Search results for "ITC"

Hits ?▲	Authors	Title	Venue	Year	Link	Author keywords
82	Robert C. Aitken	ITC is Cool.	IEEE Des. Test Comput.	2005	DBLP DOI BibTeX RDF	high-frequency test, board and system test, test compression, silicon debug, International Test Conference, ITC
75	Kuen-Jong Lee, Shi-Yu Huang, Huawei Li, Tomoo Inoue, Yervant Zorian	International Test Conference in Asia (ITC-Asia) - Bridging ITC and Test Community in Asia.	ITC	2019	DBLP DOI BibTeX RDF
70	Carol Stolicny	ITC 2006 panels.	IEEE Des. Test Comput.	2007	DBLP DOI BibTeX RDF	International Test Conference, ITC
62	Miruna Szabo, Martin Stetter, Gustavo Deco, Stefano Fusi, Paolo Del Giudice, Maurizio Mattia	Learning to Attend: Modeling the Shaping of Selectivity in Infero-temporal Cortex in a Categorization Task.	Biol. Cybern.	2006	DBLP DOI BibTeX RDF
57	Jill Sibert	ITC exhibits for fun and profit.	IEEE Des. Test Comput.	2007	DBLP DOI BibTeX RDF	Test Week, test professionals, technical sessions, exhibits, International Test Conference, ITC
53	Li-C. Wang, Jeff Rearick	Welcome Message ITC 2023.	ITC	2023	DBLP DOI BibTeX RDF
53	Scott Davidson 0001	The ITC test compression shootout.	ITC	2005	DBLP DOI BibTeX RDF
53	Mike Tripp	ITC 2004 Panel: Cost of Test - Taking Control.	ITC	2004	DBLP DOI BibTeX RDF
53		ITC Technical Paper Evaluation and Selection Process.	ITC	2004	DBLP DOI BibTeX RDF
49	Ron Bekkerman, Martin Scholz	Data weaving: scaling up the state-of-the-art in data clustering.	CIKM	2008	DBLP DOI BibTeX RDF	information-theoretic clustering, multi-modal clustering, parallel and distributed data mining
48	Anne Gattiker	Guest Editor's Introduction: Getting More Out of Test.	IEEE Des. Test Comput.	2007	DBLP DOI BibTeX RDF	electronic test, designers, debugging, diagnosis, International Test Conference, ITC, test engineers
47	Ken Butler	Conference Reports: 2005 International Test Conference.	IEEE Des. Test Comput.	2006	DBLP DOI BibTeX RDF	low-cost ATE, very-deep submicron tecnology, yield ramping, International Test Conference, ITC 2005
46	Carol Stolicny	ITC 2004 panels: Part 1.	IEEE Des. Test Comput.	2005	DBLP DOI BibTeX RDF
46	Nicola Bertoldi, Marcello Federico	ITC-irst at CLEF 2003: Monolingual, Bilingual, and Multilingual Information Retrieval.	CLEF	2003	DBLP DOI BibTeX RDF
46	Nicola Bertoldi, Marcello Federico	ITC-irst at CLEF 2001: Monolingual and Bilingual Tracks.	CLEF	2001	DBLP DOI BibTeX RDF
44	Mike Li	Is "Design to Production" The Ultimate Answer For Jitter, Noise, and BER Challenges For Multi GB/s ICs?	ITC	2004	DBLP DOI BibTeX RDF
44	Bill Eklow	What Do You Mean My Board Test Stinks?	ITC	2004	DBLP DOI BibTeX RDF
44	Anuja Sehgal, Sandeep Kumar Goel, Erik Jan Marinissen, Krishnendu Chakrabarty	IEEE P1500-Compliant Test Wrapper Design for Hierarchical Cores.	ITC	2004	DBLP DOI BibTeX RDF
44	Chunsheng Liu, Hamid Sharif, Érika F. Cota, Dhiraj K. Pradhan	Test Scheduling for Network-on-Chip with BIST and Precedence Constraints.	ITC	2004	DBLP DOI BibTeX RDF
44	Saravanan Padmanaban, Spyros Tragoudas	A Critical Path Selection Method for Delay Testing.	ITC	2004	DBLP DOI BibTeX RDF
44	Kameshwar Chandrasekar, Michael S. Hsiao	Decision Selection and Learning for an All-Solutions ATPG Engine.	ITC	2004	DBLP DOI BibTeX RDF
44	Érika F. Cota, Luigi Carro, Flávio Rech Wagner, Marcelo Lubaszewski	Power-aware NoC Reuse on the Testing of Core-based Systems.	ITC	2003	DBLP DOI BibTeX RDF
44	Carol Stolicny	ITC 2005 panels.	IEEE Des. Test Comput.	2006	DBLP DOI BibTeX RDF	multicore testing, design for testability, soft errors, test compression, International Test Conference, ITC 2005
43	Darius Bartlett	A review of: "ILWIS - The Integrated Land and Watershed Management Information System, " ITC Publication No. 7. Edited by A. M. J. MEIJERINK, C. R. VALENZUELA and A. STEWART. (Enschede: International Institute for Aerospace Survey and Earth Sciences (ITC), 1988.) [Pp. 115.] Price Dfl.20·00.	Int. J. Geogr. Inf. Sci.	1989	DBLP DOI BibTeX RDF
37	S. M. Delouis, M. Jalobeanu	Tele-Pedagogy in the Virtual Educational Communities.	AICT/SAPIR/ELETE	2005	DBLP DOI BibTeX RDF
37	Cédric Archambeau, Torsten Butz, Vlad Popovici, Michel Verleysen, Jean-Philippe Thiran	Supervised Nonparametric Information Theoretic Classification.	ICPR (3)	2004	DBLP DOI BibTeX RDF
37	Yervant Zorian	Wider Coverage.	IEEE Des. Test Comput.	2000	DBLP DOI BibTeX RDF
37	Richard Tabors	Unbundling of Transmission: The Operation and Economics of a For-Profit Transmission Company.	HICSS	2000	DBLP DOI BibTeX RDF
36	Kwang-Ting (Tim) Cheng	Combining synchronous and asynchronous timing schemes for high-performance systems.	IEEE Des. Test Comput.	2007	DBLP DOI BibTeX RDF	high-performance systems, synchronous, asynchronous, DAC, ITC
35	Sandeep Kumar Goel, Erik Jan Marinissen	Effective and Efficient Test Architecture Design for SOCs.	ITC	2002	DBLP DOI BibTeX RDF
34	Milen Kouylekov, Matteo Negri, Bernardo Magnini, Bonaventura Coppola	Towards Entailment-Based Question Answering: ITC-irst at CLEF 2006.	CLEF	2006	DBLP DOI BibTeX RDF
34	Scott Davidson 0001	Guest Editor's Introduction: ITC Examines How Test Helps the Fittest Survive.	IEEE Des. Test Comput.	2005	DBLP DOI BibTeX RDF	X-tolerant, IC outlier, ATPG, BIST, yield, IDDQ, International Test Conference, test metrics
34	Nicola Bertoldi, Marcello Federico	ITC-irst at CLEF 2003: Cross-Language Spoken Document Retrieval.	CLEF	2003	DBLP DOI BibTeX RDF
34	Nicola Bertoldi, Fabio Brugnara, Mauro Cettolo, Marcello Federico, Diego Giuliani, Erwin Leeuwis, Vanessa Sandrini	The ITC-irst News on Demand Platform.	ECIR	2003	DBLP DOI BibTeX RDF
34	Luis Basto	First Results of ITC'99 Benchmark Circuits.	IEEE Des. Test Comput.	2000	DBLP DOI BibTeX RDF
34	Nicola Bertoldi, Marcello Federico	ITC-irst at CLEF 2000: Italian Monolingual Track.	CLEF	2000	DBLP DOI BibTeX RDF
32	Kai-Min Chung (eds.)	4th Conference on Information-Theoretic Cryptography, ITC 2023, June 6-8, 2023, Aarhus University, Aarhus, Denmark	ITC	2023	DBLP BibTeX RDF
32		IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023	ITC	2023	DBLP DOI BibTeX RDF
32		Front Matter, Table of Contents, Preface, Conference Organization.	ITC	2023	DBLP DOI BibTeX RDF
32	Kasper Green Larsen, Maciej Obremski, Mark Simkin 0001	Distributed Shuffling in Adversarial Environments.	ITC	2023	DBLP DOI BibTeX RDF
32	Keitaro Hiwatashi, Koji Nuida	Exponential Correlated Randomness Is Necessary in Communication-Optimal Perfectly Secure Two-Party Computation.	ITC	2023	DBLP DOI BibTeX RDF
32	Cody Freitag, Ilan Komargodski	The Cost of Statistical Security in Proofs for Repeated Squaring.	ITC	2023	DBLP DOI BibTeX RDF
32	Noam Mazor	A Lower Bound on the Share Size in Evolving Secret Sharing.	ITC	2023	DBLP DOI BibTeX RDF
32	Vipul Goyal, Chen-Da Liu-Zhang, Rafail Ostrovsky	Asymmetric Multi-Party Computation.	ITC	2023	DBLP DOI BibTeX RDF
32	Nils Fleischhacker, Suparno Ghoshal, Mark Simkin 0001	Interactive Non-Malleable Codes Against Desynchronizing Attacks in the Multi-Party Setting.	ITC	2023	DBLP DOI BibTeX RDF
32	Fabrice Benhamouda, Shai Halevi, Lev Stambler	Weighted Secret Sharing from Wiretap Channels.	ITC	2023	DBLP DOI BibTeX RDF
32	Ivan Damgård, Daniel Escudero 0001, Antigoni Polychroniadou	Phoenix: Secure Computation in an Unstable Network with Dropouts and Comebacks.	ITC	2023	DBLP DOI BibTeX RDF
32	Samuel Bouaziz-Ermann, Alex B. Grilo, Damien Vergnaud	Quantum Security of Subset Cover Problems.	ITC	2023	DBLP DOI BibTeX RDF
32	Andrej Bogdanov	Csirmaz's Duality Conjecture and Threshold Secret Sharing.	ITC	2023	DBLP DOI BibTeX RDF
32	Hannah Keller, Claudio Orlandi, Anat Paskin-Cherniavsky, Divya Ravi	MPC with Low Bottleneck-Complexity: Information-Theoretic Security and More.	ITC	2023	DBLP DOI BibTeX RDF
32	Mohammad Hajiabadi, Shahram Khazaei, Behzad Vahdani	Randomness Recoverable Secret Sharing Schemes.	ITC	2023	DBLP DOI BibTeX RDF
32	Justin Holmgren, Ruta Jawale	Locally Covert Learning.	ITC	2023	DBLP DOI BibTeX RDF
32	Amos Beimel	Lower Bounds for Secret-Sharing Schemes for k-Hypergraphs.	ITC	2023	DBLP DOI BibTeX RDF
32	Badih Ghazi, Ravi Kumar 0001, Pasin Manurangsi, Jelani Nelson, Samson Zhou	Differentially Private Aggregation via Imperfect Shuffling.	ITC	2023	DBLP DOI BibTeX RDF
32	Nicolas Resch, Chen Yuan 0003	Two-Round Perfectly Secure Message Transmission with Optimal Transmission Rate.	ITC	2023	DBLP DOI BibTeX RDF
32	Ivan Damgård, Divya Ravi, Daniel Tschudi, Sophia Yakoubov	Secure Communication in Dynamic Incomplete Networks.	ITC	2023	DBLP DOI BibTeX RDF
32	Mohammad Mahmoody, Wei Qi	Online Mergers and Applications to Registration-Based Encryption and Accumulators.	ITC	2023	DBLP DOI BibTeX RDF
32	Suhasini Komarraju, Akhil Tammana, Chandramouli N. Amarnath, Abhijit Chatterjee	OATT: Outlier Oriented Alternative Testing and Post-Manufacture Tuning of Mixed-Signal/RF Circuits and Systems.	ITC	2023	DBLP DOI BibTeX RDF
32	Rasheed Kibria, Farimah Farahmandi, Mark M. Tehranipoor	ARC-FSM-G: Automatic Security Rule Checking for Finite State Machine at the Netlist Abstraction.	ITC	2023	DBLP DOI BibTeX RDF
32	Anshuman Chandra, Moiz Khan, Ankita Patidar, Fumiaki Takashima, Sandeep Kumar Goel, Bharath Shankaranarayanan, Vuong Nguyen, Vistrita Tyagi, Manish Arora	A Case Study on IEEE 1838 Compliant Multi-Die 3DIC DFT Implementation.	ITC	2023	DBLP DOI BibTeX RDF
32	Ayush Arunachalam, Sanjay Das, Monikka Rajan, Fei Su, Xiankun Jin, Suvadeep Banerjee, Arnab Raha, Suriyaprakash Natarajan, Kanad Basu	Enhanced ML-Based Approach for Functional Safety Improvement in Automotive AMS Circuits.	ITC	2023	DBLP DOI BibTeX RDF
32	Kranthi Kandula, Ramalingam Kolisetti, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian	SLM Subsystem for Automotive SoC: Case Study on Path Margin Monitor.	ITC	2023	DBLP DOI BibTeX RDF
32	Saidapet Ramesh, Rahul Kalyan, Jesse Yanez, Andreas Glowatz, Maija Ryynänen, Sergej Schwarz	Measuring Non-Redundant VIA Test-Coverage for Automotive Designs in Lower Process Nodes.	ITC	2023	DBLP DOI BibTeX RDF
32	Francesco Lorenzelli, Asser Elsayed, Clement Godfrin, Alexander Grill, Stefan Kubicek, Ruoyu Li, Michele Stucchi, Danny Wan, Kristiaan De Greve, Erik Jan Marinissen, Georges G. E. Gielen	Wafer-Scale Electrical Characterization of Silicon Quantum Dots from Room to Low Temperatures.	ITC	2023	DBLP DOI BibTeX RDF
32	Daehyun Chang, Youngdae Kim, Suksoo Pyo, Shin Hun, Daesop Lee, Sohee Hwang, Jaesik Choi, Siwoong Kim	Algorithmic Read Resistance Trim for Improving Yield and Reducing Test Time in MRAM.	ITC	2023	DBLP DOI BibTeX RDF
32	Navajit Singh Baban, Ajymurat Orozaliev, Yong-Ak Song, Urbi Chatterjee, Sankalp Bose, Sukanta Bhattacharjee, Ramesh Karri, Krishnendu Chakrabarty	Biochip-PUF: Physically Unclonable Function for Microfluidic Biochips.	ITC	2023	DBLP DOI BibTeX RDF
32	Manoj Devendhiran, Jakub Janicki, Szczepan Urban, Manish Sharma, Jayant D'Souza	Predicting the Resolution of Scan Diagnosis.	ITC	2023	DBLP DOI BibTeX RDF
32	Szczepan Urban, Piotr Zimnowlodzki, Manish Sharma, Shraddha Bodhe, John Schulze, Abdullah Yassine, Adam Styblinski	Global Control Signal Defect Diagnosis in Volume Production Environment.	ITC	2023	DBLP DOI BibTeX RDF
32	Yunfei Gu, Xingyu Wang, Zixiao Chen, Chentao Wu, Xinfei Guo, Jie Li 0002, Minyi Guo, Song Wu, Rong Yuan, Taile Zhang, Yawen Zhang, Haoran Cai	Improving Productivity and Efficiency of SSD Manufacturing Self-Test Process by Learning-Based Proactive Defect Prediction.	ITC	2023	DBLP DOI BibTeX RDF
32	Cyrille Dray, Khushal Gelda, Benoit Nadeau-Dostie, Wei Zou, Luc Romain, Jongsin Yun, Harshitha Kodali, Lori Schramm, Martin Keim	Transitioning eMRAM from Pilot Project to Volume Production.	ITC	2023	DBLP DOI BibTeX RDF
32	Yuxuan Yin, Rebecca Chen, Chen He, Peng Li	Domain-Specific Machine Learning Based Minimum Operating Voltage Prediction Using On-Chip Monitor Data.	ITC	2023	DBLP DOI BibTeX RDF
32	Sicong Yuan, Z. Zhang, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, M. Taouil, Said Hamdioui	Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs.	ITC	2023	DBLP DOI BibTeX RDF
32	Arani Sinha, Glenn Colón-Bonet, Michael Fahy, Pankaj Pant, Haijing Mao, Akhilesh Shukla	Maximizing Stress Coverage by Novel DFT Techniques and Relaxed Timing Closure.	ITC	2023	DBLP DOI BibTeX RDF
32	Matthew Dupree, Min Jian Yang, Yueling Jenny Zeng, Li-C. Wang	IEA-Plot: Conducting Wafer-Based Data Analytics Through Chat.	ITC	2023	DBLP DOI BibTeX RDF
32	Nadun Sinhabahu, Katherine Shu-Min Li, Sying-Jyan Wang, J. R. Wang, Matt Ho	Machine-Learning Driven Sensor Data Analytics for Yield Enhancement of Wafer Probing.	ITC	2023	DBLP DOI BibTeX RDF
32	Bharath Nandakumar, Sameer Chillarige	Low cost production scan chain test for compression based designs.	ITC	2023	DBLP DOI BibTeX RDF
32	Seyedeh Maryam Ghasemi, Sergej Meschkov, Jonas Krautter, Dennis R. E. Gnad, Mehdi B. Tahoori	Enabling In-Field Parametric Testing for RISC-V Cores.	ITC	2023	DBLP DOI BibTeX RDF
32	Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty	Scan Cell Segmentation Based on Reinforcement Learning for Power-Safe Testing of Monolithic 3D ICs.	ITC	2023	DBLP DOI BibTeX RDF
32	Yu Li, Qiang Xu	Towards Robust Deep Neural Networks Against Design-Time and Run-Time Failures.	ITC	2023	DBLP DOI BibTeX RDF
32	Sudhakar Kongala, Anuj Gupta, Yash Walia, Sahil Jain	Novel Methodology to Optimize TAT and Resource Utilization for ATPG Simulations for Large SoCs.	ITC	2023	DBLP DOI BibTeX RDF
32	Costas Argyrides, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian	Utilizing ECC Analytics to Improve Memory Lifecycle Management.	ITC	2023	DBLP DOI BibTeX RDF
32	Dhruv Thapar, Simon Thomann, Arjun Chaudhuri, Hussam Amrouch, Krishnendu Chakrabarty	Analysis and Characterization of Defects in FeFETs.	ITC	2023	DBLP DOI BibTeX RDF
32	Ching-Min Liu, Chia-Heng Yen, Shu-Wen Lee, Kai-Chiang Wu, Mango Chia-Tso Chao	Enhancing Good-Die-in-Bad-Neighborhood Methodology with Wafer-Level Defect Pattern Information.	ITC	2023	DBLP DOI BibTeX RDF
32	Yinxuan Lyu, Liangliang Yu, Pengju Li, Junlin Huang	Logic Test Vehicles for High Resolution Diagnosis of Systematic FEOL/MEOL Yield Detractors.	ITC	2023	DBLP DOI BibTeX RDF
32	Sam M.-H. Hsiao, Amy H.-Y. Tsai, Lowry P.-T. Wang, Aaron C.-W. Liang, Charles H.-P. Wen, Herming Chiueh	Preventing Single-Event Double-Node Upsets by Engineering Change Order in Latch Designs.	ITC	2023	DBLP DOI BibTeX RDF
32	Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima, Oussama Laouamri, Naveen Khanna, Jeff Mayer, Nilanjan Mukherjee	A New Framework for RTL Test Points Insertion Facilitating a "Shift-Left DFT" Strategy.	ITC	2023	DBLP DOI BibTeX RDF
32	Irith Pomeranz	Compaction of Functional Broadside Tests for Path Delay Faults Using Clusters of Propagation Lines.	ITC	2023	DBLP DOI BibTeX RDF
32	Seongkwan Lee, Minho Kang, Cheolmin Park, Jun Yeon Won, Jaemoo Choi	Method for Adjusting Termination Resistance Using PMU in DC Test.	ITC	2023	DBLP DOI BibTeX RDF
32	Zhe-Jia Liang, Yu-Tsung Wu, Yun-Feng Yang, James Chien-Mo Li, Norman Chang, Akhilesh Kumar, Ying-Shiun Li	High-Speed, Low-Storage Power and Thermal Predictions for ATPG Test Patterns.	ITC	2023	DBLP DOI BibTeX RDF
32	Dimitris Gizopoulos, George Papadimitriou 0001, Odysseas Chatzopoulos	Estimating the Failures and Silent Errors Rates of CPUs Across ISAs and Microarchitectures.	ITC	2023	DBLP DOI BibTeX RDF
32	Aswin R	New Algorithm for Fast and Accurate Linearity Testing of High-Resolution SAR ADCs.	ITC	2023	DBLP DOI BibTeX RDF
32	Ferhat Can Ataman, Y. B. Chethan Kumar, Sandeep Rao, Sule Ozev	Improving Angle of Arrival Estimation Accuracy for mm-Wave Radars.	ITC	2023	DBLP DOI BibTeX RDF
32	Ryan Holzhausen, Tasnuva Farheen, Morgan Thomas, Nima Maghari, Domenic Forte	Laser Fault Injection Vulnerability Assessment and Mitigation with Case Study on PG-TVD Logic Cells.	ITC	2023	DBLP DOI BibTeX RDF
32	Bing-Han Hsieh, Yun-Sheng Liu, James Chien-Mo Li, Chris Nigh, Mason Chern, Gaurav Bhargava	Diagnosis of Systematic Delay Failures Through Subset Relationship Analysis.	ITC	2023	DBLP DOI BibTeX RDF
32	Anuj Dubey, Aydin Aysu	A Full-Stack Approach for Side-Channel Secure ML Hardware.	ITC	2023	DBLP DOI BibTeX RDF
32	Fernando Fernandes dos Santos, Luigi Carro, Paolo Rech	Understanding and Improving GPUs' Reliability Combining Beam Experiments with Fault Simulation.	ITC	2023	DBLP DOI BibTeX RDF
32	Huaxiao Liang, Xiaoze Lin, Liyang Lai, Naixing Wang, Yu Huang, Fei Yang, Yuxin Yang	GPU-Based Concurrent Static Learning.	ITC	2023	DBLP DOI BibTeX RDF
32	J. Lefevre, P. Debaud, P. Girard, Arnaud Virazel	Predictor BIST: An "All-in-One" Optical Test Solution for CMOS Image Sensors.	ITC	2023	DBLP DOI BibTeX RDF
32	Hanzhi Xun, Sicong Yuan, Moritz Fieback, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui	Device-Aware Test for Ion Depletion Defects in RRAMs.	ITC	2023	DBLP DOI BibTeX RDF
32	Hanieh Jafarzadeh, Florian Klemme, Jan Dennis Reimer, Zahra Paria Najafi-Haghi, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich	Robust Pattern Generation for Small Delay Faults Under Process Variations.	ITC	2023	DBLP DOI BibTeX RDF