Search results for "IRPS"

Hits ?▲	Authors	Title	Venue	Year	Link
1	Javier Martín-Martínez, Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Rosana Rodríguez, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández 0001, Montserrat Nafría	Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability.	IRPS	2023	DBLP DOI BibTeX RDF
1	Zhan Gao, Francesca Chiocchetta, Fabiana Rampazzo, Carlo De Santi, Mirko Fornasier, Gaudenzio Meneghesso, Matteo Meneghini, Enrico Zanoni	Thermally-activated failure mechanisms of 0.25 \ \mu \mathrm{m}$ RF AIGaN/GaN HEMTs submitted to long-term life tests.	IRPS	2023	DBLP DOI BibTeX RDF
1	H. Takahashi, Y. Okamoto, Toshiki Hamada, Yusuke Komura, S. Watanabe, K. Tsuda, H. Sawai, Takanori Matsuzaki, Yoshinori Ando, Tatsuya Onuki, Hitoshi Kunitake, Shunpei Yamazaki, D. Kobayashi, A. Ikuta, Takahiro Makino, Takeshi Ohshima	Soft- and Hard-Error Radiation Reliability of 228 KB $3\mathrm{T}+1\mathrm{C}$ Oxide Semiconductor Memory.	IRPS	2023	DBLP DOI BibTeX RDF
1	Yoni Xiong, Yueh Chiang, Nicholas J. Pieper, Dennis R. Ball, Bharat L. Bhuva	Soft Error Rate Predictions for Terrestrial Neutrons at the 3-nm Bulk FinFET Technology.	IRPS	2023	DBLP DOI BibTeX RDF
1	Patrick M. Lenahan, E. B. Frantz, Sean W. King, Mark A. Anders 0002, S. J. Moxim, James P. Ashton, Kyle J. Myers, M. E. Flatté, N. J. Harmon	Near Zero Field Magnetoresistance Spectroscopy: A New Tool in Semiconductor Reliability Physics.	IRPS	2023	DBLP DOI BibTeX RDF
1		IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023	IRPS	2023	DBLP DOI BibTeX RDF
1	Luca Laurin, Matteo Baldo, Elisa Petroni, Giulia Samanni, Lorenzo Turconi, A. Motta, Massimo Borghi, A. Serafini, D. Codegoni, M. Scuderi, S. Ran, A. Claverie, Daniele Ielmini, Roberto Annunziata, Andrea Redaelli	Unveiling Retention Physical Mechanism of Ge-rich GST ePCM Technology.	IRPS	2023	DBLP DOI BibTeX RDF
1	Lina Qu, Shengwei Yang, Ming He, Rui Fang, Xiaojuan Zhu, Kun Han, Yi He	Polarity Dependency and 1/E Model of Gate Oxide TDDB Degradation in 3D NAND.	IRPS	2023	DBLP DOI BibTeX RDF
1	Rahim Kasim, Cheyun Lin, Christopher Perini, James Palmer, N. Gilda, S. Imam, Justin R. Weber, C. Wallace, Jeffery Hicks	Reliability Modeling of Middle-Of-Line Interconnect Dielectrics in Advanced process nodes.	IRPS	2023	DBLP DOI BibTeX RDF
1	Maximilian W. Feil, Katja Waschneck, Hans Reisinger, Judith Berens, Thomas Aichinger, Paul Salmen, Gerald Rescher, Wolfgang Gustin, Tibor Grasser	Towards Understanding the Physics of Gate Switching Instability in Silicon Carbide MOSFETs.	IRPS	2023	DBLP DOI BibTeX RDF
1	Takuya Wadatsumi, Kohei Kawai, Rikuu Hasegawa, Kazuki Monta, Takuji Miki, Makoto Nagata	Characterization of Backside ESD Impacts on Integrated Circuits.	IRPS	2023	DBLP DOI BibTeX RDF
1	Dongyoung Kim, Skylar DeBoer, Stephen A. Mancini, Sundar Babu Isukapati, Justin Lynch, Nick Yun, Adam J. Morgan, Seung Yup Jang, Woongje Sung	Static, Dynamic, and Short-circuit Characteristics of Split-Gate 1.2 kV 4H-SiC MOSFETs.	IRPS	2023	DBLP DOI BibTeX RDF
1	Joseph B. Bernstein, Emmanuel Bender, Alain Bensoussan 0002	The Correct Hot Carrier Degradation Model.	IRPS	2023	DBLP DOI BibTeX RDF
1	Akira Goda, Kishore Kumar Muchherla, Peter Feeley	Reliability of 3D NAND Flash for Future Storage Systems (Invited).	IRPS	2023	DBLP DOI BibTeX RDF
1	Fengkai Liu, Lei Wu, Kai Wang, Enhao Guan, Xingji Li	Effect of Precursor Defects in Oxide Layer on Ionizing Radiation Damage of Bipolar Junction Transistors.	IRPS	2023	DBLP DOI BibTeX RDF
1	Anand Kumar Rai, Harsha B. Variar, Mayank Shrivastava	Circuit Reliability of $\text{MoS}_{2}$ Channel Based 2D Transistors.	IRPS	2023	DBLP DOI BibTeX RDF
1	Y. L. Chou, W. J. Tsai, G. W. Wu, W. Chang, T. C. Lu, K. C. Chen, C. Y. Lu	A Novel Data Recovery Technique for 3D TLC NAND Flash Memory Using Intercell Program.	IRPS	2023	DBLP DOI BibTeX RDF
1	Seongkyung Kim, Hyerim Park, Eunyu Choi, Young Han Kim, Dahyub Kim, Hyewon Shim, Shin-Young Chung, Paul Jung	Reliability Assessment of 3nm GAA Logic Technology Featuring Multi-Bridge-Channel FETs.	IRPS	2023	DBLP DOI BibTeX RDF
1	Joost Melai, V. Subramanian, I. Pouwel	Impact of Process Variation on MIM Capacitor Lifetime.	IRPS	2023	DBLP DOI BibTeX RDF
1	Ayumu Yamada, Naoko Misawa, Chihiro Matsui, Ken Takeuchi	ReRAM CiM Fluctuation Pattern Classification by CNN Trained on Artificially Created Dataset.	IRPS	2023	DBLP DOI BibTeX RDF
1	Stéphane Moreau, David Bouchu, J. Jourdon, Bassel Ayoub, S. Lhostis, Hélène Frémont, P. Lamontagne	Recent Advances on Electromigration in Cu/SiO2 to Cu/SiO2 Hybrid Bonds for 3D Integrated Circuits.	IRPS	2023	DBLP DOI BibTeX RDF
1	Satendra Kumar Gautam, Harsha B. Variar, Juan Luo, Ning Shi, David Marreiro, Shekar Mallikarjunaswamy, Mayank Shrivastava	3D Approaches to Engineer Holding Voltage of SCR.	IRPS	2023	DBLP DOI BibTeX RDF
1	Vladislav A. Vashchenko, H. Sarbishaei	Voltage Acceleration of Power NLDMOS Hot Carrier Degradation.	IRPS	2023	DBLP DOI BibTeX RDF
1	Hsi-Yu Kuo, Yu-Lin Chu, Hung-Da Dai, Chun-Chi Wang, Pei-Jung Lin, Ethan Guo, Yu-Ti Su, Chia-Lin Hsu, Kuan-Hung Chen, Tsung-Yuan Chen, Ryan Lu, Victor Liang, Kuo-Ji Chen, Kejun Xia	Protection Schemes for Plasma Induced Damage from Well-Side Antennas.	IRPS	2023	DBLP DOI BibTeX RDF
1	B. Tolleson, Christopher H. Bennett, T. Patrick Xiao, Donald Wilson, Jesse Short, J. Kim, David R. Hughart, Nad Gilbert, Sapan Agarwal, Hugh J. Barnaby, Matthew J. Marinella	TID Response of an Analog In-Memory Neural Network Accelerator.	IRPS	2023	DBLP DOI BibTeX RDF
1	Sunil Rathore, Rajeewa Kumar Jaisawal, P. N. Kondekar, Navneet Gandhi, Shashank Banchhor, Young Suh Song, Navjeet Bagga	Self-Heating Aware Threshold Voltage Modulation Conforming to Process and Ambient Temperature Variation for Reliable Nanosheet FET.	IRPS	2023	DBLP DOI BibTeX RDF
1	Chi-Wei Wang, Che-Pei Chang, Chang-Chun Lee	Demonstration on Warpage Estimation Approach Utilized in Fan-Out Panel-Level Packaging Enabled by Multi-Scale Process-Oriented Simulation.	IRPS	2023	DBLP DOI BibTeX RDF
1	Y. H. Liu, T. C. Zhan, Y. S. Yang, C. C. Hsu, A. C. Liu, W. Lin	Impact of Trapped Charge Vertical Loss and Lateral Migration on Lifetime Estimation of 3-D NAND Flash Memories.	IRPS	2023	DBLP DOI BibTeX RDF
1	Ivana Kovacevic-Badstuebner, Salvatore Race, Ulrike Grossner, Elena Mengotti, Christoph Kenel, Enea Bianda, Joni P. A. Jormanainen	Extended Analysis of Power Cycling Behavior of TO-Packaged SiC Power MOSFETs.	IRPS	2023	DBLP DOI BibTeX RDF
1	Yong Hyeon Yi, Chris H. Kim, Chen Zhou, Armen Kteyan, Valeriy Sukharev	Studying the Impact of Temperature Gradient on Electromigration Lifetime Using a Power Grid Test Structure with On-Chip Heaters.	IRPS	2023	DBLP DOI BibTeX RDF
1	E. Murakami, T. Takeshita, K. Oda, M. Kobayashi, K. Asayama, M. Okamoto	Classification of Commercial SiC-MOSFETs Based on Time-Dependent Gate-current Characteristics.	IRPS	2023	DBLP DOI BibTeX RDF
1	S. Lee, N.-H. Lee, K. W. Lee, J. H. Kim, J. H. Jin, Y. S. Lee, Y. C. Hwang, H. S. Kim, S. Pae	Development and Product Reliability Characterization of Advanced High Speed 14nm DDR5 DRAM with On-die ECC.	IRPS	2023	DBLP DOI BibTeX RDF
1	Limeng Shi, Shengnan Zhu, Jiashu Qian, Michael Jin, Monikuntala Bhattacharya, Marvin H. White, Anant K. Agarwal, Atsushi Shimbori, Tianshi Liu	Investigation of different screening methods on threshold voltage and gate oxide lifetime of SiC Power MOSFETs.	IRPS	2023	DBLP DOI BibTeX RDF
1	Daniel Christopher Worledge	Write-error-rate of Spin-Transfer-Torque MRAM (Invited).	IRPS	2023	DBLP DOI BibTeX RDF
1	Md. Asaduz Zaman Mamun, Amar Mavinkurve, Michiel van Soestbergen, Muhammad Ashraful Alam	Transient Leakage Current as a Non-destructive Probe of Wire-bond Electrochemical Failures.	IRPS	2023	DBLP DOI BibTeX RDF
1	Tidjani Garba-Seybou, Xavier Federspiel, Frederic Monsieur, Mathieu Sicre, Florian Cacho, Joycelyn Hai, Alain Bravaix	Location of Oxide Breakdown Events under Off-state TDDB in 28nm N-MOSFETs dedicated to RF applications.	IRPS	2023	DBLP DOI BibTeX RDF
1	Elisa Vitanza, C. Realmuto, M. La Marca, L. Torrisi	Backside Failure Analysis of IGBT power devices assembled in STPAK.	IRPS	2023	DBLP DOI BibTeX RDF
1	Anirban Bandyopadhyay	Differentiated Silicon Technologies for mmwave 5G and 6G applications (Invited).	IRPS	2023	DBLP DOI BibTeX RDF
1	Tomasz Brozek, Alberto A. P. Cattaneo, Larg Weiland, Michele Quarantelli, Alberto Coccoli, Sharad Saxena, Christopher Hess, Andrzej J. Strojwas	In-Product BTI Aging Sensor for Reliability Screening and Early Detection of Material at Risk.	IRPS	2023	DBLP DOI BibTeX RDF
1	M. Jamil, S. Mukhopadhay, M. Ghoneim, A. Shailos, Chetan Prasad, Inanc Meric, Stephen Ramey	Reliability Studies on Advanced FinFET Transistors of the Intel 4 CMOS Technology.	IRPS	2023	DBLP DOI BibTeX RDF
1	Erik Bury, Michiel Vandemaele, Jacopo Franco, Adrian Chasin, Stanislav Tyaginov, A. Vandooren, Romain Ritzenthaler, Hans Mertens, Javier Diaz-Fortuny, N. Horiguchi, Dimitri Linten, Ben Kaczer	Reliability challenges in Forksheet Devices: (Invited Paper).	IRPS	2023	DBLP DOI BibTeX RDF
1	Davide Favero, A. Cavaliere, Carlo De Santi, Matteo Borga, W. Gonçalez Filho, Karen Geens, Benoit Bakeroot, Stefaan Decoutere, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini	High- Temperature PBTI in Trench-Gate Vertical GaN Power MOSFETs: Role of Border and Semiconductor Traps.	IRPS	2023	DBLP DOI BibTeX RDF
1	Harsh Raj, Vipin Joshi, Rajarshi Roy Chaudhuri, Rasik Rashid Malik, Mayank Shrivastava	Physical Insights into the DC and Transient Reverse Bias Reliability of β-Ga2O3 Based Vertical Schottky Barrier Diodes.	IRPS	2023	DBLP DOI BibTeX RDF
1	Hui Wang, Pengyu Lai, Zhong Chen	Current Injection Effect on ESD Behaviors of the Parasitic Bipolar Transistors inside P+/N-well diode.	IRPS	2023	DBLP DOI BibTeX RDF
1	Y. H. Lin, C. C. Lee, C. Y. Liao, M. H. Lin, W. C. Tu, Robin Chen, H. P. Chen, Winston S. Shue, Min Cao	A Novel Methodology to Predict Process-Induced Warpage in Advanced BEOL Interconnects.	IRPS	2023	DBLP DOI BibTeX RDF
1	D. Lipp, Z. Zhao, G. Krause, Wafa Arfaoui, Elodie Ebrard, Germain Bossu, S. Evseev, Markus Herklotz, Mahesh Siddabathula	Excellent Reliability performances of a truly 5V nBOXFET for Automotive and IOT applications.	IRPS	2023	DBLP DOI BibTeX RDF
1	Valentina Meli, Gabriele Navarro, J. Rottner, Niccolo Castellani, S. Martin, N. P. Tran, Guillaume Bourgeois, C. Sabbione, Marie Claire Cyrille	Multi Level Cell Reliability in Ge-rich GeSbTe-based Phase Change Memory Arrays.	IRPS	2023	DBLP DOI BibTeX RDF
1	Mehak Ashraf Mir, Vipin Joshi, Rajarshi Roy Chaudhuri, Mohammad Ateeb Munshi, Rasik Rashid Malik, Mayank Shrivastava	Dynamic Interplay of Surface and Buffer Traps in Determining Drain Current Injection induced Device Instability in OFF-state of AlGaN/GaN HEMTs.	IRPS	2023	DBLP DOI BibTeX RDF
1	A. S. Saleh, Houman Zahedmanesh, Hajdin Ceric, Ingrid De Wolf, Kris Croes	Impact of via geometry and line extension on via-electromigration in nano-interconnects.	IRPS	2023	DBLP DOI BibTeX RDF
1	Andrea Vici, Robin Degraeve, Philippe J. Roussel, Jacopo Franco, Ben Kaczer, Ingrid De Wolf	Analysis of TDDB lifetime projection in low thermal budget HfO2/SiO2 stacks for sequential 3D integrations.	IRPS	2023	DBLP DOI BibTeX RDF
1	S. Mukhopadhyay, C. Chen, M. Jamil, Jihan Standfest, Inanc Meric, Balkaran Gill, Stephen Ramey	A Unified Aging Model Framework Capturing Device to Circuit Degradation for Advance Technology Nodes.	IRPS	2023	DBLP DOI BibTeX RDF
1	Victor M. van Santen, Jose M. Gata-Romero, Juan Núñez 0002, Rafael Castro-López, Elisenda Roca, Hussam Amrouch	Characterizing BTI and HCD in 1.2V 65nm CMOS Oscillators made from Combinational Standard Cells and Processor Logic Paths.	IRPS	2023	DBLP DOI BibTeX RDF
1	Dishant Sangani, Javier Diaz-Fortuny, Erik Bury, Ben Kaczer, Georges G. E. Gielen	The Role of Mobility Degradation in the BTI-Induced RO Aging in a 28-nm Bulk CMOS Technology: (Student paper).	IRPS	2023	DBLP DOI BibTeX RDF
1	Melina Lofrano, Herman Oprins, Xinyue Chang, Bjorn Vermeersch, Olalla Varela Pedreira, Alicja Lesniewska, Vladimir Cherman, Ivan Ciofi, Kristof Croes, Seongho Park, Zsolt Tokei	Towards accurate temperature prediction in BEOL for reliability assessment (Invited).	IRPS	2023	DBLP DOI BibTeX RDF
1	Yujie Zhou, David LaFonteese, Elyse Rosenbaum	Collector Engineering of ESD PNP in BCD Technologies.	IRPS	2023	DBLP DOI BibTeX RDF
1	Matchima Buddhanoy, Biswajit Ray	Electrostatic Shielding of NAND Flash Memory from Ionizing Radiation.	IRPS	2023	DBLP DOI BibTeX RDF
1	Yaru Ding, Xinwei Yu, Chu Yan, Zeping Weng, Yiming Qu, Yi Zhao	Interval time dependent wake-up effect of HfZrO ferroelectric capacitor.	IRPS	2023	DBLP DOI BibTeX RDF
1	Houman Zahedmanesh, Philippe Roussel, Ivan Ciofi, Kristof Croes	A pragmatic network-aware paradigm for system-level electromigration predictions at scale.	IRPS	2023	DBLP DOI BibTeX RDF
1	Jounghun Park, Gilsang Yoon, Donghyun Go, Donghwi Kim, Ukju An, Jongwoo Kim, Jungsik Kim, Jeong-Soo Lee	Decomposition of Vertical and Lateral Charge Loss in Long-term Retention of 3-D NAND Flash Memory.	IRPS	2023	DBLP DOI BibTeX RDF
1	Rashmi Saikia, Aseer Ansari, Souvik Mahapatra	A Physics-based Model for Long Term Data Retention Characteristics in 3D NAND Flash Memory.	IRPS	2023	DBLP DOI BibTeX RDF
1	C. Doyen, V. Yon, Xavier Garros, Luigi Basset, Tadeu Mota Frutuoso, C. Dagon, Cheikh Diouf, X. Federspiel, V. Millon, Frederic Monsieur, C. Pribat, David Roy 0001	Insight Into HCI Reliability on I/O Nitrided Devices.	IRPS	2023	DBLP DOI BibTeX RDF
1	Manisha Sharma, Hokyung Park, Yinghong Zhao, Ki-Don Lee, Liangshan Chen, Joonah Yoon, Rakesh Ranjan, Caleb Dongkyan Kwon, Hyewon Shim, Myungsoo Yeo, Shin-Young Chung, Jon Haefner	Polarity Dependency of MOL-TDDB in FinFET.	IRPS	2023	DBLP DOI BibTeX RDF
1	Brian T. McGowan, Michal Rakowski, Seungman Choi	Nickel Silicide Electromigration on Micro Ring Modulators for Silicon Photonics Technology.	IRPS	2023	DBLP DOI BibTeX RDF
1	Klodjan Bidaj, Lauriane Gateka, Benjamin Ardaillon	Innovative reliability solution for WLCSP packages.	IRPS	2023	DBLP DOI BibTeX RDF
1	Nicholas J. Pieper, Yoni Xiong, Dennis R. Ball, J. Pasternak, Bharat L. Bhuva	Effects of Collected Charge and Drain Area on SE Response of SRAMs at the 5-nm FinFET Node.	IRPS	2023	DBLP DOI BibTeX RDF
1	Edward Van Brunt, Daniel J. Lichtenwalner, J. H. Park, Satyaki Ganguly, J. W. McPherson	Lifetime Modeling of the 4H-SiC MOS Interface in the HTRB Condition Under the Influence of Screw Dislocations.	IRPS	2023	DBLP DOI BibTeX RDF
1	A. Thiessen, M. Haack, Markus Herklotz	Silicon based degradation model for various types of highly integrated MOL resistor devices.	IRPS	2023	DBLP DOI BibTeX RDF
1	Pablo Saraza-Canflanca, Javier Diaz-Fortuny, Andrea Vici, Erik Bury, Robin Degraeve, Ben Kaczer	Using dedicated device arrays for the characterization of TDDB in a scaled HK/MG technology.	IRPS	2023	DBLP DOI BibTeX RDF
1	Akhil S. Kumar, Michael J. Uren, Matthew D. Smith 0003, Martin Kuball, Justin Parke, H. George Henry, Robert S. Howell	Dielectric Thickness and Fin Width Dependent OFF-State Degradation in AlGaN/GaN SLCFETs.	IRPS	2023	DBLP DOI BibTeX RDF
1	Marcello Cioni, G. Giorgino, Alessandro Chini, Carmine Miccoli, Maria Eloisa Castagna, M. Moschetti, C. Tringali, Ferdinando Iucolano	Evidence of Carbon Doping Effect on VTH Drift and Dynamic-RON of 100V p-GaN Gate AlGaN/GaN HEMTs.	IRPS	2023	DBLP DOI BibTeX RDF
1	Wonju Sung, Hyun Seung Kim, Jung Hoon Han, Seguen Park, Jeonghoon Oh, Hyodong Ban, Jooyoung Lee	Investigation on NBTI Control Techniques of HKMG Transistors for Low-power DRAM applications.	IRPS	2023	DBLP DOI BibTeX RDF
1	Harsha B. Variar, Satendra Kumar Gautam, Ashita Kumar, K. M. Amogh, Juan Luo, Ning Shi, David Marreiro, Shekar Mallikarjunaswamy, Mayank Shrivastava	Engineering Custom TLP I-V Characteristic Using a SCR-Diode Series ESD Protection Concept.	IRPS	2023	DBLP DOI BibTeX RDF
1	Xinwei Yu, Chu Yan, Yaru Ding, Yiming Qu, Yi Zhao	GHz AC to DC TDDB Modeling with Defect Accumulation Efficiency Model.	IRPS	2023	DBLP DOI BibTeX RDF
1	Viktor Dudash, Kashi Vishwanath Machani, Bjoern Boehme, Simone Capecchi, Jungtae Ok, Karsten Meier, Frank Kuechenmeister, Marcel Wieland, Karlheinz Bock	Wafer Level Chip Scale Package Failure Mode Prediction using Finite Element Modeling.	IRPS	2023	DBLP DOI BibTeX RDF
1	F. Serra Di Santa Maria, Francis Balestra, Christoforos G. Theodorou, Gérard Ghibaudo, Cezar B. Zota, Eunjung Cha	Experimental Study of Self-Heating Effect in InGaAs HEMTs for Quantum Technologies Down to 10K.	IRPS	2023	DBLP DOI BibTeX RDF
1	Kuo-Yu Hsiang, Jia-Yang Lee, Z.-F. Lou, F.-S. Chang, Z.-X. Li, C. W. Liu, T.-H. Hou, P. Su, Min-Hung Lee	Cryogenic Endurance of Anti-ferroelectric and Ferroelectric Hf1-xZrXO2 for Quantum Computing Applications.	IRPS	2023	DBLP DOI BibTeX RDF
1	Gennadi Bersuker, E. Tang, Dmitry Veksler	Signal duration sensitive degradation in scaled devices.	IRPS	2023	DBLP DOI BibTeX RDF
1	Nagothu Karmel Kranthi, Yang Xiu, Yang Xiao, Rajkumar Sankaralingam	Current Scalability Issues in Multi-Bank 5V PMOS ESD structures: Root cause and Design Guideline.	IRPS	2023	DBLP DOI BibTeX RDF
1	Jorge Mendoza, Jimmy-Bao Le, Choong-Un Kim, Hung-Yun Lin	Advanced Methods of Detecting Physical Damages in Packaging and BEOL Interconnects.	IRPS	2023	DBLP DOI BibTeX RDF
1	Shinwoo Jeong, Jin-Seong Lee, Jiuk Jang, Jooncheol Kim, Hyunsu Shin, Jihun Kim, Jeongwoo Song, Dongsoo Woo, Jeonghoon Oh, Jooyoung Lee	Investigation of Sub-20nm 4th generation DRAM cell transistor's parasitic resistance and scalable methodology for Sub-20nm era.	IRPS	2023	DBLP DOI BibTeX RDF
1	Lorenzo Benatti, Sara Vecchi, Milan Pesic, Francesco Maria Puglisi	The Role of Defects and Interface Degradation on Ferroelectric HZO Capacitors Aging.	IRPS	2023	DBLP DOI BibTeX RDF
1	Yuya Aoki, Tatsuya Iwata, Takuji Miki, Kazutoshi Kobayashi, Takefumi Yoshikawa	A 13-bit Radiation-Hardened SAR-ADC with Error Correction by Adaptive Topology Transformation.	IRPS	2023	DBLP DOI BibTeX RDF
1	Om Prakash 0007, Kai Ni 0004, Hussam Amrouch	Monolithic 3D Integrated BEOL Dual-Port Ferroelectric FET to Break the Tradeoff Between the Memory Window and the Ferroelectric Thickness.	IRPS	2023	DBLP DOI BibTeX RDF
1	M. Monishmurali, Nagothu Karmel Kranthi, Gianluca Boselli, Mayank Shrivastava	Impact of Thin-oxide Gate on the On-Resistance of HV-PNP Under ESD Stress.	IRPS	2023	DBLP DOI BibTeX RDF
1	Andrea Padovani, Paolo La Torraca, Jack Strand, Alexander L. Shluger, Valerio Milo, Luca Larcher	Towards a Universal Model of Dielectric Breakdown.	IRPS	2023	DBLP DOI BibTeX RDF
1	Sruthi M. P, Md. Asaduz Zaman Mamun, Deleep R. Nair, Anjan Chakravorty, Nandita DasGupta, Amitava DasGupta, Muhammad Ashraful Alam	Cross-coupled Self-Heating and Consequent Reliability Issues in GaN-Si Hetero-integration: Thermal Keep-Out-Zone Quantified.	IRPS	2023	DBLP DOI BibTeX RDF
1	Ernest Y. Wu, Baozhen Li	Quantum Mechanical Connection of Schottky Emission Process and Its implications on Breakdown Methodology and Conduction Modeling for BEOL Low-k Dielectrics.	IRPS	2022	DBLP DOI BibTeX RDF
1	Zheng Ke, Sachin Goyal, Solomon Arputharaj, Wendy Wee Yee Lau, Tan Tam Lyn, Lim Dau Fatt, Pandurangan Madhavan, Chandrasekar Venkataramani	Pre-O2 treatment for LNA gate oxide leakage improvement.	IRPS	2022	DBLP DOI BibTeX RDF
1	Marcello Cioni, Nicolò Zagni, Alessandro Chini	Fe-Traps Influence on Time-dependent Breakdown Voltage in 0.1-μm GaN HEMTs for 5G Applications.	IRPS	2022	DBLP DOI BibTeX RDF
1	R. Zhang, J. Liu, Q. Li, S. Pidaparthi, A. Edwards, C. Drowley, Y. Zhang	Vertical GaN Fin JFET: A Power Device with Short Circuit Robustness at Avalanche Breakdown Voltage.	IRPS	2022	DBLP DOI BibTeX RDF
1	Quan Tran, Ronald Gayhardt, Tin Nguyen 0003, Arif Zaman	Recent US West Coast Wildfire Disasters: Impact on the Reliability Assessment of Optical Transceivers.	IRPS	2022	DBLP DOI BibTeX RDF
1	Daniel Beckmeier, Jifa Hao, Jake Choi, Matt Ring	Revealing stresses for plasma induced damage detection in thick oxides.	IRPS	2022	DBLP DOI BibTeX RDF
1	A. Viegas, K. Falidas, T. Ali, Kati Kühnel, R. Hoffmann, Clemens Mart, M. Czernohorsky, J. Heitmann	Reliability of Ferroelectric and Antiferroelectric Si: HfO2 materials in 3D capacitors by TDDB studies.	IRPS	2022	DBLP DOI BibTeX RDF
1	Md. Asaduz Zaman Mamun, Muhammad Ashraful Alam	Reduced Relative Humidity (RH) Enhances the Corrosion-Limited Lifetime of Self-Heated IC: Peck's equation Generalized.	IRPS	2022	DBLP DOI BibTeX RDF
1	Ikuo Suda, Ryo Kishida, Kazutoshi Kobayashi	An Aging Degradation Suppression Scheme at Constant Performance by Controlling Supply Voltage and Body Bias in a 65 nm Fully-Depleted Silicon-On-Insulator Process.	IRPS	2022	DBLP DOI BibTeX RDF
1	Jae-Gyung Ahn, Jim Wesselkamper, Ryan S. W. Baek, Ping-Chin Yeh, Jonathan Chang, Jennifer Wong, Xin Wu	Reliability Analysis of Physically Unclonable Function by Using Aging Variability Simulation.	IRPS	2022	DBLP DOI BibTeX RDF
1	Armen Kteyan, Valeriy Sukharev, Y. Yi, Chris H. Kim	Novel methodology for temperature-aware electromigration assessment in on-chip power grid: simulations and experimental validation (Invited).	IRPS	2022	DBLP DOI BibTeX RDF
1	Aarti Rathi, Abhisek Dixit, P. Srinivasan 0002, Oscar Huerta-Gonzalez, Fernando Guarin	RF Reliability of CMOS-Based Power Amplifier Cell for 5G mmWave Applications.	IRPS	2022	DBLP DOI BibTeX RDF
1	H. Zheng, Y. S. Sun, J. L. Huang	Impact of TSV on TDDB Performance of Neighboring FinFET with HK/IL Gate Stacking.	IRPS	2022	DBLP DOI BibTeX RDF
1	Alexander Hirler, Ulrich Abelein, M. Büttner, Ricarda Fischbach, Göran Jerke, Andreas Krinke, S. Simon	Mission Profile Clustering Using a Universal Quantile Criterion.	IRPS	2022	DBLP DOI BibTeX RDF

Publications at "IRPS"( http://dblp.L3S.de/Venues/IRPS )