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Venues (Conferences, Journals, ...)
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GrowBag graphs for keyword ? (Num. hits/coverage)
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The graphs summarize 1928 occurrences of 678 keywords
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Results
Found 2033 publication records. Showing 2033 according to the selection in the facets
| Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
| 1 | Daniel Tille, Leon Klimasch, Sebastian Huhn 0001 |
A Novel LBIST Signature Computation Method for Automotive Microcontrollers using a Digital Twin.  |
VTS  |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Javad Bahrami, Mohammad Ebrahimabadi, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi |
Special Session: Security Verification & Testing for SR-Latch TRNGs. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Po-Yao Chuang, Francesco Lorenzelli, Sreejit Chakravarty, Cheng-Wen Wu, Georges G. E. Gielen, Erik Jan Marinissen |
Effective and Efficient Testing of Large Numbers of Inter-Die Interconnects in Chiplet-Based Multi-Die Packages. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Michele Portolan, Martin Keim, Jeff Rearick, Heiko Ehrenberg |
Refreshing the JTAG Family. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Bapi Vinnakota, Jaber Derakhshandeh, Eric Beyne, Erik Jan Marinissen, Sreejit Chakravarty |
IP Session on Chiplet: Design, Assembly, and Test. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Surendra Hemaram, Soyed Tuhin Ahmed, Mahta Mayahinia, Christopher Münch, Mehdi B. Tahoori |
A Low Overhead Checksum Technique for Error Correction in Memristive Crossbar for Deep Learning Applications. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Fabio Pavanello, Elena Ioana Vatajelu, Alberto Bosio, Thomas Van Vaerenbergh, Peter Bienstman, Benoît Charbonnier, Alessio Carpegna, Stefano Di Carlo, Alessandro Savino |
Special Session: Neuromorphic hardware design and reliability from traditional CMOS to emerging technologies. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Chin-Kuan Lin, Cheng-Che Lu, Shuo-Wen Chang, Ying-Hua Chu, Kai-Chiang Wu, Mango Chia-Tso Chao |
Outlier Detection for Analog Tests Using Deep Learning Techniques. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Gurumurti Kailaschandra Avhad, Shitin Sahu, Navaneeth Kumar |
Auxiliary State Machine Controlled Autonomous Design Verification Framework. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Fei Su, Xiankun Robert Jin, Nilanjan Mukherjee 0001, Yervant Zorian |
Innovation Practices Track: Silicon Lifecycle Management Challenges and Opportunities. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Adit D. Singh, Sreejit Chakravarty, George Papadimitriou 0001, Dimitris Gizopoulos |
Silent Data Errors: Sources, Detection, and Modeling. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Mohammad Hasan Ahmadilivani, Mario Barbareschi, Salvatore Barone, Alberto Bosio, Masoud Daneshtalab, Salvatore Della Torca, Gabriele Gavarini, Maksim Jenihhin, Jaan Raik, Annachiara Ruospo, Ernesto Sánchez 0001, Mahdi Taheri |
Special Session: Approximation and Fault Resiliency of DNN Accelerators. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | V. A. Niranjan, Deepika Neethirajan, Constantinos Xanthopoulos, D. Webster, Amit Nahar, Yiorgos Makris |
Machine Learning-Based Adaptive Outlier Detection for Underkill Reduction in Analog/RF IC Testing. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Jackson Fugate, Greg Stitt, Naren Vikram Raj Masna, Aritra Dasgupta, Swarup Bhunia, Nij Dorairaj, David Kehlet |
An Exploration of ATPG Methods for Redacted IP and Reconfigurable Hardware. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Gooyoung Kim, Youngseon Moon, Jongmin Kim, Jaeyong Jeong, Eun-Kyoung Kim, Sunghoi Hur |
Kernel Smoothing Technique Based on Multiple-Coordinate System for Screening Potential Failures in NAND Flash Memory. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Ahmet Enis Çetin, Hongyi Pan |
Hybrid Binary Neural Networks: A Tutorial Review. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Artur Ghukasyan, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian |
Overcoming Embedded Memory Test & Repair Challenges in the Gate-All-Around Era. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty |
Special Session: Using Graph Neural Networks for Tier-Level Fault Localization in Monolithic 3D ICs *. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Yu-Min Li, Cheng-Yun Hsieh, Yen-Wei Li, James Chien-Mo Li |
Diagnosis of Quantum Circuits in the NISQ Era. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Ian Hill, André Ivanov |
Gerabaldi: A Temporal Simulator for Probabilistic IC Degradation and Failure Processes. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Irith Pomeranz |
Expanding a Pool of Functional Test Sequences to Support Test Compaction. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Lilas Alrahis, Ozgur Sinanoglu |
Graph Neural Networks for Hardware Vulnerability Analysis - Can you Trust your GNN? |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Fei Su, Meirav Nitzan, Ankush Sethi, Vaibhav Kumar, Dan Alexandrescu |
Innovation Practices Track: VLSI Functional Safety. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Subashini Gopalsamy, Irith Pomeranz |
Fully Deterministic Storage Based Logic Built-In Self-Test. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Fei Su, Marc Hunter, Chen He, Sashi Obilisetty |
Innovation Practices Track: Innovation on Telemetry Monitoring. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Vinay Kumar, Bhrugurajsinh Chudasama, Bin B. W. Wang, Manish Arora, Bharath Shankaranarayanan |
Allocating Physically Aware Embedded Memory Test & Repair Processor using Floorplan Info at the RTL Design Level. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Mingye Li, Yunkun Lin, Sandeep Gupta 0001 |
Design for testability (DFT) for RSFQ circuits. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Francesco Angione, Paolo Bernardi, Nicola Di Gruttola Giardino, Davide Appello, Claudia Bertani, Vincenzo Tancorre |
A guided debugger-based fault injection methodology for assessing functional test programs. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Judy Amanor-Badu, Ritchie Rice, Azizi Shuma, Rishik Bazaz, Horthense Tamdem |
Pre and post silicon server platform transient performance using trans-inductor voltage regulator. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Mridha Md Mashahedur Rahman, M. Sazadur Rahman, Rasheed Kibria, Mike Borza, Bandy Reddy, Adam Cron, Fahim Rahman, Mark M. Tehranipoor, Farimah Farahmandi |
CAPEC: A Cellular Automata Guided FSM-based IP Authentication Scheme. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | |
41st IEEE VLSI Test Symposium, VTS 2023, San Diego, CA, USA, April 24-26, 2023 |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Yu-Teng Nien, Chen-Hong Li, Pei-Yin Wu, Yung-Jheng Wang, Kai-Chiang Wu, Mango C.-T. Chao |
Test Generation for Defect-Based Faults of Scan Flip-Flops. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Keqing Ouyang, Minqiang Peng, Yunnong Zhu, Kang Qi, Grigor Tshagharyan, Arun Kumar, Gurgen Harutyunyan, Isaac Wang |
An Efficient External Memory Test Solution: Case Study for HPC Application. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Saidapet Ramesh, Kristofor Dickson, Akshay Jaiswal, Robert Marchese, Kiran Sunny Thota |
Targeted Custom High-Voltage Stress Patterns on Automotive Designs. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Chun Chen, Jeng-Yu Liao, James Chien-Mo Li, Harry H. Chen, Eric Jia-Wei Fang |
Vmin Prediction Using Nondestructive Stress Test. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Sohrab Aftabjahani, Mark M. Tehranipoor, Farimah Farahmandi, Bulbul Ahmed, Ryan Kastner, Francesco Restuccia 0002, Andres Meza 0001, Kaki Ryan, Nicole Fern, Jasper Van Woudenberg, Rajesh Velegalati, Cees-Bart Breunesse, Cynthia Sturton, Calvin Deutschbein |
Special Session: CAD for Hardware Security - Promising Directions for Automation of Security Assurance. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Leon Li, Alex Orailoglu |
Thwarting Reverse Engineering Attacks through Keyless Logic Obfuscation. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Gauri Koli, Liam Nguyen, Jennifer Kitchen |
Architectural Radiation Hardening of CMOS Power Management Circuits through Bias Tuning. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Fei Su, Eric Zhang, Arjun Chaudhuri, Michael Paulitsch |
Innovation Practices Track: Testability and Dependability of AI Hardware and Autonomous Systems. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Irith Pomeranz |
Compact Set of Functional Broadside Tests with Fault Detection on Primary Outputs. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Arjun Chaudhuri, Ching-Yuan Chen, Jonti Talukdar, Krishnendu Chakrabarty |
Functional Test Generation for AI Accelerators using Bayesian Optimization∗. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Mikail Yayla, Simon Thomann, Md. Mazharul Islam 0006, Ming-Liang Wei, Shu-Yin Ho, Ahmedullah Aziz, Chia-Lin Yang, Jian-Jia Chen, Hussam Amrouch |
Reliable Brain-inspired AI Accelerators using Classical and Emerging Memories. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Mohammad Ershad Shaik, Abhishek Kumar Mishra, Yonghyun Kim |
Predicting the Silent Data Error Prone Devices Using Machine Learning. |
VTS |
2023 |
DBLP DOI BibTeX RDF |
|
| 1 | Sahil Shah, Jennifer Blain Christen |
Special Session: Calibrating mismatch in an ISFET with a Floating-Gate. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Arani Sinha |
Innovative Practices Track: Silent Data Errors. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Jerin Joe, Nilanjan Mukherjee 0001, Irith Pomeranz, Janusz Rajski |
Fast Test Generation for Structurally Similar Circuits. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Rubin A. Parekhji |
Innovative Practices Track: New Methods for System Level Test of Image Projection and Radar VLSI Systems. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Minqiang Peng, Youfa Wu, Jialiang Li, Alex Yu, Grigor Tshagharyan, Costas Argyrides, Vilas Sridharan, Gurgen Harutyunyan, Yervant Zorian, Nilanjan Mukherjee |
Innovative Practices Track: What's Next for Automotive: Where and How to Improve Field Test and Enhance SoC Safety. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Sreejit Chakravarty |
Special Session: A Call to Standardize Chip-let Interconnect Testing. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Mingye Li, Fangzhou Wang, Sandeep Gupta 0001 |
Methods for testing path delay and static faults in RSFQ circuits. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Shail Dave, Alberto Marchisio, Muhammad Abdullah Hanif, Amira Guesmi, Aviral Shrivastava, Ihsen Alouani, Muhammad Shafique 0001 |
Special Session: Towards an Agile Design Methodology for Efficient, Reliable, and Secure ML Systems. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Baishakhi Rani Biswas, Sandeep Gupta 0001 |
Memristor-Specific Failures: New Verification Methods and Emerging Test Problems. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Bala Tarun Nelapatla, Rahul Singhal, Michael Daub, Zoran Stanojevics |
Innovative Practices Track: High Speed Test Fabric. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Debarshi Chatterjee, Parth Lathigara, Siddhanth Dhodhi, Chad Parsons |
FIFO Topology Aware Stalling for Accelerating Coverage Convergence of Stalling Regressions. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Sankaran M. Menon, Rolf Kühnis |
Special Session: Closed Chassis Platform Debug of Compute Systems using the Functional Ubiquitous USB Type-C Receptacle. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Fei Su, Stephen Crosher, Andrea Matteucci, Yuwen Zou |
Innovation Practices Track: Silicon Telemetry for Dependability. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Mona Ganji, Marampally Saikiran, Degang Chen 0001 |
All Digital Low-Overhead SAR ADC Built-In Self-Test for Fault Detection and Diagnosis. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Anteneh Gebregiorgis, Lizhou Wu, Christopher Münch, Siddharth Rao, Mehdi B. Tahoori, Said Hamdioui |
Special Session: STT-MRAMs: Technology, Design and Test. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Aibin Yan, Kuikui Qian, Jie Cui 0004, Ningning Cui, Zhengfeng Huang, Xiaoqing Wen, Patrick Girard 0001 |
A Highly Reliable and Low Power RHBD Flip-Flop Cell for Aerospace Applications. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Soyed Tuhin Ahmed, Mehdi B. Tahoori |
Fault-tolerant Neuromorphic Computing with Functional ATPG for Post-manufacturing Re-calibration. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Ziqi Zhou, Ujjwal Guin, Peng Li, Vishwani D. Agrawal |
Fault Modeling and Test Generation for Technology-Specific Defects of Skyrmion Logic Circuits. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi 0001, Degang Chen 0001 |
The Least-Squares Approach to Systematic Error Identification and Calibration in Semiconductor Multisite Testing. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Jennifer Hasler |
Special Session: Testing and Characterization for Large-Scale Programmable Analog Systems. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Daniel W. Gulick, Yuna Jung, Seunghyun Lee, Sule Ozev, Jennifer Blain Christen |
Exploring Model-based Failure Prediction of Passive Bio-electro-mechanical Implants. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Gang Qu 0001, Benjamin Tan 0001, Kuheli Pratihar, Debdeep Mukhopadhyay, Ramesh Karri |
Innovation Practices Track: Security in Test and Test for Security. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Nitin Chaudhary |
Innovative Practices Track: Novel Methods for Validation and Test. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Vineet Pancholi |
Special Session: Test Impact of Multi-Die Packages. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Christopher Münch, Jongsin Yun, Martin Keim, Mehdi B. Tahoori |
MBIST-based Trim-Search Test Time Reduction for STT-MRAM. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Juan-David Guerrero-Balaguera, Josie E. Rodriguez Condia, Matteo Sonza Reorda |
A New Method to Generate Software Test Libraries for In-Field GPU Testing Resorting to High-Level Languages. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Sandeep Kumar Goel, Sandeep Pendharkar, Chunsheng Liu |
Innovative Practices Track: Test of 3D ICs & Chiplets. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Marcel Merten, Sebastian Huhn 0001, Rolf Drechsler |
A Hardware-based Evolutionary Algorithm with Multi-Objective Optimization Operators for On-Chip Transient Fault Detection. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Amit Pandey, Brendan Tully, Abhijeet Samudra, Ajay Nagarandal, Karthikeyan Natarajan, Rahul Singhal |
Novel Technique for Manufacturing & In-system Testing of Large Scale SoC using Functional Protocol Based High-Speed I/O. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Muslum Emir Avci, Sule Ozev, Y. B. Chethan Kumar |
Fast RF Mismatch Calibration Using Built-in Detectors. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Arjun Chaudhuri, Jonti Talukdar, Krishnendu Chakrabarty |
Special Session: Fault Criticality Assessment in AI Accelerators. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Mahta Mayahinia, Atousa Jafari, Mehdi B. Tahoori |
Voltage Tuning for Reliable Computation in Emerging Resistive Memories. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Rasheed Kibria, Nusrat Farzana, Farimah Farahmandi, Mark M. Tehranipoor |
FSMx: Finite State Machine Extraction from Flattened Netlist With Application to Security. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Ho-Chieh Hsu, Cheng-Che Lu, Shih-Wei Wang, Kelly Jones, Kai-Chiang Wu, Mango C.-T. Chao |
Rule Generation for Classifying SLT Failed Parts. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Deepika Neethirajan, V. A. Niranjan, Richard Willis, Amit Nahar, D. Webster, Yiorgos Makris |
Machine Learning-Based Overkill Reduction through Inter-Test Correlation. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Chris Mangelsdorf, Manasa Madhvaraj, Salvador Mir, Manuel J. Barragán, Daisuke Iimori, Takayuki Nakatani, Shogo Katayama, Gaku Ogihara, Yujie Zhao, Jianglin Wei, Anna Kuwana, Kentaroh Katoh, Kazumi Hatayama, Haruo Kobayashi 0001, Keno Sato, Takashi Ishida 0003, Toshiyuki Okamoto, Tamotsu Ichikawa |
Innovative Practices Track: Innovative Analog Circuit Testing Technologies. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Antonios Pavlidis, Eric Faehn, Marie-Minerve Louërat, Haralampos-G. Stratigopoulos |
Run-Time Hardware Trojan Detection in Analog and Mixed-Signal ICs. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Mahmut Yilmaz, Pavan Kumar Datla Jagannadha, Kaushik Narayanun, Shantanu Sarangi, Francisco Da Silva, Joe Sarmiento, Smbat Tonoyan, Ashwin Chintaluri, Animesh Khare, Milind Sonawane, Ashish Kumar, Anitha Kalva, Alex Hsu, Jayesh Pandey |
NVIDIA MATHS: Mechanism to Access Test-Data over High-Speed Links. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Renjian Pan, Xin Li 0001, Krishnendu Chakrabarty |
Semi-Supervised Root-Cause Analysis with Co-Training for Integrated Systems. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Abram Detofsky |
Special Session: A Testability Practitioner's Guide to Chiplets. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Bora Bilgic, Sule Ozev |
Performance Degradation Monitoring for Analog Circuits Using Lightweight Built-in Components. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Shamik Kundu, Suvadeep Banerjee, Arnab Raha, Kanad Basu |
Special Session: Effective In-field Testing of Deep Neural Network Hardware Accelerators. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Seyed Nima Mozaffari, Bonita Bhaskaran, Shantanu Sarangi, Suhas M. Satheesh, Kuo Lin Fu, Nithin Valentine, P. Manikandan, Mahmut Yilmaz |
On-Die Noise Measurement During Automatic Test Equipment (ATE) Testing and In-System-Test (IST). |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Arani Sinha |
Innovative Practices Track: Next Generation Test Standards. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Cheng Liu 0008, Zhen Gao, Siting Liu 0001, Xuefei Ning, Huawei Li 0001, Xiaowei Li 0001 |
Special Session: Fault-Tolerant Deep Learning: A Hierarchical Perspective. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Riccardo Cantoro, Francesco Garau, Riccardo Masante, Sandro Sartoni, Virendra Singh, Matteo Sonza Reorda |
Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Mehdi Sadi, Yi He 0010, Yanjing Li, Mahabubul Alam, Satwik Kundu, Swaroop Ghosh, Javad Bahrami, Naghmeh Karimi |
Special Session: On the Reliability of Conventional and Quantum Neural Network Hardware. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Shi-Xuan Zheng, Chung-Yu Yeh, Kuen-Jong Lee, Chen Wang 0014, Wu-Tung Cheng, Mark Kassab, Janusz Rajski, Sudhakar M. Reddy |
Accurate Estimation of Test Pattern Counts for a Wide-Range of EDT Input/Output Channel Configurations. |
VTS |
2022 |
DBLP DOI BibTeX RDF |
|
| 1 | Soham Roy, Spencer K. Millican, Vishwani D. Agrawal |
Special Session - Machine Learning in Test: A Survey of Analog, Digital, Memory, and RF Integrated Circuits. |
VTS |
2021 |
DBLP DOI BibTeX RDF |
|
| 1 | Natalia Lylina, Ahmed Atteya, Hans-Joachim Wunderlich |
A Hybrid Protection Scheme for Reconfigurable Scan Networks. |
VTS |
2021 |
DBLP DOI BibTeX RDF |
|
| 1 | Hussam Amrouch, Animesh Basak Chowdhury, Wentian Jin, Ramesh Karri, Farshad Khorrami, Prashanth Krishnamurthy, Ilia Polian, Victor M. van Santen, Benjamin Tan 0001, Sheldon X.-D. Tan |
Special Session: Machine Learning for Semiconductor Test and Reliability. |
VTS |
2021 |
DBLP DOI BibTeX RDF |
|
| 1 | Elham Amini, Kai Bartels, Christian Boit, Marius Eggert, Norbert Herfurth, Tuba Kiyan, Thilo Krachenfels, Jean-Pierre Seifert, Shahin Tajik |
Special Session: Physical Attacks through the Chip Backside: Threats, Challenges, and Opportunities. |
VTS |
2021 |
DBLP DOI BibTeX RDF |
|
| 1 | Jinhua Zhu, Zhen Gao 0005, Jie Jin, Pedro Reviriego |
Reliability Evaluation of the Count Min Sketch (CMS) against Single Event Transients (SETs). |
VTS |
2021 |
DBLP DOI BibTeX RDF |
|
| 1 | Simon Thomann, Chao Li 0065, Cheng Zhuo, Om Prakash 0007, Xunzhao Yin, Xiaobo Sharon Hu, Hussam Amrouch |
On the Reliability of In-Memory Computing: Impact of Temperature on Ferroelectric TCAM. |
VTS |
2021 |
DBLP DOI BibTeX RDF |
|
| 1 | Xingyi Wang, Yu Li 0007, Yiquan Chen, Shiwen Wang, Yin Du, Cheng He, Yuzhong Zhang, Pinan Chen, Xin Li, Wenjun Song, Qiang Xu 0001, Li Jiang 0002 |
On Workload-Aware DRAM Failure Prediction in Large-Scale Data Centers. |
VTS |
2021 |
DBLP DOI BibTeX RDF |
|
| 1 | Sebastian Brandhofer, Simon J. Devitt, Thomas Wellens, Ilia Polian |
Special Session: Noisy Intermediate-Scale Quantum (NISQ) Computers - How They Work, How They Fail, How to Test Them? |
VTS |
2021 |
DBLP DOI BibTeX RDF |
|
| 1 | Emmanuel Casseau, Petr Dobiás, Oliver Sinnen, Gennaro Severino Rodrigues, Fernanda Lima Kastensmidt, Alessandro Savino, Stefano Di Carlo, Maurizio Rebaudengo, Alberto Bosio |
Special Session: Operating Systems under test: an overview of the significance of the operating system in the resiliency of the computing continuum. |
VTS |
2021 |
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