|
|
Venues (Conferences, Journals, ...)
|
|
GrowBag graphs for keyword ? (Num. hits/coverage)
Group by:
No Growbag Graphs found.
|
|
|
Results
Found 1201 publication records. Showing 1201 according to the selection in the facets
Hits ?▲ |
Authors |
Title |
Venue |
Year |
Link |
Author keywords |
1 | Javier Martín-Martínez, Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Rosana Rodríguez, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández 0001, Montserrat Nafría |
Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Zhan Gao, Francesca Chiocchetta, Fabiana Rampazzo, Carlo De Santi, Mirko Fornasier, Gaudenzio Meneghesso, Matteo Meneghini, Enrico Zanoni |
Thermally-activated failure mechanisms of 0.25 \ \mu \mathrm{m}$ RF AIGaN/GaN HEMTs submitted to long-term life tests. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | H. Takahashi, Y. Okamoto, Toshiki Hamada, Yusuke Komura, S. Watanabe, K. Tsuda, H. Sawai, Takanori Matsuzaki, Yoshinori Ando, Tatsuya Onuki, Hitoshi Kunitake, Shunpei Yamazaki, D. Kobayashi, A. Ikuta, Takahiro Makino, Takeshi Ohshima |
Soft- and Hard-Error Radiation Reliability of 228 KB $3\mathrm{T}+1\mathrm{C}$ Oxide Semiconductor Memory. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Yoni Xiong, Yueh Chiang, Nicholas J. Pieper, Dennis R. Ball, Bharat L. Bhuva |
Soft Error Rate Predictions for Terrestrial Neutrons at the 3-nm Bulk FinFET Technology. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Patrick M. Lenahan, E. B. Frantz, Sean W. King, Mark A. Anders 0002, S. J. Moxim, James P. Ashton, Kyle J. Myers, M. E. Flatté, N. J. Harmon |
Near Zero Field Magnetoresistance Spectroscopy: A New Tool in Semiconductor Reliability Physics. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | |
IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023 |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Luca Laurin, Matteo Baldo, Elisa Petroni, Giulia Samanni, Lorenzo Turconi, A. Motta, Massimo Borghi, A. Serafini, D. Codegoni, M. Scuderi, S. Ran, A. Claverie, Daniele Ielmini, Roberto Annunziata, Andrea Redaelli |
Unveiling Retention Physical Mechanism of Ge-rich GST ePCM Technology. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Lina Qu, Shengwei Yang, Ming He, Rui Fang, Xiaojuan Zhu, Kun Han, Yi He |
Polarity Dependency and 1/E Model of Gate Oxide TDDB Degradation in 3D NAND. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Rahim Kasim, Cheyun Lin, Christopher Perini, James Palmer, N. Gilda, S. Imam, Justin R. Weber, C. Wallace, Jeffery Hicks |
Reliability Modeling of Middle-Of-Line Interconnect Dielectrics in Advanced process nodes. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Maximilian W. Feil, Katja Waschneck, Hans Reisinger, Judith Berens, Thomas Aichinger, Paul Salmen, Gerald Rescher, Wolfgang Gustin, Tibor Grasser |
Towards Understanding the Physics of Gate Switching Instability in Silicon Carbide MOSFETs. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Takuya Wadatsumi, Kohei Kawai, Rikuu Hasegawa, Kazuki Monta, Takuji Miki, Makoto Nagata |
Characterization of Backside ESD Impacts on Integrated Circuits. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Dongyoung Kim, Skylar DeBoer, Stephen A. Mancini, Sundar Babu Isukapati, Justin Lynch, Nick Yun, Adam J. Morgan, Seung Yup Jang, Woongje Sung |
Static, Dynamic, and Short-circuit Characteristics of Split-Gate 1.2 kV 4H-SiC MOSFETs. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Joseph B. Bernstein, Emmanuel Bender, Alain Bensoussan 0002 |
The Correct Hot Carrier Degradation Model. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Akira Goda, Kishore Kumar Muchherla, Peter Feeley |
Reliability of 3D NAND Flash for Future Storage Systems (Invited). |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Fengkai Liu, Lei Wu, Kai Wang, Enhao Guan, Xingji Li |
Effect of Precursor Defects in Oxide Layer on Ionizing Radiation Damage of Bipolar Junction Transistors. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Anand Kumar Rai, Harsha B. Variar, Mayank Shrivastava |
Circuit Reliability of $\text{MoS}_{2}$ Channel Based 2D Transistors. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Y. L. Chou, W. J. Tsai, G. W. Wu, W. Chang, T. C. Lu, K. C. Chen, C. Y. Lu |
A Novel Data Recovery Technique for 3D TLC NAND Flash Memory Using Intercell Program. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Seongkyung Kim, Hyerim Park, Eunyu Choi, Young Han Kim, Dahyub Kim, Hyewon Shim, Shin-Young Chung, Paul Jung |
Reliability Assessment of 3nm GAA Logic Technology Featuring Multi-Bridge-Channel FETs. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Joost Melai, V. Subramanian, I. Pouwel |
Impact of Process Variation on MIM Capacitor Lifetime. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Ayumu Yamada, Naoko Misawa, Chihiro Matsui, Ken Takeuchi |
ReRAM CiM Fluctuation Pattern Classification by CNN Trained on Artificially Created Dataset. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Stéphane Moreau, David Bouchu, J. Jourdon, Bassel Ayoub, S. Lhostis, Hélène Frémont, P. Lamontagne |
Recent Advances on Electromigration in Cu/SiO2 to Cu/SiO2 Hybrid Bonds for 3D Integrated Circuits. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Satendra Kumar Gautam, Harsha B. Variar, Juan Luo, Ning Shi, David Marreiro, Shekar Mallikarjunaswamy, Mayank Shrivastava |
3D Approaches to Engineer Holding Voltage of SCR. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Vladislav A. Vashchenko, H. Sarbishaei |
Voltage Acceleration of Power NLDMOS Hot Carrier Degradation. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Hsi-Yu Kuo, Yu-Lin Chu, Hung-Da Dai, Chun-Chi Wang, Pei-Jung Lin, Ethan Guo, Yu-Ti Su, Chia-Lin Hsu, Kuan-Hung Chen, Tsung-Yuan Chen, Ryan Lu, Victor Liang, Kuo-Ji Chen, Kejun Xia |
Protection Schemes for Plasma Induced Damage from Well-Side Antennas. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | B. Tolleson, Christopher H. Bennett, T. Patrick Xiao, Donald Wilson, Jesse Short, J. Kim, David R. Hughart, Nad Gilbert, Sapan Agarwal, Hugh J. Barnaby, Matthew J. Marinella |
TID Response of an Analog In-Memory Neural Network Accelerator. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Sunil Rathore, Rajeewa Kumar Jaisawal, P. N. Kondekar, Navneet Gandhi, Shashank Banchhor, Young Suh Song, Navjeet Bagga |
Self-Heating Aware Threshold Voltage Modulation Conforming to Process and Ambient Temperature Variation for Reliable Nanosheet FET. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Chi-Wei Wang, Che-Pei Chang, Chang-Chun Lee |
Demonstration on Warpage Estimation Approach Utilized in Fan-Out Panel-Level Packaging Enabled by Multi-Scale Process-Oriented Simulation. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Y. H. Liu, T. C. Zhan, Y. S. Yang, C. C. Hsu, A. C. Liu, W. Lin |
Impact of Trapped Charge Vertical Loss and Lateral Migration on Lifetime Estimation of 3-D NAND Flash Memories. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Ivana Kovacevic-Badstuebner, Salvatore Race, Ulrike Grossner, Elena Mengotti, Christoph Kenel, Enea Bianda, Joni P. A. Jormanainen |
Extended Analysis of Power Cycling Behavior of TO-Packaged SiC Power MOSFETs. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Yong Hyeon Yi, Chris H. Kim, Chen Zhou, Armen Kteyan, Valeriy Sukharev |
Studying the Impact of Temperature Gradient on Electromigration Lifetime Using a Power Grid Test Structure with On-Chip Heaters. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | E. Murakami, T. Takeshita, K. Oda, M. Kobayashi, K. Asayama, M. Okamoto |
Classification of Commercial SiC-MOSFETs Based on Time-Dependent Gate-current Characteristics. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | S. Lee, N.-H. Lee, K. W. Lee, J. H. Kim, J. H. Jin, Y. S. Lee, Y. C. Hwang, H. S. Kim, S. Pae |
Development and Product Reliability Characterization of Advanced High Speed 14nm DDR5 DRAM with On-die ECC. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Limeng Shi, Shengnan Zhu, Jiashu Qian, Michael Jin, Monikuntala Bhattacharya, Marvin H. White, Anant K. Agarwal, Atsushi Shimbori, Tianshi Liu |
Investigation of different screening methods on threshold voltage and gate oxide lifetime of SiC Power MOSFETs. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Daniel Christopher Worledge |
Write-error-rate of Spin-Transfer-Torque MRAM (Invited). |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Md. Asaduz Zaman Mamun, Amar Mavinkurve, Michiel van Soestbergen, Muhammad Ashraful Alam |
Transient Leakage Current as a Non-destructive Probe of Wire-bond Electrochemical Failures. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Tidjani Garba-Seybou, Xavier Federspiel, Frederic Monsieur, Mathieu Sicre, Florian Cacho, Joycelyn Hai, Alain Bravaix |
Location of Oxide Breakdown Events under Off-state TDDB in 28nm N-MOSFETs dedicated to RF applications. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Elisa Vitanza, C. Realmuto, M. La Marca, L. Torrisi |
Backside Failure Analysis of IGBT power devices assembled in STPAK. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Anirban Bandyopadhyay |
Differentiated Silicon Technologies for mmwave 5G and 6G applications (Invited). |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Tomasz Brozek, Alberto A. P. Cattaneo, Larg Weiland, Michele Quarantelli, Alberto Coccoli, Sharad Saxena, Christopher Hess, Andrzej J. Strojwas |
In-Product BTI Aging Sensor for Reliability Screening and Early Detection of Material at Risk. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | M. Jamil, S. Mukhopadhay, M. Ghoneim, A. Shailos, Chetan Prasad, Inanc Meric, Stephen Ramey |
Reliability Studies on Advanced FinFET Transistors of the Intel 4 CMOS Technology. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Erik Bury, Michiel Vandemaele, Jacopo Franco, Adrian Chasin, Stanislav Tyaginov, A. Vandooren, Romain Ritzenthaler, Hans Mertens, Javier Diaz-Fortuny, N. Horiguchi, Dimitri Linten, Ben Kaczer |
Reliability challenges in Forksheet Devices: (Invited Paper). |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Davide Favero, A. Cavaliere, Carlo De Santi, Matteo Borga, W. Gonçalez Filho, Karen Geens, Benoit Bakeroot, Stefaan Decoutere, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini |
High- Temperature PBTI in Trench-Gate Vertical GaN Power MOSFETs: Role of Border and Semiconductor Traps. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Harsh Raj, Vipin Joshi, Rajarshi Roy Chaudhuri, Rasik Rashid Malik, Mayank Shrivastava |
Physical Insights into the DC and Transient Reverse Bias Reliability of β-Ga2O3 Based Vertical Schottky Barrier Diodes. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Hui Wang, Pengyu Lai, Zhong Chen |
Current Injection Effect on ESD Behaviors of the Parasitic Bipolar Transistors inside P+/N-well diode. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Y. H. Lin, C. C. Lee, C. Y. Liao, M. H. Lin, W. C. Tu, Robin Chen, H. P. Chen, Winston S. Shue, Min Cao |
A Novel Methodology to Predict Process-Induced Warpage in Advanced BEOL Interconnects. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | D. Lipp, Z. Zhao, G. Krause, Wafa Arfaoui, Elodie Ebrard, Germain Bossu, S. Evseev, Markus Herklotz, Mahesh Siddabathula |
Excellent Reliability performances of a truly 5V nBOXFET for Automotive and IOT applications. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Valentina Meli, Gabriele Navarro, J. Rottner, Niccolo Castellani, S. Martin, N. P. Tran, Guillaume Bourgeois, C. Sabbione, Marie Claire Cyrille |
Multi Level Cell Reliability in Ge-rich GeSbTe-based Phase Change Memory Arrays. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Mehak Ashraf Mir, Vipin Joshi, Rajarshi Roy Chaudhuri, Mohammad Ateeb Munshi, Rasik Rashid Malik, Mayank Shrivastava |
Dynamic Interplay of Surface and Buffer Traps in Determining Drain Current Injection induced Device Instability in OFF-state of AlGaN/GaN HEMTs. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | A. S. Saleh, Houman Zahedmanesh, Hajdin Ceric, Ingrid De Wolf, Kris Croes |
Impact of via geometry and line extension on via-electromigration in nano-interconnects. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Andrea Vici, Robin Degraeve, Philippe J. Roussel, Jacopo Franco, Ben Kaczer, Ingrid De Wolf |
Analysis of TDDB lifetime projection in low thermal budget HfO2/SiO2 stacks for sequential 3D integrations. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | S. Mukhopadhyay, C. Chen, M. Jamil, Jihan Standfest, Inanc Meric, Balkaran Gill, Stephen Ramey |
A Unified Aging Model Framework Capturing Device to Circuit Degradation for Advance Technology Nodes. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Victor M. van Santen, Jose M. Gata-Romero, Juan Núñez 0002, Rafael Castro-López, Elisenda Roca, Hussam Amrouch |
Characterizing BTI and HCD in 1.2V 65nm CMOS Oscillators made from Combinational Standard Cells and Processor Logic Paths. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Dishant Sangani, Javier Diaz-Fortuny, Erik Bury, Ben Kaczer, Georges G. E. Gielen |
The Role of Mobility Degradation in the BTI-Induced RO Aging in a 28-nm Bulk CMOS Technology: (Student paper). |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Melina Lofrano, Herman Oprins, Xinyue Chang, Bjorn Vermeersch, Olalla Varela Pedreira, Alicja Lesniewska, Vladimir Cherman, Ivan Ciofi, Kristof Croes, Seongho Park, Zsolt Tokei |
Towards accurate temperature prediction in BEOL for reliability assessment (Invited). |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Yujie Zhou, David LaFonteese, Elyse Rosenbaum |
Collector Engineering of ESD PNP in BCD Technologies. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Matchima Buddhanoy, Biswajit Ray |
Electrostatic Shielding of NAND Flash Memory from Ionizing Radiation. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Yaru Ding, Xinwei Yu, Chu Yan, Zeping Weng, Yiming Qu, Yi Zhao |
Interval time dependent wake-up effect of HfZrO ferroelectric capacitor. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Houman Zahedmanesh, Philippe Roussel, Ivan Ciofi, Kristof Croes |
A pragmatic network-aware paradigm for system-level electromigration predictions at scale. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Jounghun Park, Gilsang Yoon, Donghyun Go, Donghwi Kim, Ukju An, Jongwoo Kim, Jungsik Kim, Jeong-Soo Lee |
Decomposition of Vertical and Lateral Charge Loss in Long-term Retention of 3-D NAND Flash Memory. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Rashmi Saikia, Aseer Ansari, Souvik Mahapatra |
A Physics-based Model for Long Term Data Retention Characteristics in 3D NAND Flash Memory. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | C. Doyen, V. Yon, Xavier Garros, Luigi Basset, Tadeu Mota Frutuoso, C. Dagon, Cheikh Diouf, X. Federspiel, V. Millon, Frederic Monsieur, C. Pribat, David Roy 0001 |
Insight Into HCI Reliability on I/O Nitrided Devices. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Manisha Sharma, Hokyung Park, Yinghong Zhao, Ki-Don Lee, Liangshan Chen, Joonah Yoon, Rakesh Ranjan, Caleb Dongkyan Kwon, Hyewon Shim, Myungsoo Yeo, Shin-Young Chung, Jon Haefner |
Polarity Dependency of MOL-TDDB in FinFET. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Brian T. McGowan, Michal Rakowski, Seungman Choi |
Nickel Silicide Electromigration on Micro Ring Modulators for Silicon Photonics Technology. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Klodjan Bidaj, Lauriane Gateka, Benjamin Ardaillon |
Innovative reliability solution for WLCSP packages. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Nicholas J. Pieper, Yoni Xiong, Dennis R. Ball, J. Pasternak, Bharat L. Bhuva |
Effects of Collected Charge and Drain Area on SE Response of SRAMs at the 5-nm FinFET Node. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Edward Van Brunt, Daniel J. Lichtenwalner, J. H. Park, Satyaki Ganguly, J. W. McPherson |
Lifetime Modeling of the 4H-SiC MOS Interface in the HTRB Condition Under the Influence of Screw Dislocations. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | A. Thiessen, M. Haack, Markus Herklotz |
Silicon based degradation model for various types of highly integrated MOL resistor devices. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Pablo Saraza-Canflanca, Javier Diaz-Fortuny, Andrea Vici, Erik Bury, Robin Degraeve, Ben Kaczer |
Using dedicated device arrays for the characterization of TDDB in a scaled HK/MG technology. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Akhil S. Kumar, Michael J. Uren, Matthew D. Smith 0003, Martin Kuball, Justin Parke, H. George Henry, Robert S. Howell |
Dielectric Thickness and Fin Width Dependent OFF-State Degradation in AlGaN/GaN SLCFETs. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Marcello Cioni, G. Giorgino, Alessandro Chini, Carmine Miccoli, Maria Eloisa Castagna, M. Moschetti, C. Tringali, Ferdinando Iucolano |
Evidence of Carbon Doping Effect on VTH Drift and Dynamic-RON of 100V p-GaN Gate AlGaN/GaN HEMTs. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Wonju Sung, Hyun Seung Kim, Jung Hoon Han, Seguen Park, Jeonghoon Oh, Hyodong Ban, Jooyoung Lee |
Investigation on NBTI Control Techniques of HKMG Transistors for Low-power DRAM applications. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Harsha B. Variar, Satendra Kumar Gautam, Ashita Kumar, K. M. Amogh, Juan Luo, Ning Shi, David Marreiro, Shekar Mallikarjunaswamy, Mayank Shrivastava |
Engineering Custom TLP I-V Characteristic Using a SCR-Diode Series ESD Protection Concept. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Xinwei Yu, Chu Yan, Yaru Ding, Yiming Qu, Yi Zhao |
GHz AC to DC TDDB Modeling with Defect Accumulation Efficiency Model. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Viktor Dudash, Kashi Vishwanath Machani, Bjoern Boehme, Simone Capecchi, Jungtae Ok, Karsten Meier, Frank Kuechenmeister, Marcel Wieland, Karlheinz Bock |
Wafer Level Chip Scale Package Failure Mode Prediction using Finite Element Modeling. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | F. Serra Di Santa Maria, Francis Balestra, Christoforos G. Theodorou, Gérard Ghibaudo, Cezar B. Zota, Eunjung Cha |
Experimental Study of Self-Heating Effect in InGaAs HEMTs for Quantum Technologies Down to 10K. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Kuo-Yu Hsiang, Jia-Yang Lee, Z.-F. Lou, F.-S. Chang, Z.-X. Li, C. W. Liu, T.-H. Hou, P. Su, Min-Hung Lee |
Cryogenic Endurance of Anti-ferroelectric and Ferroelectric Hf1-xZrXO2 for Quantum Computing Applications. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Gennadi Bersuker, E. Tang, Dmitry Veksler |
Signal duration sensitive degradation in scaled devices. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Nagothu Karmel Kranthi, Yang Xiu, Yang Xiao, Rajkumar Sankaralingam |
Current Scalability Issues in Multi-Bank 5V PMOS ESD structures: Root cause and Design Guideline. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Jorge Mendoza, Jimmy-Bao Le, Choong-Un Kim, Hung-Yun Lin |
Advanced Methods of Detecting Physical Damages in Packaging and BEOL Interconnects. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Shinwoo Jeong, Jin-Seong Lee, Jiuk Jang, Jooncheol Kim, Hyunsu Shin, Jihun Kim, Jeongwoo Song, Dongsoo Woo, Jeonghoon Oh, Jooyoung Lee |
Investigation of Sub-20nm 4th generation DRAM cell transistor's parasitic resistance and scalable methodology for Sub-20nm era. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Lorenzo Benatti, Sara Vecchi, Milan Pesic, Francesco Maria Puglisi |
The Role of Defects and Interface Degradation on Ferroelectric HZO Capacitors Aging. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Yuya Aoki, Tatsuya Iwata, Takuji Miki, Kazutoshi Kobayashi, Takefumi Yoshikawa |
A 13-bit Radiation-Hardened SAR-ADC with Error Correction by Adaptive Topology Transformation. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Om Prakash 0007, Kai Ni 0004, Hussam Amrouch |
Monolithic 3D Integrated BEOL Dual-Port Ferroelectric FET to Break the Tradeoff Between the Memory Window and the Ferroelectric Thickness. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | M. Monishmurali, Nagothu Karmel Kranthi, Gianluca Boselli, Mayank Shrivastava |
Impact of Thin-oxide Gate on the On-Resistance of HV-PNP Under ESD Stress. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Andrea Padovani, Paolo La Torraca, Jack Strand, Alexander L. Shluger, Valerio Milo, Luca Larcher |
Towards a Universal Model of Dielectric Breakdown. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Sruthi M. P, Md. Asaduz Zaman Mamun, Deleep R. Nair, Anjan Chakravorty, Nandita DasGupta, Amitava DasGupta, Muhammad Ashraful Alam |
Cross-coupled Self-Heating and Consequent Reliability Issues in GaN-Si Hetero-integration: Thermal Keep-Out-Zone Quantified. |
IRPS |
2023 |
DBLP DOI BibTeX RDF |
|
1 | Ernest Y. Wu, Baozhen Li |
Quantum Mechanical Connection of Schottky Emission Process and Its implications on Breakdown Methodology and Conduction Modeling for BEOL Low-k Dielectrics. |
IRPS |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Zheng Ke, Sachin Goyal, Solomon Arputharaj, Wendy Wee Yee Lau, Tan Tam Lyn, Lim Dau Fatt, Pandurangan Madhavan, Chandrasekar Venkataramani |
Pre-O2 treatment for LNA gate oxide leakage improvement. |
IRPS |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Marcello Cioni, Nicolò Zagni, Alessandro Chini |
Fe-Traps Influence on Time-dependent Breakdown Voltage in 0.1-μm GaN HEMTs for 5G Applications. |
IRPS |
2022 |
DBLP DOI BibTeX RDF |
|
1 | R. Zhang, J. Liu, Q. Li, S. Pidaparthi, A. Edwards, C. Drowley, Y. Zhang |
Vertical GaN Fin JFET: A Power Device with Short Circuit Robustness at Avalanche Breakdown Voltage. |
IRPS |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Quan Tran, Ronald Gayhardt, Tin Nguyen 0003, Arif Zaman |
Recent US West Coast Wildfire Disasters: Impact on the Reliability Assessment of Optical Transceivers. |
IRPS |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Daniel Beckmeier, Jifa Hao, Jake Choi, Matt Ring |
Revealing stresses for plasma induced damage detection in thick oxides. |
IRPS |
2022 |
DBLP DOI BibTeX RDF |
|
1 | A. Viegas, K. Falidas, T. Ali, Kati Kühnel, R. Hoffmann, Clemens Mart, M. Czernohorsky, J. Heitmann |
Reliability of Ferroelectric and Antiferroelectric Si: HfO2 materials in 3D capacitors by TDDB studies. |
IRPS |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Md. Asaduz Zaman Mamun, Muhammad Ashraful Alam |
Reduced Relative Humidity (RH) Enhances the Corrosion-Limited Lifetime of Self-Heated IC: Peck's equation Generalized. |
IRPS |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Ikuo Suda, Ryo Kishida, Kazutoshi Kobayashi |
An Aging Degradation Suppression Scheme at Constant Performance by Controlling Supply Voltage and Body Bias in a 65 nm Fully-Depleted Silicon-On-Insulator Process. |
IRPS |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Jae-Gyung Ahn, Jim Wesselkamper, Ryan S. W. Baek, Ping-Chin Yeh, Jonathan Chang, Jennifer Wong, Xin Wu |
Reliability Analysis of Physically Unclonable Function by Using Aging Variability Simulation. |
IRPS |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Armen Kteyan, Valeriy Sukharev, Y. Yi, Chris H. Kim |
Novel methodology for temperature-aware electromigration assessment in on-chip power grid: simulations and experimental validation (Invited). |
IRPS |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Aarti Rathi, Abhisek Dixit, P. Srinivasan 0002, Oscar Huerta-Gonzalez, Fernando Guarin |
RF Reliability of CMOS-Based Power Amplifier Cell for 5G mmWave Applications. |
IRPS |
2022 |
DBLP DOI BibTeX RDF |
|
1 | H. Zheng, Y. S. Sun, J. L. Huang |
Impact of TSV on TDDB Performance of Neighboring FinFET with HK/IL Gate Stacking. |
IRPS |
2022 |
DBLP DOI BibTeX RDF |
|
1 | Alexander Hirler, Ulrich Abelein, M. Büttner, Ricarda Fischbach, Göran Jerke, Andreas Krinke, S. Simon |
Mission Profile Clustering Using a Universal Quantile Criterion. |
IRPS |
2022 |
DBLP DOI BibTeX RDF |
|
Displaying result #101 - #200 of 1201 (100 per page; Change: ) Pages: [ <<][ 1][ 2][ 3][ 4][ 5][ 6][ 7][ 8][ 9][ 10][ 11][ >>] |
|