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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
The graphs summarize 416 occurrences of 289 keywords
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Results
Found 5933 publication records. Showing 5933 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
82 | Robert C. Aitken |
ITC is Cool. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 22(6), pp. 616, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
high-frequency test, board and system test, test compression, silicon debug, International Test Conference, ITC |
75 | Kuen-Jong Lee, Shi-Yu Huang, Huawei Li, Tomoo Inoue, Yervant Zorian |
International Test Conference in Asia (ITC-Asia) - Bridging ITC and Test Community in Asia. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2019, Washington, DC, USA, November 9-15, 2019, pp. 1-4, 2019, IEEE, 978-1-7281-4823-6. The full citation details ...](Pics/full.jpeg) |
2019 |
DBLP DOI BibTeX RDF |
|
70 | Carol Stolicny |
ITC 2006 panels. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 24(1), pp. 94-96, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
International Test Conference, ITC |
62 | Miruna Szabo, Martin Stetter, Gustavo Deco, Stefano Fusi, Paolo Del Giudice, Maurizio Mattia |
Learning to Attend: Modeling the Shaping of Selectivity in Infero-temporal Cortex in a Categorization Task. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Biol. Cybern. ![In: Biol. Cybern. 94(5), pp. 351-365, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
57 | Jill Sibert |
ITC exhibits for fun and profit. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 24(5), pp. 512, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
Test Week, test professionals, technical sessions, exhibits, International Test Conference, ITC |
53 | Li-C. Wang, Jeff Rearick |
Welcome Message ITC 2023. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. xiii, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
53 | Scott Davidson 0001 |
The ITC test compression shootout. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005, pp. 1, 2005, IEEE Computer Society, 0-7803-9038-5. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
53 | Mike Tripp |
ITC 2004 Panel: Cost of Test - Taking Control. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 1432, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
53 | |
ITC Technical Paper Evaluation and Selection Process. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 10, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
49 | Ron Bekkerman, Martin Scholz |
Data weaving: scaling up the state-of-the-art in data clustering. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CIKM ![In: Proceedings of the 17th ACM Conference on Information and Knowledge Management, CIKM 2008, Napa Valley, California, USA, October 26-30, 2008, pp. 1083-1092, 2008, ACM, 978-1-59593-991-3. The full citation details ...](Pics/full.jpeg) |
2008 |
DBLP DOI BibTeX RDF |
information-theoretic clustering, multi-modal clustering, parallel and distributed data mining |
48 | Anne Gattiker |
Guest Editor's Introduction: Getting More Out of Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 24(5), pp. 474-475, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
electronic test, designers, debugging, diagnosis, International Test Conference, ITC, test engineers |
47 | Ken Butler |
Conference Reports: 2005 International Test Conference. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 23(1), pp. 71, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
low-cost ATE, very-deep submicron tecnology, yield ramping, International Test Conference, ITC 2005 |
46 | Carol Stolicny |
ITC 2004 panels: Part 1. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 22(2), pp. 186-189, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
46 | Nicola Bertoldi, Marcello Federico |
ITC-irst at CLEF 2003: Monolingual, Bilingual, and Multilingual Information Retrieval. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CLEF ![In: Comparative Evaluation of Multilingual Information Access Systems, 4th Workshop of the Cross-Language Evaluation Forum, CLEF 2003, Trondheim, Norway, August 21-22, 2003, Revised Selected Papers, pp. 140-151, 2003, Springer, 3-540-24017-9. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
46 | Nicola Bertoldi, Marcello Federico |
ITC-irst at CLEF 2001: Monolingual and Bilingual Tracks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CLEF ![In: Evaluation of Cross-Language Information Retrieval Systems, Second Workshop of the Cross-Language Evaluation Forum, CLEF 2001, Darmstadt, Germany, September 3-4, 2001, Revised Papers, pp. 94-101, 2001, Springer, 3-540-44042-9. The full citation details ...](Pics/full.jpeg) |
2001 |
DBLP DOI BibTeX RDF |
|
44 | Mike Li |
Is "Design to Production" The Ultimate Answer For Jitter, Noise, and BER Challenges For Multi GB/s ICs? ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 1433, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
44 | Bill Eklow |
What Do You Mean My Board Test Stinks? ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 1423, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
44 | Anuja Sehgal, Sandeep Kumar Goel, Erik Jan Marinissen, Krishnendu Chakrabarty |
IEEE P1500-Compliant Test Wrapper Design for Hierarchical Cores. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 1203-1212, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
44 | Chunsheng Liu, Hamid Sharif, Érika F. Cota, Dhiraj K. Pradhan |
Test Scheduling for Network-on-Chip with BIST and Precedence Constraints. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 1369-1378, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
44 | Saravanan Padmanaban, Spyros Tragoudas |
A Critical Path Selection Method for Delay Testing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 232-241, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
44 | Kameshwar Chandrasekar, Michael S. Hsiao |
Decision Selection and Learning for an All-Solutions ATPG Engine. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA, pp. 607-616, 2004, IEEE Computer Society, 0-7803-8581-0. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
44 | Érika F. Cota, Luigi Carro, Flávio Rech Wagner, Marcelo Lubaszewski |
Power-aware NoC Reuse on the Testing of Core-based Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA, pp. 612-621, 2003, IEEE Computer Society, 0-7803-8106-8. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
44 | Carol Stolicny |
ITC 2005 panels. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 23(2), pp. 164-166, 2006. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
multicore testing, design for testability, soft errors, test compression, International Test Conference, ITC 2005 |
43 | Darius Bartlett |
A review of: "ILWIS - The Integrated Land and Watershed Management Information System, " ITC Publication No. 7. Edited by A. M. J. MEIJERINK, C. R. VALENZUELA and A. STEWART. (Enschede: International Institute for Aerospace Survey and Earth Sciences (ITC), 1988.) [Pp. 115.] Price Dfl.20·00. ![Search on Bibsonomy](Pics/bibsonomy.png) |
Int. J. Geogr. Inf. Sci. ![In: Int. J. Geogr. Inf. Sci. 3(3), pp. 274-276, 1989. The full citation details ...](Pics/full.jpeg) |
1989 |
DBLP DOI BibTeX RDF |
|
37 | S. M. Delouis, M. Jalobeanu |
Tele-Pedagogy in the Virtual Educational Communities. ![Search on Bibsonomy](Pics/bibsonomy.png) |
AICT/SAPIR/ELETE ![In: Telecommunications 2005: Advanced Industrial Conference on Telecommunications / Service Assurance with Partial and Intermittent Resources Conference / E-Learning on Telecommunications Workshop (AICT / SAPIR / ELETE 2005), 17-22 July 2005, Lisbon, Portugal, pp. 527-532, 2005, IEEE Computer Society, 0-7695-2388-9. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
|
37 | Cédric Archambeau, Torsten Butz, Vlad Popovici, Michel Verleysen, Jean-Philippe Thiran |
Supervised Nonparametric Information Theoretic Classification. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ICPR (3) ![In: 17th International Conference on Pattern Recognition, ICPR 2004, Cambridge, UK, August 23-26, 2004., pp. 414-417, 2004, IEEE Computer Society, 0-7695-2128-2. The full citation details ...](Pics/full.jpeg) |
2004 |
DBLP DOI BibTeX RDF |
|
37 | Yervant Zorian |
Wider Coverage. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 17(3), pp. 6-, 2000. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
37 | Richard Tabors |
Unbundling of Transmission: The Operation and Economics of a For-Profit Transmission Company. ![Search on Bibsonomy](Pics/bibsonomy.png) |
HICSS ![In: 33rd Annual Hawaii International Conference on System Sciences (HICSS-33), 4-7 January, 2000, Maui, Hawaii, USA, 2000, IEEE Computer Society, 0-7695-0493-0. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
36 | Kwang-Ting (Tim) Cheng |
Combining synchronous and asynchronous timing schemes for high-performance systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 24(5), pp. 412, 2007. The full citation details ...](Pics/full.jpeg) |
2007 |
DBLP DOI BibTeX RDF |
high-performance systems, synchronous, asynchronous, DAC, ITC |
35 | Sandeep Kumar Goel, Erik Jan Marinissen |
Effective and Efficient Test Architecture Design for SOCs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002, pp. 529-538, 2002, IEEE Computer Society, 0-7803-7543-2. The full citation details ...](Pics/full.jpeg) |
2002 |
DBLP DOI BibTeX RDF |
|
34 | Milen Kouylekov, Matteo Negri, Bernardo Magnini, Bonaventura Coppola |
Towards Entailment-Based Question Answering: ITC-irst at CLEF 2006. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CLEF ![In: Evaluation of Multilingual and Multi-modal Information Retrieval, 7th Workshop of the Cross-Language Evaluation Forum, CLEF 2006, Alicante, Spain, September 20-22, 2006, Revised Selected Papers, pp. 526-536, 2006, Springer, 978-3-540-74998-1. The full citation details ...](Pics/full.jpeg) |
2006 |
DBLP DOI BibTeX RDF |
|
34 | Scott Davidson 0001 |
Guest Editor's Introduction: ITC Examines How Test Helps the Fittest Survive. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 22(6), pp. 565, 2005. The full citation details ...](Pics/full.jpeg) |
2005 |
DBLP DOI BibTeX RDF |
X-tolerant, IC outlier, ATPG, BIST, yield, IDDQ, International Test Conference, test metrics |
34 | Nicola Bertoldi, Marcello Federico |
ITC-irst at CLEF 2003: Cross-Language Spoken Document Retrieval. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CLEF ![In: Comparative Evaluation of Multilingual Information Access Systems, 4th Workshop of the Cross-Language Evaluation Forum, CLEF 2003, Trondheim, Norway, August 21-22, 2003, Revised Selected Papers, pp. 672-675, 2003, Springer, 3-540-24017-9. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
34 | Nicola Bertoldi, Fabio Brugnara, Mauro Cettolo, Marcello Federico, Diego Giuliani, Erwin Leeuwis, Vanessa Sandrini |
The ITC-irst News on Demand Platform. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ECIR ![In: Advances in Information Retrieval, 25th European Conference on IR Research, ECIR 2003, Pisa, Italy, April 14-16, 2003, Proceedings, pp. 520-527, 2003, Springer, 3-540-01274-5. The full citation details ...](Pics/full.jpeg) |
2003 |
DBLP DOI BibTeX RDF |
|
34 | Luis Basto |
First Results of ITC'99 Benchmark Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
IEEE Des. Test Comput. ![In: IEEE Des. Test Comput. 17(3), pp. 54-59, 2000. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
34 | Nicola Bertoldi, Marcello Federico |
ITC-irst at CLEF 2000: Italian Monolingual Track. ![Search on Bibsonomy](Pics/bibsonomy.png) |
CLEF ![In: Cross-Language Information Retrieval and Evaluation, Workshop of Cross-Language Evaluation Forum, CLEF 2000, Lisbon, Portugal, September 21-22, 2000, Revised Papers, pp. 261-272, 2000, Springer, 3-540-42446-6. The full citation details ...](Pics/full.jpeg) |
2000 |
DBLP DOI BibTeX RDF |
|
32 | Kai-Min Chung (eds.) |
4th Conference on Information-Theoretic Cryptography, ITC 2023, June 6-8, 2023, Aarhus University, Aarhus, Denmark ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-271-6 The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP BibTeX RDF |
|
32 | |
IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023 ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![IEEE, 979-8-3503-4325-0 The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
32 | |
Front Matter, Table of Contents, Preface, Conference Organization. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 4th Conference on Information-Theoretic Cryptography, ITC 2023, June 6-8, 2023, Aarhus University, Aarhus, Denmark, pp. 0:1-0:12, 2023, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-271-6. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
32 | Kasper Green Larsen, Maciej Obremski, Mark Simkin 0001 |
Distributed Shuffling in Adversarial Environments. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 4th Conference on Information-Theoretic Cryptography, ITC 2023, June 6-8, 2023, Aarhus University, Aarhus, Denmark, pp. 10:1-10:15, 2023, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-271-6. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
32 | Keitaro Hiwatashi, Koji Nuida |
Exponential Correlated Randomness Is Necessary in Communication-Optimal Perfectly Secure Two-Party Computation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 4th Conference on Information-Theoretic Cryptography, ITC 2023, June 6-8, 2023, Aarhus University, Aarhus, Denmark, pp. 18:1-18:16, 2023, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-271-6. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
32 | Cody Freitag, Ilan Komargodski |
The Cost of Statistical Security in Proofs for Repeated Squaring. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 4th Conference on Information-Theoretic Cryptography, ITC 2023, June 6-8, 2023, Aarhus University, Aarhus, Denmark, pp. 4:1-4:23, 2023, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-271-6. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
32 | Noam Mazor |
A Lower Bound on the Share Size in Evolving Secret Sharing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 4th Conference on Information-Theoretic Cryptography, ITC 2023, June 6-8, 2023, Aarhus University, Aarhus, Denmark, pp. 2:1-2:9, 2023, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-271-6. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
32 | Vipul Goyal, Chen-Da Liu-Zhang, Rafail Ostrovsky |
Asymmetric Multi-Party Computation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 4th Conference on Information-Theoretic Cryptography, ITC 2023, June 6-8, 2023, Aarhus University, Aarhus, Denmark, pp. 6:1-6:25, 2023, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-271-6. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
32 | Nils Fleischhacker, Suparno Ghoshal, Mark Simkin 0001 |
Interactive Non-Malleable Codes Against Desynchronizing Attacks in the Multi-Party Setting. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 4th Conference on Information-Theoretic Cryptography, ITC 2023, June 6-8, 2023, Aarhus University, Aarhus, Denmark, pp. 5:1-5:26, 2023, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-271-6. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
32 | Fabrice Benhamouda, Shai Halevi, Lev Stambler |
Weighted Secret Sharing from Wiretap Channels. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 4th Conference on Information-Theoretic Cryptography, ITC 2023, June 6-8, 2023, Aarhus University, Aarhus, Denmark, pp. 8:1-8:19, 2023, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-271-6. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
32 | Ivan Damgård, Daniel Escudero 0001, Antigoni Polychroniadou |
Phoenix: Secure Computation in an Unstable Network with Dropouts and Comebacks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 4th Conference on Information-Theoretic Cryptography, ITC 2023, June 6-8, 2023, Aarhus University, Aarhus, Denmark, pp. 7:1-7:21, 2023, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-271-6. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
32 | Samuel Bouaziz-Ermann, Alex B. Grilo, Damien Vergnaud |
Quantum Security of Subset Cover Problems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 4th Conference on Information-Theoretic Cryptography, ITC 2023, June 6-8, 2023, Aarhus University, Aarhus, Denmark, pp. 9:1-9:17, 2023, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-271-6. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
32 | Andrej Bogdanov |
Csirmaz's Duality Conjecture and Threshold Secret Sharing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 4th Conference on Information-Theoretic Cryptography, ITC 2023, June 6-8, 2023, Aarhus University, Aarhus, Denmark, pp. 3:1-3:6, 2023, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-271-6. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
32 | Hannah Keller, Claudio Orlandi, Anat Paskin-Cherniavsky, Divya Ravi |
MPC with Low Bottleneck-Complexity: Information-Theoretic Security and More. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 4th Conference on Information-Theoretic Cryptography, ITC 2023, June 6-8, 2023, Aarhus University, Aarhus, Denmark, pp. 11:1-11:22, 2023, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-271-6. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
32 | Mohammad Hajiabadi, Shahram Khazaei, Behzad Vahdani |
Randomness Recoverable Secret Sharing Schemes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 4th Conference on Information-Theoretic Cryptography, ITC 2023, June 6-8, 2023, Aarhus University, Aarhus, Denmark, pp. 12:1-12:25, 2023, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-271-6. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
32 | Justin Holmgren, Ruta Jawale |
Locally Covert Learning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 4th Conference on Information-Theoretic Cryptography, ITC 2023, June 6-8, 2023, Aarhus University, Aarhus, Denmark, pp. 14:1-14:12, 2023, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-271-6. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
32 | Amos Beimel |
Lower Bounds for Secret-Sharing Schemes for k-Hypergraphs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 4th Conference on Information-Theoretic Cryptography, ITC 2023, June 6-8, 2023, Aarhus University, Aarhus, Denmark, pp. 16:1-16:13, 2023, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-271-6. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
32 | Badih Ghazi, Ravi Kumar 0001, Pasin Manurangsi, Jelani Nelson, Samson Zhou |
Differentially Private Aggregation via Imperfect Shuffling. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 4th Conference on Information-Theoretic Cryptography, ITC 2023, June 6-8, 2023, Aarhus University, Aarhus, Denmark, pp. 17:1-17:22, 2023, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-271-6. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
32 | Nicolas Resch, Chen Yuan 0003 |
Two-Round Perfectly Secure Message Transmission with Optimal Transmission Rate. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 4th Conference on Information-Theoretic Cryptography, ITC 2023, June 6-8, 2023, Aarhus University, Aarhus, Denmark, pp. 1:1-1:20, 2023, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-271-6. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
|
32 | Ivan Damgård, Divya Ravi, Daniel Tschudi, Sophia Yakoubov |
Secure Communication in Dynamic Incomplete Networks. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 4th Conference on Information-Theoretic Cryptography, ITC 2023, June 6-8, 2023, Aarhus University, Aarhus, Denmark, pp. 13:1-13:21, 2023, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-271-6. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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32 | Mohammad Mahmoody, Wei Qi |
Online Mergers and Applications to Registration-Based Encryption and Accumulators. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: 4th Conference on Information-Theoretic Cryptography, ITC 2023, June 6-8, 2023, Aarhus University, Aarhus, Denmark, pp. 15:1-15:23, 2023, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 978-3-95977-271-6. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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32 | Suhasini Komarraju, Akhil Tammana, Chandramouli N. Amarnath, Abhijit Chatterjee |
OATT: Outlier Oriented Alternative Testing and Post-Manufacture Tuning of Mixed-Signal/RF Circuits and Systems. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 37-46, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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32 | Rasheed Kibria, Farimah Farahmandi, Mark M. Tehranipoor |
ARC-FSM-G: Automatic Security Rule Checking for Finite State Machine at the Netlist Abstraction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 320-329, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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32 | Anshuman Chandra, Moiz Khan, Ankita Patidar, Fumiaki Takashima, Sandeep Kumar Goel, Bharath Shankaranarayanan, Vuong Nguyen, Vistrita Tyagi, Manish Arora |
A Case Study on IEEE 1838 Compliant Multi-Die 3DIC DFT Implementation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 11-20, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
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32 | Ayush Arunachalam, Sanjay Das, Monikka Rajan, Fei Su, Xiankun Jin, Suvadeep Banerjee, Arnab Raha, Suriyaprakash Natarajan, Kanad Basu |
Enhanced ML-Based Approach for Functional Safety Improvement in Automotive AMS Circuits. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 266-275, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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32 | Kranthi Kandula, Ramalingam Kolisetti, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian |
SLM Subsystem for Automotive SoC: Case Study on Path Margin Monitor. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 388-392, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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32 | Saidapet Ramesh, Rahul Kalyan, Jesse Yanez, Andreas Glowatz, Maija Ryynänen, Sergej Schwarz |
Measuring Non-Redundant VIA Test-Coverage for Automotive Designs in Lower Process Nodes. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 286-292, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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32 | Francesco Lorenzelli, Asser Elsayed, Clement Godfrin, Alexander Grill, Stefan Kubicek, Ruoyu Li, Michele Stucchi, Danny Wan, Kristiaan De Greve, Erik Jan Marinissen, Georges G. E. Gielen |
Wafer-Scale Electrical Characterization of Silicon Quantum Dots from Room to Low Temperatures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 151-158, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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32 | Daehyun Chang, Youngdae Kim, Suksoo Pyo, Shin Hun, Daesop Lee, Sohee Hwang, Jaesik Choi, Siwoong Kim |
Algorithmic Read Resistance Trim for Improving Yield and Reducing Test Time in MRAM. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 87-92, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
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32 | Navajit Singh Baban, Ajymurat Orozaliev, Yong-Ak Song, Urbi Chatterjee, Sankalp Bose, Sukanta Bhattacharjee, Ramesh Karri, Krishnendu Chakrabarty |
Biochip-PUF: Physically Unclonable Function for Microfluidic Biochips. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 166-175, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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32 | Manoj Devendhiran, Jakub Janicki, Szczepan Urban, Manish Sharma, Jayant D'Souza |
Predicting the Resolution of Scan Diagnosis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 303-309, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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32 | Szczepan Urban, Piotr Zimnowlodzki, Manish Sharma, Shraddha Bodhe, John Schulze, Abdullah Yassine, Adam Styblinski |
Global Control Signal Defect Diagnosis in Volume Production Environment. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 65-70, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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32 | Yunfei Gu, Xingyu Wang, Zixiao Chen, Chentao Wu, Xinfei Guo, Jie Li 0002, Minyi Guo, Song Wu, Rong Yuan, Taile Zhang, Yawen Zhang, Haoran Cai |
Improving Productivity and Efficiency of SSD Manufacturing Self-Test Process by Learning-Based Proactive Defect Prediction. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 226-235, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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32 | Cyrille Dray, Khushal Gelda, Benoit Nadeau-Dostie, Wei Zou, Luc Romain, Jongsin Yun, Harshitha Kodali, Lori Schramm, Martin Keim |
Transitioning eMRAM from Pilot Project to Volume Production. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 82-86, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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32 | Yuxuan Yin, Rebecca Chen, Chen He, Peng Li |
Domain-Specific Machine Learning Based Minimum Operating Voltage Prediction Using On-Chip Monitor Data. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 99-104, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
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32 | Sicong Yuan, Z. Zhang, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, M. Taouil, Said Hamdioui |
Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 236-245, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
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32 | Arani Sinha, Glenn Colón-Bonet, Michael Fahy, Pankaj Pant, Haijing Mao, Akhilesh Shukla |
Maximizing Stress Coverage by Novel DFT Techniques and Relaxed Timing Closure. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 56-59, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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32 | Matthew Dupree, Min Jian Yang, Yueling Jenny Zeng, Li-C. Wang |
IEA-Plot: Conducting Wafer-Based Data Analytics Through Chat. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 122-131, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
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32 | Nadun Sinhabahu, Katherine Shu-Min Li, Sying-Jyan Wang, J. R. Wang, Matt Ho |
Machine-Learning Driven Sensor Data Analytics for Yield Enhancement of Wafer Probing. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 93-98, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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32 | Bharath Nandakumar, Sameer Chillarige |
Low cost production scan chain test for compression based designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 350-356, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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32 | Seyedeh Maryam Ghasemi, Sergej Meschkov, Jonas Krautter, Dennis R. E. Gnad, Mehdi B. Tahoori |
Enabling In-Field Parametric Testing for RISC-V Cores. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 367-376, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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32 | Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty |
Scan Cell Segmentation Based on Reinforcement Learning for Power-Safe Testing of Monolithic 3D ICs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 216-225, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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32 | Yu Li, Qiang Xu |
Towards Robust Deep Neural Networks Against Design-Time and Run-Time Failures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 196-205, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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32 | Sudhakar Kongala, Anuj Gupta, Yash Walia, Sahil Jain |
Novel Methodology to Optimize TAT and Resource Utilization for ATPG Simulations for Large SoCs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 60-64, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
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32 | Costas Argyrides, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian |
Utilizing ECC Analytics to Improve Memory Lifecycle Management. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 383-387, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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32 | Dhruv Thapar, Simon Thomann, Arjun Chaudhuri, Hussam Amrouch, Krishnendu Chakrabarty |
Analysis and Characterization of Defects in FeFETs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 256-265, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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32 | Ching-Min Liu, Chia-Heng Yen, Shu-Wen Lee, Kai-Chiang Wu, Mango Chia-Tso Chao |
Enhancing Good-Die-in-Bad-Neighborhood Methodology with Wafer-Level Defect Pattern Information. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 357-366, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
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32 | Yinxuan Lyu, Liangliang Yu, Pengju Li, Junlin Huang |
Logic Test Vehicles for High Resolution Diagnosis of Systematic FEOL/MEOL Yield Detractors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 117-121, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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32 | Sam M.-H. Hsiao, Amy H.-Y. Tsai, Lowry P.-T. Wang, Aaron C.-W. Liang, Charles H.-P. Wen, Herming Chiueh |
Preventing Single-Event Double-Node Upsets by Engineering Change Order in Latch Designs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 276-285, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
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32 | Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima, Oussama Laouamri, Naveen Khanna, Jeff Mayer, Nilanjan Mukherjee |
A New Framework for RTL Test Points Insertion Facilitating a "Shift-Left DFT" Strategy. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 1-10, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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32 | Irith Pomeranz |
Compaction of Functional Broadside Tests for Path Delay Faults Using Clusters of Propagation Lines. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 105-110, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
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32 | Seongkwan Lee, Minho Kang, Cheolmin Park, Jun Yeon Won, Jaemoo Choi |
Method for Adjusting Termination Resistance Using PMU in DC Test. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 77-81, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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32 | Zhe-Jia Liang, Yu-Tsung Wu, Yun-Feng Yang, James Chien-Mo Li, Norman Chang, Akhilesh Kumar, Ying-Shiun Li |
High-Speed, Low-Storage Power and Thermal Predictions for ATPG Test Patterns. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 206-215, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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32 | Dimitris Gizopoulos, George Papadimitriou 0001, Odysseas Chatzopoulos |
Estimating the Failures and Silent Errors Rates of CPUs Across ISAs and Microarchitectures. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 377-382, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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32 | Aswin R |
New Algorithm for Fast and Accurate Linearity Testing of High-Resolution SAR ADCs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 21-29, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
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32 | Ferhat Can Ataman, Y. B. Chethan Kumar, Sandeep Rao, Sule Ozev |
Improving Angle of Arrival Estimation Accuracy for mm-Wave Radars. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 30-36, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
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32 | Ryan Holzhausen, Tasnuva Farheen, Morgan Thomas, Nima Maghari, Domenic Forte |
Laser Fault Injection Vulnerability Assessment and Mitigation with Case Study on PG-TVD Logic Cells. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 330-339, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
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32 | Bing-Han Hsieh, Yun-Sheng Liu, James Chien-Mo Li, Chris Nigh, Mason Chern, Gaurav Bhargava |
Diagnosis of Systematic Delay Failures Through Subset Relationship Analysis. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 293-302, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
DBLP DOI BibTeX RDF |
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32 | Anuj Dubey, Aydin Aysu |
A Full-Stack Approach for Side-Channel Secure ML Hardware. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 186-195, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
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32 | Fernando Fernandes dos Santos, Luigi Carro, Paolo Rech |
Understanding and Improving GPUs' Reliability Combining Beam Experiments with Fault Simulation. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 176-185, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
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32 | Huaxiao Liang, Xiaoze Lin, Liyang Lai, Naixing Wang, Yu Huang, Fei Yang, Yuxin Yang |
GPU-Based Concurrent Static Learning. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 159-165, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
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32 | J. Lefevre, P. Debaud, P. Girard, Arnaud Virazel |
Predictor BIST: An "All-in-One" Optical Test Solution for CMOS Image Sensors. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 310-319, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
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32 | Hanzhi Xun, Sicong Yuan, Moritz Fieback, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui |
Device-Aware Test for Ion Depletion Defects in RRAMs. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 246-255, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
2023 |
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32 | Hanieh Jafarzadeh, Florian Klemme, Jan Dennis Reimer, Zahra Paria Najafi-Haghi, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich |
Robust Pattern Generation for Small Delay Faults Under Process Variations. ![Search on Bibsonomy](Pics/bibsonomy.png) |
ITC ![In: IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, pp. 111-116, 2023, IEEE, 979-8-3503-4325-0. The full citation details ...](Pics/full.jpeg) |
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