density. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSE ![In: 27th International Conference on Software Engineering (ICSE 2005), 15-21 May 2005, St. Louis, Missouri, USA, pp. 580-586, 2005, ACM. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
statistical methods, fault-proneness, defect density, static analysis tools |
12 | Richard K. Cheng |
A False Measure of Success "I'd rather have an ounce of cure over this 200 pounds of prevention". ![Search on Bibsonomy](Pics/bibsonomy.png) |
AGILE ![In: AGILE 2005 Conference (AGILE 2005), 24-29 July 2005, Denver, CO, USA, pp. 180-184, 2005, IEEE Computer Society, 0-7695-2487-7. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Peng Guo, Taihua Chang |
MGPC Based on Hopfield Network and Its Application in a Thermal Power Unit Load System. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICMLC ![In: Advances in Machine Learning and Cybernetics, 4th International Conference, ICMLC 2005, Guangzhou, China, August 18-21, 2005, Revised Selected Papers, pp. 790-796, 2005, Springer, 3-540-33584-6. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
12 | Claes Wohlin |
Are Individual Differences in Software Development Performance Possible to Capture Using a Quantitative Survey?. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Empir. Softw. Eng. ![In: Empir. Softw. Eng. 9(3), pp. 211-228, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
Individual performance, development experience, quantitative survey, Personal Software Process |
12 | Xiaoliang Bai, Sujit Dey |
High-level crosstalk defect Simulation methodology for system-on-chip interconnects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. ![In: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(9), pp. 1355-1361, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Frank Padberg, Thomas Ragg, Ralf Schoknecht |
Using Machine Learning for Estimating the Defect Content After an Inspection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Software Eng. ![In: IEEE Trans. Software Eng. 30(1), pp. 17-28, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
Defect content estimation, neural networks, software inspections, empirical methods, nonlinear regression |
12 | Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi |
DFT for Delay Fault Testing of High-Performance Digital Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 21(3), pp. 248-258, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Clifford A. Reiter |
With J: image processing 1: smoothing filters. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM SIGAPL APL Quote Quad ![In: ACM SIGAPL APL Quote Quad 34(2), pp. 9-15, 2004. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Tor Stålhane, Cat Kutay, Hiyam Al-Kilidar, D. Ross Jeffery |
Teaching the Process of Code Review. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Australian Software Engineering Conference ![In: 15th Australian Software Engineering Conference (ASWEC 2004), 13-16 April 2004, Melbourne, Australia, pp. 271-278, 2004, IEEE Computer Society, 0-7695-2089-8. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Olga Duran, Kaspar Althoefer, Lakmal D. Seneviratne |
Automated Pipe Inspection using ANN and Laser Data Fusion. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICRA ![In: Proceedings of the 2004 IEEE International Conference on Robotics and Automation, ICRA 2004, April 26 - May 1, 2004, New Orleans, LA, USA, pp. 4875-4880, 2004, IEEE. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Amador Durán 0001, Beatriz Bernárdez 0001, Marcela Genero, Mario Piattini |
Empirically Driven Use Case Metamodel Evolution. ![Search on Bibsonomy](Pics/bibsonomy.png) |
UML ![In: «UML» 2004 - The Unified Modelling Language: Modelling Languages and Applications. 7th International Conference, Lisbon, Portugal, October 11-15, 2004. Proceedings, pp. 1-11, 2004, Springer, 3-540-23307-5. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
metamodel evolution, use cases, empirical software engineering |
12 | Melvin A. Breuer |
Intelligible Test Techniques to Support Error-Tolerance. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Asian Test Symposium ![In: 13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan, pp. 386-393, 2004, IEEE Computer Society, 0-7695-2235-1. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Hongbin Jia, Yi Lu Murphey, Jianjun Shi, Tzyy-Shuh Chang |
An Intelligent Real-time Vision System for Surface Defect Detection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICPR (3) ![In: 17th International Conference on Pattern Recognition, ICPR 2004, Cambridge, UK, August 23-26, 2004., pp. 239-242, 2004, IEEE Computer Society, 0-7695-2128-2. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Joachim Schmid 0003 |
The Main Steps to Data Quality. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICDM ![In: Advances in Data Mining, Applications in Image Mining, Medicine and Biotechnology, Management and Environmental Control, and Telecommunications, 4th Industrial Conference on Data Mining, ICDM 2004, Leipzig, Germany, July 4-7, 2004, Revised Selected Papers, pp. 69-77, 2004, Springer, 3-540-24054-3. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Patrik Kenger |
Benefits of Modularity and Module Level Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
BASYS ![In: Emerging Solutions for Future Manufacturing Systems, IFIP TC5 / WG5.5 Sixth IFIP International Conference on Information Technology for Balanced Automation Systems in Manufacturing and Services, 27-29 September 2004, Vienna, Austria, pp. 379-386, 2004, Springer, 0-387-22828-4. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Nachiappan Nagappan, Laurie A. Williams, John P. Hudepohl, Will Snipes, Mladen A. Vouk |
Preliminary Results On Using Static Analysis Tools For Software Inspection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSRE ![In: 15th International Symposium on Software Reliability Engineering (ISSRE 2004), 2-5 November 2004, Saint-Malo, Bretagne, France, pp. 429-439, 2004, IEEE Computer Society, 0-7695-2215-7. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Tianqi Zhang, Xiaokang Lin, Zhengzhong Zhou |
Use PCA Neural Network to Extract the PN Sequence in Lower SNR DS/SS Signals. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISNN (1) ![In: Advances in Neural Networks - ISNN 2004, International Symposium on Neural Networks, Dalian, China, August 19-21, 2004, Proceedings, Part I, pp. 780-785, 2004, Springer, 3-540-22841-1. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Youngshin Han, Dongsik Park, Chilgee Lee |
On the Repair of Memory Cells with Spare Rows and Columns for Yield Improvement. ![Search on Bibsonomy](Pics/bibsonomy.png) |
AsiaSim ![In: Systems Modeling and Simulation: Theory and Applications, Third Asian Simulation Conference, AsiaSim 2004, Jeju Island, Korea, October 4-6, 2004, Revised Selected Papers, pp. 713-720, 2004, Springer, 3-540-24477-8. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Daisuke Maruyama, Akira Kanuma, Takashi Mochiyama, Hiroaki Komatsu, Yaroku Sugiyama, Noriyuki Ito |
Detection of multiple transitions in delay fault test of SPARC64 microprocessor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICCAD ![In: 2004 International Conference on Computer-Aided Design, ICCAD 2004, San Jose, CA, USA, November 7-11, 2004, pp. 893-898, 2004, IEEE Computer Society / ACM, 0-7803-8702-3. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Young-Chul Song, Doo-Hyun Choi, Kil-Houm Park |
Morphological Blob-Mura Defect Detection Method for TFT-LCD Panel Inspection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
KES ![In: Knowledge-Based Intelligent Information and Engineering Systems, 8th International Conference, KES 2004, Wellington, New Zealand, September 20-25, 2004. Proceedings. Part III, pp. 862-868, 2004, Springer, 3-540-23205-2. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Arvind Kumar, Sandip Tiwari |
Defect tolerance for nanocomputer architecture. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SLIP ![In: The Sixth International Workshop on System-Level Interconnect Prediction (SLIP 2004), Paris, France, February 14-15, 2004, Proceedings, pp. 89-96, 2004, ACM, 1-58113-818-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
wire length estimation, FPGA, reliability, reconfigurability, defect tolerance, nanoelectronics, Rent's rule, nanocomputing |
12 | Sameep Mehta, Kaden Hazzard, Raghu Machiraju, Srinivasan Parthasarathy 0001, John Wilkins |
Detection and Visualization of Anomalous Structures in Molecular Dynamics Simulation Data. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Visualization ![In: 15th IEEE Visualization Conference, IEEE Vis 2004, Austin, TX, USA, October 10-15, 2004, Proceedings, pp. 465-472, 2004, IEEE Computer Society, 0-7803-8788-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
Scientific Data Visualization, Data Mining, Feature Extraction, Transfer Functions, Molecular Dynamics, Iso-surface |
12 | Darrell Reimer, Edith Schonberg, Kavitha Srinivas, Harini Srinivasan, Bowen Alpern, Robert D. Johnson, Aaron Kershenbaum, Larry Koved |
SABER: smart analysis based error reduction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSTA ![In: Proceedings of the ACM/SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2004, Boston, Massachusetts, USA, July 11-14, 2004, pp. 243-251, 2004, ACM, 1-58113-820-2. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
defect understanding, frameworks, program analysis |
12 | Pekka Abrahamsson, Juha Koskela |
Extreme Programming: A Survey of Empirical Data from a Controlled Case Study. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISESE ![In: 2004 International Symposium on Empirical Software Engineering (ISESE 2004), 19-20 August 2004, Redondo Beach, CA, USA, pp. 73-82, 2004, IEEE Computer Society, 0-7695-2165-7. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Pierre-Louis Bazin, Dzung L. Pham |
Topology Smoothing for Segmentation and Surface Reconstruction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MICCAI (1) ![In: Medical Image Computing and Computer-Assisted Intervention -- MICCAI 2004, 7th International Conference Saint-Malo, France, September 26-29, 2004, Proceedings, Part I, pp. 111-118, 2004, Springer, 3-540-22976-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | John Y. Fong, Randy Acklin, John Roscher, Feng Li, Cindy Laird, Cezary Pietrzyk |
Nonvolatile Repair Caches Repair Embedded SRAM and New Nonvolatile Memories. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings, pp. 347-355, 2004, IEEE Computer Society, 0-7695-2241-6. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Najwa Aaraj, Anis Nazer, Ali Chehab, Ayman I. Kayssi |
Transient Current Testing of Dynamic CMOS Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings, pp. 264-271, 2004, IEEE Computer Society, 0-7695-2241-6. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Arvind Kumar, Sandip Tiwari |
Testing and Defect Tolerance: A Rent's Rule Based Analysis and Implications on Nanoelectronics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings, pp. 280-288, 2004, IEEE Computer Society, 0-7695-2241-6. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Tetsuya Iizuka, Makoto Ikeda, Kunihiro Asada |
Exact Wiring Fault Minimization via Comprehensive Layout Synthesis for CMOS Logic Cells. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISQED ![In: 5th International Symposium on Quality of Electronic Design (ISQED 2004), 22-24 March 2004, San Jose, CA, USA, pp. 377-380, 2004, IEEE Computer Society, 0-7695-2093-6. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Manish Sharma, Janak H. Patel |
What Does Robust Testing a Subset of Paths, Tell us about the Untested Paths in the Circuit? ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004, Napa Valley, CA, USA, pp. 31-36, 2004, IEEE Computer Society, 0-7695-2134-7. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Sule Ozev, Christian Olgaard |
Wafer-level RF Test and DfT for VCO Modulating Transceiver Architecures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004, Napa Valley, CA, USA, pp. 217-222, 2004, IEEE Computer Society, 0-7695-2134-7. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Jennifer Dworak, David Dorsey, Amy Wang, M. Ray Mercer |
Excitation, Observation, and ELF-MD: Optimization Criteria for High Quality Test Sets. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VTS ![In: 22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004, Napa Valley, CA, USA, pp. 9-15, 2004, IEEE Computer Society, 0-7695-2134-7. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Carl Gould 0001, Zhendong Su 0001, Premkumar T. Devanbu |
Static Checking of Dynamically Generated Queries in Database Applications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSE ![In: 26th International Conference on Software Engineering (ICSE 2004), 23-28 May 2004, Edinburgh, United Kingdom, pp. 645-654, 2004, IEEE Computer Society, 0-7695-2163-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Sanjay Sengupta |
Test Strategies for Nanometer Technologies. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 1421, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Benjamin M. Mauck, Vishnumohan Ravichandran, Usman Azeez Mughal |
A Design for Test Technique for Parametric Analysis of SRAM: On-Die Low Yield Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 105-113, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Quming Zhou, Kartik Mohanram |
Analysis of delay caused by bridging faults in RLC interconnects. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 1044-1052, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Phil Nigh, Anne E. Gattiker |
Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 309-318, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Yuyi Tang, Hans-Joachim Wunderlich, Harald P. E. Vranken, Friedrich Hapke, Michael Wittke, Piet Engelke, Ilia Polian, Bernd Becker 0001 |
X-Masking During Logic BIST and Its Impact on Defect Coverage. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 442-451, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
X-Masking, Resistive Bridging Faults, Defect Coverage, Logic BIST |
12 | Pamela S. Gillis, Francis Woytowich, Andrew Ferko, Kevin McCauley |
Low Overhead Delay Testing of ASICS. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 534-542, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Hans G. Kerkhoff, Arun A. Joseph |
Testability Issues in Superconductor Electronic. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DELTA ![In: 2nd IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2004), 28-30 January 2004, Perth, Australia, pp. 9-14, 2004, IEEE Computer Society, 0-7695-2081-2. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Masaki Hashizume, Tetsuo Akita, Hiroyuki Yotsuyanagi, Takeomi Tamesada |
CMOS Open Fault Detection by Appearance Time of Switching Supply Current. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DELTA ![In: 2nd IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2004), 28-30 January 2004, Perth, Australia, pp. 183-188, 2004, IEEE Computer Society, 0-7695-2081-2. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Gethin Norman, David Parker 0001, Marta Z. Kwiatkowska, Sandeep K. Shukla |
Evaluating the Reliability of Defect-Tolerant Architectures for Nanotechnology with Probabilistic Model Checking. ![Search on Bibsonomy](Pics/bibsonomy.png) |
VLSI Design ![In: 17th International Conference on VLSI Design (VLSI Design 2004), with the 3rd International Conference on Embedded Systems Design, 5-9 January 2004, Mumbai, India, pp. 907-, 2004, IEEE Computer Society, 0-7695-2072-3. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
12 | Michel Renovell, Jean Marc Gallière, Florence Azaïs, Yves Bertrand |
Modeling the Random Parameters Effects in a Non-Split Model of Gate Oxide Short. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 19(4), pp. 377-386, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
minimal-length transistors, fault modeling, gate oxide short |
12 | Wanli Jiang, Eric Peterson |
Performance Comparison of VLV, ULV, and ECR Tests. ![Search on Bibsonomy](Pics/bibsonomy.png) |
J. Electron. Test. ![In: J. Electron. Test. 19(2), pp. 137-147, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
very low voltage test, dynamic current test, test threshold, test effectiveness, test efficiency |
12 | Stefan Biffl, Michael Halling |
Investigating the Defect Detection Effectiveness and Cost Benefit of Nominal Inspection Teams. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Trans. Software Eng. ![In: IEEE Trans. Software Eng. 29(5), pp. 385-397, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
cost-benefit modeling, empirical software engineering, Software inspection, reading techniques |
12 | Tong Fang, Mohsen A. Jafari, Stephen C. Danforth, Ahmad Safari |
Signature analysis and defect detection in layered manufacturing of ceramic sensors and actuators. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Mach. Vis. Appl. ![In: Mach. Vis. Appl. 15(2), pp. 63-75, 2003. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
Layered manufacturing, Inspection system, Fused deposition of ceramics, Signature analysis, Defect detection |
12 | Noriaki Yoshiura |
Decision Procedures for Several Properties of Reactive System Specifications. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSS ![In: Software Security - Theories and Systems, Second Mext-NSF-JSPS International Symposium, ISSS 2003, Tokyo, Japan, November 4-6, 2003, Revised Papers, pp. 154-173, 2003, Springer, 3-540-23635-X. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
Specification Description, Temporal Logic, Reactive System |
12 | Hitoshi Yamauchi, Jörg Haber, Hans-Peter Seidel |
Image Restoration using Multiresolution Texture Synthesis and Image Inpainting. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Computer Graphics International ![In: 2003 Computer Graphics International (CGI 2003), 9-11 July 2003, Tokyo, Japan, pp. 120-125, 2003, IEEE Computer Society, 0-7695-1946-6. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
multiresolution texture synthesis, image in-painting, frequency decomposition, image restoration |
12 | Christian Denger, Daniel M. Berry, Erik Kamsties |
Higher Quality Requirements Specifications through Natural Language Patterns. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SwSTE ![In: 2003 IEEE International Conference on Software - Science, Technology and Engineering (SwSTE 2003), 4-5 November 2003, Herzelia, Israel, pp. 80-, 2003, IEEE Computer Society, 0-7695-2047-2. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
embedded systems, authoring, patterns, quality, metamodel, natural language, completeness, accuracy, requirements specification, ambiguity, rewriting, precision |
12 | Giovanni Cantone, Luca Colasanti, Zeiad A. Abdulnabi, Anna Lomartire, Giuseppe Calavaro |
Evaluating Checklist-Based and Use-Case-Driven Reading Techniques as Applied to Software Analysis and Design UML Artifacts. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ESERNET ![In: Empirical Methods and Studies in Software Engineering, Experiences from ESERNET, pp. 142-165, 2003, Springer, 3-540-40672-7. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
12 | Chenggang Bai, Kai-Yuan Cai, T. Y. Chen |
An Efficient Defect Estimation Method for Software Defect Curves. ![Search on Bibsonomy](Pics/bibsonomy.png) |
COMPSAC ![In: 27th International Computer Software and Applications Conference (COMPSAC 2003): Design and Assessment of Trustworthy Software-Based Systems, 3-6 November 2003, Dallas, TX, USA, Proceedings, pp. 534-, 2003, IEEE Computer Society, 0-7695-2020-0. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
12 | Stefan Mankefors, Richard Torkar, Andreas Boklund |
New Quality Estimations in Random Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSRE ![In: 14th International Symposium on Software Reliability Engineering (ISSRE 2003), 17-20 November 2003, Denver, CO, USA, pp. 468-478, 2003, IEEE Computer Society, 0-7695-2007-3. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
12 | David Leon, Andy Podgurski |
A Comparison of Coverage-Based and Distribution-Based Techniques for Filtering and Prioritizing Test Cases. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSRE ![In: 14th International Symposium on Software Reliability Engineering (ISSRE 2003), 17-20 November 2003, Denver, CO, USA, pp. 442-456, 2003, IEEE Computer Society, 0-7695-2007-3. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
12 | Jean-Philippe Andreu, Alfred Rinnhofer |
Modeling Knot Geometry in Norway Spruce from Industrial CT Images. ![Search on Bibsonomy](Pics/bibsonomy.png) |
SCIA ![In: Image Analysis, 13th Scandinavian Conference, SCIA 2003, Halmstad, Sweden, June 29 - July 2, 2003, Proceedings, pp. 786-791, 2003, Springer, 3-540-40601-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
12 | Minsu Choi, Nohpill Park, Fabrizio Lombardi, Yong-Bin Kim, Vincenzo Piuri |
Optimal Spare Utilization in Repairable and Reliable Memory Cores. ![Search on Bibsonomy](Pics/bibsonomy.png) |
MTDT ![In: 11th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2003), 28-29 July 2003, San Jose, CA, USA, pp. 64-71, 2003, IEEE Computer Society, 0-7695-2004-9. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
Embedded Memory Repair and Reliability, Fault-Tolerant Memory Core, System-on-chip, Yield, Built-In-Self-Repair |
12 | Stefan Biffl, Michael Halling, Sabine T. Köszegi |
Investigating the Accuracy of Defect Estimation Models for Individuals and Teams Based on Inspection Data. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISESE ![In: 2003 International Symposium on Empirical Software Engineering (ISESE 2003), 30 September - 1 October 2003. Rome, Italy, pp. 232-243, 2003, IEEE Computer Society, 0-7695-2002-2. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
12 | Amr Kamel, Paul G. Sorenson |
The Application of Capture-Recapture Log-Linear Models To Software Inspections Data. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISESE ![In: 2003 International Symposium on Empirical Software Engineering (ISESE 2003), 30 September - 1 October 2003. Rome, Italy, pp. 213-222, 2003, IEEE Computer Society, 0-7695-2002-2. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
12 | Paul Grünbacher, Michael Halling, Stefan Biffl, Hasan Kitapci, Barry W. Boehm |
Repeatable Quality Assurance Techniques for Requirements Negotiations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
HICSS ![In: 36th Hawaii International Conference on System Sciences (HICSS-36 2003), CD-ROM / Abstracts Proceedings, January 6-9, 2003, Big Island, HI, USA, pp. 23, 2003, IEEE Computer Society, 0-7695-1874-5. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
Pre-requirements, quality assurance techniques, GSS support, empirical evaluation, requirements negotiation |
12 | Wangqi Qiu, Xiang Lu, Zhuo Li 0001, D. M. H. Walker, Weiping Shi |
CodSim -- A Combined Delay Fault Simulator. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings, pp. 79-, 2003, IEEE Computer Society, 0-7695-2042-1. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
12 | Charles F. Hawkins, Ali Keshavarzi, Jaume Segura 0001 |
A View from the Bottom: Nanometer Technology AC Parametric Failures -- Why, Where, and How to Detect. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings, pp. 267-, 2003, IEEE Computer Society, 0-7695-2042-1. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
12 | Tsung-Chuan Huang, Chu-Sing Yang, Chao-Chieh Huang, Sheng-Wen Bai |
Hierarchical Grown Bluetrees (HGB) - An Effective Topology for Bluetooth Scatternets. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISPA ![In: Parallel and Distributed Processing and Applications, International Symposium, ISPA 2003, Aizu, Japan, July 2-4, 2003, Proceedings, pp. 152-164, 2003, Springer, 3-540-40523-2. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
12 | Andy Podgurski, David Leon, Patrick Francis, Wes Masri, Melinda Minch, Jiayang Sun, Bin Wang |
Automated Support for Classifying Software Failure Reports. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSE ![In: Proceedings of the 25th International Conference on Software Engineering, May 3-10, 2003, Portland, Oregon, USA, pp. 465-477, 2003, IEEE Computer Society, 0-7695-1877-X. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
12 | Suzette Vandivier, Mark Wahl, Jeff Rearick |
First IC Validation of IEEE Std. 1149.6. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, pp. 632-639, 2003, IEEE Computer Society, 0-7803-8106-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
1149.6, test receiver |
12 | Kenneth P. Parker |
Defect Coverage of Boundary-Scan Tests: What does it mean when a Boundary-Scan test passes? ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, pp. 1268-1276, 2003, IEEE Computer Society, 0-7803-8106-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
12 | Arun A. Joseph, Hans G. Kerkhoff |
Towards Structural Testing of Superconductor Electronics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, pp. 1182-1191, 2003, IEEE Computer Society, 0-7803-8106-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
12 | Thomas S. Barnett, Adit D. Singh |
Relating Yield Models to Burn-In Fall-Out in Time. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, pp. 77-84, 2003, IEEE Computer Society, 0-7803-8106-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
12 | Tong-Seng Quah, Mie Mie Thet Thwin |
Application of Neural Networks for Software Quality Prediction Using Object-Oriented Metrics. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSM ![In: 19th International Conference on Software Maintenance (ICSM 2003), The Architecture of Existing Systems, 22-26 September 2003, Amsterdam, The Netherlands, pp. 116-, 2003, IEEE Computer Society, 0-7695-1905-9. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
12 | Jef Jacobs, J. H. van Moll, Paul J. Krause, Rob J. Kusters, Jos J. M. Trienekens |
Effects of Virtual Development on Product Quality: Exploring Defect Causes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
STEP ![In: 11th International Workshop on Software Technology and Engineering Practice (STEP 2003), 19-21 September 2003, Amsterdam, The Netherlands, pp. 6-15, 2003, IEEE Computer Society, 0-7695-2218-1. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
Virtual development, Defect injection, Defect Causal Analysis, Defect detection, Product Quality |
12 | Norman E. Fenton, Paul Krause, Martin Neil |
Software Measurement: Uncertainty and Causal Modeling. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Softw. ![In: IEEE Softw. 19(4), pp. 116-122, 2002. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
software quality estimation, Bayesian networks, risk management, Software measurement, causal modeling |
12 | Tsong Yueh Chen, Pak-Lok Poon, Sau-Fun Tang, T. H. Tse, Yuen-Tak Yu |
Towards a Problem-Driven Approach to Perspective-Based Reading. ![Search on Bibsonomy](Pics/bibsonomy.png) |
HASE ![In: 7th IEEE International Symposium on High-Assurance Systems Engineering (HASE 2002), 23-25 October 2002, Tokyo, Japan, pp. 221-229, 2002, IEEE Computer Society, 0-7695-1769-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
Defect-Based Reading, Requirements Inspection, Software Inspection, Perspective-Based Reading, Classification-Tree Method |
12 | Stuart E. Schechter |
How to Buy Better Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
InfraSec ![In: Infrastructure Security, International Conference, InfraSec 2002 Bristol, UK, October 1-3, 2002, Proceedings, pp. 73-87, 2002, Springer, 3-540-44309-6. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
12 | Khalil Maalmi, A. El-Ouaazizi, Rachid Benslimane, Lew Fock Chong Lew Yan Voon, A. Diou, Patrick Gorria |
Crack Defect Detection and Localization Using Genetic-Based Inverse Voting Hough Transform. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICPR (3) ![In: 16th International Conference on Pattern Recognition, ICPR 2002, Quebec, Canada, August 11-15, 2002., pp. 257-260, 2002, IEEE Computer Society, 0-7695-1695-5. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
12 | Rodrigo Rodrigues 0001, Barbara Liskov, Liuba Shrira |
The design of a robust peer-to-peer system. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM SIGOPS European Workshop ![In: Proceedings of the 10th ACM SIGOPS European Workshop, Saint-Emilion, France, July 1, 2002, pp. 117-124, 2002, ACM. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
12 | Amitabh Srivastava, Jay Thiagarajan |
Effectively prioritizing tests in development environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISSTA ![In: Proceedings of the International Symposium on Software Testing and Analysis, ISSTA 2002, Roma, Italy, July 22-24, 2002, pp. 97-106, 2002, ACM, 1-58113-562-9. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
software testing, regression testing, test selection, test prioritization, test minimization |
12 | Claes Wohlin |
Is Prior Knowledge of a Programming Language Important for Software Quality?. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ISESE ![In: 2002 International Symposium on Empirical Software Engineering (ISESE 2002), 3-4 October 2002, Nara, Japan, pp. 27-36, 2002, IEEE Computer Society, 0-7695-1796-X. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
12 | Rosa Rodríguez-Montañés, D. Muñoz, Luz Balado, Joan Figueras |
Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IOLTW ![In: 8th IEEE International On-Line Testing Workshop (IOLTW 2002), 8-10 July 2002, Isle of Bendor, France, pp. 99-103, 2002, IEEE Computer Society, 0-7695-1641-6. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
12 | Arun Krishnamachary, Jacob A. Abraham |
Test generation for resistive opens in CMOS. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Great Lakes Symposium on VLSI ![In: Proceedings of the 12th ACM Great Lakes Symposium on VLSI 2002, New York, NY, USA, April 18-19, 2002, pp. 65-70, 2002, ACM, 1-58113-462-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
resistive opens, delay testing, defect detection |
12 | Minsu Choi, Nohpill Park, Fabrizio Lombardi, Yong-Bin Kim, Vincenzo Piuri |
Balanced Redundancy Utilization in Embedded Memory Cores for Dependable Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
DFT ![In: 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver, BC, Canada, Proceedings, pp. 419-427, 2002, IEEE Computer Society, 0-7695-1831-1. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
12 | Frank Padberg |
Empirical interval estimates for the defect content after an inspection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICSE ![In: Proceedings of the 24th International Conference on Software Engineering, ICSE 2002, 19-25 May 2002, Orlando, Florida, USA, pp. 58-68, 2002, ACM. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
12 | Takashi Hiroi, Chie Shishido, Masahiro Watanabe |
Pattern Alignment Method Based on Consistency Among Local Registration Candidates for LSI Wafer Pattern Inspection. ![Search on Bibsonomy](Pics/bibsonomy.png) |
WACV ![In: 6th IEEE Workshop on Applications of Computer Vision (WACV 2002), 3-4 December 2002, Orlando, FL, USA, pp. 257-263, 2002, IEEE Computer Society, 0-7695-1858-3. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
12 | Nilmoni Deb, R. D. (Shawn) Blanton |
Built-In Self Test of CMOS-MEMS Accelerometers. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002, pp. 1075-1084, 2002, IEEE Computer Society, 0-7803-7543-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
12 | Ronald D. Blanton, John T. Chen, Rao Desineni, Kumar N. Dwarakanath, Wojciech Maly, Thomas J. Vogels |
Fault Tuples in Diagnosis of Deep-Submicron Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002, pp. 233-241, 2002, IEEE Computer Society, 0-7803-7543-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
fault model and characterization, diagnosis, failure analysis |
12 | Pekka Abrahamsson, Karlheinz Kautz |
Personal Software Process: Classroom Experiences from Finland. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ECSQ ![In: Software Quality - ECSQ 2002, 7th International Conference, Helsinki, Finland, June 9-13, 2002, Proceedings, pp. 175-185, 2002, Springer, 3-540-43749-5. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
12 | Dimitris A. Karras, Basil G. Mertzios |
Improved Defect Detection Using Novel Wavelet Feature Extraction Involving Principal Component Analysis and Neural Network Techniques. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Australian Joint Conference on Artificial Intelligence ![In: AI 2002: Advances in Artificial Intelligence, 15th Australian Joint Conference on Artificial Intelligence, Canberra, Australia, December 2-6, 2002, Proceedings, pp. 638-647, 2002, Springer, 3-540-00197-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
Neural Networks, Wavelets, Defect detection |
12 | Mechelle Gittens, Hanan Lutfi Lutfiyya, Michael A. Bauer 0001, David Godwin, Yong Woo Kim, Pramod Gupta |
An empirical evaluation of system and regression testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CASCON ![In: Proceedings of the 2002 conference of the Centre for Advanced Studies on Collaborative Research, September 30 - October 3, 2002, Toronto, Ontario, Canada, pp. 3, 2002, IBM. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP BibTeX RDF |
|
12 | Stefan Biffl |
Lesetechniken fuer die Inspektion von Software-Anforderungsdokumenten - Ein kontrolliertes Experiment zur Untersuchung der Effektivität und Verwendung von Zeit bei der Anwendung verschiedener Lesetechniken. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Inform. Forsch. Entwickl. ![In: Inform. Forsch. Entwickl. 16(3), pp. 145-158, 2001. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
Software-Inspektion, Techniken zum Erkennen von Fehlern, Inspektionsplanung, kontrolliertes Experiment, Empirische Softwaretechnik |
12 | Ismed Hartanto, Srikanth Venkataraman, W. Kent Fuchs, Elizabeth M. Rudnick, Janak H. Patel, Sreejit Chakravarty |
Diagnostic simulation of stuck-at faults in sequential circuits using compact lists. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ACM Trans. Design Autom. Electr. Syst. ![In: ACM Trans. Design Autom. Electr. Syst. 6(4), pp. 471-489, 2001. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
stuck-at fault diagnosis, Fault simulation |
12 | Michiel van Genuchten, Cor van Dijk, Henk Scholten, Douglas R. Vogel |
Using Group Support Systems for Software Inspections. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Softw. ![In: IEEE Softw. 18(3), pp. 60-65, 2001. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
12 | Kevin Stanley |
High-Accuracy Flush-and-Scan Software Diagnostic. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 18(6), pp. 56-62, 2001. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
12 | Alessandro Bianchi, Danilo Caivano, Filippo Lanubile, Giuseppe Visaggio |
Evaluating Software Degradation through Entropy. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE METRICS ![In: 7th IEEE International Software Metrics Symposium (METRICS 2001), 4-6 April 2001, London, England, UK, pp. 210-, 2001, IEEE Computer Society, 0-7695-1043-4. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
12 | Prasanna Sundararajan, Steve Guccione |
Run-Time defect tolerance using JBits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
FPGA ![In: Proceedings of the ACM/SIGDA International Symposium on Field Programmable Gate Arrays, FPGA 2001, Monterey, CA, USA, February 11-13, 2001, pp. 193-198, 2001, ACM, 1-58113-341-3. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
Java, FPGA, cores, defect tolerance, run-time reconfiguration |
|
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